Trigger control method and device

Abstract

The embodiment of the present invention provides a trigger control method and device. The method includes: obtaining a trigger signal and a waveform generation instruction; collecting the trigger signal and counting the delay time; determining the waveform identifier and waveform delay of the waveform based on the waveform generation instruction; when the delay time meets the waveform generation condition, generating a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other. The technical solution provided in this embodiment collects the trigger signal, counts the delay time, and generates the corresponding waveform when the delay time meets the set conditions. This not only effectively realizes the ability to accurately generate a waveform corresponding to the delay time in the trigger signal, but also the waveforms corresponding to different delay times are independent of each other. In this way, when performing signal measurement and control based on the waveform, not only the occupancy rate of data processing resources is reduced, but also the quality and efficiency of data processing are improved.

Description

Technical Field

[0001] The present invention relates to the field of signal control technology, and in particular to a trigger control method and device. Background Art

[0002] In the field of radio frequency signal measurement and control, the requirements for the measurement and control system that can realize signal calculation operations are very strict. Among them, the measurement and control system includes a trigger and a waveform generator. The trigger can generate a trigger signal, and the waveform generator can generate a continuous waveform based on the trigger signal. The continuous waveform is used to measure and control superconducting quantum bits.

[0003] Since the continuous waveform generated by the waveform generator includes valid data related to the trigger signal and invalid data unrelated to the trigger signal, when the obtained continuous waveform is used to measure and control superconducting quantum bits, it will not only increase the occupancy rate of data resources but also reduce the efficiency of data processing. Summary of the invention

[0004] An embodiment of the present invention provides a trigger control method and device, which can generate a waveform corresponding to the delay time in a trigger signal, and the waveform only includes valid data related to the trigger signal, thereby helping to reduce the occupancy rate of data resources and improve the quality and efficiency of data processing.

[0005] In a first aspect, an embodiment of the present invention provides a trigger control method, including:

[0006] Get trigger signals and waveform generation instructions;

[0007] Collecting the trigger signal and counting the delay time;

[0008] Based on the waveform generation instruction, determining a waveform identifier and a waveform delay of the waveform;

[0009] When the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and waveforms corresponding to different delay times are independent of each other.

[0010] In a second aspect, an embodiment of the present invention provides a trigger control device, including:

[0011] A first acquisition module, used for acquiring a trigger signal and a waveform generation instruction;

[0012] A first statistical module, used for collecting the trigger signal and counting the delay time;

[0013] A first determination module, configured to determine a waveform identifier and a waveform delay of a waveform based on the waveform generation instruction;

[0014] The first control module is used to generate a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction when the delay time meets the waveform generation condition, and the waveforms corresponding to different delay times are independent of each other.

[0015] In a third aspect, an embodiment of the present invention provides an electronic device, comprising: a memory, and a processor; wherein the memory is used to store one or more computer instructions, wherein the one or more computer instructions, when executed by the processor, implement the trigger control method in the above-mentioned first aspect.

[0016] In a fourth aspect, an embodiment of the present invention provides a computer storage medium for storing a computer program, wherein the computer program enables a computer to implement the trigger control method in the first aspect when executed.

[0017] In a fifth aspect, an embodiment of the present invention provides a trigger control method, including:

[0018] Get trigger signals and waveform generation instructions;

[0019] Collecting the trigger signal and counting the delay time;

[0020] Based on the waveform generation instruction, determining a waveform identifier and a waveform delay of the waveform;

[0021] When the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other;

[0022] The superconducting quantum bit is measured and controlled based on the waveform.

[0023] In a sixth aspect, an embodiment of the present invention provides a trigger control device, including:

[0024] A second acquisition module, used for acquiring a trigger signal and a waveform generation instruction;

[0025] A second statistical module is used to collect the trigger signal and count the delay time;

[0026] A second determination module, configured to determine a waveform identifier and a waveform delay of a waveform based on the waveform generation instruction;

[0027] A second control module is used to generate a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction when the delay time meets the waveform generation condition, and the waveforms corresponding to different delay times are independent of each other;

[0028] The second processing module is used to measure and control the superconducting quantum bit based on the waveform.

[0029] In the seventh aspect, an embodiment of the present invention provides an electronic device, comprising: a memory and a processor; wherein the memory is used to store one or more computer instructions, wherein the one or more computer instructions, when executed by the processor, implement the trigger control method in the above-mentioned fifth aspect.

[0030] In an eighth aspect, an embodiment of the present invention provides a computer storage medium for storing a computer program, wherein the computer program enables a computer to implement the trigger control method in the fifth aspect when executed.

[0031] In an eighth aspect, an embodiment of the present invention provides a trigger measurement and control device, including:

[0032] A trigger, for generating a trigger signal and a waveform generation instruction, and sending the trigger signal and the waveform generation instruction to at least one waveform generator;

[0033] A waveform generator is connected to the trigger and is used to obtain the trigger signal and the waveform generation instruction; collect the trigger signal and count the delay time; determine the waveform identifier and waveform delay of the waveform based on the waveform generation instruction; when the delay time meets the waveform generation condition, generate a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other.

[0034] The technical solution provided in this embodiment acquires a trigger signal and a waveform generation instruction, collects the trigger signal, and counts the delay time, and then determines the waveform identifier and waveform delay of the waveform based on the waveform generation instruction; when the delay time satisfies the waveform generation condition, a waveform corresponding to the delay time in the trigger signal can be generated, wherein the waveforms corresponding to different delay times are independent of each other, that is, the generated waveform only includes valid data related to the trigger signal, which not only effectively realizes the ability to accurately generate a waveform corresponding to the delay time in the trigger signal, but also reduces the occupancy rate of data processing resources when measuring and / or controlling superconducting quantum bits based on the waveform, and also improves the quality and efficiency of data processing, thereby further improving the practicability of the trigger control method. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0036] Figure 1 A flowchart of a trigger control method provided by an embodiment of the present invention;

[0037] Figure 2 A schematic diagram of the principle of a trigger control method provided by an embodiment of the present invention;

[0038] Figure 3 A schematic diagram of collecting the trigger signal and counting the delay time provided by an embodiment of the present invention;

[0039] Figure 4 A schematic diagram of generating a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction provided in an embodiment of the present invention;

[0040] Figure 5 A flowchart of another trigger control method provided by an embodiment of the present invention;

[0041] Figure 6 A flowchart of another trigger control method provided by an embodiment of the present invention;

[0042] Figure 7 A schematic diagram of the structure of a trigger measurement and control device provided by an embodiment of the present invention;

[0043] Figure 8 A schematic diagram of the structure of another trigger measurement and control device provided by an embodiment of the present invention;

[0044] Fig. 9 A schematic diagram of a structure in which a trigger of a trigger measurement and control device on a PXIe chassis is connected to triggers on other PXIe chassis provided by an embodiment of the present invention;

[0045] Fig.10 A schematic diagram of the structure of a radio frequency signal measurement and control system provided by an application embodiment of the present invention;

[0046] Fig.11 A schematic diagram of the connection structure of a radio frequency signal measurement and control system provided by an application embodiment of the present invention;

[0047] Fig.12 Schematic diagram of concurrent waveforms provided for application embodiments of the present invention Figure 1 ;

[0048] Fig.13 Schematic diagram of concurrent waveforms provided for application embodiments of the present invention Figure 2 ;

[0049] Fig.14 A schematic diagram of the structure of another trigger control device provided by an embodiment of the present invention;

[0050] Fig.15 For Fig.14 A schematic diagram of the structure of an electronic device corresponding to the trigger control device provided in the illustrated embodiment;

[0051] Fig.16 A schematic diagram of the structure of another trigger control device provided by an embodiment of the present invention;

[0052] Fig.17 For Fig.16 A schematic structural diagram of an electronic device corresponding to the trigger control device provided in the illustrated embodiment. DETAILED DESCRIPTION

[0053] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0054] The terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The singular forms "a", "said" and "the" used in the embodiments of the present invention and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings, and "multiple" generally includes at least two, but does not exclude the inclusion of at least one.

[0055] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0056] As used herein, the words "if" and "if" may be interpreted as "at the time of" or "when" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrases "if it is determined" or "if (stated condition or event) is detected" may be interpreted as "when it is determined" or "in response to determining" or "when detecting (stated condition or event)" or "in response to detecting (stated condition or event)", depending on the context.

[0057] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a product or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such a product or system. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the product or system including the elements.

[0058] In addition, the step sequence in the following method embodiments is only an example and not a strict limitation.

[0059] In order to understand the specific implementation process of the technical solution in this embodiment, the relevant technologies are described below:

[0060] In the field of radio frequency signal measurement and control, each measurement and control channel (signal transmission channel, signal acquisition channel) is interrelated. In order to ensure the accuracy of signal measurement and control, it is necessary to control the phase noise between each measurement and control channel. For example, in the field of superconducting quantum computing, the phase noise between measurement and control channels directly affects the control accuracy of quantum bits and the readout signal-to-noise ratio, which makes it easy for related technologies to fail to meet design requirements.

[0061] Faced with the signal synchronization requirements at the picosecond level, the operating clock cycle of the central processing unit (CPU) and the field programmable gate array (FPGA) included in the measurement and control system usually reaches hundreds of picoseconds or even nanoseconds. Since it is impossible to ensure that all sub-modules can receive the start command at the same time under the standard communication protocol, the start command cannot be sent to each module through the standard communication protocol, where the standard communication protocol includes any one of the following: Ethernet, USB, PCIe, etc. At this time, it is necessary to effectively control the relationship between the clock, operation and trigger to meet the requirements of low phase noise. In addition, in order to improve the flexibility and reliability of the measurement and control system, the measurement and control system also needs to have a certain degree of scalability to meet the application needs of different users.

[0062] Taking the field of superconducting quantum computing as an example, since the phase noise between microwave channels can directly affect the control accuracy and readout signal-to-noise ratio of superconducting quantum bits, in the field of superconducting quantum computing, the requirements for the measurement and control system are very strict. The measurement and control system includes an arbitrary waveform generator and a waveform acquisition card. Therefore, it is necessary to strictly control the timing of the arbitrary waveform generator and the waveform acquisition card so that the arbitrary waveform generator can generate an arbitrary waveform with precise timing to control the superconducting quantum bits. In addition, the waveform acquisition card is also required to accurately collect the output signal of the resonant cavity for reading the state of the superconducting quantum bits.

[0063] In order to achieve multi-channel, low phase noise concurrent operation in the measurement and control system, a measurement and control system based on a daisy chain connection structure is provided in the related art. Specifically, multiple devices are connected in the form of a daisy chain, and clock and trigger signals are transmitted through electrical connections to control phase noise and system expansion operations. However, this daisy chain cascade structure will not only lead to the accumulation of deviations on the connection link, but also the deviations of each board are different. When the scale of the measurement and control system is large, the system deviation will reach the level of tens of ns or even higher. At this time, not only does it need to correct each board, but it also does not have good scalability.

[0064] In order to solve the above technical problems, the present embodiment proposes a trigger control method and device, wherein the trigger control method can be applied to the superconducting quantum field or the radio frequency signal measurement and control field. Specifically, the method acquires the trigger signal and the waveform generation instruction, collects the trigger signal, and counts the delay time, and then determines the waveform identifier and waveform delay of the waveform based on the waveform generation instruction. When the delay time meets the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, wherein the waveforms corresponding to different delay times are independent of each other, that is, the above waveform only includes valid data related to the trigger signal, which not only effectively realizes the ability to accurately generate a waveform corresponding to the delay time in the trigger signal, but also reduces the occupancy rate of data processing resources when performing signal measurement and / or control based on the waveform pair, and also improves the quality and efficiency of data processing, thereby further improving the practicability of the trigger control method.

[0065] In the following, some embodiments of the present invention are described in detail in conjunction with the accompanying drawings. In the case where there is no conflict between the embodiments, the following embodiments and features in the embodiments can be combined with each other.

[0066] Figure 1 A flowchart of a trigger control method provided by an embodiment of the present invention; Figure 2 A schematic diagram of a trigger control method provided by an embodiment of the present invention; Figure 1 -Attached Figure 2As shown, this embodiment provides a trigger control method, which can be applied to the field of radio frequency signal measurement and control or the field of superconducting quantum. The execution subject of the above method can be a trigger control device. It can be understood that the trigger control device can be implemented as software, or a combination of software and hardware. In some examples, the trigger control device can be implemented as a device capable of waveform generation and / or waveform acquisition operations.

[0067] Specifically, the trigger control method may include:

[0068] Step S101: Acquire a trigger signal and a waveform generation instruction.

[0069] Step S102: Collect the trigger signal and count the delay time.

[0070] Step S103: Based on the waveform generation instruction, determine the waveform identifier and waveform delay of the waveform.

[0071] Step S104: when the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other.

[0072] The following is a detailed description of each of the above steps:

[0073] Step S101: Acquire a trigger signal and a waveform generation instruction.

[0074] Among them, the trigger signal refers to a pulse signal used to trigger the trigger control device. When the trigger control device obtains the trigger signal, it can be started based on the trigger signal. The corresponding waveform generation operation and / or waveform acquisition operation can be realized by the started trigger control device. The waveform generation instruction refers to an instruction used to control the trigger control device to generate a waveform. In some instances, the generated waveform may include any one of the following: a radio frequency signal, a microwave signal; in other instances, the above waveform can be used to measure and control superconducting quantum bits. It can be understood that the generated waveform can be any waveform, such as: a sine wave, a square wave, a triangle wave, etc.

[0075] In addition, this embodiment does not limit the specific method for obtaining the trigger signal and the waveform generation instruction. Those skilled in the art can set it according to the specific application scenario or application requirements. For example, an interactive interface is provided on the trigger control device, and the user can input the corresponding operation in the interactive interface, so that the trigger control device generates the trigger signal and the waveform generation instruction. Alternatively, the trigger control device is communicatively connected to a controller, and the controller is used to generate the waveform generation instruction and send the waveform generation instruction to the trigger control device, so that the trigger control device can stably obtain the waveform generation instruction.

[0076] Of course, those skilled in the art may also adopt other methods to obtain the trigger signal and the waveform generation instruction, as long as the accuracy and reliability of obtaining the trigger signal and the waveform generation instruction can be guaranteed, which will not be elaborated here.

[0077] Step S102: Collect the trigger signal and count the delay time.

[0078] After the trigger signal is obtained, the trigger signal can be collected and the delay time can be counted. Specifically, the delay time can be counted by a timer. Figure 3 As shown, when a trigger signal is received, a timing operation can be performed through the timer. When the timing is the preset delay 1, a sub-trigger signal corresponding to delay 1 can be generated (that is, the first square wave signal in the figure), and the sub-trigger signal is used to generate a waveform corresponding to delay 1; similarly, when the timing is the preset delay 2, a sub-trigger signal corresponding to delay 2 can be generated (that is, the second square wave signal in the figure), and the sub-trigger signal is used to generate a waveform corresponding to delay 2; when the timing is the preset delay 3, a sub-trigger signal corresponding to delay 3 can be generated (that is, the third square wave signal in the figure), and the sub-trigger is used to generate a waveform corresponding to delay 3, thereby effectively achieving the stable reliability of the statistical delay time of the trigger signal.

[0079] Step S103: Based on the waveform generation instruction, determine the waveform identifier and waveform delay of the waveform.

[0080] Among them, the waveform identification and waveform delay of the waveform are pre-stored in the trigger control device (specifically, the waveform generator of the trigger control device). It can be understood that the waveform identification and waveform delay of multiple waveforms can be stored in one trigger control device. After the waveform generation instruction is obtained, since the waveform generation instruction includes the relevant information of the waveform to be generated, the waveform generation instruction can be analyzed and processed to determine the waveform identification and waveform delay of the waveform, wherein the waveform identification is used as the identity identification of the waveform, and different types of waveforms can correspond to different waveform identifications. For example, when the waveform is a square wave, the waveform identification can be "1"; when the waveform is a sine wave, the waveform identification can be "2"; when the waveform is a triangle wave, the waveform identification can be "3" and so on. The waveform delay is used to identify the delay information corresponding to the waveform generated after the trigger signal is obtained. The identity identification and delay information of the waveform can be a value pre-configured by the user or a default value.

[0081] It should be noted that the execution order between step S103 in this embodiment and the above-mentioned step S102 is not limited to the description order specified in the above-mentioned embodiment. For example, step S103 can be executed before step S102, or step S103 can be executed simultaneously with step S102. Those skilled in the art can adjust the execution order of the above-mentioned steps according to the specific application scenario or application requirements.

[0082] Step S104: when the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other.

[0083] Among them, a waveform generation condition for determining whether to generate a waveform is pre-configured, and the waveform generation condition may be pre-set rule information for generating a waveform. For example, the waveform generation condition may be: when the timing for statistically analyzing the trigger signal is the first delay time, the first waveform may be generated based on the sub-trigger signal corresponding to the first delay time; when the timing for statistically analyzing the trigger signal is the second delay time, the second waveform may be generated based on the sub-trigger signal corresponding to the second delay time; when the timing for statistically analyzing the trigger signal is the third delay time, the third waveform may be generated based on the sub-trigger signal corresponding to the third delay time, and so on. Specifically, after the delay time is obtained, the delay time may be analyzed and processed to determine whether the delay time satisfies the waveform generation condition. When the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay may be generated based on the waveform generation instruction, wherein the waveforms corresponding to different delay times are independent of each other, and the above-mentioned waveform independence may mean that the waveforms corresponding to different delay times are discontinuous and unrelated to each other.

[0084] For example, see Attachment Figure 4 As shown, when the timing of the statistics of the trigger signal meets the delay 1, the waveform 1 corresponding to the delay 1 can be generated based on the sub-trigger signal corresponding to the delay 1 (such as the first square wave signal in the figure); when the timing of the statistics of the trigger signal meets the delay 2, the waveform 2 corresponding to the delay 2 can be generated based on the sub-trigger signal corresponding to the delay 2 (such as the second square wave signal in the figure); when the timing of the statistics of the trigger signal meets the delay 3, the waveform 3 corresponding to the delay 3 can be generated based on the sub-trigger signal corresponding to the delay 3 (such as the third square wave signal in the figure), wherein the waveform 1, waveform 2 and waveform 3 are independent of each other, that is, the waveform 1, waveform 2 and waveform 3 are discontinuous and unrelated to each other. Specifically, the phase, amplitude and type corresponding to any two waveforms in the waveform 1, waveform 2 and waveform 3 may be the same or different.

[0085] The trigger control method provided in the present embodiment acquires a trigger signal and a waveform generation instruction, collects the trigger signal, and counts the delay time, and then determines the waveform identifier and waveform delay of the waveform based on the waveform generation instruction; when the delay time satisfies the waveform generation condition, a waveform corresponding to the delay time in the trigger signal can be generated, wherein the waveforms corresponding to different delay times are independent of each other, that is, the generated waveform only includes valid data related to the trigger signal, which not only effectively realizes the ability to accurately generate a waveform corresponding to the delay time in the trigger signal, but also reduces the occupancy rate of data processing resources when measuring and / or controlling superconducting quantum bits based on the waveform, and also improves the quality and efficiency of data processing, thereby further improving the practicability of the trigger control method.

[0086] Figure 5 A flow chart of another trigger control method provided by an embodiment of the present invention; based on the above embodiment, refer to the attached Figure 5 As shown, after generating a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction, the method in this embodiment may further include:

[0087] Step S501: Obtain waveform acquisition instructions.

[0088] Step S502: When the delay time satisfies the waveform acquisition condition, the waveform is acquired based on the waveform acquisition instruction.

[0089] Among them, a waveform acquisition condition for determining whether to perform a waveform acquisition operation is pre-configured. The waveform acquisition instruction refers to an instruction for performing an acquisition operation on the generated waveform. After the waveform is generated and the waveform acquisition instruction is obtained, it can be detected whether the delay time meets the waveform acquisition condition. When the delay time meets the waveform acquisition condition, the waveform can be acquired based on the waveform acquisition instruction; when the delay time does not meet the waveform acquisition condition, there is no need to acquire the waveform, thereby effectively realizing the acquisition operation on the generated waveform.

[0090] In some instances, after collecting the waveform based on the waveform collection instruction, the method in this embodiment may also include: determining parameters corresponding to the waveform based on the collected waveform, the parameters including at least one of the following: phase, frequency, amplitude, and superconducting quantum bit state.

[0091] Specifically, after the waveform is collected, a parameter corresponding to the waveform can be determined based on the collected waveform, and the parameter can include at least one of the following: phase, frequency, amplitude, and superconducting quantum bit state. In some examples, the phase, frequency, and amplitude corresponding to the waveform can be directly determined based on the collected waveform. In other examples, the superconducting quantum bit state corresponding to the waveform can be determined based on the collected waveform and the generated waveform.

[0092] In this embodiment, by obtaining the waveform acquisition instruction, when the delay time meets the waveform acquisition condition, the waveform can be acquired based on the waveform acquisition instruction, thereby effectively realizing a stable and effective acquisition operation on the generated waveform, and then the parameters corresponding to the waveform can be determined based on the acquired waveform, further improving the practicality of the method.

[0093] Figure 6 A flowchart of another trigger control method provided by an embodiment of the present invention; Figure 6 As shown, this embodiment provides another trigger control method, and the execution subject of the method can be a trigger control device. It can be understood that the trigger control device can be implemented as software, or a combination of software and hardware. Specifically, the trigger control method may include:

[0094] Step S601: Acquire a trigger signal and a waveform generation instruction.

[0095] Step S602: Collect the trigger signal and count the delay time.

[0096] Step S603: Based on the waveform generation instruction, determine the waveform identifier and waveform delay of the waveform.

[0097] Step S604: when the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other.

[0098] The specific implementation process and implementation effects of the above steps in this embodiment are similar to the specific implementation process and implementation effects of steps S101 to S104 in the above embodiment. Please refer to the above statements for details, and no further details will be given here.

[0099] Step S605: measuring and controlling the superconducting quantum bit based on the waveform.

[0100] Among them, after the waveform is generated, the generated waveform can be applied to the superconducting quantum bit to achieve control of the superconducting quantum bit. In addition, in the field of superconducting quantum, the coupling method between the resonant cavity and the quantum bit can be used to achieve the measurement of the quantum bit. Specifically, the microwave signal passing through the resonant cavity can carry the relevant information of the superconducting quantum bit. In order to measure the superconducting quantum bit, the generated signal can be collected, and then the waveform collected in the readout link and the generated waveform are analyzed and compared, so that the state of the superconducting quantum bit can be determined.

[0101] The trigger control method provided in this embodiment acquires the trigger signal and the waveform generation instruction, collects the trigger signal, and counts the delay time, and then determines the waveform identifier and the waveform delay of the waveform based on the waveform generation instruction. When the delay time meets the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction. Since the waveforms corresponding to different delay times are independent of each other, that is, the waveform only includes valid data related to the trigger signal, therefore, when measuring and controlling superconducting quantum bits based on the waveform, not only the occupancy rate of data processing resources will be reduced, but also the quality and efficiency of data processing will be improved, thereby further improving the practicality of the method.

[0102] Figure 7 A schematic diagram of a trigger measurement and control device provided in an embodiment of the present invention; Figure 7 As shown, this embodiment provides a trigger measurement and control device, which is used to perform the above Figure 1 The trigger control method shown in the figure, specifically, the trigger measurement and control device includes: a trigger 11 and at least one waveform generator 12 connected to the trigger 11, the trigger 11 is used to generate a trigger signal and a waveform generation instruction, and send the trigger signal and the waveform generation instruction to at least one waveform generator 12. The waveform generator 12 is used to obtain the trigger signal and the waveform generation instruction; collect the trigger signal and count the delay time; determine the waveform identifier and waveform delay of the waveform based on the waveform generation instruction; when the delay time meets the waveform generation condition, generate a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other.

[0103] Among them, the trigger 11 refers to a device for generating a trigger signal and a waveform generation instruction. Specifically, the trigger 11 can be provided with a setting interface for interacting with the user, so that the trigger 11 can generate a trigger signal and a waveform generation instruction; after generating the trigger signal and the waveform generation instruction, the trigger signal and the waveform generation instruction can be sent to at least one waveform generator 12, wherein the number of waveform generators 12 can be one or more, and in different application scenarios, the trigger measurement and control device can include different numbers of waveform generators 12.

[0104] In the process of sending the trigger signal and the waveform generation instruction to at least one waveform generator 12, in order to achieve concurrent operation with low phase noise, for at least one waveform generator 12, the trigger signal obtained by at least one waveform generator 12 comes from the same clock source, and the wiring length of the clock signal between the trigger 11 and any two waveform generators 12 is basically the same. For a trigger measurement and control device, if the structure of the trigger measurement and control device has been determined (that is, the number of waveform generators 12 included in the trigger measurement and control device is determined), then the trigger signals obtained by all waveform generators in the trigger measurement and control device are from the same clock source, and the wiring length of the clock signal between the trigger 11 and any two waveform generators 12 is basically the same.

[0105] It should be noted that the clock signal wiring length between the trigger 11 and any two waveform generators 12 being basically consistent may include any one of the following: the clock signal wiring length between the trigger 11 and any two waveform generators 12 being consistent, and the length deviation value between the clock signal wiring length between the trigger 11 and any two waveform generators 12 being less than or equal to a set threshold. It can be understood that in different application scenarios, the set threshold may correspond to a different value range. For example: when the length deviation value between the clock signal wiring length between the trigger 11 and any two waveform generators 12 is less than or equal to a few microns, it can be determined that the clock signal wiring length between the trigger 11 and any two waveform generators 12 is basically consistent; when the length deviation value between the clock signal wiring length between the trigger 11 and any two waveform generators 12 is greater than a few microns, it can be determined that the clock signal wiring length between the trigger 11 and any two waveform generators 12 is inconsistent.

[0106] In order to ensure that the trigger signal obtained by at least one waveform generator 12 comes from the same clock source and the wiring length of the clock signal between the trigger 11 and any two waveform generators 12 is substantially the same, the connection structure between the trigger 11 and at least one waveform generator 12 can be a star connection structure, such as Figure 7For a trigger measurement and control device, if the structure of the trigger measurement and control device is determined (that is, the number of waveform generators 12 included in the trigger measurement and control device is determined), then the connection structure between all waveform generators 12 and triggers 11 in the trigger measurement and control device is a star connection structure.

[0107] In addition, by setting the waveform generator 12 and the trigger 11 as a star connection structure, the convenience of expanding the trigger control device is effectively improved, that is, the user can arbitrarily add devices connected to the trigger 11 based on design requirements or scenario requirements, such as: waveform generator 12, waveform collector 13 and other devices that can be connected to the trigger 11, etc., which effectively improves the flexibility and reliability of the use of the trigger measurement and control system, which is conducive to meeting the corresponding measurement and control needs of different users.

[0108] The trigger measurement and control device provided in this embodiment generates a trigger signal and a waveform generation instruction through a trigger, and sends the trigger signal and the waveform generation instruction to at least one waveform generator. After the waveform generator obtains the trigger signal and the waveform generation instruction, the trigger signal can be collected and the delay time can be counted; and the waveform identifier and the waveform delay of the waveform are determined based on the waveform generation instruction; when the delay time meets the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, wherein the waveforms corresponding to different delay times are independent of each other, that is, the waveform only includes valid data related to the trigger signal. Therefore, when measuring and controlling superconducting quantum bits based on the waveform, not only the occupancy rate of data processing resources will be reduced, but also the quality and efficiency of data processing will be improved, further improving the practicality of the trigger measurement and control device.

[0109] Figure 8 A schematic diagram of another trigger measurement and control device provided in an embodiment of the present invention; Figure 8 As shown, in order to improve the practicality of the trigger measurement and control device, the device in this embodiment may also include: a waveform collector 13 connected to the trigger 11, the number of the waveform collector 13 may be one or more, the number of the waveform collector 13 is the same as or different from the number of the waveform generator 12, specifically, when a waveform collection operation is required for the waveform generated by each waveform generator 11, the number of the waveform generator 12 may be the same as the number of the waveform collector 13. When a waveform collection operation is only required for the waveforms generated by a part of the number of waveform generators 11, the number of the waveform generators 12 may be greater than the number of the waveform collectors 13. It should be noted that for the trigger measurement and control device, the trigger 11 and the waveform generator 12 and the waveform collector 13 are also in a star connection structure.

[0110] Specifically, after the waveform collector 13 is connected to the trigger 11, the waveform collector 13 can be used to obtain the trigger signal and the waveform collection instruction, collect the trigger signal, and count the delay time; when the delay time meets the waveform collection condition, the waveform is collected based on the waveform collection instruction.

[0111] Among them, the specific implementation process and implementation effect of the waveform collector 13 in this embodiment collecting the generated waveform based on the trigger signal and the waveform acquisition instruction are similar to the specific implementation process and implementation effect of collecting the generated waveform based on the trigger signal and the waveform acquisition instruction in the above embodiment. Please refer to the above statements for details, and no further details will be given here.

[0112] In some instances, the waveform collector 13 in this embodiment is also used to determine parameters corresponding to the waveform based on the collected waveform after collecting the waveform based on the waveform collection instruction, and the parameters include at least one of the following: phase, frequency, amplitude, and superconducting quantum bit state.

[0113] Specifically, the specific implementation process and implementation effect of determining the parameters corresponding to the waveform based on the collected waveform in this embodiment are similar to the specific implementation process and implementation effect of determining the parameters corresponding to the waveform based on the collected waveform in the above-mentioned embodiment. Please refer to the above-mentioned statements for details, and no further details will be given here.

[0114] In some instances, in order to improve the flexibility and reliability of the use of the trigger measurement and control device, the above-mentioned trigger measurement and control device is arranged on a PXI Express (PXIe) chassis. Specifically, PCI extensions for instrumentation (PXI for short) is a sturdy PCI-based measurement and automation platform released by the PXI Alliance. When the trigger measurement and control system is set on the PXIe chassis, the trigger of the trigger measurement and control device can be provided with a setting interface for connecting to triggers on other PXIe chassis, thereby effectively realizing the expansion connection operation between different PXIe chassis.

[0115] For example, there are three PXIe chassis, each of which is provided with a trigger measurement and control device. The trigger measurement and control devices provided on different PXIe chassis can be the same or different. The three PXIe chassis can be connected to each other through the triggers provided on the PXIe chassis, and the three PXIe chassis can be a star connection structure. Fig. 9As shown, when three PXIe chassis are interconnected, one of the PXIe chassis can be used as the master PXIe chassis, and the other PXIe chassis can be used as slave PXIe chassis (including slave PXIe chassis 1 and slave PXIe chassis 2). The master PXIe chassis can communicate with triggers on other slave PXIe chassis through triggers set on the master PXIe chassis, thereby effectively realizing the expansion connection of the trigger measurement and control device on the PXIe platform.

[0116] For specific application example 1, please refer to the attached Fig.10 As shown, this application embodiment provides a scalable, low phase noise RF signal measurement and control system implemented on a PXIe platform. The RF signal measurement and control system may include: an arbitrary waveform generation module 22 (the number may be one or more), a waveform acquisition module 23 (the number may be one or more) and a clock trigger module 21. The clock trigger module 21 and the arbitrary waveform generation module 22 and the waveform acquisition module 23 may be in a star connection structure, such as Fig.11 As shown, the clock trigger module 21 can be used as a master node, the arbitrary waveform generation module 22 and the waveform acquisition module 23 can be used as slave nodes, and a star connection structure is formed between a master node and multiple slave nodes, so that multiple slave nodes can obtain the clock signal sent by the master node in the same clock domain.

[0117] In addition, the above-mentioned RF signal measurement and control system can be set on a single PXIe chassis. Specifically, the PXIe chassis is provided with a clock slot for installing the clock trigger module 21, and three sets of star differential lines (DstarA, DstarB and DstarC) are provided on the back panel of the PXIe chassis. When the clock trigger module 21 is inserted into the clock slot, the clock signal sent by the clock trigger module 21 can be distributed using the differential star line DstarA; specifically, after the clock trigger module 21 as the master node receives the start signal, the start signal can be distributed in the form of a pulse signal to other modules (arbitrary waveform generation module 22, waveform acquisition module 23, etc.) in the PXIe chassis as slave nodes through the differential star line DstarB on the back panel of the PXIe chassis. In this way, the trigger signal is transmitted directly by electrical connection instead of by the communication protocol, and the control of the slave nodes in the RF signal measurement and control system can achieve very high time accuracy. In addition, since the master node and slave node adopt a star connection structure, users can add and / or delete slave nodes according to design requirements and usage requirements, thereby facilitating the expansion of the measurement and control channels of the RF signal measurement and control system for a single PXIe chassis, which is conducive to increasing the scope of application of the measurement and control system.

[0118] Taking the clock trigger module 21 that can generate a 10MHz trigger signal as an example, in order to enable the arbitrary waveform generation module 22 and the waveform acquisition module 23 connected to the clock trigger module 21 to work in the same clock domain, the fan-out module 24 can be used to fan out the 10MHz trigger signal into multiple transmission signals of set frequencies. For example: the 10MHz trigger signal can be fanned out into two 50MHz transmission signals through the fan-out module 24, and then the 50MHz transmission signal is sent to the waveform acquisition module 23 and the arbitrary waveform generation module 22.

[0119] Among them, the arbitrary waveform generation module 22 may include a phase-locked loop unit (PLL), an FPGA unit, and a waveform generation chip. After the arbitrary waveform generation module 22 obtains a 50MHz transmission signal, the 50MHz transmission signal can be de-jittered by the phase-locked loop unit, and the transmission signal can be multiplied to the frequency required by the FPGA and the waveform generation chip and other chips. For example, when the FPGA unit needs to use a 250MHz signal, the phase-locked loop unit can multiply the received 50MHz transmission signal to a 250MHz signal; when the waveform generation chip needs to use 2GHz, the phase-locked loop unit can multiply the received 50MHz transmission signal to a 2GHz signal. In this way, the arbitrary waveform generation module 22 can generate a preset waveform, thereby ensuring that all modules in the radio frequency signal measurement and control system work in the same clock domain.

[0120] Similarly, the waveform acquisition module 23 may include a phase-locked loop unit, an FPGA unit, and an analog-to-digital conversion unit. After the waveform acquisition module 23 obtains the 50MHz transmission signal, the phase-locked loop unit can eliminate jitter of the 50MHz transmission signal, and can also multiply the transmission signal to the frequency required by other chips such as the FPGA and the analog-to-digital converter. For example, when the FPGA unit needs to use a 125MHz signal, the phase-locked loop unit can multiply the received 50MHz transmission signal to a 125MHz signal; when the analog-to-digital converter needs to use 1GHz, the phase-locked loop unit can multiply the received 50MHz transmission signal to a 1GHz signal. In this way, the waveform acquisition module 23 can realize the waveform acquisition operation, thereby ensuring that all modules in the RF signal measurement and control system operate in the same clock domain.

[0121] Before sending the start command to the clock trigger module 21, the operation instructions that need to be executed by each module connected to the clock trigger module 21 are transmitted to each module in advance through the PXIe interface on the chassis. The operation instructions include operation type, delay time, number of operations, etc. The operation type is used to identify the action that each module needs to perform, and the delay time and number of operations are used as the execution conditions of the action that each module needs to perform. For example, Fig.12 As shown, after acquiring the clock signal, the clock trigger module 21 can send a trigger signal to each module connected to the clock trigger module 21. When each module includes the above-mentioned arbitrary waveform generation module 22 and waveform acquisition module 23, the arbitrary waveform generation module 22 and the waveform acquisition module 23 can perform corresponding operations according to the pre-configured operation instructions after receiving the trigger signal. Specifically, after receiving the trigger signal, the arbitrary waveform generation module 22 starts to count the delay time. When the delay time 1 meets the waveform generation condition, the arbitrary waveform generation module 22 can generate a waveform pre-downloaded into the module. After receiving the trigger signal, the waveform acquisition module 23 starts to count the delay time. When the delay time 2 meets the waveform acquisition condition, the waveform acquisition module 23 can perform an acquisition operation on the waveform. It can be understood that all of the above operations will be performed concurrently in each module, thereby realizing low phase noise concurrent operation of multiple modules.

[0122] In other instances, when increasing the number of measurement and control channels in a PXIe chassis cannot meet the signal processing requirements, one of the PXIe chassis can be used as the main chassis, and the clock trigger modules 21 located on the clock slots of the remaining PXIe chassis are connected to the clock trigger module 21 located in the clock slot of the main PXIe chassis via cables on the front panel. In this way, the clock trigger module 21 of the main PXIe chassis distributes the system clock and trigger signals to the slave PXIe chassis through these cables, and then distributes them to the various modules of other chassis.

[0123] Furthermore, before the clock trigger module 21 of the master PXIe chassis distributes the system clock and trigger signals through the backplane, the phases of these signals can be adjusted. Since the delayed phase depends on the cable length between the master and slave chassis, the cable length between the master chassis and any two slave chassis can be kept basically consistent. In this way, all modules in different chassis can receive the clock and trigger at the same time, effectively expanding the RF signal measurement and control system to hundreds of channels through the connection between the master and slave chassis.

[0124] The RF signal measurement and control system provided in this application embodiment configures each module on the PXIe chassis into a star connection structure, and then distributes the clock and trigger signals of the system based on the differential bus of the backplane, and then uses instructions such as operation type, delay parameter, and number of operations to achieve concurrent operation with low phase noise of each module; in addition, by configuring the clock trigger modules of multiple chassis to achieve a point-to-point master-slave connection structure, the number of chassis can be effectively expanded, which not only expands the total number of channels to hundreds of channels, but also achieves large-scale concurrent operation with low phase noise. In addition, in terms of scalability and phase noise, it is highly competitive compared with other systems and has a good development prospect in the RF measurement and control system.

[0125] Specific application example 2: This application embodiment provides a scalable, low-phase-noise superconducting quantum computing room-temperature measurement and control system implemented on a PXIe platform. The superconducting quantum computing room-temperature measurement and control system can not only achieve low phase noise, with a jitter of approximately 3.6ps, but also has scalability and can meet the room-temperature measurement and control needs of large-scale superconducting quantum bits.

[0126] Specifically, the room temperature measurement and control system may include: an arbitrary waveform generation module 22 (one or more), a waveform acquisition module 23 (one or more) and a clock trigger module 21. The clock trigger module 21, the arbitrary waveform generation module 22 and the waveform acquisition module 23 may form a star connection structure, such as Fig.11 As shown, the clock trigger module 21 can be used as a master node, the arbitrary waveform generation module 22 and the waveform acquisition module 23 can be used as slave nodes, and multiple slave nodes can obtain the clock signal sent by the master node in the same clock domain.

[0127] In order to achieve a relatively low phase noise index, it is necessary to strictly design the clock scheme, eliminate the multi-phase problem that often occurs in the clock scheme, and minimize jitter. Specifically, the structure of the room temperature measurement and control system is as follows Fig.10As shown, the room temperature measurement and control system corresponds to a 10MHz clock input, which is used as the clock source of the entire system. First, the 10MHz clock is multiplied to 50MHz through the fan-out module 24 (the specific multiplication value is not limited to the above-mentioned numerical range, for example, 100MHz, 25MHz, etc., and the specific value is related to the model of the arbitrary waveform generation module 22 and the waveform acquisition module 23), and then the multiplied signal is transmitted to each daughter card (arbitrary waveform generation module 22 and waveform acquisition module 23) as the clock source on the daughter card. On each daughter card, the phase-locked loop chip is used to multiply the frequency to 125MHz, 250MHz, 1GHz, and 2GHz, etc. according to the clock requirements, so that all clocks are guaranteed to come from the only clock input 10MHz; and because each daughter card in the room temperature measurement and control system adopts a star connection structure, the 50MHz clock source wiring length on each daughter card is basically the same.

[0128] In addition, in order to achieve accurate synchronization of the operations of each daughter card, in addition to the clock, the trigger operation of the room temperature measurement and control system also needs to be accurately designed, such as Fig.13 As shown, after the clock trigger module obtains the clock signal, a trigger signal can be sent to each module connected to the clock trigger module. For example, the XY axis trigger module can collect the trigger signal and count the delay time; when the delay time meets the set waveform generation condition, the XY axis waveform generation module can generate a waveform corresponding to the delay time. For example: when the delay time is delay 1, a waveform 1 corresponding to delay 1 can be generated; when the delay time is delay 2, a waveform 2 corresponding to delay 2 can be generated; when the delay time is delay 3, a waveform 3 corresponding to delay 3 can be generated, and the waveforms corresponding to different delay times are independent of each other. Similarly, when the signal readout module obtains the trigger signal, the delay time can be counted, and when the delay time meets the waveform acquisition condition, the signal readout module can perform a waveform acquisition operation. It can be understood that all of the above operations will be performed concurrently in each module, thereby realizing low phase noise concurrent operation of multiple modules.

[0129] By adopting a star connection structure to distribute trigger signals, the time when each board receives the trigger signal is similar. The sub-board uses the same source clock to collect trigger signals. When a high level is collected, it means that the start command has been received. Then the counting starts. When the count reaches the delay parameter set in advance, the corresponding sub-trigger signal is generated. The sub-trigger signal can make the waveform generation module generate a waveform, or make the signal reading module start to collect waveforms. Specifically, the specific implementation method and implementation effect of this application implementation 2 are similar to the specific implementation method and implementation effect of the above-mentioned application example 1. For details, please refer to the above-mentioned statements, which will not be repeated here.

[0130] The room temperature measurement and control system for superconducting quantum computing provided by the present application embodiment adopts a star connection structure instead of a daisy chain connection structure for the distribution of clocks and triggers in the room temperature measurement and control system, so that the lengths of each link are basically the same, which greatly reduces the difference in skew. Under the premise of ensuring that the clock signals of the waveform acquisition module and the arbitrary waveform generation module come from the same clock source, a good synchronization effect of about 3.6ps can be achieved, thereby realizing concurrent quantum operations with low phase noise. In addition, compared with the existing room temperature measurement and control system, the waveforms corresponding to the delay information generated by the waveform generation module are independent of each other, that is, the waveform includes valid data, which reduces the data resources required for waveform transmission, improves the quality and efficiency of data processing, and makes signal control more efficient. When the trigger signal changes, only the relevant parameters need to be changed, and then the corresponding waveform is generated directly with the changed trigger signal, and then the updated waveform is spliced ​​with the historical waveform without the need to regenerate a complete waveform. In addition, in terms of expansion needs, if you need to process less than 10 superconducting quantum bits, only one PXIe chassis is needed to realize the measurement and control operation of superconducting quantum bits. At this time, you can add multiple waveform acquisition modules and arbitrary waveform generation modules in the PXIe chassis without additional connections. When you need to process more than 10 superconducting quantum bits, you can connect each PXIe chassis through the high-density connector of the clock trigger board, that is, realize multi-chassis connection, effectively realize the expansion of the number of chassis, and meet the room temperature measurement and control needs of hundreds of quantum bits. It realizes large-scale low-phase noise quantum concurrent operations, effectively increases market competitiveness, and has a good development prospect in superconducting quantum computing measurement and control systems.

[0131] Fig.14 A structural diagram of another trigger control device provided in an embodiment of the present invention; Fig.14 As shown, this embodiment provides a trigger control device, which can execute the above Figure 1 The trigger control method shown in the figure, the trigger control device may include: a first acquisition module 1401, a first statistics module 1402, a first determination module 1403 and a first control module 1404, specifically,

[0132] The first acquisition module 1401 is used to acquire a trigger signal and a waveform generation instruction;

[0133] The first statistical module 1402 is used to collect the trigger signal and count the delay time;

[0134] A first determining module 1403, configured to determine a waveform identifier and a waveform delay of a waveform based on a waveform generation instruction;

[0135] The first control module 1404 is used to generate a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction when the delay time meets the waveform generation condition, and the waveforms corresponding to different delay times are independent of each other.

[0136] In some examples, the waveform includes any one of the following: a radio frequency signal, a microwave signal.

[0137] In some examples, waveforms are used to measure and control superconducting qubits.

[0138] In some examples, after generating a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction, the first acquisition module 1401 and the first control module 1404 in this embodiment are used to perform the following steps:

[0139] The first acquisition module 1401 is used to acquire a waveform acquisition instruction;

[0140] The first control module 1404 is used to collect the waveform based on the waveform collection instruction when the delay time meets the waveform collection condition.

[0141] In some instances, after the waveform is collected based on the waveform collection instruction, the first control module 1404 in this embodiment is used to perform the following steps: based on the collected waveform, determine the parameters corresponding to the waveform, the parameters including at least one of the following: phase, frequency, amplitude, superconducting quantum bit state.

[0142] Fig.14 The device shown can perform Figure 1-Figure 5 For the method of the embodiment shown in the figure, the part not described in detail in this embodiment can be referred to Figure 1-Figure 5 The implementation process and technical effects of this technical solution refer to Figure 1-Figure 5 The description in the illustrated embodiment will not be repeated here.

[0143] In one possible design, Fig.14 The structure of the trigger control device shown can be implemented as an electronic device, which can be a mobile phone, a tablet computer, a server, or other devices. Fig.15 As shown, the electronic device may include: a first processor 1501 and a first memory 1502. The first memory 1502 is used to store the corresponding electronic device to execute the above Figure 1-Figure 5 In the illustrated embodiment, the program of the trigger control method is such that the first processor 1501 is configured to execute the program stored in the first memory 1502 .

[0144] The program includes one or more computer instructions, wherein when the one or more computer instructions are executed by the first processor 1501, the following steps can be implemented:

[0145] Get trigger signals and waveform generation instructions;

[0146] Collect the trigger signal and count the delay time;

[0147] Based on the waveform generation instruction, determine the waveform identifier and waveform delay of the waveform;

[0148] When the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other.

[0149] Furthermore, the first processor 1501 is also used to execute the aforementioned Figure 1-Figure 5 All or part of the steps in the illustrated embodiments.

[0150] The structure of the electronic device may further include a first communication interface 1503 for the electronic device to communicate with other devices or a communication network.

[0151] In addition, an embodiment of the present invention provides a computer storage medium for storing computer software instructions used by electronic devices, which includes instructions for executing the above Figure 1-Figure 5 The procedures involved in triggering the control method in the method embodiment shown.

[0152] Fig.16 A structural diagram of another trigger control device provided by an embodiment of the present invention; Fig.16 As shown, this embodiment provides another trigger control device, which can execute the above Figure 6 The trigger control method shown in the figure, the generating device may include: a second acquisition module 1601, a second statistics module 1602, and a second determination module 1603; specifically,

[0153] The second acquisition module 1601 is used to acquire a trigger signal and a waveform generation instruction.

[0154] The second statistical module 1602 is used to collect the trigger signal and count the delay time.

[0155] The second determination module 1603 is used to determine the waveform identifier and waveform delay of the waveform based on the waveform generation instruction.

[0156] The second control module 1604 is used to generate a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction when the delay time meets the waveform generation condition, and the waveforms corresponding to different delay times are independent of each other.

[0157] The second processing module 1605 is used to measure and control the superconducting quantum bit based on the waveform.

[0158] Fig.16 The device shown can perform Figure 6 For the method of the embodiment shown in the figure, the part not described in detail in this embodiment can be referred to Figure 6 The implementation process and technical effects of this technical solution refer to Figure 6 The description in the illustrated embodiment will not be repeated here.

[0159] In one possible design, Fig.16 The structure of the trigger control device shown can be implemented as an electronic device, which can be a mobile phone, a tablet computer, a server, or other devices. Fig.17 As shown, the electronic device may include: a second processor 1701 and a second memory 1702. The second memory 1702 is used to store the corresponding electronic device executing the above Figure 6 The program of the trigger control method provided in the illustrated embodiment, the second processor 1701 is configured to execute the program stored in the second memory 1702 .

[0160] The program includes one or more computer instructions, wherein when the one or more computer instructions are executed by the second processor 1701, the following steps can be implemented:

[0161] Get trigger signals and waveform generation instructions;

[0162] Collect the trigger signal and count the delay time;

[0163] Based on the waveform generation instruction, determine the waveform identifier and waveform delay of the waveform;

[0164] When the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other;

[0165] Waveform-based measurement and control of superconducting qubits.

[0166] Furthermore, the second processor 1701 is also used to execute the aforementioned Figure 6 All or part of the steps in the illustrated embodiments.

[0167] The structure of the electronic device may further include a second communication interface 1703, which is used for the electronic device to communicate with other devices or a communication network.

[0168] In addition, an embodiment of the present invention provides a computer storage medium for storing computer software instructions used by electronic devices, which includes instructions for executing the above Figure 6 The procedures involved in triggering the control method in the method embodiment shown.

[0169] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0170] Through the description of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by adding a necessary general hardware platform, and of course can also be implemented by combining hardware and software. Based on such an understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a computer product, and the present invention can be in the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes.

[0171] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable device to produce a machine, so that the instructions executed by the processor of the computer or other programmable device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0172] These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable device to work in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture including an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0173] These computer program instructions may also be loaded onto a computer or other programmable device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for executing on the computer or other programmable device to implement the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0174] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0175] The memory may include non-permanent storage in a computer-readable medium, random access memory (RAM) and / or non-volatile memory in the form of read-only memory (ROM) or flash RAM. The memory is an example of a computer-readable medium.

[0176] Computer readable media include permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. Information can be computer readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer readable media does not include temporary computer readable media (transitory media), such as modulated data signals and carrier waves.

[0177] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A trigger control method, characterized in that: include: Get trigger signals and waveform generation instructions; The trigger signal is collected and the delay time is counted, wherein the trigger signal includes a plurality of sub-trigger signals, and different sub-trigger signals correspond to different delay times; Based on the waveform generation instruction, determining a waveform identifier and a waveform delay of the waveform; When the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and waveforms corresponding to different delay times are independent of each other.

2. The method according to claim 1, characterized in that The waveform includes any one of the following: a radio frequency signal, a microwave signal.

3. The method according to claim 1, characterized in that After generating a waveform corresponding to the waveform identifier and the waveform delay based on the waveform generation instruction, the method further includes: Get waveform acquisition instructions; When the delay time satisfies the waveform acquisition condition, the waveform is acquired based on the waveform acquisition instruction.

4. The method according to claim 3, characterized in that After collecting the waveform based on the waveform collection instruction, the method further includes: Based on the acquired waveform, a parameter corresponding to the waveform is determined, wherein the parameter includes at least one of the following: phase, frequency, amplitude, and superconducting quantum bit state.

5. A trigger control method, characterized in that: include: Get trigger signals and waveform generation instructions; The trigger signal is collected and the delay time is counted, wherein the trigger signal includes a plurality of sub-trigger signals, and different sub-trigger signals correspond to different delay times; Based on the waveform generation instruction, determining a waveform identifier and a waveform delay of the waveform; When the delay time satisfies the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other; The superconducting quantum bit is measured and controlled based on the waveform.

6. A trigger measurement and control device, characterized in that: include: A trigger, for generating a trigger signal and a waveform generation instruction, and sending the trigger signal and the waveform generation instruction to at least one waveform generator; A waveform generator, connected to the trigger, for acquiring the trigger signal and the waveform generation instruction; collecting the trigger signal and counting the delay time, wherein the trigger signal includes a plurality of sub-trigger signals, and different sub-trigger signals correspond to different delay times; Based on the waveform generation instruction, the waveform identifier and waveform delay of the waveform are determined; when the delay time meets the waveform generation condition, a waveform corresponding to the waveform identifier and the waveform delay is generated based on the waveform generation instruction, and the waveforms corresponding to different delay times are independent of each other.

7. The device according to claim 6, characterized in that The trigger signal acquired by at least one waveform generator comes from the same clock source, and the wiring length of the clock signal between the trigger and any two waveform generators is substantially consistent.

8. The device according to claim 7, characterized in that The trigger and the at least one waveform generator are in a star connection structure.

9. The device according to claim 6, characterized in that The device also includes: A waveform collector is connected to the trigger, and is used to obtain the trigger signal and the waveform collection instruction, collect the trigger signal, and count the delay time; when the delay time meets the waveform collection condition, the waveform is collected based on the waveform collection instruction.

10. The device according to claim 9, characterized in that The waveform collector is also used to determine parameters corresponding to the waveform based on the collected waveform after collecting the waveform based on the waveform collection instruction, and the parameters include at least one of the following: phase, frequency, amplitude, and superconducting quantum bit state.

11. The device according to any one of claims 6 to 10, characterized in that: The trigger measurement and control device is arranged on the PXIe chassis, and the trigger is provided with a setting interface for connecting with triggers on other PXIe chassis.

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