Device used for testing LED components

A component and component technology, applied in the field of LED component testing, can solve the problems of large influence of welding resistance, easy damage to LED components, and waste of LED component samples.

Inactive Publication Date: 2017-02-15
CHENGDU MEILYU SCI & TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

image 3 It is a structural schematic diagram of an LED lamp in the prior art, including an LED element 19 and LED electrodes 20 on both sides thereof, Figure 4 It is a side view of the LED element 19. Due to the limitation of the size of the LED element itself, it is difficult to weld the wire on the LED electrode, and it is often easy to damage the LED element itself, which causes a waste of the LED element sample; on the other hand, due to the small resistance of the LED element itself , the welding resistance caused by the welding method has a great influence on it, and the accuracy of the test data is not high when the LED test is performed.

Method used

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  • Device used for testing LED components
  • Device used for testing LED components
  • Device used for testing LED components

Examples

Experimental program
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Effect test

Embodiment Construction

[0016] The present invention will be further described below in conjunction with accompanying drawing and specific embodiment:

[0017] Such as figure 1 and figure 2 As shown, a device for testing LED components of the present invention includes a frame 1 for installing various components, an inclined bottom plate 2 is provided on the frame 1, and a first baffle plate 3 is installed in parallel on the upper surface of the bottom plate 2 With the second baffle plate 4, the bottom plate 2, the first baffle plate 3 and the second baffle plate 4 encircle an inclined conveying passage 5; connected to the start.

[0018] The first stopper 6 and the second stopper 7 are telescopically installed on the second baffle plate 4. In this embodiment, the first stopper 6 is connected to the first telescopic cylinder 11, and the second stopper 7 is connected to the second stopper 4. The telescopic cylinders 12 are connected, and the first blocking member 6 is located downstream of the se...

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Abstract

The invention discloses a device used for testing LED components. The device comprises a frame, wherein the frame is provided with an inclined base plate, an upper surface of the base plate is parallelly equipped with a first baffle plate and a second baffle plate, the base plate, the first baffle plate and the second baffle plate circle to form an inclined conveying channel, a first blocking member and a second blocking member are arranged at the second baffle plate in a telescopic penetration mode, the conveying channel is separated by the first blocking member and the second blocking member to form a test channel segment, the test channel is internally provided with a first conductive electrode and a second conductive electrode oppositely, the first conductive electrode is fixedly mounted on the second baffle plate, the second conductive electrode is movably arranged, and an interval of the first conductive electrode and the second conductive electrode is adjustable. The device is advantaged in that the first conductive electrode and the second conductive electrode are respectively in extrusion contact with LED electrodes at two sides of the LED components to realize electrical connection, so tests are accomplished, through setting a conveying belt and scraping wings, disqualified LED components after tests can be screened out.

Description

technical field [0001] The invention belongs to the technical field of testing LED components, and in particular relates to a device for testing LED components. Background technique [0002] Semiconductor LED is an important optoelectronic device, which is widely used in scientific research and industrial and agricultural production. Light-emitting diodes may be small, but accurate measurement of their light and radiation parameters is not an easy task. [0003] The existing test method is to weld the two poles of a single LED lamp with wires. image 3 It is a structural schematic diagram of an LED lamp in the prior art, including an LED element 19 and LED electrodes 20 on both sides thereof, Figure 4 It is a side view of the LED element 19. Due to the limitation of the size of the LED element itself, it is difficult to weld the wire on the LED electrode, and it is often easy to damage the LED element itself, which causes a waste of the LED element sample; on the other han...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor陈文
OwnerCHENGDU MEILYU SCI & TECH CO LTD