Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method of testing an electronic control system

An electronic control system, control system technology, applied in the direction of test/monitor control system, general control system, control/regulation system, etc., can solve problems such as high overhead

Active Publication Date: 2008-03-26
DSPACE DIGITAL SIGNAL PROCESSING & CONTROL ENG
View PDF0 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage of this approach is that the test model and the environment model are functionally dependent on each other, since the environment model has to be implemented through dedicated test model-related function calls (OPAL-RT Technologies Inc.: "RTLAB, Product Description, Detailed Characteristics, Typical application”; 2005)
This creates a significantly high overhead in the environment model and thus leads to a noticeable runtime disadvantage when the function of the test model is an "empty function"

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method of testing an electronic control system
  • Method of testing an electronic control system
  • Method of testing an electronic control system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] 1 to 6 illustrate certain aspects of the testing method of the present invention, the scheduling method of the present invention and the testing device of the present invention by means of different embodiments, respectively.

[0041] FIG. 1 shows a typical structure of a test environment for testing an electronic control system 1, which is suitable for carrying out the method of the invention. The electronic system under test 1 is here connected to the testing device 3 via a data channel 2 . The environment model 4 is calculated on the test device 3 , wherein the environment model 4 outputs the environment model data to the control system 1 through the test device 3 , and receives the control system data from the control system 1 through the data channel 2 to interact with the control system 1 .

[0042] The testing of the control system 1 by the test device 3 is basically carried out by influencing the environment model 4 executed on the test device 3 . To this end, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for testing at least one electronic control system (1) is showed and described, wherein, the control system (1) connects with testing device(3) by a data channel (2), the testing device calculates at least one environmental model (4) which exports the environmental model data to the control system (1) by the testing device (3), receives the data of the control system from the control system on the data channel (2) and interacts with the control system (1). The method of the invention overcomes the fault of the existing method in the technology, which includes executing at least one test model (5) for influencing the environmental model (4) and / or calculating and / or electronic control system (1) of the environmental model (4), the test model (5) or these test models (5a, 5b) executed functionally independent of the environment model (4) and on a testing operation that is in synchronization with the environment model (4).

Description

technical field [0001] The invention relates to a method for testing at least one electronic control system, wherein the control system is connected via a data channel to a test device, at least one environment model is calculated on the test device, and the environment model is transferred to the environment model by the test device Data is output to the control system and interacts with the control system by receiving control system data from the control system on the data channel. Furthermore, the invention relates to a scheduling method for implementing at least one test model on a simulation computer, in which the first scheduler is activated on the basis of an external activation signal. Finally, the invention also relates to a test device for testing at least one electronic control system, wherein the test device is connected to the control system via a data channel, at least one environment model is calculated with the test device, and the environment model is calculat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05B23/02
CPCG05B2219/23446G05B19/0428G05B17/02G05B23/0256
Inventor 尼古拉·布拉斯基拉尔夫·G·博尔格豪格·克瑞斯普罗伯特·雷恩费尔尼埃杜尔德·米勒尔朱伯斯特·瑞契尔特托马斯·沃弗尔
Owner DSPACE DIGITAL SIGNAL PROCESSING & CONTROL ENG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com