Testing device for endurance of closing and opening of external unlocking door of automobile sliding door
A durability test and sliding door technology, which is applied in the direction of measuring devices, testing of mechanical components, testing of machine/structural components, etc., can solve the problem that the test parts of the sliding door subsystem cannot be certified, and cannot be unlocked and switched outside Door fatigue durability test, failure to meet the technical requirements of the test, etc., to achieve the effect of accurate and reliable test data, simple structure, and accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0017] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.
[0018] Such as figure 1 and figure 2 As shown, the present invention includes a test bench 10, a power unit fixed on the test bench 10, a control system, a sliding device, and an external unlocking and door opening device. The test bench is used to fix the test vehicle 1, and the external unlocking and door opening The device is fixed on the sliding device, the power device is connected with the sliding device, and the control system is used to control the power device to provide power, and to control the unlocking of the external unlocking device.
[0019] The external unlocking and external opening and closing test device is more in line with the actual use.
[0020] The external unlocking and door opening device includes a handle frock 3, a first swing rod 2, a first actuator 6 and an unlocking contact 4, and the handle frock 3 is clampe...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com