A photovoltaic cell temperature control test device

Abstract

The present invention relates to the field of temperature control technology, and provides a photovoltaic cell temperature control test device. The photovoltaic cell temperature control test device includes a temperature control base, a temperature control component and a test component interface. Among them, the temperature control component is arranged on the temperature control base and connected and fed back through a signal line, and is used to switch between a semiconductor temperature control state and an air-cooled temperature control state; in the semiconductor temperature control state, the temperature control component is used to perform contact temperature control on the photovoltaic cell; in the air-cooled temperature control state, the temperature control component is used to perform non-contact temperature control on the photovoltaic cell; the test component interface is integrated in the temperature control component, and the photovoltaic cell is connected to an external test system in a four-wire manner to test its photoelectric performance. The present invention can test the photoelectric performance of new thin-film photovoltaic cells with different structures at different temperatures, which greatly improves the scope of application of the present invention, and also improves the accuracy and work efficiency of photovoltaic cell measurement.

Description

Technical Field

[0001] The invention relates to the technical field of temperature control, and in particular to a photovoltaic cell temperature control testing device. Background Art

[0002] Photovoltaic cell temperature control test devices are indispensable tools in photovoltaic research and performance evaluation. They provide precise temperature control and stable electrical contact to ensure accurate evaluation of photovoltaic cell photoelectric performance. However, various new photovoltaic cells vary in size, specifications, materials, electrode structures, etc., so photovoltaic cell temperature control test devices are required to have different temperature control methods to cope with the testing of various photovoltaic cells. However, the existing test devices have a single temperature control function and temperature control method, which cannot meet the needs of various photovoltaic cells under standard test conditions and specified non-standard test conditions. Summary of the invention

[0003] The present invention provides a photovoltaic cell temperature control test device, which is used to solve the problem that the temperature control function and temperature control method of the test device in the prior art are single and cannot meet the test requirements of various photovoltaic cells under various conditions.

[0004] The present invention provides a photovoltaic cell temperature control test device, comprising

[0005] Temperature controlled base;

[0006] A temperature control component is disposed on the temperature control base and connected and fed back through a signal line, and is used to switch between a semiconductor temperature control state and an air cooling temperature control state;

[0007] In the semiconductor temperature control state, the temperature control component is used to perform contact temperature control on the photovoltaic cell; in the air-cooled temperature control state, the temperature control component is used to perform non-contact temperature control on the photovoltaic cell;

[0008] A test component interface, which is integrated in the temperature control component and is used to connect the photovoltaic cell to an external test system to test the photoelectric performance of the photovoltaic cell.

[0009] According to a photovoltaic cell temperature control test device provided by the present invention, in the semiconductor temperature control state, the temperature control component is a semiconductor temperature control component, and the semiconductor temperature control component includes:

[0010] A semiconductor temperature control box is arranged on the temperature control base;

[0011] The temperature control platform is arranged on the upper surface of the semiconductor temperature control box and is used to place the photovoltaic cell. The temperature control platform is connected to a semiconductor temperature control source, and the semiconductor temperature control source is used to adjust the temperature of the temperature control platform.

[0012] According to a photovoltaic cell temperature control test device provided by the present invention, the temperature control platform is provided with an adsorption hole, the adsorption hole is arranged through the temperature control platform, and the adsorption hole is connected to an air suction pump.

[0013] According to a photovoltaic cell temperature control test device provided by the present invention, the test component interface is connected to a probe, and the probe is provided with at least one.

[0014] According to a photovoltaic cell temperature control test device provided by the present invention, a magnetic platform is further provided on the upper surface of the semiconductor temperature control box, and the temperature control platform (230) is located on the upper surface of the magnetic platform (211), a first magnetic base is provided at the bottom of the probe, and the probe is magnetically connected to the magnetic platform.

[0015] According to a photovoltaic cell temperature control test device provided by the present invention, a lifting component is provided between the semiconductor temperature control box and the temperature control base, and the lifting component is used to adjust the height of the semiconductor temperature control box.

[0016] According to a photovoltaic cell temperature control test device provided by the present invention, in the air-cooled temperature control state, the temperature control component is an air-cooled temperature control component, and the air-cooled temperature control component includes:

[0017] An air-cooled temperature control box is arranged on the temperature control base;

[0018] An air duct, wherein the air duct is provided with an air return port and an air outlet, and the air return port and the air outlet are spaced apart and arranged on the upper surface of the air-cooled temperature control box;

[0019] An air source pump is connected to the air duct and is used to transport the air source from the air outlet to the return air outlet.

[0020] According to a photovoltaic cell temperature control test device provided by the present invention, the air-cooled temperature control component also includes a fixing clamp, which is arranged between the return air port and the air outlet and is used to clamp the photovoltaic cell. The fixing clamp is connected to the test component interface for photoelectric performance parameter testing.

[0021] According to a photovoltaic cell temperature control testing device provided by the present invention, a magnetic plate is provided on the upper surface of the air-cooled temperature control box, and a second magnetic base is provided on the bottom of the fixing fixture, and the second magnetic base is magnetically connected to the magnetic plate.

[0022] According to a photovoltaic cell temperature control test device provided by the present invention, a lifting component is provided between the air-cooled temperature control box and the temperature control base, and the lifting component is used to adjust the height of the air-cooled temperature control box.

[0023] The above one or more technical solutions in the embodiments of the present invention have at least one of the following technical effects:

[0024] In the above structure, the present invention sets the temperature control component to switch between a semiconductor temperature control state and an air-cooled temperature control state. Among them, for some photovoltaic cell tests that require contact temperature control, the present invention can be switched to a semiconductor temperature control state. For some photovoltaic cells that require non-contact temperature control, the present invention can be switched to an air-cooled temperature control state. In this way, the present invention can be used to test the photoelectric performance of thin-film photovoltaic cells of different structures at different temperatures, which greatly improves the scope of application of the present invention, and also improves the accuracy and work efficiency of photovoltaic cell measurements. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0026] Figure 1 It is a schematic structural diagram of the photovoltaic cell temperature control test device provided by the present invention in a semiconductor temperature control state;

[0027] Figure 2 This is a front view of the photovoltaic cell temperature control test device provided by the present invention in a semiconductor temperature control state;

[0028] Figure 3 It is a structural schematic diagram of a temperature control base of a photovoltaic cell temperature control test device provided by the present invention;

[0029] Figure 4 It is a side view of the photovoltaic cell temperature control test device provided by the present invention in a semiconductor temperature control state;

[0030] Figure 5 It is a structural schematic diagram of the photovoltaic cell temperature control test device provided by the present invention in the air-cooled temperature control state;

[0031] Figure 6 It is a schematic structural diagram of the photovoltaic cell temperature control test device provided by the present invention in the air-cooled temperature control state without the protective cover;

[0032] Figure 7 This is a front view of the photovoltaic cell temperature control test device provided by the present invention in an air-cooled temperature control state;

[0033] Figure 8 It is a side view of the photovoltaic cell temperature control test device provided by the present invention in the air-cooled temperature control state.

[0034] Reference numerals:

[0035] 100: temperature control base; 110: base body; 111: limiter; 112: lifting hole; 113: temperature display screen; 114: lifting regulating valve; 115: power switch; 116: base exhaust port; 117: base air inlet; 120: lifting component; 131: second internal temperature test and feedback interface; 132: power supply port; 133: base body power supply port;

[0036] 200: semiconductor temperature control component; 210: semiconductor temperature control box; 211: magnetic suction platform; 212: semiconductor temperature control box exhaust port; 213: semiconductor temperature control box air inlet; 220: probe; 221: first magnetic suction base; 230: temperature control platform; 231: adsorption hole; 241: suction pump interface; 242: suction pump interface switch; 243: first test component interface; 244: external temperature tester interface; 245: internal / external temperature feedback mode switching button; 246: first internal temperature and feedback interface; 247: semiconductor temperature control box power supply inlet; 248: second test component interface;

[0037] 300: air-cooled temperature control component; 310: air-cooled temperature control box; 311: air exhaust port of the air-cooled temperature control box; 312: air inlet of the air-cooled temperature control box; 320: air return port; 330: protective cover; 331: protective cover opening; 340: air outlet; 350: fixing fixture; 360: second magnetic base. DETAILED DESCRIPTION

[0038] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0039] In the description of the embodiments of the present invention, it should be noted that, unless otherwise expressly specified and limited, the terms "first" and "second" are for the purpose of clearly explaining the numbering of product components and do not represent any substantial difference. The directions of "upper" and "lower" shall be based on the directions shown in the accompanying drawings. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present invention can be understood according to the specific circumstances. In addition, the meaning of "multiple" is two or more. In the specification, "and / or" means at least one of the connected objects, and the character " / " generally indicates that the previously associated objects are in an "or" relationship.

[0040] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0041] Reference Figures 1 to 8 The present invention provides a photovoltaic cell temperature control test device. The present invention can be used to test photovoltaic cells, including new thin-film photovoltaic cells of various materials and various specifications and structures, such as organic, perovskite, new inorganic, laminated and other thin-film photovoltaic cells.

[0042] The photovoltaic cell temperature control test device provided by the embodiment of the present invention comprises a temperature control base 100, a temperature control component and a test component interface. The temperature control component is arranged on the temperature control base 100, and is used to switch between a semiconductor temperature control state and an air-cooling temperature control state; in the semiconductor temperature control state, the temperature control component is used for contact temperature control of the photovoltaic cell; in the air-cooling temperature control state, the temperature control component is used for non-contact temperature control of the photovoltaic cell; the test component interface is arranged on the temperature control component, and is used to test the performance of the photovoltaic cell.

[0043] In the above structure, the present invention switches between a semiconductor temperature control state and an air-cooled temperature control state by setting the temperature control component. For some photovoltaic cell tests that require contact temperature control, the present invention can be switched to a semiconductor temperature control state. For some photovoltaic cells that require non-contact temperature control, the present invention can be switched to an air-cooled temperature control state. In this way, the present invention can be used for performance tests of new thin-film photovoltaic cells of different structures at different temperatures, which greatly improves the scope of application of the present invention, and also improves the accuracy and work efficiency of photovoltaic cell testing.

[0044] It is understandable that the above-mentioned "contact temperature control" means that due to some photovoltaic cell structures, the photovoltaic cells need to be placed on the surface of the temperature control platform for testing. The above-mentioned "non-contact temperature control" means that the photovoltaic cells cannot be placed on the surface of the temperature control platform during testing, and need to be erected in the air and placed in the temperature control duct. This mode is suitable for photovoltaic cell samples with poor contact temperature control effect and poor thermal conductivity.

[0045] Figure 1 A schematic structural diagram of a photovoltaic cell temperature control test device provided by an embodiment of the present invention in a semiconductor temperature control state is illustrated; Figure 2 An example of a front view of a photovoltaic cell temperature control test device provided by an embodiment of the present invention in a semiconductor temperature control state is shown; Figure 3 A schematic structural diagram of a temperature control base of a photovoltaic cell temperature control test device provided by an embodiment of the present invention is illustrated; Figure 4 The side view of the photovoltaic cell temperature control test device provided by the embodiment of the present invention in the semiconductor temperature control state is illustrated.

[0046] Reference Figures 1 to 4 In some embodiments of the present invention, in the semiconductor temperature control state, the temperature control component is a semiconductor temperature control component 200; the semiconductor temperature control component 200 includes a semiconductor temperature control box 210 and a temperature control platform 230. The semiconductor temperature control box 210 is disposed on the temperature control base 100; the temperature control platform 230 is disposed on the upper surface of the temperature control box 210, and is used to place photovoltaic cells. The temperature control platform 230 is connected to a semiconductor temperature control source, and the semiconductor temperature control source is used to adjust the temperature of the temperature control platform 230.

[0047] Specifically, the temperature control base 100 includes a base body 110, which is a rectangular box structure, and a power supply is provided inside the base body 110 to supply power to the entire device. In addition, a wiring hole is provided on the side of the base body 110 for electrical connection and signal feedback with the semiconductor temperature control component 200, supplying power to the semiconductor temperature control component 200 and feedback and adjusting the actual temperature. A power switch 115 is also provided on the front side of the base body 110 to control the switch of the power supply. When the power switch 115 is turned off, the entire device is powered off. When the power switch 115 is turned on, the power supply supplies power to the entire device. The base body 110 is provided with a base exhaust port 116 and a base air inlet 117 on the opposite sides of the base body 110, respectively, and the base exhaust port 116 and the base air inlet 117 are provided to dissipate heat inside the base body 110. Specifically, the base exhaust port 116 and the base air inlet 117 are provided on the left and right sides of the base body 110.

[0048] The semiconductor temperature control box 210 is a rectangular box structure with a cavity inside. The left and right sides of the semiconductor temperature control box 210 are respectively provided with a semiconductor temperature control box exhaust port 212 and a semiconductor temperature control box air inlet 213, which are used to ventilate and cool the inside of the semiconductor temperature control box 210. The semiconductor temperature control source is arranged inside the semiconductor temperature control box 210. The semiconductor temperature control source can be a semiconductor refrigeration sheet, and it should be noted that the semiconductor refrigeration sheet can both heat and cool. The semiconductor refrigeration sheet is connected to the temperature control platform 230 through some heat conducting parts, so as to adjust the temperature of the temperature control platform 230. The temperature control platform 230 can be a gold-plated copper plate, so that the temperature control platform 230 not only has good thermal conductivity, but also has good electrical conductivity. When performing a contact temperature control test, the photovoltaic cell needs to be placed on the temperature control platform 230. The temperature control platform 230 can not only perform temperature control for the photovoltaic cell, but also be electrically connected to an electrode of the photovoltaic cell. When testing the photovoltaic cell, it can be directly connected as an electrode of the photovoltaic cell.

[0049] The top of the base body 110 is adapted to the bottom of the semiconductor temperature control box 210, so that the two can be assembled. And the top of the base body 110 is provided with a plurality of limit members 111, and the bottom of the semiconductor temperature control box 210 is correspondingly provided with a plurality of limit holes. When the two need to be connected, just plug the limit member 111 into the inside of the limit hole. A lifting component 120 is provided between the semiconductor temperature control box 210 and the temperature control base 100, and the lifting component 120 is used to adjust the height of the semiconductor temperature control box 210, so as to match different light source systems for photoelectric performance testing. The lifting component 120 can be an electric lifting rod, and the electric lifting rod passes through the top surface of the base body 110. Specifically, the top of the base body 110 is provided with a plurality of lifting holes 112, and an electric lifting rod is provided inside each lifting hole 112. The bottom end of the electric lifting rod is fixed inside the base body 110, and the top end is connected to the semiconductor temperature control box 210. In addition, a lifting regulating valve 114 is provided on the front side of the base body 110 , and the lifting regulating valve 114 is used to control the lifting of the lifting rod.

[0050] In some possible embodiments, in order to test the temperature of the photovoltaic cell, a temperature tester is provided on the photovoltaic cell device. A temperature display screen 113 is provided on the front side of the base body 110, and the temperature display screen 113 is electrically connected to the temperature tester. The temperature display screen 113 is used to display the temperature of the photovoltaic cell. A central processing unit is also provided, and the central processing unit is electrically connected to the temperature tester and the semiconductor temperature control component 200. The temperature tester transmits the collected temperature of the photovoltaic cell to the central processing unit, and the central processing unit controls the semiconductor temperature control component 200 according to the temperature data, so that the temperature of the photovoltaic cell is adjustable within the range of 15°C-60°C. Specifically, the temperature of the photovoltaic cell is set at a standard test temperature of 25°C. The temperature control accuracy of the semiconductor temperature control component 200 can be ±0.5°C.

[0051] Reference Figure 1 In some embodiments of the present invention, the temperature control platform 230 is provided with an adsorption hole 231, and the adsorption hole 231 is arranged through the upper surface of the temperature control platform 230, and the adsorption hole is connected to an air suction pump.

[0052] Specifically, the suction pump can be arranged inside the semiconductor temperature control box 210. The adsorption hole 231 is a cylindrical hole, which passes through the surface of the temperature control platform 230 and the semiconductor temperature control box 210, and its bottom end extends to the interior of the semiconductor temperature control box 210 to communicate with the suction pump. It should be noted that the number of adsorption holes 231 is not limited to one, and multiple holes can be designed as needed. When it is necessary to test the photovoltaic cell, the photovoltaic cell can be placed on the temperature control platform 230 and the adsorption hole 231 can be covered, and then the suction pump can be started. The photovoltaic cell can be firmly adsorbed on the upper surface of the temperature control platform 230 by the suction force of the suction pump, which can avoid displacement or poor contact of the photovoltaic cell, thereby better controlling the temperature and testing the photoelectric performance of the photovoltaic cell.

[0053] Reference Figure 1 In some embodiments of the present invention, the test component interface is connected to a probe 220, and the probe 220 is provided with at least one.

[0054] When the positive and negative electrodes of the photovoltaic cell are located on two opposite surfaces thereof, the probe 220 can be one. Since the temperature control platform 230 is a gold-plated copper sheet, one electrode of the photovoltaic cell is in contact with the temperature control platform 230. Since the gold-plated copper sheet has good conductivity, it can be regarded as one electrode of the photovoltaic cell. When testing the photovoltaic cell, it is placed on the temperature control platform 230, and the probe 220 is pressed on an electrode on the upper surface of the photovoltaic cell. Then, two wires are led out from the temperature control platform 230 and the probe 220 respectively and connected to the external test system in a four-wire system. In this way, the temperature control platform 230 can both control the temperature of such photovoltaic cells and participate in testing them.

[0055] When the two electrodes of the photovoltaic cell are located on the same side, or at least one electrode is not in contact with the temperature control platform 230, two probes 220 may be provided. When testing the photovoltaic cell, it is placed on the temperature control platform 230, and the two probes 220 are pressed on the two electrodes of the photovoltaic cell respectively, and then two wires are led out from each of the two probes 220 and connected to the photovoltaic performance test instrument in a four-wire system.

[0056] Reference Figure 1 In some embodiments of the present invention, a magnetic platform 211 is provided on the upper surface of the semiconductor temperature control box 210, and the temperature control platform 230 is located on the upper surface of the magnetic platform 211, and a first magnetic base 221 is provided at the bottom of the probe 220, and the probe 220 is magnetically connected to the magnetic platform 211.

[0057] Specifically, the magnetic table 211 can be made of iron material. The magnetic table 211 is a rectangular iron plate, which is fixedly mounted on the upper surface of the semiconductor temperature control box 210 by bolts or the like. The temperature control platform 230 is fixedly mounted in the central area of ​​the magnetic table 211. A first magnetic base 221 is fixedly mounted on the bottom of the probe 220. When the probe 220 needs to be replaced, it only needs to be picked up and placed on other parts of the magnetic table 211. By means of magnetic attraction, the position of the probe 220 can be adjusted very conveniently. It should be noted that the first magnetic base 221 can be a permanent magnet or an electromagnet.

[0058] Figure 5 The schematic structural diagram of the photovoltaic cell temperature control test device provided by the embodiment of the present invention in the air-cooled temperature control state is illustrated; Figure 6 A schematic structural diagram illustrating a photovoltaic cell temperature control test device provided by an embodiment of the present invention without a protective cover in an air-cooled temperature control state; Figure 7 An example of a front view of a photovoltaic cell temperature control test device provided by an embodiment of the present invention in an air-cooled temperature control state is shown; Figure 8 The side view of the photovoltaic cell temperature control test device provided by the embodiment of the present invention in the air-cooled temperature control state is illustrated.

[0059] Reference Figures 5 to 8 In some embodiments of the present invention, in the air-cooled temperature control state, the temperature control component is an air-cooled temperature control component 300, and the air-cooled temperature control component 300 includes an air-cooled temperature control box 310, an air duct, and an air source pump. The air-cooled temperature control box 310 is arranged on the temperature control base 100; the air duct is provided with a return air port 320 and an air outlet 340, and the return air port 320 and the air outlet 340 are arranged at intervals on the upper surface of the air-cooled temperature control box 310; the air source pump, the air source pump is connected to the air duct, and the air source pump is used to transport the air source from the air outlet 340 to the return air port 320.

[0060] In the above structure, when the photovoltaic cell needs to be tested, the photovoltaic cell can be placed between the return air port 320 and the air outlet 340. Under the action of the wind source pump, the wind is blown out from the air outlet 340, enters the air duct from the return air port 320, and then circulates. The wind can control the temperature of the air and photovoltaic cell samples, so for photovoltaic cells that are not suitable for contact temperature control, the temperature can be better controlled. It should be noted that in order to obtain the appropriate wind temperature, some cold sources and heat sources can be set to adjust the temperature of the air. Make the wind in the air duct have a suitable temperature, so as to better control the temperature of the photovoltaic cell.

[0061] In some possible embodiments, in order to make the temperature of the photovoltaic cell placement area more stable, a protective cover 330 can be set between the return air port 320 and the air outlet 340, and the air-cooled temperature control box 310 and the air outlet 340 are respectively connected to the two sides of the protective cover 330. In order not to block the irradiation of the test light source to the photovoltaic cell, a protective cover opening 331 can also be set at the top of the protective cover opening 331. The light source can irradiate the photovoltaic cell through the protective cover opening 331, thereby facilitating the test of the photoelectric conversion of the photovoltaic cell.

[0062] Specifically, the temperature control base 100 includes a base body 110, which is a rectangular box structure, and a power supply is provided inside the base body 110 to supply power to the entire device. A wiring buckle is also provided on the side of the base body 110, which is used to electrically connect and feedback signals with the air-cooled temperature control component 300, and to supply power to the inside of the air-cooled temperature control component 300. The air source pump, the cold source and the heat source are all electrically connected to the power supply. A power switch 115 is also provided on the front side of the base body 110 to control the switch of the power supply. When the power switch 115 is turned off, the entire device is powered off. When the power switch 115 is turned on, the power supply supplies power to the entire device. A base exhaust port 116 and a base air inlet 117 are respectively provided on the opposite sides of the base body 110, and the base exhaust port 116 and the base air inlet 117 are provided to dissipate heat inside the base body 110. Specifically, the base air outlet 116 and the base air inlet 117 are disposed on the left and right sides of the base body 110 , and the power switch 115 is disposed on the front side of the base body 110 .

[0063] The air-cooled temperature control box 310 is a rectangular box structure with a cavity inside. The left and right sides of the air-cooled temperature control box 310 are respectively provided with an air-cooled temperature control box exhaust port 311 and an air-cooled temperature control box air inlet 312 for ventilating and cooling the inside of the air-cooled temperature control box 310. The air source pump, the cold source and the heat source are all arranged inside the air-cooled temperature control box 310.

[0064] The top of the base body 110 is adapted to the bottom of the air-cooled temperature control box 310, so that the two can be assembled. And the top of the base body 110 is provided with a plurality of limit members 111, and the bottom of the air-cooled temperature control box 310 is correspondingly provided with a plurality of limit holes. When the two need to be connected, just plug the limit member 111 into the inside of the limit hole. A lifting component 120 is provided between the air-cooled temperature control box 310 and the temperature control base 100, and the lifting component 120 is used to adjust the height of the air-cooled temperature control box 310, so as to match different light source systems for photoelectric performance testing. The lifting component 120 can be an electric lifting rod, and the electric lifting rod passes through the top surface of the base body 110. Specifically, the top of the base body 110 is provided with a plurality of lifting holes 112, and each lifting hole 112 is provided with an electric lifting rod. The bottom end of the electric lifting rod is fixed inside the base body 110, and the top end is connected to the air-cooled temperature control box 310. In addition, a lifting regulating valve 114 is provided on the front side of the base body 110 , and the lifting regulating valve 114 is used to control the lifting of the lifting rod.

[0065] In some possible embodiments, in order to test the temperature of the photovoltaic cell, an internal temperature tester is set at the air return port 320 of the protective cover. A temperature display screen 113 is provided on the front side of the base body 110, and the temperature display screen 113 is electrically connected to the internal temperature tester. The temperature display screen 113 is used to display the temperature of the photovoltaic cell. A central processing unit is also provided, and the central processing unit is electrically connected to the internal temperature tester, the wind source pump, the cold source and the heat source. The internal temperature tester transmits the collected temperature of the photovoltaic cell to the central processing unit, and the central processing unit controls the wind source pump, the cold source and the heat source according to the temperature data, so that the temperature of the photovoltaic cell is adjustable within the range of 15°C-60°C. Specifically, the temperature of the photovoltaic cell is set at a standard test temperature of 25°C. The temperature control accuracy can be ±0.5°C.

[0066] Reference Figure 6 In some embodiments of the present invention, the air-cooled temperature control assembly 300 further includes a fixing fixture 350 , which is disposed between the return air port 320 and the air outlet 340 and is used to clamp the photovoltaic cell.

[0067] The fixing fixture 350 can be specifically a 3M chip test clip. The 3M chip test clip is fixedly mounted on the upper surface of the air-cooled temperature control box 310. Four wires are led out from the 3M chip test clamp end and connected to the wiring hole 370 on the air-cooled temperature control box 310, and then connected to the photoelectric performance test system.

[0068] Reference Figure 6 In some embodiments of the present invention, a magnetic plate is provided on the upper surface of the air-cooled temperature control box 310, and a second magnetic base 360 ​​is provided on the bottom of the fixing fixture 350, and the second magnetic base 360 ​​is magnetically connected to the magnetic plate.

[0069] Specifically, the magnetic plate can be a rectangular iron plate, which is fixed on the upper surface of the air-cooled temperature control box 310 by bolts or the like. When the fixing fixture 350 needs to be replaced, it only needs to be picked up and placed on other parts of the magnetic plate. By means of magnetic attraction, the position of the fixing fixture 350 can be adjusted very conveniently. It should be noted that the second magnetic base 360 ​​can be a permanent magnet or an electromagnet.

[0070] Reference Figures 1 to 4 , the following provides an embodiment of the present invention when it is in a semiconductor temperature control state.

[0071] The front side of the semiconductor temperature control box 210 is provided with an air pump interface 241, an air pump interface switch 242, a first test component interface 243, and an external temperature tester interface 244 from left to right. The right side of the semiconductor temperature control box 210 is provided with a first internal temperature test and feedback interface 246 and a semiconductor temperature control box power supply inlet 247 from front to back. The left side of the semiconductor temperature control box 210 is provided with a second test component interface 248. The first test component interface 243 and the second test component interface 248 are electrically connected by a wire, and the wire connecting the two is set inside the semiconductor temperature control box 210.

[0072] The right side of the base body 110 is provided with a second internal temperature test and feedback interface 131 , a power supply port 132 , and a base body power supply port 133 in sequence from front to back.

[0073] When the present invention needs to be used, an external power source can be connected through the power inlet 133 of the base body, and then the power inlet 132 and the semiconductor temperature control box power inlet 247 are connected through a wire, thereby powering the semiconductor temperature control box 210 and the base body 110, and the power on and off of the entire device is controlled by the power switch 115.

[0074] In order to detect the temperature of the photovoltaic cell, an internal temperature tester can be set at the bottom of the temperature control platform 230, wherein the internal temperature tester is electrically connected to the first internal temperature and feedback interface 246, and the second internal temperature test and feedback interface 131 is electrically connected to the temperature display screen 113. When it is necessary to measure the temperature of the photovoltaic cell, the first internal temperature and feedback interface 246 can be electrically connected to the second internal temperature test and feedback interface 131 through a wire. The internal temperature tester transmits the detected temperature to the temperature display screen 113, and the temperature display screen 113 displays the temperature.

[0075] In other possible embodiments, an external temperature tester can also be connected, the external temperature test probe is placed in a suitable position, and then it is electrically connected to the external temperature tester interface 244, and the external temperature tester interface 244 is also electrically connected to the temperature display screen 113. In this way, the temperature detected by the external temperature tester can be displayed through the temperature display screen 113. The internal / external temperature feedback mode switching button 245 is used to control the connection object and the internal or external feedback mode of the switching temperature display screen 113. When the internal / external temperature feedback mode switching button 245 is in the first switching position, the temperature display screen 113 is used to display the temperature of the internal temperature tester. When the second switching position, the temperature display screen 113 is used to display the temperature of the external temperature tester. It should be noted that the internal temperature tester is fixedly installed on this device, and the external temperature tester can be selected and replaced at will. The role of setting the external temperature tester interface 244 and the internal / external temperature feedback mode switching button 245 is to increase the way of temperature detection.

[0076] In order to make the structure of the present invention compact, when the present invention is used, the suction pump is arranged outside the present device, and the suction pump only needs to be connected to the suction pump interface 241. The suction pump interface switch 242 is used to control the suction pump to be connected to the present invention.

[0077] When testing the photovoltaic cell, place it on the temperature control platform 230, press the probe 220 on an electrode on the upper surface of the photovoltaic cell, turn on the suction pump interface switch, and then lead two wires from the temperature control platform 230 and the probe 220, and connect the connectors of the wires to the four first test component interfaces 243 on the front side. Since the first test component interface 243 is connected to the second test component interface 248 through a wire, the photovoltaic cell can be measured by connecting the external test system to the four second test component interfaces 248 on the left side.

[0078] It should be noted that when the present invention is in an air-cooled temperature control state: the specific connection can refer to the above embodiment and will not be repeated here.

[0079] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A photovoltaic cell temperature control test device, characterized in that: include: Temperature control base (100); A temperature control component, which is arranged on the temperature control base (100) and connected and fed back via a signal line, and is used to switch between a semiconductor temperature control state and an air cooling temperature control state; In the semiconductor temperature control state, the temperature control component is used to perform contact temperature control on the photovoltaic cell; in the air-cooled temperature control state, the temperature control component is used to perform non-contact temperature control on the photovoltaic cell; A test component interface, which is integrated in the temperature control component and is used to connect the photovoltaic cell to an external test system to test the photoelectric performance of the photovoltaic cell; In the semiconductor temperature control state, the temperature control component is a semiconductor temperature control component (200), the semiconductor temperature control component (200) comprises a semiconductor temperature control box (210) and a temperature control platform (230), the semiconductor temperature control box (210) is arranged on the temperature control base (100); the temperature control platform (230) is arranged on the upper surface of the semiconductor temperature control box (210) and is used to place the photovoltaic cell, the temperature control platform (230) is connected to a semiconductor temperature control source, and the semiconductor temperature control source is used to adjust the temperature of the temperature control platform (230); The temperature control platform (230) is provided with an adsorption hole (231), the adsorption hole (231) is provided through the temperature control platform (230), and the adsorption hole (231) is connected to an air suction pump; The test component interface is connected to a probe (220), and the probe (220) is provided with at least one; A magnetic suction platform (211) is provided on the upper surface of the semiconductor temperature control box (210), and the temperature control platform (230) is located on the upper surface of the magnetic suction platform (211). A first magnetic suction base (221) is provided at the bottom of the probe (220), and the probe (220) is magnetically connected to the magnetic suction platform (211).

2. The photovoltaic cell temperature control test device according to claim 1, characterized in that: A lifting component is provided between the semiconductor temperature control box (210) and the temperature control base (100), and the lifting component (120) is used to adjust the height of the semiconductor temperature control box (210).

3. The photovoltaic cell temperature control test device according to claim 1, characterized in that: In the air-cooling temperature control state, the temperature control component is an air-cooling temperature control component (300), and the air-cooling temperature control component (300) comprises: An air-cooled temperature control box (310) is disposed on the temperature control base (100); An air duct, wherein the air duct is provided with an air return port (320) and an air outlet (340), and the air return port (320) and the air outlet (340) are arranged at intervals on the upper surface of the air-cooled temperature control box (310); An air source pump is connected to the air duct and is used to transport air from the air outlet (340) to the return air outlet (320).

4. The photovoltaic cell temperature control test device according to claim 3, characterized in that: The air-cooled temperature control component (300) also includes a fixing clamp (350), which is arranged between the return air port (320) and the air outlet (340) and is used to clamp the photovoltaic cell. The fixing clamp (350) is connected to the test component interface and is used for photoelectric performance parameter testing.

5. The photovoltaic cell temperature control test device according to claim 4, characterized in that: The upper surface of the air-cooled temperature control box (310) is provided with a magnetic plate, and the bottom of the fixing fixture (350) is provided with a second magnetic base (360), and the second magnetic base (360) is magnetically connected to the magnetic plate.

6. The photovoltaic cell temperature control test device according to any one of claims 3 to 5, characterized in that: A lifting component (120) is provided between the air-cooled temperature-controlled box (310) and the temperature-controlled base (100), and the lifting component (120) is used to adjust the height of the air-cooled temperature-controlled box (310).

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