Method and system for testing hot plug of nvme solid state disk

Abstract

The invention discloses an nvme solid state disk hot plug test method and system, a power supply module is arranged in the system, a host end controls the power supply module through a first GPIO pin to realize hot plug hardware simulation, and controls the nvme solid state disk through a second GPIO pin to realize hot plug software simulation. The method comprises the following steps: enabling a power supply module through a first GPIO pin during a hot plug test, and electrifying through a second GPIO pin; power-off protection is carried out during a hot pull-out test, power-off is carried out through the second GPIO pin, and if power-off succeeds, the power supply module is disabled through the first GPIO pin; if the power-off fails, data recovery is carried out after the second GPIO pin is powered on, and the hot pull-out test is carried out again; and obtaining kernel information, searching abnormal information and outputting a test result. According to the invention, the data security in the test process is effectively ensured by adding a power-off protection mechanism while the effective test is carried out.

Description

Technical Field

[0001] The present invention relates to the field of solid state drive testing, and in particular to an NVME solid state drive hot-swap testing method and system. Background Art

[0002] With the rapid development of big data and AI, information services and increasingly powerful cloud computing services have higher and higher requirements for server performance. NVME solid-state drives solve the bottlenecks of high latency and low bandwidth in server data transmission. The design of NVME solid-state drives makes full use of the low latency and concurrency of the PCIE interface channel. Therefore, NVME solid-state drives have six major technical advantages: faster interface speed, better management and functionality, better performance per unit capacity, lower latency, higher I / O efficiency, and more flexible storage matching. When a server installs a new NVME solid-state drive or migrates an NVM solid-state drive, it is necessary to ensure the normal operation of the server business and the security of the NVME SSD data. However, violent hot-plugging will bring uncertain catastrophic problems to the system and the NVME solid-state drive. Therefore, without affecting the operation of the server, it is necessary to design a set of test methods to check the hot-plugging of NVME solid-state drives, which is also to safely protect the data of NVME solid-state drives.

[0003] Most of the current NVMe SSD hot-swap tests control the power on or off of the NVMe SSD according to the test command to simulate the insertion or removal of the NVMe SSD. However, the lack of a reliable power-off protection mechanism can easily lead to disk damage. Summary of the invention

[0004] The technical problem to be solved by the present invention is as follows: In view of the above-mentioned problems in the prior art, a method and system for hot-swap testing of an NVMe solid-state hard disk is provided, which effectively ensures data security during the testing process by adding a power-off protection mechanism.

[0005] In order to solve the above technical problems, the technical solution adopted by the present invention is:

[0006] An NVMe solid-state hard disk hot-swap test method is applied to an NVMe solid-state hard disk hot-swap test system. The NVMe solid-state hard disk hot-swap test system includes a host end host and a power supply module. The power supply module is serially connected to the power supply end of the NVMe solid-state hard disk hardware circuit, and the control end of the power supply module is connected to the first GPIO pin of the host end host. The method includes the following steps:

[0007] S101) If a hot-plug test is performed, the host enables the power supply module through the first GPIO pin to turn on the power of the nvme solid-state hard disk, and then switches the value of the register of the nvme solid-state hard disk to the first value through the second GPIO pin, thereby powering on the nvme solid-state hard disk;

[0008] S102) If a hot unplug test is performed, the host cancels all I / O operations and saves the nvme solid-state hard disk data to perform power-off protection, and then switches the value of the register of the nvme solid-state hard disk to the second value through the second GPIO pin, thereby powering off the nvme solid-state hard disk. If the nvme solid-state hard disk is powered off successfully, the power supply module is disabled through the first GPIO pin to disconnect the power supply of the nvme solid-state hard disk;

[0009] S103) If the NVMe SSD fails to be powered off, the host switches the value of the register of the NVMe SSD to the first value through the second GPIO pin, thereby powering on the NVMe SSD, and recovering the data of the NVMe SSD according to the saved NVMe SSD data, and then executing step S102 again;

[0010] S104) Obtain kernel information and search for abnormal information in the hot-insert test and / or hot-unplug test, and output the test results.

[0011] Further, enabling the power supply module through the first GPIO pin specifically sets the first GPIO pin to a high level or a low level, and disabling the power supply module through the first GPIO pin specifically sets the first GPIO pin to a low level or a high level.

[0012] Furthermore, when the value of the register of the nvme solid-state hard disk is switched to the first value through the second GPIO pin and the value of the register of the nvme solid-state hard disk is switched to the second value through the second GPIO pin, it includes: calling the GPIO interface of the kernel system, obtaining the second GPIO pin for controlling the power on and off of the nvme solid-state hard disk, changing the state of the second GPIO pin to a high level or a low level, thereby controlling the value of the register of the nvme solid-state hard disk to the first value or the second value.

[0013] Furthermore, when the host cancels all I / O operations, it includes: calling the I / O interface of the kernel system, obtaining the I / O communication status, terminating the I / O operation and processing the I / O operation data rollback.

[0014] Furthermore, when terminating the I / O operation and processing the I / O operation data rollback, it includes: directly canceling the read operation, calculating the estimated duration for the write operation, if the estimated duration is less than the preset threshold, waiting for the write operation to complete, if the estimated duration is greater than the preset threshold, rolling back the data and canceling the write operation.

[0015] Furthermore, when saving the nvme solid state drive data, it includes: calling the page table interface of the kernel system to obtain the mapping table data of the nvme solid state drive, calling the memory management interface of the kernel system to obtain the logical address of the nvme solid state drive, converting the logical address into a physical address and storing it together with the mapping table data in the designated storage medium.

[0016] Furthermore, after the host cancels all I / O operations and saves the NVMe SSD data to perform power-off protection, it also includes: sending a power-off pre-notification instruction to the controller of the NVMe SSD, waiting for and obtaining a reply from the controller that it is ready to power off, and executing the step of switching the value of the register of the NVMe SSD to a second value through the second GPIO pin.

[0017] Furthermore, obtaining kernel information specifically refers to calling the dmesg command to view the contents of the kernel ring buffer.

[0018] The present invention also proposes an NVMe solid-state hard drive hot-swap test system, comprising a host end host and a power supply module, wherein the power supply module is connected in series to the power supply end of the NVMe solid-state hard drive hardware circuit, and the control end of the power supply module is connected to the first GPIO pin of the host end host, and the host end host is programmed or configured to execute any one of the NVMe solid-state hard drive hot-swap test methods described.

[0019] Furthermore, the power supply module includes a P-channel or N-channel MOSFET, the gate of the MOSFET is connected to the first GPIO pin, the source of the MOSFET is grounded, the drain of the MOSFET is connected to the power supply end of the nvme solid-state hard drive, and a capacitor or a diode is also provided between the drain of the MOSFET and the power supply end of the nvme solid-state hard drive to prevent power transients from damaging the nvme solid-state hard drive.

[0020] Compared with the prior art, the advantages of the present invention are:

[0021] The present invention controls the power on and off of the nvme solid-state hard disk at the hardware level and the software level to realize the hot-swap test. Specifically, the hardware level sets a power supply module to be serially connected to the power supply end of the nvme solid-state hard disk hardware circuit, and the control end of the power supply module is connected to the GPIO pin of the host end host, so as to control the power supply of the nvme solid-state hard disk to be turned on or off; the software level controls the value of the nvme solid-state hard disk register through another GPIO pin of the host end host, so as to realize the power on or off of the nvme solid-state hard disk software level. Therefore, the plugging and unplugging of the nvme solid-state hard disk can be flexibly controlled through the GPIO pin of the host end host, and the hardware protection of the nvme solid-state hard disk is realized at the same time.

[0022] The present invention performs power-off protection by canceling all I / O operations and saving the NVMe solid-state hard disk data before the NVMe solid-state hard disk is powered off. When the power-off operation fails, the power-on operation is performed again, and the data of the NVMe solid-state hard disk is restored according to the saved NVMe solid-state hard disk data to avoid disk damage. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 FIG. 4 is a block diagram of a system structure of an embodiment of the present invention.

[0024] Figure 2 This is a schematic diagram of the attribute function interface control logic of an embodiment of the present invention.

[0025] Figure 3 The hot-swap test flow chart of an embodiment of the present invention.

[0026] Figure 4 The figure is an overall flow chart of the method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0027] The present invention is further described below in conjunction with the accompanying drawings and specific preferred embodiments, but the protection scope of the present invention is not limited thereby.

[0028] Embodiment 1

[0029] In order to safely replace a new NVME SSD or migrate NVME SSD while ensuring the normal operation of server services, including hardware security and data security, this embodiment proposes an NVME solid-state drive hot-swap test method, which is applied to the NVME solid-state drive hot-swap test system of this embodiment to ensure safe power on and off during the test from the hardware level and software level.

[0030] like Figure 1 As shown, the nvme solid-state hard disk hot-swap test system of this embodiment includes a host and a power supply module. The power supply module is a functional module added in this embodiment to protect the hardware circuit of the nvme solid-state hard disk. The host is connected to the host through the first GPIO pin ( Figure 1 Medium GPIO 1 ) controls the power supply module to implement hot-swap hardware simulation, and uses the second GPIO pin ( Figure 1 Medium GPIO 2) controls the nvme solid-state drive to realize hot-swap software simulation, the power supply module is connected in series to the power supply end of the nvme solid-state drive hardware circuit, and the control end of the power supply module is connected to the first GPIO pin of the host end, and the power supply module is turned on and off by changing the level of the first GPIO pin, thereby realizing the plug-in simulation of the nvme solid-state drive at the hardware level.

[0031] In this embodiment, the power supply module includes a P-channel or N-channel MOSFET, which is a commonly used electronic switch. A MOSFET with low on-resistance and high current capacity can be selected to ensure that the impact on the power supply is minimized when it is turned on. The gate of the MOSFET is connected to the first GPIO pin, the source of the MOSFET is grounded, and the drain of the MOSFET is connected to the power supply end of the nvme solid-state hard disk. In this embodiment, a capacitor or a diode is also provided between the drain of the MOSFET and the power supply end of the nvme solid-state hard disk to prevent power transients from damaging the nvme solid-state hard disk.

[0032] Based on the system of this embodiment, the idea of ​​the method of this embodiment is to encapsulate an attribute function interface to perform hot plug control at the software level, and then encapsulate the attribute function interface in the user state control kernel of the host for user state testing and output a test report.

[0033] like Figure 2 As shown, the attribute function interface of this embodiment simulates power-off protection when the nvme solid-state hard disk is pulled out, ensuring that the hard disk is pulled out normally from the following three aspects:

[0034] First, before power failure, a power failure control command is sent to the controller of the nvme solid-state drive, so that the nvme solid-state drive can prepare for power failure and cancel all I / O operations and data storage.

[0035] Secondly, call the system I / O interface to check the I / O status and cancel the ongoing I / O operation. In addition, save the data, ensure that the mapping table is saved, and complete the conversion of logical addresses to physical addresses.

[0036] After completing the power-off protection, call the kernel system general interface to obtain the second GPIO pin that controls the power on and off of the nvme solid-state drive, change the high and low level states of the second GPIO pin, control the value of the nvme solid-state drive register, and thus control the plugging and unplugging of the nvme solid-state drive.

[0037] Based on the above ideas, the method of this embodiment is as follows Figure 3 As shown, the following steps are included:

[0038] S101) If a hot-plug test is performed, the host enables the power supply module through the first GPIO pin to turn on the power of the nvme solid-state hard disk, and then switches the value of the register of the nvme solid-state hard disk to the first value through the second GPIO pin, thereby powering on the nvme solid-state hard disk;

[0039] S102) If a hot unplug test is performed, the host cancels all I / O operations and saves the nvme solid-state hard disk data to perform power-off protection, and then switches the value of the register of the nvme solid-state hard disk to the second value through the second GPIO pin, thereby powering off the nvme solid-state hard disk. If the nvme solid-state hard disk is powered off successfully, the power supply module is disabled through the first GPIO pin to disconnect the power supply of the nvme solid-state hard disk;

[0040] S103) If the NVMe SSD fails to be powered off, the host switches the value of the register of the NVMe SSD to the first value through the second GPIO pin, thereby powering on the NVMe SSD, and recovering the data of the NVMe SSD according to the saved NVMe SSD data, and then executing step S102 again;

[0041] S104) Obtain kernel information and search for abnormal information in the hot-insert test and / or hot-unplug test, and output the test results.

[0042] Through the above steps, the insertion and removal of the NVMe SSD are simulated at both the hardware and software levels, and a power-off protection mechanism is added to ensure hardware and data security. The specific contents of the relevant steps are explained below.

[0043] In step S101 of this embodiment, enabling the power supply module through the first GPIO pin specifically means setting the first GPIO pin to a high level or a low level. Correspondingly, disabling the power supply module through the first GPIO pin in step S102 of this embodiment specifically means setting the first GPIO pin to a low level or a high level. For example, if an N-channel MOSFET is used, the MOSFET can be turned on by outputting a high level through the GPIO, thereby supplying power to the NVMe disk; outputting a low level turns off the MOSFET, disconnecting the NVMe disk power supply; for a P-channel MOSFET, the control logic is opposite.

[0044] When the value of the register of the nvme solid-state hard disk is switched to the first value through the second GPIO pin in step S101 of this embodiment and the value of the register of the nvme solid-state hard disk is switched to the second value through the second GPIO pin in step S102 of this embodiment, both include: using the attribute function interface to call the GPIO interface of the kernel system, obtaining the second GPIO pin for controlling the power on and off of the nvme solid-state hard disk, changing the state of the second GPIO pin to a high level or a low level, thereby controlling the value of the register of the nvme solid-state hard disk to the first value or the second value.

[0045] Step S102 of this embodiment specifically first utilizes the I / 0 status check and I / 0 power-off pre-processing added by the attribute function interface, as well as the power-off protection mechanism to perform a simulation test on the removal of the nvme solid-state drive, and then disables the power supply module at the hardware level to ensure safe power-off.

[0046] In this embodiment, when the host side host cancels all I / O operations, it includes: using the attribute function interface to call the I / O interface of the kernel system, obtaining the I / O communication status, terminating the I / O operation and processing the I / O operation data rollback. When terminating the I / O operation and processing the I / O operation data rollback, it includes: directly canceling the read operation read, calculating the estimated duration for the write operation write, if the estimated duration is less than the preset threshold, waiting for the write operation write to be completed, if the estimated duration is greater than the preset threshold, rolling back the data and canceling the write operation write. It should be noted that how to calculate the estimated duration of the write operation is well known to those skilled in the art, and this embodiment does not involve improvements to the specific calculation process, so the specific calculation process is not repeated.

[0047] In this embodiment, when saving the nvme solid state drive data, it includes: using the attribute function interface to call the kernel system's page table interface to obtain the mapping table data of the nvme solid state drive, calling the kernel system's memory management interface to obtain the logical address of the nvme solid state drive, converting the logical address into a physical address and storing it together with the mapping table data in the designated storage medium.

[0048] In this embodiment, the designated storage medium can be a private flash. If the subsequent power-off process of the nvme solid-state drive fails, resulting in electrical damage to its electrical components, the reinsertion of the nvme solid-state drive is simulated at the software level through step S103, and the data saved in the flash is read at the same time to restore the threshold data of the electrical components of the nvme solid-state drive, which plays a role in restoring the threshold of the hardware parameters of the nvme solid-state drive, so that the nvme solid-state drive can resume normal operation. It should be noted that how to restore the threshold of the hardware parameters of the nvme solid-state drive through the physical address and mapping table data is well known to those skilled in the art. This embodiment does not involve improvements to the specific process, so the specific recovery process is not repeated.

[0049] The power-off protection mechanism added in step S102 of this embodiment also adds a step of issuing a pre-power-off notification. Specifically, after the host cancels all I / O operations and saves the nvme solid-state hard disk data to perform power-off protection, it also includes: issuing a power-off pre-notification instruction to the controller of the nvme solid-state hard disk, waiting for and obtaining a reply from the controller that it is ready to power off, and executing the step of switching the value of the register of the nvme solid-state hard disk to a second value through the second GPIO pin.

[0050] By powering off the controller of the nvme solid-state drive, sufficient time can be provided for the host to save the mapping table data and complete the conversion of the logical address to the physical address. It should be noted that the power-off preparation of the controllers of different nvme solid-state drives may be different, including but not limited to the following operations:

[0051] Data refresh and synchronization ensures that all cached data is written to persistent storage to prevent data loss. For example, data in the controller cache is written to NAND flash memory.

[0052] Submit outstanding I / O operations and ensure that all ongoing I / O operations are completed. For example, you can check the I / O operation status through polling or interrupt mechanism and wait for outstanding I / O operations to complete.

[0053] Close active command queues, ensuring that all command queues are closed properly. For example, close all I / O command queues step by step.

[0054] Save context and metadata, specifically save context information and metadata that need to be restored at the next startup. For example, save the current command queue status, error log, and other information.

[0055] Update the power management state to prepare for entering low power mode. For example, you can send a power management command to set the device to enter low power mode.

[0056] Error handling and logging, specifically checking for unhandled errors and logging them. For example, logging the current error status for diagnosis at the next startup.

[0057] Notify the operating system or host. For example, a certain mechanism may be used to notify the operating system that the SSD is about to be powered off.

[0058] Safe shutdown ensures that the device is shut down in a safe manner to prevent hardware damage.

[0059] In step S104 of this embodiment, obtaining kernel information specifically refers to calling the dmesg command to view the contents of the kernel ring buffer. These messages contain important information about hardware detection, device initialization, and any potential problems that the kernel may encounter. In this embodiment, the kernel provides user mode and checks the kernel dmesg to check whether there is any abnormal information when unplugging and plugging in, some of which are warning messages, and some are caused by abnormal power on and off. Therefore, the test stage where the abnormality occurs can be clearly understood through the above information. In addition, if there is no abnormal information, it means that the nvme solid-state drive has passed the hot-swap test.

[0060] Embodiment 2

[0061] This embodiment proposes a more comprehensive NVMe solid state drive hot plug test method based on the first embodiment, the difference is that Figure 4 As shown, before step S101, first determine whether the current test environment supports hot plugging. If not, output which specific level does not support it. If supported, start executing steps S101 to S104, and simulate the hot plugging of the nvme solid-state drive at the hardware and software levels to determine whether it is safe to power on and off and safely save data.

[0062] This embodiment includes the following steps before step S101:

[0063] NVME SSD check: Check the product specification to confirm whether the nvme solid-state drive supports hot-plugging. At the same time, call the command "lspci-s-vvv pci bus number|grep-iE hostplug" to obtain the device attributes and feature capabilities of the nvme solid-state drive through the pci bus. If the hostplug information is searched, it also means that the nvme solid-state drive definitely supports hot-plugging. If it does not support it, output the final test report and explain that the current test environment does not support hot-plugging because the nvme solid-state drive does not support it.

[0064] PCIe port check: Check whether the root port supports hot-plugging through system commands. By calling the command "ls-la / sys / bus / pci / slots", you can see many hotplug slot name names. Check the address to find the bus number corresponding to the slot. If the bus number is the same as the nvme ssd bus number queried from lspci, it means that this pcieport supports hot-plugging. The principle is to control the bit value corresponding to the slot ctrl reg in the configuration space and change the slot signal to power on and off, but it does not mean that nvme ssd can really power on and off. It depends on whether the chip design supports slot ctrlreg to change the electrical signal of the slot. Therefore, steps S101 and S102 are used to verify whether there are abnormalities in the power on and off process.

[0065] In summary, the present invention discloses a NVME solid-state hard disk hot-swap test method, which is applied to the NVME solid-state hard disk hot-swap test system of the present invention, and ensures safe power on and off during the test from the hardware level and the software level. A power supply module is added at the hardware level to protect the NVME disk hardware circuit, and the host side host controls the power supply module through a GPIO pin, and enables or disables the power supply module by controlling the GPIO value, so as to realize the hardware simulation of the NVME disk plug-in and ensure the safe power on and off of NVME, and at the same time, after the power-off protection is performed at the software level, the host side host controls the value of the register of the NVME disk through another GPIO pin to change to realize the software simulation of the NVME disk plug-in, and the power-off protection is realized by sending the power-off instruction before power-off, I / O status check, data preservation when the NVME disk is executed, and data recovery in the flash, so as to ensure the safe power on and off of NVME from the software level.

[0066] The above is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above embodiments. All technical solutions under the concept of the present invention belong to the protection scope of the present invention. It should be pointed out that for ordinary technicians in this technical field, some improvements and modifications without departing from the principle of the present invention should also be regarded as the protection scope of the present invention.

Claims

1. A nvme solid state drive hot-swap test method, characterized in that: The invention is applied to an nvme solid-state hard disk hot-swap test system, the nvme solid-state hard disk hot-swap test system comprises a host end host and a power supply module, the power supply module is serially connected to the power supply end of the nvme solid-state hard disk hardware circuit, and the control end of the power supply module is connected to the first GPIO pin of the host end host, the method comprises the following steps: S101) If a hot-plug test is performed, the host enables the power supply module through the first GPIO pin to turn on the power of the nvme solid-state hard disk, and then switches the value of the register of the nvme solid-state hard disk to the first value through the second GPIO pin, thereby powering on the nvme solid-state hard disk; S102) If a hot unplug test is performed, the host cancels all I / O operations and saves the nvme solid-state hard disk data to perform power-off protection, and then switches the value of the register of the nvme solid-state hard disk to the second value through the second GPIO pin, thereby powering off the nvme solid-state hard disk. If the nvme solid-state hard disk is powered off successfully, the power supply module is disabled through the first GPIO pin to disconnect the power supply of the nvme solid-state hard disk; S103) If the NVMe SSD fails to be powered off, the host switches the value of the register of the NVMe SSD to the first value through the second GPIO pin, thereby powering on the NVMe SSD, and recovering the data of the NVMe SSD according to the saved NVMe SSD data, and then executing step S102 again; S104) Obtain kernel information and search for abnormal information in the hot-insert test and / or hot-unplug test, and output the test results.

2. The NVMe SSD hot-swap test method according to claim 1, wherein: Enabling the power supply module through the first GPIO pin specifically sets the first GPIO pin to a high level or a low level, and disabling the power supply module through the first GPIO pin specifically sets the first GPIO pin to a low level or a high level.

3. The NVMe SSD hot-swap test method according to claim 1, characterized in that: When the value of the register of the nvme solid-state hard disk is switched to the first value through the second GPIO pin and the value of the register of the nvme solid-state hard disk is switched to the second value through the second GPIO pin, it includes: calling the GPIO interface of the kernel system, obtaining the second GPIO pin for controlling the power on and off of the nvme solid-state hard disk, changing the state of the second GPIO pin to a high level or a low level, thereby controlling the value of the register of the nvme solid-state hard disk to the first value or the second value.

4. The NVMe SSD hot-swap test method according to claim 1, wherein: When the host cancels all I / O operations, it includes: calling the I / O interface of the kernel system, obtaining the I / O communication status, terminating the I / O operation and processing the I / O operation data rollback.

5. The NVMe SSD hot-swap test method according to claim 4, characterized in that: When terminating an I / O operation and processing I / O operation data rollback, it includes: directly canceling the read operation, calculating the estimated duration for the write operation, and waiting for the write operation to complete if the estimated duration is less than the preset threshold. If the estimated duration is greater than the preset threshold, data is rolled back and the write operation is canceled.

6. The NVMe SSD hot-swap test method according to claim 1, characterized in that: When saving nvme solid state drive data, it includes: calling the page table interface of the kernel system to obtain the mapping table data of the nvme solid state drive, calling the memory management interface of the kernel system to obtain the logical address of the nvme solid state drive, converting the logical address into a physical address and storing it together with the mapping table data in a designated storage medium.

7. The NVMe SSD hot-swap test method according to claim 1, characterized in that: After the host cancels all I / O operations and saves the NVMe solid-state hard disk data to perform power-off protection, it also includes: sending a power-off pre-notification instruction to the controller of the NVMe solid-state hard disk, waiting for and obtaining a reply from the controller that it is ready to power off, and then executing the step of switching the value of the register of the NVMe solid-state hard disk to a second value through the second GPIO pin.

8. The NVMe SSD hot-swap test method according to claim 1, characterized in that: Getting kernel information specifically refers to calling the dmesg command to view the contents of the kernel ring buffer.

9. An nvme solid state drive hot-swap test system, characterized in that: The invention comprises a host end host and a power supply module, wherein the power supply module is connected in series to the power supply end of the NVMe solid-state hard disk hardware circuit, and the control end of the power supply module is connected to the first GPIO pin of the host end host, and the host end host is programmed or configured to execute the NVMe solid-state hard disk hot-swap test method according to any one of claims 1 to 8.

10. The NVMe solid state drive hot-swap test system according to claim 9, characterized in that: The power supply module includes a P-channel or N-channel MOSFET, the gate of the MOSFET is connected to the first GPIO pin, the source of the MOSFET is grounded, the drain of the MOSFET is connected to the power supply end of the nvme solid-state hard drive, and a capacitor or a diode is also provided between the drain of the MOSFET and the power supply end of the nvme solid-state hard drive to prevent power transients from damaging the nvme solid-state hard drive.

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