Device and method for testing dose rate and electromagnetic pulse coordination effect of electronic device
By designing a double-layer test shielding unit with window, the pulse X-ray dose rate effect and electromagnetic pulse coordination effect test of electronic devices in a multi-factor environment is realized, which solves the test problems in the existing technology and improves the radiation of electronic devices. Reliability in the environment.
Patent Information
- Application Number
- CN202411454842.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-17
- Publication Date
- 2025-01-10
AI Technical Summary
The prior art is difficult to accurately test the convergence effect of the radiation effect of electronic devices in space multi-factor environments, which makes it difficult to improve the reliability of electronic devices in radiation environments.
A double-layer test shielding unit with window is designed to shield the test circuit board in two ways, so as to achieve the test of pulsed X-ray dose rate effect and electromagnetic pulse coordination effect, and to avoid interference from peripheral circuits by electromagnetic radiation.
Through the opening and closing of the movable window cover, the two test needs of dose rate effect and electromagnetic pulse convergence effect are met, and the test results errors are avoided. It provides a feasible method for pulse X-ray dose rate effect and electromagnetic pulse convergence effect of electronic devices, which improves the Test accuracy and operability.
Smart Images
Figure CN119291435A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of radiation effects of electronic devices, and in particular to a test device and a test method for the synergy effect of dose rate and electromagnetic pulse of electronic devices. Background Art
[0002] In recent years, a lot of work has been done on the ground simulation test of single-factor space radiation environmental effects. However, due to the combination of multiple environmental factors in the real space radiation environment, new synergy effects different from the ground single-factor simulation test are produced, resulting in the single-factor ground simulation test results not completely consistent with the data in the real environment. Therefore, it is necessary to study the multi-factor environmental synergy effect of electronic devices in space irradiation to guide the ground simulation test of radiation effects of sensitive materials and devices, and provide guidance for the analysis of radiation environment failures of electronic devices. At present, how to accurately evaluate the multi-factor environmental synergy effect in space has become one of the restrictive links for long-life electronic devices in the future. In the design, development and selection of semiconductor devices and materials, it is necessary to fully consider the impact of the synergy effect of multi-factor space environmental factors on their performance, and then strengthen the research on environmental synergy effect test methods, degradation mechanisms, prediction methods and protection measures in the process of ground simulation tests, so as to better improve the reliability of electronic devices in radiation environments.
[0003] The radiation effects of electronic devices in different space environments are complex. These environmental factors not only act on sensitive materials and devices individually, but may also induce secondary environments. For example, the effects of certain radiation environments on electronic devices may trigger the effects of other radiation environments on electronic devices; certain radiation environments may enhance the effects of other radiation environments; and certain radiation environments may weaken the effects of other radiation environments.
[0004] Electromagnetic radiation refers to the fluctuation phenomenon caused by changing electric and magnetic fields. X-rays are electromagnetic waves generated by rapidly changing electromagnetic fields. Therefore, when performing X-ray dose rate tests, there must be changing electric and magnetic fields in the irradiation chamber. If not shielded, electromagnetic radiation interference will inevitably occur to electronic components. At the same time, when ionizing radiation particles penetrate metal shells and cables, they will stimulate transient system electromagnetic pulses, which will be coupled to sensitive devices through transmission lines, antennas and other structures through radiation or conduction, causing transient interference or even damage. Due to the complex radiation effects of electronic devices in different space environments, the test of the dose rate of electronic devices and the synergistic effect of electromagnetic pulses is difficult and there is no mature test standard. Summary of the invention
[0005] 1. Technical issues to be resolved
[0006] In order to solve at least one of the above-mentioned technical problems arising in the test of the dose rate and electromagnetic pulse synergy effect of electronic devices in the prior art, an embodiment of the present invention provides an electronic device dose rate and electromagnetic pulse synergy effect test device and a test method. By designing a double-layer test shielding unit with a window, it is used to shield the test circuit board in two different ways, thereby realizing pulse X-ray dose rate effect irradiation and pulse X-ray dose rate and electromagnetic pulse synergy effect irradiation tests, and at the same time, it can prevent the peripheral circuit from receiving electromagnetic radiation and interfering with the test results.
[0007] (II) Technical solution
[0008] In view of the above technical problems, an embodiment of the present invention provides an electronic device dose rate and electromagnetic pulse synergy effect test device and test method.
[0009] According to the first aspect of the present invention, there is provided an electronic device dose rate and electromagnetic pulse synergy effect test device, characterized in that it includes: a pulse power irradiation device, an irradiation chamber, a test shielding unit, a shielding cabinet, a first test equipment, a second test equipment, a power supply, a first cable and a signal input device, wherein the pulse power irradiation device includes a pulse X-ray source; the pulse X-ray source is used to generate pulse X-rays, and the pulse X-rays enter the irradiation chamber to generate pulse X-rays and an electromagnetic pulse irradiation environment excited by the pulse X-rays in the irradiation chamber; the test shielding unit is located inside the irradiation chamber, and is used to place the electronic device to be tested, so that the electronic device to be tested is in a single pulse X-ray irradiation environment or a pulse X-ray irradiation and electromagnetic pulse irradiation environment; the first test equipment, the second test equipment, the power supply and the signal input device are located inside the shielding cabinet; and the test shielding unit is connected to the first test equipment, the second test equipment, the power supply and the signal input device through a first cable.
[0010] In some exemplary embodiments, the test shielding unit includes: a test circuit board, a dose sheet, a movable window cover, a peripheral circuit, a bracket, a second cable, a cable interface, a test circuit shielding box and a secondary shielding structure, wherein the cable interface is located on the test circuit shielding box; the test circuit board is fixed to the inside of the test circuit shielding box by the bracket; the dose sheet is used to test the X-ray irradiation dose; the peripheral circuit is mounted on the test circuit board and is used to power the electronic device to be tested and transmit data; the secondary shielding structure is located on the first surface of the test circuit board and forms a cavity between the test circuit shielding box and the test circuit shielding box, wherein the first surface is the surface away from the bracket; the first surface of the test circuit board that is not covered by the secondary shielding structure is used to place the electronic device to be tested; there is an opening in the relative position between the test circuit shielding box and the electronic device placement area to be tested; the movable window cover is used to cover the opening of the test circuit shielding box; and the second cable is used to connect the test circuit board and the cable interface.
[0011] In some exemplary embodiments, the first electrical cable comprises a shielded electrical cable.
[0012] In some exemplary embodiments, the movable window cover can be opened and closed, and the test environment of the electronic device to be tested can be controlled by controlling the opening and closing of the movable window cover.
[0013] In some exemplary embodiments, when the movable window cover is in a closed state, the electronic device to be tested is in a pulsed X-ray irradiation environment; and when the movable window cover is in an open state, the electronic device to be tested is in an environment of pulsed X-ray irradiation and electromagnetic pulse irradiation.
[0014] In some exemplary embodiments, the first test device is used to collect the instantaneous pulse signal generated by the pulse power irradiation device; the second test device is used to collect the output signal of the electronic device to be tested; and the second test device is triggered by the instantaneous pulse signal collected by the first test device.
[0015] In some exemplary embodiments, the test shielding unit is connected to the first test device, the second test device, the power supply and the signal input device through the first cable, including: the test shielding unit is connected to the cable interface on the irradiation chamber through the first cable; the cable interface on the irradiation chamber is connected to the cable interface on the shielding cabinet through the first cable; and the first test device, the second test device, the power supply and the signal input device are connected to the cable interface on the shielding cabinet through the first cable.
[0016] According to a second aspect of the present invention, a test method for the dose rate and electromagnetic pulse synergy effect test of electronic devices based on the above-mentioned device is provided, comprising: installing and debugging the test device; placing a first group of electronic devices to be tested into an electronic device placement area to be tested, and closing a movable window cover; opening a first test device, a second test device, a power supply, and a signal input device in a shielding cabinet; starting a pulse power irradiation device to generate pulsed X-rays to perform a single pulse X-ray dose rate effect test; closing the device, taking out the first group of electronic devices to be tested; placing a second group of electronic devices to be tested into an electronic device placement area to be tested, and keeping the movable window cover in an open state; opening the first test device, the second test device, the power supply, and the signal input device in the shielding cabinet; and starting the pulse power irradiation device to generate pulsed X-rays to perform a pulsed X-ray dose rate and electromagnetic pulse synergy effect test.
[0017] In some exemplary embodiments, installing and debugging the equipment includes: performing a power-on test on a test circuit board to ensure that the signal input and signal output of the electronic device to be tested are normal; fixing the test circuit board in a test circuit shielding box, and connecting the wires on the test circuit board to the cable interface inside the test circuit shielding box; placing a dose sheet at a preset position; and after the test device is installed, performing a power-on test on the test circuit board to ensure that the installation process has not affected the function of the test circuit board.
[0018] In some exemplary embodiments, the method further includes: transmitting the electrical parameters recorded by the first test device and the second test device during the irradiation process to a computer; and processing the collected data using the computer.
[0019] (III) Beneficial effects
[0020] It can be seen from the above technical solutions that the embodiment of the present invention provides an electronic device dose rate and electromagnetic pulse synergy effect test device and test method, which have at least the following beneficial effects:
[0021] (1) The test requirements of dose rate effect and dose rate and electromagnetic pulse synergy effect can be met by closing and opening the movable window cover, so as to avoid errors in the position of the test device in the irradiation chamber caused by repositioning the test device, which will cause errors in the test results.
[0022] (2) Anti-radiation devices should be used as peripheral circuit components to prevent the peripheral circuit from receiving electromagnetic radiation and causing interference to the test results.
[0023] (3) The test method of electronic device dose rate and electromagnetic pulse synergy effect is summarized, and feasible methods and technologies are provided for electronic device pulse X-ray dose rate effect irradiation, pulse X-ray dose rate and electromagnetic pulse synergy effect irradiation test. It can solve the problem that the electronic device dose rate and electromagnetic pulse synergy effect cannot be accurately measured, with a wide range of applications, simple methods and strong operability. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] The above contents and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:
[0025] Figure 1 A schematic diagram of the structure of a device for testing the synergistic effect of dose rate and electromagnetic pulse of an electronic device according to an embodiment of the present invention is shown;
[0026] Figure 2 A schematic diagram of the structure of a test shielding unit according to an embodiment of the present invention is shown;
[0027] Figure 3A schematic diagram of a flow chart of a test method for a dose rate and electromagnetic pulse synergy effect test of an electronic device according to an embodiment of the present invention is shown;
[0028] Figure 4 A schematic diagram of a process flow of an installation and debugging test device according to an embodiment of the present invention is shown;
[0029] Figure 5 A schematic diagram of a flow chart of another test method for the synergy effect of dose rate and electromagnetic pulse on electronic devices according to an embodiment of the present invention is shown;
[0030] Figure 6 A schematic diagram schematically shows the test results of a DCDC converter before irradiation according to an embodiment of the present invention; and
[0031] Figure 7 The figure schematically shows the test result of the DCDC converter after irradiation according to the embodiment of the present invention.
[0032] Reference numerals:
[0033] 1- pulse power irradiation device; 11- pulse X-ray source; 2- irradiation chamber; 3- test shielding unit; 31- test circuit shielding box; 32- test circuit board; 33- dose sheet; 34- secondary shielding structure; 35- movable window cover; 36- bracket; 37- peripheral circuit; 38- second cable; 39- cable interface; 4- first cable; 5- shielding cabinet; 6- first test equipment; 7- second test equipment; 8- power supply; 9- signal input device. DETAILED DESCRIPTION
[0034] In order to make the purpose, technical scheme and advantages of the present invention more clearly understood, the present invention is further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0035] Figure 1 The structure diagram of a device for testing the synergistic effect of dose rate and electromagnetic pulse of an electronic device according to an embodiment of the present invention is schematically shown.
[0036] like Figure 1As shown, an electronic device dose rate and electromagnetic pulse synergy effect test device according to an embodiment of the present invention comprises: a pulse power irradiation device 1, an irradiation chamber 2, a test shielding unit 3, a shielding cabinet 5, a first test device 6, a second test device 7, a power supply 8, a first cable 4 and a signal input device 9, wherein the pulse power irradiation device 1 comprises a pulse X-ray source 11; the pulse X-ray source 11 is used to generate pulse X-rays, and the pulse X-rays enter the irradiation chamber 2 to generate pulse X-rays and an electromagnetic pulse irradiation environment excited by the pulse X-rays in the irradiation chamber 2; the test shielding unit 3 is located inside the irradiation chamber 2, and is used to place the electronic device to be tested, so that the electronic device to be tested is in a single A pulse X-ray irradiation environment or a pulse X-ray irradiation and electromagnetic pulse irradiation environment; the first test equipment 6, the second test equipment 7, the power supply 8 and the signal input equipment 9 are located inside the shielding cabinet 5; and the test shielding unit 3 is connected to the first test equipment 6, the second test equipment 7, the power supply 8 and the signal input equipment 9 through the first cable 4. Specifically, the test shielding unit 3 is connected to the cable interface on the irradiation chamber 2 through the first cable 4; the cable interface on the irradiation chamber 2 is connected to the cable interface on the shielding cabinet 5 through the first cable 4; and the first test equipment 6, the second test equipment 7, the power supply 8 and the signal input equipment 9 are connected to the cable interface on the shielding cabinet 5 through the first cable 4.
[0037] Optionally, the first cable 4 includes a shielded cable. When a cable without electromagnetic shielding function is exposed to electromagnetic radiation, it will stimulate a transient system electromagnetic pulse. The electromagnetic pulse will be coupled to sensitive devices through structures such as transmission lines and antennas through radiation or conduction, causing transient interference or even damage.
[0038] In some embodiments, the first test device 6 is used to collect the instantaneous pulse signal generated by the pulse power irradiation device 1; the second test device 7 is used to collect the output signal of the electronic device to be tested; and the second test device 7 is triggered by the instantaneous pulse signal collected by the first test device 6. The second test device 7 is triggered by the pulse signal collected by the first test device 6 to avoid the failure to collect the test results or the generation of errors due to trigger delay.
[0039] Figure 2 A schematic structural diagram of a test shielding unit 3 according to an embodiment of the present invention is shown schematically.
[0040] like Figure 2As shown, a test shielding unit 3 according to an embodiment of the present invention includes: a test circuit board 32, a dose sheet 33, a movable window cover 35, a peripheral circuit 37, a bracket 36, a second cable 38, a cable interface 39, a test circuit shielding box 31 and a secondary shielding structure 34, wherein the cable interface 39 is located on the test circuit shielding box 31, and the test circuit shielding box 31 is used to shield the electromagnetic pulse irradiation outside the box; the test circuit board 32 is fixed inside the test circuit shielding box 31 through the bracket 36; the dose sheet 33 is used to test the X-ray irradiation dose; the peripheral circuit 37 is mounted on the test circuit board 32, and is used to power the electronic device to be tested and transmit The secondary shielding structure 34 is located on the first surface of the test circuit board 32, and a cavity is formed between the test circuit shielding box 31. The function of the secondary shielding structure 34 is to shield the electromagnetic pulse radiation outside the test circuit shielding box 31. The first surface is the surface away from the bracket 36. The first surface of the test circuit board 32 that is not covered by the secondary shielding structure 34 is used to place the electronic device to be tested. There is an opening at the relative position between the test circuit shielding box 31 and the electronic device placement area to be tested. The movable window cover 35 is used to cover the opening of the test circuit shielding box 31. And the second cable 38 is used to connect the test circuit board 32 and the cable interface 39. At the same time, in order to prevent the peripheral circuit 37 from being irradiated and interfering with the test results, the peripheral circuit 37 devices used in the test should be radiation-resistant devices.
[0041] In the embodiment of the present invention, the movable window cover 35 can be opened and closed, and the test environment of the electronic device to be tested can be controlled by controlling the opening and closing of the movable window cover 35. When the movable window cover 35 is in a closed state, the movable window cover 35 and the test circuit shielding box 31 form a closed electromagnetic shielding structure. When the pulse X-ray source 11 irradiates, the irradiation chamber 2 simultaneously has pulse X-rays and the electromagnetic pulse irradiation environment excited by them. At this time, the device under test has good electromagnetic shielding, and the output signal is only affected by the dose rate effect caused by the pulse X-ray irradiation. The electronic device to be tested is in the pulse X-ray irradiation environment; when the movable window cover 35 is in an open state, the movable window cover 35 and the test circuit shielding box 31 form a closed electromagnetic shielding structure. When the pulse X-ray source 11 irradiates, the irradiation chamber 2 simultaneously has pulse X-rays and the electromagnetic pulse irradiation environment excited by them. At this time, the device under test has good electromagnetic shielding, and the output signal is only affected by the dose rate effect caused by the pulse X-ray irradiation. The electronic device to be tested is in the environment of pulse X-ray irradiation and electromagnetic pulse irradiation.
[0042] The movable window cover 35 is closed and opened to meet the test requirements of dose rate effect and dose rate and electromagnetic pulse synergy effect, avoiding the position error of the test device in the irradiation chamber 2 caused by relocation, which causes error in the test result.
[0043] Figure 3 The flowchart of a test method for the synergy effect of dose rate and electromagnetic pulse on electronic devices according to an embodiment of the present invention is schematically shown.
[0044] like Figure 3 As shown, the test method for testing the synergy effect of the dose rate and electromagnetic pulse of the electronic device according to the embodiment of the present invention uses Figure 1 The device is tested, specifically including steps S110-S180.
[0045] In step S110 , the test device is installed and debugged.
[0046] In some exemplary embodiments, step S110 includes steps S111-S114, see Figure 4 .
[0047] In step S111 , a power-on test is performed on the test circuit board 32 to ensure that the signal input and signal output of the electronic device to be tested are normal.
[0048] In step S112 , the test circuit board 32 is fixed in the test circuit shielding box 31 , and the connection lines on the test circuit board 32 are connected to the cable interface 39 inside the test circuit shielding box 31 .
[0049] In step S113, the dosage sheet 33 is placed at a preset position.
[0050] In step S114 , after the test device is installed, a power-on test is performed on the test circuit board 32 to ensure that the installation process does not affect the function of the test circuit board 32 .
[0051] In step S120 , a first group of electronic devices to be tested is placed in the electronic device placement area to be tested, and the movable window cover 35 is closed.
[0052] In step S130 , the first test device 6 , the second test device 7 , the power supply 8 and the signal input device 9 in the shielding cabinet 5 are turned on.
[0053] In step S140, the pulse power irradiation device 1 is started to generate pulse X-rays to perform a single pulse X-ray dose rate effect test.
[0054] In step S150, the device is turned off and the first group of electronic devices to be tested are taken out.
[0055] In step S160, a second group of electronic devices to be tested is placed in the electronic device placement area to be tested, and the movable window cover 35 is kept in an open state.
[0056] In step S170 , the first test device 6 , the second test device 7 , the power supply 8 and the signal input device 9 in the shielding cabinet 5 are turned on.
[0057] In step S180, the pulse power irradiation device 1 is started to generate pulse X-rays to perform a pulse X-ray dose rate and electromagnetic pulse synergy effect test.
[0058] Figure 5 The flowchart of another test method for the dose rate and electromagnetic pulse synergy effect test of an electronic device according to an embodiment of the present invention is schematically shown.
[0059] like Figure 5 As shown, another electronic device dose rate and electromagnetic pulse synergy effect test method according to an embodiment of the present invention is Figure 3 The method shown in the figure also includes steps S190 and S1100
[0060] In step S190, the electrical parameters recorded by the first test device 6 and the second test device 7 during the irradiation process are transmitted to the computer.
[0061] In step S1100, the collected data is processed by a computer.
[0062] For example, the method of the embodiment of the present invention is introduced by taking the dose rate and electromagnetic pulse synergy effect test of the DCDC converter as an example.
[0063] A. Test preparation stage: Prepare the test circuit board 32, the dosing sheet 33, and the DCDC converter, and check the first test equipment 6, the second test equipment 7, the power supply 8, the signal input equipment 9, the cables, etc.
[0064] B. Circuit board function test: Power on the test circuit board 32 to test the signal input and signal output of the DCDC converter. Ensure that the DCDC converter can work normally before irradiation.
[0065] C. Install the test circuit board 32. Figure 2 The six dose tablets 33 are fixed in the test circuit shielding box 31. Figure 2 Place it in a suitable position. Connect the 12V power supply and DCDC converter output interface required on the test circuit board 32 to the cable interface 39 inside the test circuit shielding box 31. After installation, seal the test circuit shielding box 31 and provide additional protection for any gaps that may exist.
[0066] D. Connect the power supply 8 and the signal cable. Connect the cable interface 39 on the outside of the test circuit shielding box 31 to the interface on the outside of the shielding cabinet 5 through a shielded cable. Use a shielded cable to prevent the signal from being interfered by electromagnetic radiation during transmission in the cable, which may affect the test results or even damage the test circuit board 32, the first test device 6 and the second test device 7. Connect the cable interface inside the shielding cabinet 5 to the corresponding first test device 6, the second test device 7, the power supply 8 and the signal input device 9.
[0067] E. Power on and debug before testing. After the test circuit board 32, power supply 8, and signal cable are connected, add 12V voltage to the test circuit board 32 and perform the last test before irradiation to ensure that the installation process does not affect the function of the test circuit board 32. Test results are as follows: Figure 6 shown.
[0068] F. Irradiation. Group A conducts a single pulse X-ray dose rate effect test. Before the test, the movable window cover 35 is closed. The movable window cover 35 and the test circuit shielding box 31 form a closed electromagnetic shielding structure. When the pulse X-ray source 11 irradiates, the pulse X-ray and the electromagnetic pulse irradiation environment excited by it exist in the irradiation chamber 2 at the same time. At this time, the DCDC converter has good electromagnetic shielding, and the output signal is only affected by the dose rate effect caused by the pulse X-ray irradiation. Group B conducts a pulse X-ray dose rate and electromagnetic pulse synergy effect test. Before the test, the movable window cover 35 is opened. The secondary shielding structure 34 and the test circuit shielding box 31 form a closed electromagnetic shielding structure. When the pulse X-ray source 11 irradiates, the pulse X-ray and the electromagnetic pulse irradiation environment excited by it exist in the irradiation chamber 2 at the same time. At this time, the DCDC converter is not electromagnetically shielded, and the output signal is affected by the dose rate and electromagnetic pulse synergy effect. The first test device 6, the second test device 7, the power supply 8, and the signal input device 9 in the shielding cabinet 5 are turned on. The 10MA pulse power irradiation device 1 is triggered to perform pulse X-ray irradiation, and the first test device 6 and the second test device 7 are triggered to record electrical parameters.
[0069] G. Collect and save data. The first test device 6 and the second test device 7 transmit the electrical parameters recorded during the irradiation process to the computer, which processes the collected data and saves it. The test results are as follows: Figure 7 shown.
[0070] The above specific embodiments further illustrate the purpose, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above are only specific embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.
Claims
1. An electronic device dose rate and electromagnetic pulse synergy effect test device, characterized in that: include: A pulse power irradiation device, an irradiation chamber, a test shielding unit, a shielding cabinet, a first test device, a second test device, a power supply, a first cable, and a signal input device, Wherein, the pulse power irradiation device comprises a pulse X-ray source; The pulse X-ray source is used to generate pulse X-rays, and the pulse X-rays enter the irradiation chamber to generate pulse X-rays and an electromagnetic pulse irradiation environment excited by the pulse X-rays in the irradiation chamber; The test shielding unit is located inside the irradiation chamber and is used to place the electronic device to be tested so that the electronic device to be tested is in a single pulse X-ray irradiation environment or a pulse X-ray irradiation and electromagnetic pulse irradiation environment; The first test device, the second test device, the power supply and the signal input device are located inside the shielding cabinet; and The test shielding unit is connected to the first test device, the second test device, the power supply, and the signal input device through the first cable.
2. The device according to claim 1, characterized in that The test shielding unit includes: a test circuit board, a dosage sheet, a movable window cover, a peripheral circuit, a bracket, a second cable, a cable interface, a test circuit shielding box and a secondary shielding structure. Wherein, the cable interface is located on the test line shielding box; The test circuit board is fixed inside the test circuit shielding box through the bracket; The dose sheet is used to test the X-ray irradiation dose; The peripheral circuit is mounted on the test circuit board and is used to supply power to the electronic device to be tested and transmit data; The secondary shielding structure is located on the first surface of the test circuit board and forms a cavity with the test circuit shielding box, wherein the first surface is the surface away from the bracket; The portion of the first surface of the test circuit board not covered by the secondary shielding structure is used for placing the electronic device to be tested; There is an opening in the test circuit shielding box relative to the placement area of the electronic device to be tested; The movable window cover is used to cover the opening of the test line shielding box; and The second cable is used to connect the test circuit board and the cable interface.
3. The device according to claim 1 or 2, characterized in that: The first cable comprises a shielded cable.
4. The device according to claim 2, characterized in that The movable window cover can be opened and closed, and the test environment of the electronic device to be tested can be controlled by controlling the opening and closing of the movable window cover.
5. The device according to claim 4, characterized in that When the movable window cover is in a closed state, the electronic device to be tested is in a pulsed X-ray irradiation environment; and When the movable window cover is in the open state, the electronic device to be tested is in an environment of pulse X-ray irradiation and electromagnetic pulse irradiation.
6. The device according to claim 1, characterized in that The first testing device is used to collect the instantaneous pulse signal generated by the pulse power irradiation device; The second testing device is used to collect output signals of the electronic device to be tested; and The second testing device is triggered by the instantaneous pulse signal collected by the first testing device.
7. The device according to claim 1, characterized in that The test shielding unit is connected with the first test device, the second test device, the power supply and the signal input device through the first cable, including: The test shielding unit is connected to the cable interface on the irradiation chamber via a first cable; The cable interface on the irradiation chamber is connected to the cable interface on the shielding cabinet through a first cable; and The first test device, the second test device, the power supply and the signal input device are connected to the cable interface on the shielding cabinet through a first cable.
8. A test method for the dose rate and electromagnetic pulse synergy effect test of electronic devices based on the device according to any one of claims 1 to 7, characterized in that: include: Install and debug test equipment; Place the first group of electronic devices to be tested into the electronic device placement area to be tested, and close the movable window cover; Turn on the first test device, the second test device, the power supply, and the signal input device in the shielding cabinet; Start the pulse power irradiation device to generate pulse X-rays to conduct a single pulse X-ray dose rate effect test; closing the device and taking out a first group of electronic devices to be tested; Placing the second group of electronic devices to be tested into the electronic device placement area to be tested, and keeping the movable window cover in an open state; Turn on the first test device, the second test device, the power supply, and the signal input device in the shielding cabinet; as well as The pulse power irradiation device is started to generate pulse X-rays to conduct a pulse X-ray dose rate and electromagnetic pulse synergy effect test.
9. The method according to claim 8, characterized in that The installation and debugging equipment includes: Perform power-on test on the test circuit board to ensure that the signal input and signal output of the electronic device to be tested are normal; Fixing the test circuit board in the test circuit shielding box, and connecting the connection line on the test circuit board to the cable interface inside the test circuit shielding box; placing a dosage tablet at a predetermined location; and After the test device is installed, the test circuit board is powered on to test to ensure that the installation process has no impact on the function of the test circuit board.
10. The method according to claim 8, characterized in that Also includes: transmitting the electrical parameters recorded by the first test device and the second test device during the irradiation process to a computer; as well as Use computers to process the collected data.