Temperature shock test chamber capable of achieving instantaneous high and low temperature changes

Abstract

The present invention discloses a temperature shock test box capable of realizing instantaneous changes in high and low temperatures, comprising: a box body, the box body comprising a side box body and a test box, the side box body being arranged at a side wall of the test box, and an airflow circulation channel being arranged between the side box body and the test box; a temperature shock test device, the temperature shock test device comprising a sample fixing device, a high temperature shock device and a low temperature shock device, and the high temperature shock device and the low temperature shock device can perform high temperature shock or low temperature shock on a sample placed on the sample fixing device. The present invention is a temperature shock test box capable of realizing instantaneous changes in high and low temperatures, which greatly shortens the test time and reduces the test energy consumption.

Description

Technical Field

[0001] The invention relates to the technical field of high and low temperature impact test equipment, and in particular to a temperature impact test box capable of realizing instantaneous changes in high and low temperatures. Background Art

[0002] In addition to the increasingly high quality requirements for electronic industrial products, this requires that the laboratory must completely simulate the actual use of the product, and even conduct tests under power, such as lithium battery leakage test. However, the test process is often accompanied by certain risks. For example, due to material reasons, the sample cannot withstand the extreme temperature, and the sample itself has a certain amount of heat. Such a combined effect accelerates the aging of the sample insulation, and may cause combustion due to excessive local temperature, causing all test products to be scrapped, or even burning the test box, causing a fire. The existing high and low temperature test chamber can control the high and low humidity, high and low air pressure, and high and low temperature to simulate the test environment. For humidity control, heaters, evaporators, and air circulation devices are generally used to increase or decrease the humidity in the air. However, for some products that require rain tests, this type of test chamber cannot simulate the required conditions.

[0003] At present, the high and low temperature impact test chambers in the prior art are mostly divided into a high temperature generating device, a low temperature generating device and a test chamber, and the high temperature generating device and the low temperature generating device are used to perform high and low temperature shocks on the samples placed inside the test chamber in turn.

[0004] The high and low temperature impact test chamber in the prior art needs to quickly adjust the temperature of the entire test chamber. During this adjustment process, the temperature change must go through a relatively slow process, which will cause the test time to be long. In addition, due to the large space of the entire chamber, a large amount of energy is wasted.

[0005] Therefore, there is an urgent need for a temperature shock test chamber that can achieve instantaneous changes in high and low temperatures and greatly shorten the test time and reduce the test energy consumption. Summary of the invention

[0006] The purpose of the present invention is to provide a temperature shock test box which can greatly shorten the test time, reduce the test energy consumption and realize the instantaneous change of high and low temperatures.

[0007] In order to achieve the above-mentioned purpose, the technical solution provided by the present invention is: to provide a temperature shock test chamber capable of realizing instantaneous high and low temperature changes, comprising:

[0008] A box body, the box body comprising a side box body and a test box, the side box body is arranged at a side wall of the test box, and an air circulation channel is arranged between the side box body and the test box;

[0009] A temperature shock test device comprises a sample fixing device, a high temperature shock device and a low temperature shock device, and the high temperature shock device and the low temperature shock device can perform high temperature shock or low temperature shock on a sample placed on the sample fixing device.

[0010] The high temperature impact device and the low temperature impact device can perform high temperature impact or low temperature impact on the sample placed on the sample fixing device in turn.

[0011] The high temperature impact device is a laser emitting device with adjustable power.

[0012] The low-temperature impact device is a nitrogen emission device with adjustable flow rate.

[0013] The sample fixing device is also connected to a driving device, and the driving device drives the sample fixing device to rotate. The sample fixing device is provided with grooves arranged in a circumferential shape, and the sample is fixed in the grooves.

[0014] The laser emitting device and the nitrogen emitting device are arranged above the sample fixing device and facing the groove. The laser device and the nitrogen emitting device can respectively perform laser heating or nitrogen cooling on the sample placed in the groove.

[0015] The driving device includes: a host computer, a PLC controller, a frequency converter and a motor connected in sequence, and the host computer is provided with a human-machine operation interface, the human-machine operation interface is used to input working parameters, and the human-machine operation interface is converted into control instructions by the host computer and transmitted to the PLC controller, and the PLC controller controls the start, stop and speed of the motor through the frequency converter.

[0016] It also includes a fixing plate for mounting the laser emitting device and the nitrogen emitting device, wherein the laser emitting device and the nitrogen emitting device are mounted on the lower surface of the fixing plate, and also includes a liquid nitrogen pipeline, which is arranged on the upper surface of the fixing plate, one end of which is connected to an external liquid nitrogen source, and the other end of which is connected to the nitrogen emitting device.

[0017] The laser emitting device and the nitrogen emitting device are installed on the lower surface of the fixing plate in a circular arrangement, and each of the grooves is aligned with one of the laser emitting device or the nitrogen emitting device.

[0018] A temperature sensing device is also provided at the bottom of the groove, and the temperature sensing device is also connected to a data acquisition card, and is connected to a computer through the data acquisition card. The computer collects temperature change information in the groove through the data acquisition card.

[0019] Compared with the prior art, the temperature shock test chamber of the present invention that can achieve instantaneous high and low temperature changes includes the temperature shock test device, which includes a high temperature shock device and a low temperature shock device. The high temperature shock device and the low temperature shock device can perform high temperature shock or low temperature shock on the sample placed on the sample fixing device. In the present invention, the high temperature shock device and the low temperature shock device can quickly perform high temperature and low temperature shocks on the sample fixed in the groove in turn. The shock temperature can change instantly or slowly to meet different test requirements. It can truly achieve instantaneous high temperature or low temperature, and there is no need to alternate the temperature in the entire test chamber between hot and cold, which can greatly reduce energy consumption and shorten the test time.

[0020] The present invention will become more apparent from the following description taken in conjunction with the accompanying drawings, which are used to illustrate embodiments of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a schematic cross-sectional structure diagram of an embodiment of the temperature shock test box of the present invention which can realize the instantaneous change of high and low temperature.

[0022] Figure 2 As shown Figure 1 The schematic diagram of the sample fixing device of the temperature shock test chamber which can realize the instantaneous change of high and low temperature is shown. Figure 3 Shown is the circuit principle module diagram of the drive device.

[0023] Figure 4 Shown is the principle module diagram of the temperature acquisition circuit. DETAILED DESCRIPTION

[0024] The embodiments of the present invention are now described with reference to the accompanying drawings, in which similar element numbers represent similar elements. As described above, with reference to 1, 2, and 3, the present invention provides a temperature shock test chamber 100 capable of achieving instantaneous high and low temperature changes, comprising:

[0025] Box 1, the box 1 includes a side box 2 and a test box 3, the side box 2 is arranged at a side wall of the test box 3, and an air circulation channel is arranged between the side box 2 and the test box 3; specifically, the gas in the test box 3 can be temperature-regulated through the side box 2, and the gas after temperature regulation returns to the test box 3, more specifically, a heater 21 and an evaporator 22 can be arranged in the side box 2, the heater 21 plays a heating role, and the evaporator 22 plays a cooling role, and the heater 21 or the evaporator 22 can be selected to work according to the test needs, thereby adjusting the test environment temperature in the test box 3. Or the gas inside the test box 3 can circulate with the outside air through the side box 2, and the external high-temperature gas or low-temperature gas can be introduced, or the air pressure in the test box 3 can be adjusted.

[0026] refer to Figure 1 The temperature shock test device 4 includes a sample fixing device 41, a high temperature shock device 42 and a low temperature shock device 43, and the high temperature shock device 42 and the low temperature shock device 43 can perform high temperature shock or low temperature shock on the sample placed on the sample fixing device 41. Figure 1 As shown, the temperature shock test device 4 is arranged inside the test box 3, so that the temperature shock test device 4 can be isolated from contact with the outside during operation, and an independent and adjustable test atmosphere can be created for the temperature shock test device 4 without cross contamination with the external environment.

[0027] In one embodiment, the high temperature shock device 42 and the low temperature shock device 43 can perform high temperature shock or low temperature shock alternately on the sample placed on the sample fixing device 41. Specifically, for the sample on the same sample fixing device 41, the high temperature shock device 42 and the low temperature shock device 43 can perform shock alternately, and the time interval for switching the high temperature shock device 42 or the low temperature shock device 43 can be performed in a very short time or in a longer time. The length of the interval time is freely controllable, and the power output by the high temperature shock device 42 and the low temperature shock device 43 is adjustable. In one embodiment, the high temperature shock device 42 is a laser emitting device with adjustable power. The advantages of the laser emitting device are concentrated energy, good directionality, and minimal interference to non-related targets. In addition, due to its adjustable power, the temperature range generated by the laser emitting device is very wide. Since the temperature generated by the laser can easily reach tens of thousands of degrees Celsius, and most tests only require a few hundred degrees of high temperature, the high temperature generated by the laser emitting device is sufficient to meet all high-temperature testing needs. Generally speaking, only a laser emitting device with extremely small power can meet most testing needs.

[0028] In one embodiment, the low temperature impact device 43 is a nitrogen emission device with adjustable flow rate. The substance emitted by the nitrogen emission device is nitrogen, which comes from an external nitrogen bottle. Liquid nitrogen absorbs a large amount of heat during the gasification process, which can instantly cool the temperature of the sample to below -200 degrees. Therefore, it is necessary to control the amount of nitrogen emitted by the nitrogen emission device to achieve the purpose of controlling its cooling and prevent the temperature from being too low.

[0029] Therefore, it should be noted that the high and low temperature shocks on the sample by the laser emitting device and the nitrogen emitting device introduced in the above two embodiments can cause the temperature environment of the sample to change instantly. In fact, the temperature environment of the sample can also change slowly, depending on the power of the high temperature shock device 42 and the low temperature shock device 43, and the power of the two devices and the rate of change of the power.

[0030] like Figure 1 , 2 In the embodiment shown, the sample fixing device 41 is also connected to a driving device, and the driving device drives the sample fixing device 41 to rotate. The sample fixing device 41 is provided with grooves 45 arranged in a circumferential shape, and the sample is fixed in the grooves 45. Figure 2 In the embodiment shown, one circle of the groove 45 is exemplarily provided. In actual application, the number of circles of the groove 45 can be multiple circles. In addition, the inner wall of the groove 45 needs to be designed as a heat-insulating inner wall to prevent the temperatures of the grooves 45 from interfering with each other, and also to reduce energy loss and energy consumption. Figure 1 In the illustrated embodiment, the laser emitting device and the nitrogen emitting device are disposed above the sample fixing device 41 and facing the groove 45. The laser emitting device and the nitrogen emitting device can respectively perform laser heating or nitrogen cooling on the sample placed in the groove 45. Specifically, the laser emitting device and the nitrogen emitting device are arranged in a circular shape, and can also be arranged in one or more circles corresponding to the grooves 45 arranged in a circular shape, corresponding to the number of circles of the grooves 45, that is, one laser emitting device or one nitrogen emitting device is correspondingly arranged above each groove 45.

[0031] like Figure 3In the illustrated embodiment, the driving device 44 includes: a host computer 441, a PLC controller 442, a frequency converter 443 and a motor 444 connected in sequence, and the host computer 441 is provided with a human-machine operation interface 445, and the human-machine operation interface 445 is used to input working parameters, and is converted into control instructions by the host computer 441 and transmitted to the PLC controller 442, and the PLC controller 442 controls the start, stop and speed of the motor 444 through the frequency converter 443.

[0032] like Figure 1 In the embodiment shown, a fixing plate 46 for mounting the laser emitting device and the nitrogen emitting device is also included. The laser emitting device and the nitrogen emitting device are installed on the lower surface of the fixing plate 46. A liquid nitrogen pipeline is also included. The liquid nitrogen pipeline is arranged on the upper surface of the fixing plate 46, one end of which is connected to an external liquid nitrogen source, and the other end is connected to the nitrogen emitting device. It should be noted that the nitrogen emitting device must be arranged with the liquid nitrogen pipeline, and the liquid nitrogen pipeline is connected from an external liquid nitrogen source, while the laser emitting device only needs to arrange a conductive cable inside the fixing plate 46. The laser emitting device is directly installed on the lower surface of the fixing plate 46, and the laser emitting device can be a laser emitting gun with adjustable power.

[0033] like Figure 1 In the embodiment shown, the laser emitting device and the nitrogen emitting device are installed in a circular arrangement on the lower surface of the fixing plate 46, and each of the grooves 45 is aligned with one of the laser emitting device or the nitrogen emitting device. Therefore, the test performed on the sample in each groove 45 is independent, and some grooves can be subjected to high temperature shock, while some grooves can be subjected to low temperature shock.

[0034] In one embodiment, if Figure 4 As shown, a temperature sensor 47 is also provided at the bottom of the groove 45, and the temperature sensor 47 is also connected to a data acquisition card 48, and is connected to a computer 49 through the data acquisition card 48. The computer 49 collects temperature change information in the groove 45 through the data acquisition card 48. The temperature change curve of the groove 45 can be well displayed through the computer 49, and can be further connected to the network or a printer to output through the printer.

[0035] The above disclosure is only the preferred embodiment of the present invention, which certainly cannot be used to limit the scope of rights of the present invention. Therefore, equivalent changes made according to the scope of the patent application of the present invention are still within the scope covered by the present invention.

Claims

1. A temperature shock test chamber capable of achieving instantaneous high and low temperature changes, characterized in that: include: A box body, the box body comprising a side box body and a test box, the side box body is arranged at a side wall of the test box, and an air circulation channel is arranged between the side box body and the test box; A temperature shock test device, the temperature shock test device comprising a sample fixing device, a high temperature shock device and a low temperature shock device, the high temperature shock device and the low temperature shock device are arranged above the sample fixing device, the sample fixing device is provided with one or more circles of grooves arranged in a circumferential shape, the grooves have a heat-insulating inner wall, the sample is fixed in the grooves, the high temperature shock device and the low temperature shock device can perform high temperature shock or low temperature shock on the sample placed in the grooves in turn, the sample fixing device is also connected to a driving device, the driving device drives the sample fixing device to rotate; The high temperature impact device is a laser emitting device with adjustable power, and the low temperature impact device is a nitrogen emitting device with adjustable flow rate. The laser emitting device and the nitrogen emitting device can respectively perform laser heating or nitrogen cooling on the sample placed in the groove; It also includes a fixing plate for mounting the laser emitting device and the nitrogen emitting device, wherein the laser emitting device and the nitrogen emitting device are arranged in a circular shape and mounted on the lower surface of the fixing plate and correspond to the number of circles of the grooves, so that each of the grooves is aligned with one of the laser emitting device or the nitrogen emitting device; It also includes a liquid nitrogen pipeline, which is arranged on the upper surface of the fixed plate, and one end of the liquid nitrogen pipeline is connected to an external liquid nitrogen source, and the other end is connected to the nitrogen emission device.

2. The temperature shock test chamber capable of realizing instantaneous high and low temperature changes as claimed in claim 1, characterized in that: The driving device includes: a host computer, a PLC controller, a frequency converter and a motor connected in sequence, and the host computer is provided with a human-machine operation interface, the human-machine operation interface is used to input working parameters, and the human-machine operation interface is converted into control instructions by the host computer and transmitted to the PLC controller, and the PLC controller controls the start, stop and speed of the motor through the frequency converter.

3. The temperature shock test chamber capable of realizing instantaneous high and low temperature changes as claimed in claim 1, characterized in that: A temperature sensing device is also provided at the bottom of the groove, and the temperature sensing device is also connected to a data acquisition card, and is connected to a computer through the data acquisition card. The computer collects temperature change information in the groove through the data acquisition card.

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