Power supply test circuit

Abstract

The embodiment of the invention discloses a power supply test circuit. The power supply test circuit comprises a packaging test seat which is electrically connected with a power supply to be tested; the adjustable power supply is electrically connected with the packaging test seat, and the adjustable power supply is used for supplying power to the to-be-tested power supply; the load module is electrically connected with the packaging test seat and is used for providing a load for the power supply to be tested; the load module comprises an amplifier and an MOS tube. The starting test module is electrically connected with the packaging test seat and is used for outputting a pulse signal and controlling the state of the load module through the pulse signal; the starting test module comprises a trigger and an optoelectronic isolator; the adjustable power supply is also used for supplying power to the starting test module and the load module. The power supply test circuit provided by the embodiment of the invention can ensure the test reliability.

Description

Technical Field

[0001] The embodiments of the present invention relate to a power supply testing technology, and in particular to a power supply testing circuit. Background Art

[0002] For devices that require power supply, power supply is an essential component. Power supply must be tested before leaving the factory to ensure the factory performance of the power supply.

[0003] At present, the existing power supply test circuit usually integrates various off-the-shelf instruments and other products through a bus and then controls them through software. The off-the-shelf instruments have a small selection range, large integrated volume, difficult installation, high cost, and mutual interference between the power supply and the finished instrument, affecting the test reliability. Summary of the invention

[0004] An embodiment of the present invention provides a power supply test circuit to ensure test reliability.

[0005] An embodiment of the present invention provides a power supply test circuit comprising:

[0006] A package test socket, electrically connected to a power supply to be tested;

[0007] An adjustable power supply, electrically connected to the package test socket, the adjustable power supply being used to supply power to the power supply to be tested;

[0008] A load module, electrically connected to the package test socket, for providing a load for the power supply to be tested; the load module includes an amplifier and a MOS tube;

[0009] A startup test module is electrically connected to the package test socket and is used to output a pulse signal, and the state of the load module is controlled by the pulse signal; the startup test module includes a trigger and a photoelectric isolator; and the adjustable power supply is also used to power the startup test module and the load module.

[0010] Optionally, the startup test module includes a trigger unit, a photoelectric isolation unit and a switch unit, the input end of the trigger unit is electrically connected to the package test socket, the output end of the trigger unit is electrically connected to the input end of the switch unit through the photoelectric isolation unit, and the output end of the switch unit is electrically connected to the package test socket; the trigger unit includes at least one trigger, and the photoelectric isolation unit includes at least one photoelectric isolator.

[0011] Optionally, the load module is a dual-channel load module, and the load module includes a first adjustable resistance unit, a second adjustable resistance unit, a first amplifier, a second amplifier, a first MOS tube, and a second MOS tube; the first end and the second end of the first adjustable resistance unit are electrically connected to different voltage ends of the package test socket, the adjustment end of the first adjustable resistance unit is electrically connected to the positive input end of the first amplifier, the negative input end of the first amplifier is electrically connected to the first pole of the first MOS tube, the output end of the first amplifier is electrically connected to the gate of the first MOS tube, the first pole of the first MOS tube is electrically connected to the second end of the first adjustable resistance unit, and the first MOS The second pole of the tube is electrically connected to the first end of the first adjustable resistance unit; the first end of the second adjustable resistance unit is electrically connected to the second end of the first adjustable resistance unit, the second end of the second adjustable resistance unit is electrically connected to the package test socket, the adjustment end of the second adjustable resistance unit is electrically connected to the positive input end of the second amplifier, the negative input end of the second amplifier is electrically connected to the first pole of the second MOS tube, the output end of the second amplifier is electrically connected to the gate of the second MOS tube, the first pole of the second MOS tube is electrically connected to the second end of the second adjustable resistance unit, and the second pole of the second MOS tube is electrically connected to the first end of the second adjustable resistance unit.

[0012] Optionally, the first adjustable resistance unit has the same structure as the second adjustable resistance unit, the first adjustable resistance unit includes an adjustable resistor and multiple relay branches, the adjustment end of the adjustable resistor is electrically connected to the positive input end of the first amplifier, one end of the adjustable resistor is electrically connected to a voltage end of the package test socket through the relay branch, the other end of the adjustable resistor is electrically connected to another voltage end of the package test socket, and the relay branch is provided with a relay and a resistor connected to the relay.

[0013] Optionally, the load module also includes a first relay unit and a second relay unit, the first pole of the first MOS tube is electrically connected to the second end of the first adjustable resistance unit through the first relay unit, the first pole of the second MOS tube is electrically connected to the second end of the second adjustable resistance unit through the second relay unit, and the first relay unit and the second relay unit each include a plurality of relays and resistors connected to the relays.

[0014] Optionally, the power supply test circuit further includes a digital voltage and current meter, which is electrically connected to the package test socket and is used to test the voltage and current of the load module through the package test socket.

[0015] Optionally, the power supply test circuit further includes a ripple test module, wherein the ripple test module is electrically connected to the package test socket, and the ripple test module is used to perform a ripple test on the power supply to be tested through the package test socket.

[0016] Optionally, the adjustable power supply includes a transformer, a first rectifier, a second rectifier, a first voltage regulator and an adjustable voltage regulator. The input end of the transformer is connected to the AC power supply. The transformer is electrically connected to the input end of the first rectifier and the input end of the second rectifier through its own different output ends. The output end of the first rectifier is electrically connected to the input end of the first voltage regulator, the output end of the second rectifier is electrically connected to the input end of the adjustable voltage regulator, and the output end of the first voltage regulator and the output end of the adjustable voltage regulator are both electrically connected to the packaging test socket.

[0017] Optionally, the output end of the first voltage regulator outputs a 5V DC voltage, the output end of the adjustable voltage regulator outputs a 1.2-24V DC voltage, the voltage output by the output end of the first voltage regulator is used to power the load module and the startup test module, and the voltage output by the output end of the adjustable voltage regulator is used to power the power supply to be tested.

[0018] Optionally, the power supply test circuit further includes a power supply to be tested, and the power supply to be tested is electrically connected to the package test socket.

[0019] The power supply test circuit provided by the embodiment of the present invention includes: a package test socket, electrically connected to the power supply to be tested; an adjustable power supply, electrically connected to the package test socket, and the adjustable power supply is used to power the power supply to be tested; a load module, electrically connected to the package test socket, and used to provide a load for the power supply to be tested; the load module includes an amplifier and a MOS tube; a start test module, electrically connected to the package test socket, and used to output a pulse signal, and control the state of the load module through the pulse signal; the start test module includes a trigger and a photoelectric isolator; and the adjustable power supply is also used to power the start test module and the load module. The power supply test circuit provided by the embodiment of the present invention realizes the connection between the power supply to be tested and the adjustable power supply, the load module, and the start test module through the setting of the package test socket, and isolates the adjustable power supply that powers the power supply to be tested from the power supply to be tested through the package test socket, so as to prevent the adjustable power supply from being directly connected to the power supply to be tested, so that the signal output by the adjustable power supply interferes with the signal output by the power supply to be tested, so as to ensure the reliability of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a structural block diagram of a power supply test circuit provided by an embodiment of the present invention;

[0021] Figure 2 is a structural diagram of a startup test module provided by an embodiment of the present invention;

[0022] Figure 3 It is a structural schematic diagram of a packaging test socket provided by an embodiment of the present invention;

[0023] Figure 4 is a structural schematic diagram of a load module provided by an embodiment of the present invention;

[0024] Figure 5 is a structural schematic diagram of an adjustable resistance unit provided by an embodiment of the present invention;

[0025] Figure 6 is a structural schematic diagram of a relay unit provided by an embodiment of the present invention;

[0026] Figure 7 is a structural schematic diagram of an adjustable power supply provided by an embodiment of the present invention;

[0027] Figure 8 is a structural block diagram of another power supply test circuit provided by an embodiment of the present invention;

[0028] Fig. 9 It is a structural schematic diagram of a digital voltage and current meter provided by an embodiment of the present invention;

[0029] Fig.10 It is a structural schematic diagram of a ripple test module provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0030] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0031] Figure 1 is a structural block diagram of a power supply test circuit provided by an embodiment of the present invention. Figure 1 The power supply test circuit includes: a package test socket 10, an adjustable power supply 20, a load module 30 and a start test module 40. The package test socket 10 is electrically connected to the power supply to be tested; the adjustable power supply 20 is electrically connected to the package test socket 10, and the adjustable power supply 20 is used to supply power to the power supply to be tested; the load module 30 is electrically connected to the package test socket 10, and is used to provide a load for the power supply to be tested; the load module 30 includes an amplifier and a MOS tube; the start test module 40 is electrically connected to the package test socket 10, and is used to output a pulse signal, and control the state of the load module 30 through the pulse signal; the start test module 40 includes a trigger and a photoelectric isolator; the adjustable power supply 20 is also used to supply power to the start test module 40 and the load module 30.

[0032] Specifically, the power supply test circuit can be applied to batch testing of the power supply to be tested, and the power supply to be tested can be a low-power power supply such as a DC-DC isolated or non-isolated power supply with a power of less than 10W. The package test socket 10 is provided with multiple voltage terminals and signal terminals, and the adjustable power supply 20, the load module 30, the start test module 40 and the power supply to be tested are electrically connected to the voltage terminal and the signal terminal of the package test socket 10, such as the adjustable power supply 20 is electrically connected to at least two power supply terminals V1 and V2 of the package test socket 10. The adjustable power supply 20 can be a power supply with two outputs, such as one outputting a constant DC voltage and the other outputting an adjustable DC voltage. When the power supply to be tested is tested, the power supply to be tested is connected to the voltage terminal IN+ / IN- and the signal terminal of the package test socket 10, the adjustable power supply 20 is used to power the power supply to be tested, the start test module 40 outputs a pulse signal, and the load module 30 is controlled to be connected to the package test socket 10 by the pulse signal, and the load size of the load module 30 is adjustable, thereby providing different sizes of loads for the power supply to be tested, and realizing performance tests such as the power supply capacity of the power supply to be tested. Furthermore, the adjustable power supply 20 that supplies power to the power supply to be tested is isolated from the power supply to be tested by packaging the test socket 10, so as to prevent the adjustable power supply 20 from being directly connected to the power supply to be tested, thereby preventing the signal output by the adjustable power supply 20 from interfering with the signal output by the power supply to be tested and affecting the test reliability.

[0033] The power supply test circuit provided in this embodiment includes: a package test socket, electrically connected to the power supply to be tested; an adjustable power supply, electrically connected to the package test socket, and the adjustable power supply is used to power the power supply to be tested; a load module, electrically connected to the package test socket, and used to provide a load for the power supply to be tested; the load module includes an amplifier and a MOS tube; a start test module, electrically connected to the package test socket, and used to output a pulse signal, and control the state of the load module through the pulse signal; the start test module includes a trigger and a photoelectric isolator; and the adjustable power supply is also used to power the start test module and the load module. The power supply test circuit provided in this embodiment realizes the connection between the power supply to be tested and the adjustable power supply, the load module, and the start test module through the setting of the package test socket, and isolates the adjustable power supply that powers the power supply to be tested from the power supply to be tested through the package test socket, so as to prevent the adjustable power supply from being directly connected to the power supply to be tested, so that the signal output by the adjustable power supply interferes with the signal output by the power supply to be tested, so as to ensure the reliability of the test.

[0034] Figure 2 is a schematic diagram of a startup test module provided by an embodiment of the present invention, Figure 3 Schematic diagram of the structure of a packaging test socket provided by an embodiment of the present invention. Figure 2 and Figure 3Optionally, the start test module 40 includes a trigger unit 41, a photoelectric isolation unit 42 and a switch unit 43, the input end of the trigger unit 41 is electrically connected to the package test socket 10, the output end of the trigger unit 41 is electrically connected to the input end of the switch unit 43 through the photoelectric isolation unit 42, and the output end of the switch unit 43 is electrically connected to the package test socket 10; the trigger unit 41 includes at least one trigger, and the photoelectric isolation unit 42 includes at least one photoelectric isolator.

[0035] For example, Figure 2 It is schematically shown that the trigger unit 41 includes a first trigger U1, a second trigger U2, and a third trigger U3, the photoelectric isolation unit 42 includes two photoelectric isolators U4 and U5, and the switch unit 43 includes two switches, wherein the output end of the first trigger U1 is electrically connected to the input ends of the other two triggers U2 and U3, the output ends of the other two triggers U2 and U3 are electrically connected to the input ends of the two photoelectric isolators U4 and U5, respectively, the output ends of the two photoelectric isolators U4 and U5 are electrically connected to the input ends of the two switches, and the output ends of the two switches are connected to different signal ends of the package test socket 10. And, Figure 2The startup test module 40 also includes an oscillator U6, one input end of the oscillator U6 is grounded through a switch, and the other input end is connected to its own output end and an input end of the first trigger U1 through a resistor. The other input end of the first trigger U1 is connected to the power supply end V1 of the package test socket 10 through a resistor and is grounded through a switch. The input end of each trigger is electrically connected to the power supply end V1 of the package test socket 10, so as to connect the adjustable power supply 20 through the power supply end V1 of the package test socket 10 to realize power supply such as 5V power supply, and the input ends of the two switches are respectively connected to two different power supply ends VA+ and VB+ of the package test socket 10 (port J of the package test socket 10 has multiple pins such as pins J4-J12, namely the above-mentioned power supply ends and signal ends, and the voltages of some pins are VO1- / VO2+ / 0V, VO1+, VO2-). Among them, the oscillator U6 is used to generate an oscillation signal. When the switch connected to the oscillator U6 is disconnected, the oscillator U6 does not work. When the switch connected to the oscillator U6 is closed, the oscillator U6 generates an oscillation signal. At this time, the oscillation signal is input into the input end of the first trigger U1, and the first trigger U1 generates a trigger signal such as a high-level trigger signal. The first trigger U1 plays a buffering role. The trigger signal generated by the first trigger U1 is transmitted to the other two triggers U2 and U3 connected to it. The other two triggers U2 and U3 output trigger signals. The trigger signal is transmitted to the switch unit 43 after the isolation effect of the optoelectronic isolator connected to the trigger, and is transmitted to the packaging test socket 10 through the switch unit 43, so as to be transmitted to the load module 30 through the packaging test socket 10. Taking the trigger signal as a high-level signal, when the load module 30 receives the high-level signal, the load module 30 is connected to the power supply connection line to be tested. When the switch unit 43 is disconnected, the load module 30 is disconnected from the power supply connection line to be tested. When the switch unit 43 is turned on and the load module 30 receives the trigger signal, the load module 30 is connected to the power supply connection line to be tested, so that the load module 30 provides a simulated load for the power supply to be tested for testing.

[0036] Figure 4 Schematic diagram of a load module provided by an embodiment of the present invention. Figure 4Optionally, the load module 30 is a dual-channel load module, and the load module 30 includes a first adjustable resistance unit 31, a second adjustable resistance unit 32, a first amplifier UA, a second amplifier UB, a first MOS tube TA and a second MOS tube TB; the first end and the second end of the first adjustable resistance unit 31 are electrically connected to different voltage ends VOA+ and 0V of the package test socket 10, the adjustment end of the first adjustable resistance unit 31 is electrically connected to the positive input end of the first amplifier UA, the negative input end of the first amplifier UA is electrically connected to the first pole of the first MOS tube, the output end of the first amplifier UA is electrically connected to the gate of the first MOS tube TA, and the first pole of the first MOS tube TA is electrically connected to the first adjustable resistance unit 31. The second end is electrically connected, the second pole of the first MOS tube TA is electrically connected to the first end of the first adjustable resistance unit 31; the first end of the second adjustable resistance unit 32 is electrically connected to the second end of the first adjustable resistance unit 31, the second end of the second adjustable resistance unit 32 is electrically connected to the voltage terminal VOB- of the package test socket 10, the adjustment end of the second adjustable resistance unit 32 is electrically connected to the positive input end of the second amplifier, the negative input end of the second amplifier is electrically connected to the first pole of the second MOS tube, the output end of the second amplifier is electrically connected to the gate of the second MOS tube, the first pole of the second MOS tube is electrically connected to the second end of the second adjustable resistance unit, and the second pole of the second MOS tube is electrically connected to the first end of the second adjustable resistance unit 32.

[0037] Specifically, the resistance values ​​of the first adjustable resistance unit 31 and the second adjustable resistance unit 32 are adjustable. When the voltage terminal VOA+ of the package test socket 10 connected to the first adjustable resistance unit 31 transmits a trigger signal to the load module 30, the first amplifier UA outputs a level signal such as a high level signal, and the first MOS tube TA is disconnected, ensuring that the load resistance between the voltage terminal VOA+ and the 0V terminal of the package test socket 10 is the resistance value of the first adjustable resistance unit 31. At this time, the first adjustable resistance unit 31 provides a load for the power supply to be tested. When the voltage terminal VOB- of the package test socket 10 connected to the second adjustable resistance unit 32 transmits a trigger signal to the load module 30, the second amplifier UB outputs a level signal such as a high level signal, and the second MOS tube TB is disconnected, ensuring that the load resistance between the voltage terminal VOB- and the 0V terminal of the package test socket 10 is the resistance value of the second adjustable resistance unit 32. At this time, the second adjustable resistance unit 32 provides a load for the power supply to be tested. When the voltage end of the package test socket 10 connected to the first adjustable resistance unit 31 and the second adjustable resistance unit 32 transmits a trigger signal to the load module 30 , the first adjustable resistance unit 31 and the second adjustable resistance unit 32 provide a dual-channel load for the power supply to be tested.

[0038] Figure 5 Schematic diagram of a structure of an adjustable resistance unit provided by an embodiment of the present invention. Figure 4 and Figure 5Optionally, the first adjustable resistance unit 31 has the same structure as the second adjustable resistance unit 32. The first adjustable resistance unit 31 includes an adjustable resistor RP and multiple relay branches. The adjustment end of the adjustable resistor RP is electrically connected to the positive input end of the first amplifier UA, one end of the adjustable resistor RP is electrically connected to a voltage end of the package test socket 10 through the relay branch, and the other end of the adjustable resistor RP is electrically connected to another voltage end of the package test socket 10. The relay branch is provided with a relay KV1 and a resistor connected to the relay KV1.

[0039] The two ends of the adjustable resistor RP in the first adjustable resistor unit 31 are respectively used as the two ends of the first adjustable resistor unit 31, and the two ends of the adjustable resistor in the second adjustable resistor unit 32 are respectively used as the two ends of the second adjustable resistor unit 32. When the relay KV1 is powered on, the branch where the relay KV1 is located is turned on, and the resistance of the branch where the relay KV1 is located is connected to the adjustable resistor RP, so that the on-off state of each relay branch is adjusted according to the resistance requirement to meet the load size required for the test.

[0040] Figure 6 Schematic diagram of a relay unit provided by an embodiment of the present invention. Figure 4 , Figure 5 and Figure 6 Optionally, the load module 30 also includes a first relay unit and a second relay unit, the first pole S of the first MOS tube TA is electrically connected to the second end of the first adjustable resistance unit 31 through the first relay unit, the first pole of the second MOS tube TB is electrically connected to the second end of the second adjustable resistance unit 32 through the second relay unit, and the first relay unit and the second relay unit both include multiple relays KV2 and resistors connected to the relays KV2.

[0041] Specifically, Figure 6 The relay unit shown is a first relay unit, and the first relay unit has the same structure as the second relay unit. When the relay KV2 is powered on, the branch where the relay KV2 is located is turned on, and the first pole S of the first MOS tube TA is connected to the second end of the second adjustable resistance unit 32 through the resistance of the branch where the relay KV2 is located, thereby further adjusting the on-off state of each relay branch in each relay unit according to the resistance requirement.

[0042] Figure 7 Schematic diagram of an adjustable power supply provided by an embodiment of the present invention. Figure 7Optionally, the adjustable power supply 20 includes a transformer T, a first rectifier PB1, a second rectifier PB2, a first voltage regulator PD and an adjustable voltage regulator PM. The input end of the transformer T is connected to the AC power supply. The transformer T is electrically connected to the input end of the first rectifier PB1 and the input end of the second rectifier PB2 through its own different output ends. The output end of the first rectifier PB1 is electrically connected to the input end of the first voltage regulator PD, the output end of the second rectifier PB2 is electrically connected to the input end of the adjustable voltage regulator PM, and the output end of the first voltage regulator PD and the output end of the adjustable voltage regulator PM are electrically connected to the package test socket 10.

[0043] Specifically, the transformer T performs voltage conversion on the AC power, i.e., AC power, and transmits the converted AC power to the first rectifier PB1 and the second rectifier PB2. The first rectifier PB1 and the second rectifier PB2 rectify the converted AC power and output DC power, such as 5V DC power. The first voltage regulator PD stabilizes the DC power, such as stabilizing the voltage of the DC power at 5V. The adjustable voltage regulator PM stabilizes and adjusts the DC power, such as adjusting the voltage of the DC power to 1.2-24V, thereby realizing one 5V output and another 1.2-24V output of the adjustable power supply 20. In addition, the input and output ends of the first voltage regulator PD and the adjustable voltage regulator PM are connected with devices such as capacitors, resistors, and diodes. The capacitor can play a filtering role, and the diode can prevent the current from flowing in the reverse direction.

[0044] Optionally, the output end of the first voltage regulator outputs a 5V DC voltage, the output end of the adjustable voltage regulator outputs a 1.2-24V DC voltage, the voltage output by the output end of the first voltage regulator is used to power the load module and the startup test module, and the voltage output by the output end of the adjustable voltage regulator is used to power the power supply to be tested. Among them, the voltage output by each voltage regulator is only for schematic illustration, which can be determined according to actual test requirements and is not limited here.

[0045] Figure 8 is a structural block diagram of another power supply test circuit provided by an embodiment of the present invention, Fig. 9 Schematic diagram of the structure of a digital voltage and current meter provided by an embodiment of the present invention. Figure 8 and Fig. 9 Optionally, the power supply test circuit further includes a digital voltage and current meter 50 , which is electrically connected to the package test socket 10 and is used to test the voltage and current of the load module through the package test socket 10 .

[0046] Among them, the power supply end of the digital voltage and ammeter 50 is electrically connected to the power supply end V1 of the packaging test socket 10, and the adjustable power supply is connected through the power supply end V1 of the packaging test socket 10, and the adjustable power supply is powered by the adjustable power supply. The input end IN-V / IN-A of the digital voltage and ammeter 50 is electrically connected to the signal end of the packaging test socket 10, and the load module is connected through the packaging test socket 10 to test the voltage and current of the load module and display the voltage and current.

[0047] Fig.10 Schematic diagram of the structure of a ripple test module provided by an embodiment of the present invention. Figure 8 and Fig.10 Optionally, the power supply test circuit further includes a ripple test module 60, which is electrically connected to the package test socket 10 and is used to perform a ripple test on the power supply to be tested through the package test socket 10. The ripple test module 60 may be an oscilloscope, which tests the ripple in the voltage signal output by the power supply to be tested through a probe such as a 10:1 probe.

[0048] Optionally, the power supply test circuit also includes a power supply to be tested, and the power supply to be tested is electrically connected to the package test socket. Specifically, when the power supply to be tested needs to be tested, the power supply to be tested is electrically connected to the package test socket, so as to connect other modules in the power supply test circuit through the package test socket to implement power supply testing.

[0049] The power supply test circuit provided in the present embodiment realizes the connection between the power supply to be tested and the adjustable power supply, the load module and the start test module through the setting of the packaged test socket, and isolates the adjustable power supply that supplies power to the power supply to be tested from the power supply to be tested through the packaged test socket, thereby preventing the adjustable power supply from being directly connected to the power supply to be tested so that the signal output by the adjustable power supply interferes with the signal output by the power supply to be tested, so as to ensure the test reliability; and, there is no need to use various ready-made instruments, which can solve the problems of large size, difficult installation and high cost caused by the use of various ready-made instruments in the prior art, thereby making the power supply test circuit smaller in size, easier to install, lower in cost, and obvious in energy saving and environmental protection effect.

[0050] Note that the above are only preferred embodiments of the present invention and the technical principles used. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and that various obvious changes, readjustments, combinations and substitutions can be made by those skilled in the art without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments, and may include more other equivalent embodiments without departing from the concept of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. A power supply test circuit, characterized in that: include: A package test socket, electrically connected to a power supply to be tested; An adjustable power supply, electrically connected to the package test socket, the adjustable power supply being used to supply power to the power supply to be tested; A load module, electrically connected to the package test socket, for providing a load for the power supply to be tested; the load module includes an amplifier and a MOS tube; A startup test module is electrically connected to the package test socket and is used to output a pulse signal, and the state of the load module is controlled by the pulse signal; the startup test module includes a trigger and a photoelectric isolator; and the adjustable power supply is also used to power the startup test module and the load module.

2. The power supply test circuit according to claim 1, characterized in that: The startup test module includes a trigger unit, a photoelectric isolation unit and a switch unit, the input end of the trigger unit is electrically connected to the package test socket, the output end of the trigger unit is electrically connected to the input end of the switch unit through the photoelectric isolation unit, and the output end of the switch unit is electrically connected to the package test socket; The trigger unit includes at least one trigger, and the photoelectric isolation unit includes at least one photoelectric isolator.

3. The power supply test circuit according to claim 1, characterized in that: The load module is a dual-channel load module, and the load module includes a first adjustable resistance unit, a second adjustable resistance unit, a first amplifier, a second amplifier, a first MOS tube, and a second MOS tube; the first end and the second end of the first adjustable resistance unit are electrically connected to different voltage ends of the package test socket, the adjustment end of the first adjustable resistance unit is electrically connected to the positive input end of the first amplifier, the negative input end of the first amplifier is electrically connected to the first pole of the first MOS tube, the output end of the first amplifier is electrically connected to the gate of the first MOS tube, the first pole of the first MOS tube is electrically connected to the second end of the first adjustable resistance unit, and the The second pole is electrically connected to the first end of the first adjustable resistance unit; the first end of the second adjustable resistance unit is electrically connected to the second end of the first adjustable resistance unit, the second end of the second adjustable resistance unit is electrically connected to the package test socket, the adjustment end of the second adjustable resistance unit is electrically connected to the positive input end of the second amplifier, the negative input end of the second amplifier is electrically connected to the first pole of the second MOS tube, the output end of the second amplifier is electrically connected to the gate of the second MOS tube, the first pole of the second MOS tube is electrically connected to the second end of the second adjustable resistance unit, and the second pole of the second MOS tube is electrically connected to the first end of the second adjustable resistance unit.

4. The power supply test circuit according to claim 3, characterized in that: The first adjustable resistor unit has the same structure as the second adjustable resistor unit. The first adjustable resistor unit includes an adjustable resistor and multiple relay branches. The adjustment end of the adjustable resistor is electrically connected to the positive input end of the first amplifier. One end of the adjustable resistor is electrically connected to a voltage end of the package test socket through the relay branch. The other end of the adjustable resistor is electrically connected to another voltage end of the package test socket. The relay branch is provided with a relay and a resistor connected to the relay.

5. The power supply test circuit according to claim 3, characterized in that: The load module also includes a first relay unit and a second relay unit, wherein the first pole of the first MOS tube is electrically connected to the second end of the first adjustable resistance unit through the first relay unit, and the first pole of the second MOS tube is electrically connected to the second end of the second adjustable resistance unit through the second relay unit, and the first relay unit and the second relay unit each include a plurality of relays and resistors connected to the relays.

6. The power supply test circuit according to claim 1, characterized in that: It also includes a digital voltage and current meter, which is electrically connected to the package test socket and is used to test the voltage and current of the load module through the package test socket.

7. The power supply test circuit according to claim 1, characterized in that: It also includes a ripple test module, which is electrically connected to the package test socket and is used to perform a ripple test on the power supply to be tested through the package test socket.

8. The power supply test circuit according to claim 1, characterized in that: The adjustable power supply includes a transformer, a first rectifier, a second rectifier, a first voltage regulator and an adjustable voltage regulator. The input end of the transformer is connected to the mains, and the transformer is electrically connected to the input end of the first rectifier and the input end of the second rectifier through its own different output ends. The output end of the first rectifier is electrically connected to the input end of the first voltage regulator, and the output end of the second rectifier is electrically connected to the input end of the adjustable voltage regulator. The output end of the first voltage regulator and the output end of the adjustable voltage regulator are both electrically connected to the package test socket.

9. The power supply test circuit according to claim 8, characterized in that: The output end of the first voltage regulator outputs a 5V DC voltage, the output end of the adjustable voltage regulator outputs a 1.2-24V DC voltage, the voltage output by the output end of the first voltage regulator is used to power the load module and the startup test module, and the voltage output by the output end of the adjustable voltage regulator is used to power the power supply to be tested.

10. The power supply test circuit according to claim 1, characterized in that: It also includes a power supply to be tested, and the power supply to be tested is electrically connected to the package test socket.

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