Element testing method and device, electronic equipment, storage medium and program product

CN119322736APending Publication Date: 2025-01-17TENCENT TECHNOLOGY (SHENZHEN) CO LTD
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Patent Information

Application Number
CN202310873033.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-07-14
Publication Date
2025-01-17

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Abstract

The embodiment of the invention discloses an element testing method and device, electronic equipment, a storage medium and a program product. The method comprises the steps of obtaining a test program corresponding to a to-be-tested element, accessing a to-be-tested page displaying a type label, determining a target label in the to-be-tested page to display the to-be-tested element of a target type, and then running the test program to test information, namely visual information, of the to-be-tested element displayed in the to-be-tested page. According to the method, the to-be-tested page is automatically accessed to obtain the to-be-tested element displayed in the to-be-tested page, the test program is automatically run to detect the visual information of the to-be-tested element, the whole process does not need manual intervention and is fast and efficient, and therefore the test efficiency can be improved.
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