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Evaluation method and device for multi-dimensional index analysis

A technology of indicators and positive indicators, applied in the field of data analysis, can solve problems such as limited, incomplete, time-consuming and labor-intensive factors to be considered, and achieve the effect of fast evaluation, comprehensive factors, and multiple dimensions

Pending Publication Date: 2020-10-30
NAT COMP NETWORK & INFORMATION SECURITY MANAGEMENT CENT
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

At present, the evaluation of industrial development is mainly manual evaluation, which is time-consuming and laborious, and cannot meet the requirements of rapid evaluation, and the factors considered by human evaluation are limited and not comprehensive.

Method used

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  • Evaluation method and device for multi-dimensional index analysis
  • Evaluation method and device for multi-dimensional index analysis
  • Evaluation method and device for multi-dimensional index analysis

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Embodiment Construction

[0046] The present invention will be further described in detail below in conjunction with the accompanying drawings, so that those skilled in the art can implement it with reference to the description.

[0047] It should be understood that terms such as "having", "comprising" and "including" used herein do not exclude the presence or addition of one or more other elements or combinations thereof.

[0048] Such as figure 1 As shown, the embodiments of the present application provide an evaluation method for multidimensional index analysis, including:

[0049] Step s101, obtaining data on indicators related to industrial development in a predetermined area, said indicators related to industrial development at least including industrial indicators, indicators of scientific research institutions, and indicators of policies and regulations; Step s102, performing dimensionless processing on the data related to industrial development indicators ; Step s103, according to the data ob...

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Abstract

The invention discloses an evaluation method for multi-dimensional index analysis, and the method comprises the steps of obtaining the data of industrial development related indexes of a predeterminedregion, and enabling the industrial development related indexes to at least comprise an industrial index, a scientific research institution index and a policy and regulation index; performing dimensionless processing on the data of the industrial development related indexes; according to the data obtained through dimensionless processing, calculating entropy values of the industrial development related indexes, and calculating weights of the industrial development related indexes according to the entropy values; and evaluating the industrial development of the predetermined region according to the data and the weight obtained by the dimensionless processing. The invention further provides an evaluation device for multi-dimensional index analysis. According to the invention, comprehensive,multi-dimensional and rapid evaluation is realized by acquiring and calculating the index data information of multiple angles.

Description

technical field [0001] The invention relates to the technical field of data analysis. More specifically, the present invention relates to an evaluation method and device for multidimensional index analysis. Background technique [0002] With the rapid development of information technology, various evaluation needs are continuously derived. At present, the assessment of industrial development is mainly manual assessment, which is time-consuming and laborious, and cannot meet the requirements of rapid assessment, and the factors considered by manual assessment are limited and not comprehensive. Therefore, there is an urgent need to design a technical solution that can overcome the above-mentioned defects to a certain extent. Contents of the invention [0003] An object of the present invention is to provide an evaluation method and device for multi-dimensional index analysis, which realizes comprehensive, multi-dimensional, and rapid evaluation by acquiring and calculating...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06Q10/04G06N3/08
CPCG06N3/08G06Q10/04G06Q10/06393
Inventor 李欣赵志云葛自发孙小宁张冰万欣欣袁钟怡赵忠华孙立远付培国王禄恒王晴
Owner NAT COMP NETWORK & INFORMATION SECURITY MANAGEMENT CENT
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