Chip test fixture

Abstract

The present invention discloses a chip test fixture, comprising a fixture body and a plurality of metal ejectors; the fixture body comprises a bearing surface for bearing a chip; the fixture body is provided with a plurality of first cavities arranged in a matrix to accommodate the pins of the chip; the metal ejectors are movably arranged along the direction in which the first cavities extend, one end of the metal ejectors is used to contact the pins, and the other end of the metal ejectors is led out of the first cavities to contact the PCB. The present invention enables the chip test fixture to be reused for different chips, improves the flexibility of chip testing, saves the cycle and cost of specially making chip test fixtures, and improves the efficiency of chip testing.

Description

Technical Field

[0001] The invention belongs to the technical field of chip testing, and in particular relates to a chip testing fixture. Background Art

[0002] When testing chips, sockets are often used as test fixtures. The socket is welded on the test board, and the socket is provided with leads corresponding to the chip. During the test, the socket clamps the chip to be tested for testing. In the prior art, new sockets are often designed according to the specifications of each chip (size, number of pins, pin arrangement, etc.). This way, each socket design takes a long time, is inefficient, and requires design fees and mold fees. Moreover, when designing a project, it is necessary to wait until the socket drawings are designed before continuing the project design. If there are no drawings to do the project, the risk of the project will increase. Moreover, the new socket needs to be rebuilt, which takes more time.

[0003] Therefore, the prior art has the following defects:

[0004] 1. Each chip needs to redesign the socket, which requires additional expenses.

[0005] 2. For new sockets, the library needs to be rebuilt, which takes project time.

[0006] 3. You need to get the socket drawings before you can continue the project.

[0007] 4. Waste of raw materials, previously used sockets cannot be reused. Summary of the invention

[0008] The technical problem to be solved by the present invention is to provide a chip test fixture in order to overcome the defects in the prior art that the chip test socket needs to be redesigned, which is time-consuming and consumes a lot of raw materials.

[0009] The present invention solves the above technical problems through the following technical solutions:

[0010] The present invention provides a chip testing fixture, comprising: a fixture body, a plurality of metal ejector pins;

[0011] The fixture body includes a carrying surface for carrying the chip;

[0012] The fixture body is provided with a plurality of first cavities arranged in a matrix to accommodate the pins of the chip;

[0013] The metal ejector pin is movably arranged along the extending direction of the first tube cavity, one end of the metal ejector pin is used to contact the pin, and the other end of the metal ejector pin is led out of the first tube cavity to contact the PCB.

[0014] Preferably, the metal ejector is provided with a limit ring, a first limit surface is provided on one side of the limit ring close to the bearing surface, a first limit step is provided in the first lumen, and the first limit step is provided corresponding to the first limit surface to limit the metal ejector from moving toward the bearing surface.

[0015] Preferably, the chip testing fixture further comprises a cover body, which is arranged on a side of the fixture body away from the bearing surface, and the cover body is provided with a second tube cavity connected to the first tube cavity, and the other end of the metal ejector pin is led out of the second tube cavity.

[0016] Preferably, a second limiting surface is provided on the side of the limiting ring away from the bearing surface, and a first limiting portion is provided on the side of the second lumen close to the bearing surface. The first limiting portion and the second limiting surface are provided correspondingly to limit the metal ejector from moving away from the bearing surface.

[0017] Preferably, the metal ejector is also provided with a second limiting step, which is arranged between the second limiting surface and the other end of the metal ejector; a second limiting portion is also arranged in the second tube cavity, and the second limiting portion and the second limiting step are arranged correspondingly to limit the metal ejector from moving in a direction away from the bearing surface.

[0018] Preferably, one end of the metal ejector pin is provided with a plurality of contact protrusions.

[0019] Preferably, the cover is snap-connected with the fixture body.

[0020] Preferably, a clamping portion is provided in the first tube cavity, and the clamping portion clamps the metal ejector pin.

[0021] Preferably, the chip testing fixture further comprises an upper cover, which is engaged with the fixture body to clamp the chip.

[0022] Preferably, the opening of the first lumen disposed on the bearing surface has a diameter of 0.3 mm to 0.6 mm.

[0023] Preferably, the center distance between two adjacent openings of the first lumen disposed on the bearing surface is 0.3 mm to 1.2 mm.

[0024] Preferably, the chip is packaged in BGA or QFA format.

[0025] The positive progressive effect of the present invention is that the present invention enables chip test fixtures to be reused for different chips, thereby improving the flexibility of chip testing, saving the cycle and cost of specially making chip test fixtures, and improving the efficiency of chip testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a partial cross-sectional structural schematic diagram of a chip testing fixture according to a preferred embodiment of the present invention.

[0027] Figure 2 It is a schematic diagram of a partial carrying surface of a chip testing fixture according to a preferred embodiment of the present invention. DETAILED DESCRIPTION

[0028] The present invention is further described below by way of a preferred embodiment, but the present invention is not limited to the scope of the embodiment.

[0029] This embodiment provides a chip 4 test fixture. Figure 1 , Figure 2 The chip 4 test fixture includes a fixture body 1 and a plurality of metal ejector pins 2. The fixture body 1 includes a bearing surface 101 for bearing the chip 4. The fixture body 1 is provided with a plurality of first cavities 102 arranged in a matrix to accommodate the pins 401 of the chip 4; the metal ejector pins 2 are movably arranged along the direction in which the first cavities 102 extend, one end 201 of the metal ejector pin 2 is used to contact the pins 401, and the other end 202 of the metal ejector pin 2 is led out of the first cavities 102 to contact the PCB. The main body of the metal ejector pin 2 is a cylinder 203. The PCB is a test board for testing the chip 4.

[0030] In an optional embodiment, the chip 4 is a BGA package. The diameter D1 of the opening of the first tube cavity 102 arranged on the bearing surface 101 is 0.3 mm to 0.6 mm. The center distance D2 of two adjacent openings of the first tube cavity 102 arranged on the bearing surface 101 is 0.3 mm to 1.2 mm. In the first optional embodiment, the center distance D2 is 0.4 mm (millimeter), and the chip 4 test fixture is suitable for a chip 4 with a 0.4mm BGA pitch (chip 4 pin center distance). In the second optional embodiment, the center distance D2 is 0.5 mm, and the chip 4 test fixture is suitable for a chip 4 with a 0.5mm BGA pitch. In the third optional embodiment, the center distance D2 is 0.8 mm, and the chip 4 test fixture is suitable for a chip 4 with a 0.8mm BGA pitch. In the fourth optional embodiment, the center distance D2 is 1.0 mm, and the chip 4 test fixture is suitable for a chip 4 with a 1.0mm BGA pitch.

[0031] In another optional implementation, the chip 4 is in a QFA package.

[0032] In order to improve compatibility, the number of the first tube cavities 102 of the chip 4 test fixture is a relatively large value, such as 1000, so as to be compatible with chips 4 of various specifications with different numbers of pins.

[0033] When testing chip 4, chip 4 is placed on the bearing surface 101 of the chip 4 test fixture, and the pins 401 of chip 4 are correspondingly inserted into the first tube cavity 102. As an optional embodiment, the chip 4 test fixture further includes an upper cover (not shown in the figure). The upper cover is engaged with the fixture body 1 to clamp the chip 4.

[0034] Then, according to the setting of the pins 401 of the chip 4, a metal ejector pin 2 is inserted into the first tube cavity 102 corresponding to each pin 401. One end 201 of the metal ejector pin 2 contacts the corresponding pin 401. Then, the chip 4 test fixture is set on the test board PCB. The test board PCB is provided with contact points corresponding to the pins 401 of the chip 4. The other end 202 of the metal ejector pin 2 contacts the corresponding contact point, thereby realizing the electrical connection between the corresponding pin 401 and the corresponding contact point.

[0035] Finally, the test board PCB is powered on to test the chip 4.

[0036] The chip 4 test fixture adopts a separable structure of the fixture body 1 and the metal ejector pin 2, which can be easily stored, sorted and maintained.

[0037] In an optional embodiment, a clamping portion 104 is disposed in the first lumen 102. When the cylinder 203 is inserted into the first lumen 102, the clamping portion 104 clamps the cylinder 203 of the metal ejector pin 2 to fix the metal ejector pin 2 and prevent the metal ejector pin 2 from falling off.

[0038] One end 201 of the metal ejector pin 2 is provided with a plurality of contact protrusions 206 , which can ensure that the metal ejector pin 2 forms a good connection with the pin 401 of the chip 4 and avoid poor contact and an open circuit.

[0039] The metal ejector 2 is provided with a limiting ring 204. The limiting ring 204 protrudes from the surface of the cylinder 203. A first limiting surface 205 is provided on one side of the limiting ring 204 close to the bearing surface 101, and a first limiting step 103 is provided in the first lumen 102. The first limiting step 103 is provided corresponding to the first limiting surface 205 to limit the metal ejector 2 from moving toward the bearing surface 101.

[0040] The chip 4 test fixture further includes a cover 3, which is disposed on a side of the fixture body 1 away from the bearing surface 101, and is provided with a second tube cavity 301 connected to the first tube cavity 102, and the other end 202 of the metal ejector pin 2 is led out of the second tube cavity 301. The cover 3 is clamped with the fixture body 1.

[0041] A second limiting surface 207 is provided on the side of the limiting ring 204 away from the bearing surface 101 , and a first limiting portion is provided on the side of the second lumen 301 close to the bearing surface 101 . The first limiting portion and the second limiting surface 207 are correspondingly arranged to limit the metal ejector 2 from moving in a direction away from the bearing surface 101 .

[0042] The metal ejector pin 2 is also provided with a second limiting step 208, which is arranged between the second limiting surface 207 and the other end 202 of the metal ejector pin 2; a second limiting portion 302 is also provided in the second tubular cavity 301, and the second limiting portion 302 is arranged corresponding to the second limiting step 208 to limit the metal ejector pin 2 from moving in a direction away from the bearing surface 101.

[0043] When testing the chip 4, the chip 4 is fixed on the carrying surface 101. Then the cover 3 is separated from the fixture body 1. Next, the metal ejector pin 2 is inserted into the first tube cavity 102. Then, the cover 3 is engaged with the fixture body 1.

[0044] The first limiting step 103 limits the metal ejector pin 2 from moving toward the bearing surface 101 to prevent the metal ejector pin 2 from exerting excessive pressure on the chip 4. The first limiting portion and the second limiting portion 302 can prevent the metal ejector pin 2 from falling out of the chip 4 test fixture, and also provide convenience for taking out and putting in the metal ejector pin 2.

[0045] The chip test fixture of this embodiment can be applied to a variety of chips with different numbers of pins, and has high compatibility. The same chip test fixture can be applied to a variety of different chip test projects, which reduces the project cycle and saves costs. In addition, the chip test fixture is easy to use, store and maintain.

[0046] Although the specific embodiments of the present invention are described above, it should be understood by those skilled in the art that this is only for illustration and the protection scope of the present invention is defined by the appended claims. Those skilled in the art may make various changes or modifications to these embodiments without departing from the principles and essence of the present invention, but these changes and modifications all fall within the protection scope of the present invention.

Claims

1. A chip testing fixture, characterized in that: include: The fixture body and several metal ejectors; The fixture body includes a carrying surface for carrying a chip; The fixture body is provided with a plurality of first cavities arranged in a matrix to accommodate the pins of the chip; The metal ejector pin is movably arranged along the direction in which the first tube cavity extends, one end of the metal ejector pin is used to contact the pin, and the other end of the metal ejector pin is led out of the first tube cavity to contact the PCB; The metal ejector is provided with a limiting ring, a first limiting surface is provided on a side of the limiting ring close to the bearing surface, a first limiting step is provided in the first lumen, and the first limiting step is provided corresponding to the first limiting surface to limit the metal ejector from moving toward the bearing surface; The chip testing fixture further comprises a cover body, which is arranged on a side of the fixture body away from the bearing surface, and the cover body is provided with a second tube cavity communicating with the first tube cavity, and the other end of the metal ejector pin is led out of the second tube cavity; A second limiting surface is provided on a side of the limiting ring away from the bearing surface, and a first limiting portion is provided on a side of the second tube cavity close to the bearing surface, and the first limiting portion and the second limiting surface are provided correspondingly to limit the metal ejector from moving in a direction away from the bearing surface; A clamping portion is provided in the first tube cavity, and the clamping portion clamps the metal ejector pin.

2. The chip testing fixture as claimed in claim 1, characterized in that: The metal ejector pin is also provided with a second limiting step, which is arranged between the second limiting surface and the other end of the metal ejector pin; a second limiting portion is also arranged in the second tube cavity, and the second limiting portion is arranged corresponding to the second limiting step to limit the metal ejector pin from moving in a direction away from the bearing surface.

3. The chip testing fixture as claimed in claim 1, characterized in that: One end of the metal ejector pin is provided with a plurality of contact protrusions.

4. The chip testing fixture as claimed in claim 1, characterized in that: The cover body is clamped with the fixture body.

5. The chip testing fixture as claimed in claim 1, characterized in that: The chip testing fixture further comprises an upper cover, and the upper cover is engaged with the fixture body to clamp the chip.

6. The chip testing fixture as claimed in claim 1, characterized in that: The opening of the first tube cavity disposed on the bearing surface has a diameter of 0.3 mm to 0.6 mm.

7. The chip testing fixture as claimed in claim 1, characterized in that: The center distance between two adjacent openings of the first tube cavity arranged on the bearing surface is 0.3 mm to 1.2 mm.

8. The chip testing fixture as claimed in claim 1, characterized in that: The chip is packaged in BGA or QFA.

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