Movable loading device capable of ensuring accurate contraposition of electronic element

Abstract

The invention provides a transferring device capable of accurately aligning electronic elements. The transferring device is arranged on an operation area of a machine table and comprises a test station, an image taking mechanism capable of connecting a signal to a central controller, a feeding carrier displaced above the image taking mechanism, a first material-collecting carrier and a second material-collecting carrier which are positioned on the two sides of the test station, as well as a first transferring and placing device and a second transferring and placing device. The feeding carrier is used for bearing the electronic elements to be tested; the first and the second transferring and placing devices are used for transferring and placing operations; the feeding carrier is provided with a bearing seat for adjusting the position and the angle of the bearing seat; the bearing seat is used for bearing the electronic elements to be tested in a feeding position and delivering the electronic elements to the position of the image taking mechanism to carry out image taking; after the comparison and the operation are carried out to the electronic elements through the central controller, the bearing seat of the feeding carrier is commanded to carry out the compensation and correction of the position and the angle; and the first and the second transferring and placing devices can be used for accurately taking and transferring the electronic elements to be tested on the bearing seat of the feeding carrier to the test station and carrying out a test operation, so that the equipment cost can be saved and the test quality is effectively improved.

Description

technical field [0001] The invention relates to an electronic component testing device, in particular to a transfer device for reciprocatingly transferring electronic components to be tested. Background technique [0002] Today's electronic components are actively developing towards small, thin, and small-volume micro-contacts. Therefore, the accuracy requirements for placing small-volume micro-contact electronic components in the test socket are quite high. Effective electrical contact cannot be made, which reduces the quality of the test. [0003] see figure 1 , figure 2 , image 3 , it is China Taiwan Patent Application No. 93110783 IC detection device (two) patent case that the present inventor applies for, and described detection device comprises test bench 10, the first, the second feeding mechanism 20,30 and feeding and discharging Mechanisms 40, 50, wherein, the first and second retrieving mechanisms 20, 30 are provided on both sides of the test bench 10, and ea...

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