Isolation device interface test system and test method

Abstract

The invention discloses an isolation device interface test system and test method. The test system comprises a control platform used for generating a corresponding control signal according to a currently selected test item; the test equipment is used for simulating the aerial carrier platform according to the control signal and generating a corresponding test signal; and the test adapter plate is used for transferring a test signal to a port corresponding to the isolation device interface, and returning return data fed back by the port to the control platform through the test equipment, so that the control platform can generate a test result according to the return data. According to the invention, the test equipment can be built by adopting test equipment with lower cost, and compared with an expensive aerial carrier platform, the test cost is greatly reduced; the control platform can perform analysis, measurement and calculation and generate the test result according to the return data fed back by the tested port, manual test is not needed, the test efficiency can be obviously improved, and test errors caused by manual operation are reduced or even avoided.

Description

Technical Field

[0001] The invention relates to an isolation device interface testing system and a testing method, belonging to the technical field of automated testing. Background Art

[0002] In the field of industrial control communication, industrial control communication needs to send the data collected by the downstream equipment to the background, and the background will process the data and then feed it back to the downstream equipment. Data communication is required in the middle. Data communication has a variety of data interfaces, and common data interfaces include RS485, RS232, RS422, etc. However, these common interfaces usually cannot achieve electrical isolation between input signals when collecting multiple signals; or use optocouplers to achieve electrical isolation, which has the technical problem of poor linearity.

[0003] For this reason, an isolation device interface has been developed in the prior art, which can realize electrical isolation between input signals when collecting multi-channel signals, and has a good suppressive effect on loop noise. However, the isolation device interface is an integrated device, which involves many parameter indicators, resulting in a test bottleneck during mass production. Taking the YX050101 isolation interface circuit as an example, it involves the parameter indicators of the RS422 transceiver and the isolator, and the test load conditions are different. If a manual test bench is used for manual testing, there are not only technical problems such as high test difficulty and high test cost, but also facing more parameter indicators, each circuit needs to be tested for about 20 minutes, the test efficiency is low, and there is a high risk of manual misoperation. Therefore, when the product enters mass production, product testing will be a major bottleneck to achieve capacity improvement. Summary of the invention

[0004] The purpose of the present invention is to overcome the deficiencies in the prior art, provide an isolation device interface test system and test method, and solve the technical problems of high test cost and low efficiency in the prior art.

[0005] In order to solve the above technical problems, the present invention is implemented by adopting the following technical solutions: In a first aspect, the present invention provides an isolation device interface testing system, comprising: Control platform: used to generate corresponding control signals according to the currently selected test items; Testing equipment: used for generating a test signal corresponding to the test item according to the control signal; Test adapter board: used to transfer the test signal to the port corresponding to the isolation device interface, and transmit the feedback data fed back by the port to the control platform through the test equipment, so that the control platform can generate test results based on the feedback data.

[0006] In combination with the first aspect, further, the test device includes an acquisition card; When the currently selected test item is the serial port data rate test item, the acquisition card is used to send a square wave signal through the TXD port of the isolation device interface of the test adapter board according to the control direction of the control platform, and collect the return data fed back by the Y and Z ports of the isolation device interface and transmit it back to the control platform; and is also used to send a square wave signal to the A and B ports of the isolation device interface through the test adapter board according to the control of the control platform, and collect the return data fed back by the RXD port of the isolation device interface and transmit it back to the control platform; When the currently selected test item is the IO port data frequency test item, the acquisition card is used to send square wave signals to the input ports of each IO port of the isolation device interface through the test adapter board according to the control of the control platform, and collect the feedback data fed back by the output port corresponding to each IO port and transmit it back to the control platform.

[0007] In combination with the first aspect, further, the test equipment also includes an acquisition card, a programmable power supply and an adjustable electronic load; When the currently selected test item is the IO drive capability test item, the adjustable electronic load is connected to the output ports of each IO port of the isolation device interface through the test adapter board, so as to simulate different load conditions of the carrier platform; the adjustable power supply output terminal or GND terminal of the programmable power supply is respectively connected to the input port of each IO port of the isolation device interface, so as to provide a high level or a low level for the input port of each IO port; the current acquisition port of the acquisition card is connected to the current output terminal of the adjustable electronic load, so as to acquire the output current of the output port of each IO port under different load conditions, and transmit the output current back to the control platform.

[0008] In combination with the first aspect, further, the test equipment includes an acquisition card, a programmable power supply and a multimeter; When the currently selected test item is the IO port output high and low level test item, the adjustable power supply output terminal or GND terminal of the programmable power supply is respectively connected to the input port of each IO port of the isolation device interface, so as to provide a high level or a low level for the input port of each IO port; the multimeter is connected to the output port of each IO port of the isolation device interface through a test adapter board, so as to measure the output voltage of the output port of each IO port; the acquisition card is used to transmit the output voltage back to the control platform.

[0009] In combination with the first aspect, further, the test equipment includes an acquisition card and an oscilloscope; When the currently selected test item is a serial port or IO port transmission delay test item, the acquisition card is used to send a test square wave to the TXD port, Z port and Y port of the isolation device interface, or to the input port of each IO port, respectively, through the test adapter board according to the control of the control platform, and capture the output waveform of the A port, B port and RXT port of the isolation device interface, or the output port of each IO port through the oscilloscope, and transmit the output waveform back to the control platform; The control platform determines the transmission delay of the serial port or the IO port by comparing the time difference between the test square wave and the output waveform.

[0010] In combination with the first aspect, further, the test device is connected to the test adapter board via an integrated plug.

[0011] In combination with the first aspect, further, the test equipment includes an isolation withstand voltage tester; When the currently selected test item is the isolation voltage withstand test, the isolation voltage withstand tester is used to perform isolation voltage withstand tests on each port of the isolation device interface according to the electrostatic interference that may be generated during the operation of the simulated carrier platform under the control of the control platform, and transmit the feedback data from each port back to the control platform.

[0012] In combination with the first aspect, optionally, the isolation and voltage withstand tester is connected to the test adapter board via a high voltage resistant cable.

[0013] In combination with the first aspect, optionally, the test adapter board is connected to the port to be tested of the isolation device interface through a fixture.

[0014] In a second aspect, the present invention provides an isolation device interface testing method, the method comprising: Generate a control signal according to the currently selected test item to control the test device to generate a test signal corresponding to the test item according to the control signal; Receive the feedback data sent back by the test device, and generate a test result according to the feedback data; The feedback data is data fed back by the tested port of the isolation device interface after receiving the test signal.

[0015] Compared with the prior art, the present invention has the following beneficial effects: The isolation device interface test system provided in the present application uses test equipment to simulate the existing carrier platform. The test equipment can be built with low-cost test devices. Compared with the expensive carrier platform, the test system provided by the present application greatly reduces the test cost; for different test items, the control platform can control the test equipment to generate different test signals. The control platform can analyze and calculate the feedback data fed back by the tested port to generate test results. There is no need for manual testing, which can significantly improve test efficiency and reduce or even avoid test errors caused by manual operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a circuit principle block diagram of an isolation device interface test system provided by an embodiment of the present invention; Figure 2 It is a flow chart of a serial port data rate testing method of an isolation device interface provided by an embodiment of the present invention; Figure 3 It is a flow chart of a method for testing the IO port driving capability of an isolation device interface provided by an embodiment of the present invention; Figure 4 It is a flow chart of a method for testing high and low levels of IO port outputs of an isolation device interface provided by an embodiment of the present invention; Figure 5 It is a flow chart of an isolation withstand voltage test method for an isolation device interface provided by an embodiment of the present invention; Figure 6 It is a flow chart of a method for testing serial port and IO port transmission delay of an isolation device interface provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0017] The technical solution of the present invention is described in detail below through the accompanying drawings and specific embodiments. It should be understood that the embodiments of the present application and the specific features in the embodiments are detailed descriptions of the technical solution of the present application, rather than limitations on the technical solution of the present application. In the absence of conflict, the embodiments of the present application and the technical features in the embodiments can be combined with each other.

[0018] The term "and / or" in this article is only a description of the association relationship of the associated objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0019] Embodiment 1:

[0020] like Figure 1FIG. 1 is a circuit principle block diagram of an isolation device interface test system provided by an embodiment of the present invention, including a control platform, a test device and a test adapter board, wherein the control platform is connected to the test adapter board through the test device. During the test, the test adapter board is connected to the tested port of the isolation device interface.

[0021] For isolation devices with integrated multi-functional interfaces, they usually have multiple ports, and the same port may have different functions under different operating conditions. Before testing, the user can select the test items of the port according to actual needs. Specifically, information can be exchanged with the control platform through the human-computer interaction device. During the test, the control platform can automatically generate a corresponding control signal according to the currently selected test item; the test device is used to generate a test signal corresponding to the test item according to the control signal; the test adapter board serves as an interface conversion component, which mainly realizes the conversion and adaptation between the test device port and the isolation device interface. During the test, it is used to transfer the test signal output by the test device to the port corresponding to the isolation device interface, and is also used to feed back the return data generated by the tested port according to the test signal to the test device. The control platform can receive the return data through the test device, and analyze the return data to generate test results.

[0022] It should be noted that the test equipment can be selected from one or more low-priced test instruments in the prior art. When multiple test instruments are configured, one of the multiple test instruments can be used independently or in conjunction with other test instruments to complete different test items. It should be understood that the selection of the test instrument can be determined based on the test items required for the isolation device interface.

[0023] In summary, the isolation device interface test system provided by the present application uses test equipment to simulate the carrier platform in the prior art, and the test equipment can be built with low-cost test devices. Compared with the expensive carrier platform, the test system provided by the present application greatly reduces the testing cost; for different test items, the control platform can control the test equipment to generate different test signals, and the control platform can analyze and calculate the feedback data fed back by the tested port to generate test results. There is no need for manual testing, which can significantly improve the testing efficiency.

[0024] The following is a further detailed description of the test system provided by the present application, taking an isolated RS485\RS422 transceiver as an example.

[0025] The isolated RS485\RS422 transceiver is also equipped with 4 isolated IOs, including two sending ports and two receiving ports. After level conversion and high-voltage isolation, the RXD and TXD signals are input or output to the transceiver and connected to external devices through the transceiver bus. After LEVELSHIFT, the signal level of DIN1, DIN2, DOUT3, and DOUT4 is converted into a level compatible with the isolator to complete the signal receiving and sending function. The control platform can use a host computer, and the host computer software can use Labview software, which has the functions of test equipment output control, automatic collection of return data, analysis and processing of return data, and storage.

[0026] As shown in Table 1, it is a pin function description table of the isolation device provided in this embodiment:

[0027] Table 1 For the above isolation device interface, the test items may include serial port data rate test, IO port data frequency test, IO port drive capability test, IO port output high and low level test, isolation withstand voltage test and serial port / IO port transmission delay test.

[0028] like Figure 2 As shown, if the currently selected test item is a serial port data rate test item, the test equipment can only be configured with an acquisition card. During the test, the acquisition card can be used to send a square wave signal to the TXD port of the isolation device interface through the test adapter board according to the control of the control platform; at the same time, the acquisition card can also collect the feedback data fed back by the Y and Z ports of the isolation device interface, and transmit the feedback data back to the control platform. The control platform can generate a feedback waveform based on the feedback data, and generate the data rate test result of the tested port by analyzing and judging the waveform quality and frequency of the feedback waveform. If the square wave signal sent to the TXD port is a square wave signal with a low level of 0V, a high level of 5V, a duty cycle of 50%, and a frequency of 10MHz, then for Figure 2 The "test passed" returned in the test means that the returned waveform is a square wave with a low level of -0.2~0.2V, a high level of 4.8~5.2V, a duty cycle of 50%, and a frequency of 10±0.2MHz; otherwise, the test result of "test failed" is returned.

[0029] Correspondingly, for ports A and B, the acquisition card can send a square wave signal to ports A and B of the isolation device interface through the test adapter board according to the control of the control platform, and collect the feedback data fed back by the RXD port of the isolation device interface and transmit it back to the control platform. Similarly, the control platform can generate a feedback waveform based on the feedback data, and generate the data rate test result of the tested port by analyzing and judging the waveform quality and frequency of the feedback waveform.

[0030] If the currently selected test item is the IO port data frequency test item, the acquisition card is used to send square wave signals to the input ports of each IO port of the isolation device interface through the test adapter board according to the control of the control platform, and collect the feedback data fed back by the output port corresponding to each IO port and transmit it back to the control platform. Continuing to refer to the pin function description table of the aforementioned pin isolation device, it can be seen from the table that the input ports of the IO port include DIN1, DIN2, DIN3 and DIN4, and the output ports corresponding to the input ports are DOUT1, DOUT2, DOUT3 and DOUT4 respectively. After receiving the feedback data fed back by each output port, the control platform generates a corresponding feedback waveform, and generates the data frequency test result of the tested port by analyzing and judging the waveform quality and frequency of the feedback waveform.

[0031] In some embodiments, the aforementioned square wave signal can be a 10 MHz square wave signal.

[0032] like Figure 3 As shown, if the currently selected test item is the IO drive capability test item, the test equipment should include a programmable power supply and an adjustable electronic load in addition to the acquisition card. The programmable power supply can output different voltages according to the control of the control platform. During the test, the adjustable electronic load is connected to the output port of each IO port through the test adapter board to simulate different load conditions of the carrier platform. The IO drive capability test can be further divided into two cases: the input level is high and the input level is low, and the test is carried out separately: When the input level is high, the control platform controls the programmable power supply output to VL=5V, VCC1=3.3V, VCC2=5V, and connects VL to the DIN1, DIN2, DIN3, and DIN4 ports of the isolation device; connects DOUT1, DOUT2, DOUT3, and DOUT4 ports to the adjustable electronic load, and simulates the output current under different load conditions by adjusting the output load of the adjustable electronic load. The output current is collected and transmitted to the control platform using an acquisition card, and the control platform analyzes the driving capability of the IO port when the input level is high based on the current collected and output by the acquisition card.

[0033] When the input level is low, the IO port driving capability test method includes: the control platform controls the programmable power supply output to be VL=5V, VCC1=3.3V, VCC2=5V, and GND is connected to the DIN1, DIN2, DIN3, and DIN4 ports of the isolation device; the DOUT1, DOUT2, DOUT3, and DOUT4 ports are connected to the output current of the adjustable electronic load simulating the working condition, and the output current is collected to the control platform using the acquisition card. The control platform analyzes the driving capability of the IO port when the input level is low according to the current collected and output by the acquisition card.

[0034] for Figure 3 The "test passed" returned in the test means that the output current of the DOUT1~DOUT4 ports under load is ≥10mA. Otherwise, the test result of "test failed" is returned.

[0035] like Figure 4 As shown in FIG. 1 , it is a flow chart of the IO port output high and low level test method. To implement this test, the test equipment includes not only the acquisition card and programmable power supply mentioned above, but also a multimeter. Figure 1 The multimeter is connected between the test adapter board and the acquisition card to collect the output voltage of each IO port through the test adapter board. The following is a further explanation of the two situations of IO port output high level test and IO port output low level test: For the IO port output high level test, the adjustable power output of the programmable power supply is VCC1=3.3V, VCC2=5V, VL=1.2V, 1.8V, 3.3V, 5V, 5.5V; VL is connected to the DIN1, DIN2, DIN3, and DIN4 ports of the isolation device respectively, and the output voltage of the DOUT1, DOUT2, DOUT3, and DOUT4 ports is measured with a multimeter and output to the acquisition card and then returned to the control platform.

[0036] For the IO port output low level test, the adjustable power output of the programmable power supply is VCC1=3.3V, VCC2=5V, VL=5V; connect the GND end to the DIN1, DIN2, DIN3, and DIN4 ports of the isolation device respectively, use a multimeter to measure the output voltage of the DOUT1, DOUT2, DOUT3, and DOUT4 ports, output them to the acquisition card, and then return to the control platform.

[0037] for Figure 4 The "test passed" returned in the test means that the following test pass criteria are met: High level test: When VL=1.2, 1.8, 3.3, 5, 5.5V, the voltage measured at DOUT1~DOUT4 ports is 1.2±0.1V, 1.8±0.1V, 3.3±0.1V, 5±0.1V, 5.5±0.1V. Low level test: The voltage measured at DOUT1~DOUT4 ports is ≤0.2V. Otherwise, the test result of "test failed" is returned.

[0038] like Figure 5 , which is a flow chart of an isolation voltage withstand test method, in which the test equipment includes an isolation voltage withstand tester. In this embodiment, the isolation voltage withstand tester can provide DC: 50V-6000V, AC: 50V-5000V voltage withstand parameter tests.

[0039] If the currently selected test item is the isolation voltage withstand test, the isolation voltage withstand tester is used to perform isolation voltage withstand tests on each port of the isolation device interface according to the electrostatic interference that may be generated during the operation of the control simulation carrier platform of the control platform, and transmit the feedback data from each port back to the control platform. Taking Table 1 as an example, the voltage withstand isolation of TXD, A, B; RXT, Z, Y; DIN1, DOUT1; DIN2, DOUT2; DIN3, DOUT3; DIN4, DOUT4 ports should be measured respectively. The isolation voltage withstand tester can be connected to the test adapter board via a high-voltage resistant cable.

[0040] Assuming that the model of the isolation withstand voltage tester is Chroma 19032-P, during the test, the positive pole of the isolation withstand voltage tester is connected to the port under test, and the negative pole is connected to the GND end of the circuit. The withstand voltage parameter is set to DC 5kV, and the test time is 1min. During the test, the current between the positive and negative poles of the tester is allowed to not exceed 1μA. It can be considered that the circuit has isolation withstand voltage under this condition, that is, the test result of "test passed" is returned. Otherwise, the test result of "test failed" is returned.

[0041] like Figure 6 The figure shows a flow chart of a serial port or IO port transmission delay test method. To implement this test, the test equipment should at least include an acquisition card and an oscilloscope. The oscilloscope can acquire relevant waveform parameters, including: output rate, rise time, fall time, delay and other time parameters.

[0042] If the currently selected test item is a serial port or IO port transmission delay test item, for the serial port: TXD port, Z port and Y port, the acquisition card is used to send test square waves to the TXD port, Z port and Y port of the isolation device interface respectively according to the control of the control platform, and capture the output waveform of the RXT port, A port, B port and of the isolation device interface through the oscilloscope, and transmit the output waveform back to the control platform; the control platform determines the transmission delay of the serial port by comparing the time difference between the test square wave and the output waveform. Correspondingly, for the IO port, the test square wave is sent to the DIN1, DIN2, DIN3, DIN4 input ports respectively, and the output square wave is collected and obtained from the DOUT1, DOUT2, DOUT3, DOUT4 output ports respectively.

[0043] In some embodiments, the test square wave may be a square wave with a frequency of 10 kHz, a high level of 5 V, a low level of 0 V, and a duty cycle of 50%. Figure 6 The "test passed" in the above statement means that the time difference between the test square wave and the output waveform is ≤60ns. Otherwise, the test result of "test failed" is returned.

[0044] As an embodiment of the present application, the control platform may adopt a host computer, and the test equipment may be connected to the test adapter board through an integrated plug and connected to the host computer through a USB interface. More specifically, the aforementioned acquisition card, isolation withstand voltage tester and programmable power supply may be directly connected to the host computer through a USB interface. The test adapter board may be connected to the port to be tested of the isolation device interface through a fixture.

[0045] Through product test code writing, the test system provided in this application can be successfully adapted to the STS6100 automatic test machine. For the YX050101 type isolation interface integrated device, the interface test time can be reduced from 20 minutes per product to 20 seconds, which not only greatly improves the test efficiency and reduces the test cost, but also reduces the risk of misoperation caused by manual testing.

[0046] Embodiment 2: An embodiment of the present invention provides an isolation device interface testing method, which can be implemented based on the test system provided in the first embodiment. The method can be executed by a control platform in the test system, and the method mainly includes: Generate a control signal according to the currently selected test item to control the test device to generate a test signal corresponding to the test item according to the control signal; Receive the feedback data sent back by the test device, and generate a test result according to the feedback data; The feedback data is data fed back by the tested port of the isolation device interface after receiving the test signal.

[0047] In an embodiment, the test items may include serial port data rate and IO port data frequency test, IO port drive capability test, IO port output high and low level test, isolation withstand voltage test and serial port / IO port transmission delay test. These test items can be implemented independently, or multiple test items can be selected from them for implementation. Users can choose according to the needs of the product under test. For the specific operation method of each test item, please refer to Example 1, which will not be repeated here.

[0048] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principles of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. An isolation device interface test system, characterized in that: include: Control platform: used to generate corresponding control signals according to the currently selected test items; Testing equipment: used for generating a test signal corresponding to the test item according to the control signal; Test adapter board: used to transfer the test signal to the port corresponding to the isolation device interface, and transmit the feedback data fed back by the port to the control platform through the test equipment, so that the control platform can generate test results based on the feedback data.

2. The isolation device interface test system according to claim 1, characterized in that: The test equipment includes an acquisition card; When the currently selected test item is the serial port data rate test item, the acquisition card is used to send a square wave signal to the TXD port of the isolation device interface through the test adapter board according to the control of the control platform, and collect the return data fed back by the Y and Z ports of the isolation device interface and return it to the control platform; And it is also used to send square wave signals to the A and B ports of the isolation device interface through the test adapter board according to the control of the control platform, and collect the return data fed back by the RXD port of the isolation device interface and return it to the control platform; When the currently selected test item is the IO port data frequency test item, the acquisition card is used to send square wave signals to the input ports of each IO port of the isolation device interface through the test adapter board according to the control of the control platform, and collect the feedback data fed back by the output port corresponding to each IO port and transmit it back to the control platform.

3. The isolation device interface test system according to claim 1, characterized in that: The test equipment also includes an acquisition card, a programmable power supply and an adjustable electronic load; When the currently selected test item is the IO drive capability test item, the adjustable electronic load is connected to the output ports of each IO port of the isolation device interface through the test adapter board, so as to simulate different load conditions of the carrier platform; the adjustable power supply output terminal or GND terminal of the programmable power supply is respectively connected to the input port of each IO port of the isolation device interface, so as to provide a high level or a low level for the input port of each IO port; the current acquisition port of the acquisition card is connected to the current output terminal of the adjustable electronic load, so as to acquire the output current of the output port of each IO port under different load conditions, and transmit the output current back to the control platform.

4. The isolation device interface test system according to claim 1, characterized in that: The test equipment includes an acquisition card, a programmable power supply and a multimeter; When the currently selected test item is the IO port output high and low level test item, the adjustable power supply output terminal or GND terminal of the programmable power supply is respectively connected to the input port of each IO port of the isolation device interface, so as to provide a high level or a low level for the input port of each IO port; the multimeter is connected to the output port of each IO port of the isolation device interface through a test adapter board, so as to measure the output voltage of the output port of each IO port; the acquisition card is used to transmit the output voltage back to the control platform.

5. The isolation device interface test system according to claim 1, characterized in that: The test equipment includes an acquisition card and an oscilloscope; When the currently selected test item is a serial port or IO port transmission delay test item, the acquisition card is used to send a test square wave to the TXD port, Z port and Y port of the isolation device interface, or to the input port of each IO port, through the test adapter board according to the control of the control platform, and capture the output waveform of the A port, B port and RXT port of the isolation device interface, or the output port of each IO port through the oscilloscope, and transmit the output waveform back to the control platform; The control platform determines the transmission delay of the serial port or the IO port by comparing the time difference between the test square wave and the output waveform.

6. The isolation device interface test system according to any one of claims 1 to 5, characterized in that: The test device is connected to the test adapter board via an integrated plug.

7. The isolation device interface test system according to claim 1, characterized in that: The test equipment includes an isolation and withstand voltage tester; When the currently selected test item is the isolation voltage withstand test, the isolation voltage withstand tester is used to perform isolation voltage withstand tests on each port of the isolation device interface according to the electrostatic interference that may be generated during the operation of the simulated carrier platform under the control of the control platform, and transmit the feedback data from each port back to the control platform.

8. The isolation device interface test system according to claim 7, characterized in that: The isolation and withstand voltage tester is connected to the test adapter board via a high voltage resistant cable.

9. The isolation device interface testing system according to claim 1, characterized in that: The test adapter board is connected to the port to be tested of the isolation device interface through a fixture.

10. A method for testing an isolation device interface, characterized in that: The method comprises: Generate a control signal according to the currently selected test item to control the test device to generate a test signal corresponding to the test item according to the control signal; Receive the feedback data sent back by the test device, and generate a test result according to the feedback data; The feedback data is data fed back by the tested port of the isolation device interface after receiving the test signal.

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