A method and device for batch measurement of contact resistance

Abstract

The present application discloses a batch measurement method and device for contact resistance, belonging to the field of electronic detection technology. The present application connects one end of all contact resistors to a measurement port pair including a power port and a voltage measurement port, and multiple contact resistors are used as a large contact resistor group. The other end of each contact resistor in the same large contact resistor group is short-circuited. According to the connection position of the contact resistor to be measured in the large contact resistor group, the current or voltage is controlled to be applied between the selected power ports, and the voltage is controlled to be measured between the selected voltage measurement ports, thereby calculating the resistance value of the contact resistor to be measured based on the four-wire method; the technical solution of the present application is adopted without flying wires or switching units to achieve the measurement of a large number of contact resistors.

Description

Technical Field

[0001] The present application belongs to the field of electronic detection technology, and more specifically, relates to a batch measurement method and device for contact resistance. Background Art

[0002] With the development of automatic testing, more and more crimping and buckling are applied to the detection field. Ensuring the reliability of crimping and buckling is a critical part. Measuring the contact resistance can reflect whether the connection between conductors is tight, so accurate and fast measurement of a large number of contact resistances has become an urgent need.

[0003] The resistance of contact resistance is usually small, ranging from tens to hundreds of milliohms. In order to accurately measure the resistance of contact resistance, the four-wire method with higher accuracy is usually used. Figure 1 The diagram shows the port connection diagram when a large number of contact resistances are currently measured using the four-wire method. In the figure, the S+ / S- port is the voltage measurement port of the measurement unit; F+ / F- is the power port of the measurement unit; the F+ / S+ port of the measurement unit is converted to N groups of F+ / S+ terminals through a switching unit, and the N groups of F+ / S+ terminals are respectively connected to the crimping terminals of N contact resistances DUT to be measured, and the F- / S- terminal of the measurement unit is connected to the crimped terminals of all contact resistances DUT to be measured by flying wires. During detection, the F+ / S+ terminal of the measurement unit is switched to the crimping terminal of each contact resistance DUT to be measured in turn by the switching unit to detect the contact resistance to be measured until the resistance value detection of all contact resistances to be measured is completed. The existing four-wire method measurement has the following defects: 1. The measurement unit needs to connect the F- / S- terminal of the contact resistance with a flying wire; 2. An additional switching unit is used to switch the measurement port in turn to realize the detection of a large number of contact resistances in turn, and a large number of contact resistances cannot be measured and detected in batches. Summary of the invention

[0004] In view of the above defects or improvement needs of the prior art, the present application provides a batch measurement method and device for contact resistance, which aims to solve the problem that a large number of contact resistances cannot be measured in batches at present.

[0005] To achieve the above objectives, in a first aspect, the present application provides a batch measurement method for contact resistance, comprising:

[0006] Connecting the first end of each contact group to a measurement port pair, each measurement port pair consisting of a power supply port and a voltage measurement port;

[0007] Will The contact resistors are regarded as a large contact resistor group, and the second ends of the contact resistors in the same large contact resistor group are short-circuited. ;

[0008] Select two contact resistors different from the contact resistor to be measured from the contact resistor group to which the contact resistor to be measured belongs, select a power port and a voltage measurement port that do not belong to the same measurement port pair from the measurement port pair connected to the two selected contact resistors, and use the four-wire method to measure the resistance value of the contact resistor to be measured in conjunction with the power port and the measurement port connected to the contact resistor to be measured:

[0009] Apply a constant voltage or a constant current between two power ports to obtain the current flowing between the ports ;Measure the voltage between two voltage measurement ports ; The resistance of the contact resistance to be measured .

[0010] Preferably, all contact resistances of the product to be tested are divided into a plurality of large contact resistance groups, and the contact resistances in at least some of the large contact resistance groups are measured synchronously.

[0011] Preferably, all contact resistances of the product to be tested are divided into a plurality of large contact resistance groups, and the contact resistances in the plurality of large contact resistance groups are measured in sequence.

[0012] Preferably, the measurement port pairs connected to all the contact resistors in the contact resistance group form a measurement group, and multiple measurement groups are multiplexed. identical pairs of measurement ports;

[0013] like , ; The following method is used to measure the contact resistance connected to the multiplexed measurement port pair:

[0014] Multiplexing in a large measurement group The measurement port pairs are divided into the first measurement unit group, and the other measurement port pairs in the measurement group are divided into the second measurement unit group;

[0015] A power port and a voltage measurement port that do not belong to the same measurement port pair are selected from the second measurement unit group, and the resistance value of the contact resistance to be measured is measured by a four-wire method in conjunction with the power port and the measurement port connected to the contact resistance to be measured.

[0016] Preferably, , =2.

[0017] Preferably, , =2; for any large contact group, it includes a first contact resistor, a second contact resistor, a third contact resistor and a fourth contact resistor; the first contact resistor is connected to the first measurement port pair, the second contact resistor is connected to the second measurement port pair, the third contact resistor is connected to the third measurement port pair, and the fourth contact resistor is connected to the fourth measurement port pair;

[0018] The first measurement port pair and the second measurement port pair form a first measurement unit group, and the third measurement port pair and the fourth measurement port pair form a second measurement unit group;

[0019] Select a power port and a voltage measurement port that do not belong to the same measurement port pair from the first measurement unit group to form a first port pair; use a four-wire method to measure the third contact resistance in the first port pair and the third measurement port pair; use a four-wire method to measure the fourth contact resistance in the first port pair and the fourth measurement port pair;

[0020] A power port and a voltage measurement port that do not belong to the same measurement port pair are selected from the second measurement unit group to form a second port pair; a four-wire method is used to measure the first contact resistance in the second port pair and the first measurement port pair; and a four-wire method is used to measure the second contact resistance in the second port pair and the second measurement port pair.

[0021] In a second aspect, the present application provides a batch measurement device for contact resistance, the batch measurement device comprising a plurality of power ports, a plurality of voltage measurement ports, a control module, a calculation module, a power module and a voltage measurement module, wherein:

[0022] The control module is electrically connected to the calculation module, the power supply module and the voltage measurement module respectively;

[0023] The power supply module is connected to a plurality of power supply ports, and the voltage measurement module is connected to a plurality of voltage measurement ports;

[0024] A power port and a voltage measurement port form a measurement port pair, and the measurement port pair is used to connect to one end of the contact resistor;

[0025] The control module is used to Each measurement port pair is divided into a measurement group. ; Select two contact resistors different from the contact resistance to be measured from the measurement group, select a power port and a voltage measurement port that do not belong to the same measurement port pair from the measurement port pairs connected to the two selected contact resistors, and use a four-wire method to measure the resistance value of the contact resistance to be measured by coordinating the power port and the measurement port connected to the contact resistance to be measured:

[0026] The power module is used to apply a constant voltage or a constant current between two power ports to obtain a current flowing between the ports. ;

[0027] The voltage measurement module is used to measure the voltage between two voltage measurement ports. ;

[0028] The calculation unit is used to calculate the resistance of the contact resistance to be measured. .

[0029] Preferably, the power module includes a plurality of power chips, the voltage measurement module includes a plurality of voltage measurement chips, the plurality of power chips are connected to a plurality of power ports in a one-to-one correspondence, and the plurality of voltage measurement chips are connected to a plurality of voltage measurement ports in a one-to-one correspondence;

[0030] Applying a constant voltage or current between the two power ports through two power chips connected to the two power ports;

[0031] The voltage between the two voltage measurement ports is measured by two voltage measurement chips connected to the two voltage measurement ports.

[0032] Preferably, all contact resistances of the product to be tested are divided into a plurality of large contact resistance groups, and the control module is further used to control the batch measurement device to perform parallel synchronous measurement on at least part of the large contact resistance groups.

[0033] Preferably, the batch measurement device includes but is not limited to using a CPU, FPGA, DSP, ASIC or GPU to simultaneously implement the functions of the control module and the calculation module.

[0034] In a third aspect, the present application provides a measurement system, which includes any one of the batch measurement devices described in the second aspect, and also includes a crimping module; the crimping module is electrically connected to the batch measurement device and is used to crimp and connect the product to be measured.

[0035] In general, the above technical solutions conceived by this application have the following beneficial effects compared with the prior art:

[0036] (1) The present application connects one end of all contact resistors to a measurement port pair including a power port and a voltage measurement port. The multiple contact resistors are grouped as a large contact resistor group. The other end of each contact resistor in the same large contact resistor group is short-circuited. According to the connection position of the contact resistor to be measured in the large contact resistor group, the current or voltage is controlled to be applied between the selected power ports, and the voltage is controlled to be measured between the selected voltage measurement ports. The resistance value of the contact resistor to be measured is calculated based on the four-wire method. The technical solution of the present application can be used to measure a large number of contact resistors without the need for flying wires or switching units.

[0037] (2) The present application divides the contact resistance into multiple large groups. One end of all the contact resistances in each contact resistance large group is short-circuited, and the other end is connected to a measurement port pair. The measurement port pairs connected to all the contact resistances in the contact resistance large group constitute a measurement large group. In different measurement large groups, current or voltage is controlled to be applied between some ports, and voltage is measured between other ports. In this way, different measurement large groups are used to realize synchronous and parallel measurement of contact resistances between contact resistance large groups. Compared with the existing method, the present application realizes batch measurement of a large number of contact resistances.

[0038] (3) In the present application, since each group of contact resistances is not connected to each other, when different measurement groups are used to batch measure different contact resistance groups, the same one or more measurement port pairs can be reused in multiple measurement groups. Thus, by reusing the measurement port pairs, the purpose of testing a large number of contact resistances by using a small number of measurement units can be achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 This is a schematic diagram of the existing four-wire method for batch measurement of a large number of contact resistances;

[0040] Figure 2 It is a schematic diagram of synchronous batch measurement of contact resistances in a large group of multiple contact resistances provided in an embodiment of the present application;

[0041] Figure 3 is a contact resistance measurement equivalent circuit diagram provided in an embodiment of the present application;

[0042] Figure 4 It is a schematic diagram of measuring the contact resistances in a plurality of contact resistance groups in sequence and step by step according to an embodiment of the present application;

[0043] Figure 5 It is a schematic diagram of the structure of a contact resistance batch measurement device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0045] The terms "first" and "second" in the specification and claims herein are used to distinguish different objects rather than to describe a specific order of objects. For example, the first measurement group and the second measurement group are used to distinguish different measurement groups rather than to describe a specific order of measurement groups.

[0046] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0047] In the description of the embodiments of the present application, unless otherwise specified, “plurality” means two or more than two. For example, “plurality of measurement port pairs” means two or more than two measurement port pairs.

[0048] Figure 2 This is a schematic diagram of Example 1 of the present application.

[0049] Schematic diagram of synchronous batch measurement of contact resistance.

[0050] In this embodiment, there are multiple contact resistors DUT1~DUT12 to be tested. As shown in the figure, the 12 contact resistors are evenly divided into 3 groups (a first contact resistor large group, a second contact resistor large group, and a third contact resistor large group). Each group contains 4 contact resistors. The crimped sides of the 4 contact resistors in each group are short-circuited together to form a contact resistor large group.

[0051] The crimping end of each contact group is connected to a measurement port pair, and each measurement port pair (F0 / S0, ​​F1 / S1, F2 / S2, ..., Fn / Sn) consists of one voltage measurement port S and one power port F. In this embodiment, the batch measurement device has multiple voltage measurement ports S and multiple power ports F.

[0052] The measurement port pairs connected to all contact resistances in the contact resistance group form a measurement group. As shown in the figure, F0 / S0, ​​F1 / S1, F2 / S2 and F3 / S3 are the first measurement group; F0 / S0, ​​F1 / S1, F4 / S4 and F5 / S5 are the second measurement group; F0 / S0, ​​F1 / S1, F6 / S6 and F7 / S7 are the third measurement group.

[0053] To measure the contact resistance of multiple contact resistance groups simultaneously, The measurement port pairs are divided into the first measurement unit group, and the other measurement port pairs in the measurement group are divided into the second measurement unit group. In the embodiment, the measurement port pairs multiplexed in the three measurement groups are F0 / S0 and F1 / S1.

[0054] Then in the first measurement group:

[0055] The multiplexed measurement port pairs F0 / S0 and F1 / S1 are grouped as one measurement unit, and F2 / S2 and F3 / S3 are grouped as one measurement unit;

[0056] Then in the second measurement group:

[0057] The measurement port pairs F0 / S0 and F1 / S1 are grouped as one measurement unit, and F4 / S4 and F5 / S6 are grouped as one measurement unit;

[0058] Then in the third measurement group:

[0059] The measurement port pairs F0 / S0 and F1 / S1 are grouped as one measurement unit, and F6 / S6 and F7 / S7 are grouped as one measurement unit.

[0060] (1) Within the contact resistance group, measure the contact resistance of each contact resistance in series:

[0061] In this embodiment, in the first contact resistance group, the four-wire method is used through ports F0, S0, S2, and F3 to accurately measure the resistance of the contact resistance DUT1; a constant current is applied between the power supply ports F0 and F3, and the voltage between the voltage measurement ports S0 and S2 is measured at the same time. Its equivalent circuit is as follows: Figure 3 As shown, the circuit analysis is as follows:

[0062] Current I After passing through DUT1, it enters DUT4. Since the internal resistance between the voltage measurement ports S0 and S2 is very large, the current I entering DUT3 DUT3 Very small, so the voltage I DUT3 ×DUT3 is much smaller than the voltage I across DUT1 DUT1 ×DUT1. Voltage measurement values ​​of voltage measurement ports S0 and S2 U is the voltage sum of DUT1 and DUT3. Since the voltage of DUT3 is much smaller than that of DUT1, the voltage measurement values ​​of voltage measurement ports S0 and S2 are U It can be regarded as the voltage across the resistor DUT1. The final resistance of DUT1 is:

[0063]

[0064] Then, ports F1, S1, S2, and F3 are selected to use the four-wire method to accurately measure the resistance of the contact resistance DUT2;

[0065] Select ports in a symmetrical manner to measure the resistance of DUT3 and DUT4:

[0066] Select ports F2, S2, S0, and F1 to use the four-wire method to accurately measure the resistance of the contact resistance DUT3;

[0067] Select ports F3, S3, S0, and F1 and use the four-wire method to accurately measure the resistance of the contact resistance DUT4.

[0068] Thus, the current passing between different ports in the first measurement group is controlled in sequence, the voltage between different ports is measured, and the resistance values ​​of all contact resistors in the first contact resistance group are obtained in sequence.

[0069] (2) Between contact resistance groups, the contact resistance in different contact resistance groups is measured synchronously and in parallel:

[0070] When performing parallel synchronous measurement between large contact resistance groups, if , ; The following method is used to measure the contact resistance connected to the multiplexed measurement port pair:

[0071] Multiplexing in a large measurement group The measurement port pairs are divided into the first measurement unit group, and the other measurement port pairs in the measurement group are divided into the second measurement unit group;

[0072] A power port and a voltage measurement port that do not belong to the same measurement port pair are selected from the second measurement unit group, and the resistance value of the contact resistance to be measured is measured by a four-wire method in conjunction with the power port and the measurement port connected to the contact resistance to be measured.

[0073] In this embodiment, DUT1, DUT5 and DUT9 are measured synchronously:

[0074] The F0, S0, S2, and F3 ports in the first measurement group are used to measure DUT1 in the first contact resistance group using a four-wire method;

[0075] The F0, S0, S4, and F5 measurement port pairs in the second measurement group are used to measure DUT1 in the second contact resistance group using four lines;

[0076] The F0, S0, S6, and F7 measurement ports in the third measurement group are used to measure DUT9 in the third contact resistance group using a four-wire method;

[0077] Since the first contact resistance group, the second contact resistance group and the third contact resistance group are not connected, the same measurement port pair F0 / S0 can be used to simultaneously measure different contact resistances between different contact resistance groups. In this embodiment, the measurement port pairs F0 / S0 and F1 / S1 are reused in the first measurement group, the second measurement group and the third measurement group, and the contact resistances DUT1, DUT5 and DUT9 can be measured in parallel using the first measurement group, the second measurement group and the third measurement group, respectively.

[0078] In this embodiment, all contact resistances of the product to be tested are divided into three large contact resistance groups, and the contact resistances in the three large contact resistance groups are measured synchronously. It can be seen that the present application realizes the synchronous and parallel measurement of contact resistances in multiple large contact resistance groups, thereby improving the efficiency of contact resistance measurement.

[0079] In the present embodiment, the measurement port pairs F0 / S0 and F1 / S1 are multiplexed in the three measurement groups. By selecting the limited four ports and adopting the four-wire method, the synchronous parallel measurement of the contact resistance is realized when multiple port pairs are multiplexed. This not only improves the efficiency of the contact resistance measurement, but also improves the utilization rate of the port pairs by multiplexing the port pairs, so that the measuring device can synchronously measure more contact resistance groups with fewer measurement port pairs.

[0080] In this embodiment, 4 ( ) contact resistances as a contact resistance group, and each contact resistance group corresponds to a measurement group that reuses 2 ( =2) measurement port pairs, grouping two measurement port pairs as a measurement unit. Under this grouping and multiplexing condition, the utilization rate of the measurement port pairs in synchronous parallel measurement is the highest. measurement unit groups, each measurement unit group contains 2 measurement port pairs; 2 measurement unit groups constitute each measurement group ( ), one measurement unit group can be reused in a large measurement group ( =2), then the measurement group has Combination methods can be achieved Thus, by multiplexing the measurement port pairs, it is possible to measure a large number of contact resistances using a small number of measurement port pairs.

[0081] In this embodiment, the ports selected for measuring DUT1 and DUT2 are F0, S0, S2, F3 and F1, S1, S2, F3; the ports selected for measuring DUT3 and DUT4 are F2, S2, S0, F1 and F3, S3, S0, F1. In form, the ports selected for measuring DUT1 and DUT2 and the ports selected for measuring DUT3 and DUT4 are symmetrical. By selecting the ports in a symmetrical manner and using the four-wire method to measure the contact resistance, the realization of the automated measurement program can be facilitated, thereby improving the measurement efficiency.

[0082] Figure 4 This is a schematic diagram of Example 2 of the present application.

[0083] A schematic diagram of the step-by-step measurement of contact resistance.

[0084] In this embodiment, there are multiple contact resistors DUT1~DUT12 to be tested. As shown in the figure, the 12 contact resistors are evenly divided into 3 groups (a first contact resistor large group, a second contact resistor large group, and a third contact resistor large group). Each group contains 4 contact resistors. The crimped sides of the 4 contact resistors in each group are short-circuited together to form a contact resistor large group.

[0085] The crimping end of each contact group is connected to a measurement port pair, and each measurement port pair (F0 / S0, ​​F1 / S1, F2 / S2, ..., Fn / Sn) consists of one voltage measurement port S and one power port F. In this embodiment, the batch measurement device has multiple voltage measurement ports S and multiple power ports F.

[0086] The measurement port pairs connected to all contact resistances in the contact resistance group form a measurement group. As shown in the figure, F0 / S0, ​​F1 / S1, F2 / S2 and F4 / S4 are the first measurement group; F0 / S0, ​​F1 / S1, F2 / S2 and F5 / S5 are the second measurement group; F0 / S0, ​​F1 / S1, F2 / S2 and Fn / Sn are the third measurement group.

[0087] Select the port to measure all contact resistances in series using the four-wire method:

[0088] First, measure the contact resistance in the first contact resistance group in sequence:

[0089] The resistance value of DUT1 is measured by 4-wire measurement method composed of F0, S0, S2 and F4;

[0090] The resistance value of DUT2 is measured by 4-wire measurement method composed of F1, S1, S2 and F4;

[0091] Select ports in a symmetrical manner to measure the resistance of DUT3 and DUT4:

[0092] The resistance value of DUT3 is measured by forming a 4-wire measurement method using F2, S2, S0, and F1.

[0093] The resistance value of DUT4 is measured by using the 4-wire measurement method composed of F4, S4, S0, and F1.

[0094] Then measure the contact resistance in the second contact resistance group in turn:

[0095] The resistance value of DUT5 is measured by forming a 4-wire measurement method using F0, S0, S2, and F5.

[0096] The resistance value of DUT6 is measured by 4-wire measurement method composed of F1, S1, S2 and F5;

[0097] Select ports in a symmetrical manner to measure the resistance of DUT7 and DUT8:

[0098] The resistance value of DUT7 is measured by 4-wire measurement method composed of F2, S2, S0 and F1;

[0099] The resistance of DUT8 is measured by using the 4-wire measurement method composed of F5, S5, S0, and F1.

[0100] Finally, measure the contact resistances in the third contact resistance group in turn:

[0101] The resistance value of DUT9 is measured by 4-wire measurement method composed of F0, S0, S2 and Fn;

[0102] The resistance value of DUT10 is measured by 4-wire measurement method composed of F1, S1, S2 and Fn;

[0103] Select ports in a symmetrical manner to measure the resistance of DUT11 and DUT12:

[0104] The resistance value of DUT11 is measured by forming a 4-wire measurement method using F2, S2, S0, and F1.

[0105] The resistance value of DUT12 is measured by a 4-wire measurement method composed of Fn, Sn, S0, and F1.

[0106] In this embodiment, since all contact resistances are measured serially in sequence, the same power supply port or voltage measurement port can be selected in different test groups, thereby enabling the measurement of more contact resistances with a small number of ports.

[0107] In this embodiment, the contact resistance is measured by using a four-wire method by selecting ports in a symmetrical manner, which can facilitate the implementation of an automated measurement program and improve measurement efficiency.

[0108] Figure 5 It is a schematic diagram of Example 3 of the present application.

[0109] Schematic diagram of a batch measurement device for contact resistance.

[0110] As shown in the figure, the batch measurement device includes multiple power ports, multiple voltage measurement ports, a control module, a calculation module, a power module and a voltage measurement module, wherein:

[0111] The control module is electrically connected to the calculation module, the power supply module and the voltage measurement module respectively;

[0112] The power module is connected to a plurality of power ports, and the voltage measurement module is connected to a plurality of voltage measurement ports;

[0113] A power port and a voltage measurement port form a measurement port pair, and the measurement port pair is used to connect to one end of the contact resistor;

[0114] The control module is used to Each measurement port pair is divided into a measurement group. ; Select two contact resistors different from the contact resistance to be measured from the measurement group, select a power port and a voltage measurement port that do not belong to the same measurement port pair from the measurement port pairs connected to the two selected contact resistors, and use a four-wire method to measure the resistance value of the contact resistance to be measured by coordinating the power port and the measurement port connected to the contact resistance to be measured:

[0115] The power module is used to apply a constant voltage or a constant current between two power ports to obtain the current flowing between the ports. ;

[0116] The voltage measurement module is used to measure the voltage between two voltage measurement ports. ;

[0117] The calculation unit is used to calculate the resistance of the contact resistance to be measured .

[0118] As a preferred implementation, the power module includes a plurality of power chips, and the voltage measurement module includes a plurality of voltage measurement chips.

[0119] A plurality of power supply chips are connected to a plurality of power supply ports in a one-to-one correspondence, and a plurality of voltage measurement chips are connected to a plurality of voltage measurement ports in a one-to-one correspondence;

[0120] Applying a constant voltage or current between the two power ports through two power chips connected to the two power ports;

[0121] The voltage between the two voltage measurement ports is measured by two voltage measurement chips connected to the two voltage measurement ports.

[0122] As a preferred implementation, all contact resistances of the product to be tested are divided into a plurality of large contact resistance groups, and the control module is further used to control the batch measurement device to perform parallel synchronous measurement on at least part of the large contact resistance groups.

[0123] As a preferred implementation, the batch measurement device includes but is not limited to using a CPU, FPGA, DSP, ASIC or GPU to simultaneously implement the functions of the control module and the calculation module.

[0124] In the present embodiment, a batch measurement device with multiple voltage measurement ports and power supply ports is designed, a power supply port and a voltage measurement port are combined into a measurement port pair, and the measurement port pair is connected to one end of the contact resistor; according to the connection position of the contact resistance to be measured in the contact resistance group, the current or voltage is controlled to be applied between the selected power supply ports, and the voltage is controlled to be measured between the selected voltage measurement ports, thereby calculating the resistance value of the contact resistance to be measured based on the four-wire method; thus, the measurement of a large number of contact resistances can be achieved without flying wires or switching units.

[0125] In this embodiment, multiple power chips are connected to the power ports in a one-to-one correspondence, and multiple voltage measurement chips are connected to the voltage measurement ports in a one-to-one correspondence, thereby controlling the voltage and current between different power ports more simply and directly, and measuring the voltage between different voltage measurement ports is also more simply and directly.

[0126] In this embodiment, by dividing into a plurality of large measurement groups, batch measurement of contact resistance in a plurality of large contact resistance groups is achieved, and the measurement efficiency is higher than that of the prior art.

[0127] In this embodiment, a variety of hardware are proposed to simultaneously realize the functions of the control module and the calculation module, which simplifies the device design.

[0128] The present application also implements an embodiment of a measurement system, which includes a batch measurement device for contact resistance and a crimping module; the crimping module is electrically connected to the batch measurement device and is used to crimp and connect the product to be measured.

[0129] The system in this embodiment can realize the measurement of a large number of contact resistances without the need for flying wires and switching devices.

[0130] It should be understood that the above-mentioned device is used to execute the method in the above-mentioned embodiment. The implementation principle and technical effect of the corresponding units in the device are similar to those described in the above-mentioned method. The working process of the device can refer to the corresponding process in the above-mentioned method, which will not be repeated here.

[0131] It should be understood that the various numerical numbers involved in the embodiments of the present application are only used for the convenience of description and are not used to limit the scope of the embodiments of the present application.

[0132] The above content is easily understood by those skilled in the art. The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application should be included in the protection scope of the present application.

Claims

1. A batch measurement method of contact resistance, which can realize the measurement of a large number of contact resistances without flying wires or switching units, characterized in that: include: Connecting the first end of each contact group to a measurement port pair, each measurement port pair consisting of a power supply port and a voltage measurement port; Will The contact resistors are regarded as a large contact resistor group, and the second ends of the contact resistors in the same large contact resistor group are short-circuited. ; Select two contact resistors different from the contact resistor to be measured from the contact resistor group to which the contact resistor to be measured belongs, select a power port and a voltage measurement port that do not belong to the same measurement port pair from the measurement port pair connected to the two selected contact resistors, and use the four-wire method to measure the resistance value of the contact resistor to be measured in conjunction with the power port and the measurement port connected to the contact resistor to be measured: Apply a constant voltage or a constant current between two power ports to obtain the current flowing between the ports ;Measure the voltage between two voltage measurement ports ; The resistance of the contact resistance to be measured .

2. The batch measurement method according to claim 1, characterized in that: All contact resistances of the product to be tested are divided into a plurality of large contact resistance groups, and the contact resistances in at least some of the large contact resistance groups are measured synchronously.

3. The batch measurement method according to claim 1, characterized in that: All contact resistances of the product to be tested are divided into a plurality of large contact resistance groups, and the contact resistances in the plurality of large contact resistance groups are measured in sequence.

4. The batch measurement method according to claim 2, characterized in that: The measurement port pairs connected to all contact resistances in the contact resistance group form a measurement group. Multiple measurement groups can be reused. identical pairs of measurement ports; like , ; The following method is used to measure the contact resistance connected to the multiplexed measurement port pair: Multiplexing in a large measurement group The measurement port pairs are divided into the first measurement unit group, and the other measurement port pairs in the measurement group are divided into the second measurement unit group; A power port and a voltage measurement port that do not belong to the same measurement port pair are selected from the second measurement unit group, and the resistance value of the contact resistance to be measured is measured by a four-wire method in conjunction with the power port and the measurement port connected to the contact resistance to be measured.

5. The batch measurement method according to claim 4, characterized in that: , =2; for any large contact group, it includes a first contact resistor, a second contact resistor, a third contact resistor and a fourth contact resistor; the first contact resistor is connected to the first measurement port pair, the second contact resistor is connected to the second measurement port pair, the third contact resistor is connected to the third measurement port pair, and the fourth contact resistor is connected to the fourth measurement port pair; The first measurement port pair and the second measurement port pair form a first measurement unit group, and the third measurement port pair and the fourth measurement port pair form a second measurement unit group; Select a power port and a voltage measurement port that do not belong to the same measurement port pair from the first measurement unit group to form a first port pair; use a four-wire method to measure the third contact resistance in the first port pair and the third measurement port pair; use a four-wire method to measure the fourth contact resistance in the first port pair and the fourth measurement port pair; Select a power port and a voltage measurement port that do not belong to the same measurement port pair from the second measurement unit group to form a second port pair; use a four-wire method to measure the first contact resistance in the second port pair and the first measurement port pair; The second contact resistance is measured using a four-wire method in the second port pair and the second measurement port pair.

6. A batch measurement device for contact resistance, which can realize the measurement of a large number of contact resistances without flying wires or switching units, characterized in that: The device comprises a plurality of power ports, a plurality of voltage measurement ports, a control module, a calculation module, a power module and a voltage measurement module, wherein: The control module is electrically connected to the calculation module, the power supply module and the voltage measurement module respectively; The power supply module is connected to a plurality of power supply ports, and the voltage measurement module is connected to a plurality of voltage measurement ports; A power port and a voltage measurement port form a measurement port pair, and the measurement port pair is used to connect to one end of the contact resistor; The control module is used to Each measurement port pair is divided into a measurement group. ; Select two contact resistors different from the contact resistance to be measured from the measurement group, select a power port and a voltage measurement port that do not belong to the same measurement port pair from the measurement port pairs connected to the two selected contact resistors, and use a four-wire method to measure the resistance value of the contact resistance to be measured by coordinating the power port and the measurement port connected to the contact resistance to be measured: The power module is used to apply a constant voltage or a constant current between two power ports to obtain a current flowing between the ports. ; The voltage measurement module is used to measure the voltage between two voltage measurement ports. ; The calculation module is used to calculate the resistance of the contact resistance to be measured. .

7. The batch measuring device according to claim 6, characterized in that: The power module includes a plurality of power chips, the voltage measurement module includes a plurality of voltage measurement chips, the plurality of power chips are connected to a plurality of power ports in a one-to-one correspondence, and the plurality of voltage measurement chips are connected to a plurality of voltage measurement ports in a one-to-one correspondence; Applying a constant voltage or current between the two power ports through two power chips connected to the two power ports; The voltage between the two voltage measurement ports is measured by two voltage measurement chips connected to the two voltage measurement ports.

8. The batch measurement device according to claim 6, characterized in that: All contact resistances of the product to be tested are divided into a plurality of large contact resistance groups, and the control module is further used to control the batch measurement device to perform parallel synchronous measurement on at least part of the large contact resistance groups.

9. The batch measurement device according to claim 6, characterized in that: The batch measurement device includes but is not limited to using a CPU, FPGA, DSP, ASIC or GPU to simultaneously realize the functions of the control module and the calculation module.

10. A measurement system based on the batch measurement device according to any one of claims 6 to 9, characterized in that: The system includes the batch measuring device as described in claims 6-9, and also includes a crimping module; the crimping module is electrically connected to the batch measuring device and is used to crimp and connect the product to be measured.

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