Aging fault monitoring system for vehicle-mounted equipment

Abstract

The present invention discloses an aging fault monitoring system for vehicle-mounted equipment, and relates to the technical field of electronic equipment aging. The present invention includes a control module and a power supply module, and also includes an acquisition module, a test platform and a monitoring module. The control module includes an industrial computer and an analog output module. The industrial computer sends control instructions and receives return messages through an RS232-RS485 converter, and sends and receives Can messages through a USB-Can converter; the analog output module sends analog voltage output, and the power supply module includes an equipment power supply module, a short-circuit protection module and a product power supply module. The short-circuit protection module includes an air switch and a single-channel glass tube fuse. The equipment power supply module supplies power to the industrial computer, and the product power supply module provides multiple independent power supplies to the test platform. The present invention includes the temperature rise and temperature drop intervals in the high-temperature aging test, so that the simulation test of high-temperature aging is closer to the actual application environment of the product, and the qualified detection result is more meaningful for reference.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic equipment aging, and in particular to an aging fault monitoring system for vehicle-mounted equipment. Background Art

[0002] In-vehicle electronic devices refer to the various electronic systems and devices installed in a car, providing various onboard functions for the driver and passengers. To ensure the stability of in-vehicle electronic devices in high-temperature environments, they require aging testing. Existing aging test conditions generally set the temperature 20-30°C above the device's normal operating temperature, with 125°C being a common temperature. The device under test is placed in a high-temperature test chamber, fully exposed to the set high temperature environment, and continuously supplied with power and communication signals, maintaining continuous operation at high temperatures for an extended period, such as hundreds to thousands of hours.

[0003] Existing high-temperature aging tests for on-board equipment can only record the test time at a fixed high temperature. The process of temperature rise and fall also has an aging effect on the electronic equipment. This process is not recorded and quantified in the aging test evaluation, resulting in a certain deviation between the evaluation results and the actual results. Therefore, how to fully synchronize the actual high-temperature aging test with the evaluation process is a technical problem that technical personnel in this field need to solve. Summary of the Invention

[0004] In view of the deficiencies in the prior art, the present invention provides an aging fault monitoring system for vehicle-mounted equipment, which solves the problems raised in the above-mentioned background technology.

[0005] To achieve the above objectives, the present invention is implemented through the following technical solutions: an aging fault monitoring system for vehicle-mounted equipment, including a control module and a power supply module, and also including an acquisition module, a test platform and a monitoring module;

[0006] The control module includes an industrial computer and an analog output module. The industrial computer sends control instructions and receives return messages through an RS232-RS485 converter, and the industrial computer sends and receives Can messages through a USB-Can converter; the analog output module sends analog voltage output;

[0007] The power supply module includes an equipment power supply module, a short-circuit protection module and a product power supply module. The short-circuit protection module includes an air breaker and a single-channel glass tube fuse. The equipment power supply module supplies power to the industrial computer, and the product power supply module provides multiple independent power supplies to the test platform. The product power supply module outputs a voltage proportional to the received analog voltage. The voltage output by the product power supply module ranges from 0V to 36V. The two ends of the air breaker are respectively connected to the product power supply module and the 220V mains to prevent the product power supply module itself from being damaged by a short circuit. The two ends of the single-channel glass tube fuse are respectively connected to the product power supply module and the test platform. When a short circuit occurs on the product or line, the large current generated by the single-channel glass tube fuse will cause the single-channel glass tube fuse to melt itself, thereby protecting the product and the equipment on the line.

[0008] The acquisition module includes a current and voltage acquisition card, a Can module, and a temperature sensor. The current and voltage acquisition card acquires real-time current and voltage information of the product on the test platform. The Can module sends command information to the product using the Can protocol and acquires messages fed back by the product. The temperature sensor acquires real-time temperature information of the product on the test platform. The acquisition module transmits the real-time current and voltage information, command information, messages, and real-time temperature information to the industrial computer.

[0009] The test platform includes several independent temperature control boxes, and the product is placed in the temperature control box for high temperature aging test;

[0010] The monitoring module presets a high-temperature aging test program and a test qualification standard and sends them to the industrial computer for execution. The monitoring module receives the current and voltage information, instruction information, message and temperature information sent by the industrial computer. The monitoring module modifies the high-temperature aging test program and the test qualification standard according to the information fed back by the industrial computer. The monitoring module divides the high-temperature aging test process into three stages: a heating test process, a constant temperature test process and a cooling test process. If the product passes each stage in the three-stage repeated cycle test, it is recorded as a qualified product. Conversely, if any stage fails, it is recorded as an unqualified product.

[0011] Furthermore, the specific steps of the temperature rise test process are:

[0012] 101: The industrial computer sends a temperature increase instruction to control the temperature inside the temperature control box to increase. The industrial computer controls the product power supply module to supply power to the product. The monitoring module divides the temperature increase time period into seconds.

[0013] 102: The industrial computer controls the Can module to send command information through the USB-Can converter. The Can module sends command information to the product at each time node and transmits the product feedback message to the industrial computer. If the Can module does not receive the feedback message within 500 milliseconds after sending the command, the time corresponding to the sending of the command is recorded as a response abnormal value. The current and voltage acquisition card collects the current value and voltage value of each time node in real time and transmits them to the industrial computer. The temperature sensor transmits the temperature information collected at each time node to the industrial computer.

[0014] 103: The industrial computer compares the returned temperature information with the sent temperature increase command and calculates the temperature control delay. The industrial computer compares the output voltage and current parameters of the product power supply module with the current and voltage values ​​collected by the current and voltage acquisition card and calculates the power difference. The industrial computer brings the current and voltage values ​​collected by the current and voltage acquisition card into a coordinate system and uses the time node as the horizontal axis and the current and voltage values ​​as the vertical axis to obtain a power curve for the product temperature increase test process.

[0015] 104: The monitoring module analyzes the power curve of the product during the temperature rise test, extracts the values ​​in the power curve that are higher or lower than the power difference threshold as power anomaly values, subtracts the temperature control delay from the corresponding time node to obtain a new time node, and comprehensively analyzes the new time node, power anomaly value, and response anomaly value to obtain an abnormality evaluation index λ of the electronic device during the temperature rise test. xg ;

[0016] 105: The industrial computer accumulates all the time of the heating stage in the repeated cycle test of the product to obtain the total time t, and calculates the aging coefficient of the product from the accumulated total time and the abnormal evaluation index Specifically:

[0017]

[0018] Among them, w1, w2, w3...w n is the time accumulation coefficient, which needs to be obtained in actual application. n is the duration of the temperature rising test process, and n is the number of cycle tests;

[0019] 106: According to the aging coefficient Determine the specific time standard for high-temperature aging of the product during the temperature rise test. In actual testing, if the cumulative time of the temperature rise test exceeds the predicted high-temperature aging time standard, the product is considered qualified; otherwise, it is considered unqualified.

[0020] The specific steps of the cooling test process are the same as those of the heating test process and will not be repeated here.

[0021] Furthermore, the constant temperature test process lasts for a long time and there is no temperature change. Therefore, it is necessary to continuously change the output voltage and current of the product power supply module under the constant temperature state. The specific steps are as follows:

[0022] 201: The analog output module outputs an analog voltage to the product power supply module. The product power supply module performs power supply tests on the product according to three preset modes: high current load, balanced load, and high voltage load. The high current load voltage is 12V and the current is 3A, the balanced load voltage is 24V and the current is 2A, and the high voltage load voltage is 36V and the current is 1A.

[0023] 202: The current and voltage acquisition card acquires the current and voltage values ​​of the product in real time and transmits them to the industrial computer. The industrial computer transmits the current and voltage values ​​to the monitoring module. The monitoring module performs real-time analysis on the current and voltage values.

[0024] 203: The monitoring module plots the current and voltage values ​​collected in real time by the test product into a value versus time relationship graph based on the duration. When the current and voltage values ​​are higher or lower than the threshold, the power difference between the power information corresponding to the threshold and the rated output power of the product power supply module is recorded. p , and record the number of times the threshold is triggered r;

[0025] 204: When the product current or voltage is 0, the monitoring module records the time t that the product continues to test in the constant temperature test phase. h ;

[0026] 205: The monitoring module determines the duration of the test t h , power difference f p The qualified standard time η of the product aging test is calculated based on the number of times r the trigger threshold is recorded, which is specifically:

[0027]

[0028] in, The power difference is a positive number, The power difference is negative. It is the average duration of the constant temperature test phase. In actual testing, if the duration of the constant temperature test process of the product exceeds the predicted qualified standard time η, it is recorded as qualified, otherwise it is recorded as unqualified.

[0029] Furthermore, after the product completes the three-stage cycle test of the heating test process, the constant temperature test process, and the cooling test process, it is necessary to manually check the actual high-temperature aging condition of the product. The high-temperature aging test standard time predicted by the monitoring module is not consistent with the actual test result. There are two processing procedures for judging errors:

[0030] In the first scenario, a product passes three stages of repeated cyclic testing. The monitoring module determines that the product has passed the test, but manual inspection reveals that the product is damaged. The operator enters the misjudgment result into the industrial computer, which transmits the test time of each stage of the misjudged product to the monitoring module. The monitoring module then adjusts the preset high-temperature aging test program and test pass criteria.

[0031] The second type is that the product fails the three-stage repeated cycle test, and the monitoring module determines that the product has failed the test. Actual manual inspection finds that the product is not damaged and the product can still accept control instructions and return messages. The operator inputs the result of the misjudgment into the industrial computer, and the industrial computer transmits the test time of each previous stage of the misjudged product to the monitoring module. The monitoring module continues to accumulate the test time of the misjudged product, and puts the misjudged product back into the test platform to continue the high-temperature aging test until it is damaged. The industrial computer feeds back the accumulated test time of the three stages of the product to the monitoring module, and the monitoring module adjusts the preset high-temperature aging test program and the test pass standard.

[0032] Furthermore, in order to ensure the continuity of the test process, each independent temperature control box is equipped with an independent timing function, and an insulation layer is provided between adjacent temperature control boxes to avoid the temperature of the temperature control boxes affecting each other.

[0033] Furthermore, the real-time temperature environment during the constant temperature test process is 125 degrees Celsius, 150 degrees Celsius and 175 degrees Celsius respectively. The monitoring module performs high-temperature aging tests on the products in order from low to high temperature. If the test product is judged to be unqualified in a lower temperature environment, there is no need to conduct subsequent aging tests at higher temperatures.

[0034] Furthermore, the monitoring module intelligently controls the duration of the heating test process to keep it consistent with the duration of the cooling test process. In the cyclic test, if the heating test process time is shorter than the cooling test process time, in the next cycle of heating test, the monitoring module reduces the heating speed of the temperature control box. Conversely, if the heating test process time is longer than the cooling test process time, the monitoring module increases the heating speed of the temperature control box to maintain dynamic balance.

[0035] The present invention has the following beneficial effects:

[0036] 1. This vehicle-mounted equipment aging fault monitoring system takes into account the temperature increase and decrease intervals in the high-temperature aging test, and adds manual evaluation and feedback of the test results. This makes the high-temperature aging simulation test closer to the actual application environment of the product, and the qualified test results are more meaningful for reference.

[0037] 2. The vehicle-mounted equipment uses an aging fault monitoring system that uses multiple independent temperature control boxes and separate timing functions to enable the detection process to continue uninterrupted. Multi-channel simultaneous detection can shorten detection time and improve detection efficiency.

[0038] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0040] Figure 1 This is a block diagram of an aging fault monitoring system for vehicle-mounted equipment according to the present invention. DETAILED DESCRIPTION

[0041] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts shall fall within the scope of protection of the present invention.

[0042] See also Figure 1 , the present invention provides a technical solution: an aging fault monitoring system for vehicle-mounted equipment, comprising a control module, a power supply module, an acquisition module, a test platform and a monitoring module;

[0043] The control module includes an industrial computer and an analog output module. The industrial computer sends control instructions and receives return messages through the RS232-RS485 converter, and the industrial computer sends and receives Can messages through the USB-Can converter; the analog output module sends analog voltage output, and the analog voltage output range is 0-10V;

[0044] The power supply module includes an equipment power supply module, a short-circuit protection module, and a product power supply module. The short-circuit protection module includes an air breaker and a single-channel glass tube fuse. The equipment power supply module supplies power to the industrial computer, and the product power supply module provides multiple independent power supplies to the test platform. The product power supply module outputs a voltage proportional to the received analog voltage. The output voltage range of the product power supply module is 0V-36V. The two ends of the air breaker are respectively connected to the product power supply module and the 220V mains to prevent the product power supply module from short-circuiting and damaging itself. The two ends of the single-channel glass tube fuse are respectively connected to the product power supply module and the test platform. When a short circuit occurs on the product or line, the large current generated by the single-channel glass tube fuse will cause the single-channel glass tube fuse to melt itself, protecting the product and equipment on the line.

[0045] The acquisition module includes a current and voltage acquisition card, a Can module, and a temperature sensor. The current and voltage acquisition card acquires real-time current and voltage information of the product on the test platform. The Can module sends command information to the product using the Can protocol and acquires the message feedback from the product. The temperature sensor acquires real-time temperature information of the product on the test platform. The acquisition module transmits real-time current and voltage information, command information, messages, and real-time temperature information to the industrial computer. It should be noted that the industrial computer is used to execute the high-temperature aging test program, and the analysis and evaluation is completed by the monitoring module.

[0046] The test platform includes several independent temperature control boxes. Each temperature control box is equipped with a slide trolley. The slide trolley can be pulled out of the temperature control box. The product is placed on the slide trolley in the temperature control box for high temperature aging testing.

[0047] The monitoring module presets the high-temperature aging test program and test qualification standards and sends them to the industrial computer for execution. The monitoring module receives the current and voltage information, command information, message and temperature information sent by the industrial computer. The monitoring module modifies the high-temperature aging test program and test qualification standards according to the information fed back by the industrial computer. The monitoring module divides the high-temperature aging test process into three stages: heating test process, constant temperature test process and cooling test process. If the product passes each stage in the three-stage repeated cycle test, it will be recorded as a qualified product. On the contrary, if any stage fails, it will be recorded as an unqualified product. The three-stage repeated high-temperature aging test can prove that the product has strong resistance to high temperature environment.

[0048] Among them, the specific steps of the temperature rise test process are:

[0049] The industrial computer sends a temperature increase command to control the temperature rise inside the temperature control box. The industrial computer controls the product power supply module to supply power to the product. The monitoring module divides the temperature rise time period into seconds.

[0050] The industrial computer controls the Can module to send command information through the USB-Can converter. The Can module sends command information to the product at each time node and transmits the product feedback message to the industrial computer. The Can module is used to test whether the product maintains communication function in a high-temperature environment. If the Can module does not receive a feedback message within 500 milliseconds after sending the command, the time corresponding to the sending command is recorded as the response abnormality value. If the response time is too long, it means that the product's communication function is weakened or fails in a high-temperature environment. Recording its abnormality can help determine whether the product is qualified. The current and voltage acquisition card collects the current and voltage values ​​of each time node in real time and transmits them to the industrial computer. The temperature sensor transmits the temperature information collected at each time node to the industrial computer.

[0051] The industrial computer compares the temperature information sent back with the temperature increase command sent and calculates the temperature control delay. Since the control system has a certain delay, the delay time during the test can be measured by comparing the temperature, thereby optimizing the acquisition accuracy of the current and voltage acquisition card and reducing the error during the actual test. The industrial computer compares the output voltage and current parameters of the product power supply module with the current and voltage values ​​collected by the current and voltage acquisition card to calculate the power difference. The industrial computer brings the current and voltage values ​​collected by the current and voltage acquisition card into the coordinate system, using the time node as the horizontal axis and the current and voltage values ​​as the vertical axis to obtain the power curve of the product temperature increase test process.

[0052] The monitoring module analyzes the power curve of the product during the temperature rise test and extracts the values ​​in the power curve that are higher or lower than the power difference threshold as the power anomaly value. The power difference threshold is within the range of plus or minus 5% of the rated power. The corresponding time node is subtracted from the temperature control delay to obtain a new time node. The new time node, power anomaly value and response anomaly value are comprehensively analyzed to obtain the abnormal evaluation index λ of the electronic device in the temperature rise test. xg ,actual test power abnormality means that high temperature has an aging effect on the product circuit, which can also help determine whether the product is qualified;

[0053] The industrial computer accumulates all the time of the heating stage in the repeated cycle test of the product to obtain the total time t, and calculates the aging coefficient of the product from the accumulated total time and the abnormal evaluation index Specifically:

[0054] Among them, w1, w2, w3...w n is the time accumulation coefficient, which needs to be obtained in actual application. n is the duration of the temperature rising test process, and n is the number of cycle tests;

[0055] According to the aging factor Determine the specific time standard for high-temperature aging of the product during the temperature rise test. In actual testing, if the cumulative time of the temperature rise test exceeds the predicted high-temperature aging time standard, the product is considered qualified; otherwise, it is considered unqualified.

[0056] The specific steps of the cooling test process are the same as those of the heating test process and will not be repeated here.

[0057] The constant temperature test process lasts for a long time and there is no temperature change. Therefore, it is necessary to continuously change the output voltage and current of the product power supply module under the constant temperature state. The specific steps are as follows:

[0058] The analog output module outputs analog voltage to the product power supply module. The product power supply module tests the product power supply according to three preset modes: high current load, balanced load, and high voltage load. The high current load voltage is 12V and the current is 3A, the balanced load voltage is 24V and the current is 2A, and the high voltage load voltage is 36V and the current is 1A.

[0059] The current and voltage acquisition card collects the current and voltage values ​​of the product in real time and transmits them to the industrial computer. The industrial computer transmits the current and voltage values ​​to the monitoring module, which performs real-time analysis on the current and voltage values.

[0060] The monitoring module plots the current and voltage values ​​collected by the test product in real time into a value-over-time relationship graph based on the duration. When the current and voltage values ​​are higher or lower than the threshold, the power difference between the power information corresponding to the threshold and the rated output power of the product power supply module is recorded. p , and record the number of times the threshold is triggered r. The voltage threshold is within the range of plus or minus 5% of the rated voltage, and the current threshold is within the range of plus or minus 5% of the rated current;

[0061] When the product current or voltage is 0, the monitoring module indicates that the circuit in the product is open and damaged. At this time, the continuous test time t of the product in the constant temperature test phase is recorded. h ;

[0062] The monitoring module is based on the test duration t h , power difference f p The qualified standard time η of the product aging test is calculated based on the number of times r the trigger threshold is recorded, which is specifically:

[0063]

[0064] in, The power difference is a positive number, The power difference is negative. is the average duration of the constant temperature test phase, and the power difference f pThe smaller the absolute value, the less impact the product will receive from high-temperature aging during the test. In actual testing, if the constant temperature test duration of the product exceeds the predicted qualified standard time η, it is considered qualified, otherwise it is considered unqualified.

[0065] After the product completes the three-stage test cycle of heating test, constant temperature test, and cooling test, it is necessary to manually check the actual high-temperature aging of the product. The high-temperature aging test standard time predicted by the monitoring module may not be consistent with the actual test results. There are two processing procedures for error judgment:

[0066] The first scenario involves a product that passes three stages of repeated cyclic testing. The monitoring module determines the product has passed the test, but manual inspection reveals that the product is damaged. The operator enters this misjudgment into the industrial computer, which then transmits the test times of each stage of the misjudged product to the monitoring module. The monitoring module then adjusts the preset high-temperature aging test program and test pass criteria. The operator's continuous feedback on the misjudgment results helps refine the monitoring module's analysis process and aging test pass criteria.

[0067] The second type is that the product fails the three-stage repeated cycle test, and the monitoring module determines that the product has failed the test. Actual manual inspection finds that the product is not damaged, and the product can still accept the Can module control instructions and return messages. The operator inputs the result of the misjudgment into the industrial computer, and the industrial computer transmits the test time of each previous stage of the misjudged product to the monitoring module. The monitoring module continues to accumulate the test time of the misjudged product, and puts the misjudged product back into the test platform to continue the high-temperature aging test until it is damaged. The industrial computer feeds back the accumulated test time of the three stages of the product to the monitoring module, and the monitoring module adjusts the preset high-temperature aging test program and the test pass standard. The results of the retest can further reduce the probability of misjudgment by the monitoring module.

[0068] Among them, in order to ensure the continuity of the testing process, each independent temperature control box is equipped with an independent timing function, which is uniformly controlled by an industrial computer. An insulation layer is set between each adjacent temperature control box to avoid the temperature of the temperature control boxes affecting each other.

[0069] Among them, the real-time temperature environment during the constant temperature test process is 125 degrees Celsius, 150 degrees Celsius and 175 degrees Celsius respectively. The monitoring module performs high-temperature aging tests on the products in order from low to high temperature. The specific number of cycle tests in each temperature stage is determined according to actual application. If the test product is judged as unqualified in a lower temperature environment, there is no need to conduct subsequent aging tests at higher temperatures.

[0070] Among them, the monitoring module intelligently controls the duration of the heating test process to keep it consistent with the duration of the cooling test process. In the cyclic test, if the heating test process time is shorter than the cooling test process time, in the next cycle of heating test, the monitoring module reduces the heating speed of the temperature control box. Conversely, if the heating test process time is longer than the cooling test process time, the monitoring module increases the heating speed of the temperature control box to maintain dynamic balance and reduce the impact of temperature changes on the analysis results.

[0071] The above description is only a preferred specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any technician familiar with the technical field, within the technical scope disclosed by the present invention, who makes equivalent replacements or changes based on the technical solution and inventive concept of the present invention, should be covered by the scope of protection of the present invention.

Claims

1. An aging fault monitoring system for vehicle-mounted equipment, comprising a control module and a power supply module, characterized in that: It also includes acquisition module, test platform and monitoring module; The control module includes an industrial computer and an analog output module. The industrial computer sends control instructions and receives return messages through an RS232-RS485 converter, and sends and receives Can messages through a USB-Can converter; the analog output module sends analog voltage output; The power supply module includes an equipment power supply module, a short-circuit protection module and a product power supply module. The short-circuit protection module includes an air switch and a single-channel glass tube fuse. The equipment power supply module supplies power to the industrial computer, and the product power supply module provides multiple independent power supplies to the test platform, and outputs voltage in proportion to the received analog voltage. The two ends of the air switch are respectively connected to the product power supply module and the 220V mains, and the two ends of the single-channel glass tube fuse are respectively connected to the product power supply module and the test platform. When a short circuit occurs on the product or line, the large current generated will cause the single-channel glass tube fuse to fuse itself; The acquisition module includes a current and voltage acquisition card, a Can module and a temperature sensor. The current and voltage acquisition card acquires real-time current and voltage information of the product on the test platform. The Can module sends command information to the product and acquires messages fed back by the product. The temperature sensor acquires real-time temperature information of the product on the test platform. The acquisition module transmits real-time current and voltage information, command information, messages and real-time temperature information to the industrial computer. The test platform includes several independent temperature control boxes, and the product is placed in the temperature control box for high temperature aging test; The monitoring module presets the high temperature aging test program and the test qualification standard and sends them to the industrial computer for execution, receives the current and voltage information, instruction information, message and temperature information sent by the industrial computer, and modifies the high temperature aging test program and the test qualification standard according to the information fed back by the industrial computer. The high temperature aging test process is composed of three stages of repeated cycle tests: a heating test process, a constant temperature test process and a cooling test process. If the product is qualified in each stage of the three-stage repeated cycle test, it is recorded as a qualified product. On the contrary, if any stage is unqualified, it is recorded as an unqualified product. The specific steps of the temperature rise test process are: 101: the industrial computer sends a temperature increase instruction to control the temperature increase inside the temperature control box, controls the product power supply module to supply power to the product, and the monitoring module divides the temperature increase time period into seconds as the time node; 102: The industrial computer controls the Can module to send command information through the USB-Can converter. The Can module sends command information to the product at each time node and transmits the product feedback message to the industrial computer. If no feedback message is received after sending the command, the time corresponding to the sending command is recorded as the response abnormal value. The current and voltage acquisition card collects the current value and voltage value of each time node in real time and transmits them to the industrial computer. The temperature sensor transmits the temperature information collected at each time node to the industrial computer. 103: The industrial computer compares the temperature information sent back with the temperature increase instruction, calculates the temperature control delay, compares the output voltage and current parameters of the product power supply module with the current value and voltage value collected by the current and voltage acquisition card, calculates the power difference, brings the current value and voltage value collected by the current and voltage acquisition card into the coordinate system, and obtains the power curve of the product temperature increase test process with the time node as the horizontal coordinate and the current value and voltage value as the vertical coordinate; 104: The monitoring module analyzes the power curve of the product temperature rise test process, extracts the value in the power curve that is higher or lower than the power difference threshold as the power abnormal value, subtracts the temperature control delay from the corresponding time node to obtain a new time node, and comprehensively analyzes the new time node, the power abnormal value and the response abnormal value to obtain the abnormal evaluation index λ of the electronic device in the temperature rise test xg ; 105: The industrial computer accumulates all the time of the heating stage in the repeated cycle test of the product to obtain the total time t, and calculates the aging coefficient of the product from the accumulated total time and the abnormal evaluation index Specifically: Among them, w1, w2, w3...w n is the time accumulation coefficient, t1, t2, t3...t n is the duration of the temperature rise test process, and n is the number of cycle tests; 106: According to the aging coefficient Find out the specific time standard of high temperature aging of the product during the temperature rise test. In the actual test, if the cumulative time of the temperature rise test process of the product exceeds the predicted high temperature aging time standard, it is recorded as qualified, otherwise it is recorded as unqualified; The specific steps of the cooling test process are the same as those of the heating test process; After the product has completed the three-stage repeated cycle test of the heating test process, the constant temperature test process and the cooling test process, it is necessary to manually check the actual high-temperature aging of the product. The standard time of the high-temperature aging test predicted by the monitoring module is not consistent with the actual test result. There are two processing procedures for judging errors: The first type is that the product passes three stages of repeated cycle testing, the monitoring module determines that the product has passed the test, but the actual manual inspection finds that the product is damaged. The operator inputs the misjudged result into the industrial computer, and the industrial computer transmits the test time of each stage of the misjudged product to the monitoring module, and the monitoring module adjusts the preset high temperature aging test program and the test pass standard; The second type is that the product fails the three-stage repeated cycle test, and the monitoring module determines that the product fails the test. Actual manual inspection finds that the product is not damaged, and the product can still accept control instructions and return messages. The operator inputs the result of the misjudgment into the industrial computer, and the industrial computer transmits the test time of each previous stage of the misjudged product to the monitoring module. The monitoring module continues to accumulate the test time of the misjudged product, and puts the misjudged product back into the test platform to continue the high-temperature aging test until it is damaged. The industrial computer feeds back the accumulated test time of the product in three stages to the monitoring module, and the monitoring module adjusts the preset high-temperature aging test program and the test pass standard.

2. The aging fault monitoring system for vehicle-mounted equipment according to claim 1, characterized in that: The constant temperature test process lasts for a long time and there is no temperature change. Therefore, it is necessary to continuously change the output voltage and current of the product power supply module under the constant temperature state. The specific steps are as follows: 201: the analog output module outputs an analog voltage to the product power supply module, and the product power supply module performs a power supply test on the product according to three preset modes: high current load, balanced load and high voltage load; 202: The current and voltage acquisition card acquires the current value and voltage value of the product in real time and transmits the acquired current value and voltage value to the industrial computer. The industrial computer transmits the current value and voltage value to the monitoring module. The monitoring module performs real-time analysis on the current value and voltage value. 203: The monitoring module plots the current value and voltage value collected in real time by the test product into a value versus time relationship diagram according to the duration, and records the power difference between the power information corresponding to the threshold and the rated output power of the product power supply module when the current value and voltage value are higher or lower than the threshold. p , and record the number of times the threshold is triggered r; 204: When the product current is 0 or the voltage is 0, the monitoring module records the time t that the product is continuously tested in the constant temperature test phase. h ; 205: The monitoring module determines the duration of the test according to t h , power difference f p The qualified standard time η of the product aging test is calculated by the number of times r of trigger threshold records, which is specifically: in, The power difference is a positive number, The power difference is negative. It is the average duration of the constant temperature test phase. In actual testing, if the product constant temperature test process lasts longer than the predicted qualified standard time η, it is recorded as qualified, otherwise it is recorded as unqualified.

3. The aging fault monitoring system for vehicle-mounted equipment according to claim 1, characterized in that: Each of the temperature control boxes is equipped with an independent timing function, and a temperature insulation layer is arranged between adjacent temperature control boxes.

4. The aging fault monitoring system for vehicle-mounted equipment according to claim 1, characterized in that: The monitoring module performs high temperature aging tests on the products in order from low to high temperatures. If the tested product is determined to be unqualified in a test under a lower temperature environment, there is no need to perform subsequent aging tests at a higher temperature.

5. The aging fault monitoring system for vehicle-mounted equipment according to claim 1, characterized in that: The monitoring module intelligently controls the duration of the heating test process to keep it consistent with the duration of the cooling test process. In the cyclic test, if the heating test process time is shorter than the cooling test process time, in the next cycle of heating test, the monitoring module reduces the heating speed of the temperature control box. Conversely, if the heating test process time is longer than the cooling test process time, the monitoring module increases the heating speed of the temperature control box.

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