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Clamp for detecting external dimension of packaged chip and detection method of clamp

A technology for appearance size and chip detection, which is applied in the direction of measuring devices, mechanical measuring devices, and mechanical devices, etc., can solve the problems of time-consuming and labor-intensive, and achieve the effects of reducing inspection personnel, improving detection efficiency, and simple and convenient detection process

Active Publication Date: 2015-06-03
四川明泰微电子科技股份有限公司
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to overcome the time-consuming and labor-intensive defects of the existing detection methods, the present invention provides a fixture for detecting the appearance size of the packaged chip, which helps inspectors to detect the flatness and span size of the PIN pin of the packaged chip , to detect multiple packaged chips at one time, the detection efficiency is greatly improved, and the inspection personnel do not need to observe carefully to avoid visual fatigue of the inspection personnel

Method used

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  • Clamp for detecting external dimension of packaged chip and detection method of clamp
  • Clamp for detecting external dimension of packaged chip and detection method of clamp
  • Clamp for detecting external dimension of packaged chip and detection method of clamp

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Embodiment Construction

[0032] The present invention will be further described below in conjunction with the embodiments, and the described embodiments are only a part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, other used embodiments obtained by persons of ordinary skill in the art without creative efforts all belong to the protection scope of the present invention.

[0033] This embodiment provides a jig for detecting the appearance size of a packaged chip. The main purpose of this jig is to facilitate the detection of whether the PIN pins of the packaged chip are flat and whether the width dimension meets the requirements, without the need for testing workers to use measuring tools one by one. Inspection, relieve the visual fatigue of inspection workers, and also greatly improve the inspection efficiency, reduce the number of inspection workers, and reduce the labor cost of the enterprise. Moreover, the fixture has a simple struct...

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Abstract

The invention discloses a clamp for detecting an external dimension of a packaged chip and a detection method of the clamp. The clamp comprises a base, a supporting plate, a rail seat, a rail, a detecting jig and cover plates, wherein the supporting plate is fixed on the base; the rail seat is hinged on the supporting plate; the rail is arranged on the rail seat; two cover plates are respectively fixed at two ends of the rail seat; the detecting jig is arranged on the rail; the detecting jig comprises a detecting jig body; a channel, through which the packaged chip can pass, is arranged on the detecting jig; the channel is adaptive to the external dimension of the packaged chip. According to the clamp for detecting the external dimension of the packaged chip, the detection efficiency is greatly improved. The invention further provides the detection method. The detection method provided by the invention has the advantages of simplicity and easiness in operation.

Description

technical field [0001] The invention relates to the field of chip packaging, in particular to a fixture and a detection method for detecting whether dimensions such as flatness and span of PIN pins after chip packaging meet requirements. Background technique [0002] Chip packaging is an important process step in chip molding, and the quality of chip packaging directly affects the use of chips. Therefore, the requirements on the appearance size of the packaged chip are also very strict. After the packaging factory completes the chip packaging, it will inspect the appearance and size of the packaged product, such as detecting whether the PIN pin is flat, whether the detection span meets the requirements, and so on. The detection method generally uses measuring tools (projectors, calipers, micrometers, etc.) for detection. Although such detection methods can detect products with unqualified appearance and size, this detection method is time-consuming and labor-intensive, and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B5/00
Inventor 王铁冶
Owner 四川明泰微电子科技股份有限公司
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