Optical module test equipment, system, control method and upper computer equipment

Abstract

The embodiment of the invention provides optical module testing equipment, an optical module testing system, a control method and upper computer equipment, and the equipment internally comprises a plurality of testing slot positions, and each testing slot position is integrated with a hardware module of a bit error tester; each test slot is provided with a communication interface and establishes an information interaction channel with upper computer equipment through the communication interface arranged on the test slot; the bit error tester is used for communicating with the upper computer equipment through an information interaction channel between the test slot position and the upper computer equipment; and according to a control command of the upper computer equipment, the to-be-tested optical module corresponding to the test slot position is tested. The integrated level is high, the occupied space is small, parallel testing of the optical module is achieved, and therefore the testing efficiency is improved.

Description

Technical Field

[0001] The present disclosure relates to the field of optical communication technology, and in particular to an optical module testing device, system, control method and host computer device. Background Art

[0002] With the rapid growth of data center traffic, the demand for high-speed optical modules is also increasing, which has driven the need for more efficient testing solutions. In traditional optical module testing solutions, the testing process of optical modules requires the cooperation of multiple independent devices, such as bit error testers, temperature control equipment, etc. These test devices are usually placed in test cabinets, which will take up a lot of space; in actual use, the space in the cabinet is limited and can only accommodate some equipment. In addition, an 8-channel bit error tester can only test an 8-channel optical module. If you want to test multiple optical modules at the same time, you need to place multiple bit error testers at the same time, which will take up more space. In addition, optical module manufacturers may purchase equipment from different suppliers separately, and finally combine them together. The compatibility between the equipment cannot be guaranteed, which completely violates the needs of users. Summary of the invention

[0003] The embodiments of the present disclosure provide an optical module testing device, a system, a control method and a host computer device, which are used to solve the problems of low integration, large occupied space and low testing efficiency of existing optical module testing devices.

[0004] Based on the above problems, in a first aspect, an optical module testing device provided by an embodiment of the present disclosure includes:

[0005] The device includes a plurality of test slots, each of which is integrated with a hardware module of a bit error meter; each test slot is provided with a communication interface, and establishes an information interaction channel with a host computer device through the communication interface provided by itself;

[0006] The bit error meter is used to communicate with the host computer device through the information interaction channel between the test slot where it is located and the host computer device; and test the optical module to be tested corresponding to the test slot where it is located according to the control command of the host computer device.

[0007] In combination with the first aspect, in a possible implementation manner, the method further includes: a temperature control module provided for each test slot; the temperature control module is connected to the bit error meter of the test slot via a bus;

[0008] The temperature control module is used to provide a preset ambient temperature for testing the optical module to be tested corresponding to the test slot where the module is located.

[0009] In combination with the first aspect, in a possible implementation manner, the device further includes: a fixture plate;

[0010] The fixture board is connected to the bit error meter by plugging; the bit error meter is connected to the optical module to be tested corresponding to the test slot through the fixture board.

[0011] In combination with the first aspect, in a possible implementation manner, the hardware module of the bit error meter includes: a sub-hardware module of the bit error meter controller and a sub-hardware module of the bit error meter DSP; the sub-hardware module of the bit error meter controller and the sub-hardware module of the bit error meter DSP are connected via a bus;

[0012] The BER controller is used to manage and control the peripheral resources of the test slot according to the control command received from the host device; the peripheral resources include at least one of the following: a BER DSP and a temperature control module;

[0013] The bit error meter DSP is used to test the optical module to be tested corresponding to the test slot and to collect statistics on the bit error information of the optical module to be tested.

[0014] In combination with the first aspect, in a possible implementation, the bit error meter controller is used to receive a control command sent by the host computer device through an interactive channel between the test slot where it is located and the host computer device; parse the control command, determine the target peripheral device and control operation targeted by the control command, and complete the control operation on the target peripheral device; and after completing the control operation on the target peripheral device, send a response message to the host computer device through the interactive channel between the test slot where it is located and the host computer device.

[0015] In combination with the first aspect, in a possible implementation, the target peripheral is a bit error meter DSP; the control operation is a read operation; the bit error meter controller is used to read the corresponding register of the bit error meter DSP; and convert the read register value into corresponding status information; generate response information based on the status information and send it to the host device through the interactive channel between the test slot and the host device;

[0016] The control operation is a write operation; the BER controller is used to determine the register value corresponding to the information to be written; and write the register value into the corresponding register of the BER DSP; based on the result of whether the write register is successful, a response message is generated and sent to the host device through the interactive channel between the test slot and the host device.

[0017] In combination with the first aspect, in a possible implementation manner, the target peripheral is a temperature control module; the control operation is a read operation; the bit error meter controller is used to send a read command to the temperature control module and receive a read result replied by the temperature control module; generate a response message based on the read result and send it to the host computer device through an interactive channel between the test slot and the host computer device;

[0018] The control operation is a write operation; the bit error meter controller is used to send a write command to the temperature control module and receive a write result from the temperature control module indicating whether the write is successful; a response message is generated based on the write result and sent to the host device through an interactive channel between the test slot and the host device.

[0019] In a second aspect, an embodiment of the present disclosure provides a host computer device, including: a control module and a plurality of communication ports;

[0020] The host computer device establishes information interaction channels with corresponding test slots of the optical module test device through multiple communication ports;

[0021] The control module is used to send a control instruction to any communication port among the multiple communication ports through an information interaction channel between the any communication port and the corresponding test slot, and receive response feedback information through the information interaction channel;

[0022] The optical module testing device is as described in the first aspect, or in combination with the optical module testing device described in any possible implementation manner of the first aspect.

[0023] In combination with the second aspect, in a possible implementation, the control module is used to send a connection establishment instruction through any communication port among the multiple communication ports after the any communication port completes a physical connection with a corresponding test slot, and receive information of the corresponding test slot after the connection is successfully established; and

[0024] After the corresponding test slot is connected to the optical module to be tested, a configuration instruction is sent through the any communication port, and response feedback information representing the configuration result is received through the any communication port.

[0025] In combination with the second aspect, in a possible implementation manner, the multiple communication ports include one or more of the following: a network port, a USB port, a COM port, and an LPT port; the communication interfaces corresponding to the multiple test slots of the optical module test device include at least one of the following: a network port and a USB port;

[0026] In the case where the host computer device is respectively connected to at least two test slots through network ports, the host computer device is respectively connected to the at least two test slots through network ports corresponding to the number of the at least two test slots; or the host computer device is connected to the switch through one network port, and the switch is respectively connected to the at least two test slots through network ports corresponding to the number of the at least two test slots.

[0027] In combination with the second aspect, in a possible implementation manner, the host computer device further includes: a display module;

[0028] The display module is used to display a human-computer interaction interface for controlling the multiple test slots, and based on the response feedback information received by the host computer device, display the working status of the multiple test slots on the human-computer interaction interface.

[0029] In a third aspect, an embodiment of the present disclosure provides a control method for an optical module test device, including:

[0030] The optical module test device communicates with the host computer device through an information interaction channel between the test slot where the bit error meter is located and the host computer device for the bit error meter in each test slot; and

[0031] According to the control command of the host computer device, the optical module to be tested corresponding to the test slot is tested;

[0032] The device includes multiple test slots, each of which is integrated with a hardware module of a bit error meter; each test slot is provided with a communication interface, and establishes an information interaction channel with the host computer device through its own communication interface.

[0033] Based on the above problems, in a fourth aspect, an optical module testing system provided by an embodiment of the present disclosure includes: an optical module testing device and a host computer device;

[0034] The optical module test device includes a plurality of test slots, each of which is integrated with a hardware module of a bit error meter; each test slot is provided with a communication interface, and establishes an information interaction channel with a host computer device through the communication interface provided by itself; the host computer device includes a control module and a plurality of communication ports;

[0035] The host computer device establishes information interaction channels with corresponding test slots of the optical module test device through multiple communication ports;

[0036] The optical module test device is used to communicate with the host computer device through the bit error meter based on the information interaction channel between the test slot where the bit error meter is located and the host computer device; and test the optical module to be tested corresponding to the test slot according to the control command of the host computer device;

[0037] The host computer device is used to send a control instruction to any communication port among the multiple communication ports through the control module based on the information interaction channel between the any communication port and the corresponding test slot, and receive response feedback information through the information interaction channel.

[0038] The beneficial effects of the embodiments of the present disclosure include:

[0039] The optical module test equipment, system, control method and host computer equipment provided by the embodiment of the present disclosure include: the equipment includes multiple test slots inside, each test slot is integrated with a hardware module of a bit error meter; each test slot is provided with a communication interface, and establishes an information interaction channel with the host computer equipment through the communication interface set by itself; the bit error meter is used to communicate with the host computer equipment through the information interaction channel between the test slot and the host computer equipment; and according to the control command of the host computer equipment, the optical module to be tested corresponding to the test slot is tested. The optical module test equipment provided by the embodiment of the present disclosure includes multiple independent test slots inside, each test slot is integrated with a hardware module of a bit error meter; and each test slot is provided with a communication interface, and establishes independent information interaction channels with the host computer equipment through these communication interfaces. Compared with the related art, an optical module test equipment integrates multiple test slots, and multiple optical modules to be tested can be tested in parallel, with high integration and small space occupation. Each test slot directly communicates with the host computer equipment, realizing parallel testing of optical modules, thereby improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 One of the structural schematic diagrams of the optical module testing equipment provided in the embodiment of the present disclosure;

[0041] Figure 2 The second structural diagram of the optical module testing equipment provided in the embodiment of the present disclosure;

[0042] Figure 3 A flow chart of a method for controlling optical module testing equipment provided in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0043] The embodiments of the present disclosure provide an optical module test device, system, control method and host computer device. The preferred embodiments of the present disclosure are described below in conjunction with the drawings of the specification. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present disclosure, and are not used to limit the present disclosure. In addition, the embodiments in this application and the features in the embodiments can be combined with each other if there is no conflict.

[0044] The present disclosure provides an optical module testing device 10, such as Figure 1 As shown, the device includes: a plurality of test slots 101 inside, each of which is integrated with a hardware module of a bit error meter 102; each of which is provided with a communication interface 103, and establishes an information interaction channel with a host device 104 through the communication interface provided by itself;

[0045] The bit error tester 102 is used to communicate with the host device 104 through the information exchange channel between the test slot 101 and the host device 104; and test the optical module 105 to be tested corresponding to the test slot 101 according to the control command of the host device 104.

[0046] In order to meet the testing requirements of optical modules, the disclosed embodiment proposes an efficient testing device. In the box of the testing device, a plurality of test slots 101 are usually included, and each test slot 101 is integrated with a test component such as a bit error meter 102. When a certain optical module 105 to be tested needs to be tested, the optical module 105 to be tested is connected to any idle test slot 101, and the optical module 105 to be tested corresponding to the test slot 101 is tested through the test component of the test slot.

[0047] like Figure 1 As shown, the multiple test slots 101 included in the device are independently set, and each test slot 101 is integrated with the hardware module of the bit error meter 102; and each test slot is provided with a communication interface 103, and establishes an information interaction channel with the host device 104 through the communication interface set by itself. The hardware module of each bit error meter 102 communicates with the host device 104 through independent information interaction channels, and performs parallel testing on the optical module 105 to be tested corresponding to the test slot 101 according to the control command of the host device 104, thereby improving the test efficiency.

[0048] Furthermore, the communication interface 103 provided in the test slot may include: a universal serial bus (USB), an Ethernet port, etc. In addition, the positions of the components in the drawings provided in the embodiments of the present disclosure are only for illustration and do not limit the present disclosure. In the embodiments of the present disclosure, a plurality refers to at least two.

[0049] In another embodiment provided by the present disclosure, it further includes: a temperature control module provided for each test slot 101; the temperature control module is connected to the bit error meter 102 of the test slot 101 via a bus;

[0050] The temperature control module is used to provide a preset ambient temperature for the test of the optical module 105 to be tested corresponding to the test slot 101 .

[0051] In the embodiments of the present disclosure, Figure 2 As shown, the temperature control module 107 provided for each test slot 101 is connected to the bit error meter 102 of the test slot 101 through a bus, so as to communicate with the hardware module of the bit error meter 102. The temperature control module 107 is used to provide a preset ambient temperature for the test of the optical module 105 to be tested corresponding to the test slot. The temperature control module 107 can be a thermoelectric cooler (TEC, Thermo Electric Cooler), which has the characteristics of small size, no noise, high temperature control efficiency, and precise temperature control, and can realize the three-temperature (high temperature, normal temperature and low temperature) test of the optical module 105. In addition, a corresponding temperature control interface is provided on the upper computer device side, which greatly facilitates the temperature control operation of the user.

[0052] In yet another embodiment provided by the present disclosure, it further includes: a fixture plate 108;

[0053] The fixture board 108 is connected to the bit error tester 102 by plugging; the bit error tester 102 is connected to the optical module 105 to be tested corresponding to the test slot 101 through the fixture board 108 .

[0054] In the present disclosure, Figure 2 As shown, the fixture board 108 is directly connected to the bit error tester 102 by plugging, eliminating high-speed radio frequency cables, reducing signal loss, improving data transmission rate, and reducing production costs. The bit error tester 102 is connected to the optical module to be tested 105 corresponding to the test slot through the fixture board 108. The fixture board 108 is used to fix the test optical module 105 and provide a slot for plugging and unplugging.

[0055] In another embodiment provided by the present disclosure, the hardware module of the bit error meter 102 includes: a sub-hardware module of the bit error meter controller 1021 and a sub-hardware module of the bit error meter digital signal processor 1022; the sub-hardware module of the bit error meter controller 1021 and the sub-hardware module of the bit error meter digital signal processor 1022 are connected via a bus;

[0056] The BER controller 1021 is used to manage and control the peripheral resources of the test slot according to the control command received from the host device; the peripheral resources include: the BER digital signal processor 1022 and / or the temperature control module;

[0057] The bit error meter digital signal processor 1022 is used to test the optical module 105 to be tested corresponding to the test slot, and to collect statistics on the bit error information of the optical module 105 to be tested.

[0058] In the present disclosure, Figure 2 As shown, the sub-hardware module of the bit error meter controller 1021 (for example, a microcontroller (MCU, MicroController Unit)) and the sub-hardware module of the bit error meter digital signal processor (DSP, Digital Signal Processing) 1022 can be connected via an integrated circuit bus (I2C, Inter-Integrated Circuit) bus);

[0059] The BER controller 1021 directly communicates with the host device 104 and manages and controls the peripheral resources of the test slot according to the control command received from the host device 104;

[0060] The bit error meter DSP1022 is used to test the optical module 105 to be tested corresponding to the test slot. The bit error meter DSP1022 is the core component of the bit error statistics. It first sends a signal to the optical module 105, and the optical module 105 then returns the signal to the bit error meter DSP1022 in some form (such as optical fiber loopback), so as to count the bit error information of the optical module 105 to be tested.

[0061] In another embodiment provided by the present disclosure, the bit error meter controller 1021 is used to receive a control command sent by the host device 104 through an interactive channel between the test slot 101 and the host device 104; parse the control command, determine the target peripheral device and the control operation targeted by the control command, and complete the control operation on the target peripheral device; and after completing the control operation on the target peripheral device, send a response message to the host device 104 through the interactive channel between the test slot 101 and the host device 104.

[0062] In the embodiment of the present disclosure, the BER controller 1021 completes the processing of an instruction including the following steps:

[0063] Step 1: Receive a control command sent by the host device 104 through the interactive channel between the test slot 101 and the host device 104;

[0064] Step 2: parse the control command, determine the target peripheral device and control operation targeted by the control command, and complete the control operation on the target peripheral device;

[0065] Step 3: After completing the control operation on the target peripheral device, a response message is sent to the host device 104 through the interactive channel between the test slot 101 and the host device 104 .

[0066] It can be concluded from the above steps that when testing an optical module, when the BER controller 1021 of the test slot 101 parses and forwards control instructions, there is no intersection with the BER controllers 1021 of other test slots 101. From a functional point of view, the optical module 105 to be tested corresponding to each slot is tested completely in parallel.

[0067] In another embodiment provided by the present disclosure, the target peripheral is a bit error meter DSP1022; the control operation is a read operation; the bit error meter controller 1021 is used to read the corresponding register of the bit error meter DSP1022; and convert the read register value into corresponding status information; generate response information based on the status information and send it to the host device 104 through the interactive channel between the test slot 101 and the host device 104;

[0068] The control operation is a write operation; the bit error meter controller 1021 is used to determine the register value corresponding to the information to be written; and write the register value into the corresponding register of the bit error meter DSP1022; based on the result of whether the write register is successful, a response message is generated and sent to the host device 104 through the interaction channel between the test slot 101 and the host device 104.

[0069] In the embodiment of the present disclosure, the target peripheral is the BER DSP 1022. Taking the function of writing 53.125 GBaud / s into the optical module 105 to be tested as an example, the control operation flow of the BER controller 1021 on the BER DSP 1022 is analyzed.

[0070] First, the BER controller 1021 determines the register value corresponding to the rate information to be written. The BER controller 1021 parses the received write command, for example, the content of the write command is: SOUR:ALL:TIMERBASE[53.125], and obtains the register value corresponding to the write rate information. For example, the pseudo code is:

[0071] if(strcmp(cmd,“:SOUR:ALL:TIMERBASE[”)==0)

[0072] {

[0073] Cmd+=strlen(“:SOUR:ALL:TIMERBASE[”);

[0074] Datarate = atof(cmd);

[0075] Set_Dsp_datarate(Datarate);

[0076] }

[0077] Then, the rate Datarate is written into the corresponding register of the bit error tester DSP1022, so as to achieve the setting of the target rate; finally, based on the result of whether the register is written successfully, a response message is generated and sent to the host device 104 through the interactive channel between the test slot 101 and the host device 104. For example, whether the rate of the optical module 105 to be tested is written successfully can be known according to the register status. If the writing is successful, the host device 1 is replied through the interactive channel between the test slot 101 and the host device 104; if the writing fails, the host device 0 is replied.

[0078] In another embodiment provided by the present disclosure, the target peripheral is a temperature control module; the control operation is a read operation; the BER controller 1021 is used to send a read command to the temperature control module and receive a read result replied by the temperature control module; generate a response message based on the read result and send it to the host device 104 through the interactive channel between the test slot 101 and the host device 104;

[0079] The control operation is a write operation; the bit error meter controller 1021 is used to send a write command to the temperature control module and receive a write result from the temperature control module indicating whether the write is successful; a response message is generated based on the write result and sent to the host device 104 through the interactive channel between the test slot 101 and the host device 104.

[0080] In the embodiment of the present disclosure, the target peripheral is a temperature control module; the following takes the function of setting the ambient temperature of the optical module to be tested to 65 degrees Celsius as an example to analyze the control operation flow of the temperature control module by the bit error meter controller 1021. First, the bit error meter controller 1021 sends a write command to the temperature control module. For example, the content of the write command received by the bit error meter controller 1021 is: SOUR:ALL:TEMP 65. After parsing, the write command is sent to the temperature control module. The pseudo code is:

[0081] if(strcmp(cmd,“:TEC[0]:TEMP”)==0)

[0082] {

[0083] Cmd+=strlen(“:TEC[0]:TEMP”);

[0084] temp = atoi(cmd);

[0085] Set_slot0_temperature(temp);

[0086] }

[0087] After receiving the write command from the BER controller 1021, the temperature control module sets the target temperature to 65 degrees Celsius and responds to the BER controller 1021. The BER controller 1021 receives the write result of whether the writing is successful from the temperature control module, and finally generates a response message based on the write result and sends it to the host device 104 through the interactive channel between the test slot 101 and the host device 104. For example, if the temperature control module writes the temperature successfully, the BER controller 1021 responds to the host device 1, and if it fails, it responds to the host device 0; thereafter, the temperature control module starts the environmental temperature control process.

[0088] Furthermore, if the temperature control module writes the temperature successfully, the host device 104 will also periodically read the current temperature, for example, the host device reads the current temperature every 1 second. For example, the content of the read command received by the BER controller 1021 is: SOUR:ALL:TEMP?, and after parsing, the read command is sent to the temperature control module. The pseudo code is:

[0089] if(strcmp(cmd,":TEMP?")==0)

[0090] {

[0091] Temp=Query_tec_temperature();

[0092] }

[0093] After receiving the read command from the BER controller 1021, the temperature control module reads the test environment temperature of the current optical module 105 to be tested, and responds to the BER controller 1021. The BER controller 1021 receives the read result replied by the temperature control module, and finally generates a response message based on the read result and sends it to the host device 104 through the interactive channel between the test slot 101 and the host device 104. For example, if the current temperature is 60 degrees Celsius, the BER controller 1021 responds to the host device 104 that the reading result is 60 degrees Celsius. After 1 second, the host device 104 continues to read the current temperature, and the above process is repeated until the ambient temperature is read for 30 consecutive times and is around 65 degrees Celsius, and the temperature difference does not exceed 1 degree Celsius.

[0094] With the above Figure 1 or Figure 2 The optical module test device shown in FIG. 1 corresponds to the embodiment of the present disclosure, which further provides a host device 104 , including: a control module and a plurality of communication ports 106 ;

[0095] The host device 104 establishes information interaction channels with the corresponding test slots 101 of the optical module test device through multiple communication ports 106;

[0096] A control module, for sending a control instruction to any communication port among the plurality of communication ports 106 through an information interaction channel between the any communication port 106 and the corresponding test slot 101, and receiving response feedback information through the information interaction channel;

[0097] The optical module testing device may be the optical module testing device 10 provided in the above embodiment.

[0098] In the disclosed embodiment, the host computer device 104 has powerful computing and processing capabilities, integrates the host computer software, and realizes the function of testing the optical module to be tested 105. The multiple communication ports 106 of the host computer device 104 are respectively connected to the communication interface 103 of the corresponding test slot 101 of the optical module test device 10 through data transmission cables, and establish an information exchange channel; the control module (such as the host computer software) of the host computer device 104 can determine the communication port 106, thereby sending a control instruction to the corresponding test slot 101, and receiving response feedback information.

[0099] In the embodiment of the present disclosure, the host computer device 104 may refer to a computer device installed with host computer control software.

[0100] In another embodiment provided by the present disclosure, the control module is used to send a connection establishment instruction through any communication port 106 among the plurality of communication ports 106 after the any communication port 106 completes the physical connection with the corresponding test slot 101, and receive information of the corresponding test slot 101 after the connection is successfully established; and

[0101] After the corresponding test slot 101 is connected to the optical module to be tested 105 , a configuration instruction is sent through any communication port 106 , and response feedback information representing the configuration result is received through any communication port 106 .

[0102] In the embodiment of the present disclosure, illustratively, a data transmission cable is used to connect communication port No. 1 and the corresponding test slot No. 1, and another data transmission cable is used to connect communication port No. 2 and the corresponding test slot No. 2, until the physical connection between the multiple communication ports 106 and the corresponding test slots 101 is completed. After the control module selects any communication port 106, for example, communication port No. 1 is selected, a connection establishment instruction is sent to the corresponding test slot No. 1, and after the connection is successfully established, information of the corresponding test slot is received, for example, the information of the corresponding test slot is that the connection of slot No. 1 is successful; and

[0103] After the corresponding test slot 101 is connected to the optical module to be tested 105, a configuration instruction is sent through the any communication port 106, for example, the configuration instruction is to write the rate of the optical module to be tested at 53.125 billion symbols per second. And the response feedback information representing the configuration result is received through the any communication port 106, for example, if the configuration is successful, a 1 is received through the any communication port, and if the configuration fails, a 0 is received. The host device 104 can select multiple any communication ports 106 and complete the parallel test of the corresponding multiple optical modules 105 to be tested.

[0104] In another embodiment provided by the present disclosure, the plurality of communication ports 106 include one or more of the following: a network port, a USB port, a serial communication port (COM, Cluster Communication Port) and a parallel port (LPT, Line Printer Terminal); the communication interface 103 corresponding to the plurality of test slots 101 of the optical module test device 10 includes at least one of the following: a network port and a USB port;

[0105] When the host computer device 104 is connected to at least two test slots 101 respectively through the network ports 106, the host computer device 104 is connected to the at least two test slots 101 respectively through the network ports 106 corresponding to the number of the at least two test slots 101; or the host computer device 104 is connected to the switch through a network port, and the switch is connected to the at least two test slots 101 respectively through the network ports corresponding to the number of the at least two test slots 101.

[0106] In the disclosed embodiment, the multiple communication ports 106 on the host computer device 104 side may use the same type of ports (for example, all use network ports), or may use different types of ports respectively (for example, some communication ports 106 use network ports, some communication ports 106 use COM ports, etc.). There is no restriction here, as long as it can communicate with the other end of the established information interaction channel.

[0107] In the disclosed embodiment, the number of communication ports 106 of the host device 104 is not limited. When the host device 104 is connected to at least two test slots 101 respectively through the network ports 106, it can be connected to the test slots 101 respectively through the corresponding number of network ports 106, or it can be connected to the test slots 101 respectively through a switch using one network port 106. And after the connection, the information of the corresponding test slot 101 is received through the network protocol. Assuming that the optical module test device 10 provides 4 Ethernet ports and 4 USB ports to the outside, the host device 104 side can use 4 USB cables to connect to the optical module test device 10, or use a network cable to connect to the switch, and then connect 4 network cables to the switch to connect to the optical module test device 10, or it can be mixed (for example, use 3 USB cables and 1 network cable to connect to the optical module test device 10).

[0108] In another embodiment provided by the present disclosure, the host computer device 104 further includes: a display module;

[0109] The display module is used to display a human-machine interaction interface for controlling the multiple test slots 101 , and to display the working status of the multiple test slots 101 on the human-machine interaction interface based on the response feedback information received by the host device 104 .

[0110] In the disclosed embodiment, the host computer device 104 provides a user-friendly human-computer interaction interface. The human-computer interaction interface can display the working status information of each test slot 101. For example, the interface can configure the temperature of the temperature control module of the test slot 101, and display the current test environment temperature of the optical module 105 to be tested in real time. The operation is simple and convenient, which is convenient for users to better observe and record test results.

[0111] The following is an example of an operation flow of the host device 104:

[0112] Taking the parallel testing of the optical modules in the first slot and the second slot as an example, the process may include:

[0113] First, use a USB cable to connect the host device 104 (in this embodiment, a personal computer (PC)) and the USB port on the rear panel of the first slot, then open the device manager on the PC to check the ports (COM and LPT) and confirm that the USB corresponds to COM5;

[0114] Use another USB cable to connect the PC and the USB port on the rear panel of the second slot, then open the device manager on the PC, check the ports (COM and LPT), and confirm that the USB corresponds to COM6.

[0115] Open the host computer software (installed on the PC), select the communication interface as COM5, click Connect, and when the information of the first slot is displayed, it means the connection is successful. The host computer software controls the first slot.

[0116] Open another host computer software, select the communication interface as COM6, click Connect, and when the information of the second slot is displayed, it means the connection is successful. The host computer software controls the second slot.

[0117] Note that the two host computer software opened here can be the same host computer software or the same host computer software according to actual needs, but the optical modules controlled are different.

[0118] The user inserts the optical module to be tested into the first slot, and then clicks the start test button of the PC host software. The host device 104 will send a series of configuration commands to configure the test conditions. These configurations include:

[0119] -Test rate of optical module, such as 53.125GBaud / s

[0120] -The signal format of the optical module, such as PAM4 or NRZ

[0121] -Test pattern, such as PRBS31

[0122] - Start PPG signal output

[0123] -Start ED end bit error measurement

[0124] -……

[0125] Taking the configuration of the rate of the optical module as an example, the process of configuring the first slot can be seen in the above embodiment in detail, which will not be repeated here.

[0126] Based on the same concept, the embodiment of the present disclosure also provides a control method for an optical module testing device, such as Figure 3 As shown, including:

[0127] S301, the optical module test device communicates with the host computer device through the information interaction channel between the test slot where the bit error meter is located and the host computer device for each test slot; and

[0128] S302, testing the optical module to be tested corresponding to the test slot according to the control command of the host computer device;

[0129] The device includes multiple test slots, each of which is integrated with a hardware module of a bit error meter; each test slot is provided with a communication interface, and establishes an information interaction channel with the host computer device through its own communication interface.

[0130] Since the principle of the problem solved by the control method is similar to that of the aforementioned optical module test device and host computer device, the implementation of the control method can refer to the aforementioned optical module test device and host computer device implementation, and the repeated parts will not be repeated.

[0131] Based on the same concept, the present disclosure also provides an optical module testing system. Figure 1 or Figure 2 The figure includes: an optical module testing device 10 and a host computer device 104;

[0132] The optical module test device 10 includes a plurality of test slots 101, each of which is integrated with a hardware module of a bit error meter 102; each of the test slots 101 is provided with a communication interface 103, and establishes an information interaction channel with a host device 104 through the communication interface 103 provided by itself; the host device 104 includes a control module and a plurality of communication ports 106;

[0133] The host device 104 establishes information interaction channels with the corresponding test slots 101 of the optical module test device 10 through multiple communication ports 106;

[0134] The optical module test device 10 is used to communicate with the host device 104 through the bit error tester 102 based on the information interaction channel between the test slot 101 where the bit error tester 102 is located and the host device 104; and test the optical module 105 to be tested corresponding to the test slot 101 according to the control command of the host device 104;

[0135] The host device 104 is used to send a control instruction to any communication port 106 among the multiple communication ports 106 through the control module based on the information interaction channel between the any communication port 106 and the corresponding test slot 101, and receive response feedback information through the information interaction channel.

[0136] Since the principle of solving the problem by this system is similar to that of the aforementioned optical module test equipment and host computer equipment, the implementation of this system can refer to the aforementioned optical module test equipment and host computer equipment implementation, and the repeated parts will not be repeated.

[0137] Through the description of the above implementation methods, those skilled in the art can clearly understand that the embodiments of the present disclosure can be implemented by hardware, or by means of software plus a necessary general hardware platform. Based on such an understanding, the technical solution of the embodiments of the present disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (which can be a CD-ROM, a USB flash drive, a mobile hard disk, etc.), including a number of instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment of the present disclosure.

[0138] Those skilled in the art will appreciate that the accompanying drawings are merely schematic diagrams of a preferred embodiment, and the modules or processes in the accompanying drawings are not necessarily required for implementing the present disclosure.

[0139] Those skilled in the art can understand that the modules in the device in the embodiment can be distributed in the device in the embodiment according to the description of the embodiment, or can be changed accordingly and located in one or more devices different from the present embodiment. The modules in the above embodiment can be combined into one module, or can be further divided into multiple sub-modules.

[0140] The serial numbers of the above-mentioned embodiments of the present disclosure are only for description and do not represent the advantages or disadvantages of the embodiments.

[0141] Obviously, those skilled in the art can make various changes and modifications to the present disclosure without departing from the spirit and scope of the present disclosure. Thus, if these modifications and variations of the present disclosure fall within the scope of the claims of the present disclosure and their equivalents, the present disclosure is also intended to include these modifications and variations.

Claims

1. An optical module testing device, characterized in that: include: The device includes a plurality of test slots, each of which is integrated with a hardware module of a bit error meter; each test slot is provided with a communication interface, and establishes an information interaction channel with a host computer device through the communication interface provided by itself; The bit error meter is used to communicate with the host computer device through the information interaction channel between the test slot where it is located and the host computer device; and test the optical module to be tested corresponding to the test slot where it is located according to the control command of the host computer device.

2. The optical module testing device according to claim 1, characterized in that: Also includes: A temperature control module is provided for each test slot; The temperature control module is connected to the bit error meter of the test slot via a bus; The temperature control module is used to provide a preset ambient temperature for testing the optical module to be tested corresponding to the test slot where the module is located.

3. The device according to claim 1, characterized in that Also includes: Fixture plate; The fixture plate is connected to the bit error meter by plugging; The bit error meter is connected to the optical module to be tested corresponding to the test slot through the fixture plate.

4. The device according to claim 2, characterized in that The hardware module of the bit error meter includes: a sub-hardware module of the bit error meter controller and a sub-hardware module of the bit error meter digital signal processor DSP; the sub-hardware module of the bit error meter controller and the sub-hardware module of the bit error meter DSP are connected via a bus; The BER controller is used to manage and control the peripheral resources of the test slot according to the control command received from the host device; the peripheral resources include at least one of the following: a BER DSP and a temperature control module; The bit error meter DSP is used to test the optical module to be tested corresponding to the test slot and to collect statistics on the bit error information of the optical module to be tested.

5. The device according to claim 4, characterized in that The BERT controller is configured to receive a control command sent by the host device through an interactive channel between the test slot where the BERT controller is located and the host device; parse the control command, determine the target peripheral device and the control operation targeted by the control command, and complete the control operation on the target peripheral device; And after completing the control operation on the target peripheral device, sending response information to the host computer device through the interactive channel between the test slot and the host computer device.

6. The device according to claim 5, characterized in that The target peripheral is a bit error meter DSP; the control operation is a read operation; the bit error meter controller is used to read the corresponding register of the bit error meter DSP; and convert the read register value into corresponding status information; Generate response information based on the status information and send it to the host computer device through an interactive channel between the test slot and the host computer device; The control operation is a write operation; The BER controller is used to determine the register value corresponding to the information to be written; and write the register value into the corresponding register of the BER DSP; generate response information based on the result of whether the register is written successfully and send it to the host device through the interactive channel between the test slot and the host device.

7. The device according to claim 5, characterized in that The target peripheral is a temperature control module; the control operation is a read operation; the BER controller is used to send a read command to the temperature control module and receive a read result replied by the temperature control module; generate a response message based on the read result and send it to the host device through an interactive channel between the test slot and the host device; The control operation is a write operation; The bit error meter controller is used to send a write command to the temperature control module and receive a write result from the temperature control module indicating whether the write is successful; generate response information based on the write result and send it to the host computer device through the interactive channel between the test slot and the host computer device.

8. A host computer device, characterized in that: include: control module and multiple communication ports; The host computer device establishes information interaction channels with corresponding test slots of the optical module test device through multiple communication ports; The control module is used to send a control instruction to any communication port among the multiple communication ports through an information interaction channel between the any communication port and the corresponding test slot, and receive response feedback information through the information interaction channel; The optical module testing device is the optical module testing device provided in any one of claims 1-7.

9. The host computer device according to claim 8, characterized in that: The control module is used for sending a connection establishment instruction through any communication port among the multiple communication ports after the communication port completes the physical connection with the corresponding test slot, and receiving information of the corresponding test slot after the connection is successfully established; as well as After the corresponding test slot is connected to the optical module to be tested, a configuration instruction is sent through the any communication port, and response feedback information representing the configuration result is received through the any communication port.

10. The host computer device according to claim 8, characterized in that: The multiple communication ports include one or more of the following: a network port, a universal serial bus USB, a serial communication port COM, and a parallel port LPT; the communication interfaces corresponding to the multiple test slots of the optical module test equipment include at least one of the following: a network port and a USB port; In the case where the host computer device is respectively connected to at least two test slots through network ports, the host computer device is respectively connected to the at least two test slots through network ports corresponding to the number of the at least two test slots; or the host computer device is connected to the switch through one network port, and the switch is respectively connected to the at least two test slots through network ports corresponding to the number of the at least two test slots.

11. The host computer device according to claim 8, characterized in that: The host computer device also includes: a display module; The display module is used to display a human-computer interaction interface for controlling the multiple test slots, and based on the response feedback information received by the host computer device, display the working status of the multiple test slots on the human-computer interaction interface.

12. A control method for an optical module testing device, characterized in that: include: The optical module test device communicates with the host computer device through an information interaction channel between the test slot where the bit error meter is located and the host computer device for the bit error meter in each test slot; and According to the control command of the host computer device, the optical module to be tested corresponding to the test slot is tested; The device includes multiple test slots, each of which is integrated with a hardware module of a bit error meter; each test slot is provided with a communication interface, and establishes an information interaction channel with the host computer device through its own communication interface.

13. An optical module testing system, characterized in that: include: Optical module testing equipment and host computer equipment; The optical module test device includes a plurality of test slots, each of which is integrated with a hardware module of a bit error meter; each test slot is provided with a communication interface, and establishes an information interaction channel with a host computer device through the communication interface provided by itself; the host computer device includes a control module and a plurality of communication ports; The host computer device establishes information interaction channels with corresponding test slots of the optical module test device through multiple communication ports; The optical module test device is used to communicate with the host computer device through the bit error meter based on the information interaction channel between the test slot where the bit error meter is located and the host computer device; and test the optical module to be tested corresponding to the test slot according to the control command of the host computer device; The host computer device is used to send a control instruction to any communication port among the multiple communication ports through the control module based on the information interaction channel between the any communication port and the corresponding test slot, and receive response feedback information through the information interaction channel.

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