Open and short circuit test circuit board and switching circuit board

Abstract

The invention provides an open / short circuit test circuit board and a switching circuit board. The open / short circuit test circuit board comprises at least one group of first multiplexers, first connectors, second connectors and third connectors, the first connector comprises first terminals in one-to-one correspondence with input pins of at least one group of first multiplexers, the input pins of the first multiplexers are connected with the corresponding first terminals, and the first terminals are also used for being connected with corresponding to-be-tested pins in a to-be-tested product; the second connector is connected with a control pin of the first multiplexer; the third connector comprises a second terminal and a third terminal, first output pins of the first multiplexers are connected with the second terminal, and second output pins of the first multiplexers are connected with the third terminal; and the at least one group of first multiplexers are used for selecting the input pins conducted with the second terminal and the input pins conducted with the third terminal according to the control signal, so that the test equipment performs open and short circuit test on the to-be-tested pins of the to-be-tested product.

Description

Technical Field

[0001] The embodiments of the present disclosure relate to the technical field of electronic circuits, and more specifically, to an open-short circuit test circuit board and a transfer circuit board. Background Art

[0002] For large-scale system-level chips, system in package (SIP), and ball grid array (BGA), there are hundreds or thousands of pins. If you need to perform comprehensive open and short circuit tests on all pins, you need to design a logic switch composed of a multiplexer on the test circuit board.

[0003] In the prior art, different test circuit boards are usually required for different products to implement open and short circuit tests on the pins of the corresponding products. Different products cannot share the same test circuit boards, resulting in high development costs and material costs. Summary of the invention

[0004] An object of the embodiments of the present disclosure is to provide an open-short circuit test circuit board and a transfer circuit board.

[0005] According to a first aspect of an embodiment of the present disclosure, there is provided an open-short circuit test circuit board, comprising at least one group of first multiplexers, a first connector for connecting a product to be tested, a second connector for receiving a control signal, and a third connector for connecting a test device; a group of first multiplexers comprises a plurality of first multiplexers; the first connector comprises first terminals corresponding one-to-one to input pins of the at least one group of first multiplexers, the input pins of the first multiplexers are connected to the corresponding first terminals, and the first terminals are also used to connect to the corresponding pins to be tested in the product to be tested; the second connector is connected to the control pins of the first multiplexer; the third connector comprises a second terminal and a third terminal, the first output pins of the first multiplexer are all connected to the second terminal, and the second output pins of the first multiplexer are all connected to the third terminal;

[0006] The at least one group of first multiplexers is used to select the input pin connected to the second terminal and the input pin connected to the third terminal according to the control signal, so that the test equipment performs an open and short circuit test on the pin to be tested of the product to be tested.

[0007] Optionally, the open-short circuit test circuit board also includes a second multiplexer, the second multiplexer has an output end corresponding one-to-one to each group of first multiplexers, the input end of the second multiplexer is connected to the second connector, and the output end of the second multiplexer is connected to the control pin of the corresponding group of first multiplexers.

[0008] Optionally, the open-short circuit test circuit board also includes a fourth connector for connecting a power source, and the fourth connector includes a fourth terminal, and the fourth terminal is connected to a power pin of the first multiplexer so that the power source supplies power to the first multiplexer.

[0009] Optionally, the open-short circuit test circuit board also includes a power conversion module, the input end of the power conversion module is connected to the fourth terminal, the output end of the power conversion module is connected to the power pin of the first multiplexer, and the power conversion module is used to convert the voltage provided by the power supply into the supply voltage of the first multiplexer.

[0010] Optionally, the first connector, the second connector, the third connector, and the fourth connector are provided by the same plug-in connector.

[0011] Optionally, the control signal is an I2C signal, and the second multiplexer is an I2C multiplexer.

[0012] Optionally, the first multiplexer is a serially controlled, dual-channel analog multiplexer.

[0013] According to the second aspect of the present disclosure, a converter circuit board is provided, which is used in conjunction with the open-short circuit test circuit board according to the first aspect of the present disclosure. The converter circuit board is provided with a controller, a fifth connector for correspondingly connecting to the first connector, a sixth connector for correspondingly connecting to the second connector, a seventh connector for correspondingly connecting to the third connector, a test socket for fixing the product to be tested, and a measurement source interface for connecting the test equipment. A spring-type probe in the test socket connected to the pin to be tested of the product to be tested is connected to the corresponding terminal in the fifth connector, and the measurement source interface is correspondingly connected to the seventh connector. The controller is used to output the control signal to the first multiplexer so that the test equipment performs an open-short circuit test on the pin to be tested of the product to be tested.

[0014] Optionally, the adapter circuit board also includes a power supply interface for connecting a power source and an eighth connector for correspondingly connecting to the fourth connector of the open-short circuit test circuit board, and the eighth connector is connected to the power supply interface so that the power supply can supply power to the open-short circuit test circuit board.

[0015] Optionally, the adapter circuit board also includes a control interface, which is used to connect to a host computer, and the controller is used to receive a detection instruction issued by the host computer through the control interface, and output the control signal according to the detection instruction.

[0016] Through the embodiments of the present disclosure, different products to be tested can share the open-short circuit test circuit board to perform open-short circuit tests, which can effectively reduce development costs and material costs.

[0017] Further features and advantages of the present invention will become apparent from the following detailed description of exemplary embodiments of the present invention with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.

[0019] Figure 1 is a block diagram of an open-short circuit test circuit board according to an embodiment of the present disclosure;

[0020] Figure 2 is a block diagram of an open-short circuit test circuit board according to another embodiment of the present disclosure;

[0021] Figure 3 is a block diagram of a transfer circuit board according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0022] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention unless otherwise specifically stated.

[0023] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.

[0024] Technologies, methods and equipment known to persons of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods and equipment should be considered part of the specification.

[0025] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0026] It should be noted that like reference numerals and letters refer to similar items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0027] The present disclosure provides an open-short circuit test circuit board. Figure 1As shown, the open-short circuit test circuit board 1000 may include at least one group of first multiplexers, a first connector J1 for connecting a product to be tested, a second connector J2 for receiving a control signal, and a third connector J3 for connecting a test device; a group of first multiplexers includes multiple first multiplexers U1; the first connector U1 includes first terminals corresponding one-to-one to input pins of at least one group of first multiplexers, the input pins of the first multiplexer U1 are connected to the corresponding first terminals, and the first terminals are also used to connect to the corresponding pins to be tested in the product to be tested; the second connector J2 is connected to the control pin of the first multiplexer U1; the third connector J3 includes a second terminal A and a third terminal B, the first output pins of the first multiplexer U1 are all connected to the second terminal A, and the second output pins of the first multiplexer U1 are all connected to the third terminal B.

[0028] At least one group of first multiplexers U1 is used to select the input pin connected to the second terminal A and the input pin connected to the third terminal B according to the control signal input by the second connector J2, so that the test equipment can perform open and short circuit tests on the pins to be tested of the product to be tested.

[0029] In one embodiment of the present disclosure, the control signal may be an I2C signal, or an SPI signal, or a signal of other protocols.

[0030] In one embodiment of the present disclosure, the first multiplexer U1 is a serially controlled, dual-channel analog multiplexer. For example, the model of the first multiplexer U1 may be, but is not limited to, MAX14661.

[0031] The first multiplexer U1 may allow any one of the N input pins to be connected to the corresponding first output pin or second output pin, or may allow none of the N input pins to be connected to the corresponding first output pin or second output pin.

[0032] When the first multiplexer U1 has N input pins, a group of first multiplexers includes M first multiplexers U1, and the open-short circuit test circuit board 1000 includes K groups of first multiplexers, the K groups of first multiplexers can have N*M*K input pins, and the first connector J1 can have N*M*K first terminals, which are respectively connected to the corresponding input pins.

[0033] Through the K groups of first multiplexers, any two of the N*M*K input pins can be connected to the second terminal A and the third terminal B, so that the test equipment can perform an open-short circuit test on any two pins to be tested in the product to be tested.

[0034] The product to be tested in this embodiment may be a system-on-chip or a system in package.

[0035] Furthermore, the product under test can be connected to the first connector J1 through an adapter circuit board used in conjunction with the product under test and an open-short circuit test circuit board, so that the test pins of the product under test are connected to corresponding input pins in at least one group of the first multiplexer through the adapter circuit board and the first connector J1.

[0036] The testing device in this embodiment may be a device such as a multimeter that can detect open and short circuits.

[0037] Furthermore, the test device can be connected to the third connector J3 through a switching circuit board used in conjunction with the test device and the open-short circuit test circuit board, so that the test device is connected to the corresponding output pin in each first multiplexer through the switching circuit board and the third connector J3.

[0038] Through the embodiments of the present disclosure, different products to be tested can share the open-short circuit test circuit board to perform open-short circuit tests, which can effectively reduce development costs and material costs.

[0039] In one embodiment of the present disclosure, Figure 2 As shown, the open-short circuit test circuit board 1000 also includes a second multiplexer U2, which has an output end corresponding to each group of first multiplexers, an input end of the second multiplexer U2 is connected to the second connector, and an output U2 end of the second multiplexer U2 is connected to a control pin of the first multiplexer U1 of the corresponding group.

[0040] When the control signal is an I2C signal and the model of the first multiplexer U1 is MAX14661, one first multiplexer U1 may have 16 input pins, and one I2C signal may control the channel states of at most four first multiplexers U1. Then, a group of first multiplexers may include four first multiplexers.

[0041] On this basis, if the open-short circuit test circuit board 1000 includes multiple groups of first multiplexers, the control signal corresponding to each group of first multiplexers can be expanded through the second multiplexer. Figure 2 In the example shown, the plurality of first multiplexers within the dashed box constitute a group of first multiplexers.

[0042] In one embodiment of the present disclosure, the control signal is an I2C signal, and the second multiplexer U2 is an I2C multiplexer. For example, the model of the second multiplexer U2 can be but is not limited to PCA9544.

[0043] In this embodiment, one second multiplexer U2 can expand one I2C signal into four I2C signals, and therefore, one second multiplexer U2 can be connected to up to four groups of first multiplexers.

[0044] Through this embodiment, a second multiplexer is provided in the open-short circuit test circuit board, so as to expand the number of pins to be tested that can be detected and increase the use scenarios of the open-short circuit test circuit board.

[0045] In one embodiment of the present disclosure, Figure 2 As shown, the open-short circuit test circuit board 1000 further includes a fourth connector for connecting a power source, the fourth connector includes a fourth terminal, and the fourth terminal is connected to a power pin of the first multiplexer U1 so that the power source supplies power to the first multiplexer U1.

[0046] In this embodiment, the power supply can be connected to the fourth connector via a switching circuit board used in conjunction with the open-short circuit test circuit board, so that the power supply supplies power to the first multiplexer U1.

[0047] In one embodiment of the present disclosure, the open-short circuit test circuit board 1000 also includes a power conversion module, the input end of the power conversion module is connected to the fourth terminal, the output end of the power conversion module is connected to the power pin of the first multiplexer, and the power conversion module is used to convert the voltage provided by the power supply into the power supply voltage of the first multiplexer U1.

[0048] In this embodiment, when the voltage provided by the power supply does not match the power supply voltage of the first multiplexer U1 or the power supply voltage of the second multiplexer U2, the voltage provided by the power supply can be converted into the power supply voltage of the first multiplexer U1 through the power conversion module to power the first multiplexer U1; the voltage provided by the power supply can also be converted into the power supply voltage of the second multiplexer U2 to power the second multiplexer U2.

[0049] In one embodiment of the present disclosure, the first connector J1 , the second connector J2 , the third connector J3 , and the fourth connector are provided by the same plug-in connector.

[0050] In one example, the plug-in connector may be a plug-in connector having 400 terminals.

[0051] Through this embodiment, the area of ​​the open-short circuit test circuit board can be reduced.

[0052] This embodiment also provides a switching circuit board, such as Figure 3As shown, the adapter circuit board 3000 is used in conjunction with the aforementioned open-short circuit test circuit board 1000, and the adapter circuit board is provided with a controller U4, a fifth connector J5 for correspondingly connecting to the first connector J1, a sixth connector J6 for correspondingly connecting to the second connector J2, a seventh connector J7 for correspondingly connecting to the third connector J3, a test socket socket 1 for fixing the product to be tested, and a measurement source interface U5 for connecting the test equipment, a spring-type probe connected to the test pin of the product to be tested by the socket 1 in the test socket, and connected to the corresponding terminal in the fifth connector J5, the measurement source interface U5 is correspondingly connected to the seventh connector J7, and the controller U4 is used to output a control signal to the first multiplexer U1 so that the test equipment performs an open-short circuit test on the test pin of the product to be tested.

[0053] In this embodiment, the adapter circuit board 3000 is used in conjunction with the open-short circuit test circuit board 1000, the first connector J1 is connected to the fifth connector J5 accordingly, the second connector J2 is connected to the sixth connector J6 accordingly, and the third connector J3 is connected to the seventh connector J7 accordingly, so that each pin to be tested of the product to be tested fixed in the test socket socket 1 can be connected to the corresponding input pins in at least one group of the first multiplexer in the open-short circuit test circuit board 1000, and the test equipment connected to the measurement source interface U5 is connected to the second terminal A and the third terminal B in the open-short circuit test circuit board 1000 to detect the open-short circuit condition between any two pins to be tested of the product to be tested.

[0054] In one embodiment of the present disclosure, the adapter circuit board 3000 also includes a power supply interface U6 for connecting to a power source and an eighth connector for correspondingly connecting to the fourth connector of the open-short circuit test circuit board. The eighth connector is connected to the power supply interface U6 so that the power supply can supply power to the open-short circuit test circuit board 1000.

[0055] The specific power source can be connected to the power supply interface U6, and power is supplied to the first multiplexer U1 and the second multiplexer U2 in the open-short circuit test circuit board 1000 through the power supply interface U6, the fourth connector and the eighth connector.

[0056] In one embodiment of the present disclosure, the adapter circuit board 3000 further includes a control interface U7, the control interface U4 is used to connect to a host computer, and the controller U4 is used to receive a detection instruction issued by the host computer through the control interface U7, and output a control signal according to the detection instruction.

[0057] In this embodiment, the upper computer can generate a detection instruction for controlling the first input pin to be turned on with the corresponding first output pin and controlling the second input pin to be turned on with the corresponding second output pin based on the first input pin and the second input pin connected to the two pins to be tested in the product to be tested. The controller U4 outputs a control signal for controlling the first input pin to be turned on with the corresponding first output pin and controlling the second input pin to be turned on with the corresponding second output pin based on the detection instruction.

[0058] Through this embodiment, the host computer can control the open-short circuit test of any two pins to be tested in the product to be tested.

[0059] The present invention may be a system, a method and / or a computer program product. The computer program product may include a computer-readable storage medium carrying computer-readable program instructions for causing a processor to implement various aspects of the present invention.

[0060] A computer-readable storage medium may be a tangible device that can hold and store instructions used by an instruction execution device. A computer-readable storage medium may be, for example, but not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the foregoing. More specific examples of computer-readable storage media (a non-exhaustive list) include: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disk read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, such as a punch card or a raised structure in a groove on which instructions are stored, and any suitable combination of the foregoing. As used herein, a computer-readable storage medium is not to be interpreted as a transient signal per se, such as a radio wave or other freely propagating electromagnetic wave, an electromagnetic wave propagating through a waveguide or other transmission medium (e.g., a light pulse through a fiber optic cable), or an electrical signal transmitted through a wire.

[0061] The computer-readable program instructions described herein can be downloaded from a computer-readable storage medium to each computing / processing device, or downloaded to an external computer or external storage device via a network, such as the Internet, a local area network, a wide area network, and / or a wireless network. The network can include copper transmission cables, optical fiber transmissions, wireless transmissions, routers, firewalls, switches, gateway computers, and / or edge servers. The network adapter card or network interface in each computing / processing device receives the computer-readable program instructions from the network and forwards the computer-readable program instructions for storage in the computer-readable storage medium in each computing / processing device.

[0062] The computer program instructions for performing the operation of the present invention may be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source code or object code written in any combination of one or more programming languages, including object-oriented programming languages, such as Smalltalk, C++, etc., and conventional procedural programming languages, such as "C" language or similar programming languages. Computer-readable program instructions may be executed entirely on a user's computer, partially on a user's computer, as an independent software package, partially on a user's computer, partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer via any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., using an Internet service provider to connect via the Internet). In some embodiments, an electronic circuit, such as a programmable logic circuit, a field programmable gate array (FPGA), or a programmable logic array (PLA), may be personalized by utilizing the state information of the computer-readable program instructions, and the electronic circuit may execute the computer-readable program instructions, thereby realizing various aspects of the present invention.

[0063] Various aspects of the present invention are described herein with reference to the flow charts and / or block diagrams of the methods, devices (systems) and computer program products according to embodiments of the present invention. It should be understood that each box of the flow chart and / or block diagram and the combination of each box in the flow chart and / or block diagram can be implemented by computer-readable program instructions.

[0064] These computer-readable program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, thereby producing a machine, so that when these instructions are executed by the processor of the computer or other programmable data processing device, a device that implements the functions / actions specified in one or more boxes in the flowchart and / or block diagram is generated. These computer-readable program instructions can also be stored in a computer-readable storage medium, and these instructions cause the computer, programmable data processing device, and / or other equipment to work in a specific manner, so that the computer-readable medium storing the instructions includes a manufactured product, which includes instructions for implementing various aspects of the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0065] Computer-readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operating steps are performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the instructions executed on the computer, other programmable data processing apparatus, or other device to implement the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0066] The flow charts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the systems, methods and computer program products according to multiple embodiments of the present invention. In this regard, each box in the flow chart or block diagram can represent a part of a module, a program segment or an instruction, and a part of the module, a program segment or an instruction contains one or more executable instructions for realizing the specified logical function. In some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flow chart, and the combination of the boxes in the block diagram and / or flow chart can be implemented by a dedicated hardware-based system that performs the specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions. It is well known to those skilled in the art that it is equivalent to implement it by hardware, implement it by software, and implement it by combining software and hardware.

[0067] Embodiments of the present invention have been described above, and the above description is exemplary, not exhaustive, and is not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The selection of terms used herein is intended to best explain the principles of the embodiments, practical applications, or technical improvements in the marketplace, or to enable other persons of ordinary skill in the art to understand the embodiments disclosed herein. The scope of the present invention is defined by the appended claims.

Claims

1. An open and short circuit test circuit board, characterized in that: The invention comprises at least one group of first multiplexers, a first connector for connecting a product to be tested, a second connector for receiving a control signal, and a third connector for connecting a test device; the group of first multiplexers comprises a plurality of first multiplexers; the first connector comprises first terminals corresponding to the input pins of the at least one group of first multiplexers, the input pins of the first multiplexers are connected to the corresponding first terminals, and the first terminals are also used to connect to the corresponding pins to be tested in the product to be tested; the second connector is connected to the control pins of the first multiplexer; the third connector comprises a second terminal and a third terminal, the first output pins of the first multiplexer are all connected to the second terminal, and the second output pins of the first multiplexer are all connected to the third terminal; The at least one group of first multiplexers is used to select the input pin connected to the second terminal and the input pin connected to the third terminal according to the control signal, so that the test equipment performs an open and short circuit test on the pin to be tested of the product to be tested.

2. The open-short circuit test circuit board according to claim 1, characterized in that: The open-short circuit test circuit board also includes a second multiplexer, which has an output end corresponding to each group of first multiplexers, an input end of the second multiplexer is connected to the second connector, and an output end of the second multiplexer is connected to a control pin of the corresponding group of first multiplexers.

3. The open-short circuit test circuit board according to claim 1, characterized in that: The open-short circuit test circuit board further includes a fourth connector for connecting a power source, wherein the fourth connector includes a fourth terminal, and the fourth terminal is connected to a power pin of the first multiplexer so that the power source supplies power to the first multiplexer.

4. The open-short circuit test circuit board according to claim 3, characterized in that: The open-short circuit test circuit board also includes a power conversion module, an input end of the power conversion module is connected to the fourth terminal, an output end of the power conversion module is connected to the power pin of the first multiplexer, and the power conversion module is used to convert the voltage provided by the power supply into the supply voltage of the first multiplexer.

5. The open-short circuit test circuit board according to claim 3, characterized in that: The first connector, the second connector, the third connector, and the fourth connector are provided by the same plug-in connector.

6. The open-short circuit test circuit board according to claim 2, characterized in that: The control signal is an I2C signal, and the second multiplexer is an I2C multiplexer.

7. The open-short circuit test circuit board according to claim 1, characterized in that: The first multiplexer is a serially controlled, dual-channel analog multiplexer.

8. A transfer circuit board, characterized in that: The adapter circuit board is used in conjunction with an open-short circuit test circuit board according to any one of claims 1 to 7. The adapter circuit board is provided with a controller, a fifth connector for correspondingly connecting to the first connector, a sixth connector for correspondingly connecting to the second connector, a seventh connector for correspondingly connecting to the third connector, a test socket for fixing the product to be tested, and a measurement source interface for connecting the test equipment. A spring-type probe in the test socket connected to the test pin of the product to be tested is connected to the corresponding terminal in the fifth connector, and the measurement source interface is correspondingly connected to the seventh connector. The controller is used to output the control signal to the first multiplexer so that the test equipment performs an open-short circuit test on the test pin of the product to be tested.

9. The adapter circuit board according to claim 8, characterized in that: The adapter circuit board also includes a power supply interface for connecting a power source and an eighth connector for correspondingly connecting to the fourth connector of the open-short circuit test circuit board. The eighth connector is connected to the power supply interface so that the power supply can supply power to the open-short circuit test circuit board.

10. The adapter circuit board according to claim 8, characterized in that: The adapter circuit board also includes a control interface, which is used to connect to a host computer. The controller is used to receive a detection instruction issued by the host computer through the control interface and output the control signal according to the detection instruction.

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