A detector high-temperature stability testing system

Abstract

This utility model discloses a testing system, particularly a high-temperature stability testing system for detectors, comprising: a temperature control cabinet, on which several drawer-type test boxes are arranged. Each drawer-type test box includes a shell with an opening on its side and a drawer inside. This system employs a drawer-type test box design, supporting flexible addition or removal of test units as needed, easily adapting to different testing scales from single-channel to multi-channel, significantly improving the adaptability and scalability of the system configuration.

Description

Technical Field

[0001] This utility model relates to the field of reliability testing technology for photoelectric detectors, and in particular to a high-temperature stability testing system for detectors. Background Technology

[0002] In the current field of high-temperature testing technology for detectors, traditional testing platforms have several significant limitations. First, their temperature control capabilities are generally insufficient; the temperature control range of common equipment is usually no more than 200℃, and the accuracy is poor, often greater than ±3℃, making it difficult to reliably simulate extreme high-temperature operating conditions. Second, testing efficiency is low; most systems only support single-channel sequential testing, and the evaluation of batch devices is significantly time-consuming. In addition, system maintenance costs are high, modularity is low, and a single failure often leads to system downtime, making repairs cumbersome and affecting testing progress. Finally, data management capabilities are weak; temperature and electrical performance parameters mostly rely on manual recording, lacking automated acquisition, storage, and traceability mechanisms, which restricts the reliability and analysis efficiency of test data. Utility Model Content

[0003] In order to solve the problems existing in the prior art, this utility model provides a high-temperature stability testing system for detectors to address the current technical issues.

[0004] The technical solution adopted by this utility model to solve its technical problem is: This utility model provides a high-temperature stability testing system for a detector, comprising: a temperature control cabinet, wherein a plurality of drawer-type test boxes are provided on the temperature control cabinet, each drawer-type test box includes a shell, an opening is provided on the side of the shell, and a drawer is provided inside the shell.

[0005] Preferably, the housing is provided with a track, the track is provided with a slider, and the drawer is provided on the slider.

[0006] Preferably, the drawer is provided with a test socket for testing components.

[0007] Preferably, the drawer is provided with a baffle for blocking the opening on the side of the outer casing.

[0008] Preferably, a heating module and a temperature sensor are provided inside the housing.

[0009] Preferably, the outer casing is provided with an optical fiber interface that penetrates the outer casing.

[0010] Preferably, the temperature control cabinet is also equipped with an industrial computer, which is electrically connected to the heating module and the temperature sensor.

[0011] Preferably, the temperature control cabinet is also equipped with a source meter and a data acquisition module.

[0012] Preferred methods of use include the following: Step 1: Turn on the main power, industrial computer, and power meter; Step 2: Pull out the drawer of the drawer-type test box, place the device inside, and close the drawer; Step 3: Enter the parameter configuration window and configure the parameters; Step 4: Start the test; Step 5: Stop, exit the program, and turn off the power.

[0013] The beneficial effects of this utility model are: Modular and flexible expansion: Adopting a drawer-type test box design, it supports flexible addition and removal of test units as needed, and can easily adapt to different test scales from single channel to multi-channel, significantly improving the adaptability and scalability of system configuration; Precise and stable temperature control: It integrates a high-precision temperature control module, which can achieve higher temperature control accuracy than traditional equipment. The maximum operating temperature reaches 300℃, which can reliably meet the testing needs in extreme high temperature environments. Multi-channel parallel high efficiency: Supports multi-channel cyclic scanning testing, enabling synchronous parallel evaluation of batch devices, improving testing efficiency by more than 50%, and significantly shortening the R&D and verification cycle; Easy maintenance and low cost: The independent pull-out drawer structure enables quick maintenance and replacement of single modules, reducing fault repair time by 80% and effectively reducing system operation and maintenance costs; Data automation integration: It has the capability to automate the entire process from data acquisition and storage to analysis, eliminating human error and providing complete and reliable data support for device reliability research and quality assessment. Attached Figure Description

[0014] The above-described aspects and advantages of this utility model will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which: Figure 1 This is a schematic diagram of the detector high-temperature stability testing system according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the drawer-type test box of the detector high-temperature stability test system according to an embodiment of this utility model.

[0015] Explanation of reference numerals in the attached figures:

[0016] exist Figures 1-2 In the middle, there are: 1. Industrial control computer; 2. Temperature control cabinet; 3. Source meter; 4. Drawer-type test box; 5. Housing; 6. Fiber optic interface; 7. Drawer; 8. Test socket; 9. Baffle; 10. Rail. Detailed Implementation

[0017] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0018] This utility model provides a high-temperature stability testing system for detectors, comprising: a temperature control cabinet 2, on which several drawer-type test boxes 4 are arranged. Each drawer-type test box 4 includes a shell 5 with an opening on its side and a drawer 7 inside. Each drawer 7 is equipped with an SMA905 fiber optic interface 6 for connecting an external light source and an integrated detector-specific test socket 8, supporting simultaneous fixing of multiple detectors. The test socket 8 can be selected from existing technologies according to the needs of the tested parts. The temperature control cabinet 2 is a metal cabinet, the shell 5 is a metal shell, and the drawers 7 are also made of metal.

[0019] The outer casing 5 has a track 10 with a slider on it, and a drawer 7 is mounted on the slider. The drawer 7 has a test socket 8 for testing components. The drawer 7 also has a baffle 9 to block the opening on the side of the outer casing 5. The track 10 is a metal track, the slider on it is a metal slider, and the baffle 9 is a metal plate or a high-temperature resistant plastic plate.

[0020] The outer casing 5 contains a heating module and a temperature sensor. Both the heating module and the temperature sensor can be based on existing technologies. The temperature control range is RT+10℃~300℃, and the temperature control accuracy is ±1℃. The temperature is dynamically adjusted through a PID algorithm.

[0021] An optical fiber interface 6 is provided on the outer casing 5, which runs through the outer casing 5. An industrial control computer 1 is also provided on the temperature control cabinet 2. The industrial control computer 1 is electrically connected to the heating module and the temperature sensor. The industrial control computer 1 also adopts existing technology.

[0022] The temperature control cabinet 2 is also equipped with a source meter 3 and a data acquisition module. Both the source meter 3 and the data acquisition module can be based on existing technologies.

[0023] This method is used to test the electrical stability, lifespan, and reliability of electronic components under high-temperature conditions. The approach involves controlling parameters such as temperature, voltage, current, and sampling interval to gradually enable and disable various functions, thereby observing the high-temperature electrical characteristics of the device.

[0024] The system supports a temperature control range from room temperature +10℃ to 300℃, with a temperature control accuracy of ±1℃; each channel supports independent setting of current and voltage, and the sampling mode can be divided into static and dynamic, supporting up to 108 devices to operate simultaneously.

[0025] Temperature range: Recommended test temperature range: 25℃ to 200℃; commonly used for general life testing: high temperatures such as 85℃, 105℃, and 125℃; when testing extreme performance, the upper limit close to 300℃ can be used. If the purpose is long-term stability testing: it is recommended to set the temperature to 85℃~105℃; if the purpose is accelerated aging testing: it is recommended to set the temperature to 125℃~150℃.

[0026] Voltage setting: For low-power diodes: typically between 0.5V and 5V; For power devices: the voltage can be increased appropriately, but should not exceed 80% of the device's rated voltage. For forward conduction testing: the voltage is generally around 1V; For reverse withstand voltage testing: the voltage should be gradually increased and maintained at 70% to 80% of the rated withstand voltage; it is recommended to set the voltage reasonably according to the device datasheet to avoid exceeding the limits.

[0027] Current Limits: Small power diodes: 1mA~100mA; High power devices: 50%~80% of rated current; The maximum rated current in the device's instruction manual must not be exceeded. This prevents thermal runaway at high temperatures; the test function automatically shuts down to protect the device when the actual current exceeds the set limit. Accelerated life test: Current can be set to 70% of the rated value; Stable operation test: Current can be set to 30%~50% of the rated value.

[0028] Data Acquisition Interval: Static Acquisition Mode: Input sampling interval: 10 seconds to 600 seconds; suitable for long-term stable observation, such as when the life test exceeds 1000 hours, sampling once every 1 to 5 minutes is sufficient. Dynamic Acquisition Mode: Initial stage (first hour): can be set to 10 to 30 seconds / sample to ensure early changes are captured; Mid-stage (1 hour to 100 hours): can be set to 1 minute to 5 minutes / sample; Late stage (over 100 hours): can be set to 10 minutes to 30 minutes / sample. If the goal is to capture early failures: shorten the sampling interval; if the goal is to verify long-term stability: the interval can be appropriately lengthened to reduce the amount of data.

[0029] File saving and naming: Files must be saved on a non-system drive; avoid Chinese characters in paths and file names; ensure long-term reliable data storage; avoid data loss due to abnormal paths.

[0030] Test Execution and Control: Enabling the Test Function: Select the channel, click "Start" to enter the parameter configuration window; set the voltage and current limits, sampling interval, and confirm the indicator lights are on; apply the parameters and set the file save path. Operation Process: The system begins applying voltage and current and performs data acquisition; the channel status changes from white to green, indicating that it is in test mode. Automatic Stop Function: When the device reaches the preset termination condition (such as a 50% decrease in brightness or a sudden current change), the test function automatically shuts down; the channel status changes from green to red. Manual Stop Function: The user can execute the "Stop" operation at any time; the channel function immediately shuts down, and the status returns to white.

[0031] When the temperature exceeds 150℃, ensure that the current limit is enabled; after each parameter configuration, confirm that the indicator light is on; to stop the test, the channel must be selected before execution, otherwise the wrong channel may be closed; the file path must be valid, otherwise the test cannot start; the test box must not be opened during the test to avoid affecting contact and data.

[0032] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A detector high-temperature stability testing system, comprising: A temperature control cabinet, characterized in that: the temperature control cabinet is provided with a plurality of drawer-type test boxes, each drawer-type test box including an outer shell, an opening on the side of the outer shell, a drawer inside the outer shell, a track inside the outer shell, a slider on the track, and the drawer being disposed on the slider.

2. The detector high-temperature stability testing system according to claim 1, characterized in that: The drawer is equipped with a test socket for testing components.

3. The detector high-temperature stability testing system according to claim 1, characterized in that: The drawer is equipped with a baffle to block the opening on the side of the outer casing.

4. The detector high-temperature stability testing system according to claim 1, characterized in that: The housing contains a heating module and a temperature sensor.

5. The detector high-temperature stability testing system according to claim 1, characterized in that: The outer casing is provided with a fiber optic interface that penetrates the outer casing.

6. The detector high-temperature stability testing system according to claim 1, characterized in that: The temperature control cabinet is also equipped with an industrial computer, which is electrically connected to the heating module and the temperature sensor.

7. The detector high-temperature stability testing system according to claim 1, characterized in that: The temperature control cabinet is also equipped with a source meter and a data acquisition module.

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