Method and device for vectorizing measurement data of unidirectional scanning sensor

Abstract

The invention provides a method and device for vectorizing measurement data of a unidirectional scanning sensor, which can realize vectorization of measurement data of a unidirectional scanning sensor, improve the applicability and measurement accuracy of the unidirectional scanning sensor, and solve the problems in the application of the unidirectional scanning sensor. Insufficient applicability, poor precision and other problems have promoted the application and advantages of single-directional scanning sensors in practice, and have very practical application value.

Description

Method and device for vectorizing measurement data of unidirectional scanning sensor technical field The present invention relates to measurement data processing technical field, relate in particular to a kind of unidirectional scanning sensor measurement data vector Quantification method and apparatus. Background technique [0002] In measurement technology, the distinguishing feature of scanning sensors (ie scanning sensors) compared to trigger sensors is, With strong data acquisition ability, it can acquire a large amount of data on the surface of the measured feature in a short time, which is conducive to the precision Refinement analysis; continuous data acquisition capability enables uninterrupted measurement, with significant efficiency in the measurement of continuous features Advantage. Therefore, the scanning sensor has excellent performance in refined evaluation, continuous feature measurement, and large-scale and high-density measurement scenarios. appli...

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Problems solved by technology

[0003] Due to the consideration of price and technical difficulty, the more commonly used scanning sensor is the one-way scanning sensor, which can only realize one-way measurement, and the obtained measurement data is one-dimensional scalar data of the measured feature, reflecting the actual characteristics of the measured feature The comprehensive change of the profile relative to the theoretical profile, but cannot provide the specific change of the actual profile point of the measured feature in each direction relative to the theoretical profile point, that is, the single-direction scanning sensor can only provide the change of the measured feature, but cannot provide The direction of change of the measured feature

[0004] Based on this, the unidirectional scanning sensor can only be used for the measurement of simple features with a clear direction of change, or the measurement of features that do not pay attention to the direction of change, but cannot be used for the measurement of complex features, such as free curves, free Curved surfaces, etc., which severely limit the application scenarios of unidirectional scanning sensors, and it is difficult to give full play to their advantages

Moreover, since the unidirectional scanning sensor can only provide one-dimensional scalar information about the measured feature, but cannot provide its corresponding direction information, the contour obtained according to the one-dimensional scalar information has a large deviation compared with the actual contour, which affects subsequent processing. the accuracy of

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