Sensor module aging calibration system and aging calibration method using same

Abstract

The invention relates to the technical field of sensor detection, in particular to a sensor module aging calibration system and an aging calibration method using the same, and realizes automatic control of an aging calibration process of a sensor module through cooperative work of a host system, a slave jig and a test jig carrier plate. Specifically, the host system can automatically adjust and control the aging time according to the ex-factory time or other related parameters of the sensor, so as to ensure that each sensor module can obtain enough aging time. And meanwhile, the host system can also control the test fixture carrier plate to perform calibration test on the plurality of sensor modules and feed back test results, so that the calibration accuracy and efficiency are improved.

Description

Technical Field

[0001] The present application relates to the field of sensor detection technology, and in particular to a sensor module aging calibration system and an aging calibration method using the same. Background Art

[0002] Because sensors may have potential defects and failures due to transportation, storage, and process issues when they leave the factory for customers, and may not perform at their best quality, the gas detector production process first requires the product to be aged before it is calibrated to stabilize its performance before the product can be calibrated.

[0003] Since the aging time of the sensor is directly related to the factory date of the sensor, the aging time needs to be adjusted according to the factory date of the sensor. However, the traditional aging method is to control the aging time manually, resulting in some sensors not getting enough aging time, which affects the calibration stability of the product, resulting in poor product consistency, and problems such as large errors in the detected concentration values. Summary of the invention

[0004] In order to overcome the deficiencies of the prior art, the present invention provides a sensor module aging calibration system and an aging calibration method using the same, which automatically executes aging calibration tests and improves the aging calibration accuracy of the sensor module.

[0005] A first aspect of the present application provides a sensor module aging calibration system, the system comprising: A sensor module, a slave fixture and a host system, wherein the slave fixture includes a plurality of test fixture carriers, the sensor module is communicatively connected to the test fixture carriers, and the slave fixture is communicatively connected to the host system; The test fixture carrier is used to load the plurality of sensor modules, and when receiving the aging calibration instruction sent by the host system, performs an aging calibration test on the plurality of sensor modules; The host system is used to control the test fixture carrier to perform aging calibration tests on the multiple sensor modules, and control the test fixture carrier to feed back aging calibration test results of the sensor modules.

[0006] In an optional embodiment, the sensor module includes a sensor to be calibrated by aging and a PCB board, the sensor to be calibrated by aging is connected to the PCB board, and the PCB board is provided with a storage chip and a sensor detection circuit; The storage chip is used to store the PCB board information of the PCB board and the sensor information of the sensor to be aging calibrated; The sensor detection circuit is used to detect whether the sensor to be aging and calibrated is successfully connected to the PCB board.

[0007] In an optional embodiment, the aging calibration test includes an aging test, and the host system is further used to: Obtaining an output voltage value of the sensor module; Comparing the output voltage value with a preset voltage threshold range; When it is determined that the output voltage value is not within the preset voltage threshold range, the test fixture carrier is controlled to stop performing the aging test on the sensor module.

[0008] In an optional embodiment, the system further includes: A visual robot, used for identifying the identity serial numbers of the plurality of sensor modules, and loading the plurality of sensor modules onto the test fixture carrier based on the identity serial numbers; The host system is further used to obtain the identity serial number, determine the production data of the sensor module based on the identity serial number, and generate an aging instruction of the aging calibration instruction based on the aging state and the production state.

[0009] In an optional implementation, the sensor module is connected to the test fixture carrier board via a serial peripheral device interface, and the test fixture carrier board is connected to the host system via an RS485 bus.

[0010] A second aspect of the present application provides a sensor module aging calibration method, the method comprising: Obtaining an identity serial number of the sensor module, and determining production data of the sensor module based on the identity serial number; Controlling a test fixture carrier board to perform an aging test on the sensor module based on the production data; When it is determined that the aging test is completed, the sensor module is controlled to perform a calibration test based on a calibration concentration value.

[0011] In an optional embodiment, the sensor module and the test fixture carrier after the aging test are completed are placed in a calibration sealed box, and the controlling the sensor module to perform a calibration test based on a calibration concentration value includes: Acquiring temperature and humidity data of multiple temperature and humidity sensors in the calibration sealed box; Calculate the mean temperature and humidity of the temperature and humidity data; When it is determined that the mean temperature and humidity are stable, controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box; Obtaining a first concentration value of the calibration sealed box; When it is determined that the first concentration value satisfies the calibration concentration value, the operation of controlling the sensor module to perform a calibration test based on the calibration concentration value is executed.

[0012] In an optional embodiment, the method further comprises: Determine the maximum gas injection time; When it is detected that the maximum gas injection time is met at the current moment, determining whether the second concentration value of the calibration sealed box is within the concentration value error range; When it is determined that the second concentration value is within the concentration value error range, continuing to perform the operation of controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box until the second concentration value meets the calibration concentration value; When it is determined that the second concentration value is not within the concentration value error range, and the concentration difference is less than the concentration threshold corresponding to the concentration value error range, it is determined that there is a risk of gas leakage in the calibration sealed box, and the operation of controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box is stopped.

[0013] In an optional embodiment, controlling the test fixture carrier board to perform an aging test on the sensor module based on the production data includes: Obtaining the factory time of the sensor to be aging-calibrated in the sensor module from the production data; Adjusting the aging time of the sensor to be calibrated based on the factory time; When it is detected that the current moment satisfies the aging time, the output voltage value of the sensor module is obtained; Comparing the output voltage value with a preset voltage threshold range; When it is determined that the output voltage value is not within the preset voltage threshold range, the test fixture carrier is controlled to stop performing the aging test on the sensor module.

[0014] In an optional embodiment, before controlling the test fixture carrier to perform an aging test on the sensor module based on the production data, the method further includes: Obtaining the zero-point value voltage of the sensor module when it is at the zero-point value; When it is determined that the zero-point value voltage is normal, sending a communication connection instruction to the sensor module to determine whether the sensor module communicates normally; When it is determined that the sensor module is communicating normally, determining whether there is a welding pin header on the sensor module; When it is determined that the sensor module has a welding pin header, determining whether the welding pin header is normal; When it is determined that the welding pin header is normal, the operation of controlling the test fixture carrier board to perform an aging test on the sensor module based on the production data is executed.

[0015] In summary, the sensor module aging calibration system and the aging calibration method using the same provided by the present application realize the automated control of the aging calibration process of the sensor module through the collaborative work of the host system, the slave fixture and the test fixture carrier. Specifically, the host system can automatically adjust and control the aging time according to the factory time or other relevant parameters of the sensor to ensure that each sensor module can get enough aging time. At the same time, the host system can also control the test fixture carrier to perform calibration tests on multiple sensor modules and feedback the test results, thereby improving the accuracy and efficiency of the calibration. The beneficial effects of the present invention include at least one of the following: 1. By automatically controlling the aging time, each sensor module can be ensured to get enough aging time, thereby improving the stability of its performance. At the same time, through the control of the test fixture carrier by the host system, multiple sensor modules can be calibrated simultaneously, further improving the accuracy of calibration.

[0016] 2. The automated control system can significantly reduce manual intervention and improve production efficiency. At the same time, since the system can automatically feedback test results, production personnel can find and handle problems in a timely manner, further improving production efficiency.

[0017] 3. By precisely controlling the aging time and calibration process, the performance of each sensor module can be made more consistent, thereby improving the overall consistency and reliability of the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a structural schematic diagram of a sensor module aging calibration system shown in an embodiment of the present application; Figure 2 is a structural schematic diagram of a sensor module shown in an embodiment of the present application; Figure 3 It is a connection diagram of a sensor module aging calibration system shown in an embodiment of the present application; Figure 4 is a structural schematic diagram of a test fixture carrier shown in an embodiment of the present application; Figure 5 This is a schematic diagram of the placement of a sensor module in a test fixture carrier shown in an embodiment of the present application; Figure 6 It is a schematic diagram of a sensor module packaging process flow shown in an embodiment of the present application; Figure 7 It is a flow chart of a sensor module aging calibration method shown in an embodiment of the present application; Figure 8 is a flow chart of a sensor module calibration method shown in an embodiment of the present application; Fig. 9 It is a schematic diagram of a process of standard gas injection during a sensor module calibration process shown in an embodiment of the present application; Fig.10 It is another flow chart of a sensor module calibration method shown in an embodiment of the present application. DETAILED DESCRIPTION

[0019] The present invention is further described below in conjunction with the accompanying drawings and embodiments.

[0020] The following will clearly and completely describe the concept, specific structure and technical effects of the present invention in combination with the embodiments and drawings, so as to fully understand the purpose, characteristics and effects of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, other embodiments obtained by technicians in this field without creative work are all within the scope of protection of the present invention. In addition, all the connection / connection relationships involved in the patent do not refer to the direct connection of components, but refer to the formation of a better connection structure by adding or reducing connection accessories according to the specific implementation situation. The various technical features in the invention can be combined interchangeably without conflicting with each other.

[0021] Reference Figure 1 As shown, a structural schematic diagram of a sensor module aging calibration system shown in an embodiment of the present application.

[0022] The sensor module aging calibration system 1 includes a slave fixture 10 and a host system 20. The slave fixture 10, as a slave system, establishes a communication connection with the host system 20 through an RS485 bus. The slave fixture 10 includes a plurality of test fixture carriers 30. Figure 3 shown.

[0023] The sensor module aging calibration system 1 also includes a sensor module 40. The sensor module 40 establishes a communication connection with the test fixture carrier board 30 via a serial peripheral interface (SPI). The slave fixture 10 is used to distribute the aging calibration instruction to each test fixture carrier board 30 when receiving the aging calibration instruction issued by the host system 20, so that the sensor module 40 connected to the test fixture carrier board 30 performs the aging calibration operation.

[0024] In some embodiments, the test fixture carrier 30 is also used to provide a stable power supply for the sensor module 40, wherein the test fixture carrier 30 is connected to a power supply, and the power supply is supplied by the mains. The power supply of the host system 20 is supplied by the mains.

[0025] Refer to Figure 2 , the sensor module 40 includes a sensor to be aged and calibrated and a PCB board, and the PCB board includes a storage chip and a sensor detection circuit. In an embodiment of the present application, the sensor to be aged and calibrated is used in a modular manner. First, the sensor to be aged and calibrated is welded or plugged on the PCB board, and the PCB board is provided with a storage chip and a peripheral circuit of the sensor (that is, a sensor detection circuit), so the size of the PCB board can be designed to be 10mm×20mm or smaller, so as to facilitate mass production and application. Since the sensor to be aged and calibrated is an analog device and cannot store digital information, a storage chip, such as EEROM, FLASH, etc., is provided on the PCB board to store the PCB board information of the PCB board and the sensor information of the sensor to be aged and calibrated.

[0026] It should be noted that since all circuits have a certain error range, for example, when a semiconductor sensor needs to obtain a valid analog output, the corresponding circuit needs to be connected to a suitable load resistor; for example, when a catalytic sensor needs to obtain a valid analog output, the corresponding circuit needs an operational amplifier for amplification. Therefore, there are various errors between components. Therefore, this application attaches the sensor detection circuit to the PCB board so that when the sensor is calibrated later, this part of the error can be used as part of the sensor's performance and calibrated in, so that a suitable and stable value can be obtained.

[0027] In addition, during the production process of the PCB board, the PCB board factory can screen print a unique QR code or bar code on the PCB board, and the QR code or bar code stores the PCB information of the PCB board. In some embodiments, the sensor module aging calibration system 1 can also include a visual robot for entering the PCB information in the QR code or bar code into a storage chip, which is equivalent to assigning an identity serial number (called the first identity serial number) to each PCB board. When the sensor to be aging calibrated is welded or plugged into the PCB board, a sensor module 40 is obtained. Then, the sensor module 40 is functionally tested using the test fixture carrier 30, such as current, voltage, and memory chip read and write tests. At the same time, a visual robot is used to read the QR code or barcode during the functional test and send it to the host system 20. The host system 20 sends the sensor information (for example, sensor factory time, required aging time, sensor type, etc.) to the slave fixture 10, so that the slave fixture 10 writes the sensor information one by one into the corresponding memory chip of the sensor module 40. The sensor information may include the identity serial number (called the second identity serial number), factory time, factory address, etc. of the sensor to be aged and calibrated, so that in the subsequent aging calibration process, the second identity serial number in the memory chip can be read to distinguish which sensor is undergoing the aging calibration test.

[0028] The sensor module aging calibration system 1 also includes a cloud system. When the first identity serial number and the second identity serial number are read from the storage chip and entered into the cloud system, the user can query the calibration, aging, production time and other important information of the sensor based on the second identity serial number through the cloud system.

[0029] In some embodiments, after the sensor module is produced, the sensor module 40 can be automatically and orderly placed on the test fixture carrier 30 based on the first identity serial number by a visual robot, referring to Figure 4 and Figure 5As shown. The test fixture carrier board 30 includes a plurality of acupuncture points of the sensor module 40 for welding or plugging, a main control MCU, a power supply circuit and an indicator light. The power supply circuit is used to provide power supply for the sensor module 40, the main control MCU is used to control the polling aging calibration test of the sensor modules in the plurality of sensor module acupuncture points, and the indicator light is used to alarm when there is an abnormality during the aging calibration test. For example, the test fixture carrier board 30 automatically detects whether the function of the sensor module 40 is normal. Specifically, by detecting whether the voltage value of the 0 point value (in the air) of the sensor is normal, and whether the storage chip communicates normally. If there is a pin header welded in the sensor module, it is necessary to test whether the welded pin header is normal to eliminate the abnormal sensor module. Whenever there is an abnormality in the function of the sensor module 40, the indicator light is used to alarm.

[0030] Refer to Figure 6 In an optional implementation, after obtaining the sensor to be calibrated for aging, the sensor to be calibrated for aging can be welded to the PCBA carrier (i.e., PCB board) through surface mount (Surface Mount Technology, STM), and the sensor to be calibrated for aging can be packaged as an independent individual to form a small PCB carrier to obtain a sensor module, and an identity information is given to the sensor module, which is silk-screened on the PCBA carrier in the form of a QR code or a bar code, and the QR code information is scanned and identified by a visual robot and written into the storage chip, and the 0-point value voltage of the sensor module is input, and further aging test and calibration test are performed. At the same time, the STM patch and the PCBA carrier are also welded as the product main board (i.e., the test fixture carrier) for welding and plugging the sensor module. When necessary, the tested sensor module is welded or plugged into the product main board to complete the assembly. The assembled PCBA is functionally tested to ensure that it meets the design requirements. The qualified PCBA is installed in the housing, and the necessary packaging and protection are performed before it is shipped to the relevant users.

[0031] Through the above optional implementation, the sensor modules are made into independent PCB small carriers, so that the sensor modules are separated from the product main board. In this way, in the aging and calibration of products, production operation space can be saved, and production capacity, efficiency and consistency can be improved. At the same time, since the sensor modules can be stored separately and assembled on demand, the problems of on-demand production, limited production capacity, tight delivery time and inventory backlog caused by the inability to store in batches are solved.

[0032] When it is determined that the sensor module is loaded onto the test fixture carrier 30, the serial number of the sensor module (integrating the first identity serial number and the second identity serial number) can be identified by the visual robot, and the serial number is written into the storage chip of the sensor module, and the valid information is uploaded to the cloud system. In the later production, it is only necessary to read the serial number of the sensor module stored in the storage chip, without the need to identify the QR code or barcode on the sensor module for the second time. For the QR code or barcode information of the sensor module that cannot be identified by the visual robot, a barcode scanner can be used for further identification.

[0033] In some embodiments, the system 1 further includes a calibration sealed box for placing the sensor module 40 and the slave fixture 10 after the aging test is completed, and performing a calibration test on the sensor module 40 in the calibration sealed box. After the aging calibration test is completed, the host system can obtain the aging calibration test result of the sensor module, write the aging calibration test result into the storage chip, and upload it to the MES system at the same time.

[0034] Compared with the prior art where the sensor is directly welded on the PCBA board, when the sensor needs to be aged and stabilized during the production process, the aging position occupied by the PCBA is too wasteful due to the large size of the PCBA. In the aging environment with limited space, large-scale aging cannot be achieved, resulting in too low production capacity. In addition, the existing sensors are directly welded on the PCBA board, so it is necessary to replace gas sensors of other brands or other types. Due to the packaging of the sensor, the electrical properties of the pins, etc., all hardware parts need to be redeveloped, which wastes manpower and material resources, and also causes the types of PCBA boards to be too complicated, too much inventory accumulation, and inability to produce and prepare inventory in advance. In addition, since the sensor is directly welded on the PCBA board, due to improper daily use of the sensor, such as being affected by organic gas, hairspray, alcohol, etc., the sensor performance has a large deviation, and the user cannot calibrate or replace it by himself, resulting in a large deviation in product performance, which cannot be used safely and effectively, and the product may be scrapped and repurchased. Since the sensor cannot be traced after the PCBA board is produced, such as the factory time, production time, aging time, calibration time, etc., once there is a problem with the PCBA board, it is difficult to further analyze it. This application adopts a modular setting, which can significantly save production operation space and improve production capacity and efficiency. At the same time, since the sensor modules can be mass-produced and stored in the warehouse, it can flexibly respond to large orders or urgent product needs. In the early stage of PCB board design, you only need to reserve the installation position of the sensor to be aging and calibrated (such as the terminal plug-in or welding position), and you can easily integrate the sensor into the product.

[0035] It should be noted that the sensor to be aged and calibrated in the embodiment of the present application refers to a gas sensor, which may include, but is not limited to: a methane gas sensor, a propane gas sensor, a hydrogen gas sensor, etc. Since the current gas sensors are usually analog devices, the output is an analog signal. Taking a semiconductor sensor as an example, the semiconductor sensor is equivalent to two gas-sensitive resistors dividing the voltage. When there is gas, it will affect the resistance of the gas-sensitive resistor, thereby affecting the output voltage. However, in actual applications, in addition to the gas influencing factor, there are many other influencing factors, such as temperature and humidity, vibration, sensor contamination, etc.

[0036] Reference Figure 7 As shown, a sensor module aging calibration method is shown in an embodiment of the present application, and the sensor module aging calibration method includes the following steps.

[0037] S71, obtaining an identity serial number of a sensor module, and determining production data of the sensor module based on the identity serial number.

[0038] Among them, the identity serial number is unique and corresponds to the identity information of the sensor module. The host system can read the corresponding identity serial number based on the storage chip in the sensor module. At the same time, the host system can also obtain the production data corresponding to the identity serial number of the sensor to be aged and calibrated from the MES system, wherein the production data refers to the batch of the current production of the sensor to be aged and calibrated, which is bound to the MES system and may include, but is not limited to: the factory time of the sensor, the aging time of the sensor, the set calibration concentration value, the number of different concentration values ​​that need to be calibrated and the set alarm range, etc. When the production data is successfully obtained, the host system loads the production data and performs the sensor module aging test based on the production data. The MES system is integrated in the cloud system to store the identity serial number of each sensor to be aged and calibrated, and the production data of each sensor to be aged and calibrated. The host system obtains the production data related to the current sensor module to be tested from the MES (manufacturing execution system) system through a data interface or a network connection.

[0039] The alarm value range is set based on the characteristics, purpose, and safety standards of the sensor. Since the sensor meets the national standard certification (for example, GB15322.2) before leaving the factory, the alarm value range cannot be changed at will. During the aging calibration test, the alarm value range is used to detect whether there is an abnormality in the test process. If an abnormality is determined, an alarm is issued.

[0040] S72, controlling a test fixture carrier to perform an aging test on the sensor module based on the production data.

[0041] In some embodiments, after the host system loads the production data corresponding to the aging test from the MES system, it can calculate the aging test parameters (such as aging time) required for each sensor module, and encapsulate the aging test parameters into aging instruction data, and send the aging instruction data to the slave fixture, so that when the slave fixture receives the aging instruction data, it distributes the aging instruction data to the corresponding test fixture carrier to perform aging test on the sensor module. Each test fixture carrier is responsible for controlling and monitoring the aging test process of one or more sensor modules.

[0042] In an optional embodiment, controlling the test fixture carrier board to perform an aging test on the sensor module based on the production data includes: Obtaining the factory time of the sensor to be aging-calibrated in the sensor module from the production data; Adjusting the aging time of the sensor to be calibrated based on the factory time; When it is detected that the current moment satisfies the aging time, the output voltage value of the sensor module is obtained; Comparing the output voltage value with a preset voltage threshold range; When it is determined that the output voltage value is not within the preset voltage threshold range, the test fixture carrier is controlled to stop performing the aging test on the sensor module.

[0043] Among them, the factory time of the sensor to be aged and calibrated is determined before the sensor leaves the factory, and is written into the storage chip of the sensor module when it is loaded onto the PCB carrier board, and the storage chip can transmit the factory time to the MES system for storage, so that the production data of the sensor to be aged and calibrated can be determined later by querying the MES system or reading the storage chip. Among them, the factory time and the aging time are positively correlated. If the factory time is long, the corresponding aging time also needs to be lengthened. If the factory time is short, the corresponding aging time can be shortened. Furthermore, the host system can obtain the voltage change of the sensor module output during the aging test in real time through the test fixture carrier board loaded by the sensor module, so that the host system can determine whether the aging test can be ended based on the output voltage value of the sensor module.

[0044] Among them, aging test refers to placing a product or component under specific conditions to simulate its performance changes after long-term use in order to evaluate its durability and reliability. For sensor modules, aging tests usually include: 1) Pretreatment: placing the sensor module under standard conditions for pretreatment to ensure the stability of its initial state; 2) Stress application: placing the sensor module under specific environmental conditions (such as high temperature, high humidity, vibration, etc.) to simulate the harsh conditions it may encounter in actual use; 3) Monitoring performance: During the stress application process, real-time monitoring of the performance changes of the sensor module, such as output voltage, response time, etc.; 4) Data analysis: Based on the monitored performance data, analyze the performance change trend of the sensor module during the aging process to evaluate its durability and reliability; 5) Determination result: Based on the preset judgment criteria, determine whether the sensor module has passed the aging test or whether further adjustment and optimization are required.

[0045] In an embodiment of the present application, the host system monitors the test fixture carrier in real time to perform an aging test on the sensor module, and monitors the output voltage change of the sensor module during the aging test in real time. When it is detected that the current moment meets the aging time, the test fixture carrier obtains the output voltage value of the sensor module, and transmits the output voltage value to the slave fixture, and the slave fixture transmits the output voltage value to the host system, so that the host system compares the output voltage value with the preset voltage threshold range to determine whether the sensor module has reached a stable state or whether the performance meets the requirements. If the output voltage value is not within the preset voltage threshold range (or other judgment conditions), it means that the sensor module has passed the aging test, or its performance has stabilized to a sufficient level, and the host system can send a control instruction corresponding to stopping the execution of the aging test to the slave fixture, so that the test fixture carrier stops performing the aging test on the sensor module.

[0046] Aging tests usually involve placing the sensor module under specific conditions to simulate performance changes after long-term use. In some embodiments, during the aging test of the sensor module, the host system can also monitor the ambient temperature and humidity of the sensor module in real time, whether the power is off during the aging test, whether the aging test is not completed, or whether other sensor modules are replaced during the aging test, increase or decrease the number of aging during the aging test, and the aging time of the sensor module when it is powered on and off. Specifically, the host system can obtain the ambient temperature and humidity of the environment in which the sensor module is located based on the temperature and humidity sensors deployed around the sensor module undergoing the aging test, and compare the ambient temperature and humidity with the temperature and humidity range of the aging test (for example, the temperature range is 20°C to 30°C, and the humidity range is 40%RH to 60%RH) to determine whether the current environment meets the aging test conditions. If the ambient temperature and humidity exceed the preset temperature and humidity range, the host system should immediately issue an alarm and suspend or terminate the aging test to prevent the test results from being affected. At the same time, the power monitoring module installed between the test fixture carrier and the power supply monitors the on-off state of the power supply in real time, wherein the signal output of the power monitoring module is connected to the host system to ensure that the host system can obtain power status information in real time. If the power monitoring module detects a power outage, it will immediately send a signal to the host system. After receiving the signal, the host system will record the power-off time and perform corresponding processing according to the preset power-off processing strategy (such as pausing the test, terminating the test, etc.). At the same time, the host system determines whether the test is completed according to the preset aging test time and test conditions. If the preset test time is reached or the test conditions are met, the host system will record the test completion time and stop the aging test. And the host system regularly scans and records the identity serial number of the sensor module currently being tested to determine whether other sensor modules have been replaced during the aging test. If the identity serial number is found to have changed, the host system will record the replacement time and issue an alarm to indicate that other sensor modules have been replaced during the aging test. At the same time, the host system determines whether the aging number increases or decreases by counting the number of sensor modules currently being tested. If the number changes, the host system will record the change time and issue an alarm to indicate that the aging number has changed. At the same time, the host system can monitor the power-on and power-off time of the sensor module in real time through the power monitoring module, and determine whether the aging time of the sensor module meets the requirements according to the preset power-on and power-off time range. If the power-on or power-off time exceeds the preset range, the host system will record the abnormal time and issue an alarm to indicate that the aging time of the sensor module does not meet the requirements.

[0047] Through the above optional implementation, the host system monitors the aging test process and output voltage changes of the sensor module in real time, adjusts the aging time according to the factory time, and compares the output voltage with the preset threshold after the aging time is met to determine whether the performance of the sensor module is stable or meets the requirements, thereby improving the accuracy and efficiency of the aging test and ensuring the quality of the sensor module. At the same time, by real-time monitoring of the ambient temperature and humidity, power status, identifier, power-on and power-off time of the sensor module, comprehensive monitoring and judgment of the aging test process is achieved. And through the preset test conditions and judgment criteria, the accuracy and reliability of the test results are ensured.

[0048] In some embodiments, the slave fixture can periodically upload the sensor module information of the sensor module (for example, the timestamp (real-time clock information), aging results, etc. issued by the host system) to the host system and the cloud system for storage, reducing the congestion of communication channels between multiple slave fixtures. Furthermore, the host system can also compare the sensor module information uploaded by the slave fixture with the information pre-stored by the MES system to determine whether it is correct. Exemplarily, assuming that the sensor module information is an aging result, the information pre-stored by the MES system is the condition that the aging result must meet, such as whether the output voltage or output current of the sensor module is within a preset threshold range.

[0049] S73, when it is determined that the aging test is completed, controlling the sensor module to perform a calibration test based on a calibration concentration value.

[0050] Refer to Fig.10 In some embodiments, when it is determined that the aging test of the sensor module is completed, the sensor module and the slave fixture need to be placed in a calibration sealed box, and a communication connection between the slave fixture, the calibration sealed box and the host system is established. The host system automatically controls the door of the calibration sealed box to close, and then the host system calibrates the sensor module in the calibration sealed box. When the host system needs to perform gas calibration on the sensor module, it needs to obtain the production data of the sensor module from the MES system. When the production data is successfully obtained, the host system loads the production data and performs a calibration test of the sensor module based on the production data.

[0051] In an optional embodiment, controlling the sensor module to perform a calibration test based on a calibration concentration value includes: Acquiring temperature and humidity data of multiple temperature and humidity sensors in the calibration sealed box; Calculate the mean temperature and humidity of the temperature and humidity data; When it is determined that the mean temperature and humidity are stable, controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box; Obtaining a first concentration value of the calibration sealed box; When it is determined that the first concentration value satisfies the calibration concentration value, the operation of controlling the sensor module to perform a calibration test based on the calibration concentration value is executed.

[0052] Among them, a plurality of temperature and humidity sensors are arranged in the calibration sealed box to monitor the temperature and humidity data in the calibration sealed box. When the temperature and humidity sensor collects the temperature and humidity data in the calibration sealed box, the mean temperature and humidity of the temperature and humidity data is calculated, and the temperature and humidity data in the calibration sealed box is adjusted to the temperature and humidity range required by the calibration sensor module through the host system. A flow meter and a gas concentration analyzer are also arranged in the calibration sealed box. When it is determined that the average temperature and humidity of the plurality of temperature sensors in the calibration sealed box are stable and within the temperature and humidity range, the host system controls the solenoid valve to inject the standard gas corresponding to the sensor module into the calibration sealed box, and the flow meter and the gas concentration analyzer are used to monitor the gas concentration value in the calibration sealed box in real time. After the gas concentration value is stable and meets the calibration concentration value, the host system sends a calibration instruction to the slave fixture. After receiving the calibration instruction, the slave fixture distributes the calibration instruction to each test fixture carrier board, and each test fixture carrier board controls each sensor module to perform gas calibration.

[0053] In the embodiment of the present application, the sensor to be aged and calibrated in the sensor module is a gas sensor, which may include, but is not limited to: a methane gas sensor, a propane gas sensor, a hydrogen gas sensor, etc. When the sensor to be aged and calibrated is a methane gas sensor, the standard gas corresponding to the sensor module refers to methane gas; when the sensor to be aged and calibrated is a propane gas sensor, the standard gas corresponding to the sensor module refers to propane gas, and this application will not give examples one by one. Among them, the calibration concentration value refers to the gas concentration value of the sensor to be aged and calibrated at the current moment when the gas is calibrated. The temperature and humidity range is set according to the performance of the sensor to be aged and calibrated. The temperature range is generally set to 21°C to 28°C, and the humidity range is generally set to 40%RH to 60%RH.

[0054] In an optional embodiment, the method further comprises: Determine the maximum gas injection time; When it is detected that the maximum steam injection time is met at the current moment, determining whether the second concentration value of the calibration sealed box is within the concentration value error range; When it is determined that the second concentration value is within the concentration value error range, continuing to perform the operation of controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box until the second concentration value meets the calibration concentration value; When it is determined that the second concentration value is not within the concentration value error range, and the concentration difference is less than the concentration threshold corresponding to the concentration value error range, it is determined that there is a risk of gas leakage in the calibration sealed box, and the operation of controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box is stopped.

[0055] Refer to Fig. 9 In some embodiments, the host system can estimate a maximum gas injection time in advance based on the calibrated concentration value and the box capacity of the calibrated sealed box, and during the process of injecting the standard gas into the calibrated sealed box, detect in real time whether the maximum gas injection time is met at the current moment. When the maximum gas injection time is reached, stop injecting the standard gas into the calibrated sealed box, and obtain the gas concentration value in the calibrated sealed box at this time through the gas concentration analyzer, which is called the second concentration value, and transmit the second concentration value to the host system, so that the host system can calculate the concentration difference between the second concentration value and the calibrated concentration value. When it is determined that the second concentration value has not reached the calibrated concentration value and the concentration difference is within the preset concentration value error range, the injection speed of the standard gas into the calibrated sealed box is slowed down, and the standard gas is continued to be injected into the calibrated sealed box based on the slowed injection speed until the gas concentration analyzer detects that the second concentration value meets the calibrated concentration value, and then stops injecting the standard gas into the calibrated sealed box. When the concentration difference is not within the concentration value error range, and the second concentration value is much smaller than the minimum concentration threshold in the concentration value error range, it can be determined that there is a risk of gas leakage in the calibration sealed box (for example, the box body of the calibration sealed box is not completely closed or the seal is poor), and the injection of standard gas into the calibration sealed box is stopped, and an alarm is issued according to the preset alarm method, such as sending an abnormal signal to warn the operator.

[0056] The host system can set a concentration threshold corresponding to an error range to determine whether the second concentration value is too much less than the minimum concentration threshold in the concentration value error range. For example, if the calibration concentration value is 1000ppm (parts per million), the concentration value error range can be set to [950ppm, 1050ppm], and the minimum concentration threshold is 950ppm, then the concentration threshold corresponding to the error range can be set to 800ppm. When the second concentration value is monitored to be 800ppm, which is less than 800ppm, it can be determined that there is a risk of air leakage in the calibration sealed box.

[0057] Refer to Fig. 9In some embodiments, the host system can determine the maximum injection flow rate based on the calibration concentration value, for example, the calibration concentration value is determined as the maximum injection flow rate, or the calibration concentration value and the allowable concentration error are used as the maximum injection flow rate. For example, if the calibration concentration value is 1000ppm, and an error range of ±5% is allowed, the maximum injection flow rate = 1000ppm × (1 + 5%) = 1050ppm, or the maximum injection flow rate = 1000ppm × (1-5%) = 950ppm. The gas concentration in the calibration sealed box is monitored in real time by the flow meter, and it is ensured that the gas concentration in the calibration sealed box does not exceed the set maximum injection flow rate. When the gas analyzer monitors that the gas concentration in the calibration sealed box reaches the maximum injection flow rate, the standard gas is stopped from being injected into the calibration sealed box; when the gas analyzer monitors that the gas concentration in the calibration sealed box does not reach the maximum injection flow rate, the standard gas is continued to be injected into the calibration sealed box, and the gas analyzer monitors that the gas concentration in the sealed box reaches the maximum injection flow rate.

[0058] When it is detected that the gas concentration in the calibration sealed box meets the calibration concentration value, the host system can further control the sensor module to perform a gas calibration test based on the calibration concentration value. Calibration of gas sensors using standard gases of known concentrations to ensure the accuracy of their measurement results usually includes: 1) Preparation of standard gases: Select standard gases containing corresponding compounds according to the type of sensor to be calibrated, and ensure that their concentrations are known and accurate; 2) Introduction of standard gases: Introduce standard gases into the calibration sealed box, and ensure that they are evenly distributed in the box; 3) Sensor response measurement: Record the response value of the sensor under the action of standard gases, such as output voltage, current or frequency; 4) Data processing and calibration: Calculate the sensitivity, zero drift and other parameters of the sensor based on the response value of the sensor and the concentration of the standard gas, and perform corresponding calibration; 5) Verification and adjustment: Use the calibrated sensor to measure gases of unknown concentrations and verify the accuracy of its measurement results. If there is still an error, make further adjustments.

[0059] Refer to Figure 8 and Fig.10, the host system sends calibration instruction data to the slave fixture based on the calibration concentration value. When the slave fixture receives the calibration instruction data, it distributes it to each test fixture carrier board, and controls each of the multiple sensor modules loaded on it to calibrate the current concentration value through the test fixture carrier board, and writes the fixture board data (for example, order number parameters, calibration AD values, etc.) into the storage chip of each sensor module, and transmits the fixture board data back to the slave fixture. After receiving the fixture board data, the slave fixture packs the fixture board data and waits for the host system to query it. The host system makes a judgment when querying the fixture board data, and uploads the fixture board data to the MES system for storage, so that the MES system can verify the fixture board data. Specifically, the MES system can verify whether the uploaded value (that is, the fixture board data corresponding to the test after the test) and the value stored regularly on the system (that is, the data required to control the test before the test, such as the calibration concentration value) are correct, whether the order number parameters are correct, whether the calibration AD value is within the qualified range, and if it is not within the range, it needs to report calibration failure, etc. When the verification is confirmed to be successful, perform a gas calibration test on the sensor module.

[0060] In some embodiments, each acupuncture point of the test fixture carrier is equipped with a sensor module. When the test fixture board obtains the fixture board data on each acupuncture point, it can sort the fixture board data based on the identity serial number of the sensor module, integrate and package the sorted fixture board data, and send it to the slave fixture in the form of a data packet. After receiving the data of multiple test fixture boards, the slave fixture can also re-sort, integrate and package based on the identity serial number of the sensor module, and wait for the host system to query, so as to avoid information congestion, information confusion and other problems in the host system. When the slave fixture receives a data query request from the host system, the fixture board data is sent to the host system in the form of a data packet.

[0061] Through the above optional implementation methods, firstly, by precisely controlling the temperature, humidity and gas concentration in the calibration sealing box, it is ensured that the sensor module performs gas calibration tests under stable environmental conditions, thereby improving the accuracy and reliability of the calibration. Secondly, by introducing the judgment mechanism of the maximum gas injection time and the error range of the concentration value, the calibration failure caused by insufficient injection of standard gas or leakage of the calibration sealing box is effectively avoided, and the success rate of the calibration is further improved. In addition, through the collaborative work of the host system, the slave fixture and the test fixture carrier board, the simultaneous calibration and data management of multiple sensor modules are realized, greatly improving the calibration efficiency. Finally, by uploading the fixture board data to the MES system for verification and storage, the traceability and accuracy of the calibration data are ensured, providing strong support for the subsequent sensor module quality control and performance evaluation.

[0062] Refer to Fig. 9 and Fig.10 In some embodiments, before injecting the standard gas into the calibration sealed box, the detection device (e.g., electromagnetic reed switch, limit controller, etc.) connected to the host system can be used to detect whether the box body of the calibration sealed box for containing the gas has been completely closed, so as to ensure that the gas calibration process is successfully carried out and that the gas does not leak into the external environment. When it is detected that the box body of the calibration sealed box is not completely closed, the host system in the corresponding instruction is returned, and the box body of the calibration sealed box is further controlled by the host system to be closed. When it is detected that the box body of the calibration sealed box is completely closed, the gas analyzer is used to monitor whether the gas concentration in the calibration sealed box is 0ppm. When it is monitored that the gas concentration in the calibration sealed box is not 0ppm, the exhaust system connected to the calibration sealed box is controlled by the host system to exhaust the gas in the calibration sealed box by exhausting air, so as to avoid affecting the subsequent calibration of the standard gas. Further, the host system can obtain the temperature and humidity data of the calibration sealed box according to the same embodiment as above, and judge whether to perform the operation of injecting the pre-prepared standard gas into the calibration sealed box based on the temperature and humidity data.

[0063] In some embodiments, since the calibration sealed box used during calibration has a large box body volume, after the corresponding standard gas is injected, a stirring device (for example, a fan) provided in the calibration sealed box can be used to thoroughly stir the gas evenly so that the concentration difference between the gas concentrations in each corner of the calibration sealed box meets the calibration concentration value and lasts for a period of time before the concentration value in the calibration sealed box is considered stable.

[0064] It should be noted that each time a gas calibration is completed, the host system needs to control the exhaust system connected to the calibration sealed box to exhaust the calibrated waste gas by exhausting. During the calibration process, the aging and calibrated sensor will react chemically with the standard gas, such as producing carbon dioxide (for example, 2CH4+3O2→2CO+4H2O), etc., so the calibrated labeled gas cannot be reused. That is, each time a sensor calibration is completed, the gas in the calibration sealed box is discharged through the exhaust system, and the gas analyzer is used to monitor the gas concentration of the calibration sealed box in real time until the gas concentration is 0ppm, and then the next sensor calibration is performed based on the calibration sealed box.

[0065] In an optional embodiment, before controlling the test fixture carrier to perform an aging test on the sensor module based on the production data, the method further includes: Obtaining the zero-point value voltage of the sensor module when it is at the zero-point value; When it is determined that the zero-point value voltage is normal, sending a communication connection instruction to the sensor module to determine whether the sensor module communicates normally; When it is determined that the sensor module is communicating normally, determining whether there is a welding pin header on the sensor module; When it is determined that the sensor module has a welding pin header, determining whether the welding pin header is normal; When it is determined that the welding pin header is normal, the operation of controlling the test fixture carrier board to perform an aging test on the sensor module based on the production data is executed.

[0066] In some embodiments, when the sensor module is automatically placed on the test fixture carrier by a visual robot, the test fixture carrier can automatically detect whether the function of the sensor module is normal. Specifically, the voltage value of its 0 point value (in the air) is collected by the ADC function of the MCU on the test fixture carrier, and the measured voltage value is compared with the preset normal range to determine whether it is normal. When it is determined that the 0 point value voltage of the sensor module is within the preset normal range, a communication instruction is sent to the storage chip of the sensor module through the host system, and data is attempted to be read or written, and further checked whether the host system receives a response from the storage chip and whether the response data is correct. According to the response result, it is determined whether the storage chip communication is normal. When it is determined that the storage chip communication is normal, it can be determined that the sensor module communication is normal. When it is determined that the sensor module communication is normal, if the sensor module has a welding pin, the MCU on the test fixture carrier uses the correct communication method of the sensor to directly communicate and read the voltage value to determine whether the sensor module has a cold solder joint or a false solder joint. When it is determined that the welding pin is normal, the host system can control the test fixture carrier to perform aging test and calibration test on its corresponding sensor module.

[0067] Through the above-mentioned optional implementation mode, by adding preprocessing steps such as 0-point value voltage detection, communication connection test and welding pin inspection, the normal state of the sensor module before the aging test is ensured, the accuracy and reliability of the test are improved, and the failure of the aging calibration test caused by the abnormality of the sensor module is reduced.

[0068] It should be noted that, for the convenience of description, the aforementioned method embodiments are all described as a series of action combinations, but those skilled in the art should be aware that the present invention is not limited by the described action sequence, because according to the present invention, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present invention.

[0069] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0070] The above is a specific description of the preferred implementation of the present invention, but the invention is not limited to the embodiments. Those skilled in the art can make various equivalent modifications or substitutions without violating the spirit of the present invention. These equivalent modifications or substitutions are all included in the scope defined by the claims of this application.

Claims

1. A sensor module aging calibration system, characterized in that: The system comprises: A sensor module, a slave fixture and a host system, wherein the slave fixture includes a plurality of test fixture carriers, the sensor module is communicatively connected to the test fixture carriers, and the slave fixture is communicatively connected to the host system; The test fixture carrier is used to load the plurality of sensor modules, and when receiving the aging calibration instruction sent by the host system, performs an aging calibration test on the plurality of sensor modules; The host system is used to control the test fixture carrier to perform aging calibration tests on the multiple sensor modules, and control the test fixture carrier to feed back aging calibration test results of the sensor modules.

2. The sensor module aging calibration system according to claim 1, characterized in that: The sensor module comprises a sensor to be calibrated by aging and a PCB board, wherein the sensor to be calibrated by aging is connected to the PCB board, and the PCB board is provided with a storage chip and a sensor detection circuit; The storage chip is used to store the PCB board information of the PCB board and the sensor information of the sensor to be aging calibrated; The sensor detection circuit is used to detect whether the sensor to be aging and calibrated is successfully connected to the PCB board.

3. The sensor module aging calibration system according to claim 1, characterized in that: The aging calibration test includes an aging test, and the host system is further used for: Obtaining an output voltage value of the sensor module; Comparing the output voltage value with a preset voltage threshold range; When it is determined that the output voltage value is not within the preset voltage threshold range, the test fixture carrier is controlled to stop performing the aging test on the sensor module.

4. The sensor module aging calibration system according to claim 1, characterized in that: The system further comprises: A visual robot, used for identifying the identity serial numbers of the plurality of sensor modules, and loading the plurality of sensor modules onto the test fixture carrier based on the identity serial numbers; The host system is further used to obtain the identity serial number, determine the production data of the sensor module based on the identity serial number, and generate an aging instruction for the aging calibration instruction based on the aging state and the production state.

5. The sensor module aging calibration system according to claim 3, characterized in that: The sensor module is connected to the test fixture carrier board via a serial peripheral device interface, and the test fixture carrier board is connected to the host system via an RS485 bus.

6. A sensor module aging calibration method, characterized in that: The sensor module aging calibration system applied to any one of claims 1 to 5, the method comprising: Obtaining an identity serial number of the sensor module, and determining production data of the sensor module based on the identity serial number; Controlling a test fixture carrier board to perform an aging test on the sensor module based on the production data; When it is determined that the aging test is completed, the sensor module is controlled to perform a calibration test based on a calibration concentration value.

7. The sensor module aging calibration method according to claim 6, characterized in that: The sensor module and the test fixture carrier after the aging test are placed in a calibration sealed box, and the control of the sensor module to perform a calibration test based on a calibration concentration value includes: Acquiring temperature and humidity data of multiple temperature and humidity sensors in the calibration sealed box; Calculate the mean temperature and humidity of the temperature and humidity data; When it is determined that the mean temperature and humidity are stable, controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box; Obtaining a first concentration value of the calibration sealed box; When it is determined that the first concentration value satisfies the calibration concentration value, the operation of controlling the sensor module to perform a calibration test based on the calibration concentration value is executed.

8. The sensor module aging calibration method according to claim 7, characterized in that: The method further comprises: Determine the maximum gas injection time; When it is detected that the maximum gas injection time is met at the current moment, determining whether the second concentration value of the calibration sealed box is within the concentration value error range; When it is determined that the second concentration value is within the concentration value error range, continuing to perform the operation of controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box until the second concentration value meets the calibration concentration value; When it is determined that the second concentration value is not within the concentration value error range, and the concentration difference is less than the concentration threshold corresponding to the concentration value error range, it is determined that there is a risk of gas leakage in the calibration sealed box, and the operation of controlling the standard gas corresponding to the sensor module to be injected into the calibration sealed box is stopped.

9. The sensor module aging calibration method according to claim 6, characterized in that: The controlling the test fixture carrier board to perform an aging test on the sensor module based on the production data includes: Obtaining the factory time of the sensor to be aging-calibrated in the sensor module from the production data; Adjusting the aging time of the sensor to be calibrated based on the factory time; When it is detected that the current moment satisfies the aging time, the output voltage value of the sensor module is obtained; Comparing the output voltage value with a preset voltage threshold range; When it is determined that the output voltage value is not within the preset voltage threshold range, the test fixture carrier is controlled to stop performing the aging test on the sensor module.

10. The sensor module aging calibration method according to claim 6, characterized in that: Before controlling the test fixture carrier to perform an aging test on the sensor module based on the production data, the method further includes: Obtaining the zero-point value voltage of the sensor module when it is at the zero-point value; When it is determined that the zero-point value voltage is normal, sending a communication connection instruction to the sensor module to determine whether the sensor module communicates normally; When it is determined that the sensor module is communicating normally, determining whether there is a welding pin header on the sensor module; When it is determined that the sensor module has a welding pin header, determining whether the welding pin header is normal; When it is determined that the welding pin header is normal, the operation of controlling the test fixture carrier board to perform an aging test on the sensor module based on the production data is executed.

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