Wavelength detection method, system, equipment and medium

Abstract

The invention discloses a wavelength detection method, system and device and a medium, and the method comprises the steps: enabling to-be-detected light to irradiate a holographic optical element HOE, and enabling the HOE to generate diffraction of different angles according to the wavelength of incident light; the detector is used for receiving the light rays diffracted by the HOE and sending the light rays to the detector, and the detector is used for receiving the light rays diffracted by the HOE and detecting the intensity distribution of the light rays diffracted by the HOE; and determining the wavelength of the light to be detected based on the intensity distribution of the light on the CCD. By adopting the HOE and CCD technologies, the high precision is successfully maintained, and meanwhile, the miniaturization of equipment and the effective control of the cost are realized. The small-sized high-precision spectrograph not only fills the deficiency of small-sized high-precision spectrographs in the market, but also can be applied to laser display and other accurate spectral measurement.

Description

Technical Field

[0001] The present application relates to the technical field of wavelength detection, and in particular to a wavelength detection method, system, device and medium. Background Art

[0002] In laser display technology, narrow spectral width red, green, and blue lasers are mainly used as light sources. However, due to the limitations of output power and conversion efficiency, the types of high-power laser wavelengths commonly used in laser display equipment are relatively limited, including central wavelengths such as 445nm, 450nm, 465nm, 520nm, 525nm, 532nm, 638nm, and 641nm. These lasers are usually composed of multiple semiconductor diodes, and the central wavelength and spectral width of each module are different, generally fluctuating within the range of ±5nm. In addition, under different temperature and humidity conditions, or with changes in service life, the wavelength of the laser may drift or change, but the drift amount is usually kept below 5nm.

[0003] In view of the needs of production, maintenance and white balance adjustment, it is particularly important to quickly detect the wavelength and color coordinates of the laser in the laser display device. There are some instruments on the market that can detect wavelengths, such as Yokogawa interferometer spectrometer, CS-2000 color luminance meter and Yuanfang SRC-600 color luminance meter. The accuracy of these spectrometers is as high as 0 . However, they also have disadvantages such as high cost, high price, bulky size and inconvenient use. In contrast, although conventional dispersive spectrometers are easy to carry and cost-controlled, their accuracy can only reach the nanometer level and cannot meet specific usage requirements. Summary of the invention

[0004] Based on the above problems, the present application provides a wavelength detection method, system, device and medium.

[0005] To solve the above problems, the technical solutions provided in the embodiments of the present application are as follows:

[0006] The first aspect of the present application provides a wavelength detection method, comprising:

[0007] The light to be detected is irradiated onto the holographic optical element HOE, wherein the HOE is used to generate diffraction at different angles according to the wavelength of the incident light;

[0008] Receive the light after HOE diffraction and reach CCD, the CCD is used to receive the light after HOE diffraction and detect the intensity distribution of the light after HOE diffraction;

[0009] Based on the intensity distribution of light on the CCD, the wavelength of the light to be detected is determined.

[0010] In a possible implementation, the light to be detected is a light beam passing through a collimator, and the collimator is used to convert the light beam into parallel light, so that the light to be detected is uniform before the HOE.

[0011] In a possible implementation, the light to be detected is a light beam passing through a slit, and the slit is used to control the width of the light beam.

[0012] In a possible implementation, the HOE is in a non-rotational mode, and based on the correspondence between the wavelength of the incident light and the pixel position of the CCD, the pixel position on the CCD is converted into the corresponding wavelength of the incident light.

[0013] In a possible implementation, the HOE is in a rotating mode, and the HOE is rotated so that diffracted light of different wavelengths falls on the same position of the CCD;

[0014] Based on the correspondence between the HOE angle and the wavelength, the read HOE angle is converted into the wavelength of the light to be detected.

[0015] In a possible implementation, the wavelength of the light to be detected is calculated based on the correspondence between the HOE angle and the wavelength, including:

[0016] Based on the relationship between the angle between the recorded light beam and the vertical direction, the angle between the diffracted light beam and the vertical direction, the distance between the HOE and the CCD, the central wavelength, and the image height on the CCD, the wavelength of the light to be detected is calculated.

[0017] In a possible implementation, converting the pixel position on the CCD to the corresponding incident light wavelength based on the correspondence between the incident light wavelength and the CCD pixel position includes:

[0018] The wavelength of the incident light is determined based on the relationship between the angle between the recorded light beam and the vertical direction, the angle between the diffracted light beam and the vertical direction, the wavelength to be measured, the central wavelength, the image height on the CCD, and the focal length of M2.

[0019] A second aspect of the present application provides a wavelength detection system, comprising:

[0020] An irradiation unit, used for irradiating the light to be detected onto the holographic optical element HOE, wherein the HOE is used for generating diffraction at different angles according to the wavelength of the incident light;

[0021] A receiving unit, used to receive the light after diffraction by the HOE and reach the CCD, wherein the CCD is used to receive the light after diffraction by the HOE and detect the intensity distribution of the light after diffraction by the HOE;

[0022] The determination unit is used to determine the wavelength of the light to be detected based on the intensity distribution of the light on the CCD.

[0023] The third aspect of the present application provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the detection method described in the first aspect is implemented.

[0024] The fourth aspect of the present application provides a computer-readable storage medium, in which instructions are stored. When the instructions are executed on a terminal device, the terminal device executes the detection method as described in the first aspect above.

[0025] Compared with the prior art, this application has the following beneficial effects:

[0026] The HOE of the present application can produce diffraction at different angles according to the wavelength of the incident light, which enables the CCD detector to accurately detect the intensity distribution of the light after the HOE diffraction, and then obtain accurate wavelength information through data analysis. By combining the diffraction characteristics of the HOE with the precise measurement of the detector, the present application can achieve high-precision wavelength detection and meet the high requirements for wavelength accuracy in laser display devices. At the same time, the holographic optical element (HOE) used in the present application has the characteristics of small size and light weight. Combined with the simple optical structure and compact design, the entire spectrometer has a small structure and is easy to carry and use. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions in this embodiment or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0028] Figure 1 A method flow chart provided for an embodiment of the present application;

[0029] Figure 2 A first detection schematic diagram provided in an embodiment of the present application;

[0030] Figure 3 A wave vector analysis diagram of the first detection schematic diagram provided in an embodiment of the present application;

[0031] Figure 4 A second detection schematic diagram provided in an embodiment of the present application;

[0032] Figure 5 A wave vector analysis diagram of the second detection schematic diagram provided in an embodiment of the present application;

[0033] Figure 6A structural diagram of a wavelength detection system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0034] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0035] To facilitate understanding of the technical solutions provided by the embodiments of the present application, the professional terms involved in the embodiments of the present application will be explained below.

[0036] Holographic optical elements (HOE) are optical elements made according to the principle of holography. They are usually made on photosensitive film materials and are a type of diffraction optical element. Holographic optical elements are made of holographic recording media such as dichromated gelatin, photopolymer photosensitive materials, and photoresists. Unlike ordinary optical elements made of optical glass, crystals, or transparent media, the function of holographic optical elements is based on the principle of diffraction rather than the refraction and reflection laws of geometric optics. Holographic optical elements mainly include holographic lenses, holographic gratings, holographic filters, holographic scanners, etc.

[0037] CCD, the full name of Charge-Coupled Device, is a semiconductor device that can convert optical images into digital signals. The tiny photosensitive substances implanted on the CCD are called pixels. The more pixels a CCD contains, the higher the picture resolution it provides. The basic working principle of CCD is to convert images into electrical signals and convert them into digital signals through an analog-to-digital converter chip. Specifically, when light shines on the CCD chip, photons hit the pixels on the chip, causing the charge in the pixels to change. These charges are then transferred to the readout register of the CCD and converted into digital signals through a series of electronic processing steps.

[0038] To facilitate understanding of the technical solutions provided by the embodiments of the present application, the background technology involved in the embodiments of the present application will be described below.

[0039] As mentioned above, the prior art has some deficiencies in the detection of light source wavelength and color coordinates in laser display devices.

[0040] First, high-precision instruments are expensive and not portable. For example, high-precision instruments such as Yokogawa interferometer spectrometers cost hundreds of thousands of yuan each, which is too expensive for most laser display equipment manufacturers, maintenance and users. These high-precision instruments are large in size, not easy to carry, and cannot meet the needs of rapid on-site detection.

[0041] Secondly, although conventional dispersive spectrometers are cost-effective and easy to carry, their accuracy can only reach the nm level, which cannot meet the high-precision detection requirements of laser wavelength and color coordinates in laser display devices.

[0042] Third, the wavelength of the laser in the laser display device may drift or change under different temperature and humidity conditions, or as the service life increases, requiring frequent detection and calibration. Existing instruments are difficult to meet this demand in terms of portability and cost.

[0043] In order to solve this problem, the embodiment of the present application uses a holographic optical element (HOE) to achieve high-precision wavelength detection. HOE is an optical element obtained by holographic recording technology, whose structure is similar to a diffraction grating, and whose intensity distribution presents a sinusoidal distribution characteristic.

[0044] The laser spectrometer based on holographic optical element (HOE) proposed in this application has a simple structure, low cost, and can achieve high-precision (0.1nm) wavelength detection. Through reasonable HOE design and data processing process, the cost is effectively reduced while meeting the demand for high-precision detection.

[0045] The light first passes through a slit and is adjusted by a collimator to ensure that the light is parallel and in the same direction. Subsequently, the light is irradiated onto a pre-recorded holographic optical element (HOE). The HOE acts as a diffraction grating, diffracting the incident light. According to the wavefront vector diagram and the diffraction angle formula, the direction in which the HOE diffraction efficiency is highest can be determined, that is, after the light passes through the HOE, it will be diffracted at a specific angle. The diffracted light eventually reaches the CCD (charge-coupled device). The CCD can capture the intensity distribution of the diffracted light signal and determine the diffraction angle of the incident light based on this distribution information. Furthermore, the diffraction angle formula can be used to infer the wavelength of the incident light.

[0046] On the one hand, the laser spectrometer adopts a handheld design, which is small in size and easy to carry. It can quickly detect the wavelength of the laser anytime and anywhere, greatly improving the convenience of use. On the other hand, the laser spectrometer can cover the full wavelength range of visible light (400-700nm), and through the rotation design of HOE, it can flexibly detect lasers of different wavelengths without replacing the detection element, thereby improving the versatility and flexibility of the equipment. In addition, in response to the possible drift problem of the laser wavelength, the laser spectrometer provided in this application can quickly and accurately detect the change of wavelength, and calibrate in real time to ensure the color accuracy and stability of the laser display device.

[0047] It should be noted that the detection method, system, device and medium provided in the present application can be applied to the field of computer technology. The above is only an example, and the application field of the detection method, system, device and medium provided in the present application is not limited. In addition, the embodiments of the present application may not limit the execution subject of the detection. For example, the detection method of the embodiment of the present application can be applied to data processing equipment such as terminal equipment or servers. Among them, the terminal equipment can be electronic devices such as smart phones, computers, personal digital assistants (Personal Digital Assistant, PDA). The server can be an independent server, a cloud server or a cluster server composed of multiple servers.

[0048] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0049] The following is an example to illustrate a wavelength detection method provided by the present application. Figure 1 , Figure 1 A method flow chart provided for an embodiment of the present application includes:

[0050] S101, irradiating the light to be detected onto the holographic optical element HOE, wherein the HOE is used to generate diffraction at different angles according to the wavelength of the incident light.

[0051] In a possible implementation, the light first passes through a slit for preliminary spatial filtering, and then passes through a collimator to become parallel light, which then irradiates a recorded holographic optical element (HOE).

[0052] As a diffraction grating, HOE can produce different diffraction angles according to the wavelength of the incident light. The collimated light is irradiated onto the HOE, and the HOE disperses the light at a specific diffraction angle. The diffraction angle of the HOE depends on the wavelength of the incident light and the manufacturing parameters of the HOE itself (such as periodic structure, thickness, etc.). According to Bragg's law or other related theories, when the diffraction efficiency of the HOE is the highest, the corresponding diffraction angle can be calculated by the formula. The diffracted light is then captured by the CCD (charge coupled device) to form the intensity distribution of the diffracted light signal.

[0053] S102, receiving the light diffracted by the HOE and allowing it to reach the detector.

[0054] The detector is used to receive the light after HOE diffraction and detect the intensity distribution of the light after HOE diffraction. The diffracted light reaches CCD (charge coupled device) or similar photodetector. CCD can detect and record the intensity distribution of these diffracted light on the detector. Different wavelengths of light have different diffraction angles, so the spot positions formed on CCD are also different.

[0055] S103 . Determine the wavelength of the light to be detected based on the intensity distribution of the light on the CCD.

[0056] By analyzing the intensity distribution of the diffraction light signal received on the CCD, the position information of these diffraction spots can be determined.

[0057] In a possible implementation, the present application embodiment proposes two wavelength measurement methods:

[0058] The first method (HOE does not rotate) is applicable to the case of insensitivity to wavelength or a narrow wavelength range, and its advantage is simple implementation.

[0059] Assume that the HOE is recorded in a transmissive plane phase according to a certain central wavelength (such as 520nm). For a single primary color laser, the intensity distribution of the diffracted light signal will show a peak value, and the position corresponding to the peak value is the specific pixel position of the central wavelength of the laser on the CCD. When the wavelength of the incident light changes, the diffraction angle will also change, causing the position of the diffracted light signal on the CCD to shift. The wavelength of the incident light can be accurately measured through the correspondence between the pre-established diffraction angle formula and the CCD pixel position.

[0060] The second method (HOE rotation) is suitable for situations where the wavelength range is wide or precise measurement is required. Unlike the method where the HOE is not rotated, by rotating the HOE, the position where the strongest diffracted light of lasers of different wavelengths falls on the same position of the CCD when the diffraction efficiency is the highest (or for different colors such as red, green, and blue, it can correspond to three different pixel positions on the CCD). The advantage is that by rotating the HOE, the positions of light of different wavelengths on the CCD can be the same, which is convenient for measurement and calibration. However, it is relatively complicated to implement and requires the establishment of an accurate correspondence.

[0061] By rotating the HOE and recording the light intensity distribution on the CCD at different angles, the corresponding relationship between the HOE angle and the wavelength is pre-established. When a new laser light needs to be measured, the HOE is rotated so that the position where the diffracted light is strongest is aligned with the preset position, and then the angle of the HOE is read to determine the wavelength of the incident light based on the corresponding relationship.

[0062] This application uses a holographic optical element. According to the wavefront vector diagram, the diffraction angle formula can be obtained, that is, the direction with the highest HOE diffraction efficiency. First, after the light passes through the slit, it passes through the collimator to reach the recorded holographic optical element, and then reaches the CCD, the intensity distribution of the diffracted light signal can be obtained, and then the diffraction angle information of the incident light can be obtained. The wavelength of the incident light can be obtained using the diffraction angle formula. The calculation process of the two measurement methods is explained below:

[0063] For the first measurement method, that is, the HOE does not rotate, such as Figure 2 and Figure 3 As shown, Figure 3 The wave vector analysis diagram of the first detection schematic diagram provided in the embodiment of the present application includes a hologram and a grating vector cloud, and each parameter in the diagram is referenced to a fixed coordinate system. and the z direction, θ is the angle of the diffracted beam The angle between the z direction and is the grating vector norm, d is the volume hologram thickness, is the reproducing wave vector, is the diffraction wave vector, is the object light wave vector, is the reference wave vector.

[0064] Figure 2The first detection schematic diagram provided for the embodiment of the present application, in which M1 represents collimating lens 1, M2 represents collimating lens 2, and it is assumed that HOE records the transmission plane phase according to the central wavelength of 520nm; if it is a single primary color laser, it is a curve with only one peak, and the position corresponding to the peak is the central wavelength, which falls on a specific pixel on the CCD; when the wavelength changes, the diffraction angle changes, and it will fall on other CCD pixels; according to the diffraction angle formula, the corresponding relationship between the wavelength and the CCD pixel position can be obtained. After calibration, it can be used for wavelength detection with an accuracy of 0.1nm.

[0065] Transmission type, diffraction efficiency formula:

[0066]

[0067] In the above formulas 1 and 2, λ0 is the wavelength of the recording laser (center), λ is the wavelength to be measured, and θ0 is the recording beam and the z direction, θ is the angle of the diffracted beam and the z direction, K is the grating vector modulus, n1 is the refractive index modulation, and d is the volume hologram thickness.

[0068] The diffraction formula is as follows:

[0069]

[0070] h=l·tan(θ0-θ) (Formula 4)

[0071]

[0072] Among them, h is the image height on the CCD, l is the focal length of M2, and in actual application scenarios, λ0 and θ0 can be pre-set according to actual needs to obtain the corresponding relationship between λ and θ. Therefore, the wavelength of the incident light can be determined based on the measured θ.

[0073] In one possible implementation, the range can be calculated based on the diffraction formula and the formula for the closure of the wave vector triangle within the grating vector cloud:

[0074]

[0075] The upper limit of the range is obtained as:

[0076]

[0077] According to the diffraction formula and the formula for the closure of the wave vector triangle within the grating vector cloud:

[0078]

[0079] The calculation method for obtaining the lower limit of the range can be:

[0080]

[0081] According to the diffraction efficiency analysis, the coefficient q should be greater than 1, and the larger the value of the coefficient q, the closer the closed position of the wave vector triangle is to the center of the grating vector cloud, and the higher the diffraction efficiency. According to the range of 400-700nm, the approximate range of d and θ0 is determined. In a possible implementation, the value can be 2 for q, 3 microns for d, and θ0 should be about 20°. According to the diffraction efficiency formula, the final values ​​of d and θ0 are determined.

[0082] For the second measurement method, see Figure 4 , Figure 4 A second detection schematic diagram provided in an embodiment of the present application, Figure 5 This is a wave vector analysis diagram of the second detection schematic diagram provided in an embodiment of the present application. In the diagram, M1 represents collimating lens 1, and M2 represents collimating lens 2, that is, the HOE can rotate. When the diffraction efficiency is the highest, the measurement wavelength is calculated according to the following formula.

[0083]

[0084] h=l·tan(θ-θ0) (Formula 10)

[0085]

[0086] Where λ0 is the wavelength of the recording laser (center), λ is the wavelength to be measured, and θ0 is the recording beam. and the vertical direction, θ is the angle of the diffracted beam The angle between the vertical direction and the

[0087] In summary, the present application has successfully achieved high-precision performance by adopting a simple structural design. Its accuracy mainly depends on several key factors, namely the width of the light entrance slit, the aberration control of the spectrometer, and the diffraction efficiency. This means that during the design and manufacturing process, as long as these parameters are accurately controlled, it can be ensured that the present invention achieves very high measurement or analysis accuracy. This high-precision implementation method not only improves the performance of the instrument, but also makes the present invention have greater advantages in application scenarios that require high-precision measurements.

[0088] Existing high-precision spectrometers such as Yokogawa interferometer spectrometers, although the accuracy is as high as 0.1nm or more, are expensive, bulky, and inconvenient to use. The present application utilizes the diffraction characteristics of HOE and realizes high-precision wavelength detection through simple optical structures (such as slits, collimators, HOEs, and CCD detectors), thereby avoiding complex and expensive spectral analysis systems and significantly reducing costs. At the same time, due to its compact structure, it is easy to carry and use, meeting the needs of handheld laser spectrometers. And the holographic optical element HOE used in the embodiment of the present application can be recorded in batches, which means that it can be mass-produced without additional customization costs. The advantage of mass production is that as the scale of production expands, the cost of each HOE will be significantly reduced, thereby making the cost of the entire system lower. This is particularly important for scenarios that require wide application or large-scale deployment. In addition, the simple structural design also reduces the complexity of manufacturing and assembly, further reducing costs.

[0089] Although conventional dispersive spectrometers are easy to carry and have controllable costs, their accuracy is usually only at the nm level, which cannot meet the high-precision requirements of spectral detection in laser display. This application accurately designs the diffraction efficiency and diffraction angle formula of HOE, uses a CCD detector to receive the light intensity distribution after HOE diffraction, and calculates the wavelength of the incident light according to the diffraction angle formula. After calibration, the wavelength detection accuracy of this application can reach 0.1nm, which is much higher than the accuracy of conventional dispersive spectrometers, meeting the high-precision requirements of spectral detection in laser display.

[0090] The holographic optical element (HOE) used in this application has the characteristics of small size and light weight. Combined with a simple optical structure and compact design, the entire spectrometer is small in structure and easy to carry and use. This solves the problem that the existing high-precision spectrometer is bulky and inconvenient to use, and provides convenience for on-site detection and maintenance of laser display equipment.

[0091] The above are some specific implementations of the detection method provided in the embodiment of the present application. Based on this, the present application also provides a corresponding system for detection. The system provided in the embodiment of the present application will be introduced from the perspective of functional modularization. Figure 6 A structural diagram of a wavelength detection system provided in an embodiment of the present application.

[0092] The system comprises:

[0093] An irradiation unit 110 is used to irradiate the light to be detected onto the holographic optical element HOE, and the HOE is used to generate diffraction at different angles according to the wavelength of the incident light;

[0094] The receiving unit 111 is used to receive the light after the HOE diffraction and arrive at the detector, and the detector is used to receive the light after the HOE diffraction and detect the intensity distribution of the light after the HOE diffraction;

[0095] The determination unit 112 is used to determine the wavelength of the light to be detected based on the intensity distribution of the light on the CCD.

[0096] The embodiments of the present application also provide corresponding devices and computer storage media for implementing the detection method scheme provided in the embodiments of the present application.

[0097] The device includes a memory and a processor, the memory is used to store instructions or codes, and the processor is used to execute the instructions or codes so that the device executes the detection method described in any embodiment of the present application.

[0098] The computer storage medium stores codes, and when the codes are executed, the device executing the codes implements the detection method described in any embodiment of the present application.

[0099] It should be noted that the various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments can be referred to each other. For the system or device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part description.

[0100] It should be understood that in the present application, "at least one (item)" means one or more, and "plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" can mean: only A exists, only B exists, and A and B exist at the same time, where A and B can be singular or plural. The character " / " generally indicates that the objects associated before and after are in an "or" relationship. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0101] It should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0102] It should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0103] It should also be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0104] The steps of the method or algorithm described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), a memory, a read-only memory (ROM), an electrically programmable ROM, an electrically erasable programmable ROM, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0105] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A wavelength detection method, characterized in that: include: The light to be detected is irradiated onto the holographic optical element HOE, wherein the HOE is used to generate diffraction at different angles according to the wavelength of the incident light; Receive the light after HOE diffraction and reach CCD, the CCD is used to receive the light after HOE diffraction and detect the intensity distribution of the light after HOE diffraction; Based on the intensity distribution of light on the CCD, the wavelength of the light to be detected is determined.

2. The method according to claim 1, characterized in that The light to be detected is a light beam passing through a collimator, and the collimator is used to convert the light beam into parallel light, so that the light to be detected is uniform before the HOE.

3. The method according to claim 1, characterized in that The light to be detected is a light beam passing through a slit, and the slit is used to control the width of the light beam.

4. The method according to claim 1, characterized in that The HOE is in a non-rotational mode and converts the pixel position on the CCD into the corresponding incident light wavelength based on the corresponding relationship between the incident light wavelength and the CCD pixel position.

5. The method according to claim 4, characterized in that The HOE is in a rotating mode, and by rotating the HOE, diffracted light of different wavelengths all fall on the same position of the CCD; Based on the correspondence between the HOE angle and the wavelength, the read HOE angle is converted into the wavelength of the light to be detected.

6. The method according to claim 5, characterized in that The wavelength of the light to be detected is calculated based on the corresponding relationship between the HOE angle and the wavelength, including: Based on the relationship between the angle between the recorded light beam and the vertical direction, the angle between the diffracted light beam and the vertical direction, the distance between the HOE and the CCD, the central wavelength, and the image height on the CCD, the wavelength of the light to be detected is calculated.

7. The method according to claim 4, characterized in that The step of converting the pixel position on the CCD into the corresponding incident light wavelength based on the corresponding relationship between the incident light wavelength and the CCD pixel position includes: The wavelength of the incident light is determined based on the relationship between the angle between the recorded light beam and the vertical direction, the angle between the diffracted light beam and the vertical direction, the wavelength to be measured, the central wavelength, the image height on the CCD, and the focal length of M2.

8. A wavelength detection system, characterized in that: The system comprises: An irradiation unit, used for irradiating the light to be detected onto the holographic optical element HOE, wherein the HOE is used for generating diffraction at different angles according to the wavelength of the incident light; A receiving unit, used to receive the light after diffraction by the HOE and reach the CCD, wherein the CCD is used to receive the light after diffraction by the HOE and detect the intensity distribution of the light after diffraction by the HOE; The determination unit is used to determine the wavelength of the light to be detected based on the intensity distribution of the light on the CCD.

9. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the detection method according to any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores instructions, and when the instructions are executed on a terminal device, the terminal device executes the detection method according to any one of claims 1 to 7.

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