Sample preparation device for high-throughput characterization of fiber material microstructure

Abstract

The invention discloses a sample preparation device for fiber material microstructure high-throughput characterization, the sample preparation device comprises a fixer and a sample table, the fixer is a hexagonal hole and is used for placing the sample table, and the fixer comprises a round hole; triangular grooves are formed in the surface of the sample table, the triangular grooves are opposite to and connected with the round holes of the fixers, and the two fixers are arranged at the two ends of the sample table respectively in a sleeving mode. According to the sample preparation device and method for high-throughput characterization of the microstructure of the fiber material, three core elements of no damage, mass production and rapidness are considered, it is ensured that the surface structure of the fiber material is not damaged, meanwhile, efficient preparation of a large number of samples is achieved, and suitable characterization equipment is a laser confocal microscope and a scanning electron microscope.

Description

Technical Field

[0001] The present invention relates to the field of fiber material samples for characterization, and in particular to a sample preparation device and method for high-throughput characterization of fiber material microstructure. Background Art

[0002] As a key structural material that is indispensable to contemporary industrial and technological progress, fiber materials are widely used in the fields of automobiles, textiles, medical treatment, aerospace, nuclear industry, etc. The performance of fiber materials is closely related to their microstructural characteristics. Therefore, in-depth exploration of the microscopic world of fibers has become the key to optimizing material performance. To achieve this goal, people continue to improve microscopic imaging technology, using cutting-edge tools such as high-resolution microscopes and electron microscopes to reveal the mysteries of the internal structure of fiber materials and provide a scientific basis for the precise regulation of material properties. However, for special fiber preparation processes, the resulting fiber bundles often have hundreds of fibers, and their length can reach several meters, which makes traditional characterization methods seem incapable. In order to obtain large-scale, comprehensive and efficient sample structure information, high-throughput characterization technology has emerged, which has greatly improved the efficiency and accuracy of characterization, enabling researchers to complete structural analysis of a large number of samples in a short period of time.

[0003] In order to obtain a large amount of microstructural information of fiber materials more efficiently and comprehensively, researchers currently hope to use high-throughput characterization technology to characterize the microstructure of fiber materials. Among them, laser confocal microscopy and scanning electron microscopy, with their non-destructive measurement characteristics and high-resolution imaging capabilities, have become indispensable characterization equipment for fiber material characterization. However, when processing fiber materials, the traditional sample preparation methods of this type of equipment, such as the sample cutting process, may destroy the surface structure of the fiber material in the area required for observation, causing irreversible damage, thereby affecting the accuracy and reliability of the characterization structure; at the same time, the sample preparation process is cumbersome and time-consuming for large amounts of long fiber materials, and only part of the fiber material can be intercepted for characterization analysis, and the number of samples for characterization each time is limited, making it difficult to achieve high-throughput characterization of fiber materials. Summary of the invention

[0004] In view of the above-mentioned defects of the prior art, the technical problem to be solved by the present invention is that the existing fiber material sample preparation technology is cumbersome, small in quantity, and time-consuming. The present invention provides a sample preparation device and method for high-throughput characterization of fiber material microstructure, which takes into account the three core elements of non-destructive, large in quantity, and fast, ensuring that a large number of samples can be prepared efficiently without destroying the surface structure of the fiber material. The applicable characterization equipment is a laser confocal microscope and a scanning electron microscope.

[0005] To achieve the above-mentioned purpose, the present invention provides a sample preparation device for high-throughput characterization of the microstructure of fiber materials, including a fixture and a sample stage. The fixture is a hexagonal hole for placing the sample stage, and the fixture includes a circular hole; a triangular groove is provided on the surface of the sample stage, and the triangular groove is opposite to and connected to the circular hole of the fixture. The fixture is provided in two pieces, which are respectively mounted on the two ends of the sample stage.

[0006] Furthermore, the fixture is configured as a regular hexagon with a hollow center, the hollow center portion being a regular hexagonal hole circumscribed by a circle, a cylinder is provided at the bottom of the fixture for fixing the sample stage matched with the microscope, and a circular hole is provided on each of the other five sides for fixing the sample stage.

[0007] Further, the sample stage is configured as a cylindrical sample stage, and the triangular groove is configured on the cylindrical surface.

[0008] Furthermore, the circular hole of the fixture is configured as a threaded setting for fixing the sample stage.

[0009] Furthermore, the hexagonal hole of the fixture is a regular hexagonal hole circumscribed by a circle with a radius of 6 cm.

[0010] Further, the diameter of the circular hole of the fixture is set to 1.60 mm.

[0011] Further, the length for placing the fiber material sample is set to 0-60 cm.

[0012] Another preferred embodiment of the present invention provides a sample preparation method for high-throughput characterization of fiber material microstructure, using a sample preparation device for high-throughput characterization of fiber material microstructure as described above, comprising the following steps:

[0013] Wind the carbon glue evenly on the sample stage;

[0014] The cut fiber material samples are orderly wrapped around a sample table wrapped with carbon glue;

[0015] Assemble the sample stage;

[0016] Place the sample stage into a scanning electron microscope or confocal laser scanning microscope for high-throughput characterization of your samples.

[0017] Further, assembling the sample stage comprises the following steps:

[0018] Place the two ends of the cylindrical sample stage in two fixtures, align the triangular groove on the sample stage with the circular hole in the required direction, and fix it with screws;

[0019] Insert the cylinder at the bottom of the holder into the sample base of the scanning electron microscope or laser confocal microscope and fix it to complete the sample stage assembly.

[0020] Technical Effects

[0021] The present invention provides a sample preparation device and method for high-throughput characterization of the microstructure of fiber materials. A special sample stage is used to greatly improve the sample preparation efficiency and reduce damage to the surface of the fiber material. Samples can also be prepared in batches efficiently to achieve high-throughput characterization of fiber materials, providing richer data resources for scientific research on fiber materials and promoting the development and research of fiber materials.

[0022] The concept, specific structure and technical effects of the present invention will be further described below in conjunction with the accompanying drawings to fully understand the purpose, characteristics and effects of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a structural schematic diagram of a sample preparation device for high-throughput characterization of microstructure of fiber materials according to a preferred embodiment of the present invention;

[0024] Figure 2 Schematic diagram of a fixture of a sample preparation device for high-throughput characterization of microstructure of fiber materials according to a preferred embodiment of the present invention. Figure 2 (a) is a schematic diagram of the fixture structure. Figure 2 (b) is the three-view drawing of the fixture;

[0025] Figure 3 Schematic diagram of a sample stage of a sample preparation device for high-throughput characterization of microstructure of fiber materials according to a preferred embodiment of the present invention. Figure 3 (a) Schematic diagram of the sample stage structure. Figure 3 (b) is the three-view diagram of the sample stage. DETAILED DESCRIPTION

[0026] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0027] In the following description, specific details such as specific internal procedures and techniques are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present invention. However, it should be clear to those skilled in the art that the present invention may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present invention.

[0028] like Figure 1-3As shown, an embodiment of the present invention provides a sample preparation device for high-throughput characterization of the microstructure of fiber materials, including a fixture 1 and a sample stage 2. The fixture 1 is a hexagonal hole for placing the sample stage, and the fixture 1 includes a circular hole; a triangular groove is provided on the surface of the sample stage 2, and the triangular groove is opposite to and connected to the circular hole of the fixture. The fixture is provided in two pieces, which are respectively mounted on the two ends of the sample stage.

[0029] In this embodiment, the fixture 1 is set to be a regular hexagon with a hollow center, and the hollow center is a regular hexagonal hole circumscribed by a circle. The bottom of the fixture with a thickness of 5 mm is provided with a cylinder, and the bottom is connected to The cylinder is used to fix the sample stage matched with the microscope, and the other five sides are each provided with a circular hole for fixing the sample stage. The circular hole of the fixture is set as a threaded setting for fixing the sample stage. Specifically, there is a threaded circular hole on each of the five sides of the fixture, which can be used to change the placement direction of the sample stage so as to observe samples in more areas. The hexagonal hole of the fixture is a regular hexagonal hole circumscribed with a circle with a radius of 6 cm. The diameter of the circular hole of the fixture is set to 1.60mm. In this embodiment, the side length of the regular hexagon of the fixture is 12mm. Among them, the six corners of the fixture are rounded with a radius of 3.00mm.

[0030] The sample stage is arranged as a cylindrical sample stage, and the triangular groove is arranged on the surface of the cylinder.

[0031] In this embodiment, two ends of the sample stage are added to two parallel fixtures, and the sample stage is fixed between the two fixtures by screws through the circular holes of the fixtures. The two fixtures are fixed to the universal sample base equipped with a scanning electron microscope or a laser confocal microscope through the bottom cylinder. When the sample stage is used to fix the fiber material sample, the sample stage is wrapped with carbon glue, and the fiber is then wrapped on the sample stage and fixed. In addition, the length for placing the fiber material sample is set to 0-60cm.

[0032] Another preferred embodiment of the present invention provides a sample preparation method for high-throughput characterization of fiber material microstructure, using a sample preparation device for high-throughput characterization of fiber material microstructure as described above, comprising the following steps:

[0033] Step 1: Evenly wrap the carbon glue on the sample stage to cover the surface of the sample stage;

[0034] Step 2: Wrap the cut fiber material samples in order on a sample table wrapped with carbon glue, avoiding the position of the fixture; specifically, a group of continuous component SiC fiber samples with a length of 60 cm are preferably wrapped evenly and adhered to the surface of the sample table, and impurities on the sample surface are blown away with an ear bulb.

[0035] Step 3: Assembling the sample stage; assembling the sample stage includes the following steps:

[0036] Place the two ends of the cylindrical sample stage in two fixtures, align the triangular groove on the sample stage with the circular hole in the required direction, and fix it with screws;

[0037] Insert the cylinder at the bottom of the holder into the sample base of the scanning electron microscope or laser confocal microscope and fix it to complete the sample stage assembly.

[0038] Step 4: Place the sample stage into a scanning electron microscope or laser confocal microscope to perform high-throughput characterization of the sample.

[0039] The present invention places the continuous component SiC fiber sample to be tested on the sample table, measures its surface roughness by laser confocal, and performs quantitative analysis and surface morphology observation by scanning electron microscope, thereby realizing single sampling, equally spaced detection of morphology and composition information of different regions of the same sample, greatly improving experimental efficiency, reducing sample surface damage, and reducing the workload of experimenters. At the same time, by changing the position of the positioning bolt, the experimenter can realize the detection of a different region (i.e., the previously undetectable region), avoiding secondary sample preparation from destroying the sample morphology, composition and other information, and reducing sample loss.

[0040] The preferred specific embodiments of the present invention are described in detail above. It should be understood that a person skilled in the art can make many modifications and changes based on the concept of the present invention without creative work. Therefore, any technical solution that can be obtained by a person skilled in the art through logical analysis, reasoning or limited experiments based on the concept of the present invention on the basis of the prior art should be within the scope of protection determined by the claims.

Claims

1. A sample preparation device for high-throughput characterization of fiber material microstructure, characterized in that: It includes a fixture and a sample stage. The fixture is a hexagonal hole for placing the sample stage. The fixture includes a circular hole. A triangular groove is provided on the surface of the sample stage. The triangular groove is opposite to and connected to the circular hole of the fixture. Two fixtures are provided, which are respectively mounted at both ends of the sample stage.

2. A sample preparation device for high-throughput characterization of fiber material microstructure according to claim 1, characterized in that: The fixture is configured as a regular hexagon with a hollow center, the hollow center portion being a regular hexagonal hole circumscribed by a circle, a cylinder being provided at the bottom of the fixture for fixing the sample stage matched with the microscope, and a circular hole being provided on each of the other five sides for fixing the sample stage.

3. A sample preparation device for high-throughput characterization of fiber material microstructure according to claim 1, characterized in that: The sample stage is configured as a cylindrical sample stage, and the triangular groove is configured on the surface of the cylindrical surface.

4. A sample preparation device for high-throughput characterization of fiber material microstructure according to claim 2, characterized in that: The circular hole of the fixture is arranged as a threaded arrangement for fixing the sample stage.

5. A sample preparation device for high-throughput characterization of fiber material microstructure according to claim 2, characterized in that: The hexagonal hole of the fixture is a regular hexagonal hole circumscribed with a circle of radius 6 cm.

6. A sample preparation device for high-throughput characterization of fiber material microstructure according to claim 2, characterized in that: The diameter of the circular hole of the fixture is set to 1.60 mm.

7. A sample preparation device for high-throughput characterization of fiber material microstructure according to claim 1, characterized in that: The length for placing the fiber material sample is set to 0-60 cm.

8. A sample preparation method for high-throughput characterization of fiber material microstructure, characterized in that: Using a sample preparation device for high-throughput characterization of fiber material microstructure as described in any one of claims 1 to 7 comprises the following steps: Wind the carbon glue evenly on the sample stage; The cut fiber material samples are orderly wrapped around a sample table wrapped with carbon glue; Assemble the sample stage; Place the sample stage into a scanning electron microscope or confocal laser scanning microscope for high-throughput characterization of your samples.

9. A sample preparation method for high-throughput characterization of fiber material microstructure according to claim 8, characterized in that: Assembling the sample stage consists of the following steps: Place the two ends of the cylindrical sample stage in two fixtures, align the triangular groove on the sample stage with the circular hole in the required direction, and fix it with screws; The cylinder at the bottom of the fixture is inserted into a matching sample base of a scanning electron microscope or a laser confocal microscope and fixed to complete the sample stage assembly.

Images