Automatic detection method and system for nuclear power plant DCS system card

Abstract

The invention relates to an automatic detection method and system for a nuclear power plant DCS system card. The method comprises the following steps: obtaining test information; reading information of the to-be-tested card, and identifying the type of the to-be-tested card according to the information of the to-be-tested card; if the type of the to-be-tested card is an AI card, testing the to-be-tested card by adopting a first test process, and outputting a test report; if the to-be-tested card is the AO card, testing the to-be-tested card by adopting a second test process, and outputting a test report; if the to-be-tested card is the DI card, testing the to-be-tested card by adopting a third test process, and outputting a test report; and if the to-be-tested card is the DO card, testing the to-be-tested card by adopting a fourth test process, and outputting a test report. According to the invention, the to-be-detected card can be automatically detected, the efficiency is obviously improved, and the human factor risk can be reduced at the same time.

Description

Technical Field

[0001] The present invention relates to the field of card detection of nuclear power plants, and more specifically, to an automatic detection method and system for card detection of a DCS system of a nuclear power plant. Background Art

[0002] The distributed control system (DCS system) and turbine control system (TCS system) of nuclear power plants are both large-scale automatic control systems. The systems involve various types of input and output cards. AI cards are used for analog signal input, AO cards are used for analog signal output, DI cards are used for switch signal input, and DO cards are used for switch signal output. Under normal circumstances, the above card acceptance, fault analysis or copy machine verification, etc., cannot be installed in the unit system for performance, and only the minimum system (including CPU, backplane, power supply, etc.) can be built for power-on measurement. Due to the large number of card types, each test of a card requires manual input of current or voltage, and multiple disassembly lines are involved in the middle. For example, a 32-channel card test requires 32 disassembly times, and if there are two cards, it is 64 times. Therefore, the existing test scheme is very inefficient, with many manual operations, and it depends entirely on manpower to identify the quality of the card, which is not only inefficient but also prone to errors. Summary of the invention

[0003] The technical problem to be solved by the present invention is to provide a method and system for automatically detecting card components of a DCS system of a nuclear power plant in view of the problems existing in the prior art.

[0004] The technical solution adopted by the present invention to solve the technical problem is: constructing an automatic detection method for a nuclear power plant DCS system card, comprising the following steps:

[0005] Get test information;

[0006] Read the information of the card to be tested, and identify the type of the card to be tested according to the information of the card to be tested;

[0007] If the type of the card to be tested is an AI card, the card to be tested is tested using the first test process and a test report is output;

[0008] If the card to be tested is an AO card, the second test process is used to test the card to be tested, and a test report is output;

[0009] If the card to be tested is a DI card, the card to be tested is tested using a third test process and a test report is output;

[0010] If the card to be tested is a DO card, the fourth test process is used to test the card to be tested and a test report is output.

[0011] In the automatic detection method of a nuclear power plant DCS system card component of the present invention, if the type of the card component to be tested is an AI card component, using a first test process to test the card component to be tested includes:

[0012] Identify the subtype of the card to be tested;

[0013] If the subtype of the card to be tested is a current card, the card to be tested is tested based on the current AI card test process;

[0014] If the subtype of the card to be tested is a voltage card, the card to be tested is tested based on the voltage AI card test process;

[0015] If the subtype of the card to be tested is a thermal resistor card, the card to be tested is tested based on the thermal resistor card test process;

[0016] If the subtype of the card to be tested is a thermocouple card, the card to be tested is tested based on a thermocouple card test process.

[0017] In the automatic detection method of the nuclear power plant DCS system card component of the present invention, if the subtype of the card component to be tested is a current card, testing the card component to be tested based on the current AI card component test process includes:

[0018] Inputting current detection signals to each channel of the card to be tested;

[0019] Read the current test signal returned by each channel after the test;

[0020] Compare the current test signal returned by each channel with the standard current value to obtain the current deviation of each channel;

[0021] Determining whether the current deviation is within a set range;

[0022] If yes, it is judged as qualified, if not, it is judged as unqualified.

[0023] In the automatic detection method of the nuclear power plant DCS system card component of the present invention, if the subtype of the card component to be tested is a voltage card, testing the card component to be tested based on the voltage AI card component test process includes:

[0024] Input voltage detection signals to each channel of the card to be tested;

[0025] Read the voltage test signal returned by each channel after the test;

[0026] Compare the voltage test signal returned by each channel with the standard voltage value to obtain the voltage deviation of each channel;

[0027] Determining whether the voltage deviation is within a set range;

[0028] If yes, it is judged as qualified, if not, it is judged as unqualified.

[0029] In the automatic detection method of the nuclear power plant DCS system card component of the present invention, if the subtype of the card component to be tested is a thermal resistor card, testing the card component to be tested based on the thermal resistor card test process includes:

[0030] Outputting resistance detection signals to each channel of the card to be tested;

[0031] Read the resistance test signal returned by each channel after the test;

[0032] Compare the resistance test signal returned by each channel with the standard resistance value to obtain the resistance deviation of each channel;

[0033] Determining whether the resistance deviation is within a set range;

[0034] If yes, it is judged as qualified, if not, it is judged as unqualified.

[0035] In the automatic detection method of the nuclear power plant DCS system card component of the present invention, if the subtype of the card component to be tested is a thermocouple card, testing the card component to be tested based on the thermocouple card test process includes:

[0036] Outputting thermocouple detection signals to each channel of the card to be tested;

[0037] Read the feedback test signal returned by each channel after the test;

[0038] Compare the feedback test signal returned by each channel with the standard value to obtain the feedback deviation of each channel;

[0039] Determining whether the feedback deviation is within a set range;

[0040] If yes, it is judged as qualified, if not, it is judged as unqualified.

[0041] In the automatic detection method of the nuclear power plant DCS system card component of the present invention, if the card component to be tested is an AO card component, the second test process is used to test the card component to be tested, including:

[0042] Identify the subtype of the card to be tested;

[0043] If the subtype of the card to be tested is a current card, the card to be tested is tested based on the current AO card test process;

[0044] If the subtype of the card to be tested is a voltage card, the card to be tested is tested based on the voltage AO card test process;

[0045] The testing of the card to be tested based on the current AO card testing process includes:

[0046] Inputting current detection signals to each channel of the card to be tested;

[0047] Read the current test signal returned by each channel after the test;

[0048] Compare the current test signal returned by each channel with the standard current value to obtain the current deviation of each channel;

[0049] Determining whether the current deviation is within a set range;

[0050] If yes, it is considered qualified, if no, it is considered unqualified;

[0051] The testing of the card to be tested based on the voltage AO card testing process includes:

[0052] Input voltage detection signals to each channel of the card to be tested;

[0053] Read the voltage test signal returned by each channel after the test;

[0054] Compare the voltage test signal returned by each channel with the standard voltage value to obtain the voltage deviation of each channel;

[0055] Determining whether the voltage deviation is within a set range;

[0056] If yes, it is judged as qualified, if not, it is judged as unqualified.

[0057] In the automatic detection method of a nuclear power plant DCS system card component of the present invention, if the card component to be tested is a DI card component, the third test process is used to test the card component to be tested, including:

[0058] Increase the input resistance gradually according to the set step value;

[0059] During the enlargement process, the returned switch signal is read in real time;

[0060] Determining whether the switch signal is flipped;

[0061] If yes, stop increasing the input resistance and read the current resistance value; if no, continue to increase the input resistance;

[0062] Comparing the current resistance value with the standard resistance value to obtain a resistance deviation;

[0063] Determining whether the resistance deviation is within a set range;

[0064] If yes, it is judged as qualified, if not, it is judged as unqualified.

[0065] In the automatic detection method of a nuclear power plant DCS system card component of the present invention, if the card component to be tested is a DO card component, the fourth test process is used to test the card component to be tested, including:

[0066] Control DI input signal to be turned on once;

[0067] Control DI input signal to disconnect once;

[0068] Read the output voltage of the current card under test;

[0069] Comparing the output voltage with a standard voltage to obtain a voltage deviation;

[0070] Determining whether the voltage deviation is within a set range;

[0071] If yes, it is judged as qualified, if not, it is judged as unqualified.

[0072] The present invention also provides an automatic detection system for a nuclear power plant DCS system card, which is applied to the automatic detection method for a nuclear power plant DCS system card described above, and comprises: a DCS self-checking system, a minimum system and a dedicated computer;

[0073] The DCS self-checking system comprises: a current output module, a voltage output module, a programmable resistance module, a current measurement module, a voltage measurement module, a MOS on-off module, a plurality of switching switches and a plurality of external interfaces;

[0074] The multiple external interfaces are used to connect different types of cards to be tested; the multiple switches are used to switch corresponding channels according to the detection function; the current output module is used to output current signals; the voltage output module is used to output voltage signals; the programmable resistance module is used to output resistance signals; the current measurement module is used to measure current signals; the voltage measurement module is used to measure voltage signals; the MOS on-off simulation is used to control on-off signals;

[0075] The minimum system is used to perform analysis on the card to be tested;

[0076] The dedicated computer is used to read and display the information of the card to be tested during the testing process.

[0077] The automatic detection method and system of the card of the DCS system of a nuclear power plant implementing the present invention has the following beneficial effects: comprising the following steps: obtaining test information; reading the information of the card to be tested, and identifying the type of the card to be tested according to the information of the card to be tested; if the type of the card to be tested is an AI card, the first test process is used to test the card to be tested, and a test report is output; if the card to be tested is an AO card, the second test process is used to test the card to be tested, and a test report is output; if the card to be tested is a DI card, the third test process is used to test the card to be tested, and a test report is output; if the card to be tested is a DO card, the fourth test process is used to test the card to be tested, and a test report is output. The present invention can automatically detect the card to be tested, significantly improve efficiency, and reduce human risks. BRIEF DESCRIPTION OF THE DRAWINGS

[0078] The present invention will be further described below with reference to the accompanying drawings and embodiments, in which:

[0079] Figure 1 It is a flow chart of the automatic detection method of the card components of the DCS system of a nuclear power plant provided by the present invention;

[0080] Figure 2 It is a flow chart of a preferred embodiment of an automatic detection method for a nuclear power plant DCS system card provided by the present invention;

[0081] Figure 3 It is a principle block diagram of the automatic detection system of the nuclear power plant DCS system card provided by the present invention;

[0082] Figure 4 It is a connection diagram of the current AI / AO card provided by the present invention;

[0083] Figure 5 It is a connection diagram of the voltage AI / AO card provided by the present invention;

[0084] Figure 6 It is a connection diagram of the thermal resistance card provided by the present invention;

[0085] Figure 7 It is a connection diagram of the thermoelectric side card provided by the invention. DETAILED DESCRIPTION

[0086] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0087] In view of the problems existing in the testing of AI cards, AO cards, DI cards and DO cards of the existing DCS system, the present invention provides an automatic detection method and system for nuclear power plant DCS system cards, which can realize full-automatic detection of AI / AO / DI / DO cards, and does not require repeated disconnection of wiring during the detection process, and issues a detection report after the test is completed.

[0088] Specifically, refer to Figure 1 , Figure 1 The invention shows the automatic detection method of the card components of the DCS system of a nuclear power plant.

[0089] like Figure 1 As shown, the automatic detection method of the nuclear power plant DCS system card comprises the following steps:

[0090] Step S101: Acquire test information.

[0091] Specifically, Figure 2 As shown, when starting the test, first, the user inputs the test information of the card to be tested in the DCS self-test system 100, so that the system can obtain the test information of the card to be tested. The test information of the card to be tested includes: the type of the card to be tested and the number of channels. The types of the card to be tested include but are not limited to: AI card, AO card, DI card, DO card, etc.

[0092] Step S102: reading the information of the card to be tested, and identifying the type of the card to be tested according to the information of the card to be tested.

[0093] Specifically, after acquiring the test information of the card to be tested, the system can directly parse the test information of the card to be tested to obtain the type of the card to be tested.

[0094] Step S103: If the type of the card to be tested is an AI card, the card to be tested is tested using the first test process and a test report is output.

[0095] If the type of the card to be tested is an AI card, the first test process is used to test the card to be tested, including: identifying the subtype of the card to be tested; if the subtype of the card to be tested is a current card, the card to be tested is tested based on the current AI card test process; if the subtype of the card to be tested is a voltage card, the card to be tested is tested based on the voltage AI card test process; if the subtype of the card to be tested is a thermistor card, the card to be tested is tested based on the thermistor card test process; if the subtype of the card to be tested is a thermocouple card, the card to be tested is tested based on the thermocouple card test process.

[0096] In an embodiment of the present invention, if the subtype of the card to be tested is a current card, testing the card to be tested based on the current AI card test process includes: inputting a current detection signal to each channel of the card to be tested; reading the current test signal returned by each channel after the test; comparing the current test signal returned by each channel with the standard current value to obtain the current deviation of each channel; judging whether the current deviation is within a set range; if so, judging it as qualified, if not, judging it as unqualified.

[0097] In the embodiment of the present invention, if the subtype of the card to be tested is a voltage card, testing the card to be tested based on the voltage AI card test process includes: inputting a voltage detection signal to each channel of the card to be tested;

[0098] Read the voltage test signal returned by each channel after the test;

[0099] The voltage test signal returned by each channel is compared with the standard voltage value to obtain the voltage deviation of each channel; determine whether the voltage deviation is within the set range; if so, it is judged to be qualified, otherwise, it is judged to be unqualified.

[0100] In an embodiment of the present invention, if the subtype of the card to be tested is a thermistor card, testing the card to be tested based on the thermistor card test process includes: outputting a resistance detection signal to each channel of the card to be tested; reading the resistance test signal returned by each channel after the test; comparing the resistance test signal returned by each channel with the standard resistance value to obtain the resistance deviation of each channel; judging whether the resistance deviation is within a set range; if so, judging it as qualified, if not, judging it as unqualified.

[0101] In an embodiment of the present invention, if the subtype of the card to be tested is a thermocouple card, testing the card to be tested based on the thermocouple card test process includes: outputting thermocouple detection signals to each channel of the card to be tested; reading feedback test signals returned by each channel after the test; comparing the feedback test signals returned by each channel with the standard value to obtain the feedback deviation of each channel; judging whether the feedback deviation is within a set range; if so, judging it as qualified, if not, judging it as unqualified.

[0102] Specifically, Figure 2As shown, if the card to be tested is identified as an AI card, its subtype is further identified. If the subtype of the card to be tested is a current card, a current detection signal (i.e., a current signal with an input range of 4 to 20 mA) is generated by the DCS self-test system 100 to each channel of the current AI card, and then the current test signal (i.e., a current signal of 4 to 20 mA) is read back from the standard AO card. The system automatically records the current output at each point of 4 / 8 / 12 / 16 / 20 mA of each channel of the current AI card, and the current returned at each point of 4 / 8 / 12 / 16 / 20 mA of each channel of the standard AO card, and compares them respectively to obtain the current deviation at each point. If the current deviation at each point of each channel is within the set range, the channel is judged to be qualified, otherwise the channel is judged to be unqualified, and a corresponding report is issued at the same time, that is, if qualified, a qualified report appears, and if unqualified, an unqualified report is issued.

[0103] If it is not a current card, determine whether the subtype of the card to be tested is a voltage card. If the subtype of the card to be tested is a voltage card, the DCS self-test system 100 generates a voltage detection signal (i.e., a voltage signal with an input range of 0 to 24V) to each channel of the voltage AI card, and then reads back the voltage test signal (i.e., a voltage signal of 0 to 24V) from the standard AI card. The system automatically records the voltage output at each point of 0 / 6 / 12 / 18 / 24V of each channel of the voltage AI card, and the voltage returned at each point of 0 / 6 / 12 / 18 / 24V of each channel of the standard AI card, and compares them respectively to obtain the voltage deviation at each point. If the voltage deviation at each point of each channel is within the set range, the channel is judged to be qualified, otherwise the channel is judged to be unqualified, and a corresponding report is issued at the same time, that is, if it is qualified, a qualified report appears, and if it is unqualified, an unqualified report is issued.

[0104] If it is not a voltage card, determine whether the subtype of the card to be tested is a thermal resistor card. If the subtype of the card to be tested is a thermal resistor card, the DCS self-test system 100 generates a resistance detection signal (i.e., outputs 100-157Ω) to each channel of the thermal resistor card, and then reads back the resistance test signal (i.e., 100-157Ω) from the standard AO card. The system automatically records the voltage returned at each point of each channel of the thermal resistor card, and calculates the corresponding resistance deviation based on the resistance / voltage at each point. If the resistance deviation at each point of each channel is within the set range, the channel is judged to be qualified, otherwise the channel is judged to be unqualified, and a corresponding report is issued at the same time, that is, if qualified, a qualified report appears, and if unqualified, an unqualified report is issued.

[0105] If it is not a thermal resistor card, determine whether the subtype of the card to be tested is a thermocouple card. If the subtype of the card to be tested is a thermocouple card, the DCS self-test system 100 generates a thermocouple detection signal (i.e., outputs -6.5-55mV) to each channel of the thermocouple card, and then reads back the feedback test signal (e.g., a 0-24V voltage signal) from the standard AO card. The system automatically records the voltage returned at each point of each channel of the thermal resistor card, and obtains the corresponding feedback deviation based on the thermocouple / voltage conversion calculation at each point. If the feedback deviation at each point of each channel is within the set range, the channel is judged to be qualified, otherwise the channel is judged to be unqualified, and a corresponding report is issued at the same time, that is, if qualified, a qualified report appears, and if unqualified, an unqualified report is issued.

[0106] Step S104: If the card to be tested is an AO card, the second test process is used to test the card to be tested, and a test report is output.

[0107] In an embodiment of the present invention, if the card to be tested is an AO card, the second test process is used to test the card to be tested, including: identifying the subtype of the card to be tested; if the subtype of the card to be tested is a current card, the card to be tested is tested based on the current AO card test process; if the subtype of the card to be tested is a voltage card, the card to be tested is tested based on the voltage AO card test process.

[0108] Among them, testing the card to be tested based on the current AO card test process includes: inputting current detection signals to each channel of the card to be tested; reading the current test signals returned by each channel after the test; comparing the current test signals returned by each channel with the standard current value to obtain the current deviation of each channel; judging whether the current deviation is within the set range; if so, judging it as qualified, if not, judging it as unqualified;

[0109] Testing the card to be tested based on the voltage AO card test process includes: inputting voltage detection signals to each channel of the card to be tested; reading the voltage test signals returned by each channel after the test; comparing the voltage test signals returned by each channel with the standard voltage value to obtain the voltage deviation of each channel; judging whether the voltage deviation is within the set range; if so, judging it as qualified, if not, judging it as unqualified.

[0110] Specifically, Figure 2As shown, if the card to be tested is an AO card, and its subtype is a current card, a current detection signal (i.e., a current signal with an input range of 4 to 20 mA) is generated by the DCS self-test system 100 to each channel of the current AO card, and then the current test signal (i.e., a current signal of 4 to 20 mA) is read back from the standard AI card. The system automatically records the current output at each point of 4 / 8 / 12 / 16 / 20 mA of each channel of the current AO card, and the current returned at each point of 4 / 8 / 12 / 16 / 20 mA of each channel of the standard AI card, and compares them respectively to obtain the current deviation at each point. If the current deviation at each point of each channel is within the set range, the channel is judged to be qualified, otherwise the channel is judged to be unqualified, and a corresponding report is issued at the same time, that is, if it is qualified, a qualified report appears, and if it is unqualified, an unqualified report is issued.

[0111] If the card to be tested is an AO card, and its subtype is a voltage card, a voltage detection signal (i.e., a voltage signal with an input range of 0 to 24V) is generated to each channel of the current AO card through the DCS self-test system 100, and then the voltage test signal (i.e., a voltage signal of 0 to 24V) is read back from the standard AI card. The system automatically records the voltage output at each point of 0 / 6 / 12 / 18 / 24V of each channel of the voltage AO card, and the voltage returned at each point of 0 / 6 / 12 / 18 / 24V of each channel of the standard AI card, and compares them respectively to obtain the voltage deviation at each point. If the voltage deviation at each point of each channel is within the set range, the channel is judged to be qualified, otherwise the channel is judged to be unqualified, and a corresponding report is issued at the same time, that is, if qualified, a qualified report appears, and if unqualified, an unqualified report is issued.

[0112] Step S105: If the card to be tested is a DI card, the third test process is used to test the card to be tested, and a test report is output.

[0113] In an embodiment of the present invention, if the card to be tested is a DI card, the third test process is used to test the card to be tested, including: gradually increasing the input resistance according to the set step value; during the increase process, reading the returned switch signal in real time; judging whether the switch signal is flipped; if so, stopping increasing the input resistance and reading the current resistance value; if not, continuing to increase the input resistance; comparing the current resistance value with the standard resistance value to obtain the resistance deviation; judging whether the resistance deviation is within the set range; if so, judging it as qualified, if not, judging it as unqualified.

[0114] Specifically, Figure 2As shown, if the card to be tested is a DI card, the resistance is slowly increased with the set step value, and the returned switch signal is monitored in real time to determine whether the returned switch signal is flipped. If it is flipped, the resistance is stopped, and the current resistance value (that is, the resistance value when the switch signal is flipped) is read, and it is determined whether the current resistance value is within the required range. If it is within the required range, the current channel of the card to be tested is judged to be qualified, otherwise it is judged to be unqualified. Other channels are automatically detected in turn, and finally the test process data is automatically integrated and a test report is issued.

[0115] Step S106: If the card to be tested is a DO card, the fourth test process is used to test the card to be tested, and a test report is output.

[0116] In an embodiment of the present invention, if the card to be tested is a DO card, the fourth test process is used to test the card to be tested, including: controlling the DI input signal to be turned on once; controlling the DI input signal to be turned off once; reading the output voltage of the current card to be tested; comparing the output voltage with the standard voltage to obtain the voltage deviation; judging whether the voltage deviation is within the set range; if so, judging it as qualified, if not, judging it as unqualified.

[0117] Specifically, Figure 2 As shown, if the card to be tested is a DO card, the DI input signal is controlled to be on and off once, and the output voltage of the DO card is recorded in a loop, and its voltage value is judged to be within the required range. If it is within the required range, the channel of the DO card is judged to be qualified, otherwise it is judged to be unqualified. Other channels are automatically detected in turn, and finally the test process data is automatically integrated and a test report is issued.

[0118] refer to Figure 3 , Figure 3 The automatic detection system for a nuclear power plant DCS system card component provided by the present invention can be applied to the automatic detection method for a nuclear power plant DCS system card component disclosed in an embodiment of the present invention.

[0119] Specifically, Figure 3 As shown, the automatic detection system of the DCS system card of the nuclear power plant includes: a DCS self-checking system 100, a minimum system 200 and a special computer 300.

[0120] Among them, the DCS self-test system 100 can realize automatic testing of the card to be tested and issue a test report. The minimum system 200 is used to analyze and process the card to be tested; the dedicated computer 300 is used to read and display the information of the card to be tested during the test process. It should be noted that the minimum system 200 and the dedicated computer 300 are commonly used systems / components in the AI / AO / DI / DO card testing of the DCS system in nuclear power plants. Their working principles and functions are the same as those of the existing ones, and the present invention does not make specific limitations.

[0121] In the embodiment of the present invention, the DCS self-checking system 100 includes: a current output module, a voltage output module, a programmable resistance module, a current measurement module, a voltage measurement module, a MOS on-off module, a plurality of switching switches and a plurality of external interfaces.

[0122] Multiple external interfaces are used to connect different types of cards to be tested; multiple switches are used to switch corresponding channels according to the detection function; the current output module is used to output current signals; the voltage output module is used to output voltage signals; the programmable resistance module is used to output resistance signals; the current measurement module is used to measure current signals; the voltage measurement module is used to measure voltage signals; and the MOS on-off simulation is used to control on-off signals. It should be noted that different types of cards to be tested are directly installed in the minimum system 200, and the DCS self-test system 100 of the present invention is connected to the cards to be tested installed in the minimum system 200 through its external interface.

[0123] Specifically, Figure 3 As shown, the DCS self-test system 100 is provided with 8 external interfaces, which are used for current AI card, voltage AI card, thermal resistor card, thermocouple card, current AO card, voltage AO card, DI card and DO card respectively. There are 4 switching switches inside, and these 4 switching switches can switch the corresponding channels according to the input detection function. Among them, switching switch 1: when measuring the voltage AI card, the left side and the upper right side are connected, and when measuring the thermocouple card, the left side and the lower right side are connected. Switching switch 2: when measuring the thermal resistor card, the left side and the upper right side are connected, and when measuring the DI card, the left side and the lower right side are connected. Switching switch 3: when measuring the voltage AO card, the left side and the upper right side are connected, and when measuring the DO card, the left side and the lower right side are connected. Switching switch 4: when measuring the DI card, the upper left side and the right side are connected, and when measuring the DO card, the lower left side and the right side are connected.

[0124] Furthermore, if Figure 3 As shown, the DCS self-checking system 100 further includes: a display unit. The display unit is used to output and display the test information during the self-checking process of the DCS self-checking system 100, and output a test report.

[0125] The following describes the tests for different types of cards.

[0126] Specifically, refer to Figure 4 , Figure 4 This is a connection diagram for the current AI / AO card.

[0127] Current AI card test process (taking the current range of 4-20mA as an example): Install the AI ​​card to be tested and the standard AO card in the minimum system 200, and set the DCS self-test system 100 to automatically test the current AI card. The self-test system sends a 4-20mA DC signal to each channel of the AI ​​card, and reads back the 4-20mA signal from the AO card. The DCS self-test system 100 automatically compares the output and return current at each point of 4 / 8 / 12 / 16 / 20mA. If the deviation of each point is within the required range, the channel is judged to be qualified, otherwise it is judged to be unqualified. Finally, the test process data is automatically integrated and a test report is issued.

[0128] Current AO card test process (for example, current range 4-20mA): Install the standard AI card and the AO card to be tested in the minimum system 200, and set the DCS self-test system 100 to automatically test the current AO card. The DCS self-test system 100 sends a 4-20mA DC signal to each channel of the AI ​​card, and reads back the 4-20mA signal from the AO card. The DCS self-test system 100 automatically compares the output and return current at each point of 4 / 8 / 12 / 16 / 20mA. If the deviation of each point is within the required range, the channel is judged to be qualified, otherwise it is judged to be unqualified. Finally, the test process data is automatically integrated and a test report is issued.

[0129] The test process of voltage AI / AO card (e.g. current range 4-24V) is the same as that of current AI / AO card, except that the current signal is changed to voltage signal. For the card connection diagram, please refer to Figure 5 .

[0130] refer to Figure 6 , Figure 6 This is the connection diagram of the thermal resistance card.

[0131] Thermal resistor test process (e.g. resistance range 100-157Ω, temperature range 0-150℃): Install the tested thermal resistor card and standard AO card in the minimum system 200, and set the DCS self-test system 100 to automatically test the thermal resistor card. The DCS self-test system 100 sends 100-157Ω to each channel of the thermal resistor card, and reads back the voltage signal (e.g. 0-24V) from the AO card. The DCS self-test system 100 automatically compares the returned voltage at each point. If the deviation of each point is within the required range, the channel is judged to be qualified, otherwise it is judged to be unqualified. Finally, the test process data is automatically integrated and a test report is issued.

[0132] Here, the input signal is resistance, the signal read by the minimum system 200 is temperature, and the output signal of the minimum system 200 (also the test system readback signal) is voltage. Data conversion needs to be performed inside the minimum system 200. For example, the relationship between temperature t and resistance R is T = aR + b, the relationship between voltage U and temperature is U = f(t), and the relationship between U and R is U = f(aR + b). Among them, a and b are coefficients. Deviation = theoretical voltage value - actual voltage value.

[0133] refer to Figure 7 , Figure 7 This is the connection diagram of the thermal resistance card.

[0134] Thermocouple test process (e.g. voltage range -6.5-55mV, temperature range -270-1370℃): Install the thermocouple card to be tested and the standard AO card in the minimum system 200, and set the DCS self-test system 100 to automatically test the thermocouple card. The DCS self-test system 100 sends -6.5-55mV to each channel of the thermocouple card, and reads back the voltage signal (e.g. 0-24V) from the AO card. The DCS self-test system 100 automatically compares the returned voltage at each point. If the deviation of each point is within the required range, the channel is judged to be qualified, otherwise it is judged to be unqualified. Finally, the test process data is automatically integrated and a test report is issued.

[0135] Here, the input signal is micro voltage, the signal read by the minimum system 200 is temperature, and the output signal of the minimum system 200 (also the test system readback signal) is voltage. Data conversion needs to be performed inside the minimum system 200. For example, the corresponding relationship between micro voltage and temperature is obtained according to the thermocouple graduation table, which is used to know the theoretical display temperature value. The readback voltage and temperature are set to a linear relationship, and the theoretical value of the readback voltage can be deduced. Deviation = theoretical voltage value - actual voltage value.

[0136] DI card test process: Install the DI card to be tested and the standard DO card in the minimum system 200, and set the DI card automatic test in the DCS self-test system 100. Slowly increase the resistance from 0Ω, read the resistance value when the readback switch value reverses, and confirm that the resistance value is within the required range to judge that this card and this channel have passed the test, otherwise it is judged to be unqualified. Automatically detect other channels in turn, and finally automatically integrate the test process data to issue a test report.

[0137] DO card test process: Install the standard DI card and the DO card to be tested in the minimum system 200, and set the DO card automatic test in the DCS self-test system 100. The DI input signal is turned on and off once, and the DO card output voltage is read back and recorded. If the voltage value is within the required range, the card and this channel are judged to be qualified, otherwise it is judged to be unqualified. Other channels are automatically tested in turn, and the test process data is automatically integrated to issue a test report.

[0138] In this specification, each embodiment is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part.

[0139] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0140] The steps of the method or algorithm described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), a memory, a read-only memory (ROM), an electrically programmable ROM, an electrically erasable programmable ROM, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0141] The above embodiments are only for illustrating the technical concept and features of the present invention, and their purpose is to enable people familiar with the technology to understand the content of the present invention and implement it accordingly, and they cannot limit the scope of protection of the present invention. All equivalent changes and modifications made to the scope of the claims of the present invention should fall within the scope of the claims of the present invention.

Claims

1. A method for automatically detecting card components of a nuclear power plant DCS system, characterized in that: The following steps are involved: Get test information; Read the information of the card to be tested, and identify the type of the card to be tested according to the information of the card to be tested; If the type of the card to be tested is an AI card, the card to be tested is tested using the first test process and a test report is output; If the card to be tested is an AO card, the second test process is used to test the card to be tested, and a test report is output; If the card to be tested is a DI card, the card to be tested is tested using a third test process and a test report is output; If the card to be tested is a DO card, the fourth test process is used to test the card to be tested and a test report is output.

2. The automatic detection method of the DCS system card of a nuclear power plant according to claim 1 is characterized in that: If the type of the card to be tested is an AI card, using the first test process to test the card to be tested includes: Identify the subtype of the card to be tested; If the subtype of the card to be tested is a current card, the card to be tested is tested based on the current AI card test process; If the subtype of the card to be tested is a voltage card, the card to be tested is tested based on the voltage AI card test process; If the subtype of the card to be tested is a thermal resistor card, the card to be tested is tested based on the thermal resistor card test process; If the subtype of the card to be tested is a thermocouple card, the card to be tested is tested based on a thermocouple card test process.

3. The automatic detection method of the DCS system card of a nuclear power plant according to claim 2 is characterized in that: If the subtype of the card to be tested is a current card, testing the card to be tested based on the current AI card test process includes: Inputting current detection signals to each channel of the card to be tested; Read the current test signal returned by each channel after the test; Compare the current test signal returned by each channel with the standard current value to obtain the current deviation of each channel; Determining whether the current deviation is within a set range; If yes, it is judged as qualified, if not, it is judged as unqualified.

4. The automatic detection method for DCS system cards of a nuclear power plant according to claim 2, characterized in that: If the subtype of the card to be tested is a voltage card, testing the card to be tested based on the voltage AI card test process includes: Input voltage detection signals to each channel of the card to be tested; Read the voltage test signal returned by each channel after the test; Compare the voltage test signal returned by each channel with the standard voltage value to obtain the voltage deviation of each channel; Determining whether the voltage deviation is within a set range; If yes, it is judged as qualified, if not, it is judged as unqualified.

5. The automatic detection method of the nuclear power plant DCS system card according to claim 2 is characterized in that: If the subtype of the card to be tested is a thermal resistor card, testing the card to be tested based on the thermal resistor card test process includes: Outputting resistance detection signals to each channel of the card to be tested; Read the resistance test signal returned by each channel after the test; Compare the resistance test signal returned by each channel with the standard resistance value to obtain the resistance deviation of each channel; Determining whether the resistance deviation is within a set range; If yes, it is judged as qualified, if not, it is judged as unqualified.

6. The automatic detection method of the DCS system card of a nuclear power plant according to claim 1 is characterized in that: If the subtype of the card to be tested is a thermocouple card, testing the card to be tested based on the thermocouple card test process includes: Outputting thermocouple detection signals to each channel of the card to be tested; Read the feedback test signal returned by each channel after the test; Compare the feedback test signal returned by each channel with the standard value to obtain the feedback deviation of each channel; Determining whether the feedback deviation is within a set range; If yes, it is judged as qualified, if not, it is judged as unqualified.

7. The automatic detection method for DCS system cards of a nuclear power plant according to claim 1, characterized in that: If the card to be tested is an AO card, the second test process is used to test the card to be tested, including: Identify the subtype of the card to be tested; If the subtype of the card to be tested is a current card, the card to be tested is tested based on the current AO card test process; If the subtype of the card to be tested is a voltage card, the card to be tested is tested based on the voltage AO card test process; The testing of the card to be tested based on the current AO card testing process includes: Inputting current detection signals to each channel of the card to be tested; Read the current test signal returned by each channel after the test; Compare the current test signal returned by each channel with the standard current value to obtain the current deviation of each channel; Determining whether the current deviation is within a set range; If yes, it is considered qualified, if no, it is considered unqualified; The testing of the card to be tested based on the voltage AO card testing process includes: Input voltage detection signals to each channel of the card to be tested; Read the voltage test signal returned by each channel after the test; Compare the voltage test signal returned by each channel with the standard voltage value to obtain the voltage deviation of each channel; Determining whether the voltage deviation is within a set range; If yes, it is judged as qualified, if not, it is judged as unqualified.

8. The automatic detection method for DCS system cards of a nuclear power plant according to claim 1, characterized in that: If the card to be tested is a DI card, the third test process is used to test the card to be tested, including: Increase the input resistance gradually according to the set step value; During the enlargement process, the returned switch signal is read in real time; Determining whether the switch signal is flipped; If yes, stop increasing the input resistance and read the current resistance value; if no, continue to increase the input resistance; Comparing the current resistance value with the standard resistance value to obtain a resistance deviation; Determining whether the resistance deviation is within a set range; If yes, it is judged as qualified, if not, it is judged as unqualified.

9. The automatic detection method for DCS system cards of a nuclear power plant according to claim 1, characterized in that: If the card to be tested is a DO card, the fourth test process is used to test the card to be tested, including: Control DI input signal to be turned on once; Control DI input signal to disconnect once; Read the output voltage of the current card under test; Comparing the output voltage with a standard voltage to obtain a voltage deviation; Determining whether the voltage deviation is within a set range; If yes, it is judged as qualified, if not, it is judged as unqualified.

10. An automatic detection system for a DCS card of a nuclear power plant, applied to the automatic detection method for a DCS card of a nuclear power plant according to any one of claims 1 to 9, characterized in that: include: DCS self-check system, minimum system and dedicated computer; The DCS self-checking system comprises: a current output module, a voltage output module, a programmable resistance module, a current measurement module, a voltage measurement module, a MOS on-off module, a plurality of switching switches and a plurality of external interfaces; The multiple external interfaces are used to connect different types of cards to be tested; the multiple switches are used to switch corresponding channels according to the detection function; the current output module is used to output current signals; the voltage output module is used to output voltage signals; the programmable resistance module is used to output resistance signals; the current measurement module is used to measure current signals; the voltage measurement module is used to measure voltage signals; The MOS on-off simulation is used to control the on-off signal; The minimum system is used to perform analysis processing on the card to be tested; The dedicated computer is used to read and display the information of the card to be tested during the testing process.

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