Ion source system and mass spectrometer with atmospheric pressure interface

Abstract

The invention provides an ion source system with an atmospheric pressure interface, which includes an atmospheric pressure ion source, wherein a vacuum ion source is connected downstream of the atmospheric pressure ion source. The invention also provides a mass spectrometer using the ion source system described in the invention as an ion source. The ion source system provided by the present invention adopts a combination of an atmospheric pressure ion source and a vacuum ion source, is applicable to detection samples of various forms, and can carry out secondary ionization on the samples to be tested to ensure the transmission efficiency of ions. The mass spectrometer provided by the invention can significantly improve the transmission efficiency of ions, realize continuous sample injection detection, improve the scanning speed of the instrument, and is especially suitable for miniaturized mass spectrometers.

Description

technical field [0001] The invention relates to the field of mass spectrometry, in particular to an ion source system with an atmospheric pressure interface and a mass spectrometer. Background technique [0002] Mass spectrometry is an analytical method that separates and detects compounds according to different mass-to-charge ratios (m / z) to identify components and structures. Mass spectrometry is a biochemical analysis technique with high sensitivity and high selectivity. As a qualitative and quantitative chemical analysis method, it has been widely used in academic research, industrial product development, legal identification, supervision and other fields. In recent years, especially after major scientific and social events such as the anti-terrorist chemical warfare crisis, food, environmental safety and outer space exploration, the demand for on-site chemical analysis in my country and other countries in the world has surged. [0003] Ion sources working under atmosph...

AI Technical Summary

Problems solved by technology

[0007] In order to overcome a series of technical defects such as the low ion transmission efficiency of the existing atmospheric pressure interface ion source mass spectrometer, and the vacuum ion source mass spectrometer is limited by the shape of the sample, to find an ion source system with wider applicability, the purpose of the present invention is to provide a Ion Source Systems with Atmospheric Pressure Interface

Images