Semiconductor laser aging test device

Abstract

The invention discloses a semiconductor laser aging test device, and belongs to the technical field of semiconductor laser testing, the semiconductor laser aging test device comprises a base and a plurality of layers of supporting parts in sliding sleeve connection with a mounting groove arranged on the base, and the supporting parts are used for loading a plurality of groups of semiconductor lasers at one time and simultaneously carrying out aging test. The supporting part comprises a supporting frame and a plurality of interlayer plates, wherein the supporting frame is arranged in the mounting groove in a sliding and sleeved mode, and the interlayer plates are fixed in the supporting frame and used for vertically dividing the interior of the supporting frame into multiple layers. Through cooperative use of the supporting part, the mounting groove and other structures, after the supporting part is fully loaded with the lasers, the multiple lasers are mounted to the to-be-tested position in a transverse insertion mode, the driving part is matched to linearly drive the power connection part to move so that the power connection part can be electrically connected with the lasers, efficient and accurate connection of the laser aging test circuit is achieved, and the laser aging test efficiency is improved. And the efficiency of the laser aging test is improved.

Description

Technical Field

[0001] The invention relates to the technical field of semiconductor laser testing, in particular to a semiconductor laser aging testing device. Background Art

[0002] The aging test of semiconductor lasers is one of the important steps in the laser production process. The semiconductor laser aging test process is one of the means of observing the reliability of semiconductor lasers. The aging test device is used to detect semiconductor lasers, which is convenient for testing and recording the various parameters of semiconductor lasers. After the test, the photoelectric performance and other parameters of the semiconductor lasers before and after the test are compared. If the change rate of each parameter is no more than 5%, it is qualified. Only qualified semiconductor lasers can be packaged and shipped to customers.

[0003] The existing patent application number: 202211281514.X discloses a laser aging test device, which can load multiple semiconductor lasers at one time through the connection between the mounting part and the first drive component, and can be used in conjunction with the second drive component to move the semiconductor laser to be tested to a preset position for aging testing, and can transport the mounting part to the initial position after the aging test for unloading, so as to facilitate batch loading, power-on, power-off and unloading of semiconductor lasers, so as to realize batch aging testing of semiconductor lasers and improve the efficiency of aging testing. In the above-mentioned prior art, when the device is in use, the loading and unloading of the lasers to be tested need to be fixed on the mounting part one by one, or disassembled from the mounting part, and the fully loaded mounting part must be installed on the first drive component during detection, and then the first drive component and the second drive component are started in sequence to respectively realize pushing the mounting part to the test area and powering on the laser on the mounting part for detection, and the operation process is cumbersome and inefficient. Summary of the invention

[0004] The object of the present invention is to provide a semiconductor laser aging test device to solve the problem of cumbersome and inefficient operation of loading, unloading and testing operations during laser testing proposed in the above background technology.

[0005] To achieve the above object, the present invention adopts the following technical solution:

[0006] The present invention provides a semiconductor laser aging test device, comprising a base and a support portion slidably sleeved with a mounting groove provided on the base, wherein the support portion is multi-layered and used to load multiple groups of semiconductor lasers at one time for aging test at the same time, and the support portion comprises:

[0007] A support frame is slidably mounted in the installation groove.

[0008] A plurality of partition boards are fixed inside the support frame and used for vertically dividing the interior of the support frame into multiple layers, and a storage area is formed between two adjacent partition boards.

[0009] Two limit strips are relatively fixed in the storage area.

[0010] A crossbeam fixed in the storage area, the two limit strips and the crossbeam together form a limit slideway.

[0011] The containing parts are slidably mounted in the limiting slideway and are used for containing a plurality of semiconductor lasers in parallel.

[0012] The container comprises:

[0013] A supporting seat is laterally inserted into the limiting slideway, and a containing groove for placing a plurality of semiconductor lasers in parallel is provided on the top of the supporting seat.

[0014] A side stopper is fixed in the containing groove.

[0015] A horizontal axis is relatively rotatable in the containing tank.

[0016] A lifting bar is fixedly sleeved on the horizontal axis.

[0017] A torsion spring is sleeved on one end of the transverse shaft, and two ends of the torsion spring are respectively fixed on the transverse shaft and the side stopper.

[0018] A U-shaped baffle is fixed at the top edge of the supporting seat, wherein the baffle and the lifting bar together form a loading slide, one side of the baffle and the top of the supporting seat together form a slide groove, and the limit bar matches the slide groove.

[0019] Furthermore, the support portion further comprises:

[0020] A wedge-shaped insert block is vertically inserted into the limiting hole arranged on the cross beam.

[0021] A wedge-shaped plug plate is fixed to one side of the supporting seat, and a plug hole is arranged on the wedge-shaped plug plate, and the plug hole matches the wedge-shaped plug block.

[0022] When the wedge-shaped insert plate enters the limiting slideway transversely, the bottom end of the wedge-shaped insert block is inserted into the insert hole.

[0023] Furthermore, the bottom of the wedge-shaped plug and one side of the wedge-shaped plug plate are both inclined surfaces, and the inclined surface of the bottom of the wedge-shaped plug and the inclined surface of one side of the wedge-shaped plug plate are distributed opposite to each other.

[0024] Furthermore, the crossbeam is located at one side of the storage area, and the wedge-shaped insert plate is located between the crossbeam and the partition plate.

[0025] Furthermore, the lifting bar is initially suspended horizontally at the top of the containing groove, and the top of the lifting bar is flush with the top of the side stopper.

[0026] Furthermore, the limiting strip is located at a boundary within the storage area, and one side of the limiting strip corresponds to the sliding groove.

[0027] Furthermore, the semiconductor laser aging test device further comprises:

[0028] A monitor and a light-absorbing radiator are relatively fixed on the base.

[0029] A power connection part is arranged on the base and is used for connecting electricity to the semiconductor laser contained in the support part.

[0030] A driving unit for driving the power connection unit to move linearly.

[0031] Furthermore, the power connection part is located between the support part and the monitor, and the support part is located between the power connection part and the light absorbing heat sink.

[0032] Furthermore, the driving part includes a support bar relatively fixed on the base, a screw rod is rotatably arranged between two of the support bars, and a servo motor for driving the screw rod to rotate is fixed on one of the support bars.

[0033] Furthermore, the power connection unit includes:

[0034] An electric socket is slidably sleeved on the screw rod.

[0035] A plurality of support columns are fixed on one side of the power socket.

[0036] An insulating sleeve is slidably sleeved on one end of the support column.

[0037] A spring is slidably mounted on the outside of the support column.

[0038] An electrical connection post is embedded in the end surface of the insulating sleeve.

[0039] A plurality of conducting wires are arranged between the power socket and the monitoring instrument.

[0040] Compared with the prior art, one or more of the above technical solutions have the following beneficial effects:

[0041] 1. The present invention uses the supporting part and the installation groove and other structures in coordination. After the supporting part is fully loaded with lasers, multiple lasers can be quickly installed to the position to be tested by horizontal plugging and unplugging, or quickly disassembled and unloaded after power failure, and cooperates with the driving part to linearly drive the power connection part to move, so that the power connection part and the laser are electrically connected or disconnected, so as to achieve efficient and accurate connection of the laser aging test circuit, and improve the efficiency of loading and unloading of laser aging test;

[0042] 2. The present invention uses a container, a wedge-shaped plug block, a wedge-shaped plug plate and other structures in coordination. When loading the container, a certain number of lasers can be placed in parallel horizontally at the same time and pushed horizontally into the guide groove. Then, the lasers are directly pressed downward to make the lifting bar flip downward, so that multiple lasers can be loaded into the container groove at one time. Or, after the laser aging test, the two ends of a row of lasers can be squeezed relative to each other and pulled out upward to complete the unloading of the lasers, further improving the efficiency of loading and unloading the lasers and reducing the difficulty of disassembling and assembling the lasers.

[0043] 3. The present invention uses a multi-layer support frame, multiple partition plates and a power connection part corresponding to the power connection port of the laser installed in the container. The power connection part and the laser can be electrically connected only by driving the power connection part to move linearly. The operation is simple and the precision is high. A large number of lasers can be powered on for testing at one time, thereby improving the installation and operation efficiency of the aging test. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 is an axonometric view of the present invention;

[0045] Figure 2 is a partial axonometric view of the present invention;

[0046] Figure 3 is an axonometric view of the support portion of the present invention;

[0047] Figure 4 is a rear perspective axonometric view of the support portion of the present invention;

[0048] Figure 5 It is an axonometric view of the container in the present invention;

[0049] Figure 6 It is a rear perspective axonometric view of the container in the present invention;

[0050] Figure 7 for Figure 6 Enlarged view of part A.

[0051] In the figure: 1. base; 2. driving part; 3. power connection part; 31. power connection seat; 32. support column; 33. insulating sleeve; 34. spring; 35. power connection post; 36. wire; 4. installation groove; 5. support part; 51. support frame; 52. partition plate; 53. limit bar; 54. container; 541. support seat; 542. side block; 543. container groove; 544. horizontal axis; 545. lifting bar; 546. torsion spring; 547. block bar; 548. slide groove; 55. crossbeam; 56. wedge-shaped plug block; 57. limit hole; 58. wedge-shaped plug plate; 59. socket; 6. light-absorbing radiator; 7. monitor. DETAILED DESCRIPTION

[0052] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application.

[0053] like Figures 1 to 7 As shown, a semiconductor laser aging test device includes a base 1 and a support portion 5 slidably sleeved with a mounting groove 4 provided on the base 1. The support portion 5 is a multi-layer arrangement and is used to load multiple groups of semiconductor lasers at one time for aging testing at the same time. The support portion 5 includes:

[0054] The support frame 51 is slidably mounted in the mounting groove 4 .

[0055] A plurality of partition boards 52 are fixed inside the support frame 51 and are used to vertically divide the interior of the support frame 51 into multiple layers. A storage area is formed between two adjacent partition boards 52 .

[0056] Two limit strips 53 are relatively fixed in the storage area.

[0057] A crossbeam 55 fixed in the storage area, two limit strips 53 and the crossbeam 55 together form a limit slideway.

[0058] A containing part 54 is slidably mounted in the limiting slideway and is used for containing a plurality of semiconductor lasers in parallel.

[0059] The internal space of the support frame 51 is divided into multiple storage areas by the partition plate 52 in the vertical direction, so that multiple semiconductor lasers can be installed in the support frame 51 at one time and multiple semiconductor lasers can be subjected to aging tests simultaneously. The support frame 51 can be installed in the installation groove 4 by simple horizontal plug-in, with low operating difficulty and high installation efficiency.

[0060] The container 54 comprises:

[0061] A supporting seat 541 is transversely inserted into the limiting slideway, and a receiving groove 543 for placing a plurality of semiconductor lasers in parallel is provided on the top of the supporting seat 541 .

[0062] A side stopper 542 is fixed in the receiving groove 543 .

[0063] The horizontal shaft 544 is relatively rotatable in the containing groove 543.

[0064] A lifting bar 545 is fixedly mounted on the horizontal shaft 544 .

[0065] A torsion spring 546 is sleeved on one end of the transverse shaft 544 , and two ends of the torsion spring are fixed on the transverse shaft 544 and the side stopper 542 respectively.

[0066] A U-shaped baffle 547 is fixed at the top edge of the supporting seat 541 . The baffle 547 and the lifting bar 545 together form a loading slide. One side of the baffle 547 and the top of the supporting seat 541 together form a slide groove 548 . The limiting bar 53 matches the slide groove 548 .

[0067] When the support seat 541 needs to be loaded, it can be pulled out from the support frame 51 and used in conjunction with the semiconductor laser conveyor so that the end of the loading slide close to the side block 542 is connected to the output end of the conveyor, so that the semiconductor laser can be continuously conveyed to the loading slide until it is filled. Then the user can press down directly to make the two lifting bars 545 in the filling groove 543 deflect downward and be stored on both sides of the filling groove 543, thereby completing the operation of loading the semiconductor laser into the filling groove 543, thereby improving the loading efficiency of the semiconductor laser and simplifying the loading operation. There is no need to load and fix the semiconductor lasers one by one.

[0068] In this embodiment, the support portion 5 further includes:

[0069] A wedge-shaped insert block 56 is vertically inserted into the limiting hole 57 provided on the cross beam 55 .

[0070] A wedge-shaped insert plate 58 is fixed to one side of the supporting seat 541 , and a plug hole 59 is provided on the wedge-shaped insert plate 58 , and the plug hole 59 matches with the wedge-shaped insert block 56 .

[0071] When the wedge-shaped plug plate 58 enters the limiting slideway laterally, the bottom end of the wedge-shaped plug block 56 is inserted into the insertion hole 59. This operation can realize the limiting fixation of the supporting seat 541, so that it is firmly fixed on the top of the partition plate 52, to prevent the semiconductor laser contained therein from shaking during the subsequent power-on operation, thereby affecting the accuracy of the power-on operation and the aging test results. After the aging test, the wedge-shaped plug block 56 can be lifted up to make its lower end completely disengaged from the insertion hole 59, and the supporting seat 541 can be pulled out of the limiting slideway laterally until the wedge-shaped plug plate 58 is completely disengaged from the bottom of the wedge-shaped plug block 56, so as to release the limiting fixation of the supporting seat 541 by the wedge-shaped plug block 56, thereby improving the difficulty of unloading the semiconductor laser after the aging test and improving its unloading efficiency.

[0072] In this embodiment, the bottom of the wedge-shaped plug 56 and one side of the wedge-shaped plug plate 58 are both inclined surfaces, and the inclined surface at the bottom of the wedge-shaped plug 56 and the inclined surface on one side of the wedge-shaped plug plate 58 are relatively distributed. With this design, during the process of the supporting seat 541 being completely inserted into the rear end of the limiting slideway, the resistance between the wedge-shaped plug plate 58 and the wedge-shaped plug 56 can be reduced through the mutual friction of the inclined surfaces arranged relatively on the two, so that the wedge-shaped plug plate 58 can easily lift the wedge-shaped plug 56 to a certain height under the action of thrust, and finally the lower end of the wedge-shaped plug 56 can be inserted into the insertion hole 59, which saves the operator's effort, reduces the operator's labor intensity, and improves the smoothness of the installation operation of the supporting seat 541.

[0073] In this embodiment, the crossbeam 55 is located on one side of the storage area, and the wedge-shaped plug plate 58 is located between the crossbeam 55 and the partition plate 52. Such a design can complete the semi-automatic fixing operation in the final stage of the installation of the support seat 541, so that an interlocking effect is formed between the limit bar 53 and the slide groove 548, the wedge-shaped plug block 56 and the socket 59, thereby realizing the full freedom of the restraint support seat 541, improving the stability of the semiconductor laser in the storage groove 543, avoiding its displacement in the subsequent power-on operation and affecting the accuracy of the power-on operation, and improving the accuracy of the aging test results.

[0074] In this embodiment, the lifting bar 545 is initially suspended horizontally at the top of the filling groove 543, and the top of the lifting bar 545 is flush with the top of the side block 542. Such a design can be used in conjunction with the conveyor when the supporting seat 541 needs to be loaded, so as to realize semi-automatic and efficient loading. After the semiconductor lasers are lined up in parallel in the loading chute, the lifting bar 545 can be stored in the two sides of the filling groove 543 by pressing down the semiconductor lasers, and the semiconductor lasers can be sunk into the filling groove 543, so as to realize efficient filling and loading operations.

[0075] In this embodiment, the limit bar 53 is located at the boundary of the storage area, and one side of the limit bar 53 corresponds to the slide groove 548. This design makes it easier for the support seat 541 to be inserted horizontally into the limit slide, or when the support seat 541 is pulled out from the limit slide, the support seat 541 can load the semiconductor laser to the test position with high precision under the limiting and guiding effect of the two sets of limit bars 53 and the slide groove 548, or quickly complete the preliminary unloading operation after the test, thereby improving the efficiency and accuracy of loading and unloading of semiconductor lasers.

[0076] In this embodiment, the semiconductor laser aging test device further includes:

[0077] A monitor 7 and a light-absorbing radiator 6 are relatively fixed on the base 1 .

[0078] A power connection portion 3 is provided on the base 1 and is used to connect electricity to the semiconductor laser contained in the support portion 5 .

[0079] The driving part 2 is used to drive the power connection part 3 to move linearly.

[0080] The power connection part 3 is located between the support part 5 and the monitor 7 , and the support part 5 is located between the power connection part 3 and the light absorbing heat sink 6 .

[0081] The driving part 2 comprises supporting bars relatively fixed on the base 1, a screw rod is rotatably arranged between the two supporting bars, and a servo motor for driving the screw rod to rotate is fixed on one of the supporting bars.

[0082] After multiple semiconductor lasers are installed in place, the operator can control the servo motor to drive the lead screw to rotate, move the power connection part 3 in a straight line toward the semiconductor laser, and make the power connection part 3 and the semiconductor laser highly connected, so that the electrical connection between the two is unobstructed, and when the semiconductor laser is powered on and an aging test is performed, the laser and high temperature generated by the semiconductor laser are efficiently absorbed, and the heat is efficiently dissipated into the environment, shielding the laser to avoid damage to other objects or equipment.

[0083] In this embodiment, the power connection unit 3 includes:

[0084] The power receiving seat 31 is slidably mounted on the screw rod.

[0085] A plurality of support columns 32 are fixed to one side of the power socket 31 .

[0086] The insulating sleeve 33 is slidably mounted on one end of the supporting column 32 .

[0087] The spring 34 is slidably mounted on the outside of the support column 32 .

[0088] The electrical connection post 35 is embedded in the end surface of the insulating sleeve 33 .

[0089] A plurality of wires 36 are provided between the power socket 31 and the monitoring instrument 7 .

[0090] After the semiconductor laser is installed in place and before the aging test, the servo motor is used to drive the screw to rotate and push the power socket 31 towards the support frame 51 until the end of the power connection post 35 is precisely docked with the power connection end of the semiconductor laser, and the power socket 31 is continued to be pushed to move a short distance. Under the obstruction of the semiconductor laser, the spring 34 is pushed by the insulating sleeve 33 to shorten and deform, so that the support column 32 and the power connection post 35 always maintain a good and stable electrical connection, so that the monitor 7 can monitor and record more comprehensive data monitored during the aging test of the semiconductor laser, and improve the aging test accuracy and stability of the semiconductor laser.

[0091] The above description is only a preferred embodiment of the present invention, and the parts not described in the present invention can be implemented by adopting or drawing on existing technologies. Of course, the above description is not a limitation of the present invention, and the present invention is not limited to the above examples. Changes, modifications, additions or substitutions made by technicians in the technical field within the essential scope of the present invention should also fall within the protection scope of the present invention.

Claims

1. A semiconductor laser aging test device, comprising a base (1) and a support portion (5) slidably sleeved with a mounting groove (4) provided on the base (1), wherein the support portion (5) is multi-layered and used to load multiple groups of semiconductor lasers at one time for simultaneous aging testing, characterized in that: The support portion (5) comprises: A support frame (51) slidably mounted in the mounting groove (4); A plurality of partition boards (52) fixed in the support frame (51) and used to vertically divide the interior of the support frame (51) into multiple layers, wherein two adjacent partition boards (52) enclose each other to form a storage area; Two limiting strips (53) relatively fixed in the storage area; A crossbeam (55) fixed in the storage area, the two limit strips (53) and the crossbeam (55) together form a limit slideway; A containing part (54) slidably mounted in the limiting slideway and used for containing a plurality of semiconductor lasers in parallel; The container (54) comprises: A supporting seat (541) is transversely inserted into the limiting slideway, and a top of the supporting seat (541) is provided with a containing groove (543) for placing a plurality of semiconductor lasers in parallel; A side stopper (542) fixed in the containing groove (543); A horizontal shaft (544) relatively rotatably disposed in the containing tank (543); A lifting bar (545) fixedly sleeved on the horizontal axis (544); a torsion spring (546) sleeved on one end of the transverse shaft (544), wherein two ends of the torsion spring are respectively fixed on the transverse shaft (544) and the side stopper (542); A U-shaped baffle (547) is fixed at the top boundary of the supporting seat (541), wherein the baffle (547) and the lifting bar (545) together form a loading slide, and one side of the baffle (547) and the top of the supporting seat (541) together form a slide groove (548), and the limiting bar (53) matches the slide groove (548).

2. The semiconductor laser aging test device according to claim 1, characterized in that: The support portion (5) further comprises: A wedge-shaped insert block (56) vertically intersecting the limiting hole (57) provided on the crossbeam (55); A wedge-shaped plug plate (58) fixed to one side of the supporting seat (541), wherein the wedge-shaped plug plate (58) is provided with an insertion hole (59), and the insertion hole (59) matches the wedge-shaped plug block (56); When the wedge-shaped insert plate (58) enters the limiting slideway transversely, the bottom end of the wedge-shaped insert block (56) is inserted into the insert hole (59).

3. The semiconductor laser aging test device according to claim 2, characterized in that: The bottom of the wedge-shaped plug (56) and one side of the wedge-shaped plug plate (58) are both inclined surfaces, and the inclined surface at the bottom of the wedge-shaped plug (56) and the inclined surface at one side of the wedge-shaped plug plate (58) are distributed relative to each other.

4. The semiconductor laser aging test device according to claim 3, characterized in that: The crossbeam (55) is located at one side of the storage area, and the wedge-shaped insert plate (58) is located between the crossbeam (55) and the partition plate (52).

5. The semiconductor laser aging test device according to claim 1, characterized in that: In an initial state, the lifting bar (545) is horizontally suspended at the top of the containing groove (543), and the top of the lifting bar (545) is flush with the top of the side stopper (542).

6. The semiconductor laser aging test device according to claim 5, characterized in that: The limiting strip (53) is located at the boundary of the storage area, and one side of the limiting strip (53) corresponds to the sliding groove (548).

7. The semiconductor laser aging test device according to claim 1, characterized in that: The semiconductor laser aging test device also includes: A monitor (7) and a light-absorbing heat sink (6) fixed relatively to the base (1); A power connection portion (3) disposed on the base (1) and used for connecting electricity to the semiconductor laser contained in the support portion (5); A driving part (2) is used for driving the power connection part (3) to move linearly.

8. The semiconductor laser aging test device according to claim 7, characterized in that: The power connection part (3) is located between the support part (5) and the monitor (7), and the support part (5) is located between the power connection part (3) and the light absorbing heat sink (6).

9. The semiconductor laser aging test device according to claim 8, characterized in that: The driving part (2) comprises a support bar fixed relatively to the base (1), a screw rod is rotatably arranged between two of the support bars, and a servo motor for driving the screw rod to rotate is fixed to one of the support bars.

10. The semiconductor laser aging test device according to claim 9, characterized in that: The power connection part (3) comprises: An electric connection seat (31) slidably mounted on the screw rod; A plurality of support columns (32) fixed to one side of the power receiving seat (31); An insulating sleeve (33) slidably mounted on one end of the support column (32); A spring (34) slidably mounted on the outside of the support column (32); An electrical connection post (35) embedded in the end surface of the insulating sleeve (33); A plurality of conducting wires (36) are arranged between the power socket (31) and the monitoring instrument (7).

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