Atomic magnetometer based on planar transmission pump light path

Abstract

The invention belongs to the technical field of atom magnetometers, and particularly discloses an atom magnetometer based on a plane transmission pump light path, and the atom magnetometer comprises a light source which can emit a first light beam to an atom gas chamber along a first propagation direction; the reflecting mirror group is arranged on the atomic gas chamber; the reflector group is provided with a first reflecting surface and a second reflecting surface which correspond to each other, and the first reflecting surface converts the first light beam into at least one second light beam and reflects the second light beam to the second reflecting surface; the second light beam is propagated in the atomic gas chamber along a second propagation direction; the photoelectric detection mechanism is arranged at one end, away from the light source, of the atomic gas chamber along the first propagation direction; the photoelectric detection mechanism receives the second light beams and obtains the magnetic field intensity of the atomic gas chamber through light intensity signals of all the second light beams; compared with the prior art, the omnidirectional magnetic field measuring device has the advantages that higher measuring precision can be achieved, the device is suitable for occasions of high-precision magnetic field measurement, magnetic field intensity information in multiple directions can be provided at the same time, and omnidirectional measurement of the magnetic field is achieved.

Description

Technical Field

[0001] The invention relates to the technical field of atomic magnetometers, and in particular to an atomic magnetometer based on a planar transmission pump optical path. Background Art

[0002] Atomic magnetometers are important tools for measuring magnetic field strength. Atomic magnetometers usually use optical pumping technology to pump atoms with polarized light, so that a population difference is formed between the atomic magnetic sub-energy levels, and this atomic polarization state is used to detect the magnetic field. When measuring magnetic fields, traditional single-axis atomic magnetometers are limited by the number of atoms interacting with light, so it is difficult to further improve the measurement sensitivity. For some detection configurations that are sensitive to magnetic fields perpendicular to the optical axis, effective magnetic field strength information cannot be provided in the direction of optical axis propagation, and there is a measurement blind spot.

[0003] Therefore, an atomic magnetometer based on a planar transmission pump optical path is proposed to solve the above-mentioned problems. Summary of the invention

[0004] The present invention aims to provide an atomic magnetometer based on a planar transmission pump optical path to solve or improve at least one of the above-mentioned technical problems.

[0005] In view of this, a first aspect of the present invention is to provide an atomic magnetometer based on a planar transmission pump optical path.

[0006] The first aspect of the present invention provides an atomic magnetometer based on a planar transmission pump optical path, comprising: a light source capable of emitting a first light beam to an atomic gas chamber along a first propagation direction; a reflector group arranged on the atomic gas chamber; the reflector group having a first reflective surface and a second reflective surface corresponding to each other, the first reflective surface being used to block the first light beam along the first propagation direction to convert the first light beam into at least one second light beam and reflect it to the second reflective surface; the second light beam propagates within the atomic gas chamber along the second propagation direction; a photoelectric detection mechanism being arranged at one end of the atomic gas chamber away from the light source along the first propagation direction; the photoelectric detection mechanism receiving the second light beam reflected by the second reflective surface, and obtaining the magnetic field strength of the atomic gas chamber through the light intensity signals of all the second light beams.

[0007] In any of the above technical solutions, the reflector group includes a first reflector and a second reflector, and the first reflector, the second reflector and the atomic gas chamber are rotationally symmetric with the first propagation direction as the axis; the first reflector is arranged inside the atomic gas chamber, and the second reflector is arranged outside the atomic gas chamber to form a multi-stage bushing structure.

[0008] In any of the above technical solutions, the first reflector is formed with an outer conical surface around the first propagation direction as the axis, and the outer conical surface faces the light source along the first propagation direction; the first reflecting surface is located on the outer conical surface; and / or the second reflector is formed with an inner conical surface around the first propagation direction as the axis, and the outer conical surface faces away from the light source along the first propagation direction; the second reflecting surface is located on the inner conical surface.

[0009] In any of the above technical solutions, the inclination angles of the inner cone surface and the outer cone surface are both forty-five degrees, and the second propagation direction of all second light beams is perpendicular to the first propagation direction.

[0010] In any of the above technical solutions, the photoelectric detection mechanism includes a focusing lens for receiving the second light beam.

[0011] In any of the above technical solutions, the second reflector is annular, and a light opening is formed on the second reflector along the first propagation direction; the projection of the atomic gas chamber along the first propagation direction is located inside the light opening.

[0012] Compared with the prior art, the present invention has the following beneficial effects: It can achieve higher measurement accuracy and is suitable for high-precision magnetic field measurement. The atomic magnetometer based on the configuration of the present invention can simultaneously provide magnetic field intensity information in the first propagation direction and the second propagation direction, thereby realizing omnidirectional measurement of the magnetic field.

[0013] Additional aspects and advantages of embodiments according to the present invention will become apparent in the following description or may be learned through practice of embodiments according to the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which: Figure 1 It is a schematic diagram of the optical path of the present invention; Figure 2 This is a light beam processing flow chart of the present invention. DETAILED DESCRIPTION

[0015] In order to more clearly understand the above-mentioned purpose, features and advantages of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

[0016] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Therefore, the protection scope of the present invention is not limited to the specific embodiments disclosed below.

[0017] See also Figure 1-Figure 2 , an atomic magnetometer based on a planar transmission pump optical path according to some embodiments of the present invention is described below.

[0018] The embodiment of the first aspect of the present invention provides an atomic magnetometer based on a planar transmission pump optical path. In some embodiments of the present invention, Figure 1-Figure 2 As shown, the atomic magnetometer based on the planar transmission pump optical path includes: The light source can emit a first light beam toward the atomic gas cell along a first propagation direction.

[0019] A reflector group is arranged on the atomic gas chamber; the reflector group has a first reflective surface and a second reflective surface corresponding to each other, the first reflective surface is used to block the first light beam along the first propagation direction to convert the first light beam into at least one second light beam and reflect it to the second reflective surface; the second light beam propagates in the atomic gas chamber along the second propagation direction.

[0020] The photoelectric detection mechanism is arranged at one end of the atomic gas chamber away from the light source along the first propagation direction; the photoelectric detection mechanism receives the second light beam reflected by the second reflection surface, and obtains the magnetic field strength of the atomic gas chamber through the light intensity signals of all the second light beams.

[0021] The present invention provides an atomic magnetometer based on a planar transmission pump optical path. The main function of the light source is to generate a stable light beam with a specific wavelength, which resonates with a specific energy level transition of the target atom and is used to excite, cool or manipulate the atom. The light source can modulate multiple parameters of the light beam, such as frequency, phase, intensity and polarization state, to meet different experimental requirements and optimize the interaction with atoms. The light source can emit the light beam along a specific propagation direction (first propagation direction) to ensure that the light beam directly irradiates the atoms in the atomic gas chamber.

[0022] Laser light sources usually consist of devices such as laser diodes, solid-state lasers or gas lasers. These devices produce light with high coherence and a single wavelength by exciting media (such as crystals, gases or semiconductor materials). The direction, focus, splitting or filtering of the light beam are adjusted by optical elements (such as lenses, prisms, gratings and filters) to precisely control the characteristics and morphology of the light beam. When the light beam is irradiated into the atomic gas chamber, the photons interact with the electrons in the atoms, causing the electrons to transition from one energy level to another. This process usually requires resonance between the light frequency and the atomic transition energy level. By precisely controlling the frequency and intensity of the light beam, precise manipulation of the atomic state can be achieved, such as excitation of atoms through optical pumping technology or reduction of the motion heat energy of atoms through cooling technology. In quantum information processing, lasers are used to prepare, manipulate and measure quantum bits. In precision measurements (such as optical clocks or atomic magnetometers), lasers are used to achieve precise temporal and spatial control of atoms.

[0023] The main function of the first reflective surface is to receive and intercept the first light beam from the light source and convert it into at least one second light beam. This conversion involves changing the direction of the light beam to adapt to the needs of experimental design and spatial layout. The second reflective surface is responsible for receiving the second light beam converted by the first reflective surface and reflecting it along a predetermined second propagation direction to ensure that the light beam propagates correctly in the atomic gas chamber. Through such a configuration of the reflector group, complex optical path designs such as folding, beam splitting or focusing can be realized, enhancing the flexibility of the experiment and the efficiency of the interaction between atoms and light.

[0024] When the first light beam is emitted from the light source and reaches the first reflective surface, the design of this reflective surface enables it to intercept and / or change the propagation direction of the light beam as needed. This is usually achieved by using plane mirrors, concave mirrors, or convex mirrors at specific angles, depending on whether it is necessary to increase the beam path length or change the focusing characteristics of the beam. After the first reflective surface changes the direction of the beam, the second reflective surface receives and reflects the beam again. This can be a direct reflection, or it may involve more optical processing, such as further adjusting the beam through a lens group or other reflective surfaces. Throughout the reflection process, the quality and configuration of the reflectors must ensure that the coherence and intensity of the beam are not lost to ensure the accuracy and reliability of the experimental data. The propagation of the precisely controlled second light beam in the atomic gas cell provides the necessary optical input for the experiment. In atomic physics experiments, this precisely controlled light path is crucial to the realization of techniques such as optical pumping, optical trapping, or interferometry.

[0025] The photoelectric detection mechanism is arranged at one end of the atomic gas chamber, away from the light source along the first propagation direction, and its main task is to receive the second light beam reflected by the second reflection surface. The mechanism is capable of measuring the light intensity signals of all second light beams. These signals contain important information about the strength of the magnetic field in the atomic gas chamber, because the magnetic field affects the splitting of the atomic energy levels (Zeeman effect), thereby affecting the absorption and emission characteristics of the atoms to light. The detected light intensity signal is converted into an electrical signal, which is then analyzed by the data processing unit to calculate the specific strength and direction of the magnetic field.

[0026] In summary, by introducing advanced light source and reflector group configuration, the measurement accuracy is significantly improved and its application range is expanded. In particular, the device is able to measure magnetic fields in multiple propagation directions, achieving true omnidirectional magnetic field measurement capabilities, which is difficult to achieve in traditional single-axis magnetometers. This omnidirectional measurement function makes the magnetometer particularly suitable for scientific research and technological applications that require high-precision magnetic field data, such as geophysical exploration, precision navigation systems, and quantum computing. By optimizing the interaction between light and atoms, the present invention not only improves the sensitivity and accuracy of the measurement, but also significantly reduces the measurement blind spots commonly seen in traditional devices, opening up new possibilities for the development of magnetic field measurement technology.

[0027] In any of the above embodiments, the reflector group includes a first reflector and a second reflector, and the first reflector, the second reflector and the atomic gas chamber are rotationally symmetric with the first propagation direction as the axis.

[0028] The first reflector is arranged inside the atomic gas chamber, and the second reflector is arranged outside the atomic gas chamber to form a multi-stage bushing structure. The bushing structure formed by mutual nesting can reduce the length requirement of the atomic gas chamber along the first propagation direction, which helps to reduce the overall volume.

[0029] In this embodiment, the first reflector is responsible for receiving the light beam emitted from the light source and accurately reflecting it to the second reflector. Due to the rotational symmetry of the system, this ensures that the light beam can be correctly reflected to the second reflector regardless of the angle from which it is incident. The second reflector receives the light beam reflected from the first reflector and further reflects it into the atomic gas cell. The rotationally symmetric configuration allows the light beam to cover every part of the atomic gas cell uniformly, enhancing the efficiency of the interaction between light and atoms. The rotational symmetry of the system helps to maintain the stability of the optical path, reduce errors caused by improper equipment arrangement or external disturbances, and improve the repeatability and reliability of the experiment.

[0030] The light beam emitted by the light source is first captured and reflected by the first reflector. Due to the rotationally symmetric layout of the first reflector and the second reflector, the light beam can be accurately guided by the first reflector to the second reflector no matter how the light beam rotates or from which angle the system operates. The second reflector receives the light beam from the first reflector and reflects it to the atomic gas cell according to the preset optical path design. The rotationally symmetric design ensures that the light beam can be uniformly irradiated on the atoms in the atomic gas cell, which is crucial for achieving uniform optical pumping and magnetic field measurement. In the atomic gas cell, the light beam interacts with the atoms to produce the Zeeman effect, through which it is possible to detect how the magnetic sub-energy levels of the atoms are split due to the presence of an external magnetic field. The uniform illumination of the light beam ensures that all atoms in the gas cell can participate in this process equivalently.

[0031] By placing the first reflector inside the atomic gas chamber and the second reflector outside, this sleeve structure effectively reduces the length of the device in the first propagation direction, thereby reducing the overall volume. This compact design makes the device more suitable for use in space-constrained environments, such as in mobile measurement systems or miniaturized scientific instruments. This layout allows the light beam to be reflected multiple times inside the atomic gas chamber, increasing the chances of the light beam interacting with atoms, improving the efficiency of optical pumping and the sensitivity of the measurement. The multi-stage sleeve structure also increases the structural stability of the system, which helps reduce the impact of external environmental factors (such as temperature fluctuations and mechanical vibrations) on measurement accuracy.

[0032] The light beam emitted by the light source first enters the atomic gas chamber and is captured by the first internal reflector. The first reflector reflects the light beam to a specific direction, usually to the outside of the atomic gas chamber or to another reflective surface. The second reflector, located outside the atomic gas chamber, further reflects the light beam back into the atomic gas chamber or other required directions, realizing the recycling of the light beam and the optimization of the spatial path. Since the light beam is reflected multiple times in the atomic gas chamber, it increases the number of interactions with the atoms, which makes the optical pumping process more efficient. Each interaction between the light beam and the atom affects the energy level distribution of the atom, thereby detecting changes in the magnetic field based on the Zeeman effect. The design takes into account the reduction of the overall volume, and through the reasonable configuration of internal and external reflectors, the size of the device is minimized without sacrificing its function and efficiency. This compact design also facilitates the carrying and deployment of the device.

[0033] In any of the above embodiments, the first reflector is formed with an outer conical surface circumferentially with the first propagation direction as the axis, and the outer conical surface faces the light source along the first propagation direction; and the first reflecting surface is located on the outer conical surface.

[0034] The second reflector is formed with an inner conical surface in a circumferential direction with the first propagation direction as the axis, and the outer conical surface is facing away from the light source along the first propagation direction; the second reflective surface is located on the inner conical surface.

[0035] In this embodiment, the design of the outer cone surface allows the first reflector to not only reflect the light beam, but also focus the light beam. When the light beam is emitted from the light source and hits this conical reflective surface, the light beam will be focused and redirected in a specific direction, which is usually toward the inside of the atomic gas chamber or toward the second reflector. Because the light beam is focused, its optical density in the atomic gas chamber increases, which enhances the interaction between light and atoms, thereby improving the overall sensitivity and efficiency of the system. The use of an outer cone surface can more flexibly manipulate the path of the light beam in a limited space, especially when the atomic gas chamber is small or the equipment requires a compact layout.

[0036] When the light beam is emitted from the light source and travels along the first propagation direction, it first encounters the outer cone surface of the first reflector. Due to the conical design, this outer cone surface has the property of focusing the light beam toward a center line or focal point. This focusing action is precisely calculated through the geometry and angles of the reflectors to ensure that the light beam can be efficiently focused and directed to the correct position. Once the light beam is focused, its intensity increases at the focal point, so that the atoms passing through the focal area are more strongly illuminated by light. Such light illumination intensifies the interaction between light and atoms, such as excitation and pumping processes, thereby more effectively affecting the magnetic state of the atoms, which is crucial for the detection of magnetic fields. By precisely calculating the angles and shapes of the outer cone surface, it can be ensured that the light beam can be effectively reflected and focused regardless of the incident angle. This design provides a highly optimized optical path configuration, allowing the device to fit into compact space requirements while maintaining high performance.

[0037] The inner cone of the second reflector is designed to converge and redirect the light beam reflected by the first reflector. The inner cone makes the light beam converge inward when passing through the second reflector, thereby precisely controlling the path of the light beam propagation. By precisely controlling the focus of the light beam, the second reflector can maximize the use of light energy, reduce the energy loss of the light beam during transmission, and improve the overall optical efficiency. In conjunction with the first reflector, the inner cone design of the second reflector helps to irradiate the light beam more concentratedly onto the atoms in the atomic gas chamber, thereby enhancing the interaction between light and atoms and improving the measurement sensitivity and accuracy of the system.

[0038] The light beam is first reflected by the outer cone of the first reflector and slightly diffused or redirected before being captured by the inner cone of the second reflector. Due to the geometry of the inner cone, the light beam is guided to focus toward the center when passing through the second reflector, thereby forming a higher intensity light spot in the atomic gas chamber. After being focused by the inner cone of the second reflector, the intensity and focus of the light beam increase, making its optical path in the atomic gas chamber more concentrated. This concentrated light beam can interact with atoms more effectively, especially when performing optical pumping and measuring the Zeeman effect, and can detect magnetic field changes more accurately. The design of the inner cone not only optimizes the optical path, but also helps maintain the symmetry and balance of the system through its unique geometric structure. This symmetry helps to detect magnetic fields uniformly in multiple directions and enhances the system's adaptability to complex magnetic field environments.

[0039] In any of the above embodiments, the inclination angles of the inner cone surface and the outer cone surface are both forty-five degrees, and the second propagation directions of all second light beams are perpendicular to the first propagation direction.

[0040] In this embodiment, the 45-degree inclination angle enables the light beam to change direction precisely after reflecting from the first reflector. In physics and optics, mirror reflection at a 45-degree angle usually causes the incident light to be completely reversed, but in this configuration, due to the rotational symmetry and geometric layout of the system, the reflected light beam is directed perpendicular to the original propagation direction. By making the propagation directions of all second light beams perpendicular to the first propagation direction, the system is able to more comprehensively cover the atomic gas chamber, which is crucial for uniform excitation and detection of atoms in the gas chamber, especially when directional magnetic fields need to be measured. This design helps to improve the system's response sensitivity to magnetic fields and measurement accuracy, because the light beam can more evenly illuminate different areas of the atomic gas chamber, so that magnetic field information from all directions can be effectively detected.

[0041] When the light beam emitted from the light source first hits the outer cone surface of the first reflector, the light beam is reflected and changes direction because the outer cone surface is inclined at 45 degrees. At this time, the direction of the light beam is adjusted to be perpendicular to the original propagation direction. After being reflected by the first reflector, the light beam then hits the inner cone surface of the second reflector. Similarly, the inner cone surface is also inclined at a 45-degree angle, further ensuring that the light beam is accurately reflected and focused perpendicular to the first propagation direction. Since the second light beam is evenly distributed throughout the atomic gas chamber, the system can detect the magnetic field from multiple angles, which is not possible with traditional unidirectional magnetic field detection methods. This design is particularly suitable for complex or dynamically changing magnetic field environments, such as geophysical exploration or space physics research.

[0042] In any of the above embodiments, the photoelectric detection mechanism includes a focusing lens for receiving the second light beam.

[0043] In this embodiment, the main function of the focusing lens is to collect and focus the scattered second light beam onto the photodetector. Such a configuration ensures that light beams from different directions can be effectively collected and measured, improving the sensitivity and efficiency of detection. Through the action of the focusing lens, more light energy can be transferred to the sensitive area of ​​the photodetector, thereby increasing the intensity of the photoelectric signal and reducing the loss of the light signal during transmission. The fixed connection between the first reflector and the focusing lens ensures the stability and alignment accuracy of the entire optical path, reducing the impact of system vibration or external interference on the measurement results.

[0044] The second light beam may be scattered to a certain extent after being reflected by the second reflector. The task of the focusing lens is to refocus these scattered light beams into a smaller focus, thereby concentrating the light energy to the receiving area of ​​the photodetector. This is usually achieved by the curvature and material properties of the lens, so that the light beam is focused at the focal point behind the lens. When the focused light beam hits the photodetector, the material on the photodetector (such as photodiode, photomultiplier tube, etc.) will generate an electrical signal according to the photoelectric effect. The intensity of this signal is proportional to the intensity of the incident light. The generated electrical signal is amplified and processed to extract information about the intensity of the magnetic field in the atomic gas chamber. Signal processing usually includes steps such as amplification, filtering and analog-to-digital conversion, and the final output data is used to analyze and display the measurement results of the magnetic field. The fixed connection design of the first reflector and the focusing lens ensures the fixity and accuracy of the optical path, thereby ensuring the repeatability and reliability of the measurement. This design avoids optical path errors caused by lens movement or misalignment.

[0045] In any of the above embodiments, the second reflector is annular and has a light opening formed along the first propagation direction; the projection of the atomic gas chamber along the first propagation direction is located inside the light opening to reduce interference with the movable atomic gas chamber and ensure that the second light beam will not have a resonant light path in the first propagation direction.

[0046] In this embodiment, the design of the annular second reflector allows the atomic gas cell to be located inside the light port, and this configuration helps to avoid mechanical interference that may be caused to the movable atomic gas cell by other parts of the reflector. By setting the light port in the second reflector, it is ensured that the second light beam can pass through unimpeded and correctly illuminate the atomic gas cell, thereby ensuring the propagation efficiency and accuracy of the light beam and avoiding unnecessary beam loss or deviation. The design ensures that the second light beam will not have an additional resonant optical path in the first propagation direction, which means that the light beam passes directly through the atomic gas cell without reflecting back and forth between mirrors, reducing possible phase or resonance errors.

[0047] The annular structure of the second reflector and the light port in the middle allow the light beam to propagate freely into the atomic gas cell. This direct transmission method helps maintain the quality and consistency of the beam and avoids beam attenuation or scattering caused by multiple reflections. The structure around the annular reflector is carefully designed to focus or reflect the light beam, while the light port in the center is set to allow the beam to pass directly through. This design not only simplifies the optical path, but also improves the optical efficiency of the system. In the case where the atomic gas cell is movable, the design of the annular reflector and the light port ensures that the light beam can always be correctly irradiated onto it no matter how the atomic gas cell moves. This is crucial to achieve accurate dynamic measurements and reduce errors in experiments.

[0048] In any of the above embodiments, when Rb atoms are used as the working medium, the incident laser is output by the laser, and its frequency is the same as the transition frequency of the D1 line of the Rb atoms. The laser beam passes through a set of optical lenses to perform beam amplification, spot modulation and polarization state adjustment. After that, the light beam is incident on the atomic gas chamber, and after propagating along the incident direction for a path, it is irradiated on the conical reflector, and along the plane perpendicular to the incident direction, it is reflected to the annular reflector with a specific reflection angle outside the gas chamber, and after being collimated by the lens, it is converged onto a photodetector. The photodetector collects the light intensity signal within the photosensitive area, and transmits it to the data processing unit for amplification and analysis, calculates a set of magnetic field intensity data, and outputs the locking feedback signal required for the closed-loop control of the magnetometer.

[0049] In this embodiment, the laser frequency generated by the laser matches the D1 line transition frequency of the Rb atom, and is used to excite a specific energy level of the Rb atom, so that the atom reaches an excited state.

[0050] The optical lens group enlarges the beam diameter to increase the interaction area between the beam and the atoms, adjusts the size and shape of the spot to optimize the distribution of the beam in the atomic gas cell, ensures that the polarization state of the beam is suitable for exciting the atoms and matches the needs of the measurement system. The purpose of the atomic gas cell is to allow the light beam to propagate in the gas cell and interact with the Rb atoms. The atoms respond to the excitation of the light beam by absorbing and emitting photons. The conical reflector is used to change the propagation direction of the light beam and reflect it from the inside of the atomic gas cell to the annular reflector. The annular reflector has a specific reflection angle, which further changes the direction of the light beam to ensure that the light beam is correctly directed to the photodetector. The lens system can collimate and converge the light beam to ensure that the light beam is focused on the photosensitive surface of the photodetector to maximize the capture of the light signal. The photodetector detects the light intensity signal and converts the light signal into an electrical signal. The data processing unit amplifies and analyzes the electrical signal, calculates the magnetic field strength data, and generates a locking feedback signal to optimize the system performance.

[0051] The light beam emitted by the laser is adjusted by the optical lens group and then incident on the atomic gas chamber. The light beam interacts with the Rb atoms, causing the atomic energy level to transition and emit photons under specific conditions. The characteristics of these photons (such as intensity and polarization) carry information about the external magnetic field. After the light beam interacts with the atoms in the atomic gas chamber, it is directed to the photodetector through a specific layout of conical reflectors and toroidal reflectors. The lens system ensures that the light beam is precisely focused on the detector, maximizing the intensity of the photoelectric signal. The light signal captured by the photodetector is converted into an electrical signal, which is amplified and analyzed by the data processing unit. The unit calculates the strength of the magnetic field based on the changes in the electrical signal and adjusts the system settings (such as adjusting the laser output, beam polarization, etc.) as needed to maintain measurement accuracy and stability.

[0052] In the description of the present invention, it should be understood that the terms "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside" and "outside" etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0053] The above embodiments are only descriptions of the preferred modes of the present invention, and are not intended to limit the scope of the present invention. Without departing from the design spirit of the present invention, various modifications and improvements made to the technical solutions of the present invention by ordinary technicians in this field should all fall within the protection scope determined by the claims of the present invention.

Claims

1. An atomic magnetometer based on a planar transmission pump optical path, characterized in that: include: A light source capable of emitting a first light beam toward the atomic gas chamber along a first propagation direction; A reflector group is arranged on the atomic gas chamber; the reflector group has a first reflective surface and a second reflective surface corresponding to each other, the first reflective surface is used to block the first light beam along the first propagation direction, so as to convert the first light beam into at least one second light beam and reflect it to the second reflective surface; the second light beam propagates in the atomic gas chamber along the second propagation direction; A photoelectric detection mechanism is arranged at one end of the atomic gas chamber away from the light source along the first propagation direction; the photoelectric detection mechanism receives the second light beam reflected by the second reflection surface, and obtains the magnetic field strength of the atomic gas chamber through the light intensity signals of all the second light beams.

2. The atomic magnetometer according to claim 1, characterized in that: The reflector group includes a first reflector and a second reflector, and the first reflector, the second reflector and the atomic gas chamber are rotationally symmetrical with the first propagation direction as the axis; The first reflector is arranged inside the atomic gas chamber, and the second reflector is arranged outside the atomic gas chamber to form a multi-stage bushing structure.

3. The atomic magnetometer according to claim 2, characterized in that: The first reflector is formed with an outer conical surface around the first propagation direction, and the outer conical surface faces the light source along the first propagation direction; the first reflecting surface is located on the outer conical surface; and / or The second reflector is formed with an inner conical surface in a circumferential direction with the first propagation direction as the axis, and the outer conical surface faces away from the light source along the first propagation direction; the second reflective surface is located on the inner conical surface.

4. The atomic magnetometer according to claim 3, characterized in that: The inclination angles of the inner conical surface and the outer conical surface are both forty-five degrees, and the second propagation directions of all second light beams are perpendicular to the first propagation direction.

5. The atomic magnetometer according to claim 2, characterized in that: The photoelectric detection mechanism includes a focusing lens for receiving the second light beam.

6. The atomic magnetometer according to claim 2, characterized in that: The second reflector is annular and has a light opening formed on the second reflector along the first propagation direction; the projection of the atomic gas chamber along the first propagation direction is located inside the light opening.

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