Collimation test light source and test method of mother board collimation light path

Abstract

The invention provides a collimation test light source and a test method of a mother board collimation light path. The collimation test light source comprises a light source body; the mask plate is arranged on one side of the light source body in the test state, the mask plate comprises a light-transmitting area and a light-proof area, and the light-proof area surrounds the light-transmitting area. During testing, the mask plate is arranged on one side of the light source body, it can be ensured that only the light transmitting area can transmit light emitted by the light source body, a high-quality line light source can be obtained, and a collimation testing light source is not prone to being affected by the external environment; when the collimation test light source is used for testing the collimation light path of the mother board, the test accuracy of the collimation light path can be improved.

Description

Technical Field

[0001] The present application relates to the field of display technology, and in particular to a method for testing a collimated test light source and a collimated light path of a motherboard. Background Art

[0002] In recent years, with the rapid development of electronic technology, consumers have increased their demands for the functions of various electronic devices, and the use of biometric identifiers to achieve user authentication on electronic devices has attracted widespread attention. For example, fingerprints can be used to authenticate users who access electronic devices, computer control systems, electronic databases, or information systems, and can be used as a separate authentication method or in combination with one or more other authentication methods such as password authentication methods. Based on this, a fingerprint sensor can be built into an electronic device or information system to read the user's fingerprint pattern, so that the device can only be unlocked by an authorized user of the device by authenticating the fingerprint pattern of the authorized user, and the accuracy of the fingerprint sensor in reading fingerprints is closely related to the collimated light path of the electronic device. Summary of the invention

[0003] In view of this, an embodiment of the present application provides a collimated test light source and a method for testing a collimated light path of a motherboard.

[0004] In a first aspect, the present application provides a collimated test light source, the collimated test light source comprising:

[0005] Light source body;

[0006] The mask plate is configured on one side of the light source body in a test state, and the mask plate includes a light-transmitting area and a light-impermeable area, wherein the light-impermeable area surrounds the light-transmitting area.

[0007] Furthermore, the mask comprises:

[0008] A substrate, located at one side of the light source body;

[0009] The light shielding layer is located on a side of the substrate close to and / or away from the light source body, and the light shielding layer has a plurality of through holes, the through holes constitute a light-transmitting area, and the remaining area is a light-impermeable area;

[0010] Preferably, the substrate comprises glass.

[0011] Further, the light shielding layer includes a reflective material and / or a light absorbing material;

[0012] Preferably, the reflective material comprises molybdenum;

[0013] Preferably, the light absorbing material includes a black color resist material.

[0014] Furthermore, the collimated test light source is used to test the collimated light path of the motherboard, the motherboard includes pixels of at least one color, at least part of the pixels are arranged along the first direction, and the light-transmitting area is arranged corresponding to at least part of the pixels of one color.

[0015] Furthermore, a plurality of pixels arranged along the first direction form a pixel group, and a plurality of pixel groups are arranged at intervals along the second direction, and the first direction intersects the second direction; and the light-transmitting area is arranged corresponding to at least one pixel group of one color.

[0016] Further, the light source body includes a surface light source;

[0017] Preferably, the surface light source comprises a light box;

[0018] Preferably, the light source body emits green light or red light.

[0019] A second aspect of the present application provides a method for testing a collimated optical path of a motherboard, the method comprising:

[0020] Placing a mask plate on one side of the light source body to form a collimated test light source, wherein the mask plate includes a light-transmitting area and a light-impermeable area, wherein the light-impermeable area surrounds the light-transmitting area;

[0021] Placing a motherboard on a side of the mask away from the light source body, the motherboard comprising pixels of at least one color, at least part of the pixels being arranged along a first direction, and the light-transmitting area corresponding to at least part of the pixels of one color;

[0022] Test the collimated optical path of the motherboard.

[0023] Further, the motherboard includes a first substrate and a light emitting device, and the light emitting device is located on one side of the first substrate; placing the motherboard on a side of the mask away from the light source body includes: placing the light emitting device in the motherboard close to the mask;

[0024] Preferably, the collimated light path of the test motherboard includes the half-peak width and / or brightness attenuation of the test motherboard.

[0025] Further, the motherboard includes a first substrate and a light emitting device, and the light emitting device is located on one side of the first substrate; placing the motherboard on a side of the mask away from the light source body includes: placing the light emitting device in the motherboard away from the mask;

[0026] Preferably, the collimated light path of the testing motherboard includes: the half-peak width and / or brightness attenuation of the testing motherboard.

[0027] Further, the motherboard includes a sensor, and testing the collimated light path of the motherboard includes: testing the collimated light path of the motherboard using the sensor;

[0028] Preferably, the method further comprises placing the fingerprint to be tested on a side of the motherboard away from the collimated test light source.

[0029] According to the collimated test light source provided in the embodiment of the present application, the mask plate is arranged on one side of the light source body during testing, which can ensure that only the light-transmitting area can pass through the light emitted by the light source body, which is conducive to obtaining a high-quality line light source. The collimated test light source is not easily affected by the external environment; when the collimated test light source of the embodiment of the present application is used to test the collimated light path of the motherboard, it is beneficial to improve the test accuracy of the collimated light path. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 This is a schematic diagram of the top view of the collimated test light source in one embodiment of the present application.

[0031] Figure 2 for Figure 1 Schematic diagram of the cross-sectional structure of the collimated test light source along the AA' direction.

[0032] Figure 3 This is a schematic cross-sectional structure diagram of a collimated test light source in another embodiment of the present application.

[0033] Figure 4 This is a schematic diagram of the structure of the collimated optical path of the test motherboard in one embodiment of the present application.

[0034] Figure 5 This is a schematic diagram of the top view of the motherboard in one embodiment of the present application.

[0035] Figure 6 This is a flow chart of a method for testing the collimated optical path of a motherboard in one embodiment of the present application.

[0036] Figure 7 This is a schematic diagram of the structure of the collimated light path of the test motherboard in another embodiment of the present application.

[0037] Figure 8 This is a schematic diagram of the structure of the collimated light path of the test motherboard in another embodiment of the present application.

[0038] Fig. 9 This is a schematic diagram of the structure of the collimated light path of the test motherboard in another embodiment of the present application.

[0039] Fig.10 This is a schematic diagram of the structure of the collimated light path of the test motherboard in another embodiment of the present application. DETAILED DESCRIPTION

[0040] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0041] In addition, in order to better illustrate the present application, numerous specific details are given in the following specific embodiments. It should be understood by those skilled in the art that the present application can also be implemented without certain specific details. In some examples, methods and means well known to those skilled in the art are not described in detail in order to highlight the subject matter of the present application.

[0042] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0043] In addition, the terms “first”, “second”, etc., if used, are merely used to distinguish between the descriptions and should not be understood as indicating or implying relative importance.

[0044] In the prior art, there are two methods for testing the collimated light path of the motherboard: 1. Using the luminous pixels (such as red pixels, green pixels or blue pixels, etc.) inside the motherboard as the light source, when the sensor inside the motherboard senses the change of the light and dark information of the fingerprint, the corresponding information will be collected, but this method requires the red pixels, green pixels or blue pixels and the sensors to cooperate with each other, and has high requirements for system matching. It is difficult to characterize the actual characteristics of the light path alone, and the crosstalk between pixels is more serious, and the test results are inaccurate; 2. Directly using an external point light source or a surface light source, when the sensor inside the motherboard senses the change of the light and dark information of the fingerprint, the corresponding information will be collected, but the accuracy of the external light source is poor, and it is difficult to focus on the test point. Based on this, the accuracy of the collimated light path for testing the motherboard in the prior art needs to be improved.

[0045] The first aspect of the present application provides a collimated test light source, referring to Figure 1 and Figure 2 The structural schematic diagram of the collimated test light source shown in the figure comprises: a light source body 100; a mask plate 200. In the test state, the mask plate 200 is arranged on one side of the light source body 100. The mask plate 200 comprises a light-transmitting area 210 and a light-impermeable area 220. The light-impermeable area 220 surrounds the light-transmitting area 210.

[0046] According to the collimated test light source provided in the embodiment of the present application, the mask plate 200 is arranged on one side of the light source body 100 during the test, which can ensure that only the light-transmitting area 210 can pass through the light emitted by the light source body 100, which is conducive to obtaining a high-quality line light source, and the collimated test light source is not easily affected by the external environment; when the collimated test light source of the embodiment of the present application is used to test the collimated light path of the motherboard, it is beneficial to improve the test accuracy of the collimated light path.

[0047] Exemplarily, in the test state, the mask plate 200 is configured on one side of the light source body 100. Specifically, the mask plate 200 is located on the light emitting side of the light source body 100, so that when the light emitted from the light source body 100 passes through the mask plate 200, the light-transmitting area 210 can transmit the light, while the light-opaque area 220 cannot transmit the light.

[0048] It can be understood that the collimated test light source of the embodiment of the present application has a high accuracy in testing the collimated light path of the motherboard. When the test result shows that the light path of the motherboard is not collimated, the structure of the motherboard can be adjusted according to the test result to obtain a motherboard with a more collimated light path.

[0049] Exemplarily, the motherboard may include a fingerprint sensor. More specifically, the motherboard may be a display device having a fingerprint recognition function, such as an organic light emitting semiconductor (OLED) display device or a liquid crystal (LCD) display device.

[0050] In one embodiment, referring to Figure 3 The structure diagram of the collimated test light source shown in the figure, the mask plate 200 includes: a substrate 201, which is located on one side of the light source body 100 in the test state; a light shielding layer 202, which is located on the side of the substrate 201 close to and / or away from the light source body 100, and the light shielding layer has a plurality of through holes 2021, the through holes constitute a light-transmitting area 210, and the remaining area is a light-impermeable area 220. Therefore, the structure of the mask plate 200 is simple and easy to implement, and the light-impermeable area 220 of the light shielding layer 202 has a good light-shielding effect, and the light transmitted from the through holes 2021 constitutes the required light source for the collimated light path test.

[0051] Exemplarily, in order to allow light to penetrate the mask 200, the substrate 201 corresponding to the light-transmitting area 210 may be transparent. In a specific embodiment, the substrate 201 includes glass, so that the substrate 201 has better transparency, lower price, and better support effect on the light-shielding layer 202.

[0052] For example, in the test state, when the mask plate 200 is placed on one side of the light source body 100, in order to make the mask plate 200 and the light source body 100 fit more closely, the mask plate 200 and the light source body 100 can be attached together to avoid the formation of a gap between the mask plate 200 and the light source body 100, thereby preventing light from leaking from the gap between the mask plate 200 and the light source body 100, making the intensity of light transmitted from the light-transmitting area 210 higher, which is conducive to improving the accuracy of the collimation test. For example, when the substrate 201 is glass, the flatness of the glass is higher, and it is easy to fit more closely with the light source body 100.

[0053] It is understandable that the arrangement of the plurality of through holes 2021 may be along a straight line, or along a curve or a broken line. In a preferred embodiment, the plurality of through holes 2021 are arranged along a straight line, thereby obtaining a high-quality line light source by using the light source body 100 and the mask plate 200, which is more conducive to improving the accuracy of testing the collimated light path of the motherboard.

[0054] In one embodiment, in order to achieve an excellent light shielding effect of the opaque area 220 in the mask 200, the light shielding layer 202 includes a reflective material and / or a light absorbing material. Thus, the reflective material can reflect the light into the light source body 100, so that the light cannot pass through the opaque area 220, and the light absorbing material can absorb the light, so that the light cannot pass through the opaque area 220, ensuring that only the light-transmitting area 210 can pass the light, thereby facilitating the improvement of the test accuracy of the collimated optical path of the motherboard.

[0055] In one embodiment, the reflective material includes molybdenum. Thus, the reflective material can more effectively reflect light into the light source body 100, so that the light cannot pass through the opaque area 220, ensuring that only the transparent area 210 can pass the light, thereby facilitating the testing accuracy of the collimated optical path of the motherboard.

[0056] It is understandable that when the reflective material is molybdenum, the light shielding layer 202 can be prepared by using a mask in combination with evaporation.

[0057] In one embodiment, the light absorbing material includes a black color resist material, so that the light absorbing material can absorb light more effectively, so that the light cannot pass through the opaque area 220, and only the transparent area 210 can pass the light, thereby facilitating the improvement of the test accuracy of the collimated optical path of the motherboard.

[0058] It is understandable that when the light absorbing material is a black color resist material, the black color resist material can be used to form a whole light shielding material layer, and then a photolithography process can be used to prepare a light shielding layer having a light-transmitting area and a light-impermeable area.

[0059] In one embodiment, referring to Figure 4The structural schematic diagram of the collimated light path of the test motherboard shown in the figure, the collimated test light source 10 is used to test the collimated light path of the motherboard 20, the motherboard 20 includes pixels 21 of at least one color, at least part of the pixels 21 are arranged along the first direction, and the light-transmitting area 210 is arranged corresponding to at least part of the pixels 21 of one color. Exemplarily, the pixels 21 include red pixels, green pixels, blue pixels, etc., and the light-transmitting area 210 is arranged corresponding to the red pixels, green pixels or blue pixels. It should be noted that the light-transmitting area 210 is arranged corresponding to the pixels 21 of one color, which means that the orthographic projection of the light-transmitting area 210 on the light source body 100 covers the orthographic projection of the pixel 21 of one color on the light source body 100, and the size of the light-transmitting area 210 can be greater than or equal to the size of the pixel 21 of one color, but the orthographic projection of the light-transmitting area 210 on the light source body 100 does not intersect with the orthographic projection of the pixel 21 adjacent to the pixel 21 of one color on the light source body 100. For example, the orthographic projection of the light-transmitting area 210 on the light source body 100 covers the orthographic projection of the green pixel on the light source body 100, but the orthographic projection of the light-transmitting area 210 on the light source body 100 does not intersect with the orthographic projections of the pixels 21 of other colors on the light source body 100. Therefore, the line light source obtained by the cooperation of the light source body 100 and the mask plate 200 has a high quality, can prevent crosstalk between pixels 21 of different colors, and is more conducive to improving the accuracy of the test of the collimated light path of the motherboard.

[0060] In the prior art, the luminous pixels (such as red pixels, green pixels or blue pixels, etc.) inside the motherboard are used as light sources. When the sensor inside the motherboard senses the change in the light and dark information of the fingerprint, the corresponding information will be collected. However, this method requires the red pixels, green pixels or blue pixels and the sensors to cooperate with each other, and the system matching requirements are high. It is difficult to characterize the actual characteristics of the light path alone, and the crosstalk between pixels is more serious, and the test results are inaccurate. In the embodiment of the present application, the light-transmitting area 210 in the mask plate 200 is set corresponding to the pixel 21 of a color in the motherboard, so that the light source body 100 and the mask plate 200 cooperate to obtain a high-quality line light source, which can effectively avoid the crosstalk of light between pixels of different colors in the motherboard, and the matching requirements of the system are not high. It is easy to measure the actual characteristics of the light path, and the test results are relatively accurate. Moreover, the accuracy of the collimated test light source in the embodiment of the present application is high, and it can be focused on the test point more accurately.

[0061] It can be understood that when the collimated test light source of the embodiment of the present application is used to test the collimated light path of the motherboard, the pixels in the motherboard may not be illuminated, and only the light emitted by the collimated test light source is used as the light source to test the collimated light path of the motherboard, which is more conducive to avoiding crosstalk between pixels of different colors in the motherboard, and further improving the accuracy of the test results; moreover, the light of the collimated test light of the embodiment of the present application corresponds to the position of a pixel in the motherboard, and it is easy to accurately focus on the test point, further improving the accuracy of the test results.

[0062] In one embodiment, referring to Figure 5 In the schematic structural diagram of the motherboard shown in FIG. 1 , a plurality of pixels 21 arranged along a first direction form a pixel group 211, and a plurality of pixel groups 211 are arranged at intervals along a second direction, and the first direction intersects the second direction; a light-transmitting area 210 is arranged corresponding to at least one pixel group 211 of one color. It should be noted that the angle between the first direction and the second direction may be an acute angle, an obtuse angle, or a right angle.

[0063] It should be noted that Figure 5 The arrangement of pixels in the text is only used to explain the present application and cannot be understood as a limitation of the present application. The arrangement of pixels can be any pixel arrangement in the prior art, and the pixel group can extend along a straight line in the first direction, or along a curve or a broken line. For example, taking green pixels as an example, the pixel group can be a green pixel group formed by arranging two adjacent green pixels along the first direction, or a green pixel group can be formed by taking a green pixel every multiple (for example, 2, 3, 4 or more) pixels along the first direction.

[0064] Exemplarily, the pixel 21 includes a red pixel, a green pixel, a blue pixel, etc., and the red pixel, the green pixel or the blue pixel is arranged along the first direction and the second direction, respectively. Taking the green pixel as an example, a plurality of green pixels arranged along the first direction form a pixel group 211, and the plurality of pixel groups 211 are arranged at intervals along the second direction, and the light-transmitting area 210 is arranged corresponding to the green pixel group 211; exemplarily, the first direction and the second direction are perpendicular to each other, the row direction is parallel to the first direction, and the column direction is parallel to the second direction. Taking the green pixel as an example, a plurality of green pixels arranged along the row direction form a pixel group 211, and the plurality of pixel groups 211 are arranged at intervals along the column direction, and the light-transmitting area 210 is arranged corresponding to the green pixel group 211.

[0065] In a specific embodiment, the light-transmitting area 210 is arranged corresponding to a group of pixel groups 211 of one color. Thus, it is beneficial to obtain a high-quality line light source, and the accuracy of the collimated light path of the motherboard for testing is high. Exemplarily, the motherboard includes a centroid, and the light-transmitting area 210 can be arranged close to the centroid of the motherboard, or the orthographic projection of the light-transmitting area 210 on the light source body 100 partially covers the orthographic projection of the centroid of the motherboard on the light source body 100.

[0066] In one embodiment, the light source body 100 includes a surface light source, so that the surface light source emits light more evenly, which is conducive to obtaining a high-quality collimated photometric light source.

[0067] In one embodiment, the surface light source comprises a light box.

[0068] In one embodiment, the light source body 100 emits green light or red light. Exemplarily, the motherboard includes a sensor for identifying light, such as a PIN sensor or an OPD sensor, and the sensor is used to identify and receive light, thereby reflecting the collimated light path of the motherboard. In the embodiment of the present application, the light emitted by the light source body 100 can match the pixels in the motherboard, and the light emitted by the light source body 100 corresponds to the PIN sensor or the OPD sensor. For example, when the sensor in the motherboard is a PIN sensor, the light source body 100 can emit red light, and when the sensor in the motherboard is an OPD sensor, the light source body 100 can emit green light. As a result, the light emitted by the light source body 100 is easy to match the sensor in the motherboard, and the collimated light path of the motherboard can be tested more accurately.

[0069] Exemplarily, the mask plate has an alignment mark to ensure accurate alignment between the mother board and the mask plate.

[0070] The second aspect of the present application provides a method for testing a motherboard collimated optical path, referring to Figure 6 The test method flow chart shown in FIG. 1 includes the following steps.

[0071] S100: placing a mask plate on one side of the light source body to form a collimated test light source.

[0072] It should be noted that the mask includes a light-transmitting area and a light-impermeable area, and the light-impermeable area surrounds the light-transmitting area. The mask and the light source body are consistent with the above description, and will not be described in detail here.

[0073] It can be understood that the collimated test light source is consistent with the previous description, and the collimated test light source of this embodiment can be combined with the collimated test light source described in the previous embodiment in whole or in part, which will not be described in detail here.

[0074] In one embodiment, referring to Figure 7The schematic diagram of the structure of the collimated light path of the test motherboard shown in the figure, the motherboard 20 includes a first substrate 22 and a light emitting device 23, and the light emitting device 23 is located on one side of the first substrate 22; placing the motherboard 20 on the side of the mask plate 200 away from the light source body 100 includes: placing the light emitting device 23 in the motherboard 20 away from the mask plate 200. It can be understood that, referring to Figure 8 The motherboard 20 also includes a sensor 24, which is used to receive the light projected by the collimated test light source 10. The sensor 24 is arranged on the same layer as the light emitting device 23, and the light emitting device 23 constitutes a plurality of pixels 21. At this time, the light passing through the first substrate 22 and the corresponding pixel 21 is received by the sensor, and then the light received by the sensor is analyzed to obtain the collimated light path of the template. It can be understood that in this embodiment, the light projected by the collimated test light source needs to penetrate the first substrate 22 and the corresponding pixel 21.

[0075] In one embodiment, referring to Fig. 9 The schematic diagram of the structure of the collimated light path of the test motherboard shown in FIG. 2 shows that the motherboard 20 includes a first substrate 22 and a light emitting device 23, and the light emitting device 23 is located on one side of the first substrate 22; placing the motherboard 20 on the side of the mask plate 200 away from the light source body 100 includes: placing the light emitting device 23 in the motherboard 20 close to the mask plate 200. It can be understood that, referring to Fig.10 The motherboard 20 also includes a sensor 24, which is used to receive the light projected from the collimated test light source 10. The sensor 24 is arranged on the same layer as the light-emitting device 23, and the light-emitting device 23 constitutes a plurality of pixels 21. Therefore, the light emitted by the light source body 100 does not need to pass through the first substrate 22, but is directly projected to the sensor 24 on the same layer as the light-emitting device 23. The light intensity received by the sensor 24 is relatively high, which is more conducive to improving the accuracy of the collimated light path test.

[0076] S200: placing a motherboard on a side of the mask away from the light source body, the motherboard comprising pixels of at least one color, the pixels being arranged along a first direction, and the light-transmitting area corresponding to the pixels of one color.

[0077] It should be noted that the motherboard is consistent with the above description, and the motherboard of this embodiment can be combined with the motherboard described in the above embodiment in whole or in part, which will not be described in detail here.

[0078] It should be noted that the motherboard includes pixels of at least one color, the pixels are arranged along the first direction, and the light-transmitting area is arranged corresponding to the pixels of one color. Exemplarily, the pixels include red pixels, green pixels, blue pixels, etc., and the light-transmitting area is arranged corresponding to the red pixels, green pixels or blue pixels. The light-transmitting area is arranged corresponding to the pixels of one color, which means that the orthographic projection of the light-transmitting area on the light source body covers the orthographic projection of the pixels of one color on the light source body, and the size of the light-transmitting area can be greater than or equal to the size of the pixels of one color, but the orthographic projection of the light-transmitting area on the light source body does not intersect with the orthographic projection of the pixels adjacent to the pixels of one color on the light source body. For example, the orthographic projection of the light-transmitting area on the light source body covers the orthographic projection of the green pixel on the light source body, but the orthographic projection of the light-transmitting area on the light source body does not intersect with the orthographic projection of the pixels of the other colors on the light source body. As a result, the line light source obtained by the cooperation of the light source body and the mask plate is of high quality, which can prevent crosstalk between pixels of different colors, and is more conducive to improving the test accuracy of the collimated light path of the motherboard.

[0079] Exemplarily, a plurality of pixels arranged along a first direction form a pixel group, a plurality of pixel groups are arranged at intervals along a second direction, and the first direction intersects the second direction; and a light-transmitting area is arranged corresponding to a pixel group of one color. It should be noted that the angle between the first direction and the second direction may be an acute angle, an obtuse angle, or a right angle.

[0080] Exemplarily, the pixels include red pixels, green pixels, blue pixels, etc., and the red pixels, green pixels or blue pixels are arranged along the first direction and the second direction, respectively. Taking the green pixels as an example, a plurality of green pixels arranged along the first direction form a pixel group, and the plurality of pixel groups are arranged at intervals along the second direction, and the light-transmitting area is arranged corresponding to the green pixel group; more specifically, the first direction and the second direction are perpendicular to each other, the row direction is parallel to the first direction, and the column direction is parallel to the second direction. Taking the green pixels as an example, a plurality of green pixels arranged along the column direction form a pixel group, and the plurality of pixel groups are arranged at intervals along the row direction, and the light-transmitting area is arranged corresponding to the green pixel group.

[0081] S300: Test the collimated optical path of the motherboard.

[0082] In one embodiment, when the light-emitting device in the motherboard is placed away from the mask, testing the collimated light path of the motherboard includes: testing the half-peak width and / or brightness attenuation of the motherboard. Exemplarily, it also includes placing the fingerprint to be tested on a side of the motherboard away from the collimated test light source, collecting fingerprint information, and judging the collimation of the light path of the motherboard based on the fingerprint information.

[0083] Exemplarily, when the half-peak width of the motherboard is tested to determine whether the light path of the motherboard is collimated, if the half-peak width satisfies that the light intensity is concentrated at the pixels corresponding to the light-transmitting area, and the light intensity at other positions is very small or almost 0, then the light path of the motherboard is collimated.

[0084] Exemplarily, when testing the brightness attenuation of the motherboard to determine whether the light path of the motherboard is collimated, if the brightness satisfies that the light brightness is concentrated at the pixels corresponding to the light-transmitting area, and the light brightness at other positions is very small or almost 0, then the light path of the motherboard is collimated.

[0085] In one embodiment, when the light emitting device in the motherboard is placed close to the mask, the collimated light path for testing the motherboard includes the half-peak width and / or brightness attenuation of the testing motherboard.

[0086] In one embodiment, the motherboard includes a sensor, and testing the collimated light path of the motherboard includes: testing the collimated light path of the motherboard using the sensor.

[0087] In one embodiment, testing the collimated light path of the motherboard further includes: placing the fingerprint to be tested on a side of the motherboard away from the collimated test light source, collecting fingerprint information (brightness information, half-peak width and / or brightness attenuation) using a sensor, and judging the collimation of the light path of the motherboard based on the fingerprint information.

[0088] Exemplarily, the motherboard includes a sensor for identifying light, such as a PIN sensor or an OPD sensor, and the sensor is used to identify and receive light, thereby reflecting the collimated light path of the motherboard. In the embodiment of the present application, the light emitted by the light source body can match the pixels in the motherboard, and the light emitted by the light source body is adapted to the specific application scenarios of the PIN sensor or the OPD sensor (infrared sensing, fingerprint recognition, etc.). For example, when the sensor in the motherboard is a PIN sensor, the light source body can emit red light, and when the sensor in the motherboard is an OPD sensor, the light source body can emit green light. As a result, the light emitted by the light source body is easy to match the sensor in the motherboard, and the collimated light path of the motherboard can be tested more accurately.

[0089] The basic principles of the present application are described above in conjunction with specific embodiments. However, it should be noted that the advantages, strengths, effects, etc. mentioned in the present application are only examples and not limitations, and it cannot be considered that these advantages, strengths, effects, etc. are required by each embodiment of the present application. In addition, the specific details disclosed above are only for the purpose of illustration and ease of understanding, not for limitation, and the above details do not limit the present application to being implemented by adopting the above specific details.

[0090] The above description has been given for the purpose of illustration and description. In addition, this description is not intended to limit the embodiments of the present application to the forms disclosed herein. Although multiple example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations thereof.

Claims

1. A collimated test light source, It is characterized in that include: Light source body; The mask is configured on one side of the light source body in a testing state, and the mask comprises a light-transmitting area and a light-impermeable area, wherein the light-impermeable area surrounds the light-transmitting area.

2. The collimated test light source according to claim 1, It is characterized in that The mask comprises: A substrate, in a testing state, located at one side of the light source body; A light shielding layer is located on a side of the substrate close to and / or away from the light source body, the light shielding layer has a plurality of through holes, the through holes constitute the light-transmitting area, and the remaining area is the light-impermeable area; Preferably, the substrate comprises glass.

3. The collimated test light source according to claim 2, It is characterized in that The light-shielding layer includes a reflective material and / or a light-absorbing material; Preferably, the reflective material comprises molybdenum; Preferably, the light absorbing material includes a black color resist material.

4. The collimated test light source according to any one of claims 1 to 3, It is characterized in that The collimated test light source is used to test the collimated light path of a motherboard, the motherboard includes pixels of at least one color, at least part of the pixels are arranged along a first direction, and the light-transmitting area is arranged corresponding to at least part of the pixels of one color.

5. The collimated test light source according to claim 4, It is characterized in that A plurality of the pixels arranged along the first direction form a pixel group, and the plurality of the pixel groups are arranged at intervals along the second direction, and the first direction intersects the second direction; and the light-transmitting area is arranged corresponding to at least one of the pixel groups of one color.

6. The collimated test light source according to claim 5, It is characterized in that The light source body comprises a surface light source; Preferably, the surface light source comprises a light box; Preferably, the light source body emits green light or red light.

7. A method for testing the collimated optical path of a motherboard, It is characterized in that include: Placing a mask plate on one side of the light source body to form a collimated test light source, wherein the mask plate comprises a light-transmitting area and a light-impermeable area, wherein the light-impermeable area surrounds the light-transmitting area; Placing the motherboard on a side of the mask away from the light source body, the motherboard comprising pixels of at least one color, at least part of the pixels being arranged along a first direction, and the light-transmitting area corresponding to at least part of the pixels of one color; The collimated optical path of the motherboard is tested.

8. The test method according to claim 7, It is characterized in that The motherboard includes a first substrate and a light-emitting device, and the light-emitting device is located on one side of the first substrate; placing the motherboard on a side of the mask away from the light source body includes: placing the light-emitting device in the motherboard close to the mask; Preferably, testing the collimated light path of the motherboard includes testing the half-peak width and / or brightness attenuation of the motherboard.

9. The testing method according to claim 7, It is characterized in that The motherboard includes a first substrate and a light-emitting device, and the light-emitting device is located on one side of the first substrate; placing the motherboard on a side of the mask away from the light source body includes: placing the light-emitting device in the motherboard away from the mask; Preferably, testing the collimated light path of the motherboard includes: testing the half-peak width and / or brightness attenuation of the motherboard.

10. The test method according to any one of claims 7 to 9, It is characterized in that The motherboard includes a sensor, and the testing the collimated light path of the motherboard includes: testing the collimated light path of the motherboard using the sensor; Preferably, the method further comprises placing the fingerprint to be tested on a side of the motherboard away from the collimated test light source.

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