A method for generating a test station model

Abstract

The present invention relates to the field of automated testing technology, and in particular to a method for generating a test station model, comprising the following steps: modeling the basic information of the test station, setting the number of test station slots MS ; Slot function modeling, setting the attributes of each slot; according to the UUT model and actual hardware resources, use the test station automatic generation engine to match the test resources, and finally generate the test station model; wherein the actual hardware resources include the test instrument hardware resources in the test instrument model library and the switch model in the switch model library. Through this generation method, the problem of adapting multiple test stations to multiple instrument resources can be effectively solved.

Description

Technical Field

[0001] The present invention relates to the technical field of automated testing, and in particular to a method for generating a test station model. Background Art

[0002] In order to make the TPS (test program set) of the automatic test system portable and the test equipment interchangeable, the Institute of Electrical and Electronics Engineers (IEEE) released the Automatic Test Markup Language (ATML) standard, which is used to unify and organize the storage and exchange of information between and within the automatic test system (ATS). IEEE1671.6 standardizes the element information required for test station modeling. At present, the generation of test stations is mainly based on manual configuration by test designers.

[0003] In the prior art, a Chinese invention patent document with publication number CN117360793A and publication date January 9, 2024 is proposed. The technical solution disclosed in the patent document is as follows: a method for signal-oriented resource and path allocation, comprising the following steps: S1. Obtain a signal-oriented test requirement model of the object under test, and convert the test requirements of the object under test into test signals; S2. Model the test instrument resource model, abstract the functions of the test instrument into capability signals, and obtain a test instrument model; S3. Establish a connection relationship between the test signal and the capability signal, the connection relationship is abstracted as a graph in graph theory, and use a breadth-first search algorithm to establish an allocation path between the test signal and the capability signal in the graph.

[0004] The above technical solution describes the process of establishing the entire test hardware environment. There are two main processes in test station modeling:

[0005] 1) Description of test station port information;

[0006] 2) Description of the connection relationship between the test station and the internal specific instrument ports.

[0007] When performing the second process, the instrument automatic allocation method was used, which is divided into three steps: 1) signal type matching, 2) signal attribute matching, and 3) signal port matching.

[0008] When the above technical solution is implemented, it cannot solve the problem of adapting multiple test stations to multiple instrument resources. The main reasons are as follows:

[0009] 1) No spatial modeling of the test station;

[0010] 2) The switch in the above solution is in the adapter, and the problem of having a switch instrument in the test station is not considered.

[0011] 3) Separate instrument ports from instruments and perform repeated judgments on instruments with multiple ports. Summary of the invention

[0012] In order to solve the above technical problems, the present invention proposes a test station model generation method, which can effectively solve the problem of adapting multiple test stations to multiple instrument resources.

[0013] The present invention is achieved by adopting the following technical solutions:

[0014] A method for generating a test station model comprises the following steps:

[0015] Step S1. Model the basic information of the test station and set the number of test station slots MS;

[0016] Step S2. Slot function modeling, setting the attributes of each slot;

[0017] Step S3. According to the UUT model and actual hardware resources, the test station automatic generation engine is used to match the test resources, and finally the test station model is generated; wherein the actual hardware resources include the test instrument hardware resources in the test instrument model library and the switch model in the switch model library.

[0018] The attributes of the slot in step S2 include the slot backplane bus and the slot function.

[0019] The UUT model is the UUT electrical interface information U:

[0020] U={U i (r, s, t...)}

[0021] Among them, {U i} is the electrical signal test requirement attribute, the subscript i represents different signal types, r is the number of signal channels, s is the performance index, and t is the usage frequency attribute.

[0022] The switch model library SW is:

[0023] SW = {SW k (inN, outN)}

[0024] Among them, SW k is a switch model, the subscript k=1, 2, ... represents the switch model number, inN represents the number of input channels, and outN represents the number of output channels.

[0025] The test resource matching using the test station automatic generation engine specifically includes the following steps:

[0026] Step S 31. According to the UUT electrical interface information, filter the corresponding test instrument hardware resources in the test instrument model library, and form a test resource list based on the signal type {A j}; {A j}Performed as: A j ({B i (r,s,t…)});

[0027] Among them, A j is the test instrument resource model, where the subscript j = 1, 2, 3, ... represents the instrument number; {B i} represents the test instrument resource model A j All resource attributes, subscript i = 1, 2... represents the corresponding signal type, r is the number of signal channels, s is the performance index, and t is the usage frequency attribute;

[0028] Step S 32. Based on step S 31 The test resource list formed j} and electrical signal test requirement attributes {U i}Perform performance index matching, channel matching and usage count matching.

[0029] For bus type, the signal transmission direction is not considered; for analog, discrete, pulse and power signals, the signal transmission direction is considered.

[0030] The step S 32 The specific steps include:

[0031] Step S 321 . Starting from i=1, in the test resource list {A j}According to performance index B i (s) Screening and selecting test instrument resource models that meet the performance indicators of the product to be tested to form a collection satisfy

[0032] Step S 322 .Based on the number of channels, determine whether the channel number requirements are met;

[0033] like That is, if the number of channels of all test instruments that meet the requirements is not less than the number of channels required for UUT testing, then all combinations of test instrument resource models that meet the number of channels required for signal testing are listed. In each case, the test instrument resource model is matched with the test station slot function model in step S2. If the slot is occupied or there is no empty slot, that is, it is impossible to place all the slots, then the test instrument resource model is updated;

[0034] like That is, the number of channels of all test instruments that meet the requirements is less than the number of channels required for UUT testing; determine whether the number of channels required for UUT testing is simultaneous measurement, if so, update the test instrument resource model, if not, use the switch model for time division multiplexing;

[0035] in, Represents the test instrument resource model that meets the performance index of the product signal i under test; B i (r) represents the number of signal channels of the test instrument resource model that meets the performance index of the signal i of the product to be tested; U i (r) represents the number of channels required for UUT testing.

[0036] Using the switch model for time division multiplexing specifically refers to:

[0037] Select SW k (outN) switch model, so that Then it can meet all corresponding UUT test requirements and confirm whether the switch model can be placed in the remaining slots of the test station. If not, it is necessary to replace the switch model or increase the switch model or increase the corresponding signal test instrument resource model;

[0038] Among them, SW k (outN) represents the number of output channels of the switch model, Represents the test instrument resource model that meets the performance index of the product signal i under test; B i (r) represents the number of signal channels of the test instrument resource model that meets the performance index of the signal i of the product to be tested; U i (r) represents the number of channels required for UUT testing.

[0039] When the final test instrument resource model or / and switch model that meets the signal test requirement is determined, it is marked in or / and, and the marked test instrument resource model or / and switch model is used preferentially in the subsequent use.

[0040] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0041] 1. Aiming at the problems that manual test station modeling is inefficient, the design is not standardized, and there are few constraints in the design process, resulting in the hardware being unable to meet the software design requirements, the present invention proposes a test station model generation method that can realize automatic generation algorithms, greatly improve the generation efficiency and accuracy of the test station, and improve the development efficiency of the automatic test system.

[0042] 2. When modeling the test station, the present invention considers the characteristics of bus instruments and non-bus instruments for matching. The most important thing is that from a system perspective, based on the statistics of the electrical interface requirements of the object under test and the statistics of instrument resource performance and number of channels, the present invention avoids repeated matching of instruments with multiple ports, which is more efficient. In addition, the present invention also considers the use of switch models in the test station to solve the situation of different test requirements, which has a wider practical significance.

[0043] 3. After the test instrument resource model and / or switch model is determined, it is marked, and the marked test instrument resource model and / or switch model is used preferentially in the subsequent use to save slot space. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments, wherein:

[0045] Figure 1 A schematic diagram of the process of testing resource matching in the present invention;

[0046] Figure 2 It is a schematic diagram of the process of the present invention. DETAILED DESCRIPTION

[0047] Example 1

[0048] As a basic implementation mode of the present invention, the present invention includes a test station model generation method, comprising the following steps:

[0049] Step S1. Model the basic information of the test station and set the number of test station slots MS.

[0050] Step S2: Slot function modeling, setting the attributes of each slot.

[0051] Step S3. According to the UUT model and actual hardware resources, the test station automatic generation engine is used to match the test resources, and finally the test station model is generated; wherein the actual hardware resources include the test instrument hardware resources in the test instrument model library and the switch model in the switch model library.

[0052] Example 2

[0053] As a preferred embodiment of the present invention, the present invention includes a test station model generation method, comprising the following steps:

[0054] Step S1. Model the basic information of the test station and set the number of test station slots MS.

[0055] Step S2: Slot function modeling, setting the attributes of each slot, wherein the attributes of the slot include the slot backplane bus and the slot function.

[0056] Step S3: According to the UUT model and actual hardware resources, the test station automatic generation engine is used to match the test resources, and finally the test station model is generated. The actual hardware resources include the test instrument hardware resources in the test instrument model library and the switch models in the switch model library.

[0057] The UUT model is the UUT electrical interface information U:

[0058] U={U i (r, s, t...)}

[0059] Among them, {U i} is the electrical signal test requirement attribute, the subscript i represents different signal types, r is the number of signal channels, s is the performance index, and t is the usage frequency attribute.

[0060] Furthermore, using the test station automatic generation engine to perform test resource matching specifically includes the following steps:

[0061] Step S 31 . According to the UUT electrical interface information, filter the corresponding test instrument hardware resources in the test instrument model library, and form a test resource list based on the signal type {A j}; {A j}Performed as: A j ({B i (r,s,t…)});

[0062] Among them, A j is the test instrument resource model, where the subscript j = 1, 2, 3, ... represents the instrument number; {B j} represents the test instrument resource model A j All resource attributes of , subscript i = 1, 2... represents the corresponding signal type, r is the number of signal channels, s is the performance index, and t is the usage frequency attribute.

[0063] Among them, for the bus type, the signal transmission direction is not considered; for analog, discrete, pulse and power signals, the signal transmission direction is considered.

[0064] Step S 32 Based on step S 31 The test resource list formed j} and electrical signal test requirement attributes {U i}Perform performance index matching, channel matching and usage count matching.

[0065] Example 3

[0066] As the best embodiment of the present invention, refer to the attached specification. Figure 2The present invention includes a test station model generation method, comprising the following steps:

[0067] Step S1. Modeling the basic information of the test station, including setting the number of the test station and setting the number of test station slots MS. Since in actual applications there is a situation where one test station cannot meet the test requirements, the test station number can be used to distinguish different test stations.

[0068] Step S2. Slot function modeling, setting the attributes of each slot. The attributes of the slot include the slot backplane bus and the slot function. The slot backplane bus is such as PXI, PXIe, LAN, PCI, CPCI, etc. The slot function can refer to: selecting whether it is a controller or a test resource. If it is a test resource, set its capability set, that is, which type of functional board can be placed, such as multi-function, CAN, etc. It can be a single capability or multiple capabilities.

[0069] Step S3: According to the UUT model and actual hardware resources, the test station automatic generation engine is used to match the test resources, and finally the test station model is generated. The actual hardware resources include the test instrument hardware resources in the test instrument model library and the switch models in the switch model library.

[0070] The UUT model is the UUT electrical interface information U:

[0071] U={U i (r, s, t...)}

[0072] Among them, {U i} is the electrical signal test requirement attribute, the subscript i represents different signal types, r is the number of signal channels, s is the performance index, and t is the usage frequency attribute.

[0073] The switch model library SW is:

[0074] SW = {SW k (inN, outN)}

[0075] Among them, SW k is a switch model, the subscript k=1, 2, ... represents the switch model number, inN represents the number of input channels, and outN represents the number of output channels.

[0076] For details, please refer to the attached manual. Figure 1 In step S3, using the test station automatic generation engine to perform test resource matching specifically includes the following steps:

[0077] Step S 31 . According to the UUT electrical interface information, filter the corresponding test instrument hardware resources in the test instrument model library, and form a test resource list based on the signal type {A j}; {A j}Performed as: A j ({B i (r,s,t…)});

[0078] Among them, A j is the test instrument resource model, where the subscript j = 1, 2, 3, ... represents the instrument number; {B i} represents the test instrument resource model A j All resource attributes of , subscript i = 1, 2... represents the corresponding signal type, r is the number of signal channels, s is the performance indicator, and t is the usage frequency attribute.

[0079] Furthermore, for bus types, such as GJB289A, 1394B, RS422 / 232 / 485, CAN, etc., the signal transmission direction is not considered. For analog, discrete, pulse signals and power signals, such as AI, AO, DI, DO, PWM output, PWM input, 28V input, 15V output, etc., the signal transmission direction is considered.

[0080] If there is no corresponding electrical interface signal type, you need to add a resource model for this type of test instrument.

[0081] Step S 32. Based on step S 31 The test resource list formed j} and electrical signal test requirement attributes {U i}Perform performance index matching, channel matching and usage number matching. Specifically including the following steps:

[0082] Step S 321 . Starting from i=1, in the test resource list {A j}According to performance index B i (s) Screening and selecting test instrument resource models that meet the performance indicators of the product to be tested to form a collection satisfy

[0083] Step S 322 .Based on the number of channels, determine whether the channel number requirements are met;

[0084] like That is, the number of test instrument channels that meet the signal requirements is not less than the number of UUT test demand channels, then list all test instrument resource model combinations that meet the signal test demand channel number. In each case, match the test instrument resource model with the test station slot function model in step S2. If the slot is occupied or there is no empty slot, that is, not all can be placed, then update the test instrument resource model.

[0085] Furthermore, try to select a test instrument resource model that is used less frequently.

[0086] When the final test instrument resource model that meets the signal test requirements is determined, j}, and the marked test instrument resource model will be used first in the future to save slot space.

[0087] like That is, the number of channels of all test instruments that meet the requirements is less than the number of channels required for UUT testing. Determine whether the number of channels required for UUT testing is simultaneous measurement. If so, update the test instrument resource model. If not, use the switch model for time division multiplexing.

[0088] in, Represents the test instrument resource model that meets the performance index of the product signal i under test; B i (r) represents the number of signal channels of the test instrument resource model that meets the performance index of the signal i of the product to be tested; U i (r) represents the number of channels required for UUT testing.

[0089] Among them, using the switch model for time division multiplexing specifically refers to:

[0090] Select SW k (outN) switch model, so that It can meet all corresponding UUT test requirements and confirm whether the switch model can be placed in the remaining slots of the test station. If not, it is necessary to replace the switch model or increase the switch model or increase the corresponding signal test instrument resource model. k (outN) represents the number of output channels of the switch model.

[0091] Furthermore, if the number of signal types that need to be multiplexed by the switch model is greater than the number of input channels of the current switch model, it is necessary to replace the switch model or add a switch model.

[0092] Furthermore, try to select a test instrument resource model that is used less frequently.

[0093] When the final test instrument resource model and switch model that meet the signal test requirements are determined, j} and {SW k}, and the marked test instrument resources will be used first in the future to save slot space.

[0094] In summary, after reading the present invention document, ordinary technicians in this field can make various other corresponding transformation schemes based on the technical scheme and technical concept of the present invention without creative mental labor, which all fall within the scope of protection of the present invention.

Claims

1. A test station model generation method, characterized in that: The following steps are involved: Step S1. Model the basic information of the test station and set the number of test station slots MS; Step S2. Slot function modeling, setting the attributes of each slot; Step S3. According to the UUT model and the actual hardware resources, the test station automatic generation engine is used to match the test resources, and finally the test station model is generated; wherein the actual hardware resources include the test instrument hardware resources in the test instrument model library and the switch model in the switch model library; the switch model library SW is: SW = {SW k (inN, outN)} Among them, SW k is a switch model, subscript k=1, 2… represents the switch model number, inN represents the number of input channels, and outN represents the number of output channels; Among them, using the test station automatic generation engine to match test resources specifically includes the following steps: Step S 31 . According to the UUT electrical interface information, filter the corresponding test instrument hardware resources in the test instrument model library, and form a test resource list based on the signal type {A j }, {A j }Performed as: A j ({B i (r, s, t…)}); where A j is the test instrument resource model, where the subscript j = 1, 2, 3, ... represents the instrument number; {B i } represents the test instrument resource model A j All resource attributes, subscript i = 1, 2... represents the corresponding signal type, r is the number of signal channels, s is the performance index, and t is the usage frequency attribute; Step S 32 Based on step S 31 The test resource list formed j } and electrical signal test requirement attributes {U i }Perform performance index matching, channel matching and usage count matching; The step S 32 The specific steps include: Step S 321 . Starting from i=1, in the test resource list {A j }According to performance index B i (s) Screening and selecting test instrument resource models that meet the performance indicators of the product to be tested to form a collection satisfy Step S 322 .Based on the number of channels, determine whether the channel number requirements are met; like That is, if the number of channels of all test instruments that meet the requirements is not less than the number of channels required for UUT testing, then all combinations of test instrument resource models that meet the number of channels required for signal testing are listed. In each case, the test instrument resource model is matched with the test station slot function model in step S2. If the slot is occupied or there is no empty slot, that is, it is impossible to place all the slots, then the test instrument resource model is updated; like That is, the number of channels of all test instruments that meet the requirements is less than the number of channels required for UUT testing; determine whether the number of channels required for UUT testing is simultaneous measurement, if so, update the test instrument resource model, if not, use the switch model for time division multiplexing; in, Represents the test instrument resource model that meets the performance index of the product signal i under test; B i (r) represents the number of signal channels of the test instrument resource model that meets the performance index of the signal i of the product to be tested; U i (r) represents the number of channels required for UUT testing; Using the switch model for time division multiplexing specifically refers to: Select SW k (outN) switch model, so have to Then it can meet all corresponding UUT test requirements and confirm whether the switch model can be placed in the remaining slots of the test station. If not, it is necessary to replace the switch model or increase the switch model or increase the corresponding signal test instrument resource model; Among them, SW k (outN) represents the number of output channels of the switch model, Represents the test instrument resource model that meets the performance index of the product signal i under test; B i (r) represents the number of signal channels of the test instrument resource model that meets the performance index of the signal i of the product to be tested; U i (r) represents the number of channels required for UUT testing.

2. A test station model generation method according to claim 1, characterized in that: The attributes of the slot in step S2 include the slot backplane bus and the slot function.

3. A test station model generation method according to claim 1, characterized in that: The UUT model is the UUT electrical interface information U: U={U i (r,s,t…)} Among them, {U i } is the electrical signal test requirement attribute, the subscript i represents different signal types, r is the number of signal channels, s is the performance index, and t is the usage frequency attribute.

4. A test station model generation method according to claim 1, characterized in that: For bus type, the signal transmission direction is not considered; for analog, discrete, pulse and power signals, the signal transmission direction is considered.

5. The method for generating a test station model according to claim 1, characterized in that: When the final test instrument resource model and / or switch model that meets the signal test requirements is determined, j } or / and {SW k }, and the marked test instrument resource model and / or switch model will be used preferentially in the future.

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