A circuit board electrical performance testing device

Abstract

This application discloses a circuit board electrical performance testing device, which includes a flying probe holder, a support base, two flying probe supports, and two test pieces. The support base is fixed to the flying probe holder. The two flying probe supports are spaced apart and respectively fixed to the support base, wherein the distance between the two flying probe supports gradually decreases in the direction away from the support base. The two test pieces are respectively fixed to the ends of the two flying probe supports away from the support base, and the two test pieces are used to contact the circuit board together. Through the above method, this application can enhance the structural stability of the testing device.

Description

Technical Field

[0001] The present application relates to the technical field of circuit board testing, and in particular to a circuit board electrical performance testing device. Background Art

[0002] With the rapid development of electronic technology, the number of layers of PCB printed circuit boards is getting higher and higher, the line density is getting denser and denser, the pad size is getting smaller and smaller, and the requirements for integration are getting higher and higher. Normally, the open circuit impedance in the open and short circuit test parameter value of PCB is set to 25Ω. When the line resistance is greater than 25Ω, the machine judges it as an open circuit, and when it is less than 25Ω, the machine judges it as qualified. For lines with resistance values ​​less than 25Ω, its actual resistance value cannot be accurately tested, and lines below 25Ω become test blind areas. In actual production, it is found that certain defects of PCB, such as no copper in the hole, voids, thin copper, thin wires, line gaps, etc., will affect the line resistance. Therefore, flying probe testing is an important link. Existing test equipment has a complex structure and low structural reliability, making it difficult to conduct effective testing. Summary of the invention

[0003] The main technical problem solved by the present application is to provide a circuit board electrical performance testing device, which can solve the problems of complex structure and poor structural performance of the testing device in the prior art.

[0004] In order to solve the above technical problems, a technical solution adopted in the present application is: to provide a circuit board electrical performance test device, including a flying probe seat, a bracket seat, two flying probe brackets, and two test pieces. The bracket seat is fixed on the flying probe seat. The two flying probe brackets are arranged at intervals and are respectively fixed on the bracket seat, wherein the distance between the two flying probe brackets gradually decreases in the direction away from the bracket seat. The two test pieces are respectively fixed on one end of the two flying probe brackets away from the bracket seat, and the two test pieces are used to contact the circuit board together.

[0005] Compared with the prior art, the beneficial effects of the present application are as follows: the present application ensures the integrity of the test device by setting a flying probe holder, and at the same time, two flying probe brackets are set at intervals and fixed on the bracket holder respectively, wherein the distance between the two flying probe brackets gradually decreases in the direction away from the bracket holder, forming a reliable mechanical structure with high structural reliability, ensuring that the flying probe brackets will not be damaged when the test piece contacts the circuit board, resulting in problems such as failure to test, thereby enhancing the structural stability and test reliability of the entire test device, and setting test pieces at the two ends of the two flying probe brackets close to each other, so that the test pieces can test the electrical properties of subtle parts on the circuit board, thereby improving the accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0006] Figure 1This is a test circuit schematic diagram of an embodiment of the circuit board electrical performance test device of the present application;

[0007] Figure 2 It is a three-dimensional structural schematic diagram of an embodiment of a circuit board electrical performance testing device of the present application;

[0008] Figure 3 yes Figure 2 a left side view of the structure shown;

[0009] Figure 4 yes Figure 2 a front view of the structure shown;

[0010] Figure 5 It is a structural schematic diagram of the flying probe support of the circuit board electrical performance test device embodiment of the present application when the test piece is in a natural state and a contact state. DETAILED DESCRIPTION

[0011] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0012] Flying probe test is an important part of circuit board (PCB) testing. For the electrical performance of the circuit, for example, low resistance performance is an important focus of circuit board testing. The existing flying probe test device has a complex structure and low structural stability, and is easily damaged, resulting in inaccurate testing and other problems. In order to solve the above problems, the present application provides the following embodiments:

[0013] See also Figure 1 The embodiment of the circuit board electrical performance test device of the present application can be based on a four-wire flying probe test method, which is used to test the electrical performance of the circuit board, such as low resistance test. The four-wire flying probe test circuit includes an excitation line and a detection line. When testing the circuit board, the excitation line and the detection line independently form a loop. The excitation line is a current supply loop, and the detection line is a voltage measurement loop. A voltmeter is connected to the detection line. Generally, a voltmeter has extremely high impedance, and the impedance on the detection line can be ignored. Therefore, the electrical performance of the circuit board, such as the low resistance value, can be accurately measured.

[0014] See also Figure 2 The circuit board electrical performance testing device embodiment of the present application includes a flying probe holder 11 , a bracket holder 12 , two flying probe brackets 13 , and two test pieces 14 .

[0015] See also Figure 2 and Figure 3, the bracket seat 12 is fixed on the flying probe holder 11. The two flying probe holders 13 are arranged at intervals and are respectively fixed on the bracket seat 12, wherein the distance H between the two flying probe holders 13 gradually decreases in the direction away from the bracket seat 12. In other words, one end of the two flying probe holders 13 is fixed on the bracket seat 12, and the other end extends in the direction away from the bracket seat 12, and the distance H between the two flying probe holders 13 gradually decreases along the extension direction, so that the other ends of the two flying probe holders 13 can approach each other. The two test pieces 14 are respectively fixed on one end of the two flying probe holders 13 away from the bracket seat 12. The two test pieces 14 are used to contact the circuit board together, that is, to contact the circuit board to be tested.

[0016] During the actual operation of the test device, the two ends of the detection line are electrically connected to the two test pieces 14, and the two ends of the excitation line are electrically connected to the two test pieces 14. The two test pieces 14 need to contact the circuit board together. Since the circuit board will generate a reverse force on the test device when contacting the circuit board, it is necessary to ensure the structural performance of the test device. In this embodiment, two flying probe holders 13 are arranged at intervals and fixed on the bracket seat 12 respectively, wherein the distance H between the two flying probe holders 13 gradually decreases in the direction away from the bracket seat 12, forming a structure similar to a triangle, with high structural reliability, which can ensure that the flying probe holder 13 will not be damaged when the test piece 14 contacts the circuit board, resulting in problems such as failure to test, thereby enhancing the structural stability and test reliability of the entire test device, and setting the test pieces 14 at the two ends of the two flying probe holders 13 close to each other, so that the test pieces 14 can test the electrical performance of the subtle parts on the circuit board, thereby improving the accuracy of the test.

[0017] In this embodiment, for example, the support seat 12 is arranged in a plate shape, and a back side of the support seat 12 is arranged in front of the flying probe seat 11. The support seat 12 of this embodiment has a side close to the test piece 14 as the front side, and a side opposite to the front side as the back side. The flying probe seat 11 has a side facing the test piece 14 as the front side, and a part opposite to the front side as the back side. Optionally, a groove is provided in the front side of the support seat 12. Further, the groove can penetrate the front and back sides of the support seat 12 to form a gap.

[0018] Continue reading Figure 2 and Figure 3 Optionally, two flying probe holders 13 are fixed on two side surfaces of the holder seat 12 which are opposite to each other and are arranged in a wedge shape. The holder seat 12 is arranged in a wedge shape, so that the distance H between the two flying probe holders 13 can be gradually reduced in the direction along the two side surfaces of the wedge shape. In this embodiment, the holder seat 12 is made of at least aluminum material, which can reduce the weight of the test device.

[0019] Continue reading Figure 2Optionally, each flying probe holder 13 is arranged in a frame shape. Each flying probe holder 13 includes a first holder arm 131, a second holder arm 132, a first connecting arm 133 and a second connecting arm 134 which are arranged in a frame shape. The first holder arm 131 and the second holder arm 132 are arranged opposite to each other. The first connecting arm 133 and the second connecting arm 134 are arranged opposite to each other and are respectively connected between the first holder arm 131 and the second holder arm 132. The connection position between the first holder arm 131 and the first connecting arm 133 is adjacent to the holder seat 12. The flying probe holder 13 can be fixed on the holder seat 12 through the first connecting arm 133, or can be fixed on the holder seat 12 through the first holder arm 131, or the first holder arm 131 and the first connecting arm 133 can be fixed on the holder seat 12 together. The connection position between the second holder arm 132 and the second connecting arm 134 is adjacent to the test piece 14. The test piece 14 can be arranged on the second connecting arm 134. Specifically, for example, the first holder arm 131 and the second holder arm 132 can be arranged parallel to each other. The lengths of the first support arm 131 and the second support arm 132 are both greater than the first connecting arm 133 and the second connecting arm 134. Specifically, for example, the frame-shaped planes of the two flying probe supports 13 are arranged opposite to each other, wherein the first support arm 131, the second support arm 132, the first connecting arm 133, and the second connecting arm 134 of the two respectively correspond to each other.

[0020] In this embodiment, by providing a frame-shaped flying probe holder 13, not only the structural stability of the flying probe holder 13 can be ensured, but also the weight of the flying probe holder 13 can be reduced. When the test piece 14 contacts the circuit board, the frame-shaped flying probe holder 13 can ensure that the test piece 14 effectively contacts the circuit board and can withstand a large reverse force.

[0021] Continue reading Figure 2 Optionally, a plurality of weight-reducing holes 13a are respectively provided on the first bracket arm 131 and the second bracket arm 132. The number of weight-reducing holes 13a provided on the first bracket arm 131 is less than the number of weight-reducing holes 13a provided on the second bracket arm 132. Further, optionally, a plurality of weight-reducing holes 13a are respectively provided on the first bracket arm 131 and the second bracket arm 132 at equal intervals, or of course at unequal intervals, or the first bracket arm 131 may have weight-reducing holes 13a at equal intervals, and the second bracket arm 132 may have weight-reducing holes 13a at unequal intervals.

[0022] In this embodiment, by opening weight-reducing holes 13a on the first bracket arm 131 and the second bracket arm 132, the weight of the flying probe bracket 13 can be reduced, thereby reducing the weight of the test device. At the same time, the number of weight-reducing holes 13a opened on the first bracket arm 131 is less than the number of weight-reducing holes 13a on the second bracket arm 132, which can ensure the rigidity of the first bracket arm 131 while reducing the weight, thereby avoiding the reverse force generated by the test piece 14 when contacting the circuit board from causing a large deformation of the first bracket arm 131, and ensuring that the first bracket arm 131 is not damaged. In this way, the weight and rigidity of the flying probe bracket 13 can be balanced. In addition, in this embodiment, by ensuring the rigidity of the first bracket arm 131, the accuracy of the displacement measurement result of the first bracket arm 131 by the photoelectric sensor 15 is ensured. In this embodiment, the weight-reducing hole 13a can be a blind hole or a through hole, and the shape of the hole is not limited.

[0023] See also Figure 4 Optionally, the first bracket arm 131 includes a fixed section 131a and a connecting section 131b connected to each other, wherein the fixed section 131a is connected to the first connecting arm 133, and the connecting section 131b is connected to the second connecting arm 134, wherein the width of the fixed section 131a is greater than the width of the connecting section 132b. Figure 4 In the angle of the view shown, the width of the fixing section 131a refers to the width perpendicular to the length direction of the first bracket arm 131. For example, the fixing section 131a is used to be fixedly connected to the bracket seat 12. Further, the connecting section 131b is provided with a weight-reducing hole 13a. The number 13a of the weight-reducing holes provided on the connecting section 131b is less than the number of the weight-reducing holes provided on the second bracket arm 132. In this embodiment, by setting the fixed section 131a and the connecting section 131b, the width of the fixed section 131a is greater than the width of the connecting section 131b. On the one hand, the connection stability between the flying probe bracket 13 and the bracket seat 12 can be guaranteed, and on the other hand, the rigidity of the first bracket arm 131 can be further guaranteed, and the flying probe bracket 13 can be guaranteed not to be damaged. At the same time, the length of the connecting section 13b is less than the second bracket arm 132, so that when the test piece 14 contacts the circuit board, the flying probe bracket 13 is subjected to a reverse force, and the connecting section 13b can have a relatively large swing amplitude, which can also be said to be measurement sensitivity, so that the accuracy of the displacement measurement result of the first bracket arm 131 by the photoelectric sensor 15 can be guaranteed.

[0024] Continue reading Figure 4, further, a recessed portion 131b1 is formed at one end of the connecting section 131b connected to the fixed section 131a, and the width of the recessed portion 131b1 is smaller than the width of the portion of the connecting section 131b adjacent to the recessed portion 131b1, so that when the test piece 14 contacts the circuit board, the flying probe holder 13 is subjected to a reverse force, so that the connecting section 131b rotates around the recessed portion 131b1 to the side away from the test piece 14 (that is, the opposite direction of the contact direction of the test piece 14), so that the first bracket arm 131 of the flying probe holder 13 can be sensitively displaced. Further, a recessed portion 131b2 is formed at one end of the connecting section 131a connected to the second connecting arm 134. Optionally, symmetrical arc grooves are formed on both sides of the recessed portion 131b1. Similarly, symmetrical arc grooves can also be formed on both sides of the recessed portion 131b2.

[0025] Continue reading Figure 4 Optionally, recessed portions 1321 and 1322 are formed at two ends of the second bracket arm 132 that are connected to the first connecting arm 133 and the second connecting arm 134 respectively.

[0026] See also Figure 5 , Figure 5 The schematic diagram shows the structural change of the flying probe holder when the test piece 14 transitions from not contacting the circuit board to contacting the circuit board. Specifically, when the test piece 14 contacts the circuit board, one end of the connecting section 131b rotates around the recessed portion 131b1 to the side away from the test piece 14, and the other end of the connecting section 131b rotates around the recessed portion 131b2 to the side close to the test piece 14. One end of the second bracket arm 132 rotates around the recessed portion 1321 to the side away from the test piece 14, and the other end of the second bracket arm 132 rotates around the recessed portion 1322 to the side close to the test piece 14, so that the flying probe holder 13 is deformed, and the displacement of the connecting section 131b can be detected by the photoelectric sensor 15.

[0027] In this embodiment, a recessed portion 131b1 is formed at one end of the connecting section 131b connected to the fixed section 131a, and the width of the recessed portion 131b1 is smaller than the width of the portion of the connecting section 131b adjacent to the recessed portion 131b1, so that the connecting section 131b can sensitively generate displacement when the test piece 14 contacts the circuit board, thereby ensuring the accuracy of the result of the photoelectric sensor 15 measuring the displacement. In this embodiment, a recessed portion 131b2 is further provided at one end of the connecting section 131b connected to the second connecting arm 134, and recessed portions 1321 and 1322 are provided at both ends of the second bracket arm 132, so that the sensitivity of the flying probe bracket 13 to generate displacement and the accuracy of the displacement measurement result can be further ensured on the basis of being able to reduce the weight of the flying probe bracket 13.

[0028] In this embodiment, the flying probe support 13 can be made of plastic, for example, can be integrally formed. Figure 4 In this embodiment, for example, taking a plane perpendicular to the extension direction of the second connecting arm 134 as a cross section, the cross-sectional area of ​​the second connecting arm 134 gradually decreases from one end connected to the first bracket arm 131 to one end connected to the second bracket arm 132, and the cross-sectional area is the largest at the end connected to the test piece 14, so as to ensure the connection rigidity of the test piece 14. By gradually reducing the cross-sectional area of ​​the second connecting arm 134 from one end to the other end, an effective avoidance structure is formed, which can avoid mutual interference between the two connecting arms 134, and at the same time, when the test piece 14 contacts the circuit board, it can reduce the second connecting arm 131 from touching the circuit board to avoid damaging the circuit board.

[0029] Continue reading Figure 2 Optionally, a fixing seat 19 is provided on the flying probe seat 11. When testing a circuit board, a manipulator / arm can generally be used to drive the test device to move so as to test multiple test points on the circuit board. The fixing seat 19 in this embodiment is used to hold the manipulator. In other words, the fixing seat 19 cooperates with the corresponding components / positions on the manipulator / arm to fix the test device on the manipulator so that the test device moves relative to the circuit board under the drive of the manipulator.

[0030] In this embodiment, the fixing seat 19 includes a seat body 191 and two clamping arms 192 disposed on the seat body. The two clamping arms 192 are disposed opposite to each other and enclose a clamping area with the seat body 191. When the test device is fixed on the manipulator / arm, the corresponding parts of the manipulator / arm are clamped into the clamping area, so that the two clamping arms 192 hold the manipulator / arm tightly. Furthermore, a signal circuit board 20 can be disposed on the fixing seat 19, which can be used to transmit electrical signals, etc.

[0031] Continue reading Figure 4 Optionally, a photoelectric sensor 15 of the test device is arranged on the flying probe holder 11, and is used to detect the displacement of the flying probe holder 13 when the test piece 14 contacts the circuit board. In this embodiment, when two test pieces 14 contact the circuit board together, the circuit board will generate a reverse force on the test piece 14 and the flying probe holder 13. When the flying probe holder 13 is subjected to the reverse force, the flying probe holder 13 will generate a corresponding displacement in the reverse direction, such as deformation, resulting in a change in the position of the corresponding component, such as a change in the position of the detection position. By setting a corresponding photoelectric sensor 15 to detect the displacement, this embodiment can understand the contact status of the test piece 14 with the circuit board, thereby facilitating the adjustment of the contact between the test piece 14 and the circuit board.

[0032] For example, the result of the detection displacement of the photoelectric sensor 15 is sent to the controller of the test device, such as a processor (CPU), which simulates the reverse force exerted on the test piece 14 and the flying probe bracket 13 according to the displacement change, so as to determine whether the contact pressure between the test piece 14 and the circuit board is in line with the preset pressure value range. If it is lower than the preset pressure value range, the test device is controlled to increase the contact pressure to meet the preset pressure value range. If it is higher than the preset pressure value range, the test device is controlled to reduce the contact pressure to meet the preset pressure value range. For example, the position of the test device can be adjusted by controlling the manipulator to adjust the contact pressure between the test piece 14 and the circuit board.

[0033] This embodiment arranges a photoelectric sensor 15 on the flying probe holder 11 to detect the displacement of the flying probe holder 13 when the test piece 14 contacts the circuit board, so as to know the contact status between the test piece 14 and the circuit board for adjustment, thereby ensuring the effectiveness of the test. At the same time, it can also prevent the test piece 14 from being deformed or damaged when the contact pressure between the test piece 14 and the circuit board is too large, thereby extending the service life of the test device.

[0034] Continue reading Figure 2 and Figure 4 Optionally, the test device further includes a sensor seat 16. The sensor seat 16 is fixed on the flying probe seat 11. Specifically, for example, the sensor seat 16 is fixed on a side wall of the flying probe seat 11. The photoelectric sensor 15 is arranged on the sensor seat 16, and the photoelectric sensor 15 is arranged adjacent to one of the two flying probe holders 13, for example, the photoelectric sensor 15 is adjacent to the flying probe holder 13 located on one side of the side wall of the flying probe seat 11, and the displacement of the flying probe holder 13 adjacent to the photoelectric sensor 15 is detected.

[0035] In this embodiment, the two test pieces 14 need to contact the circuit board together, so only the displacement of one flying probe holder 13 needs to be detected. Of course, the displacements of the two flying probe holders 13 can also be detected at the same time.

[0036] Continue reading Figure 2, optionally, the photoelectric sensor 15 is further arranged between the two flying probe brackets 13. And the test surface 15a of the photoelectric sensor 15 is arranged toward the flying probe bracket 13 adjacent to it. In the present embodiment, the test surface 15a of the photoelectric sensor 15 can emit and receive light. A reflective film 151 is arranged on the surface of the first bracket arm 131 of the flying probe bracket 13 adjacent to the photoelectric sensor 15 that is opposite to the test surface 15a of the photoelectric sensor 15, so as to reflect the light emitted by the test surface 15a of the photoelectric sensor 15 so that the photoelectric sensor 15 can detect the displacement of the flying probe bracket 13 adjacent to it. Further, the test surface 15a of the photoelectric sensor 15 is arranged toward the connecting section 131b of the first bracket arm adjacent to it, and the reflective film 151 is arranged on the surface of the first connecting section 131b that is opposite to the test surface 15a of the photoelectric sensor 15. As Figure 5 As shown, when the test piece 14 contacts the circuit board, the flying probe holder 13 is deformed, and the connecting section 131b rotates around the recessed portion 131b1, thereby generating displacement, and the photoelectric sensor 15 detects the displacement.

[0037] In this embodiment, when the test piece 14 contacts the circuit board, the flying probe bracket 13 is displaced in the opposite direction, and the first bracket arm 131 provided with a reflective film 151 is also displaced accordingly. The photoelectric sensor 15 emits light and receives light reflected by the reflective film 151, so as to determine the position change of the first bracket arm 131 and obtain the displacement of the first bracket arm 131.

[0038] See also Figures 2 to 4 Optionally, the test device further includes a sunshade 17. The sunshade 17 is arranged on the sensor seat 16. The sunshade 17 is arranged opposite to the test surface 15a of the photoelectric sensor 15, and the sunshade 17 and the photoelectric sensor 15 form a test area. The first bracket arm 131 of the flying probe bracket 13 adjacent to the photoelectric sensor 15 is located in the test area. That is, the first bracket arm 131 is located between the test surface 15a of the photoelectric sensor 15 and the sunshade 17. By setting the sunshade 17, the interference of external light on the photoelectric sensor 15 can be avoided, thereby improving the accuracy of the detection result of the photoelectric sensor 15.

[0039] In this embodiment, a circuit board on the testing device can be used as the sensor seat 16, and the photoelectric sensor 15 can be disposed on the circuit board.

[0040] See also Figures 2 to 4 Optionally, for example, each test piece 14 is in the shape of a blade, and each test piece 14 includes a connecting rod 141 and a blade portion 142. The connecting rod 141 is connected to the blade portion 142. Figure 4As shown, for example, the blade portion 142 is arranged in a triangular shape, and the connecting rod 141 is connected to a short side of the blade portion 142, and the corner of the blade portion 142 opposite to the short side is used to contact the circuit board. The connecting rod 141 is inserted on the second connecting arm 134 of the flying probe holder 13. The spacing D between the contact points of the blade portions 142 of the two test pieces 14 and the circuit board is 30μm-100μm. Optionally, the spacing D is 60μm-90μm. Optionally, the spacing D is 70μm-80μm. Furthermore, when the connecting rod 141 is inserted on the second connecting arm 134, the extension direction of the connecting rod 141 forms an angle with the extension direction of the second connecting arm 134, and deviates to the side away from the first connecting arm 133, so as to facilitate contact with the circuit board when the circuit board is tested.

[0041] See also Figures 2 to 4 Optionally, the test device further includes an adjustment plate 18, and the two flying probe holders 13 are respectively fixed to the holder seat 12 through the adjustment plates 18. For example, the adjustment plates 18 are respectively arranged on the first holder arms 131 of the two flying probe holders 13, and the first holder arms 131 are respectively fixed to the two sides of the holder seat 12. The adjustment plate 18 is used to adjust the distance between the two flying probe holders 13, thereby adjusting the distance between the test pieces 14.

[0042] Further, the adjustment plate 18 is respectively arranged on the fixed section 131a, and the adjustment plate 18 fixes the fixed section 131a, or the fixed section 131a and the first connecting arm 133 to the bracket seat 12 to fix the two flying probe brackets 13. Specifically, for example, at least one through hole is formed on the fixed section 131a, such as two through holes formed at intervals along the extending direction of the fixed section 131a, and the adjustment plate 18 is threadedly connected to the bracket seat 12 by passing a screw through the through hole, wherein the diameter of the screw is smaller than the diameter of the through hole to form an adjustment margin, for example, the through hole is an elliptical hole, and the minor axis is greater than or equal to the radius of the screw, so that the position of the flying probe bracket 13 can be adjusted by the margin between the threaded rod and the through hole, thereby adjusting the distance between the two flying probe brackets 13, and finally achieving the purpose of adjusting the distance D between the contact points of the blade portion 142 of the test piece 14 for contacting the circuit board.

[0043] In summary, in this embodiment, the integrity of the test device is ensured by setting a flying probe seat 11, and at the same time, two flying probe brackets 13 are arranged at intervals and fixed on the bracket seat 12 respectively, wherein the distance H between the two flying probe brackets 13 gradually decreases in the direction away from the bracket seat 12, forming a structure similar to a triangle, and the structural reliability is high, which can ensure that the flying probe bracket 13 will not be damaged when the test piece 14 contacts the circuit board, resulting in problems such as failure to test, thereby enhancing the structural stability and test reliability of the entire test device, and the test piece 14 is arranged at the two ends of the two flying probe brackets 13 close to each other, so that the test piece 14 can test the electrical performance of subtle parts on the circuit board, thereby improving the accuracy of the test.

[0044] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A circuit board electrical performance testing device, characterized in that: include: Flying needle seat; A bracket seat, the bracket seat is fixed on the flying probe seat; Two flying probe brackets, the two flying probe brackets are arranged at intervals and are respectively fixed on the bracket seat, wherein the distance between the two flying probe brackets gradually decreases in a direction away from the bracket seat; Two test pieces, the two test pieces are respectively fixed on one end of the two flying probe holders away from the holder seat, and the two test pieces are used to contact the circuit board together; The two flying probe brackets are fixed on two side surfaces of the bracket seat which are opposite to each other and are arranged in a wedge shape, wherein each of the flying probe brackets is arranged in a frame shape, and each of the flying probe brackets includes a first bracket arm, a second bracket arm, a first connecting arm and a second connecting arm which are arranged in the frame shape, wherein the first bracket arm and the second bracket arm are arranged opposite to each other, the first connecting arm and the second connecting arm are arranged opposite to each other and are respectively connected between the first bracket arm and the second bracket arm, the connection position between the first bracket arm and the first connecting arm is adjacent to the bracket seat, and the connection position between the second bracket arm and the second connecting arm is adjacent to the test piece; the first bracket arm includes a fixing section and a connecting section which are connected to each other. The first bracket arm and the second bracket arm are connected to each other, wherein the width of the fixed segment is greater than the width of the connecting segment, and a recessed portion is formed at one end of the connecting segment connected to the fixed segment, and the width of the recessed portion is less than the width of a portion of the connecting segment adjacent to the recessed portion, so that when the test piece contacts the circuit board, the connecting segment rotates around the recessed portion to a side away from the test piece, thereby causing displacement of the flying probe bracket; a plurality of weight-reducing holes are respectively provided on the first bracket arm and the second bracket arm, wherein the number of the weight-reducing holes provided on the first bracket arm is less than the number of the weight-reducing holes provided on the second bracket arm; The device further includes adjustment plates, which are respectively arranged on the fixing sections, and the adjustment plates at least fix the fixing sections on the bracket seat to fix the two flying probe brackets, wherein the adjustment plates are used to adjust the distance between the two flying probe brackets, thereby adjusting the distance between the test pieces.

2. The circuit board electrical performance testing device according to claim 1, characterized in that: The device further comprises a photoelectric sensor, which is arranged on the flying probe holder and is used to detect the displacement of the flying probe holder when the test piece contacts the circuit board.

3. The circuit board electrical performance testing device according to claim 2, characterized in that: The device further comprises a sensor seat, the sensor seat is fixed on the flying probe seat, the photoelectric sensor is arranged on the sensor seat, and the photoelectric sensor is arranged adjacent to one of the two flying probe holders to detect the displacement of the adjacent flying probe holder.

4. The circuit board electrical performance testing device according to claim 3, characterized in that: The photoelectric sensor is further arranged between the two flying probe holders, and the test surface of the photoelectric sensor is arranged toward the adjacent flying probe holder. A reflective film is arranged on the side of the first holder arm of the adjacent flying probe holder opposite to the test surface of the photoelectric sensor to reflect the light emitted by the test surface of the photoelectric sensor so that the photoelectric sensor can detect the displacement of the adjacent flying probe holder.

5. The circuit board electrical performance testing device according to claim 4, characterized in that: The device further includes a shading plate, which is arranged on the sensor seat, and the shading plate is arranged opposite to the test surface of the photoelectric sensor, and the shading plate and the photoelectric sensor form a test area, the first bracket arm of the flying probe bracket adjacent to the photoelectric sensor is located in the test area, and the photoelectric sensor is used to measure the displacement of the first bracket arm.

6. The circuit board electrical performance testing device according to claim 1, characterized in that: Each of the test pieces includes a connecting rod and a blade part, the connecting rod is connected to the blade part, the connecting rod is inserted into the second connecting arm of the flying probe bracket, and the distance between the contact points of the blade parts of the two test pieces and the circuit board is 30um-100um.

Images