Method and device for efficiently testing electromagnetic properties of conductive materials

Abstract

The application relates to a method and device for efficiently testing electromagnetic properties of conductive materials. The method comprises: arranging a first electromagnetic shielding material on a first waveguide assembly, arranging a second electromagnetic shielding material on a second waveguide assembly, placing a conductive material to be tested on the first electromagnetic shielding material, and aligning a slot of the second electromagnetic shielding material with a slot of the first electromagnetic shielding material, so that the conductive material to be tested is located between the slot of the first electromagnetic shielding material and the slot of the second electromagnetic shielding material; and efficiently testing electromagnetic properties of the conductive material to be tested through a waveguide system. The method can quickly and effectively and accurately determine electromagnetic properties of a sample.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of conductive materials, in particular to a method and device for efficiently testing electromagnetic characteristics of conductive materials. BACKGROUND

[0002] As a typical functional electromagnetic material, the electromagnetic characteristic parameters of the conductive film, especially the electromagnetic shielding characteristic index, are particularly important, and the testing accuracy greatly affects the evaluation of the electromagnetic performance of the sample material. There are generally two methods for testing the electromagnetic performance of the conductive film: the double-antenna method and the waveguide method. The double-antenna method is mainly used for testing the electromagnetic performance of large-size conductive films. A cavity is opened in the test shield room, the conductive film is attached to the shielding cavity, and then the test result of the conductive film is compared with that of the air to obtain the electromagnetic shielding performance of the conductive film. This method requires a large-size conductive film to minimize the adverse effects of edge scattering and diffraction on the test results, and is easily affected by the test environment, resulting in large test result errors. Unlike the large-size sample requirement of the double-antenna method, the waveguide test method is mainly used for testing the electromagnetic performance of small-size conductive films.

[0003] The waveguide method can achieve relatively accurate electromagnetic shielding performance testing with little environmental influence, and does not require large-size samples, which is particularly suitable for testing and research during the sample performance research stage, reducing research and development costs and improving testing accuracy. In actual testing, good electrical contact between the sample and the waveguide face and the avoidance of electromagnetic leakage are key factors for accurate electromagnetic shielding performance testing. The conventional method is to cut a conductive material sample of the same size as the waveguide face and embed it in the waveguide face wall for testing. However, it is difficult to accurately cut and ensure good electrical contact between the sample and the waveguide face during the actual operation process, so it is difficult to obtain accurate electromagnetic shielding results.

[0004] In the prior art, in order to achieve good electrical contact between the two waveguides and prevent electromagnetic leakage during testing, the flanges of the two waveguides are aligned and fastened by screws or other operations, which is tedious and laborious, and has poor operability. At the same time, when the sample is embedded in the waveguide face, the sample and the waveguide face cannot be in good electrical contact, so the test result error is large; and when the sample is placed on the waveguide face, no matter how tightly it is fastened, due to the thickness of the conductive material, electromagnetic leakage is unavoidable, and the electromagnetic shielding result obtained by the test is also not ideal. SUMMARY

[0005] Therefore, it is necessary to provide a method and device for efficiently testing electromagnetic characteristics of conductive materials with strong operability and accurate electromagnetic shielding test results.

[0006] A kind of efficient test method of electromagnetic characteristic of conductive material, comprising:

[0007] First electromagnetic shielding material is arranged on the first waveguide assembly, and second electromagnetic shielding material is arranged on the second waveguide assembly;Wherein, the first electromagnetic shielding material and the second electromagnetic shielding material respectively have slot hole on it, which is adapted to the size of waveguide opening, and the slot hole is aligned with the center of the waveguide opening;

[0008] The conductive material to be tested is covered on the first electromagnetic shielding material, and the slot hole of the second electromagnetic shielding material is aligned with the slot hole of the first electromagnetic shielding material, so that the conductive material to be tested is located between the slot hole of the first electromagnetic shielding material and the slot hole of the second electromagnetic shielding material;

[0009] The electromagnetic performance of the conductive material to be tested is efficiently tested by waveguide system.

[0010] In one embodiment, the first waveguide assembly includes a first waveguide and a first waveguide flange, one end of the first waveguide flange is connected with the first waveguide, and has an opening with the same size as the opening end of the first waveguide, and the first electromagnetic shielding material is arranged on the other end of the first waveguide flange;

[0011] The second waveguide assembly includes a second waveguide and a second waveguide flange, one end of the second waveguide flange is connected with the second waveguide, and has an opening with the same size as the opening end of the second waveguide, and the second electromagnetic shielding material is arranged on the other end of the second waveguide flange.

[0012] In one embodiment, it further includes a third electromagnetic shielding material arranged on the first electromagnetic shielding material or the second electromagnetic shielding material, the third electromagnetic shielding material has a slot hole adapted to the shape of the conductive material to be tested, and the slot hole of the third electromagnetic shielding material is aligned with the slot hole of the first electromagnetic shielding material or the second electromagnetic shielding material and the center of the waveguide opening.

[0013] In one embodiment, when the thickness of the conductive material to be tested is greater than 1mm, the conductive material to be tested is embedded in the slot hole of the third electromagnetic shielding material, and covers the slot hole of the first electromagnetic shielding material or the second electromagnetic shielding material, and the slot hole of the first electromagnetic shielding material and the second electromagnetic shielding material is aligned, so that the conductive material to be tested is located between the slot hole of the first electromagnetic shielding material and the slot hole of the second electromagnetic shielding material;

[0014] The electromagnetic performance of the test conductive material is efficiently tested by waveguide system.

[0015] In one embodiment, the third electromagnetic shielding material is composed of at least one layer of electromagnetic shielding material.

[0016] In one embodiment, the first electromagnetic shielding material, the second electromagnetic shielding material and the third electromagnetic shielding material are flexible conductive materials.

[0017] In one embodiment, the first electromagnetic shielding material, the second electromagnetic shielding material and the third electromagnetic shielding material are one of graphene 3D porous flexible conductive material, metal sponge structure conductive material, rubber type flexible conductive material, conductive hydrogel, flexible conductive textile material and flexible conductive polymer.

[0018] In one embodiment, the first waveguide flange and the first electromagnetic shielding material, the second waveguide flange and the second electromagnetic shielding material, and the electromagnetic shielding material are fixed by conductive glue or conductive tape or screws.

[0019] The conductive material electromagnetic property efficient testing device comprises a waveguide testing system, and the waveguide testing system comprises a first waveguide assembly and a second waveguide assembly, characterized in that the first waveguide assembly is provided with a first electromagnetic shielding material, and the second waveguide assembly is provided with a second electromagnetic shielding material; the first electromagnetic shielding material and the second electromagnetic shielding material are respectively provided with slot holes which are matched with the size of waveguide openings and are aligned with the centers of the waveguide openings.

[0020] Compared with the prior art, the conductive material electromagnetic property efficient testing method and device provided by the application have the following effects:

[0021] 1. The electromagnetic shielding material ensures that the waveguide system has certain sealing performance when the electromagnetic performance is tested, and solves the problems of conductivity and electromagnetic leakage;

[0022] 2. Only the conductive material to be tested needs to cover the slot hole, and the electromagnetic performance of the conductive material to be tested can be quickly, accurately and efficiently tested by aligning the first waveguide assembly and the second waveguide assembly, which has strong operability and greatly improves the testing efficiency;

[0023] 3. The device can be used on any waveguide testing system, different frequency bands can be tested, and the device has wide application. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 It is a flow chart of the conductive material electromagnetic property efficient testing method provided by the application;

[0025] Figure 2 It is an axial view of the waveguide assembly structure in the application;

[0026] Figure 3 It is a schematic view of the conductive material sheet to be tested in the application;

[0027] Figure 4is a side view of a waveguide system for testing a conductive material of a test sheet in the present application;

[0028] Figure 5 is an axial view of a waveguide system for testing a conductive material of a test sheet in the present application;

[0029] Figure 6 is an axial view of a waveguide assembly for testing a conductive material with a thickness greater than 1 mm in the present application;

[0030] Figure 7 is a schematic view of placing a conductive material with a thickness greater than 1 mm in the present application;

[0031] Figure 8 is a side view of a waveguide system for testing a conductive material with a thickness greater than 1 mm in the present application;

[0032] Figure 9 is an axial view of a waveguide system for testing a conductive material with a thickness greater than 1 mm in the present application;

[0033] Figure 10 is a comparison chart of test and simulation results in Embodiment 1 of the present application;

[0034] Figure 11 is a comparison chart of test and simulation results in Embodiment 2 of the present application;

[0035] Figure 12 is a comparison chart of test and simulation results in Embodiment 3 of the present application;

[0036] Reference signs:

[0037] The first waveguide assembly 11 includes a first waveguide 111, a first waveguide flange 112, and a first electromagnetic shielding material 113.

[0038] The second waveguide assembly 22 includes a second waveguide 221, a second waveguide flange 222, and a second electromagnetic shielding material 223.

[0039] The third electromagnetic shielding material 224.

[0040] The test conductive material 33. DETAILED DESCRIPTION

[0041] In order to make the purpose, technical scheme and advantages of the present application clearer, the present application will be further described in detail below in combination with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and do not limit the present application.

[0042] It should be noted that the descriptions such as "first", "second" and the like in the present application are only for the purpose of description, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first", "second" can be explicitly or implicitly included at least one of the features. In the description of the present application, the meaning of "a plurality of" is at least two, for example, two, three, etc., unless otherwise specifically limited.

[0043] The conventional waveguide test system needs to accurately cut the size of the to-be-tested conductive material 33 to be the same as the size of the waveguide opening to ensure good embedding into the waveguide opening surface, and needs to fasten the two waveguide flanges through screws, buckles and other load fasteners after aligning the two waveguide flanges to avoid electromagnetic leakage, so that the test process is complicated, and the to-be-tested conductive material 33 needs to be cut and fastened again each time, which is not strong in operability in actual application, and the test result is also not ideal due to the non-ideal conductive contact between the sample and the waveguide opening surface.

[0044] In order to solve the problems of inconvenient operation and difficult to test accurately in the process of testing the electromagnetic performance of the conductive material by the waveguide method, the present application provides an efficient test method, which is convenient and fast, reusable, and strong in operability, and the test result is accurate.

[0045] As shown in Figure 1 The efficient test method for electromagnetic properties of conductive material provided by the present application has the following specific steps:

[0046] Step 102: A first electromagnetic shielding material 113 is arranged on the first waveguide assembly 11, and a second electromagnetic shielding material 223 is arranged on the second waveguide assembly 22; wherein the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223 respectively have a slot hole with a size suitable for the waveguide opening, and the slot hole is aligned with the center of the waveguide opening.

[0047] Step 104: The to-be-tested conductive material 33 is placed on the first electromagnetic shielding material 113, and the slot hole of the second electromagnetic shielding material 223 is aligned with the slot hole of the first electromagnetic shielding material 113, so that the to-be-tested conductive material 33 is located between the slot hole of the first electromagnetic shielding material 113 and the slot hole of the second electromagnetic shielding material 223.

[0048] Step 106: The to-be-tested conductive material 33 is efficiently tested for electromagnetic performance by the waveguide system.

[0049] Specifically, the first waveguide assembly 11 comprises a first waveguide 111 and a first waveguide flange 112, the first waveguide flange 112 is connected to one end of the first waveguide 111 and has an opening with the same size as the opening end of the first waveguide 111, and the other end of the first waveguide flange 112 is provided with a first electromagnetic shielding material 113; the second waveguide assembly 22 comprises a second waveguide 221 and a second waveguide flange 222, the second waveguide flange 222 is connected to one end of the second waveguide 221 and has an opening with the same size as the opening end of the second waveguide 221, and the other end of the second waveguide flange 222 is provided with a second electromagnetic shielding material 223.

[0050] When the thickness of the to-be-tested conductive material 33 is less than 1 mm, the to-be-tested conductive material 33 is covered on the slot hole of the first electromagnetic shielding material 113, and the slot hole of the second electromagnetic shielding material 223 is aligned with the slot hole of the first electromagnetic shielding material 113, so that the to-be-tested conductive material 33 is located between the slot hole of the first electromagnetic shielding material 113 and the slot hole of the second electromagnetic shielding material 223; the electromagnetic performance of the test conductive material is tested efficiently by the waveguide system.

[0051] When the thickness of the to-be-tested conductive material 33 is greater than 1 mm, a third electromagnetic shielding material 224 is additionally provided, the third electromagnetic shielding material 224 is arranged on the first electromagnetic shielding material 113 or the second electromagnetic shielding material 223 and has a slot hole matched with the shape of the to-be-tested conductive material 33, and the slot hole of the third electromagnetic shielding material 224 is aligned with the slot hole of the first electromagnetic shielding material 113 or the second electromagnetic shielding material 223 and the center of the waveguide opening. The to-be-tested conductive material 33 is embedded in the slot hole of the third electromagnetic shielding material 224 and covers the slot hole of the first electromagnetic shielding material 113 or the second electromagnetic shielding material 223, and the slot holes of the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223 are aligned, so that the to-be-tested conductive material 33 is located between the slot hole of the first electromagnetic shielding material 113 and the slot hole of the second electromagnetic shielding material 223; the electromagnetic performance of the conductive material is tested efficiently by the waveguide system.

[0052] Further specifically, taking a rectangular waveguide test system as an example, a certain thickness of electromagnetic shielding material is directly loaded on the first waveguide flange 112 and the second waveguide flange 222, and a slot hole with the same structure size as the waveguide opening is vertically provided in the electromagnetic shielding material at the corresponding position of the rectangular waveguide opening, and the opening position and size of the electromagnetic shielding material are theoretically completely aligned with the rectangular waveguide opening surface. The same electromagnetic shielding material is loaded on the first waveguide flange 112 and the second waveguide flange 222 for testing, and the waveguide opening is also basically aligned after the electromagnetic shielding material is loaded.

[0053] As Figures 2-5As shown, a relatively thin conductive material 33 is used for testing. When the thickness of the conductive material 33 is less than that of the electromagnetic shielding material, it is only necessary to cut out a conductive material 33 of any shape that can cover the waveguide opening and does not exceed the size of the electromagnetic shielding material. Under the premise of ensuring that the conductive material 33 completely covers the waveguide opening, it is placed directly on the first electromagnetic shielding material 113. Then, the second electromagnetic shielding material 223 of the same structural size is aligned with the first electromagnetic shielding material 113, ensuring that there is a certain degree of airtightness between the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223. There is no need to compact it, so that the conductive material 33 is sandwiched between the waveguide opening of the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223, thereby realizing the rapid testing of its electromagnetic performance.

[0054] like Figures 6-9 As shown, for a conductive material 33 with a thickness greater than 1 mm, a third electromagnetic shielding material 224 is added to the structure of the thinner conductive material 33 tested above. First, the conductive material 33 is cut into a cross-section that covers the waveguide aperture size and does not exceed the size of the first electromagnetic shielding material 113. Then, the third electromagnetic shielding material 224 is added to either the first electromagnetic shielding material 113 or the second electromagnetic shielding material 223. A slot of the same shape and size as the conductive material 33 is cut into the third electromagnetic shielding material 224 along the outer shape of the conductive material 33, so that the conductive material 33 can be precisely embedded in the slot of the third electromagnetic shielding material 224. The outer dimensions of the third electromagnetic shielding material 224 are consistent with the outer dimensions of the first layer of electromagnetic shielding material, and it is placed between the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223, ensuring that the waveguide aperture is basically aligned. This also achieves rapid and accurate testing of the electromagnetic performance of the sample. It is worth noting that the third electromagnetic shielding material 224 can be one or more layers of magnetic shielding material with a thickness not less than that of the conductive material 33 to be tested. When the third electromagnetic shielding material 224 has two or more layers, it can be entirely disposed on the first electromagnetic shielding material 113 or entirely disposed on the second electromagnetic shielding material 223, or it can be disposed on both the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223. The arrangement is as appropriate, as long as it is ensured that when the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223 are aligned, the thicker conductive material 33 to be tested can be completely wrapped by the magnetic shielding material and form a sealed space, thus achieving a sealing effect.

[0055] Through the above method, the efficient testing method and apparatus for the electromagnetic properties of conductive materials provided by the present invention have the following advantages:

[0056] 1. Electromagnetic shielding materials are used to ensure that the waveguide system has a certain degree of airtightness during electromagnetic performance testing, while also solving the problems of conductivity and electromagnetic leakage;

[0057] 2. Only need to cover the slot hole with the conductive material 33 to be tested, align the first waveguide assembly 11 with the second waveguide assembly 22, and the electromagnetic performance of the conductive material 33 to be tested can be quickly, accurately and efficiently tested, with strong operability and greatly improved testing efficiency;

[0058] 3. It can be used on any waveguide test system and can be tested at different frequency bands, and has wide application.

[0059] It should be understood that, although Figure 1 The steps in the flowchart of the method are displayed in sequence according to the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified herein, the execution of these steps is not strictly limited in sequence, and these steps can be executed in other orders. Moreover, Figure 1 At least part of the steps in the method can include multiple sub-steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution order of these sub-steps or stages is not necessarily sequential, but can be executed in rotation or alternation with other steps or sub-steps or stages of other steps.

[0060] In one embodiment, the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223 are flexible conductive materials. The flexible conductive material has certain conductivity and electromagnetic shielding performance.

[0061] Specifically, the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223 can be graphene 3D porous flexible conductive material, metal sponge structure conductive material, rubber type flexible conductive material, conductive hydrogel, flexible conductive textile material, flexible conductive polymer, etc.

[0062] In one embodiment, the first waveguide flange 112 and the first electromagnetic shielding material 113, the second waveguide flange 222 and the second electromagnetic shielding material 223, and the electromagnetic shielding material are fixed by conductive glue or conductive tape or screws.

[0063] In one embodiment, in order to more easily understand the present application, the following will be further described by taking metal conductive sponge as an example.

[0064] For the test of the thin conductive material, the application provides a metal conductive sponge structure, a certain thickness of metal conductive sponge is loaded on the waveguide flange, and the thickness of the metal conductive sponge is generally 1-2 mm. The outer size of the metal conductive sponge is generally not less than the outer size of the waveguide flange, and a shape size consistent with the opening rectangular size of the waveguide is opened on the metal conductive sponge and is aligned as much as possible. In the test, the thin sample to be tested is placed on the loaded metal conductive sponge and covers the opening end surface of the waveguide, and then the two-end waveguide test system is properly aligned to complete the test.

[0065] For the test of the sample to be tested with a thickness greater than 1 mm, after a certain thickness of metal conductive sponge is loaded on the waveguide flange, a metal conductive sponge is further placed on the metal conductive sponge, the thickness of the placed metal conductive sponge is not less than the thickness of the sample to be tested, the thickness of the metal conductive sponge is preferably not more than 1 mm of the thickness of the sample to be tested, and the hollow structure of the metal conductive sponge opening is basically consistent with the outer size of the sample to be tested. Then the sample to be tested is embedded in the metal conductive sponge, and then the two-end test waveguide system is properly aligned to complete the test of the sample to be tested with a thickness greater than 1 mm.

[0066] Embodiment 1:

[0067] In this embodiment, the ITO thin film sample with a sheet resistance value of 10 ohms and a PET substrate with a thickness of 100 um is placed on the waveguide opening surface loaded with the metal conductive sponge, the ITO sample is cut into an irregular quadrilateral size structure, and covers the waveguide opening surface. Then the parameter S21 for characterizing the electromagnetic shielding performance of the sample is tested based on the loaded metal conductive sponge, the frequency band range of the test is 10-15 GHz, and the result is shown in Figure 10 The measured result by this method is very close to the simulation result curve, which verifies the effectiveness of the test method proposed in the application.

[0068] Embodiment 2:

[0069] In this embodiment, a square metal grid conductive thin film with a period of 50 um and a line width of 3 um is provided, and a circular thin film sample with a silicon glass substrate with a thickness of 1 mm is placed on the waveguide opening surface loaded with the metal conductive sponge, and the circular sample directly covers the waveguide opening surface. Then the parameter S21 for characterizing the electromagnetic shielding performance of the sample is tested based on the loaded metal conductive sponge, the frequency band range of the test is 10-15 GHz, and the result is shown in Figure 11 The maximum error of the measured result by this method and the simulation result curve is 1.5 dB, which is very small relative to the shielding performance of up to 40 dB, and also verifies the effectiveness of the test method proposed in the application.

[0070] Embodiment 3:

[0071] In this embodiment, the sample is provided with a 2.6mm thick organic glass as a substrate, a periodic square metal grid with a front plating period of 358um and a line width of 8um, and a back plating of a double-layer conductive film sample of ITO material with a square resistance value of 10 ohms. Since the thickness of the sample to be tested is greater than 1mm, a layer of metal conductive sponge is placed on the basis of the metal conductive sponge loaded in the first two examples, and then the sample is embedded in the window structure of the increased conductive sponge. Only the window space of the metal conductive sponge can roughly accommodate the embedding of the sample, and there is no need to strictly cut the size of the sample and the window of the conductive sponge, which ensures that the sample can cover the mouth surface of the waveguide. Then, based on the parameter S21 for characterizing the electromagnetic shielding performance of the sample after embedding the test sample loaded with the metal conductive sponge, the frequency band range of the test is 10-15GHz, and the results are shown in Figure 12 The error between the actual test results and the simulation results curves is very small, and the effectiveness of the test method proposed in the present application is also verified.

[0072] In one embodiment, a high-efficiency test device for electromagnetic characteristics of conductive materials is provided, which includes a waveguide test system, and the waveguide test system includes a first waveguide assembly 11 and a second waveguide assembly 22, characterized in that a first electromagnetic shielding material 113 is arranged on the first waveguide assembly 11, and a second electromagnetic shielding material 223 is arranged on the second waveguide assembly 22; the first electromagnetic shielding material 113 and the second electromagnetic shielding material 223 respectively have a slot hole with a size suitable for the size of the waveguide opening, and the slot hole is aligned with the center of the waveguide opening.

[0073] The specific limitations of the high-efficiency test device for electromagnetic characteristics of conductive materials can be referred to the limitations of the high-efficiency test method for electromagnetic characteristics of conductive materials in the above, which will not be repeated here.

[0074] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, storage, databases, or other media in the embodiments provided by the present application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0075] The technical features of the above embodiments can be combined in any way. In order to make the description simple, not all possible combinations of the technical features in the above embodiments are described, but as long as the combinations of the technical features do not exist, they should be considered as the scope of the present application.

[0076] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, some modifications and improvements can be made, which are all within the scope of the present application. Therefore, the scope of the patent of the present application should be subject to the appended claims.

Claims

1. A highly efficient method for testing the electromagnetic properties of conductive materials, characterized in that, The method includes: A first electromagnetic shielding material is disposed on a first waveguide assembly, and a second electromagnetic shielding material is disposed on a second waveguide assembly; wherein, the first electromagnetic shielding material and the second electromagnetic shielding material respectively have slots adapted to the size of the waveguide opening, and the slots are aligned with the center of the waveguide opening; The conductive material to be tested is covered on the first electromagnetic shielding material, and the slot of the second electromagnetic shielding material is aligned with the slot of the first electromagnetic shielding material, so that the conductive material to be tested is located between the slot of the first electromagnetic shielding material and the slot of the second electromagnetic shielding material. The electromagnetic properties of the conductive material under test are efficiently tested using a waveguide system. The first electromagnetic shielding material and the second electromagnetic shielding material are flexible conductive materials; The conductive material to be tested can be of any shape not exceeding the size of the electromagnetic shielding material, and only needs to cover the slots of the first electromagnetic shielding material.

2. The efficient testing method for the electromagnetic properties of conductive materials according to claim 1, characterized in that: The first waveguide assembly includes a first waveguide and a first waveguide flange. One end of the first waveguide flange is connected to the first waveguide and has an opening of the same size as the opening end of the first waveguide. A first electromagnetic shielding material is disposed on the other end of the first waveguide flange. The second waveguide assembly includes a second waveguide and a second waveguide flange. One end of the second waveguide flange is connected to the second waveguide and has an opening of the same size as the open end of the second waveguide. The other end of the second waveguide flange is provided with a second electromagnetic shielding material.

3. The efficient testing method for the electromagnetic properties of conductive materials according to claim 2, characterized in that, It also includes a third electromagnetic shielding material disposed on the first electromagnetic shielding material or the second electromagnetic shielding material, the third electromagnetic shielding material having slots adapted to the shape of the conductive material to be tested, and the slots of the third electromagnetic shielding material being aligned with the center of the slots and waveguide openings of the first electromagnetic shielding material or the second electromagnetic shielding material.

4. The efficient testing method for the electromagnetic properties of conductive materials according to claim 3, characterized in that, When the thickness of the conductive material to be tested is greater than 1 mm, the conductive material to be tested is embedded in the slot of the third electromagnetic shielding material and covered on the slot of the first electromagnetic shielding material or the second electromagnetic shielding material. The slots of the first electromagnetic shielding material and the second electromagnetic shielding material are aligned so that the conductive material to be tested is located between the slots of the first electromagnetic shielding material and the slots of the second electromagnetic shielding material. The electromagnetic properties of the conductive material under test are efficiently tested using a waveguide system.

5. The efficient testing method for the electromagnetic properties of conductive materials according to claim 3, characterized in that, The third electromagnetic shielding material consists of at least one layer of electromagnetic shielding material.

6. The efficient testing method for the electromagnetic properties of conductive materials according to claim 3, characterized in that, The first electromagnetic shielding material, the second electromagnetic shielding material, and the third electromagnetic shielding material are all selected from graphene 3D porous flexible conductive materials, metal sponge structure conductive materials, rubber-type flexible conductive materials, conductive hydrogels, flexible conductive textile materials, and flexible conductive polymers.

7. The efficient testing method for the electromagnetic properties of conductive materials according to any one of claims 3 to 6, characterized in that, The first waveguide flange and the first electromagnetic shielding material, the second waveguide flange and the second electromagnetic shielding material, and the electromagnetic shielding materials are fixed together by conductive adhesive, conductive tape or screws.

8. A high-efficiency testing device for the electromagnetic properties of conductive materials, employing the high-efficiency testing method for the electromagnetic properties of conductive materials according to any one of claims 1 to 7, the device comprising: A waveguide testing system, comprising a first waveguide assembly and a second waveguide assembly, characterized in that a first electromagnetic shielding material is provided on the first waveguide assembly, and a second electromagnetic shielding material is provided on the second waveguide assembly; the first electromagnetic shielding material and the second electromagnetic shielding material respectively have slots adapted to the size of the waveguide opening, and the slots are aligned with the center of the waveguide opening.

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