Ion source structure and mass spectrometer

Abstract

This application relates to the field of mass spectrometry technology, and discloses an ion source structure and a mass spectrometer. The ion source structure includes: a first cavity, which is provided with a capillary inlet, a connecting port, and an atmospheric pressure interface. The capillary inlet is used to introduce charged ions into a first receiving cavity within the first cavity; and a correction component, which is connected to the connecting port and is used to apply a force to the charged ions so that the charged ions enter the atmospheric pressure interface. The ion source structure and mass spectrometer provided in this application are used to improve the problem in the prior art where some charged ions cannot enter the atmospheric pressure interface, resulting in a high loss rate of charged ions.

Description

Technical Field

[0001] This application relates to the field of mass spectrometry technology, and in particular to an ion source structure and a mass spectrometer. Background Technology

[0002] The core function of the ion source in a mass spectrometer is to convert sample substances into detectable or usable charged ions. Specific voltages need to be applied at the ion source outlet and atmospheric pressure interface to form charged ions.

[0003] Under atmospheric pressure, although charged ions are affected by the electric field force, there is also a large amount of background gas in the atmosphere. When charged ions move by relying solely on the electric field force, some of them tend to deviate from their original direction when they collide with the background gas in the atmosphere and cannot enter the atmospheric pressure interface, resulting in a high loss rate of charged ions. Utility Model Content

[0004] This application provides an ion source structure and a mass spectrometer to improve the problem in the prior art where some charged ions cannot enter the atmospheric pressure interface, resulting in a high loss rate of charged ions.

[0005] In a first aspect, embodiments of this application provide an ion source structure, including:

[0006] The first cavity is provided with a capillary inlet, a connecting port and an atmospheric pressure interface. The capillary inlet is used to introduce charged ions into the first receiving cavity within the first cavity.

[0007] A correction component is connected to the communication port and is used to apply a force to the charged ions so that the charged ions enter the atmospheric pressure interface.

[0008] The ion source structure provided in this application has the following advantages:

[0009] Since the first cavity is provided with a capillary inlet, a connecting port and an atmospheric pressure interface, the capillary inlet is used to introduce charged ions into the first receiving cavity in the first cavity, and the correction component is connected to the connecting port. Therefore, the correction component can apply a force to the charged ions that tend to enter the connecting port, so that the charged ions enter the atmospheric pressure interface and reduce the loss rate of charged ions.

[0010] In some embodiments, the correction assembly includes a second cavity and a correction electrode, wherein a second receiving cavity inside the second cavity is connected to the first receiving cavity through the communication port;

[0011] The correction electrode is disposed in the second receiving cavity and is used to generate an electric field force acting on the charged ions.

[0012] In some embodiments, the correction assembly further includes an air inlet communicating with the second accommodating cavity, the air inlet being used to introduce inert gas, and the force including the impact force generated by the inert gas.

[0013] In some embodiments, the ion source structure further includes an adjustment component connected to the correction component, the adjustment component being used to drive the correction component to move or rotate relative to the first cavity to adjust the angle between the axis of the atmospheric pressure interface and the applied force.

[0014] In some embodiments, the adjustment assembly includes a swing arm and a power component; wherein,

[0015] One end of the swing arm is connected to the correction assembly, and the other end of the swing arm is connected to the power component. The power component is connected to the first cavity, and the power component is used to drive the swing arm and the correction assembly to rotate together relative to the first cavity.

[0016] In some embodiments, two adjustment components are provided, and the two adjustment components are located on opposite sides of the first cavity.

[0017] In some embodiments, the ion source structure further includes a telescopic component, the first cavity and the correction component are respectively connected to opposite ends of the telescopic component, and the communication port and the correction component are connected through the telescopic component.

[0018] In some embodiments, the ion source structure further includes an ion detector for detecting charged ions entering the communication port.

[0019] In some embodiments, the first cavity is a charged shell, and the polarity of the charge on the first cavity is the same as the polarity of the charged ions.

[0020] Secondly, embodiments of this application provide a mass spectrometer, which includes the ion source structure described in the first aspect.

[0021] The mass spectrometer provided in this application has the following advantages:

[0022] Since the first cavity is provided with a capillary inlet, a connecting port and an atmospheric pressure interface, the capillary inlet is used to introduce charged ions into the first receiving cavity in the first cavity, and the correction component is connected to the connecting port. Therefore, the correction component can apply a force to the charged ions that tend to enter the connecting port, so that the charged ions enter the atmospheric pressure interface and reduce the loss rate of charged ions. Attached Figure Description

[0023] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0024] Figure 1 This is a schematic diagram of the ion source structure in one embodiment of this application;

[0025] Figure 2 yes Figure 1 The top view of the ion source structure shown;

[0026] Figure 3 yes Figure 1 The diagram shows a bottom view of the ion source structure.

[0027] Figure 4 yes Figure 1 The right view of the ion source structure shown;

[0028] Figure 5 yes Figure 4 The diagram shows a cross-sectional view of the ion source structure along the KK direction.

[0029] The markings in the diagram mean:

[0030] 100. Ion source structure;

[0031] 10. First cavity;

[0032] 11. First receiving cavity; 12. Atmospheric pressure interface; 13. Communication port;

[0033] 20. Ion source;

[0034] 30. Correction components;

[0035] 31. Second cavity; 311. Second receiving cavity; 32. Electrode; 33. Air inlet;

[0036] 40. Adjustment components;

[0037] 41. Swing arm; 42. Power component;

[0038] 50. Telescopic components;

[0039] 60. Ion detection device. Detailed Implementation

[0040] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0041] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on or indirectly on that other component. When a component is referred to as being "connected to" another component, it can be directly connected to or indirectly connected to that other component.

[0042] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0043] In this specification, references to "one embodiment," "some embodiments," or simply "embodiment" mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. Furthermore, in one or more embodiments, specific features, structures, or characteristics may be combined in any suitable manner.

[0044] The core function of the ion source in a mass spectrometer is to convert sample substances into detectable or usable charged ions. Specific voltages need to be applied at the ion source outlet and atmospheric pressure interface to form charged ions.

[0045] Under atmospheric pressure, although charged ions are affected by the electric field force, there is also a large amount of background gas in the atmosphere. When charged ions move by relying solely on the electric field force, some of them tend to deviate from their original direction when they collide with the background gas in the atmosphere and cannot enter the atmospheric pressure interface, resulting in a high loss rate of charged ions.

[0046] In view of this, this application provides an ion source structure and a mass spectrometer. The first cavity is provided with a capillary inlet, a connecting port and an atmospheric pressure interface. The capillary inlet is used to introduce charged ions into the first receiving cavity in the first cavity. The correction component is connected to the connecting port. Therefore, the correction component can apply a force to the charged ions that tend to enter the connecting port, so that the charged ions enter the atmospheric pressure interface and reduce the loss rate of charged ions.

[0047] To illustrate the technical solution of this application, the following description is provided in conjunction with specific accompanying drawings and embodiments.

[0048] Please refer to Figures 1 to 5 , Figure 1 This is a schematic diagram of the ion source structure 100 in one embodiment of this application. Figure 2 yes Figure 1 The top view of the ion source structure 100 shown is shown. Figure 3 yes Figure 1 The diagram shows a bottom view of the ion source structure 100. Figure 5 yes Figure 4 The ion source structure 100 shown is a cross-sectional view along the KK direction.

[0049] In a first aspect, embodiments of this application provide an ion source structure 100, including a first cavity 10 and a correction component 30.

[0050] The first cavity 10 is provided with a capillary inlet 20, a connecting port 13 and an atmospheric pressure interface 12. The capillary inlet 20 is used to introduce charged ions into the first receiving cavity 11 inside the first cavity 10.

[0051] Both the atmospheric pressure port 12 and the connecting port 13 are connected to the first receiving cavity 11, where charged ions are located. The atmospheric pressure port 12 can be connected to the sample injection valve of the prototype.

[0052] The correction component 30 is connected to the connection port 13. The correction component 30 is used to apply a force to charged ions that tend to enter the connection port 13, so that the charged ions enter the atmospheric pressure interface 12.

[0053] In order to form charged ions, a specific voltage is generally applied at the capillary inlet 20 and the atmospheric pressure interface 12 to create an ionizing electric field. Under atmospheric pressure, the charged ions are acted upon by the electric field force of the ionizing electric field and move towards the atmospheric pressure interface 12, thus directly entering the mass spectrometer through the atmospheric pressure interface 12 (e.g., ...). Figure 5(As shown by the middle arrow a). However, in order to allow charged ions to enter the first cavity 10 via the capillary, a carrier gas is generally used to carry the charged ions into the first cavity 10. Therefore, the charged ions are affected by the carrier gas. When charged ions collide with the background gas, they tend to deviate from their original direction, resulting in some charged ions deviating from their original direction when colliding with the background gas at atmospheric pressure, and having a tendency to enter the connecting port 13 (e.g., Figure 5 As shown by arrow c), if left untreated, these charged ions will enter the connecting port 13 and will not be able to enter the atmospheric pressure interface 12. Therefore, the correction component 30 can apply a force to these charged ions to allow them to enter the atmospheric pressure interface 12 (as shown by arrow c). Figure 5 (As indicated by the middle arrow b).

[0054] The relative positions of the capillary inlet 20, the atmospheric pressure port 12, and the connecting port 13 include, but are not limited to, the following arrangements:

[0055] The connecting port 13 is located on the lower side of the first cavity 10, and the atmospheric pressure port 12 is located on one side of the first cavity 10 in the horizontal direction. Some charged ions, besides easily deviating from their original direction when colliding with the background gas in the atmosphere, also tend to enter the connecting port 13 due to gravity (e.g., ...). Figure 5 (As indicated by the middle arrow c).

[0056] As can be seen from the above, the ion source structure 100 provided in this application embodiment has a capillary inlet 20, a connecting port 13 and an atmospheric pressure interface 12 in the first cavity 10. The capillary inlet 20 is used to introduce charged ions into the first receiving cavity 11 in the first cavity 10, and the correction component 30 is connected to the connecting port 13. Therefore, the correction component 30 can be used to apply a force to the charged ions that have a tendency to enter the connecting port 13, so that the charged ions enter the atmospheric pressure interface 12 and reduce the loss rate of charged ions.

[0057] Please refer to Figures 4 to 5 The correction component 30 includes a second cavity 31 and a correction electrode 32. The second receiving cavity 311 inside the second cavity 31 is connected to the first receiving cavity 11 through the communication port 13.

[0058] The correction electrode 32 is disposed in the second receiving cavity 311 and is used to generate an electric field force acting on the charged ions.

[0059] With this configuration, the electric field force generated by the correction electrode 32 can be applied to charged ions that tend to enter the communication port 13, so that the charged ions can enter the atmospheric pressure interface 12.

[0060] Optionally, the correction assembly 30 further includes an air inlet 33 connected to the second receiving cavity 311, the air inlet 33 being used to introduce inert gas, and the force includes the impact force generated by the inert gas.

[0061] With this configuration, the charged ions can enter the atmospheric pressure interface 12 by applying the collision force generated by the inert gas to the charged ions that tend to enter the communication port 13.

[0062] For example, the second cavity 31 is located below the first cavity 10, and the air inlet 33 is located on the lower side of the second cavity 31.

[0063] It should be noted that the inert gas can be nitrogen or argon, etc. Inert gases can be high-temperature gases, which can act as a solvent for charged ions.

[0064] It is understandable that, due to the different mass and velocity of charged ions, the electric field force generated by the correction electrode 32 and the collision force generated by the inert gas are also different. Therefore, the electric field force generated by the fixed correction electrode 32 and the collision force generated by the inert gas are not applicable to all charged ions. Thus, the electric field force generated by the correction electrode 32 and the collision force generated by the inert gas can be adjusted in real time to correct the bias of charged ions, allowing some charged ions to enter the atmospheric pressure interface 12.

[0065] In the above embodiments, considering that the electric field force of the ionizing electric field and the electric field force generated by the correction electrode 32 will interfere with each other, thereby affecting the formation and aggregation of charged ions, a time control method can be used to avoid the mutual interference of the two electric field forces.

[0066] For example, if 1 second is divided into N parts (N is a positive integer greater than or equal to 3), in the first 1 / N second, the ionization electric field applied to the ion source 20 interface and the atmospheric pressure interface 12 completes the formation of charged ions.

[0067] Then, in 2 / N seconds, the voltage of the ion source 20 and the sample injection are turned off. Below the ion source 20, the electric field force generated by the correction electrode 32 and the collision force generated by the inert gas are applied to migrate the charged ions that have not entered the atmospheric pressure interface 12 to the vicinity of the atmospheric pressure interface 12.

[0068] Then, at 3 / N seconds, depending on the sample concentration and actual situation, you can choose whether to open the sample injection valve of the atmospheric pressure interface 12 and open the ionization electric field at the same time. At this time, under the drive of the ionization electric field and the air pressure, the charged ions near the atmospheric pressure interface 12 will enter the atmospheric pressure interface 12 (during this process, you can also add a dynamometer or other electric field means to drive the charged ions).

[0069] Please refer to Figures 1 to 5In some embodiments, the ion source structure 100 further includes an adjustment component 40 connected to the correction component 30. The adjustment component 40 is used to drive the correction component 30 to move or rotate relative to the first cavity 10 to adjust the angle between the axis of the atmospheric pressure interface 12 and the applied force.

[0070] By adopting the above scheme, the force exerted by the correction component 30 on the charged ions can be adjusted according to the different masses and velocities of the charged ions, thereby enabling charged ions with a tendency to enter the communication port 13 to enter the atmospheric pressure port 12.

[0071] It is understood that the adjusting component 40 is connected to the second cavity 31, and the adjusting component 40 is used to drive the second cavity 31 to move or rotate relative to the first cavity 10, so as to adjust the angle between the axis of the atmospheric pressure interface 12 and the applied force. The adjusting component 40 may include a motor, a cylinder or a hydraulic cylinder, etc.

[0072] The adjustment component 40 includes a swing arm 41 and a power component 42.

[0073] As one possible implementation, one end of the swing arm 41 is connected to the first cavity 10, and the other end of the swing arm 41 is connected to the power component 42. The power component 42 is connected to the correction assembly 30, and the power component 42 is used to drive the correction assembly 30 to rotate relative to the first cavity 10, such as driving the correction assembly 30 to rotate relative to the first cavity 10 along... Figure 1 and Figure 5 Rotate in the direction indicated by the middle arrow M and the arrow N.

[0074] With this configuration, the correction assembly 30 can be driven to rotate relative to the first cavity 10 by the power component 42, so as to adjust the angle between the axis of the atmospheric pressure interface 12 and the applied force.

[0075] For example, the power component 42 is connected to the second cavity 31, and the power component 42 is used to drive the second cavity 31 to rotate relative to the first cavity 10. The power component 42 can be a motor or a rotary cylinder, etc.

[0076] As another possible implementation, one end of the swing arm 41 is connected to the correction assembly 30, and the other end of the swing arm 41 is connected to the power component 42. The power component 42 is connected to the first cavity 10, and the power component 42 is used to drive the swing arm 41 and the correction assembly 30 to rotate together relative to the first cavity 10, such as driving the correction assembly 30 relative to the first cavity 10 along... Figure 1 and Figure 5 Rotate in the direction indicated by the middle arrow M and the arrow N.

[0077] With this configuration, the swing arm 41 and the correction assembly 30 can be driven by the power component 42 to rotate together relative to the first cavity 10, so as to adjust the angle between the axis of the atmospheric pressure interface 12 and the applied force.

[0078] For example, one end of the swing arm 41 is connected to the second cavity 31, and the power component 42 is used to drive the swing arm 41 and the second cavity 31 to rotate together relative to the first cavity 10. The power component 42 can be a motor or a rotary cylinder, etc.

[0079] Optionally, two adjustment components 40 are provided, and the two adjustment components 40 are located on opposite sides of the first cavity 10.

[0080] This configuration makes the correction component 30 more stable when rotating relative to the first cavity 10.

[0081] Optionally, the ion source structure 100 also includes a telescopic member 50, the first cavity 10 and the correction component 30 are respectively connected to the opposite ends of the telescopic member 50, and the communication port 13 and the correction component 30 are connected through the telescopic member 50.

[0082] This configuration ensures that the connecting port 13 and the second receiving cavity 311 remain connected during the process of the adjustment component 40 driving the correction component 30 to move or rotate relative to the first cavity 10.

[0083] For example, the first cavity 10 and the second cavity 31 are respectively connected to the opposite ends of the telescopic member 50, and the connecting port 13 and the second receiving cavity 311 are connected through the telescopic member 50.

[0084] It should be noted that the telescopic component 50 can be a rubber hose, plastic hose, or silicone hose, etc.

[0085] Please refer to Figures 4 to 5 In some embodiments, the ion source structure 100 further includes an ion detector 60 for detecting charged ions entering the communication port 13.

[0086] By adopting the above scheme, the force applied to the charged ions by the correction component 30 can be dynamically adjusted according to the number of charged ions entering the communication port 13, so that more charged ions can enter the atmospheric pressure interface 12.

[0087] For example, when the ion detector 60 detects a large number of charged ions entering the communication port 13, the electric field force generated by the correction electrode 32 and the collision force generated by the inert gas can be increased. Alternatively, the adjustment component 40 can be used to drive the correction component 30 to move or rotate relative to the first cavity 10 to adjust the angle between the axis of the atmospheric pressure interface 12 and the force. Both can also be performed simultaneously.

[0088] For example, the ion detector 60 is disposed at the bottom of the second receiving cavity 311.

[0089] Optionally, the ion detector 60 is a Faraday cup.

[0090] With this setup, charged ions can be collected using a Faraday cup. The charged ions form an electric current in the Faraday cup, and the current signal is then converted into a measurable voltage or digital signal by a circuit, thereby enabling the quantitative detection of charged ions.

[0091] Understandably, if the Faraday cup current is too large, it means that the correction component 30 has not played an effective role. The electric field force generated by the correction electrode 32 and the collision force generated by the inert gas can be increased. Alternatively, the adjustment component 40 can be used to drive the correction component 30 to move or rotate relative to the first cavity 10 to adjust the angle between the axis of the atmospheric pressure interface 12 and the force. Both can also be done simultaneously.

[0092] Please refer to Figures 4 to 5 In some embodiments, the first cavity 10 is a charged shell, and the polarity of the charge on the first cavity 10 is the same as the polarity of the charged ions.

[0093] This configuration reduces the probability of charged ions coming into contact with the first cavity 10, preventing some charged ions from colliding with the first cavity 10 and causing them to annihilate directly.

[0094] Secondly, embodiments of this application provide a mass spectrometer, which includes the ion source structure 100 as described in the first aspect.

[0095] The mass spectrometer provided in this application embodiment has a first cavity 10 with a capillary inlet 20, a connecting port 13, and an atmospheric pressure interface 12. The capillary inlet 20 is used to introduce charged ions into the first receiving cavity 11 in the first cavity 10, and the correction component 30 is connected to the connecting port 13. Therefore, the correction component 30 can be used to apply a force to charged ions that tend to enter the connecting port 13, so that the charged ions enter the atmospheric pressure interface 12, reducing the loss rate of charged ions and improving the sensitivity of the mass spectrometer.

[0096] The above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. An ion source structure, characterized by, include: The first cavity (10) is provided with a capillary inlet (20), a connecting port (13) and an atmospheric pressure interface (12). The capillary inlet (20) is used to introduce charged ions into the first receiving cavity (11) inside the first cavity (10). Correction component (30) is connected to the communication port (13). The correction component (30) is used to apply a force to the charged ions so that the charged ions enter the atmospheric pressure interface (12).

2. The ion source structure of claim 1, wherein, The correction component (30) includes a second cavity (31) and a correction electrode (32). The second receiving cavity (311) inside the second cavity (31) is connected to the first receiving cavity (11) through the communication port (13). The correction electrode (32) is disposed in the second receiving cavity (311) and is used to generate an electric field force acting on the charged ions.

3. The ion source structure of claim 2, wherein, The correction component (30) further includes an air inlet (33) connected to the second receiving cavity (311), the air inlet (33) being used to introduce inert gas, and the force including the collision force generated by the inert gas.

4. The ion source structure of claim 1, wherein, The ion source structure (100) further includes an adjustment component (40), which is connected to the correction component (30). The adjustment component (40) is used to drive the correction component (30) to move or rotate relative to the first cavity (10) to adjust the angle between the axis of the atmospheric pressure interface (12) and the force.

5. The ion source structure of claim 4, wherein, The adjustment assembly (40) includes a swing arm (41) and a power component (42); wherein, One end of the swing arm (41) is connected to the correction component (30), and the other end of the swing arm (41) is connected to the power component (42). The power component (42) is connected to the first cavity (10). The power component (42) is used to drive the swing arm (41) and the correction component (30) to rotate together relative to the first cavity (10).

6. The ion source structure of claim 5, wherein, Two adjustment components (40) are provided, and the two adjustment components (40) are respectively located on opposite sides of the first cavity (10).

7. The ion source structure according to claim 3, characterized in that, The ion source structure (100) also includes a telescopic component (50), the first cavity (10) and the correction component (30) are respectively connected to the opposite ends of the telescopic component (50), and the communication port (13) and the correction component (30) are connected through the telescopic component (50).

8. The ion source structure of any of claims 1 to 7, wherein, The ion source structure (100) further includes an ion detection element (60) for detecting the charged ions entering the communication port (13).

9. The ion source structure of any of claims 1 to 7, wherein, The first cavity (10) is a charged shell, and the polarity of the charge on the first cavity (10) is the same as the polarity of the charged ions.

10. A mass spectrometer, characterized by, The mass spectrometer includes the ion source structure (100) as described in any one of claims 1 to 9.

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