Element testing method and device, electronic equipment, storage medium and program product
CN119322736APending Publication Date: 2025-01-17TENCENT TECHNOLOGY (SHENZHEN) CO LTD
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Patent Information
- Application Number
- CN202310873033.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-07-14
- Publication Date
- 2025-01-17
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Figure CN119322736A_ABST
Abstract
The embodiment of the invention discloses an element testing method and device, electronic equipment, a storage medium and a program product. The method comprises the steps of obtaining a test program corresponding to a to-be-tested element, accessing a to-be-tested page displaying a type label, determining a target label in the to-be-tested page to display the to-be-tested element of a target type, and then running the test program to test information, namely visual information, of the to-be-tested element displayed in the to-be-tested page. According to the method, the to-be-tested page is automatically accessed to obtain the to-be-tested element displayed in the to-be-tested page, the test program is automatically run to detect the visual information of the to-be-tested element, the whole process does not need manual intervention and is fast and efficient, and therefore the test efficiency can be improved.
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