Comprehensive test system for test machine

Abstract

The invention relates to a comprehensive test system for a test machine, which is applied to the technical field of equipment test and comprises a control unit, a signal test unit, a power supply test unit and a reliability test unit, the control unit is used for sending a control instruction to the signal test unit, the power supply test unit and the reliability test unit; the signal testing unit is connected to the control unit and is used for receiving the control instruction and testing the quality of a signal output by a to-be-tested device, and the to-be-tested device is used for testing a chip; the power supply test unit is connected to the control unit and is used for receiving the control instruction and testing a power supply signal output by a to-be-tested device, and the to-be-tested device is used for testing a chip; and the reliability test unit is connected to the control unit and the signal test unit and is used for testing the reliability of the to-be-tested equipment. The method has the technical effects that the accuracy of a test result is improved, and the test efficiency is improved.

Description

Technical Field

[0001] The present application relates to the technical field of equipment testing, and in particular to a comprehensive testing system for a testing machine. Background Art

[0002] With the rapid development and widespread application of information technology, the importance of chips as core components of electronic devices is self-evident. As various industries continue to increase their requirements for data processing capabilities, operating speeds, and energy efficiency, the demand for chips is not only reflected in the surge in quantity, but also in unprecedented high standards in terms of performance, stability, security, and customization. This trend has driven the rapid growth in demand for chip testing to ensure that each chip meets strict quality standards before leaving the factory and meets the needs of complex and changing application scenarios.

[0003] Faced with huge testing needs, chip testing equipment, as a key tool to ensure chip quality, has become increasingly important. In order to meet increasingly stringent testing requirements, testing equipment must not only have high-precision measurement capabilities and efficient data processing capabilities, but also have a longer service life and more stable and reliable performance. This requires equipment manufacturers to fully consider durability, ease of maintenance and scalability during design to ensure that the equipment can operate stably in a high-intensity, continuous working environment.

[0004] In order to ensure that the test equipment is always in the best working condition, daily maintenance and calibration work has become an indispensable part. This includes regular cleaning of the equipment, checking the wear of each component, replacing aging or damaged parts, adjusting equipment parameters to ensure measurement accuracy, etc. In addition, with the advancement of technology, new test methods and standards need to be continuously introduced to adapt to the rapid development of chip testing technology. Through scientific and standardized maintenance processes and strict testing standards, the service life of the equipment can be effectively extended, the test efficiency and accuracy can be improved, and strong support can be provided for the stable improvement of chip quality. Therefore, strengthening the daily maintenance and calibration of chip testing equipment is not only a necessary means to ensure test quality and improve production efficiency, but also the key to promoting the sustainable and healthy development of the entire chip industry.

[0005] Currently, the test system for test equipment needs to use an oscilloscope to calibrate the output signal of the device. Usually, each channel is tested separately, and the test parameters are recorded, such as the internal resistance, the rise and fall time of the signal channel, the connectivity between channels, etc. These parameters are collected and sorted, and compared with the test indicators to automatically determine whether the performance parameters of each channel of the test machine are qualified.

[0006] However, the existing test system requires a lot of time to test and collect data, and needs to be refitted and tested again based on the collected data, which increases the maintenance cost of the equipment and reduces the test efficiency. Summary of the invention

[0007] In order to help solve the problem that the existing test system needs to spend a lot of time to test and collect and organize data, and needs to re-fit and test again according to the collected and organized data, which increases the maintenance cost of the equipment and reduces the test efficiency, the application provides a comprehensive test system for a test machine, which adopts the following technical solution: the system includes: a control unit, a signal test unit, a power supply test unit and a reliability test unit;

[0008] The control unit is used to issue control instructions to the signal testing unit, the power testing unit and the reliability testing unit;

[0009] The signal testing unit is connected to the control unit, and is used to receive the control instruction and test the signal quality output by the device under test, wherein the device under test is a device under test for testing a chip;

[0010] The power supply test unit is connected to the control unit, and is used to receive the control instruction and test the power supply signal output by the device to be tested, wherein the device to be tested is a device to be tested for testing a chip;

[0011] The reliability testing unit is connected to the control unit and the signal testing unit, and is used to test the reliability of the device to be tested.

[0012] In a specific implementation scheme, the control unit is an MCU control chip.

[0013] In a specific implementation scheme, the model of the MCU control chip is ZYNQ7000.

[0014] In a specific implementation scheme, the signal test unit includes a plurality of relays connected in parallel, one end of the relays is connected to different signal test channels, and the other end of the relays is connected to an oscilloscope; the other end of the oscilloscope is connected to a host computer;

[0015] Among them, the plurality of relays respectively control corresponding signal test channels, and the signal test channels are signal output channels of the device to be tested.

[0016] In a specific implementation manner, the signal test channels include 256 signal test channels.

[0017] In a specific implementation scheme, the power supply test unit includes a plurality of relays connected in parallel, one end of the relays is respectively connected to different power supply output channels, and the other end of the relays is connected to a power supply test device; the other end of the power supply test device is connected to a host computer;

[0018] Among them, the plurality of relays respectively control corresponding power output channels, and the power output channels are power output channels of the device to be tested.

[0019] In a specific possible implementation manner, the power supply testing equipment includes a multimeter and an electronic load connected in parallel.

[0020] In a specific implementation manner, the power output channels include 16 power output channels.

[0021] In a specific implementation scheme, the reliability test unit includes a plurality of relays connected in parallel, one end of the relays is connected to different signal test channels respectively, and the other end of the relays is connected to a reverse power supply; the other end of the reverse power supply is connected to the control unit;

[0022] Among them, the plurality of relays respectively control corresponding signal test channels, and the signal test channels are signal output channels of the device to be tested.

[0023] In a specific possible implementation scheme, the device to be tested is connected to the comprehensive test system for the test machine through a gold finger board;

[0024] Wherein, the gold finger board includes 256 signal interfaces.

[0025] In summary, this application has the following beneficial technical effects:

[0026] The power supply test and signal test solutions of the test machine are integrated, and the power supply test and signal test can be performed simultaneously in the same system to improve the test efficiency. Secondly, multiple signal output channels and power output channels are connected to the corresponding test equipment in parallel through relays, and the on and off of the relays are controlled by the control signal of the MCU chip. When maintaining the equipment, there is no need to manually modify the wiring of the instrument and equipment frequently. While improving efficiency, it can also avoid manual errors as much as possible and improve the accuracy of the test results. In addition, increase the reliability test of the test equipment. Passing the reliability test before testing can usually avoid some repetitive or meaningless tests, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a schematic diagram of the framework of a comprehensive test system for a test machine in an embodiment of the present application;

[0028] Figure 2 It is a schematic diagram of the gold finger board in the embodiment of the present application.

[0029] Reference numerals: 101, control unit; 102, signal testing unit; 103, power supply testing unit; 104, reliability testing unit. DETAILED DESCRIPTION

[0030] The following combination Figure 1-Figure 2 This application is described in further detail.

[0031] The embodiment of the present application discloses a comprehensive test system for a test machine. The test system can be used to implement signal, power supply and reliability testing of the test machine. The test machine is mainly a test device for testing chips. In the manufacturing process of chips, chip testing is particularly important. Chip testing can test the performance of chips to determine whether the produced chips are qualified and whether they can be put into normal use. Therefore, chip testing equipment is a key tool to ensure chip quality, and its importance is becoming more and more prominent. As the integration of chips becomes higher and higher, the testing requirements for chips are becoming more and more stringent. The test equipment not only needs to have high-precision measurement capabilities and high-efficiency data processing capabilities, but also must have a longer service life and more stable and reliable performance. Therefore, in order to ensure the reliability of chip test results, test calibration and equipment maintenance of test equipment for testing chips are also important links in the chip production process.

[0032] At present, the test system for test equipment needs to use an oscilloscope to calibrate the output signal of the equipment. Usually, each channel is tested separately, and the test parameters are recorded, such as the internal resistance, the rise and fall time of the signal channel, the connectivity between channels, etc., and these parameters are collected and sorted, compared with the test indicators, and the performance parameters of each channel of the test machine are automatically determined to be qualified. In addition, traditional test equipment generally needs to test and calibrate its power supply separately. Similarly, a separate test instrument needs to be used externally for manual or automatic testing and calibration, and the test data of the power supply needs to be recorded and sorted.

[0033] However, the existing test system requires a lot of time to test and collect and organize data, and it is necessary to refit and test again based on the collected and organized data, which increases the maintenance cost of the equipment and reduces the test efficiency; secondly, the existing test system requires a lot of test wiring, and the wiring of the test instrument needs to be frequently replaced, which has a certain impact on the test results, and thus affects the calibration accuracy; at the same time, the existing test system requires manual repeated recording and data processing, and the amount of data is huge, which is easy to produce measurement errors due to misoperation, or cause greater impact. Therefore, in order to help improve the accuracy of the test and improve the test efficiency, the present application provides a comprehensive test system for the test machine.

[0034] Reference Figure 1 The comprehensive test system for the test machine includes a control unit 101 , a signal test unit 102 , a power supply test unit 103 and a reliability test unit 104 .

[0035] The control unit 101 is used to send control instructions to the signal test unit, the power test unit and the reliability test unit, wherein the control unit is an MCU control chip, and the model of the MCU control chip is ZYNQ7000. The signal test unit 102 is connected to the control unit, and is used to receive control instructions and test the signal quality output by the device to be tested, and the device to be tested is a device to be tested for testing chips; the power test unit 103 is connected to the control unit, and is used to receive control instructions and test the power signal output by the device to be tested, and the device to be tested is a device to be tested for testing chips; the reliability test unit 104 is connected to the control unit and the signal test unit, and is used to test the reliability of the device to be tested.

[0036] The signal test unit 102 mainly tests whether the signal quality emitted by the test machine meets the standards, such as the rise and fall time, signal amplitude, frequency and other indicators, which are usually tested with an oscilloscope. The signal test unit 102 includes a number of relays connected in parallel. The relays are used to control the on and off of each signal channel. One end of the relay is connected to different signal test channels, and the other end of the relay is connected to the oscilloscope; the other end of the oscilloscope is connected to the host computer to transmit the data collected by the oscilloscope to the computer for the user to view. Among them, a number of relays control the corresponding signal test channels respectively, that is, one relay controls the on and off of one signal channel. The signal test channel is the signal output channel of the device to be tested. It can also be understood that the number of relays is consistent with the number of signal channels of the device to be tested, and the specific number of relays is determined by the number of signal channels of the device to be tested. Reference Figure 1 , after the signal output channel of the device to be tested is connected in parallel through the relay, the on and off of the relay is controlled by the control signal of the MCU chip. For example, when testing signal channel 1, the control signal 1 of the MCU sends a signal to open the passage between signal channel 1 and the test channel, and the remaining signal channels to be tested are in a disconnected state; in this way, when maintaining the equipment, there is no need to manually modify the wiring of the instrument and equipment frequently, which improves efficiency and avoids manual errors. It should be noted that the number of signal test channels can be set according to the actual needs of the user to meet the test requirements. In the embodiment of the present application, 256 signal test channels are used, and 256 signal test channels can meet the needs of most test equipment.

[0037] Considering that in traditional testing methods, it is necessary to frequently switch the interface between the device and the oscilloscope for different test channels, and most devices usually have hundreds of signal interfaces, manual switching is time-consuming and labor-intensive, and prone to errors. Therefore, in the present application, the wiring that needs to be frequently switched is fixed to one interface, and the oscilloscope does not need to be moved after it is connected. Subsequent switching is performed by the hardware control circuit inside the test system to avoid manual intervention.

[0038] The power supply test unit 103 mainly tests whether the amplitude of the power supply signal output by the tester meets the standard. For example, the amplitude of 3.3V is required, and the tester cannot output 3.5V, so the power supply output error needs to be controlled within a reasonable range; in addition, the power supply of the tester needs to have a certain load capacity. For example, the chip needs 5V voltage and 1A current when it works normally, so the tester needs to be able to stably support 5V / 1A output. For an efficient tester, multiple groups of power supplies are generally provided to meet the test requirements in most cases. When testing the tester, it is necessary to measure multiple groups of power supplies one by one, which will greatly reduce the test efficiency. Therefore, the power supply test unit 103 includes several parallel relays, one end of the relay is connected to different power output channels respectively, and the other end of the relay is connected to the power supply test equipment, which includes a multimeter and an electronic load connected in parallel; the other end of the power supply test equipment is connected to the host computer to transmit the data of the multimeter and the electronic load test to the computer for the user to view. Among them, several relays control corresponding power output channels respectively, that is, one relay controls one power output channel, and the power output channel is the power output channel of the device to be tested. It can also be understood that the number of relays is consistent with the number of power output channels of the device to be tested, and the specific number of relays is determined by the number of power output channels of the device to be tested. Figure 1 , after the power output channels of the device to be tested are connected in parallel through relays, the on and off of the relays are controlled by the control signal of the MCU chip. For example, when testing power channel 1, the control signal 1 of the MCU sends a signal to open the path between power channel 1 and the test channel, and the other power supplies to be tested are in a disconnected state; in this way, when calibrating or maintaining the power supply of the device, there is no need to manually modify the wiring of the instrument and the equipment frequently, which improves efficiency and avoids manual errors. It should be noted that the number of power output channels can be set according to the actual needs of the user to meet the test requirements. In the embodiment of the present application, 16 power output channels are used, and 16 power output channels can meet the needs of most test equipment.

[0039] Considering that in the existing power supply testing and calibration, different loads need to be added to the power supply according to different load conditions, which can generally be completed by an electronic load. However, a test device usually has a large number of power supplies. To fully complete the power supply calibration of a device, it is necessary to frequently switch the interface between the device and the electronic load. During the switching process, if the wiring is accidentally wrong, it may cause the power supply to burn out, and in severe cases, it may cause a fire. Therefore, in the present application scheme, the wiring that needs to be frequently switched is fixed to an interface, and the electronic load does not need to be moved after it is connected. Subsequent switching is performed by the hardware control circuit inside the test system to avoid manual intervention. In addition, in the present application scheme, the power supply test and signal test of the test equipment are integrated, and the power supply test and signal test can be performed simultaneously in the same system, thereby improving the test efficiency.

[0040] The reliability test unit 104 is used to test the reliability of the device to be tested. The test machine needs to ensure that the internal connection performance of the test machine is intact before measurement, otherwise, the test result is invalid and the reliability is low. In order to ensure that the connection performance of the test machine itself is intact before testing, a reliability test unit is added to the present application. The reliability test unit 104 includes a number of relays in parallel, one end of the relay is connected to different signal test channels, and the other end of the relay is connected to a reverse power supply; the other end of the reverse power supply is connected to a control unit; wherein, a number of relays control the corresponding signal test channels respectively, that is, one relay controls the on and off of one signal channel, and the signal test channel is the signal output channel of the device to be tested. It can also be understood that the number of relays is consistent with the number of signal channels of the device to be tested, and the specific number of relays is determined by the number of signal channels of the device to be tested.

[0041] The reliability test unit 104 includes a test button. Before the test machine is formally tested, the button is pressed to start and control the relay to energize the test loop for installation reliability. In the test loop, each channel is connected to a reverse power supply, and the reverse voltage of the channel is tested through the reverse power supply. The reverse voltage of each channel is fed back to the MCU chip through the IIC communication protocol, and finally output to the upper computer software to determine whether the voltage is within a reasonable range, so as to determine the reliability of the internal installation of the test machine.

[0042] It should be noted that the reliability test unit used in the present application scheme utilizes a diode that must exist in each channel of the test equipment itself, and tests the reverse conduction voltage of the diode of the channel through a reverse power supply (the voltage will be sent to the MCU chip through IIC communication, and finally sent to the computer through the network port communication together with the test data of the MCU chip). If the channel is well connected, the tested reverse conduction voltage is consistent with all other channels. If the channel is disconnected, the reverse conduction voltage cannot be measured; if there are other problems with the channel, such as poor contact, the measured reverse conduction power supply will also be different. Check the signal channel of the test machine before testing, and then test after ensuring that the channel is normal, so as to improve the test efficiency and avoid repetitive or meaningless tests as much as possible.

[0043] Considering that the reliability of the test machine installation is not tested in the existing test system, it is usually a direct test, whether manual or automatic. After the test is completed, the problematic areas are usually reported directly for repair, or the parts with problematic test results are simply not used anymore. Passing reliability tests before testing can usually avoid some repetitive or meaningless tests, thereby improving test efficiency.

[0044] The device to be tested is connected to the comprehensive test system for the test machine through a gold finger board, where the gold finger includes a 256-channel signal interface. Considering that there are multiple groups of equipment in the laboratory, and the configurations and models of the equipment are different, some devices can provide 128 signals in one interface, and some devices can provide 184 signals in one interface. Therefore, in the embodiment of the present application, the device to be tested is connected to the comprehensive test system through the gold finger of the 256-channel signal interface; multiple groups of adapter boards corresponding to different devices are designed for the test equipment end, and different adapter boards are designed for different devices to transfer the power output on the device to the test system, ensuring compatibility while taking into account cost and convenience. Among them, the schematic diagram of the gold finger adapter board is as follows Figure 2 shown.

[0045] This specific embodiment is merely an explanation of the present invention and is not a limitation of the present invention. After reading this specification, those skilled in the art may make non-creative modifications to the present embodiment as needed. However, as long as they are within the scope of the claims of the present invention, they are protected by the patent law.

Claims

1. A comprehensive testing system for a testing machine, characterized in that: The system comprises: a control unit, a signal testing unit, a power supply testing unit and a reliability testing unit; The control unit is used to issue control instructions to the signal testing unit, the power testing unit and the reliability testing unit; The signal testing unit is connected to the control unit, and is used to receive the control instruction and test the signal quality output by the device under test, wherein the device under test is a device under test for testing a chip; The power supply test unit is connected to the control unit, and is used to receive the control instruction and test the power supply signal output by the device to be tested, wherein the device to be tested is a device to be tested for testing a chip; The reliability testing unit is connected to the control unit and the signal testing unit, and is used to test the reliability of the device to be tested.

2. The comprehensive testing system for a testing machine according to claim 1, characterized in that: The control unit is an MCU control chip.

3. The comprehensive testing system for a testing machine according to claim 1, characterized in that: The model of the MCU control chip is ZYNQ7000.

4. The comprehensive test system for a test machine according to claim 1, characterized in that: The signal test unit comprises a plurality of relays connected in parallel, one end of the relays is respectively connected to different signal test channels, and the other end of the relays is connected to an oscilloscope; the other end of the oscilloscope is connected to a host computer; Among them, the plurality of relays respectively control corresponding signal test channels, and the signal test channels are signal output channels of the device to be tested.

5. The comprehensive test system for a test machine according to claim 4, characterized in that: The signal test channels include 256 signal test channels.

6. The comprehensive test system for a test machine according to claim 1, characterized in that: The power supply test unit comprises a plurality of relays connected in parallel, one end of the relays is respectively connected to different power supply output channels, and the other end of the relays is connected to a power supply test device; the other end of the power supply test device is connected to a host computer; Among them, the plurality of relays respectively control corresponding power output channels, and the power output channels are power output channels of the device to be tested.

7. The comprehensive testing system for a testing machine according to claim 6, characterized in that: The power supply testing device includes a multimeter and an electronic load connected in parallel.

8. The comprehensive test system for a test machine according to claim 6, characterized in that: The power output channels include 16 power output channels.

9. The comprehensive testing system for a testing machine according to claim 1, characterized in that: The reliability test unit comprises a plurality of relays connected in parallel, one end of each relay is connected to different signal test channels, and the other end of each relay is connected to a reverse power supply; the other end of each reverse power supply is connected to the control unit; Among them, the plurality of relays respectively control corresponding signal test channels, and the signal test channels are signal output channels of the device to be tested.

10. The comprehensive testing system for a testing machine according to claim 1, characterized in that: The device to be tested is connected to the comprehensive test system for the test machine through a gold finger board; Wherein, the gold finger board includes 256 signal interfaces.

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