Screening and identifying method for wheat plant types

Abstract

The invention belongs to the technical field of agricultural technology popularization service, and relates to a wheat plant type screening and identifying method, which is characterized in that plant type physiological indexes of a plurality of plants of a plurality of wheat materials are respectively measured, and the plant type physiological indexes comprise but are not limited to flag leaf included angles, flag leaf areas, lodging resistance, ear-leaf ratios and grain-leaf ratios; based on the plant type physiological indexes obtained through measurement, a plant type screening and identifying model of the multiple wheat materials is obtained through calculation, and the plant type screening and identifying model comprises but not limited to the flag leaf included angle interval, the flag leaf area size, the lodging index, the ear / leaf ratio and the grain / leaf ratio; plant types with the flag leaf included angle being 20-40 degrees, the flag leaf area being 1000-2000 mm < 2 >, the spike / leaf ratio being 280 spike / m < 2 >, the grain / leaf ratio being 0.6-1.0 grain / cm < 2 > and the lodging index being smaller than Jimai 22 are screened and identified as excellent plant types. The plant type physiological indexes involved in the method are more comprehensive, the accuracy of excellent wheat plant type screening and identification results is guaranteed, and the method has good popularization and utilization value.

Description

Technical Field

[0001] The invention belongs to the technical field of agricultural technology extension services, and specifically relates to a method for screening and identifying wheat plant types. Background Art

[0002] Plant type is a key agronomic trait that determines wheat yield; plant type improvement is the focus of crop breeding in my country and even the world. Excellent plant type can greatly increase wheat yield and economic benefits. Therefore, screening and identifying excellent wheat plant types is of great significance for breeding high-yield wheat varieties.

[0003] The invention patent with authorization announcement number CN105660388B discloses a method for screening and breeding excellent plant types of winter wheat. The internode length, internode diameter and internode dry weight of the stem are measured with a ruler, a vernier caliper and a balance. This manual measurement method has a large workload and it is difficult to avoid manual measurement errors. The correlation coefficient analysis method is used to examine the length of the node below the ear, the length of the second node from the bottom, the length of the third node from the bottom, the length of the fourth node from the bottom, the length of the fifth node from the bottom, the diameter of the node below the ear, the diameter of the second node from the bottom, the diameter of the third node from the bottom, the diameter of the fourth node from the bottom, the diameter of the fifth node from the bottom, the dry weight of the node below the ear, the dry weight of the second node from the bottom, the dry weight of the third node from the bottom, the dry weight of the fourth node from the bottom, the dry weight of the fifth node from the bottom and the yield, biological yield and harvest index correlation coefficient. These screening contents mainly focus on the node below the ear index, and the screening index is relatively single. Summary of the invention

[0004] In order to solve the above technical problems, the present invention provides a method for screening and identifying wheat plant types. The technical solution adopted by the present invention is as follows: A method for screening and identifying wheat plant types comprises the following steps: Measuring plant type physiological indicators of several plants of several wheat materials one by one, wherein the plant type physiological indicators include but are not limited to: flag leaf angle, flag leaf area, lodging resistance, ear-leaf ratio and grain-leaf ratio; Based on the measured plant type physiological indicators, a plant type screening and identification model for the plurality of wheat materials is calculated, wherein the plant type screening and identification model includes but is not limited to: flag leaf angle interval, flag leaf area, lodging index, ear / leaf ratio and grain / leaf ratio; The data of the plant type screening and identification model were statistically analyzed to screen and identify the excellent plant types of wheat materials.

[0005] Preferably, the flag leaf angle is 20-40° and the flag leaf area is 1000-2000mm 2 , the ear / leaf ratio is 280 ears / m 2 , the grain / leaf ratio is 0.6-1.0 grain / cm 2 , and the plant type with lodging index less than Jimai 22 was screened and identified as an excellent plant type of wheat material.

[0006] Preferably, during the flowering period of wheat, several wheat plants are selected one by one for the several wheat materials, and photographs are taken of the angles formed between the internodes under the ear and the flag leaf of the several wheat plants, and the angle values ​​between the internodes under the ear and the flag leaf in the photograph images are extracted. The angle values ​​between the several internodes under the ear and the flag leaf are averaged as one, and the average value one is the flag leaf angle range of the several wheat materials.

[0007] Preferably, during the flowering period of wheat, several wheat plants are selected one by one for the several wheat materials, and the flag leaf areas of the several wheat plants are measured using a leaf area meter. The average value of the several flag leaf area values ​​is taken as two, and the average value two is the flag leaf area size of the several wheat materials.

[0008] Preferably, 15 days after the wheat blooms, wheat plants with a row length of 20 cm are selected from the wheat sample plot for the several wheat materials one by one to obtain the total number of ears of the wheat plants; all the front three leaves of the wheat plants with a row length of 20 cm are torn off and evenly laid out to ensure that there is no obstruction between any two leaves, and the total leaf area of ​​the front three leaves of the wheat plants is obtained; the ratio of the total number of ears of the wheat plant to the total leaf area of ​​the front three leaves is the ear / leaf ratio of the several wheat materials.

[0009] Preferably, the grains from the ears of the 20 cm long wheat plants are peeled off and evenly spread out to obtain the total number of wheat grains. The ratio of the total number of grains of the wheat plant to the total leaf area of ​​the first three leaves is the grain / leaf ratio of the several portions of wheat materials.

[0010] Preferably, obtaining the lodging index comprises the following steps: For the several wheat materials, several wheat plants located in the middle of the wheat sample plot are selected one by one, and the complete above-ground parts of the wheat stems of the several wheat plants are horizontally placed, and the distance values ​​from the base of the wheat stem to the balance support point on the upper part of the wheat stem are measured, and the average value three of the distance values ​​from the base of the wheat stem to the balance support point on the upper part of the wheat stem is taken, and the average value three is the center of gravity height H of the several wheat materials; The second internodes at the base of the main stems of the several wheat plants are respectively cut off and the leaf sheaths are removed as stem samples, and the stem bending resistance values ​​are measured using a stem lodging resistance meter, and an average value 4 of the several stem bending resistance values ​​is taken, and the average value 4 is the stem bending resistance S of the several wheat materials; Respectively measuring the total weight of the ears, leaves and sheaths of the several wheat plants to obtain the aboveground fresh weight value of the wheat plants, taking an average value of the several aboveground fresh weight values ​​5, and the average value 5 is the aboveground fresh weight G of the several wheat materials; The lodging index of the several wheat materials is calculated by the formula: lodging index=(H×G) / S.

[0011] Preferably, the flag leaf angle interval, flag leaf area, ear / leaf ratio and grain / leaf ratio are statistically analyzed by graphpad-prism5 analysis software, and a flag leaf angle interval curve graph, a flag leaf area curve graph, an ear / leaf ratio curve graph and a grain / leaf ratio curve graph are respectively produced.

[0012] Beneficial effects of the present invention: The present invention comprehensively sets up a scientific and reasonable screening and identification model for excellent wheat plant types, involves more comprehensive plant type physiological indicators, ensures the accuracy of the screening and identification results of excellent wheat plant types, and has great promotion and utilization value. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings: Figure 1 It is a curve diagram of the flag leaf angle intervals of 81 wheat materials according to the embodiment of the present invention; Figure 2 A curve chart showing the flag leaf area of ​​81 wheat materials according to the embodiment of the present invention; Figure 3 It is a curve chart of the ear / leaf ratios of 81 wheat materials according to the embodiment of the present invention; Figure 4 This is a curve chart of the grain / leaf ratios of 81 wheat materials according to the embodiments of the present invention. DETAILED DESCRIPTION

[0014] The technical solution of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0015] A method for screening and identifying wheat plant types provided in an embodiment of the present invention measures wheat plant type physiological indicators such as flag leaf angle, flag leaf area, lodging resistance, ear-leaf ratio and grain-leaf ratio for 81 germplasms / new strains of wheat materials with outstanding yield performance; a plant type screening and identification model based on flag leaf angle interval, flag leaf area, lodging index, ear / leaf ratio and grain / leaf ratio for comprehensive evaluation is designed. All data of the plant type screening and identification model come from three independent repeated experiments conducted on 81 germplasms / new strains of wheat materials, the data are comprehensive and reliable, and the data are all collected by instruments and analyzed by software with high accuracy; therefore, this method is practical and has wide application and promotion value. The specific methods and steps for screening and identification are as follows: Step 1, 81 high-yield wheat materials of different germplasms / new lines are planted in a wheat sample planting area of ​​4m long×1.5m wide; in the wheat sample planting area, each high-yield wheat material is set up with 3 replicates, one replicate is a wheat sample plot, and a certain germplasm / line high-yield wheat material containing multiple plants is planted in the 3 replicated wheat sample plots, and the total number of the wheat sample plots is 81×3.

[0016] During the wheat growth period, daily management such as fertilization and watering should be carried out normally. For the management methods of fertilization and watering, please refer to "Fan Chuanhang (2024), Field Management and Technology Promotion of Wheat Planting, Seed Technology 4".

[0017] Step 2: Measure the physiological index of flag leaf angle of wheat plants.

[0018] 2.1. During the flowering period of wheat, 5 wheat plants were randomly selected from each wheat sample plot, and the angles formed between the internodes under the ear and the flag leaf of the 5 selected wheat plants were photographed respectively. A total of 5 photographic images of the angles formed between the internodes under the ear and the flag leaf were obtained in each wheat sample plot. The total number of photographic images of the angles formed between the internodes under the ear and the flag leaf obtained for each germplasm / new line wheat material was 5×3, and the total number of photographic images of the angles formed between the internodes under the ear and the flag leaf obtained for 81 germplasms / new line wheat materials was 5×81×3; 2.2. All the photographs taken were selected and batch-imported (i.e., dragged) into the PS software. The PS software automatically measured the angles between the internodes under the ear and the flag leaf of the wheat plants in the photographs. A total of 5 angle values ​​between the internodes under the ear and the flag leaf were measured in each wheat sample plot. The total number of angle values ​​between the internodes under the ear and the flag leaf obtained for each germplasm / new line of wheat was 5×3. The total number of angle values ​​between the internodes under the ear and the flag leaf measured for 81 germplasms / new line of wheat materials was 5×81×3. 2.3. For each of the 81 germplasm / new line wheat materials, the average value of the angles formed between the 5×3 internodes below the ear and the flag leaf was taken. The average value was the flag leaf angle range of the wheat plant of the germplasm / new line wheat material.

[0019] Step 3: Measurement of physiological indicators of flag leaf area of ​​wheat plants.

[0020] 3.1. During the flowering period of wheat, the flag leaves of 5 wheat plants were randomly selected from each wheat sample plot, and the flag leaf area of ​​the wheat plants was measured using a leaf area meter. The total number of flag leaf areas measured for each germplasm / new line wheat material was 5×3, and the total number of flag leaf areas measured for 81 germplasms / new line wheat materials was 5×81×3; 3.2. Take the average value of 5×3 flag leaf areas of each of the 81 germplasm / new line wheat materials. The average value is the flag leaf area of ​​the wheat plant of the germplasm / new line wheat material.

[0021] Step 4: Measure the physiological indicators of the ear-to-leaf ratio of wheat plants.

[0022] 4.1. About 15 days after wheat flowering, randomly select wheat plants with a row length of 20 cm from the middle of each wheat sample plot for measurement; 4.2. Take photos of the whole ear of the wheat plant with a row length of 20 cm in three wheat sample plots corresponding to one germplasm / new line wheat material, which can be taken with a mobile phone; transfer the photos in batches to the image j software, and automatically calculate the number of ears in the photos through the existing ear number measurement system TPMS-1 to obtain the total number of wheat ears of the wheat plant with a row length of 20 cm in the three wheat sample plots; 4.3. Tear off all the front three leaves of the 20 cm long wheat plants in the three wheat sample plots, place all the torn front three leaves horizontally under a transparent tablecloth and evenly spread them out to ensure that there is no obstruction between any two leaves; take photos and upload them to the image j software for calculation to obtain the total leaf area of ​​the front three leaves of the 20 cm long wheat plants; 4.4. The ratio of the total number of ears of wheat plants with a row length of 20 cm to the total leaf area of ​​the first three leaves is the ear / leaf ratio of plants in one wheat material.

[0023] Step 5: Measure the seed-leaf ratio physiological indicators of wheat plants.

[0024] 5.1. Peel off the grains of the wheat ears in the 20 cm row length in the three wheat sample plots corresponding to one germplasm / new line of wheat in step 4 above, lay them out evenly, take photos and upload them to the image j software, and automatically calculate the number of grains in the photos through the existing grain measurement system to obtain the total number of wheat grains in the 20 cm row length of wheat plants.

[0025] 5.2. The ratio of the total number of grains in a 20 cm row of wheat plants in three wheat sample plots to the total leaf area of ​​the first three leaves is the grain / leaf ratio of a plant of one wheat material.

[0026] Step 6: Measurement of lodging resistance physiological indicators of wheat plants.

[0027] The lodging index of wheat varieties is affected by three factors: stem bending resistance (S), aboveground fresh weight (G) and wheat plant center of gravity height (H). A lodging index of wheat plants is expressed as the ratio of the product of center of gravity height (H) and aboveground fresh weight (G) to stem bending resistance (S). Lodging index = (H×G) / S is used to express the lodging resistance of wheat varieties, where stem bending resistance (S) is the bending resistance of the second internode at the base. The lodging index of wheat varieties is inversely proportional to their lodging resistance.

[0028] The test instruments include: YYD-1 plant stem strength tester, meter ruler, SE602FZH OHAUS electronic balance.

[0029] 6.1. Determination of the center of gravity height (H): Take 5 representative wheat plants located in the middle of each wheat sample plot, place the aboveground part of a complete wheat stem horizontally on a wooden stick with a diameter of 0.5 cm, so that the aboveground part of the wheat stem is on a horizontal line, and measure the distance from the base of the wheat stem to the balance fulcrum on the upper part of the wheat stem. The balance fulcrum refers to the center of gravity of the wheat stem (i.e., the position where the wheat stem can be balanced when suspended on the fulcrum). Take the average value of the distance from the base of 5×3 wheat stems to the balance fulcrum on the upper part of the wheat stem for each of the 81 germplasm / new line wheat materials. The average value is the center of gravity height (H) of the germplasm / new line wheat material. 6.2. Determination of stem bending strength (S): Cut the second internode at the base of a single stem of the main stem of the wheat plant and remove the leaf sheaths as the stem sample. Place the two ends of the stem sample in the grooves of a supporting wooden frame 50 cm high and 5 cm apart. Use a digital portable stem lodging resistance meter to push vertically and evenly to break the stem sample. Record the stem bending strength measurement value displayed on the stem lodging resistance meter. The larger the measurement value, the greater the stem breaking force. The total number of stem bending strength measurement values ​​of wheat plants in the three wheat sample plots corresponding to each germplasm / new line wheat material obtained in the experiment is 5×3. The average value of the 5×3 stem bending strength measurement values ​​of each of the 81 germplasm / new line wheat materials is taken as four. The average value four is the stem bending strength (S) of the germplasm / new line wheat material; 6.3. Determination of fresh weight of aboveground part (G): Take representative ears, leaves and sheaths of wheat plants, measure the total weight of ears, leaves and sheaths of 5×3 wheat plants of each wheat material, and take the average value of the total weight of ears, leaves and sheaths of 5×3 wheat plants of each wheat material in 81 germplasms / new lines of wheat. The average value is the fresh weight of aboveground part (G) of this germplasm / new line of wheat material. 6.4. The lodging index of each of the 81 germplasm / new line wheat materials was calculated using the formula: lodging index = (H×G) / S.

[0030] Step seven: Determine excellent plant types based on the plant type screening and identification model.

[0031] The above measured data were statistically analyzed by GraphPad-Prism5 analysis software. Figure 1-4 The flag leaf angle interval curve, flag leaf area curve, ear / leaf ratio curve and grain / leaf ratio curve shown in the figure, according to the distribution range of the data points in the curves on the coordinate axis, the following conclusions were drawn: the flag leaf angle interval of high-yield wheat materials is mainly concentrated between 20-40° ( Figure 1 ), the flag leaf area is 1000-2000mm 2 between( Figure 2 ), the ear / leaf ratio is 280 ears / m 2 ( Figure 3 ), the grain / leaf ratio is 0.6-1.0 grain / cm 2 ( Figure 4 ); The lodging index varies greatly among different germplasms / new lines of wheat materials. Based on the above data and years of production experience, if a wheat material meets the above-mentioned flag leaf angle range, flag leaf area, ear / leaf ratio and grain / leaf ratio requirements, and the lodging index is less than Jimai 22, the plant type of the wheat material can be judged as excellent.

[0032] Through the above-mentioned wheat plant type screening and identification method provided in the embodiment of the present invention, we screened and identified 14 excellent plant type germplasm wheat materials such as BC23YY0025 in practice, as shown in the following Table 1; we screened and identified 8 new germplasm wheat materials with excellent plant type and 8% increase in yield compared with the control Jimai 22, as shown in the following Table 2.

[0033]

[0034]

[0035] In the embodiments of the present invention, technical features that are not described in detail are all existing technologies or conventional technical means and will not be described in detail here.

[0036] Finally, it should be noted that the above embodiments are only specific implementation methods of the present invention, which are used to illustrate the technical solutions of the present invention, rather than to limit them, and the protection scope of the present invention is not limited thereto. Those skilled in the art should understand that any technician familiar with the technical field can modify the technical solutions recorded in the above embodiments within the technical scope disclosed by the present invention, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should be covered within the protection scope of the present invention.

Claims

1. A method for screening and identifying wheat plant types, It is characterized in that The following steps are involved: Measuring plant type physiological indicators of several plants of several wheat materials one by one, wherein the plant type physiological indicators include but are not limited to: flag leaf angle, flag leaf area, lodging resistance, ear-leaf ratio and grain-leaf ratio; Based on the measured plant type physiological indicators, a plant type screening and identification model for the plurality of wheat materials is calculated, wherein the plant type screening and identification model includes but is not limited to: flag leaf angle interval, flag leaf area, lodging index, ear / leaf ratio and grain / leaf ratio; The data of the plant type screening and identification model were statistically analyzed to screen and identify the excellent plant types of wheat materials.

2. A method for screening and identifying wheat plant types according to claim 1, It is characterized in that The flag leaf angle range is 20-40°, and the flag leaf area size is 1000-2000mm 2 , the ear / leaf ratio is 280 ears / m 2 , the grain / leaf ratio is 0.6-1.0 grain / cm 2 , and the plant type with lodging index less than Jimai 22 was screened and identified as an excellent plant type of wheat material.

3. A method for screening and identifying wheat plant types according to claim 2, It is characterized in that During the flowering period of wheat, several wheat plants are selected one by one for the several wheat materials, and photographs are taken of the angles formed between the internodes under the ear and the flag leaves of the several wheat plants. The angle values ​​between the internodes under the ear and the flag leaves in the photograph images are extracted, and an average value of the angle values ​​between the several internodes under the ear and the flag leaves is taken as one, and the average value one is the flag leaf angle range of the several wheat materials.

4. A method for screening and identifying wheat plant types according to claim 3, It is characterized in that During the flowering period of wheat, several wheat plants are selected one by one from the several wheat materials, and the flag leaf areas of the several wheat plants are measured using a leaf area meter. An average value of the several flag leaf area values ​​is taken, and the average value is the flag leaf area size of the several wheat materials.

5. A method for screening and identifying wheat plant types according to claim 4, It is characterized in that 15 days after the wheat blooms, wheat plants with a row length of 20 cm are selected from the wheat sample plots for the several wheat materials one by one to obtain the total number of ears of the wheat plants; all the front three leaves of the wheat plants with a row length of 20 cm are torn off and evenly laid out to ensure that there is no obstruction between any two leaves, to obtain the total leaf area of ​​the front three leaves of the wheat plants; the ratio of the total number of ears of the wheat plant to the total leaf area of ​​the front three leaves is the ear / leaf ratio of the several wheat materials.

6. A method for screening and identifying wheat plant types according to claim 5, It is characterized in that The grains of the ears of the 20 cm long wheat plants are peeled off and evenly spread out to obtain the total number of wheat grains. The ratio of the total number of grains of the wheat plant to the total leaf area of ​​the first three leaves is the grain / leaf ratio of the several portions of wheat materials.

7. A method for screening and identifying wheat plant types according to claim 6, It is characterized in that The acquisition of the lodging index comprises the following steps: For the several wheat materials, several wheat plants located in the middle of the wheat sample plot are selected one by one, and the complete above-ground parts of the wheat stems of the several wheat plants are horizontally placed, and the distance values ​​from the base of the wheat stem to the balance support point on the upper part of the wheat stem are measured, and the average value three of the distance values ​​from the base of the wheat stem to the balance support point on the upper part of the wheat stem is taken, and the average value three is the center of gravity height H of the several wheat materials; The second internodes at the base of the main stems of the several wheat plants are respectively cut off and the leaf sheaths are removed as stem samples, and the stem bending resistance values ​​are measured using a stem lodging resistance meter, and an average value 4 of the several stem bending resistance values ​​is taken, and the average value 4 is the stem bending resistance S of the several wheat materials; Respectively measuring the total weight of the ears, leaves and sheaths of the several wheat plants to obtain the aboveground fresh weight value of the wheat plants, taking an average value of the several aboveground fresh weight values ​​5, and the average value 5 is the aboveground fresh weight G of the several wheat materials; The lodging index of the several wheat materials is calculated by the formula: lodging index=(H×G) / S.

8. A method for screening and identifying wheat plant types according to claim 6, It is characterized in that The flag leaf angle interval, flag leaf area, ear / leaf ratio and grain / leaf ratio were statistically analyzed by graphpad-prism5 analysis software, and flag leaf angle interval curve graph, flag leaf area curve graph, ear / leaf ratio curve graph and grain / leaf ratio curve graph were respectively produced.

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