Integrated automatic test equipment and test method based on CRIO controller

Abstract

The invention discloses integrated general automatic test equipment based on a CRIO controller. The integrated general automatic test equipment comprises a measurement and control computer, a PXI acquisition card, a PXI matrix card and a universal meter card, wherein the PXI acquisition card, the PXI matrix card and the universal meter card are arranged in a case of the measurement and control computer; the measurement and control subrack and the CRIO controller are connected with the tested product and establish timing communication with the tested product; the programmable power supply supplies power to the tested product; the switch is connected with the measurement and control computer, the CRIO controller, the programmable power supply and the oscilloscope through an LAN (Local Area Network) interface; the oscilloscope is used for collecting and analyzing signal waveforms; the measurement and control subrack processes a to-be-collected signal generated by a tested product and forwards the to-be-collected signal to the PXI matrix card; the PXI matrix card is used for controlling the on-off of a signal to be acquired, so that the universal meter card acquires an output value of the corresponding signal to be acquired which needs to be acquired; the measurement and control computer reads an acquisition value of the universal meter card; the PXI acquisition card is used for acquiring a high-speed signal of the tested product and generating an excitation signal required by the tested product. The integrated automatic test equipment is suitable for various signal acquisition and communication forms, the universality of the integrated automatic test equipment is improved, and the problems that the automation degree of the integrated automatic test equipment is low, the communication precision of a LabVIEW platform is low, and accurate timing communication cannot be realized are solved.

Description

Technical Field

[0001] The present invention relates to the technical field of communication product testing, and in particular to an integrated universal automatic testing device and a testing method based on a CRIO controller. Background Art

[0002] In automated testing systems, different products under test require different test resources and test interfaces. Traditional test equipment cannot be used interchangeably. These devices take a long time to develop and incur a lot of cost. Universalization of test and control equipment for different products under test is one of the issues that need to be addressed in the field of test and control.

[0003] LabVIEW (laboratory virtual instrument engineering platform) is widely used in the development of embedded application systems such as data acquisition, instrument control and communication in automated control systems. It supports a variety of analysis and expression capabilities. However, since the Windows operating system is a multi-tasking preemptive operating system, the communication accuracy of the LabVIEW development platform is low and precise timing cannot be achieved. It cannot meet the testing requirements of some products that require high-precision testing and precise timing communication. Summary of the invention

[0004] The purpose of the present invention is to provide an integrated universal automatic test equipment and a test method based on a CRIO controller, so as to solve the problems of universalization and low automation of automatic measurement and control equipment and the inability of LabVIEW platform to realize accurate timing communication in the field of automatic measurement and control.

[0005] In order to solve the above problems, the present invention is implemented by the following technical solutions:

[0006] The invention discloses an integrated universal automatic test equipment based on a CRIO controller, comprising: a measurement and control computer, a PXI acquisition card, a PXI matrix card and a multimeter card arranged in a chassis of the measurement and control computer; a measurement and control plug-in box, a CRIO controller connected with a product under test to establish timed communication with the product under test; a program-controlled power supply for supplying power to the product under test; a switch connected with the measurement and control computer, the CRIO controller, the program-controlled power supply and the oscilloscope through a LAN interface; the oscilloscope is used to collect the power signal waveform output by the program-controlled power supply; the measurement and control plug-in box processes the signal to be collected generated by the product under test and forwards it to the PXI matrix card; the PXI matrix card is used to control the on and off of the signal to be collected so that the multimeter card collects the output value of the corresponding signal to be collected that needs to be collected; the measurement and control computer reads the collected value of the multimeter card; the PXI acquisition card collects the signal to be collected on the product under test, and generates and outputs the excitation signal required for testing the product under test.

[0007] Optionally, the CRIO controller is connected to the measurement and control computer via the LAN interface; the measurement and control computer sends instructions to the CRIO controller; the CRIO controller completes configuration according to the received instructions and starts to communicate with the product under test at a regular interval, and can adapt to the communication frame format and communication cycle of different products under test through the configuration file without restarting.

[0008] Optionally, the measurement and control plug-in box includes: a signal conditioning circuit board, and an acquisition card interface, a wire binding interface, a matrix card interface, an oscilloscope interface, a digital interface and an analog interface respectively connected to the signal conditioning circuit board. A signal generating module, which is respectively connected to the wire binding interface and the acquisition card interface; a diode driver; and a measurement and control plug-in box front panel, the measurement and control plug-in box front panel comprising: a honeycomb panel, a honeycomb panel digital interface and a honeycomb panel analog interface respectively connected to the honeycomb panel; the honeycomb panel digital interface is connected to the digital interface; the honeycomb panel analog interface is connected to the analog interface; a diode display area, connected to the diode driver through a diode interface; the acquisition card interface is connected to the PXI acquisition card; the matrix card interface is connected to the PXI matrix card; the oscilloscope interface is connected to the oscilloscope; the wire binding interface is connected to the product under test through a wire binding; the common end of the PXI matrix card is connected to the multimeter card, and multi-channel signal acquisition is completed by switching the matrix switch; the signal generating module outputs the excitation signal required by the product under test to meet the test requirements of the product under test; after the signal conditioning circuit board completes the conditioning, amplification and attenuation of the signal to be collected, on the one hand, the signal to be collected is transferred to the honeycomb panel for manual measurement by the test personnel, and on the other hand, the signal to be collected is transferred to the PXI matrix card to complete multi-channel signal acquisition.

[0009] Optionally, the PXI matrix card includes a multi-channel signal input interface and a PXI matrix card common end connected to the multi-channel signal input interface; a relay is independently connected to each of the signal input interfaces; the PXI matrix card common end includes a COM+ common interface and a COM- common interface, and the PXI matrix card common end is correspondingly connected to the red test lead and the black test lead of the multimeter card.

[0010] Optionally, the signal to be collected is input to the signal conditioning circuit board through an external binding wire and a binding wire interface, and after conditioning the signal to be collected, it is transmitted to the signal input interface of the PXI matrix card through the matrix card interface; when it is necessary to collect the output value of a certain signal, the relay of that signal is closed, and the measurement and control computer reads the collected value of the multimeter card; the output value of any signal can be collected by switching the relay switch.

[0011] Optionally, the signals to be collected include multiple analog signals and multiple digital signals.

[0012] Optionally, the measurement and control computer provides a visual graphic control interface, test file storage, signal acquisition control and communication control.

[0013] Optionally, the CRIO controller includes: a host computer, a real-time controller and an underlying FPGA. The host computer reads a local configuration file and sends it to the controller to complete the CRIO controller configuration. The host computer continues to send communication frame data, and the controller parses the received communication frame data and sends it to the underlying FPGA. The underlying FPGA starts to send the parsed communication frame data to the product under test at a regular interval. At the same time, the controller reads the communication data received by the underlying FPGA and forwards it to the host computer to complete the communication with the product under test.

[0014] On the other hand, the present invention also provides a testing method for a tested product, which is implemented by the integrated universal automatic testing equipment based on the CRIO controller as described above, including: selecting corresponding test items according to the test needs of the tested product, and the test items include several test sub-item modules. After the test item selection is completed, the tester is prompted to enter the relevant information of the product and the tester. Then the test index information of this test is loaded, and the test is performed according to the selected test item sequence. During the test of each sub-item, the test process data of the entire test process will be recorded to provide data support for the subsequent test process reproduction and product troubleshooting. The dangerous parameter indicators of the product during the test process are monitored in real time. When it is monitored that the dangerous parameter indicators are out of limit, protective measures are taken immediately, and the alarm stops the test. After the sub-item test is completed, the final test results are written into the database, which is convenient for subsequent data analysis and comparison of the test data.

[0015] Optionally, after all project tests are completed, the equipment resources are released and an over-envelope check is performed on the test data. When the test result exceeds the set envelope value, an over-envelope alarm is triggered to prompt the designer to pay special attention to the over-envelope data. Finally, a test report is generated and the test ends.

[0016] The present invention has at least one of the following technical effects:

[0017] 1. The present invention adopts modular design, each module operates independently, and is interconnected through a switch, which is convenient for function expansion and maintenance; the measurement and control plug-in box can meet the multi-channel analog signal and digital signal acquisition and output of different models of products; the CRIO controller can achieve accurate timing communication, and the communication frame format and cycle can be changed at will according to the configuration file, and different frame formats and cycles can be configured according to different test products without restarting. It solves the problem that the LabVIEW platform cannot achieve low timing accuracy and cannot achieve accurate timing communication.

[0018] 2. Through the design of the test software, one-click automated testing can be achieved, with good scalability and maintainability. The main program automatically adapts to the extension of the test subroutine, the test indicators can be changed through the configuration file, the test results are automatically stored in the database, and a report file is generated. In addition, the process data of the entire test process can be fully saved, providing complete data for subsequent reproduction of the test process and analysis of the test process, product troubleshooting, etc. During the test process, the function of monitoring dangerous parameters of the tested product is realized. When the monitoring parameters exceed the threshold, the test program will automatically take safety measures to protect the tested product from damage. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A principle block diagram of an integrated automatic test device based on a CRIO controller provided in one embodiment of the present invention;

[0020] Figure 2 A principle block diagram of a measurement and control plug-in box provided in one embodiment of the present invention;

[0021] Figure 3 A block diagram of the signal acquisition principle of an integrated automatic test equipment based on a CRIO controller provided in one embodiment of the present invention;

[0022] Figure 4 A flow chart of the CRIO controller communication program design provided by an embodiment of the present invention;

[0023] Figure 5 A flowchart of a program design for an integrated automatic test device based on a CRIO controller is provided in accordance with an embodiment of the present invention. DETAILED DESCRIPTION

[0024] The following is a further detailed description of an integrated universal automatic test equipment and test method based on a CRIO controller proposed by the present invention in combination with the accompanying drawings and specific embodiments. According to the following description, the advantages and features of the present invention will be clearer. It should be noted that the accompanying drawings adopt a very simplified form and use non-precise proportions, which are only used to conveniently and clearly assist in explaining the purpose of the embodiments of the present invention. In order to make the purposes, features and advantages of the present invention more obvious and easy to understand, please refer to the accompanying drawings. It should be noted that the structure, proportion, size, etc. illustrated by the accompanying drawings of this specification are only used to match the contents disclosed in the specification, so that people familiar with this technology can understand and read, and are not used to limit the limiting conditions for the implementation of the present invention, so they have no technical substantive significance. Any modification of the structure, change of the proportional relationship or adjustment of the size, without affecting the effects that the present invention can produce and the purposes that can be achieved, should still fall within the scope of the technical content disclosed by the present invention.

[0025] like Figure 1As shown, this embodiment provides an integrated universal automatic test equipment based on a CRIO controller, including: a measurement and control computer 1, a PXI acquisition card 3, a PXI matrix card 4 and a multimeter card 5 arranged in the chassis of the measurement and control computer 1; a measurement and control plug-in box 2, a CRIO controller 6, connected to the product under test, and establishing a timed communication with the product under test; a programmable power supply 7, which supplies power to the product under test; a switch 8, wherein the switch 8 is connected to the measurement and control computer 1, the CRIO controller 6, the programmable power supply 7 and an oscilloscope 9 through a LAN (local area network) interface; the oscilloscope 9 is used to collect the power signal waveform output by the programmable power supply 7; the measurement and control plug-in box 2 processes the signal to be collected generated by the product under test and forwards it to the PXI matrix card 4; the PXI ((PXI is PCI eXtensions for Instrumentation; PCI expansion for instrumentation system, a PC-based measurement and automation system platform) matrix card 4 is used to control the on and off of the signal to be collected, so that the multimeter card 5 collects the output value of the corresponding signal to be collected; the measurement and control computer 1 reads the collection value of the multimeter card 5; the PXI acquisition card 3 is used to collect the signals to be collected (high-speed digital signals and analog signals) of the product under test and generate the excitation signal required by the product under test; the PXI acquisition card 3 completes the acquisition of high-speed digital signals, analog signals and the output of the excitation signal of the product under test, and realizes the multi-channel simultaneous acquisition function, and the single-channel acquisition rate can reach nanosecond level at most.

[0026] This embodiment adopts modular design, each module operates independently and is interconnected through a switch, which is convenient for function expansion and maintenance; the measurement and control plug-in box can meet the multi-channel analog signal and digital signal acquisition and output of different models of products; the CRIO controller can achieve accurate timing communication, and the communication frame format and cycle can be changed at will according to the configuration file, and different frame formats and cycles can be configured according to different test products without restarting. The problem of low timing accuracy and inability to achieve accurate timing communication on the LabVIEW platform is solved.

[0027] In this embodiment, the measurement and control computer 1 provides a visual graphic control interface, test file storage, signal acquisition control and communication control.

[0028] Please continue to refer to Figure 1As shown, in this embodiment, the CRIO controller 6 is connected to the measurement and control computer 1 through the LAN interface; the measurement and control computer 1 sends instructions to the CRIO controller 6; the CRIO controller 6 completes the configuration according to the received instructions and starts to communicate with the product under test on a regular basis, and can adapt to the communication frame format and communication cycle of different products under test through the configuration file without restarting. That is, the CRIO controller 6 completes the regular communication with the product under test, and the communication frame format and communication cycle can be flexibly configured.

[0029] The switch 8 realizes the control and allocation of equipment resources by the measurement and control computer through program control.

[0030] like Figure 2 As shown, in this embodiment, the measurement and control plug-in box 2 includes: a signal conditioning circuit board 20, an acquisition card interface 21, a wire binding interface 22, a matrix card interface 23, an oscilloscope interface 24, a digital interface 25 and an analog interface 26 respectively connected to the signal conditioning circuit board 20. A signal generating module 27, which is respectively connected to the wire binding interface 22 and the acquisition card interface 21; a diode driver 28; and a measurement and control plug-in box front panel 29, the measurement and control plug-in box front panel 29 comprising: a honeycomb panel 295, a honeycomb panel digital interface 291 and a honeycomb panel analog interface 292 respectively connected to the honeycomb panel 295; the honeycomb panel digital interface 291 is connected to the digital interface 25; the honeycomb panel analog interface 292 is connected to the analog interface 26; a diode display area 294, connected to the diode driver 28 via a diode interface 293; the acquisition card interface 21 is connected to the PXI acquisition card 3; the matrix card interface 23 is connected to the PXI matrix card 4; the oscilloscope interface 24 is connected to the oscilloscope 9; the wire binding interface 22 is connected to the product under test (via an external interface) via a wire binding; the common end of the PXI matrix card 4 is connected to the multimeter card 5, and multi-channel signal acquisition is completed by switching the matrix switch. The signal generating module 27 outputs the excitation signal required by the product under test to meet the testing requirements of the product under test. After the signal conditioning circuit board 20 completes the conditioning, amplification and attenuation of the signal to be collected, on the one hand, the signal to be collected is transferred to the honeycomb panel 295 for manual measurement by the tester, and on the other hand, the signal to be collected is transferred to the PXI matrix card 4 to complete multi-channel signal collection.

[0031] Two of the oscilloscope interfaces are directly connected to the special signals of the product under test, and the other two are equipped with a special matrix card, which is switched and connected to the signals to be collected through the matrix card. The oscilloscope collects and analyzes signal waveforms through the trigger function, and can also be directly connected to the plug-in box for observing signal waveforms and troubleshooting. The multimeter card is used to collect general signals or voltage values.

[0032] like Figure 3As shown, in this embodiment, the PXI matrix card 4 includes a multi-channel signal input interface and a PXI matrix card common end connected to the multi-channel signal input interface; each of the signal input interfaces is independently connected to a relay (CH0~CH189); the PXI matrix card common end includes a COM+ common interface and a COM- common interface, and the PXI matrix card common end is correspondingly connected to the red test lead and the black test lead of the multimeter card 5.

[0033] In this embodiment, the signal to be collected is input to the signal conditioning circuit board 20 through the external binding wire and the binding wire interface 22, and after the signal to be collected is conditioned, it is transmitted to the signal input interface of the PXI matrix card 4 through the matrix card interface 23; when it is necessary to collect the output value of a certain signal, the relay of that signal is closed, and the measurement and control computer 1 reads the collected value of the multimeter card 5; the output value of any signal can be collected by switching the relay switch, thereby improving the versatility of the equipment acquisition module.

[0034] In this embodiment, please continue to refer to Figure 3 As shown, the signals to be collected include multiple analog signals (analog quantity 0 to analog quantity n) and multiple digital signals (digital quantity 0 to digital quantity n).

[0035] like Figure 4 As shown, the CRIO controller 6 includes: a host computer (Personal Computer, PC for short), a real-time controller (Real Time, RT) and a bottom FPGA (Field-Programmable Gate Array). The host PC reads the local configuration file and sends it to the controller RT to complete the configuration of the CRIO controller 6. The host PC continues to send communication frame data, and the controller RT parses and sends the received communication frame data to the bottom FPGA. The bottom FPGA starts to send the parsed communication frame data to the product under test at a regular interval. At the same time, the controller RT reads the communication data received by the bottom FPGA and forwards it to the host PC to complete the communication with the product under test.

[0036] See Figure 4The CRIO communication program is designed for execution in the CRIO controller 6, and the program is divided into the above three parts (host computer PC, real-time controller RT and bottom FPGA). In this embodiment, the communication format and communication cycle can be changed by modifying the configuration file in the host computer PC. The communication cycle can reach the microsecond level, which improves the communication accuracy on the LabVIEW platform, and the real-time controller RT is accurate in timing, realizing accurate timing communication. Further, the program design supports changing the communication protocol and communication cycle of different products without restarting. The CRIO controller is connected to the measurement and control computer through a LAN interface, and has a small size and stable performance. After the configuration is completed, it can be installed in the equipment to realize offline independent operation.

[0037] CRIO (NI Compact RIO) is a reconfigurable embedded real-time control system with an embedded FPGA. It has almost no response delay of the control system. It has a compact and rugged hardware architecture, which greatly reduces the space requirements and field wiring costs. It also has good anti-interference ability and stable performance. It is suitable for various embedded control and detection programs and is widely used in the field of engineering measurement and control.

[0038] On the other hand, Figure 5 As shown, the present invention also provides a test method for the tested product, which is implemented by the integrated universal automatic test equipment based on the CRIO controller as described above, including: after the program is run, first check whether the device resources are normal, if not, cut off the power and stop the test; if normal, select the corresponding test items according to the test needs of the tested product, and the test items include several test sub-item modules. The test sub-item selection modular design can expand the sub-item module according to the product requirements, and the main program design supports automatic loading and adaptation each time it runs.

[0039] After the test item selection is completed, the tester is prompted to enter relevant information about the product and the tester.

[0040] Then load the test indicator information of this test, and execute the test according to the selected test item sequence. During each sub-item test, the test process data of the entire test process will be recorded to provide data support for subsequent test process reproduction and product troubleshooting.

[0041] During the test, the dangerous parameters of the product (such as azimuth, voltage and current values, temperature, etc.) are monitored in real time. When it is detected that the dangerous parameters exceed the limit, protective measures are taken immediately and an alarm is issued to stop the test.

[0042] After the sub-project test is completed, the final test results will be written into the database to facilitate subsequent data analysis and comparison of the test data.

[0043] Please continue to refer to Figure 5As shown, this embodiment also includes: releasing equipment resources after all project tests are completed, and performing an over-envelope check on the test data. When the test result exceeds the set envelope value, an over-envelope alarm is triggered to prompt the designer to pay special attention to the over-envelope data. Finally, a test report is generated and the test ends.

[0044] The program design can expand the test items and has good scalability. Each test will reload the test indicators and envelope indicators. When the indicators need to be changed, only the indicator configuration file needs to be changed to improve maintainability. The test process will save the complete test process data to provide data support for test process reproduction and product troubleshooting. The dangerous parameter monitoring function also better protects the safety of the tested products. The test program realizes one-click automatic testing, has good versatility and scalability, and meets the testing needs of various products.

[0045] In summary, the present embodiment, an integrated automatic test equipment and test method based on CRIO controller, designs a universal automatic test equipment, which is suitable for the test requirements of different product collection and communication, improves the versatility and scalability of the equipment, and solves the problems of low communication accuracy and inaccurate timing communication cycle of LabVIEW development platform. Through software design adaptation project expansion, test process playback, dangerous parameter monitoring, super envelope alarm, database storage and other functions, the program scalability, maintainability and automation are improved. In addition, the design principle of the present embodiment can be extended to the automated testing of various fields.

[0046] This embodiment is suitable for various signal acquisition and communication forms, improves the versatility of the integrated automatic test equipment, and solves the problems of low versatility and automation of the integrated automatic test equipment and low communication accuracy of the LabVIEW platform, and inability to achieve precise timing communication.

[0047] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or device including the element.

[0048] It should be noted that the devices and methods disclosed in the embodiments of this article can also be implemented in other ways. The device implementation described above is only schematic. For example, the flowcharts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the devices, methods and computer program products according to multiple embodiments of this article. In this regard, each box in the flowchart or block diagram can represent a part of a module, program or code, and the module, program segment or part of the code contains one or more executable instructions for implementing the specified logical function, and the module, program segment or part of the code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flowchart, and the combination of boxes in the block diagram and / or flowchart can be implemented by a dedicated hardware-based system for performing a specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions.

[0049] In addition, the functional modules in the various embodiments of this document may be integrated together to form an independent part, or each module may exist independently, or two or more modules may be integrated to form an independent part.

[0050] Although the content of the present invention has been described in detail through the above preferred embodiments, it should be appreciated that the above description should not be considered as a limitation of the present invention. After reading the above content, it will be apparent to those skilled in the art that various modifications and substitutions of the present invention will occur. Therefore, the protection scope of the present invention should be limited by the appended claims.

Claims

1. An integrated universal automatic test equipment based on CRIO controller, characterized in that: include: Measurement and control computer, A PXI acquisition card, a PXI matrix card and a multimeter card are arranged in the chassis of the measurement and control computer; Measurement and control plug-in box, CRIO controller, connected to the product under test, to establish timed communication with the product under test; Programmable power supply to supply power to the product under test; A switch, wherein the switch is connected to the measurement and control computer, the CRIO controller and the program-controlled power supply via a LAN interface; An oscilloscope, used to collect the power signal waveform output by the programmable power supply; The measurement and control plug-in box processes the signal to be collected generated by the product under test and forwards it to the PXI matrix card; The PXI matrix card is used to control the on and off of the signal to be collected, so that the multimeter card collects the output value of the corresponding signal to be collected that needs to be collected; The measurement and control computer reads the collected values ​​of the multimeter card; The PXI acquisition card is used to acquire the signals to be acquired of the product under test, and to generate and output the excitation signals required for testing the product under test.

2. The integrated universal automatic test equipment based on CRIO controller as claimed in claim 1, characterized in that: The CRIO controller is connected to the measurement and control computer via the LAN interface; The measurement and control computer sends instructions to the CRIO controller; The CRIO controller starts to communicate with the product under test regularly after completing configuration according to the received instructions, and can adapt to the communication frame format and communication cycle of different products under test through the configuration file without restarting.

3. The integrated universal automatic test equipment based on CRIO controller as claimed in claim 1, characterized in that: The measurement and control plug-in box comprises: a signal conditioning circuit board, an acquisition card interface, a wire binding interface, a matrix card interface, an oscilloscope interface, a digital interface and an analog interface respectively connected to the signal conditioning circuit board; A signal generating module, which is connected to the wire binding interface and the acquisition card interface respectively; Diode driver; and a measurement and control plug-in box front panel, the measurement and control plug-in box front panel comprising: a honeycomb panel, a honeycomb panel digital interface and a honeycomb panel analog interface respectively connected to the honeycomb panel; the honeycomb panel digital interface is connected to the digital interface; The honeycomb panel analog interface is connected to the analog interface; A diode display area connected to the diode driver via a diode interface; The acquisition card interface is connected to the PXI acquisition card; The matrix card interface is connected to the PXI matrix card; The oscilloscope interface is connected to the oscilloscope; The wire binding interface is connected to the product under test via a wire binding wire; The common end of the PXI matrix card is connected to the multimeter card, and multi-channel signal acquisition is completed by switching the matrix switch; The signal generating module outputs the excitation signal required by the product under test to meet the test requirements of the product under test; After the signal conditioning circuit board completes the conditioning, amplification and attenuation of the signal to be collected, on the one hand, the signal to be collected is transferred to the honeycomb panel for manual measurement by the tester, and on the other hand, the signal to be collected is transferred to the PXI matrix card to complete multi-channel signal collection.

4. The integrated universal automatic test equipment based on CRIO controller as claimed in claim 3, characterized in that: The PXI matrix card comprises a multi-channel signal input interface and a PXI matrix card common terminal connected to the multi-channel signal input interface; each of the signal input interfaces is independently connected to a relay; The common end of the PXI matrix card includes a COM+ common interface and a COM- common interface, and the common end of the PXI matrix card is correspondingly connected to a red test lead and a black test lead of the multimeter card.

5. The integrated universal automatic test equipment based on CRIO controller as claimed in claim 4, characterized in that: The signal to be collected is input to the signal conditioning circuit board through an external binding wire and a binding wire interface, and after conditioning the signal to be collected, it is transmitted to the signal input interface of the PXI matrix card through the matrix card interface; When the output value of a certain signal needs to be collected, the relay of this channel is closed, and the measurement and control computer reads the collected value of the multimeter card; the output value of any signal channel can be collected by switching the relay switch.

6. The integrated universal automatic test equipment based on CRIO controller as claimed in claim 5, characterized in that: The signals to be collected include multiple channels of high-speed analog signals and multiple channels of high-speed digital signals.

7. The integrated universal automatic test equipment based on CRIO controller as claimed in claim 1, characterized in that: The measurement and control computer provides a visual graphic control interface, test file storage, signal acquisition control and communication control.

8. The integrated universal automatic test equipment based on CRIO controller as claimed in claim 1, characterized in that: The CRIO controller includes: a host computer, a real-time controller and an underlying FPGA. The host computer reads the local configuration file and sends it to the controller to complete the CRIO controller configuration; The host computer continues to send communication frame data, and the controller receives the communication frame data, parses it, and sends it to the bottom FPGA; The bottom layer FPGA starts to send the parsed communication frame data to the product under test at a regular interval. At the same time, the controller reads the communication data received by the bottom layer FPGA and forwards it to the host computer to complete the communication with the product under test.

9. A method for testing a product under test, characterized in that: The integrated universal automatic test equipment based on CRIO controller as claimed in any one of claims 1 to 8 is implemented, comprising: Select corresponding test items according to the test requirements of the product under test, wherein the test items include several test sub-item modules; After the test item selection is completed, the tester is prompted to enter the relevant information of the product and the tester; Then load the test indicator information of this test, and execute the test according to the selected test item sequence. During each sub-item test, the test process data of the entire test process will be recorded to provide data support for subsequent test process reproduction and product troubleshooting; Real-time monitoring of dangerous parameter indicators of products during the test process. When dangerous parameter indicators are detected to be out of limit, protective measures will be taken immediately and an alarm will be sounded to stop the test. After the sub-project test is completed, the final test results will be written into the database to facilitate subsequent data analysis and comparison of the test data.

10. The method for testing a product under test according to claim 9, characterized in that: After all items are tested, the equipment resources are released and the test data is checked for super envelope. When the set envelope value is exceeded, an over-envelope alarm is triggered, prompting the designer to pay special attention to the over-envelope data. Finally, a test report is generated and the test is completed.

Images