A material electromagnetic radiation performance testing probe station

Abstract

The present invention discloses a material electromagnetic radiation performance test probe station, including a video microscope mechanism, a scanning receiving probe, a scanning adjustment mechanism for adjusting the position of the scanning receiving probe, a stage for placing a test piece, a test seat supporting the stage, and a probe device capable of contacting and conducting with the test piece, wherein the test seat is provided with a probe adjustment mechanism for adjusting the position of the probe device. The probe adjustment mechanism is used to drive the probe of the probe device to contact and conduct with the test piece to receive power feed for material testing, the probe device is connected to an external signal receiving and processing instrument, and the parameter signal fed back by the test piece in an electromagnetic ray environment is processed by the signal receiving and processing instrument, thereby testing the near field and radiation characteristics of the two surfaces of the test piece.

Description

Technical Field

[0001] The invention relates to a testing device, in particular to a material electromagnetic radiation performance testing probe station. Background Art

[0002] Any material has electromagnetic radiation characteristics. If we need to test the electromagnetic radiation characteristics of a certain material, the traditional testing method is to connect the electromagnetic metamaterial to a standard connector through packaging technology, and then place it under the scanning frame for upper surface testing. Then turn the electromagnetic metamaterial over to test the other surface. Due to positioning errors, there are inherent misalignment errors in the results of the upper and lower surfaces. Therefore, the applicant has designed a material electromagnetic radiation performance test probe station to solve the above problem. Summary of the invention

[0003] In order to overcome the deficiencies of the prior art, the present invention provides a material electromagnetic radiation performance testing probe station, which can quickly and accurately test the electromagnetic radiation characteristics of materials of different geometric sizes, especially metamaterials or traditional test pieces with high-precision structural characteristics.

[0004] The technical solution adopted by the present invention to solve the technical problem is:

[0005] A material electromagnetic radiation performance test probe station, characterized in that it includes a video microscope mechanism, a scanning receiving probe, a scanning adjustment mechanism for adjusting the position of the scanning receiving probe, a stage for placing a test piece, a test seat supporting the stage, and a probe device that can contact and conduct with the test piece, and the test seat is provided with a probe adjustment mechanism for adjusting the position of the probe device.

[0006] The probe adjustment mechanism includes a slide arm and a slide arm moving unit that drives the slide arm to move forward and backward. The stage is supported by the slide arm. A slide plate connected to the slide arm through a guide rail is provided on the slide arm. The slide plate is moved left and right by the precision adjustment unit 1. A lifting plate connected to the slide plate through a guide rail is provided on the slide plate. The lifting plate is lifted and lowered by the precision adjustment unit 2. An angle fine-tuning mechanism that can drive the probe to rotate is provided on the lifting plate.

[0007] The angle fine-tuning mechanism includes two bearing seats relatively arranged on the lifting plate, the bearing seats are provided with a rotatable shaft, a swivel seat and a rotating block are fixed on the shaft, a rotating plate assembly is provided on the swivel seat, the probe is arranged on the rotating plate assembly, and two angle thread adjustment knobs are provided on the lifting plate, and the two angle thread adjustment knobs are respectively located on opposite sides of the rotating block.

[0008] The precision adjustment unit 1 includes a threaded adjustment button 1 and a return spring. The threaded adjustment button 1 is fixed to an L-shaped plate arranged on the slide arm, and the adjustment screw in the threaded adjustment button 1 can pass through the L-shaped plate to push the slide plate. The slide plate is located on the L-shaped plate. One end of the return spring is connected to the L-shaped plate, and the other end of the return spring is connected to the slide plate.

[0009] The second precision adjustment unit includes a second threaded adjustment button, two side plates arranged on the slide, and a rotating fork. The side plates are provided with avoidance holes, the rotating fork is located in the avoidance holes and is rotatably connected to the side plates. The adjustment screw of the second threaded adjustment button can push the rotating fork to lift the lifting plate through the rotating fork.

[0010] The slide arm moving unit comprises a slide arm driving motor, a slide arm lead screw and a slide arm guide rail which are arranged on the test seat. The slide arm is connected to a slide arm slider on the slide arm guide rail, and the slide arm driving motor is connected to the slide arm lead screw.

[0011] A microscope is also included.

[0012] The scanning adjustment mechanism includes a support beam and a sliding beam arranged on the test seat, the support beam is provided with a beam moving unit 1, the support beam is moved on the support beam by the beam moving unit 1, the sliding beam is provided with a beam seat plate, the beam seat plate is moved on the sliding beam by the beam moving unit 2, the beam seat plate is provided with a beam lifting plate, the beam lifting plate is moved on the beam seat plate by the beam moving unit 3, and the scanning receiving probe is arranged on the beam lifting plate.

[0013] The slide arm is provided with a positioning groove, and the edge of the loading platform is located in the positioning groove.

[0014] The beneficial effects of the present invention are as follows: the scanning receiving probe of the present invention emits electromagnetic rays, and the piece to be tested is placed on a stage in an electromagnetic ray environment. The probe of the probe device is driven by a probe adjustment mechanism to contact the piece to be tested and conduct to receive power for material testing. The probe device is connected to an external signal receiving and processing instrument, and the parameter signal fed back by the piece to be tested in the electromagnetic ray environment is processed by the signal receiving and processing instrument, thereby testing the near-field and radiation characteristics of the two surfaces of the piece to be tested.

[0015] The advantages are as follows:

[0016] 1. Reduce the error introduced by standard connectors.

[0017] 2. It reduces the work of welding and dismantling standard joints, making the operation more convenient and more standardized.

[0018] 3. The present invention can simultaneously test the near-field and radiation characteristics of the two surfaces of the electromagnetic metamaterial, greatly improving the test efficiency while avoiding the misalignment error caused by the positioning accuracy of the traditional method. (Note: Especially when testing large amounts of data, the traditional solution may take 2 to 3 weeks to test once, which significantly improves the test efficiency).

[0019] 3. The present invention can minimize the test error introduced by the uncertainty of the test instrument. (Note: Since the test instrument has a long-term stability index, when testing the upper and lower surfaces of the electromagnetic metamaterial separately, errors will be introduced due to environmental factors and different test time points.) BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The present invention is further described below in conjunction with the accompanying drawings and embodiments.

[0021] Figure 1 It is the overall structural view of the present invention;

[0022] Figure 2 It is a structural view of the sliding arm part;

[0023] Figure 3 This is a structural view of the sliding arm part from another direction. DETAILED DESCRIPTION

[0024] Reference Figures 1 to 3 The present invention discloses a material electromagnetic radiation performance test probe station, comprising a scanning receiving probe 1, a scanning adjustment mechanism for adjusting the position of the scanning receiving probe 1, a stage 2 for placing a test piece, a test seat 3 supporting the stage 2, and a probe 4 capable of contacting and conducting with the test piece, wherein the test seat 3 is provided with a probe adjustment mechanism for adjusting the position of the probe 4.

[0025] There are four slide arms 5 in the present application, which are arranged on the test seat 3 in pairs. The stage 2 is located in the middle position of the slide arms 5. There are two pairs of scanning receiving probes 1, which are respectively located at the upper and lower parts of the stage 2. The lower pair of scanning receiving probes 1 can be moved and raised and lowered in the plane through the scanning adjustment mechanism at the lower part, so as to adapt to the testing of test pieces of different specifications, and the upper pair of scanning receiving probes 1 can be moved and raised and lowered in the plane through the scanning adjustment mechanism at the upper part, and the scanning adjustment mechanism at the upper part is supported by four columns 6 and can be located above the stage 2. The size of the stage 2 can also be selected according to the specifications of the test piece, and the test piece is placed at a predetermined position on the stage 2.

[0026] As shown in the figure, the probe adjustment mechanism includes a slide arm 5 and a slide arm moving unit that drives the slide arm 5 to move forward and backward. The stage 2 is supported by the slide arm 5. The slide arm 5 is provided with a slide plate 7 connected to the slide arm 5 through a guide rail. The slide plate 7 is moved left and right by the precision adjustment unit 1; the slide plate 7 is provided with a lifting plate 8 connected to the slide plate 7 through a guide rail, and the lifting plate 8 is lifted and lowered by the precision adjustment unit 2; the lifting plate 8 is provided with an angle fine-tuning mechanism that can drive the probe 4 to rotate.

[0027] The precision adjustment unit 1 includes a threaded adjustment button 19 and a return spring (not shown in the figure). The threaded adjustment button 19 is fixed to an L-shaped plate 10 arranged on the slide arm 5, and the adjustment screw in the threaded adjustment button 19 can pass through the L-shaped plate 10 to push the slide plate 7. The slide plate 7 is located on the L-shaped plate 10. One end of the return spring is connected to the L-shaped plate 10, and the other end of the return spring is connected to the slide plate 7. The above structure is simple, and there is no need to set a threaded adjustment button 19 on both sides of the slide plate 7, thereby saving costs. The L-shaped plate 10 is composed of two plates that are 90 degrees to each other.

[0028] The second precision adjustment unit comprises a second threaded adjustment button 11, two side plates 12 arranged on the slide plate 7, and a rotating fork 13. The side plate 12 is provided with an avoidance hole 14, the rotating fork 13 is located in the avoidance hole 14 and is rotatably connected to the side plate 12, the adjusting screw of the second threaded adjustment button 11 can push the rotating fork 13 so as to lift the lifting plate 8 through the rotating fork 13, the rotating fork 13 comprises two rotating rods 131 and a lever 132 which are 90 degrees to each other, one rotating rod 131 is rotatably connected to the side plate 12, and the other rotating rod 131 is rotatably connected to the lifting plate 8, and a long hole is arranged on the lifting plate 8, so the rotating rod 131 can move along the long hole when driving the lifting plate 8 to rise through the rotating rod shaft, the adjusting screw of the second threaded adjustment button 11 can push the lever 132, because the threaded adjustment button is a tight manual adjustment component, and therefore cannot directly withstand a large pressure, so we use the lever principle to make the rotating fork 13 as an intermediary to push the lifting plate 8 up and down, thereby protecting the threaded adjustment button, and the structure is simple and the reliability is good.

[0029] The angle fine-tuning mechanism includes two bearing seats 14 relatively arranged on the lifting plate 8, the bearing seats 14 are provided with a rotatable shaft 15, the shaft 15 is fixed with a swivel seat 16 and a rotating block 17, the swivel seat 16 is provided with a swivel plate assembly 18, the probe 4 is arranged on the swivel plate assembly 18, the lifting plate 8 is provided with two angle thread adjustment knobs 19, the two angle thread adjustment knobs 19 are respectively located on the opposite sides of the rotating block 17, through this structure, only one side of the angle thread adjustment knob 19 needs to be rotated to push the rotating block 17, the rotating block 17 drives the shaft 15 and the swivel seat 16 to rotate, thereby driving the swivel plate assembly 18 to rotate and tilt to one side to achieve angle adjustment. In order to save space and facilitate manufacturing, the dynamic swivel plate assembly 18 includes two L-shaped connecting plates and a horizontal plate connected to the L-shaped connecting plate. The probe 4 is located on the horizontal plate, and there is also a baffle on the horizontal plate to limit the probe 4 to the horizontal plate.

[0030] As shown in the figure, the slide arm moving unit includes a slide arm driving motor 20, a slide arm lead screw and a slide arm guide rail 21 arranged on the test seat 3, the slide arm 5 is connected to the slide arm slider on the slide arm guide rail 21, the slide arm driving motor 20 is connected to the slide arm lead screw, and the slide arm 5 can move through the above structure. A positioning groove is provided on the slide arm 5, and the edge of the stage 2 is located in the positioning groove, so that the slide arm 5 can be positioned by contacting the positioning groove wall with the stage 2.

[0031] The scanning adjustment mechanism includes a support beam 22 and a sliding beam 23 arranged on the test seat 3, the support beam 22 is provided with a beam moving unit 1, the support beam 22 is driven by the beam moving unit 1 to move on the support beam 22, the sliding beam 23 is provided with a beam seat plate, the beam seat plate is driven by the beam moving unit 2 to move on the sliding beam 23, the beam seat plate is provided with a beam lifting plate 24, the beam lifting plate 24 is driven by the beam moving unit 3 to move on the beam seat plate, the scanning receiving probe 1 is arranged on the beam lifting plate 24, the structure and working principle of the beam moving unit 1, the beam moving unit 2 and the beam moving unit 3 are the same as those of the sliding arm moving unit, so they are not repeated here.

[0032] In this application, because the contacts on the tested object are very small, a microscope is needed to assist the probe 4 and the contact adjustment. The scanning receiving probe, microscope, threaded adjustment knob, and guide rail are all purchased parts, so their structures are not described in detail.

[0033] The operation steps of this device are briefly described as follows: (1) Adjust the probe station part and the stage space to the appropriate size according to the size of the DUT. (2) Select the appropriate tempered foam support plate according to the size of the stage space. (3) Place the DUT on the tempered foam. (4) Adjust the microscope step by step to the top of multiple feeding potentials of the DUT. (5) Operate the probe station adjustment mechanism to make the probe and the feeding potential in good contact to complete the feeding. (6) Adjust the scanning adjustment mechanism on the upper part of the DUT to the appropriate starting position and the appropriate height. (7) Install the scanning receiving probe. (8) Adjust the gap between the top of the probe and the DUT to the required distance for the test. (9) Adjust the scanning receiving probe at the bottom of the DUT, and the process is the same as steps (4) to (8). (10) Set the feeding frequency range and power range of the DUT on the software operation interface; set the scanning area, step distance, step-in-place dwell time, and scanning adjustment mechanism in-place feedback mode of the scanning adjustment mechanism; set the receiver frequency range and trigger mode connected to the scanning receiving probe. (11) Start scanning the upper and lower scanning adjustment mechanisms of the DUT. During the scanning process, record the amplitude and phase information of the scanning adjustment mechanism at the position. (12) After the test is completed, draw the amplitude and phase diagrams of the top and bottom of the tested device respectively.

[0034] The above is a detailed introduction to a material electromagnetic radiation performance test probe station provided in an embodiment of the present invention. Specific examples are used in this article to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea; at the same time, for general technical personnel in this field, according to the idea of ​​the present invention, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims

1. A material electromagnetic radiation performance test probe station, characterized in that: It includes a scanning receiving probe, a scanning adjustment mechanism for adjusting the position of the scanning receiving probe, a stage for placing the test piece, a test seat supporting the stage, and a probe device capable of contacting and conducting with the test piece. The test seat is provided with a probe adjustment mechanism for adjusting the position of the probe device. The probe adjustment mechanism includes a slide arm and a slide arm moving unit for driving the slide arm to move forward and backward. The stage is supported by the slide arm, and a slide plate connected to the slide arm through a guide rail is provided on the slide arm. The slide plate is driven to move left and right by a precision adjustment unit; the slide plate is provided with a lifting plate connected to the slide arm through a guide rail. The lifting plate is lifted and lowered by the precision adjustment unit 2; the lifting plate is provided with an angle fine-tuning mechanism that can drive the probe to rotate, and the angle fine-tuning mechanism includes two bearing seats relatively arranged on the lifting plate, the bearing seat is provided with a rotatable rotating shaft, a rotating seat and a rotating block are fixed on the rotating shaft, a rotating plate assembly is provided on the rotating seat, the probe is arranged on the rotating plate assembly, and two angle thread adjustment knobs are provided on the lifting plate, and the two angle thread adjustment knobs are respectively located on the opposite sides of the rotating block, and the precision adjustment unit 1 includes a thread adjustment knob 1 and a reset spring, and the thread adjustment knob 1 and the setting The first adjusting screw of the threaded adjusting button can pass through the L-shaped plate to push the sliding plate, and the sliding plate is located on the L-shaped plate. One end of the reset spring is connected to the L-shaped plate, and the other end of the reset spring is connected to the sliding plate. The second precision adjustment unit includes a second threaded adjusting button, two side plates arranged on the sliding plate, and a rotating fork. The side plates are provided with avoidance holes. The rotating fork is located in the avoidance holes and the side plates are rotatably connected. The adjusting screw of the second threaded adjusting button can push the rotating fork to lift the lifting plate through the rotating fork. The sliding arm moving unit includes a sliding arm driving motor arranged on the test seat. The test seat comprises a test machine, a slide arm lead screw and a slide arm guide rail, the slide arm is connected to the slide arm slider on the slide arm guide rail, the slide arm drive motor is connected to the slide arm lead screw, the scanning adjustment mechanism comprises a support beam and a sliding beam arranged on the test seat, the support beam is provided with a beam moving unit 1, the support beam is moved on the support beam by the beam moving unit 1, the sliding beam is provided with a beam seat plate, the beam seat plate is moved on the sliding beam by the beam moving unit 2, the beam seat plate is provided with a beam lifting plate, the beam lifting plate is moved on the beam seat plate by the beam moving unit 3, and the scanning receiving probe is arranged on the beam lifting plate.

2. A material electromagnetic radiation performance test probe station according to claim 1, characterized in that : Also includes a microscope.

3. A material electromagnetic radiation performance test probe station according to claim 1, characterized in that : A positioning groove is provided on the sliding arm, and the edge of the loading platform is located in the positioning groove.

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