A method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array

Abstract

The invention belongs to the technical field of multi-probe darkroom, and relates to a method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array. The antenna array to be tested is placed on a turntable, so that the antenna array to be tested is located at the center of a multi-probe vertical ring, and the antenna array to be tested is controlled to transmit signals with set parameters during the entire test process; the turntable is controlled to rotate at a set sampling interval, and all probes located in the upper half of the two vertical rings sequentially collect the electric fields in two polarization directions at the position of the probe; until the turntable rotates 90 degrees, the test data of each sampling point in the upper hemisphere is obtained; the test data of each sampling point in the upper hemisphere is calculated as the corresponding equivalent isotropic radiated power as the original data; the natural neighbor interpolation method is used to interpolate the original data with half of the set sampling interval as the interpolation interval, and the total radiated power value of the upper hemisphere of the antenna array to be tested is obtained. The problem of high cost in the existing test method is solved.

Description

Technical Field

[0001] The invention belongs to the technical field of multi-probe darkrooms and relates to a method for testing the total radiated power of a millimeter wave antenna array in the upper hemisphere. Background Art

[0002] With the development and utilization of extraterrestrial space, extraterrestrial communication technologies such as "Starlink" have also flourished. At the same time, with the widespread application of 5G technology, the power of ground communication base stations is getting higher and higher, and the power radiated upward is also getting higher and higher. In order to control the impact of ground communication systems on extraterrestrial space, it is necessary to limit the total upward radiated power of millimeter-wave antenna arrays in communication base stations. This has created a demand for the test of the episphere total radiated power (ETRP) of millimeter-wave antenna arrays. At present, there is no standard test method in this field. Many communication companies are working on fast and low-cost millimeter-wave antenna array episphere total radiated power test solutions.

[0003] The upper hemisphere total radiated power test for the millimeter wave antenna array is similar in form to the total radiated power test on a sphere with a polar angle of θ = 0-90° and an azimuth angle of φ = 0-360°. Obviously, among the many wireless device air interface test methods, the multi-probe darkroom method is more suitable for solving this problem. The multi-probe darkroom is one of the most popular air interface test methods due to its high efficiency and simple principle. The Cellular Telecommunications and Internet Association (CTIA) defines the darkroom measurement method as one of the standard air interface test methods.

[0004] The darkroom eliminates the reflection of radio waves through absorbing materials, simulates the open field test environment, and eliminates the interference of external electromagnetic wave signals on the test through the shielding room. The test efficiency can be effectively improved by installing a vertical ring with multiple probes distributed in the darkroom.

[0005] In traditional wireless device total radiated power tests, the device under test is often a single antenna with a simple directivity pattern. The upper hemisphere total radiated power test targets the millimeter wave antenna array used in base stations. Figure 1In addition, regardless of the complexity of the antenna array pattern, in the global total radiated power test, as long as the value of the main radiation direction is sampled, the calculation error in this case is often acceptable, but the antenna array upper hemisphere total radiated power test cannot meet this requirement. Because the test simulates the need for the main radiation direction of the base station to be tilted downward during normal operation, its main radiation direction is not within the upper hemisphere test range, which results in large errors when some side lobes are not sampled when the sampling interval is too large. This requires a smaller sampling interval than before in the millimeter-wave antenna array upper hemisphere total radiated power test, and the half-power beam width can be selected as the reference sampling angle interval, which is generally less than or equal to 5°.

[0006] Since there is no unified standard test method for the upper hemisphere total radiated power test of millimeter wave antenna arrays, for the convenience of description, it is referred to as the traditional method below.

[0007] In the traditional test process, the antenna array to be tested is placed on a turntable, and the antenna array to be tested is controlled to work at a set downtilt angle and set parameters during the entire test period. Then the probes on the upper vertical ring are controlled to measure the electric fields in the two polarization directions of the corresponding positions in turn. Then the turntable is controlled to rotate at a set angle Δφ, and the vertical ring sampling process is repeated at the new position of the turntable. This process is repeated until all sampling points on the spherical surface are obtained. In the most common multi-probe darkroom test system with a vertical ring, the turntable can be rotated 180° to achieve sampling of the entire upper hemisphere. Finally, the sampling data is used to calculate the equivalent isotropic radiated power (EIRP) corresponding to each sampling point, and the total radiated power of the upper hemisphere of the antenna array to be tested can be obtained by calculating all the data using formula (1).

[0008] Compared with general antennas, millimeter wave antenna arrays have high gain and narrow beams, so they need to use smaller sampling intervals in tests under the same accuracy requirements, which means high construction costs and a long testing process. These problems make the original test systems and methods generally unable to cope with this emerging test task. Major test manufacturers are in urgent need of new test systems and supporting test methods that can meet this specific test requirement and are low-cost. Summary of the invention

[0009] The purpose of the present invention is to provide a method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array, which solves the problem of high cost in existing testing methods.

[0010] The present invention is achieved through the following technical solutions:

[0011] A method for testing the total radiated power of a millimeter wave antenna array in the upper hemisphere is implemented based on a test system. The test system includes a darkroom, a turntable and two vertical rings are arranged vertically at 90 degrees in the darkroom, and a plurality of probes are evenly arranged on the vertical rings.

[0012] The test method includes the following steps:

[0013] Step 1: Place the antenna array to be tested on the turntable so that the antenna array to be tested is at the center of the multi-probe vertical ring, and control the antenna array to be tested to transmit signals with set parameters during the entire test process;

[0014] Step 2: Control the turntable to rotate at a set sampling interval, and all the probes located in the upper part of the two vertical rings collect the electric fields in the two polarization directions at the probe positions in turn;

[0015] Step 3: Repeat step 2 until the turntable rotates 90° to obtain the test data of each sampling point in the upper hemisphere;

[0016] Step 4: Calculate the test data of each sampling point in the upper hemisphere into the corresponding equivalent isotropic radiated power as the original data;

[0017] Step 5: Use the natural neighbor interpolation method to interpolate the original data with half of the set sampling interval as the interpolation interval to obtain the total radiated power value of the upper hemisphere of the antenna array to be tested.

[0018] Further, the sampling points of the test data of each sampling point in the upper hemisphere are distributed in the upper hemisphere with a polar angle θ of 0 to 90° and an azimuth angle φ of 0 to 360°;

[0019] The formula for calculating the total radiated power in the upper hemisphere is:

[0020]

[0021] Among them, EIRP θ (θ i ,φ j ) and EIRP φ (θ i ,φ j ) are respectively in (θ i ,φ j ) The equivalent isotropic radiated power in two polarization directions at the sampling point; θ i represents the elevation coordinate of the sampling point in the spherical coordinate system, φ j Indicates the azimuth coordinates of the sampling point in the spherical coordinate system; the elevation angle ranges from 0 to π, and the azimuth angle ranges from 0 to 2π;

[0022] Weight coefficient w(θ i ) is calculated when n=N, S wrepresents the sum of weight coefficients;

[0023]

[0024] N = 90 / Δθ;

[0025] M=360 / Δφ, Δθ is the elevation angle interval; Δφ is the azimuth angle interval.

[0026] Furthermore, the weight coefficient w(θ i ) is:

[0027]

[0028] Parameter b i The values ​​are:

[0029]

[0030] Furthermore, the natural neighbor interpolation method is specifically:

[0031] First, a set of Voronoi unit diagrams are generated based on the original data points, which are called the Voronoi diagrams corresponding to the data point set. Then, a new set of Voronoi unit diagrams are regenerated after the interpolation points that need to be interpolated are inserted into the original data point set. Finally, the normalized values ​​of the area changes of the corresponding Voronoi unit diagrams in the original data points adjacent to the interpolation points after the interpolation points are inserted are used as the calculation weights of the data values ​​corresponding to the corresponding data points to obtain the interpolation point values.

[0032] Furthermore, if the antenna array to be tested realizes the main radiation direction downward through mechanical downtilt in normal operation, a positioner is installed on the turntable, and the controller controls the motor to drive the positioner to maintain the spatial position state during normal operation.

[0033] Furthermore, if the antenna array to be tested realizes downtilt of the main radiation direction by setting the feed source phase shift in normal operation, the feed source is controlled to work with the set phase shift.

[0034] Furthermore, if the sampling interval requirement is smaller than the spacing angle between the probes on the vertical ring, a positioner is installed on the turntable for oversampling. Before step 2, the positioner is controlled to rotate according to the sampling interval requirement, and then steps 2 and 3 are repeated; the oversampling test data is combined with the standard test data when the positioner is not rotating as the oversampling test data.

[0035] Furthermore, the positioner is driven by a motor and can rotate in the polar angle direction to control the spatial state of the antenna array to be tested.

[0036] Compared with the prior art, the present invention has the following beneficial technical effects:

[0037] The present invention discloses a method for testing the total radiated power of the upper hemisphere of a millimeter wave antenna array, which effectively shortens the time and reduces the test cost through two mutually perpendicular vertical rings. The calculation method improves the disadvantages of estimating the integral value by a linear method in the traditional method by combining numerical integration theory and an effective interpolation method, and adopts a nonlinear method that is more in line with the actual air interface test situation. When the number of sampling points is consistent, the method of the present invention can obtain higher test accuracy without increasing any test cost. The high-precision millimeter wave antenna array upper hemisphere total radiated power test method of the present invention can be applied to any conventional multi-probe darkroom after simple modification, with strong applicability and low construction cost; the high-precision millimeter wave antenna array upper hemisphere total radiated power test method of the present invention adopts program control, the test process is simple and efficient, no manual intervention is required, and the air interface test efficiency is greatly improved; the present invention points out that the sampling interval in the upper hemisphere total radiated power test of the millimeter wave antenna array should be selected as the antenna half-power wave width or less, so that sufficient sampling information can be obtained to ensure that the test accuracy is within an acceptable range. The conventional TRP test standard interval is 15°, while the sampling interval required for this application scenario is generally less than 5°, and the number of sampling points is basically an order of magnitude more, and the cost of the test method itself is very high. The method proposed in the present invention can achieve higher accuracy at the same sampling interval, which means fewer sampling points at the same accuracy, reducing costs; the current design is to interpolate after calculating the EIRP of each sampling point, and use the interpolated EIRP data for calculation, which can further improve the test accuracy.

[0038] Furthermore, the purpose of adding a positioner is to facilitate the fixation of the device under test and to simulate the mechanical tilt of the device under test; in addition, oversampling can be achieved by controlling the rotation of the positioner in conjunction with the rotation of the turntable, which is equivalent to reducing the sampling interval and increasing the number of sampling points, because this application scenario often requires a very small sampling interval. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 It is a schematic diagram of the structure of a multi-probe darkroom adopted in the present invention;

[0040] Figure 2 is a sampling point distribution diagram of the present invention;

[0041] Figure 3 It is a comparison between the test error calculated by the improved method and the test error of the traditional test method when the main radiation direction of the antenna array to be tested used in the embodiment of the present invention is tilted downward by 12°.

[0042] Among them, 1 is a supporting structure, 2 is a turntable, 3 is a positioner, 4 is a device to be tested, and 5 is a vertical ring. DETAILED DESCRIPTION

[0043] In order to make the purpose, technical solution and advantages of the present invention more clear, the following is further described in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention, that is, the embodiments described are only part of the embodiments of the present invention, not all embodiments.

[0044] The components described and shown in the drawings and embodiments of the present invention may be arranged and designed in various configurations. Therefore, the detailed description of the embodiments of the present invention provided in the following drawings is not intended to limit the scope of the claimed invention, but merely represents a selected embodiment of the present invention. Based on the drawings and embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0045] like Figure 1 As shown, a conventional multi-probe darkroom includes a darkroom, a turntable 2 and a vertical ring 5 are provided in the darkroom, a support structure 1 is provided below the turntable 2, the vertical ring 5 runs through the support structure 1, and the device to be tested 4 is placed above the turntable 2; a number of probes are evenly distributed on the vertical ring 5; the probes are connected to a data collector, the data collector is connected to a data processor, and the data processor has a built-in total radiation power calculation method; the turntable 2 is connected to a controller.

[0046] The present invention adds a vertical ring 5, which is designed as two vertical rings 5, and the two vertical rings 5 ​​are vertically arranged at 90 degrees; the probes are arranged at a set sampling interval.

[0047] The present invention discloses a high-precision antenna array upper hemisphere total radiated power test method based on an improved Clenshaw-Curtis numerical integration rule and a natural neighbor interpolation method. The method includes a corresponding sampling method and a calculation method thereof, and the specific steps are as follows:

[0048] Step 1: Fix the antenna array to be tested on the turntable 2 so that it is located at the center of the multi-probe vertical ring 5. Control the antenna array to be tested to transmit signals with set parameters during the entire test process.

[0049] Step 2: The controller controls the turntable 2 to rotate at a set sampling interval, and all the probes located in the upper part of the two vertical rings 5 ​​sequentially collect and record the electric fields in the two polarization directions at the probe positions, and store them in a data storage device.

[0050] Step 3: After all probes on the upper vertical ring 5 have completed sampling, the controller controls the turntable 2 to rotate at a set angle interval until the turntable 2 rotates 90° to obtain the electric field data of each sampling point in the upper hemisphere;

[0051] Step 4: Calculate the electric field data of each sampling point in the upper hemisphere in the data storage device into the corresponding equivalent isotropic radiation power and upload it to the control terminal.

[0052] Step 5: In the control terminal, the equivalent isotropically radiated power corresponding to all sampling points is combined, and the original data is interpolated using the natural neighbor interpolation method with half of the sampling interval as the interpolation interval. The interpolated data is calculated according to formula (2) to obtain the total radiated power value of the upper hemisphere of the antenna array to be tested.

[0053] The sampling point distribution obtained by this sampling method is as follows Figure 2 As shown, it is consistent with the distribution using the traditional method, which is a semi-sphere with a polar angle θ of 0 to 90° and an azimuth angle φ of 0 to 360°.

[0054] The support structure 1 at the bottom of the vertical ring 5 lacks a probe at this position, but this missing probe has no effect on the sampling point obtained by this sampling method

[0055] If the antenna array to be tested is designed to achieve a downward main radiation direction through mechanical downtilt in normal operation, the controller controls the motor-driven positioner 3 to keep the spatial position state in normal operation;

[0056] If the antenna array to be tested is designed to achieve a downward tilt in the main radiation direction by setting a feed source phase shift in normal operation, the feed source is controlled to operate with the set phase shift.

[0057] If the sampling interval is required to be smaller than the interval angle between the probes on the vertical ring 5, that is, when oversampling occurs, it is necessary to install a positioner 3 on the turntable 2 and control the positioner 3 to rotate at a certain angle.

[0058] The single-axis positioner 3 on the turntable 2 is driven by a high-precision motor and can rotate in the polar angle direction to control the spatial state of the antenna array to be tested. This device can be used to simulate the mechanical downtilt of some base station antennas under normal working conditions, and can also achieve oversampling by adjusting the rotation angle in conjunction with other devices to meet the test requirements under higher precision. Taking the test system with a probe interval of 10° as an example, if the oversampling requires the test sampling interval to be 5°: first set the rotation angle interval of the turntable 2 to 5°, and perform steps 2-4 with the original state of the device to be tested 4; then perform step 5, that is, set the relative rotation angle of the positioner 3 to 5°, and keep the rotation angle interval of the turntable 2 at 5°; synthesize the sampled data into the required data for subsequent processing.

[0059] After completing the normal sampling steps, if a smaller sampling interval is required, the positioner 3 should be controlled to rotate a certain angle. For example: if the sampling interval is 10° and the oversampling requires 5°, the positioner 3 rotates 5°, the rotation interval of the turntable 2 is set to 5°, and then a complete sampling process is performed; if the sampling interval is 10° and the oversampling interval is 2°, the positioner 3 rotates 2°, the turntable 2 interval is set to 2°, a complete sampling is performed, and then the positioner 3 rotates 2° again, and a complete oversampling is performed again. The rotation angle of the positioner 3 is 4°, 6°, 8°, etc.

[0060] The probe on the vertical ring 5 measures the electric field in two polarization directions, which can be calculated using the following equivalent isotropic radiated power calculation formula:

[0061]

[0062] Where r represents the radius of the test sphere, E t represents the tangential electric field in the two polarization directions, and Z0 represents the free space impedance. The calculated equivalent isotropic radiated power EIRP in the two polarization directions is θ and EIRP φ Stored in data memory for later calculations.

[0063] Interpolating the original data before calculation will help to further improve the accuracy of the calculation, but if an inappropriate interpolation method is selected, the accuracy will decrease.

[0064] The natural neighbor interpolation method used in the present invention is more suitable for the current problem and the Clenshaw-Curtis calculation method than interpolation methods such as cubic splines. The natural neighbor interpolation method is an optimized linear interpolation method, and its principle is: first, a set of Voronoi unit graphs are generated based on the original data points, which are called the Voronoi graphs corresponding to the data point set, and then a set of new Voronoi unit graphs are regenerated after the interpolation points that need to be interpolated are inserted into the original data point set, and finally, the normalized value of the area size of the corresponding Voronoi unit graph in the original data points adjacent to the interpolation point after the insertion is used as the calculation weight of the corresponding data value of the corresponding data point, and the interpolation point value is obtained.

[0065] It should be noted that when the sampling interval is set to be very small, the error between the improved method and the traditional method is very small, and the difference between the two is not obvious. Figure 1 The test system shown.

[0066] The calculation of total radiated power is described in detail below:

[0067] According to the definition of total radiated power, the calculation formula for the total radiated power in the upper hemisphere can be obtained as follows:

[0068]

[0069] Among them, EIRP θ (θ,φ) and EIRP φ (θ, φ) represents the equivalent isotropic radiated power in the two polarization directions respectively.

[0070] 1) Traditional method

[0071] In order to demonstrate the effectiveness and superiority of the improved method proposed in the present invention, the traditional multi-probe darkroom total radiated power test method is extended to the upper hemisphere test of the millimeter wave antenna array, and this method is compared with the improved method proposed in the present invention. According to the distribution of equally spaced sampling points, the above total radiated power integral formula is discretized to obtain:

[0072]

[0073] Where M = 360 / Δφ, N = 90 / Δθ, where Δθ and Δφ represent the polar angle and azimuth sampling intervals respectively; EIRP θ (θ i ,φ j ) and EIRP φ (θ i ,φ j ) respectively represent the coordinates (θ i ,φ j ) is the equivalent isotropic radiated power in two polarization directions at the sampling point; parameter a i The values ​​are:

[0074]

[0075] 2) Improvement methods

[0076] The original Clenshaw-Curtis numerical integration method is derived based on the integral expansion of the function f(t) in the interval [-1,1]. When applied to the total radiated power test, the method is applicable to the entire sphere, that is, when the polar angle ranges from 0 to 180°. For the upper hemisphere, the method needs to be re-derived to make it applicable to the upper half of the sphere, that is, when the polar angle ranges from 0 to 90°.

[0077] Rewrite the integral expression of the total radiated power in the upper hemisphere as

[0078]

[0079] Let t = cosθ. The original problem of integrating in the direction of θ is transformed into integrating the function f(t) in the interval [0,1], that is,

[0080]

[0081] Different from the original Clenshaw-Curtis integration method formula derivation, the modified k-th order first kind Chebyshev polynomial T is used here k (t) = cos(2kcos -1 t) represents the function f(t), that is

[0082]

[0083] Among them, ∑' means taking half of the first term in the summation, c k are coefficients. The integral of the function f(t) is:

[0084]

[0085] Because the sum of infinite terms is unrealistic, the sum of infinite terms is truncated to finite terms, that is:

[0086]

[0087] In order to find the coefficient c k The value of , we need to use the orthogonality of Chebyshev polynomials, that is, T k (t) = cos(2kcos -1 x) is:

[0088]

[0089]

[0090] According to the above formula, the coefficient c k The expression is

[0091]

[0092] Estimate c using the trapezoidal integration rule k The expression is

[0093]

[0094] Among them, ∑” means taking half of the first and last two terms of the sum. In summary and simplification, we can get

[0095]

[0096] in, Weight coefficient w(θ i ) is expressed as

[0097]

[0098] Among them, parameter b i The value is

[0099]

[0100] The calculation formula for the total radiation power in the upper hemisphere is:

[0101]

[0102] Among them, the weight coefficient w(θ i ) is calculated when n=N, S w Represents the sum of weight coefficients.

[0103] The present invention is further described in detail below with reference to the embodiments.

[0104] The test frequency of the embodiment of the present invention is 24GHz, and a circularly polarized millimeter-wave leaky wave antenna array is used as the antenna array to be tested, and the scanning range of the antenna array is -36° to 36°. In order to verify the effectiveness of the fast upper hemisphere total radiated power test method, the embodiment of the present invention tests the antenna array to be tested in a multi-probe darkroom according to the improved method:

[0105] 1. First, place the antenna array to be tested normally in the multi-probe darkroom and perform the test according to the corresponding steps of the improved method. In this round of experiments, the angle interval between the probes on the multi-probe vertical ring 5 and the rotation angle interval of the turntable 2 (i.e., the elevation angle interval Δθ and the azimuth angle interval Δφ) are set to 1°, and the antenna array feed is controlled so that the main radiation direction of the antenna array to be tested is tilted downward by 12°.

[0106] The test data obtained by sampling with a test interval of 1° is calculated using the traditional method, namely formula (1), and the obtained result is used as the reference value of the total radiated power in the upper hemisphere.

[0107] From the data with a sampling interval of 1°, the data with intervals of 2°, 3°, 5°, 6° and 9° are extracted as experimental data. The data with intervals of 2°, 3°, 5°, 6° and 9° obtained by sampling are calculated using the traditional method, that is, formula (1), and the test error is calculated for comparison. The above data are calculated by the calculation steps of the improved method corresponding to the sampling, and the test error is calculated using formula (2).

[0108] The above calculation results are plotted as Figure 3 As shown, the horizontal axis is the total number of sampling points N under the corresponding sampling interval S , the ordinate is the test error. Figure 3It can be seen from the figure that: 1. When the sampling interval is too large, the error of the improved method is similar to that of the traditional method due to insufficient sampling information. 2. When the sampling interval is too small, the errors of both methods can reach a very small level, and the effect of the improved method is not obvious. 3. For the millimeter-wave antenna array to be tested with a main beam downtilt of 12°, the improved method can achieve a lower test accuracy than the traditional method when the sampling point interval is appropriate, which verifies the effectiveness of the improved method proposed in the present invention.

[0109] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array, characterized in that: Based on the test system implementation, the test system comprises a darkroom, wherein a turntable (2) and two vertical rings (5) are arranged in the darkroom, and the two vertical rings (5) are arranged vertically at 90 degrees; a plurality of probes are evenly arranged on the vertical rings (5); The test method includes the following steps: Step 1: placing the antenna array to be tested on the turntable (2) so that the antenna array to be tested is at the center of the multi-probe vertical ring (5), and controlling the antenna array to be tested to transmit signals with set parameters during the entire test process; Step 2: Control the turntable (2) to rotate at a set sampling interval, and all the probes located in the upper part of the two vertical rings (5) sequentially collect the electric fields in two polarization directions at the positions of the probes; Step 3: Repeat step 2 until the turntable (2) rotates 90° to obtain the test data of each sampling point in the upper hemisphere; Step 4: Calculate the test data of each sampling point in the upper hemisphere into the corresponding equivalent isotropic radiated power as the original data; Step 5: Use the natural neighbor interpolation method to interpolate the original data with half of the set sampling interval as the interpolation interval to obtain the total radiated power value of the upper hemisphere of the antenna array to be tested; The sampling points of the test data of each sampling point in the upper hemisphere are distributed as polar angles. 0 to 90°, azimuth The upper half of the sphere from 0 to 360°; The formula for calculating the total radiated power in the upper hemisphere is: ； in, and Respectively in The equivalent isotropic radiated power in two polarization directions at the sampling point; represents the elevation coordinate of the sampling point in the spherical coordinate system, Indicates the azimuth coordinates of the sampling point in the spherical coordinate system; the elevation angle ranges from 0 to π, and the azimuth angle ranges from 0 to 2π; Weight coefficient for In the case of calculation, represents the sum of weight coefficients; ； ； , is the elevation interval; is the azimuth interval; Weight coefficient The expression is: ； parameter The values ​​are: 。 2. The method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array according to claim 1, characterized in that: The natural neighbor interpolation method is as follows: First, a set of Voronoi unit diagrams are generated based on the original data points, which are called the Voronoi diagrams corresponding to the data point set. Then, a new set of Voronoi unit diagrams are regenerated after the interpolation points that need to be interpolated are inserted into the original data point set. Finally, the normalized values ​​of the area changes of the corresponding Voronoi unit diagrams in the original data points adjacent to the interpolation points after the interpolation points are inserted are used as the calculation weights of the data values ​​corresponding to the corresponding data points to obtain the interpolation point values.

3. The method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array according to claim 1, characterized in that: If the antenna array to be tested is used to achieve a downward main radiation direction through mechanical downtilt in normal operation, a positioner (3) is installed on the turntable (2), and a controller controls a motor to drive the positioner (3) to maintain a spatial position state during normal operation.

4. The method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array according to claim 1, characterized in that: If the antenna array to be tested realizes downtilt of the main radiation direction by setting the feed source phase shift in normal operation, the feed source is controlled to work with the set phase shift.

5. The method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array according to claim 1, characterized in that: If the sampling interval requirement is smaller than the spacing angle between the probes on the vertical ring (5), a positioner (3) is installed on the turntable (2) to perform oversampling. Before step 2, the positioner (3) is controlled to rotate according to the sampling interval requirement, and then steps 2 and 3 are repeated; the oversampling test data is combined with the standard test data when the positioner (3) is not rotating as the oversampling test data.

6. A method for testing the total radiated power in the upper hemisphere of a millimeter wave antenna array according to claim 3 or 5, characterized in that: The positioner (3) is driven by a motor and can rotate in the polar angle direction, and is used to control the spatial state of the antenna array to be tested.

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