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Panel defect measuring ruler of organic light-emitting display

A technology of light-emitting display and measuring ruler, applied in the field of measuring ruler, can solve the problems of many measuring steps, large human error, inconvenient measurement, etc., and achieve the effect of simple operation and small human error

Inactive Publication Date: 2011-06-15
DONGGUAN ANWELL DIGITAL MASCH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, using ordinary measurement tools to measure the panel defects of organic light-emitting displays (OLED displays), it is necessary to check the standard data each time, and the measurement is inconvenient, with many measurement steps and large human errors

Method used

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Embodiment Construction

[0016] In order to describe the technical content, structural features, achieved goals and effects of the present invention in detail, the following will be described in detail in conjunction with the embodiments and accompanying drawings.

[0017] refer to figure 1 , the panel defect measuring ruler 100 of the organic light emitting display of the present invention is made of a transparent material, the edge is indicated with a scale, and the upper right corner is marked with an angle meter (Angle meter) 10. Compared with the prior art, the organic light emitting display of the present invention The defect pattern of the organic light emitting display (OLED display) panel is marked on the scale surface of the panel defect measuring ruler 100 .

[0018] refer to figure 1 , the defect pattern includes a first defect pattern (EL CORNER) 11, which is used to measure defects at corners of the cut OLED display substrate glass, and the first defect pattern 11 includes a transparent...

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Abstract

The invention discloses a panel defect measuring ruler of an organic light-emitting display, which is used for measuring panel defects of an organic light-emitting display. In the invention, seven defect patterns of the organic light-emitting display panel are marked on the ruler surface of the panel defect measuring ruler of the organic light-emitting display and are respectively used for measuring defects of cut substrate glass edges and corners, defects of cut rear cover glass edges and corners, defects of the binding edge of substrate glass and a drive module, the defects of uncut edges of the substrate glass, the surface defects of the length, the substrate and the rear cover glass of the width after adhesive line pressing when the substrate and the rear cover glass are bonded and the defects of a Polaroid of the display screen of the organic light-emitting display. In the invention, the defect on the OLED (Organic Light Emitting Diode) display panel is directly compared with the defect pattern on the rule surface while measuring, and if the projection border of the defect exceeds the area of the defect pattern, the OLED display panel is unavailable. Compared with the prior art, the invention realizes the professionalization of panel defect measurement and has the advantages of simple operation and small artificial error.

Description

technical field [0001] The invention relates to a measuring ruler, in particular to a measuring ruler for measuring panel defects of an organic light-emitting display. Background technique [0002] The panel defect measurement of organic light-emitting display (OLED) generally needs to measure several items: (1) measure the size of the defect at the corner of the OLED display substrate glass after cutting; (2) measure the corner of the OLED display back cover glass after cutting (3) measure the size of the defect at the edge where the OLED display substrate glass is bound to the IC (driver module); (4) measure the defect size at the other 3 edges of the OLED display substrate glass; (5) measure The width of the UV glue line after bonding the OLED display substrate and the back cover glass; (6) measuring the size of the surface defects (mainly pits) on the substrate and the back cover glass; (7) measuring the polarized light of the OLED display The defect size of the slice. ...

Claims

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Application Information

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IPC IPC(8): G01B3/14G01B3/04
Inventor 杨明生范继良刘惠森王学敬王曼媛王勇
Owner DONGGUAN ANWELL DIGITAL MASCH CO LTD
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