A motor power line conduction test device
By using fixed disk, test disk assembly and L-shaped test piece structure in the motor power line conduction test device, the error detection problem caused by the inclination or deformation of the terminal in traditional test equipment is solved, and efficient and accurate conduction test is achieved. Improved production efficiency.
Patent Information
- Application Number
- CN202210230189.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-03-10
- Publication Date
- 2024-12-31
- Estimated Expiration
- 2042-03-10
AI Technical Summary
During the inspection process, traditional motor power line conduction testing equipment is prone to false detection due to the tilt or deformation of the terminals, which increases the testing time and labor cost and reduces production efficiency.
A motor power supply line conduction testing device including a fixed disk and a test disk assembly is designed. By providing a first slot and a second slot on the fixed disk and embeding a metal test piece in the second slot, the connection terminals and tests are ensured. The contact of the sheet adopts an L-shaped test piece and insert structure to ensure that the terminal can still contact the test piece under deformation, and combines the uniform down pressure mechanism of the pressure gland to avoid mis-testing.
It realizes fast and accurate conduction testing, reduces operational difficulty and repetitive labor, improves testing efficiency, reduces false inspection and repair costs, and improves production efficiency.
Smart Images
Figure CN114740404B_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of electronic wire harness production test equipment, and in particular to a motor power line conduction test device. Background Art
[0002] In order to meet the needs of modular design and manufacturing, some motors on the market use the power cord part to be made into a coil group structure independently, so that it is manufactured separately from the stator coil winding, and then assembled and connected in subsequent production. The shape of the power cord of this type of motor is generally designed to match the ring shape of the stator. During production, the two or three strands of the power cord are wound into a ring shape, and then the lead wires of each strand are led out from the same position and bundled into a bundle (such as Figure 3 Each of the power lines corresponds to several groups of coils paired with it in the coil windings, and several connecting terminals are arranged on any of the power lines, which are connected to the corresponding coil windings during assembly through the connecting terminals, and each connecting terminal in the same power line is connected to the corresponding coil winding. Figure 3 The structure of a motor coil group is shown, which is composed of several strands of wires 1' of different colors wound into a circular ring structure, and then a lead wire 2' is led out from one end. A plurality of evenly arranged connecting terminals 3' are arranged around the circular ring at intervals, and each strand of colored wire is connected to some of the connecting terminals 3'. When the motor is assembled, these connecting terminals 3' will be connected to the corresponding coil windings in the stator winding.
[0003] After the manufacture of this type of power cord is completed, a continuity test needs to be performed in advance to detect whether the terminal installation is normal and to ensure that each terminal can achieve conductivity between the power cord and the coil winding after the motor is assembled. Traditional testing methods include manual testing or semi-automatic testing with test fixtures. During manual testing, a multimeter is used to connect the lead with one of the two test pens, and the other test pen contacts each terminal of the strand in turn to test the conductivity. This type of testing process is not only restricted by the operator's proficiency in holding the pen, but may also waste a lot of time due to failure to find the correct pairing of the leads and terminals, seriously affecting test efficiency. Semi-automatic testing is completed through test fixtures. Common test fixtures include Figure 4As shown, it is a structural setting for testing the conduction of the connection terminals of the power line coil group, including a disc-shaped fixing seat 20' for fixing the power line 10', fixing the fixing seat 20' on the base, and setting a plurality of test points 40' on the base table around the fixing seat, each test point corresponds to the terminal position on the power line, and the test point can be connected to the low potential point through a light-emitting indication unit (such as a light-emitting diode, which is not shown in the figure), and the bundle connection end 50' of the power line is connected to the high potential. During the test, the bundle connection end 50' of the power line is first connected to the high potential, and then the ring-shaped power line 10' is inserted into the fixing seat 20', and each terminal is pressed down to contact the corresponding test point 40'. If it is conductive, the corresponding light-emitting indication unit is lit, otherwise it is in an off state.
[0004] However, the traditional test fixture was found to have the following problems during the test operation: some terminals of the prepared power cord were slightly tilted, and during the test, the tilted terminals could not make good contact with the corresponding test points, so they were often mistakenly detected as non-conducting. At this time, although the downward force can be increased to make it contact with the test point, it is also easy to cause other terminals to be over-pressed and deformed, such as Figure 4 In the structure shown, the coil 10' is inserted into the fixing seat 20', and the test points 40' are set around the fixing seat 20'. At this time, the terminal 301' on the left side is slightly lower than the terminal 302' on the right side. Therefore, when the terminal 302' on the right side just contacts the corresponding test point 40', the terminal 301' on the left side is deformed by the downward pressure and deviates to the left side for a certain distance and cannot contact and conduct with the corresponding test point normally. In addition, in some cases, due to the accuracy problem during installation, the skew angle of the connecting terminal will also deflect to avoid the test point. At this time, even if it is not affected by the downward pressure, it still cannot contact the test point smoothly. Although this kind of situation can be tested by secondary inspection or by adding a repair process (artificially reshaping the deformed terminal vertically), such operation not only increases the test process, but also increases the labor cost corresponding to the repair or re-inspection, prolongs the operation time, and slows down the overall production and operation efficiency. Summary of the invention
[0005] The purpose of the present invention is to provide a motor power line continuity test device to solve the above technical problems.
[0006] The technical problem solved by the present invention can be achieved by adopting the following technical solutions:
[0007] A motor power line conduction test device, comprising a device body, the device body comprising a fixed disk and a power supply, the fixed disk is used to fix the coil group to be tested, the power supply provides power supply for the test, wherein the device body comprises a test disk assembly, the test disk assembly comprises a disk upper part, the upper surface of the disk upper part is recessed downward to form a first disc-shaped depression, the fixed disk is located at the center of the first depression, the inner wall of the first depression (the inner wall here refers to the side wall of the first depression, which is vertical) and the outer wall of the fixed disk (the outer wall can generally be set to be vertical, or to facilitate the coil group to be clipped thereon, the outer wall can be set to be inclined to a certain extent, so that the outer wall is an inclined curved surface, under this structural setting, when the fixed disk is observed from the whole, it is a truncated cone structure with a small top surface and a large bottom surface) to form a first groove, and when the coil group to be tested is fixed to the fixed disk, it is embedded in the first groove;
[0008] At least two second grooves are arranged on the inner wall of the first recess at intervals, and at least two second grooves are evenly arranged around the first groove. Any of the second grooves is a recessed structure that is perpendicular to the inner wall of the first recess, and a metal test piece is arranged in any of the second grooves. Any of the test pieces is connected to the low potential of the power supply, and the number of the low potential terminals on the power supply is not less than the number of the test pieces on the upper part of the disk, and any of the test pieces is connected to the low potential of the power supply through an indication unit so as to indicate the conduction state during the test.
[0009] During the test process, after the coil group to be tested is embedded in the first slot, the connecting terminal on it is also embedded in the corresponding second slot and contacts the test piece inside it. At this time, after connecting the coil lead corresponding to the connecting terminal to the high potential of the power supply, turning on the power supply can determine whether the connecting terminal is set normally.
[0010] The present invention realizes the effect of quickly detecting the setting status of the connection terminals of the coil group by arranging the test disk assembly and the fixing disk. The operation is convenient and efficient, the test result feedback is intuitive, and the connection terminals with problems can be quickly located for timely repair.
[0011] The test piece has a vertical direct contact end and a horizontal contact end, which are connected to each other. The horizontal contact end is arranged to fit the bottom surface of the second groove, and the vertical direct contact end is arranged to fit the side wall of the second groove, thereby ensuring that the connecting terminal of the coil group is in contact with the test piece when the connecting terminal is embedded in the second groove.
[0012] The present invention arranges the test piece into an L-shaped structure by arranging a connection structure with a vertical direct contact end and a horizontal contact end. After the test piece is embedded in the second groove, it fits into the groove bottom and side wall of the second groove. When the connecting terminal is embedded in the second groove, even if the connecting terminal is deformed when the coil assembly is pressed down and inserted into the fixed disk, its deformation is limited by the second groove, so that it can always contact the test piece, avoiding the problem of failure to normally contact the test point due to deformation of the connecting terminal or skewness when setting in the traditional semi-automatic testing process.
[0013] The test disc assembly comprises a disc lower portion, the disc lower portion is connected upwardly to the disc upper portion,
[0014] The lower part of the plate is provided with at least two metal inserts, the number of which is not less than the number of the test pieces.
[0015] Any of the test pieces has an embedded piece corresponding to it on the lower part of the disk, and when the lower part of the disk is connected to the upper part of the disk, any of the test pieces on the upper part of the disk contacts with the embedded piece corresponding to it;
[0016] Any of the inserts is connected to the low potential of the power supply through an independent wire. When connected, the independent wire connected to the insert is connected to one of the low potential terminals of the power supply.
[0017] The test piece has an inlay contact end, the inlay contact end extends vertically downward and then passes through the lower surface of the upper part of the disk, and when the upper part of the disk is downwardly connected to the lower part of the disk, the inlay contact end contacts the inlay downward;
[0018] The insert has a vertical portion and a curved portion, which are connected. The inflection point of the curved portion bends toward one side of the vertical portion and contacts the vertical portion, so that an upward forked structure is formed on the top of the insert. When the test piece contacts the insert, the contact end of the insert contacts the forked structure of the insert. The setting of the forked structure makes the connection between the test piece and the insert smoother, and the inclined part of the forked structure can also provide a guiding effect when the contact end of the insert moves downward.
[0019] The test pieces in any of the second slots on the upper part of the disk are connected to a high potential bus, and the lead-out line of the high potential bus is connected to the high potential of the power supply, so as to realize the function of self-checking the test points formed by the contact between the test piece and the corresponding embedded piece after the upper part of the disk and the lower part of the disk are connected and before the test is carried out.
[0020] The upper part of the disk is provided with a positioning post, and the lower part of the disk is provided with a positioning hole corresponding to the positioning post. When the upper part of the disk is connected to the lower part of the disk, the positioning post is plugged into the positioning hole, thereby improving the positioning accuracy when the upper part of the disk and the lower part of the disk are connected, ensuring good contact between the test piece and the embedding piece.
[0021] The upper part of the disk is provided with a lead-out clamping hole for clamping the lead-out wire of the coil group to be tested. When the lead-out clamping hole is provided, it is a concave structure located on the upper surface of the upper part of the disk and concave downwards, and the concave structure also passes through the first groove and the outer wall of the upper part of the disk. When the coil group to be tested is sleeved on the fixed disk and clamped into the first groove, the lead-out wire of the coil group is clamped into the lead-out clamping hole, so as to prevent the lead-out wire of the coil group from being deformed and damaged.
[0022] The device body includes a pressure cover, which has a downwardly convex pressing part. The pressing part is an annular structure, and its shape matches the first slot. After the coil group to be tested is placed in the first slot, the pressure cover is closed above the first slot. After the pressure cover is pressed down, the pressing part of the pressure cover contacts and presses the coil group downward, so that the coil group is pressed into the first slot with uniform and synchronous force at each position.
[0023] The test pieces correspond to the indicating units one by one;
[0024] The indicating unit is arranged on the upper surface of the upper part of the disk, and is located on one side of the second slot where the corresponding test piece is located, so that during testing, it can be judged whether the connection terminal is set normally by observing the lighting of the corresponding indicating unit.
[0025] A mark is provided on the upper surface of the upper part of the disk, and the mark, the second groove, and the indicating unit correspond to each other one by one.
[0026] Beneficial effect: Due to the adoption of the above technical solution, the present invention simplifies the operating steps, reduces the operating difficulty, improves the operation accuracy, enhances the testing efficiency, reduces the repetitive work, and effectively avoids the problem of frequent re-inspection in traditional operations and the resulting reduction in terminal life. BRIEF DESCRIPTION OF THE DRAWINGS
[0027] Figure 1 A structural schematic diagram of the present invention;
[0028] Figure 2 for Figure 1 A schematic diagram of the structure after the power supply is hidden;
[0029] Figure 3 A schematic diagram of the structure of a coil assembly tested by the present invention;
[0030] Figure 4 A schematic diagram of a structure setting for testing a coil group in the prior art;
[0031] Figure 5 A schematic diagram of the structure of the gland of the present invention;
[0032] Figure 6A schematic diagram of the gland of the present invention when it is pressed down;
[0033] Figure 7 A schematic diagram of a structure in which the upper disk portion and the lower disk portion of the present invention are connected;
[0034] Figure 8 A schematic diagram of the structure of the power supply of the present invention. DETAILED DESCRIPTION
[0035] In order to make the technical means, creative features, purpose and efficacy of the present invention easy to understand, the present invention is further explained in conjunction with specific diagrams below. It should be noted that the terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present invention are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments described here can be implemented in an order other than that illustrated or described here. In addition, the terms "including" or "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a product or device containing a series of components or units is not necessarily limited to those components or units clearly listed, but may include other components or components that are not clearly listed or inherent to these products or devices.
[0036] Reference Figure 1 , Figure 2 A motor power line continuity test device includes a device body, the device body includes a fixing plate 101, a test plate assembly and a power supply 90, the fixing plate 101 is used to fix the coil group to be tested, and during the test, the coil group is sleeved on the fixing plate 101. The power supply 90 provides power supply for the test process. Figure 8 A schematic diagram of the structure of a power supply is shown, on the panel of which a low potential terminal 901, a high potential terminal 902 and a power-on switch 903 are provided. Figure 1 The terminals of the power supply 90 of the structure shown are covered by a shield, so that only the external wiring harness 905 is exposed. The external wiring harness 905 bundles all the wiring harnesses connected to each low-potential wiring terminal and sets a quick-connect terminal row at the end to facilitate quick connection of the wiring harness led out of the test disk assembly. The test disk assembly leads out the wiring harness 801 and sets another matching quick-connect terminal row. In addition, the high-potential wiring harness 906 of the power supply 90 is also led out and a quick-connect terminal row is set at its end to facilitate connection with the lead wires of the coil group to be tested (such as Figure 3 The leads in the 2') are quickly connected with the mating quick-connect terminal blocks.
[0037] like Figure 2As shown, the test disk assembly includes a disk upper portion 1021, the upper surface of which is recessed downward to form a first disc-shaped depression, and the fixed disk 101 is located at the center of the first depression. The inner wall of the first depression (the inner wall here refers to the side wall of the first depression, which is vertical) and the outer wall of the fixed disk 101 (the outer wall can generally be set to be vertical, or to facilitate the coil group to be inserted thereon, the outer wall can be set to be inclined to a certain extent, so that the outer wall is an inclined curved surface. Under this structural setting, when the fixed disk is observed from the whole in any side direction, it is a frustum structure with a small top surface and a large bottom surface) are separated to form a first groove 201. When the coil group to be tested is fixed to the fixed disk 101, it is embedded in the first groove 201;
[0038] At least two second grooves 202 are provided on the inner wall of the first recess, and adjacent second grooves 202 are spaced apart so that all second grooves 202 are evenly arranged around the first groove 201. Any second groove 202 is a recessed structure that is perpendicular to the inner wall of the first recess, and a metal test piece 30 is provided in any second groove 202. Any test piece 30 is connected to the low potential of the power supply 90. The number of low potential terminals 901 on the power supply 90 is not less than the number of test pieces 30 on the upper part 1021 of the disk, and any test piece 30 is connected to the low potential of the power supply through an indication unit so as to indicate the conduction state during testing.
[0039] During the test, after the coil group to be tested is embedded in the first slot 201, the connection terminal on the coil group is also embedded in the corresponding second slot 202 and contacts the test piece 30 therein. At this time, after the lead wire of the coil group corresponding to the connection terminal is connected to the high potential of the power supply 90, the power supply 90 is turned on to determine whether the connection terminal is set normally.
[0040] It should be noted that when the test piece is connected to the low potential of the power supply through the indicating unit, the indicating unit generally adopts a light-emitting device such as an LED, and its setting can be as follows: any low-potential terminal / binding post on the power supply 90 is connected to the low potential through an indicating unit (the connection structure is inside the power supply housing), so that when the test piece is connected to the terminal / binding post, a series circuit structure is formed. When setting, inside the power supply housing, one pin of the two-pole pin of the indicating unit is connected to the low-potential point inside the power supply, and the other pin is connected to the terminal / binding post on the power supply panel. Outside the power supply housing, after the coil group is inserted into the upper part of the disk, the lead wire on the upper part of the disk is connected to the low-potential terminal / binding post, and then the lead wire of the coil group is connected to the high potential of the power supply to form a loop. At this time, when the line connection is normal, the indicating unit can be illuminated to indicate that the conduction state of the corresponding connection terminal on the coil group is normal. Under this structural setting, if Figure 8As shown, an indication unit 904 may be provided for each low potential terminal 901, and the corresponding indication unit 904 may be installed on the panel of the housing of the power supply 90 so as to be located above or below the corresponding low potential terminal 901, as shown in FIG. Figure 8 In the illustrated structure, the indicating unit is located above the corresponding terminal / binding post.
[0041] The present invention arranges the test piece in the following manner to ensure that the connecting terminal of the coil assembly is in good contact with the test piece after the coil assembly is inserted into the first slot: Figure 2 , Figure 7 As shown, the test piece 30 has a vertical direct contact end 301 and a horizontal contact end 302, which are connected to each other. The horizontal contact end 302 is arranged to fit the bottom surface of the second groove 202, and the vertical direct contact end 301 is arranged to fit the side wall of the second groove 202 (in the case of providing an embedded piece contact end 303, in order to ensure that the vertical direct contact end 301 can fit the side wall of the second groove, the embedded piece contact end 303 can also be embedded in the upper part of the disk, for example, after a hole is opened on the side wall of the second groove, it is made to pass through one side to the lower surface of the upper part of the disk, and then the embedded piece contact end of the test piece is passed through the opening and vertically exposed to the lower surface of the upper part of the disk; or, the embedded piece contact end 303 and the vertical direct contact end 301 can be fitted to each other and then fit to the side wall of the second groove, and a through hole is set at the bottom of the second groove to facilitate the vertical downward movement of the embedded piece contact end 303), so as to ensure that the connection terminal of the coil group contacts the test piece 30 when it is embedded in the second groove.
[0042] In the present invention, the test piece is provided with a connection structure having a vertical contact end and a horizontal contact end, so that it is in an L-shaped structure. After it is embedded in the second groove 202, it fits the groove bottom and side wall of the second groove 202. When the connection terminal of the coil group to be tested is embedded in the second groove 202, even if the connection terminal is deformed when the coil group is pressed down and inserted into the fixed disk 101, its deformation trend is also limited by the shape and space of the second groove 202, so that it can always contact the test piece 30, avoiding the problem of failure to normally contact the test point due to deformation of the connection terminal or skewness during setting in the traditional semi-automatic testing process.
[0043] It should be noted that when the second groove 202 is set, it is connected to the upper surface of the upper part of the disk upwards, and connected to the side wall of the first recess toward the first recess, so that its opening on the upper surface of the upper part of the disk extends to the side wall of the first recess. This structure can be regarded as the second groove having an upper opening and a side wall opening, the upper opening is connected to the upper surface of the upper part 1021 of the disk, and the side wall opening is connected to the first groove 201. When the vertical direct contact end 301 of the test piece is set, it can be in a sheet shape (the attached drawings of the present invention show such a sheet structure) so that it fits the inner wall of the second groove 202 facing the side wall opening. In addition, the vertical direct contact end can also be set as a bent sheet structure (the attached drawings of the present invention do not show such a structure) so that when it fits the inner wall of the second groove, it covers as much inner wall area as possible.
[0044] In the present invention, in order to achieve a more flexible structural setting so as to adapt to more application occasions, the structural setting can be as follows: Figure 2 , Figure 7 As shown, the test disc assembly includes a disc lower portion 1022, and the disc lower portion 1022 is upwardly connected to the disc upper portion 1021;
[0045] The lower part 1022 of the plate is provided with at least two metal inserts 40, and the number of the inserts 40 is not less than the number of the test pieces 30.
[0046] Each test piece 30 has an embedded piece 40 corresponding to it on the lower part 1022 of the disk. When the lower part 1022 of the disk is connected to the upper part 1021 of the disk, each test piece 30 of the upper part 1021 of the disk contacts with the embedded piece 40 corresponding to it.
[0047] Each of the inserts 40 is connected to the low potential of the power supply through an independent wire 801. When connected, Figure 7 , Figure 8 As shown, the independent wire 801 connected to the insert 40 is connected to one of the low potential terminals 901 of the power supply 90. Figure 1 , Figure 2 In the figure, the wiring harness consisting of multiple independent wires 801 is extended on the left side of the test disk assembly. After a quick-connect terminal block (such as an air plug or other plug-in structure) is set at its end, the corresponding external wiring harness 905 connected to the low-potential terminals of the power supply 90 is also bundled and a matching quick-connect terminal block is set at the end to achieve a quick connection structure. When each test point (a test piece and a corresponding contact insert constitute a test point) are numbered, there is no need to manually distinguish the low-potential terminals that need to be connected. In addition, the operating efficiency can also be accelerated when replacing the lower part of the disk or replacing the power supply, such as replacing a bad part, or replacing a different type of lower part of the disk (such as replacing a lower part model with 20 test points with a model with 30 test points).
[0048] By setting the test disc assembly to be a combined structure in which the upper and lower discs are connected, the flexibility of the present invention in some application scenarios is increased. For example, in some application scenarios, the structural dimensions of the connection terminals on different coil groups are different, so the slotting dimensions of the second slot on the upper part of the disc for testing are also different. At this time, the same disc lower part can be set to match multiple disc upper parts to form a test fixture corresponding to coil groups with different connection terminal structural dimensions. When setting, the number of inlays on the disc lower part is not less than the number of test pieces of the style with the most test pieces among all the disc upper part styles, and each test piece on any disc upper part has an inlay corresponding to the test piece on the disc lower part. Specifically, for example, 30 inlays are set on the disc lower part, and three disc upper parts are designed corresponding to three coil groups with connection terminal styles A, B, and C, respectively, A with 10 test pieces, B with 20 test pieces, and C with 30 test pieces.
[0049] In order to facilitate the connection between the insert and the test piece, the present invention can be arranged as follows: Figure 7 As shown, the test piece 30 has an insert contact end 303, which extends vertically downward and then passes through the lower surface of the upper disk portion 1021. When the upper disk portion 1021 is downwardly connected to the lower disk portion 1022, the insert contact end 303 contacts the insert 40 downward;
[0050] The insert 40 has a vertical portion 401 and a curved portion 402, which are connected. The inflection point of the curved portion 402 bends toward the vertical portion 401 and contacts the vertical portion 401, so that the top of the insert 40 forms an upward split structure. When the test piece 30 contacts the insert 40, the insert contact end 303 contacts the split structure of the insert 40, forming a plug-in connection structure between the two. The split structure makes the connection between the test piece 30 and the insert 40 smoother, and the inclined part of the split structure can also provide a guide when the insert contact end 303 moves downward.
[0051] In addition, the lower end of the insert contact end 303 may be provided with a bent structure (this structure is not shown in the drawings of the present invention), the shape of which corresponds to the shape of the forked structure of the insert, thereby ensuring smooth contact when the insert contacts the test piece and increasing the contact area between the two.
[0052] When the test disc assembly is configured as a combined connection structure of the disc upper part and the disc lower part, the following structure can be configured to achieve the effect of self-testing each test point formed by the contact between the corresponding test piece 30 and the insert 40 after the disc upper part and the disc lower part are connected: Figure 1 , Figure 7 , Figure 8As shown, the test piece 30 in any second slot 202 of the upper part 1021 of the disk is connected to a high potential bus 802, and the lead wire of the high potential bus 802 is connected to the high potential terminal 902 of the power supply 90. Figure 1 In the structure shown, a quick-connect terminal is provided at the end of the high-potential bus 802 , which can be conveniently plugged into the high-potential lead harness 906 of the power supply 90 .
[0053] During the self-test operation, the upper part 1021 of the disk is connected downward to the lower part 1022 of the disk, so that each test piece 30 of the upper part 1021 of the disk is downwardly contacted with the corresponding embedded piece 40 of the lower part 1022 of the disk, and the lead wires of each embedded piece 40 of the lower part 1022 of the disk are connected to the corresponding low-potential terminal / binding post of the power supply 90. After the power supply is turned on, it is judged by the on and off of the indicating unit 904 whether the test point formed by the contact between the corresponding test piece 30 and the embedded piece 40 is normal.
[0054] In order to facilitate the smooth connection between the upper plate 1021 and the lower plate 1022 and ensure that any test piece 30 is in accurate contact with the corresponding insert 40, the present invention can be arranged as follows: Figure 7 As shown, the upper disk portion 1021 is provided with a positioning post 601 , and the lower disk portion 1022 is provided with a positioning hole 602 corresponding to the positioning post 601 . When the upper disk portion 1021 and the lower disk portion 1022 are connected, the positioning post 601 is plugged into the positioning hole 602 .
[0055] In order to prevent the lead wire from being excessively bent and deformed and damaged when the coil assembly is stuck in the fixed disk 101, the present invention can be arranged as follows: Figure 1 , Figure 2 As shown, the upper part 1021 of the disk is provided with a lead-out clamping hole 203 for clamping the lead-out wire of the coil group to be tested. When the lead-out clamping hole 203 is provided, it is formed into a concave structure located on the upper surface of the upper part 1021 of the disk and concave downward. The concave structure also passes through the first groove 201 and the outer wall of the upper part of the disk. When the coil group to be tested is sleeved on the fixed disk 101 and clamped into the first groove 201, the lead-out wire ( Figure 3 The lead wire 2') in the coil assembly is inserted into the lead wire slot 203 to prevent the lead wire of the coil assembly from being deformed and damaged.
[0056] In order to ensure that the coil group to be tested is smoothly inserted into the first slot, the coil group is subjected to downward pressure at each position during insertion, thereby reducing the deformation of the coil body and the connecting terminal caused by uneven force and distortion at some positions during the insertion process. The structure can be arranged as follows: Figure 5 , Figure 6As shown, the device body includes a pressure cover 5, which has a downwardly convex pressing portion 501. The pressing portion 501 is an annular structure, and its shape matches the first groove 201. After the coil group 8 to be tested is placed in the first groove 201, the pressure cover 5 is covered on the top of the first groove 201. After the pressure cover 5 is pressed down, the pressing portion 501 of the pressure cover 5 contacts and presses the coil group 8 downward, so that the coil group 8 is pressed into the first groove 201 under the condition that the force is uniform and synchronous at each position.
[0057] It should be noted that the shape of the pressing portion 501 of the pressing cover 5 matches the first slot 201 , which means that when the coil assembly 8 is not placed in the first slot 201 , the pressing portion 501 can be smoothly embedded in the first slot 201 when the pressing cover 5 is covered on the first slot 201 .
[0058] In order to make the test results clear and intuitive, the present invention can be arranged in the following structure: the test pieces correspond to the indicator units one by one; the indicator units are arranged on the upper surface of the upper part of the disk, and are located on one side of the second slot where the corresponding test piece is located. During the test, the connection terminal can be judged whether it is set normally by observing the on and off of the corresponding indicator unit.
[0059] In addition, in order to make it more convenient to read the test status and to help improve the detection efficiency, the present invention can set a mark on the test disk assembly to facilitate the rapid positioning of the status of the connection terminal together with the indicator unit:
[0060] A mark is arranged on the upper surface of the upper part of the disk, and the mark, the second groove and the indicating unit correspond to each other one by one.
[0061] The markings described in the above embodiments can be realized by Arabic numerals, English letters or a combination of the two, and can also be marked in other symbolic forms that are convenient for unique marking.
[0062] The marks in the above-mentioned embodiments and the indicating unit located on the upper surface of the upper part of the disk are not shown in the drawings of the present invention.
[0063] In summary, the present invention achieves the effect of quickly detecting the setting status of the connection terminals of the coil group by setting the test disk assembly and the fixing disk. The operation is convenient and efficient, the test result feedback is intuitive, and the connection terminals with problems can be quickly located for timely repair.
[0064] It should be noted that the test disc assembly of the present invention is made of insulating material, such as plastic or wood material. In order to make the structural design aesthetically pleasing and convenient for molding molds and manufacturing, the upper part of the disc and the lower part of the disc can be set to a disc structure, wherein the equivalent circle corresponding to the outer wall of the upper part of the disc, the equivalent circle corresponding to the inner wall of the first recess, and the equivalent circle corresponding to the outer wall of the fixed disc are concentric circle structures, so that the device body is centrally symmetrical when viewed from above. After the structure is set, not only the structure has a certain aesthetic feeling, but also when preparing the test disc assembly and the fixed disc, it is convenient for dimension mapping and instrument positioning during mold opening or manufacturing. The fixed disc can also be set to be integrally formed with the upper part of the disc. For example, when the upper part of the disc is molded with plastic injection molding, the fixed disc is integrally formed on the upper surface of the upper part of the disc by a mold. The connection between the upper part of the disc and the lower part of the disc can be connected by fasteners or snap-on connection. When snap-on connection is adopted, a snap-on end or a corresponding snap-on groove is set on the lower surface of the upper part of the disc, and a corresponding snap-on groove or snap-on end is set on the upper surface of the lower part of the disc. Figure 1 , Figure 2 In the structure shown, the upper and lower parts of the disk are connected by fasteners, which are screwed from top to bottom into the fastener holes located at the center of the first recess and the corresponding fastener holes on the lower part of the disk below to connect and fix the upper and lower parts of the disk together.
[0065] The operation process of the present invention is as follows:
[0066] Test operation: first connect the lead wire of the power cord coil group to the high potential of the power supply, then put the circular part of the power cord coil group into the first groove, and finally press the cover down so that the power cord coil group is pressed down so that the various connection terminals on it sink into the second groove and contact with the corresponding test piece; observe the display result of the indicator unit to determine whether the test is passed.
[0067] The above shows and describes the basic principles and main features of the present invention and the advantages of the present invention. It should be understood by those skilled in the art that the present invention is not limited to the above embodiments. The above embodiments and descriptions are only for explaining the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention to be protected. The scope of protection of the present invention is defined by the attached claims and their equivalents.
Claims
1. A motor power line continuity test device, comprising a device body, wherein the device body comprises a fixing plate and a power supply, characterized in that: The device body comprises a test disc assembly, the test disc assembly comprises a disc upper portion, the upper surface of the disc upper portion is recessed downward to form a disc-shaped first depression, the fixed disc is located at the center of the first depression, the inner wall of the first depression and the outer wall of the fixed disc are spaced to form a first groove, and when the coil group to be tested is fixed to the fixed disc, it is embedded in the first groove; At least two second grooves are arranged on the inner wall of the first recess at intervals, and the at least two second grooves are evenly arranged around the first groove. Any of the second grooves is a recessed structure that is perpendicular to the inner wall of the first recess, and a metal test piece is arranged in any of the second grooves. Any of the test pieces is connected to the low potential of the power supply, the number of low potential terminals on the power supply is not less than the number of the test pieces on the upper part of the disk, and any of the test pieces is connected to the low potential of the power supply through an indication unit.
2. A motor power line continuity test device according to claim 1, characterized in that: The test piece has a vertical direct contact end and a horizontal contact end, which are connected to each other. The horizontal contact end is arranged to fit the bottom surface of the second groove, and the vertical direct contact end is arranged to fit the side wall of the second groove.
3. A motor power line continuity test device according to claim 1 or 2, characterized in that: The test disc assembly comprises a disc lower portion, the disc lower portion is connected upwardly to the disc upper portion, The lower part of the plate is provided with at least two metal inserts, the number of which is not less than the number of the test pieces. Any of the test pieces has an embedded piece corresponding to it on the lower part of the disk, and when the lower part of the disk is connected to the upper part of the disk, any of the test pieces on the upper part of the disk contacts with the embedded piece corresponding to it; Any of the embedded pieces is connected to the low potential of the power supply through an independent wire.
4. A motor power line continuity test device according to claim 3, characterized in that: The test piece has an inlay contact end, the inlay contact end extends vertically downward and then passes through the lower surface of the upper part of the disk, and when the upper part of the disk is downwardly connected to the lower part of the disk, the inlay contact end contacts the inlay downward; The insert has a vertical portion and a curved portion, which are connected to each other. The inflection point of the curved portion bends toward one side of the vertical portion and contacts the vertical portion.
5. A motor power line continuity test device according to claim 3, characterized in that: The test piece in any of the second slots on the upper part of the disk is connected to a high potential bus, and the lead-out line of the high potential bus is connected to the high potential of the power supply.
6. A motor power line continuity test device according to claim 3, characterized in that: The upper part of the disk is provided with a positioning post, and the lower part of the disk is provided with a positioning hole corresponding to the positioning post. The positioning post and the positioning hole are plugged when the upper part of the disk is connected with the lower part of the disk.
7. A motor power line continuity test device according to claim 1, characterized in that: The upper part of the disk is provided with a lead-in socket for conveniently inserting the lead-out wire of the coil group to be tested.
8. A motor power line continuity test device according to claim 7, characterized in that: The device body comprises a pressure cover, wherein the pressure cover has a downwardly convex pressing portion, and the pressing portion is an annular structure, and its shape matches the first groove.
9. A motor power line continuity test device according to claim 1, characterized in that: |The test piece corresponds to the indication unit one by one; The indicating unit is disposed on the upper surface of the upper portion of the disk, and is located at one side of the second slot where the corresponding test piece is located.
10. A motor power line continuity test device according to claim 9, characterized in that: A mark is provided on the upper surface of the upper part of the disk, and the mark, the second groove, and the indicating unit correspond to each other one by one.