Chip testing device and testing method

Abstract

The invention relates to the technical field of chip detection, in particular to a chip testing device and method, and the device comprises an operation table, a conveying assembly, a control box, a lifting drive part, a rotation drive assembly, a guide plate, and a transmission assembly. A turntable is rotationally arranged on the operating table, a plurality of placing grooves are formed in the turntable, and supporting plates are arranged in the placing grooves. The two conveying assemblies are both arranged on the operation table. The control box is connected with the detection probe and movably connected with the movable plate, and the movable plate is connected with the conductive mother board. The lifting driving piece drives the movable plate to lift. The rotation driving assembly drives the turntable to rotate. The guide plate is connected with the movable plate, two sliding seats are symmetrically arranged on the guide plate, and suckers are arranged at the bottoms of the sliding seats and communicated with an air pump. The transmission assembly is in transmission connection with the rotating disc and the sliding seats so as to drive the sliding seats on the two sides to synchronously reciprocate in the rotating state of the rotating disc. Automatic feeding and discharging are achieved while the station where the chip is located is replaced, all the actions are coordinated, energy consumption is reduced, and the detection efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of chip detection, and in particular to a chip testing device and a chip testing method. Background Art

[0002] A chip generally refers to the carrier of an integrated circuit, and is also the result of the design, manufacture, packaging, and testing of an integrated circuit. It is usually an independent entity that can be used immediately. A chip, also known as a microcircuit, microchip, or integrated circuit, refers to a silicon wafer containing an integrated circuit. It is very small and is often part of a computer or other electronic device. Chips need to be rigorously tested before leaving the factory. Existing chip tests mainly include packaging testing and power-on testing, which are mostly two sets of equipment working independently, and are inefficient.

[0003] The technical solution disclosed in the Chinese patent with authorization announcement number CN116705671B realizes the adsorption and fixation of the chip through the adsorption component, which is convenient for the movement of the chip, and ensures the adsorption of the adsorption component and the chip through the negative pressure in the vacuum chamber, ensuring the stability of the adsorption; the unloading component and the rotating component are coordinated with the gear to drive the rotation of the adsorption component, thereby facilitating the rotation of the chip, and the adsorption component is exhausted when the adsorption component rotates, thereby facilitating the unloading of the adsorption component and the detection of the chip.

[0004] However, the device still has some shortcomings: when the device is actually working, it needs to adjust the coordinated operation of separate structures such as the robotic arm, adsorption component, conveying component, and downward pressure component, which is time-consuming and labor-intensive, and consumes a lot of electricity. At the same time, the device lacks detection of chip packaging integrity and internal structural defects. Summary of the invention

[0005] The purpose of the present invention is to provide a chip testing device and a testing method in view of the problems existing in the background technology.

[0006] The technical solution of the present invention: On the one hand, the present invention proposes a chip testing device, including an operating table, a turntable rotatably connected to the operating table is centrally arranged, a plurality of placement grooves are arranged in a circular array around the axis of the turntable, and a support plate is arranged in the placement groove.

[0007] Conveying components, two sets of conveying components are arranged on the operating table.

[0008] A control box is connected with the operating table, the control box is connected with the detection probe, the control box is movably connected with the movable plate, and the movable plate is connected with the conductive motherboard.

[0009] The lifting drive component is connected with the control box and drives the movable plate and the conductive mother plate to lift.

[0010] The rotary drive assembly is connected with the operating table and drives the turntable to rotate so that each placement slot passes under the detection probe and the conductive motherboard in sequence.

[0011] The guide plate is integrally connected with the movable plate, two slide seats are symmetrically arranged on the guide plate about the center of the turntable, a suction cup is arranged at the bottom of the slide seat, and an air pump connected to the suction cup is arranged on the slide seat.

[0012] And a transmission component, which is connected to the turntable and the slide, so as to drive the slides on both sides to move back and forth synchronously when the turntable rotates, and then the chip to be tested is sucked from the conveying component on one side by the suction cup on one side and placed in the placement groove on the corresponding side, and the chip that has been tested is taken out from the corresponding placement groove by the suction cup on the other side and placed on the conveying component on the other side.

[0013] Preferably, a circular groove is centrally arranged on the operating table, the turntable is arranged in the circular groove and fits with its inner wall, two feeding troughs are symmetrically arranged on the operating table about the center of the circular groove, and the two groups of conveying components are respectively located in the feeding troughs on the corresponding sides.

[0014] Preferably, the conveying assembly includes a drive roller, a conveyor belt, a toothed belt and a motor A. Two drive rollers are arranged in parallel in each feed trough. The two drive rollers in the same feed trough are connected by a conveyor belt transmission. Two adjacent drive rollers in the feed troughs on both sides are coaxially connected to a pulley, and the pulleys on both sides are connected by a toothed belt transmission. The body of the motor A is connected to the operating table, and the output end of the motor A is connected to the roller shaft of one of the drive rollers.

[0015] Preferably, a pressure cover for closing the circular groove is provided on the operating table, and the upper end surface of the turntable is rotatably connected to the pressure cover. A loading station, an inspection station A, an inspection station B and an unloading station are sequentially arranged on the pressure cover along the rotation direction of the turntable, wherein the loading station and the unloading station correspond to the feeding troughs on the corresponding sides respectively, and the loading station, the inspection station A, the inspection station B and the unloading station correspond to a placement slot respectively.

[0016] Preferably, the rotary drive assembly includes a motor B, a body of the motor B is connected to the operating table, and an output end of the motor B is coaxially connected to the turntable.

[0017] Preferably, the transmission assembly includes a reciprocating screw, a spline shaft, a hollow shaft, a gear A and a gear B. A slide groove is provided on the guide plate, two reciprocating screws are coaxially connected and arranged in the slide groove, the reciprocating screw is rotatably connected to the guide plate, a slide seat is inserted into the slide groove and slidably connected to its inner wall, and the shuttles on the reciprocating screws on both sides are respectively connected to the slide seats on the corresponding sides. The spline shaft is rotatably connected to the guide plate, and a bevel gear is respectively provided on the spline shaft and the reciprocating screw, and the two bevel gears are meshed. The hollow shaft sleeve is arranged on the outside of the spline shaft and slides along its radial direction, the hollow shaft is rotatably connected to the operating table, and the hollow shaft is coaxially connected to gear A. The central shaft is coaxially connected to the turntable, gear B is coaxially connected to the central shaft, and gear B is meshed with gear A.

[0018] Preferably, the detection probe is an X-ray probe, and a controller electrically connected to the X-ray probe is provided in the control box.

[0019] On the other hand, the present invention also provides a chip testing method based on the above chip testing device, comprising the following steps:

[0020] S1. Use the conveying assembly at the feeding end of the operating table to convey the chips to be tested one by one.

[0021] S2. The rotary drive assembly drives the turntable to rotate and rotates the empty placement slot to the conveying assembly close to the feed end. At the same time, the transmission assembly cooperates with the lifting drive assembly and the air pump to transfer the chip to be tested to the placement slot through the suction cup.

[0022] S3. The rotary drive assembly drives the turntable to rotate intermittently and continuously to push the chip to be tested to the bottom of the detection probe while loading the material. The detection probe scans its packaging and internal structure.

[0023] S4, the rotating drive assembly continues to move, and while loading, the chip detected by the detection probe is transferred to the bottom of the conductive motherboard. At this time, the suction cups on both sides are kept in a low position, the conductive motherboard is lowered to a low position, and the chip is powered on for detection.

[0024] S5. The rotating drive assembly continues to move, the suction cup on the feeding side keeps loading the material, and the suction cup on the discharging side transfers the tested chips to the conveying assembly on the discharging side.

[0025] Compared with the prior art, the present invention has the following beneficial technical effects:

[0026] 1. By setting up a turntable, the placement slots are switched cyclically by using the rotating turntable, so as to realize automatic loading, packaging inspection, power-on inspection and unloading at different stations at the same time;

[0027] 2. By setting up the transmission component, suction cup, and the matching structure of the air pump and hydraulic cylinder, the transmission component is connected to the turntable and the slide. Every time the turntable changes the placement slot, the slides on both sides synchronously complete a complete set of reciprocating movements. While completing the reciprocating movement, the chips are grabbed from the conveyor belt on the feeding side and placed in the placement slot corresponding to the loading station. At the same time, the chips on the unloading station are transferred to the conveyor belt on the discharge side. The equipment has high operating efficiency, low overall power consumption, and simple parameter adjustment. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a structural schematic diagram of an embodiment of the present invention;

[0029] Figure 2 It is a structural schematic diagram of the conveying mechanism;

[0030] Figure 3 It is a schematic diagram of the connection structure between the operating table, the turntable and the gland;

[0031] Figure 4 It is a schematic diagram of the connection structure of various components on the turntable;

[0032] Figure 5 It is a schematic diagram of the connection structure of various components on the control box;

[0033] Figure 6 It is a schematic diagram of the connection structure of various components on the movable plate;

[0034] Figure 7 The figure is a flow chart of the chip testing method of the present invention.

[0035] Figure numerals: 1. operating table; 101. circular groove; 102. feeding trough; 2. driving roller; 3. conveyor belt; 4. pulley; 5. toothed belt; 6. motor A; 7. turntable; 71. placement groove; 8. support plate; 9. center axis; 10. motor B; 11. pressure cover; 111. loading station; 112. unloading station; 113. detection station A; 114. detection station B; 12. control box; 13. detection probe; 14. movable plate; 15. spring rod; 16. conductive motherboard; 17. hydraulic cylinder; 18. guide plate; 19. slide seat; 20. suction cup; 21. air pump; 22. reciprocating screw; 23. spline shaft; 24. bevel gear; 25. hollow shaft; 26. gear A; 27. gear B. DETAILED DESCRIPTION

[0036] Embodiment 1

[0037] like Figure 1-Figure 6As shown, a chip testing device proposed by the present invention includes an operating table 1, a conveying assembly, a control box 12, a lifting drive, a rotating drive assembly, a guide plate 18 and a transmission assembly. A turntable 7 rotatably connected to the operating table 1 is centrally arranged, and six placement grooves 71 are arranged in a ring array around the axis of the turntable 7, and a support plate 8 is arranged in the placement groove 71. Two groups of conveying assemblies are arranged on the operating table 1. A circular groove 101 is centrally arranged on the operating table 1, and the turntable 7 is arranged in the circular groove 101 and fits with the inner wall thereof. Two feeding grooves 102 are symmetrically arranged on the operating table 1 about the center of the circular groove 101, and the two groups of conveying assemblies are respectively located in the feeding grooves 102 on the corresponding sides. The conveying assembly includes a transmission roller 2, a conveyor belt 3, a toothed belt 5 and a motor A6. Two transmission rollers 2 are arranged in parallel in each feed trough 102. The two transmission rollers 2 in the same feed trough 102 are connected by a conveyor belt 3. Two adjacent transmission rollers 2 in the feed troughs 102 on both sides are coaxially connected to a pulley 4, and the pulleys 4 on both sides are connected by a toothed belt 5. The body of the motor A6 is connected to the operating table 1, and the output end of the motor A6 is connected to the roller shaft of one of the transmission rollers 2. A pressure cover 11 for closing the circular groove 101 is provided on the operating table 1, and the upper end surface of the turntable 7 is rotatably connected to the pressure cover 11. A loading station 111, a detection station A113, a detection station B114 and a material unloading station 112 are sequentially provided on the pressure cover 11 along the rotation direction of the turntable 7, wherein the loading station 111 and the material unloading station 112 correspond to the feeding slot 102 on the corresponding side, respectively, and the loading station 111, the detection station A113, the detection station B114 and the material unloading station 112 are respectively connected to a placement slot 71. The control box 12 is connected to the operating table 1, and a display screen is provided on the control box 12, and the display screen is a touch screen, and an indicator light for displaying the current state of the detected chip is provided on the control box 12, and the indicator light includes a green light representing a normal state and a red light representing an abnormal state. The control box 12 is connected to the detection probe 13, and the control box 12 is movably connected to the movable plate 14, and the movable plate 14 is connected to the spring rod 15, and the spring rod 15 is connected to the conductive motherboard 16. The lifting drive includes but is not limited to the hydraulic cylinder 17, the body of the hydraulic cylinder 17 is connected to the control box 12, the push rod of the hydraulic cylinder 17 is connected to the movable plate 14, and the hydraulic cylinder 17 is connected to the hydraulic oil pump to drive the movable plate 14 and the conductive motherboard 16 to rise and fall through the hydraulic cylinder 17. The rotation drive assembly is connected to the operating table 1 and drives the turntable 7 to rotate so that each placement slot 71 passes under the detection probe 13 and the conductive motherboard 16 in sequence. The guide plate 18 is integrally connected to the movable plate 14, and two slides 19 are symmetrically arranged on the guide plate 18 about the center of the turntable 7, and a suction cup 20 is arranged at the bottom of the slide 19, and an air pump 21 connected to the suction cup 20 is arranged on the slide 19. The transmission assembly includes a reciprocating screw 22, a spline shaft 23, a hollow shaft 25, a gear A26 and a gear B27.A slide groove is provided on the guide plate 18, two reciprocating screw rods 22 are coaxially connected and arranged in the slide groove, the reciprocating screw rod 22 is rotatably connected to the guide plate 18, the slide seat 19 is inserted into the slide groove and slidably connected to its inner wall, and the shuttles on the reciprocating screw rods 22 on both sides are respectively connected to the slide seats 19 on the corresponding sides. The spline shaft 23 is rotatably connected to the guide plate 18, and a bevel gear 24 is respectively provided on the spline shaft 23 and the reciprocating screw rod 22, and the two bevel gears 24 are meshed. The hollow shaft 25 is sleeved on the outside of the spline shaft 23 and slides along its radial direction, the hollow shaft 25 is rotatably connected to the operating table 1, and the hollow shaft 25 is coaxially connected to the gear A26. The central shaft 9 is coaxially connected to the turntable 7, the gear B27 is coaxially connected to the central shaft 9, and the gear B27 is meshed with the gear A26. When the turntable 7 rotates 60 degrees, the slides 19 on both sides just complete a set of reciprocating movements, and then the chip to be tested is sucked from the conveying component on one side through the suction cup 20 on one side and placed in the placement groove 71 on the corresponding side, and the tested chip is taken out from the corresponding placement groove 71 through the suction cup 20 on the other side and placed on the conveying component on the other side.

[0038] In this embodiment, in the initial state, the distance between the slides 19 on both sides is the smallest, and the suction cups 20 on both sides are respectively located above the loading station 111 and the unloading station 112. When the motor B10 drives the turntable 7 to rotate clockwise, the gear B27 drives the gear A26 to rotate, thereby driving the hollow shaft 25 and the spline shaft 23 to rotate, and then drives the reciprocating screw 22 to rotate through the bevel gear set. The rotation of the reciprocating screw 22 causes the slides 19 on both sides to move closer or farther away synchronously. When the turntable 7 rotates 60 degrees, the slides 19 on both sides just complete a set of reciprocating movements. Figure 1, when the turntable 7 rotates 30 degrees clockwise, the distance between the slides 19 on both sides is in the largest state. In this state, the suction cup 20 on the left is located above the conveyor belt 3 on the feeding side, and the suction cup 20 on the right is located above the conveyor belt 3 on the discharging side. At this time, the hydraulic cylinder 17 presses down the movable plate 14, and the heights of the suction cups 20 on both sides are synchronously reduced, wherein the suction cup 20 on the left is just pressed on the upper end surface of the chip on the conveyor belt 3 on the feeding side, and the suction cup 20 on the right is located above the conveyor belt 3 on the discharging side. At this time, the air pump 21 on the left side sucks air and adsorbs the chip through the suction cup 20 on the left side, and the air pump 21 on the right side does not work. In this process, due to The detection station B114 is blocked by the upper end surface of the turntable 7. The conductive motherboard 16 is blocked by the turntable 7 when it descends, and the spring rod 15 shrinks adaptively; then the hydraulic cylinder 17 pulls up the movable plate 14 to make the suction cup 20 rise synchronously, and the suction cup 20 on the left lifts the chip to be detected, and then the turntable 7 continues to rotate 30 degrees, and the distance between the slides 19 on both sides moves to the minimum and reaches the initial state. At this time, there is a vacant placement slot 71 on the turntable 7 below the loading station, and the placement slot 71 originally at the loading station 111 carries the chip to be detected to the bottom of the detection station A113, and the placement slot 71 originally at the bottom of the detection station A113 The placement slot 71 carries the chip to be tested to the bottom of the testing station B114, and the placement slot 71 originally under the testing station B114 carries the chip that has passed the test to the bottom of the unloading station 112. At this time, the hydraulic cylinder 17 is started to press the movable plate 14, and the movable plate 14 drives the conductive motherboard 16, the guide plate 18 and the suction cup 20 to descend synchronously. In this state, the detection probe 13 scans and detects the chip under the testing station A113 to determine whether there are defects inside it. The conductive motherboard 16 extends into the placement slot 71 under the testing station B114 and conducts electrical detection on the chip inside it. The test results are displayed on the display screen and indicator light on the control box 12. When the guide plate 18 is lowered, the suction cup 20 on the left side places the sucked chip in the placement groove 71 corresponding to the loading station 111. The suction cup 20 on the right side starts the air pump 21 on the right side when the height is lowered, and the chip on the unloading station 112 is sucked by the suction cup 20 on the right side. Then the hydraulic cylinder 17 drives the movable plate 14 to rise, and then the turntable 7 continues to rotate 30 degrees. The distance between the suction cups 20 on both sides is enlarged. When the suction cup 20 on the left side sucks the chip to be tested, the suction cup 20 on the right side places the chip that has completed the test on the conveyor belt 3 on the right side.

[0039] Embodiment 2

[0040] like Figure 1 and Figure 3As shown, a chip testing device proposed by the present invention, compared with the first embodiment, is provided with a radiation protection cover on the inner wall of the circular groove 101, the turntable 7 is located on the inner side of the radiation protection cover and fits with the inner wall thereof, and the pressure cover 11 is a radiation protection cover, and the inner wall of the opening corresponding to the detection station A113 fits with the outer surface of the detection probe 13.

[0041] In this embodiment, the structure can be used to effectively avoid radiation leakage, thereby ensuring the safety of the environment in which the workers are located and protecting the health of the workers.

[0042] Embodiment 3

[0043] like Figure 7 As shown, the present invention proposes a testing method using the above chip testing device, comprising the following steps:

[0044] S1. Use the conveying assembly at the feeding end of the operating table 1 to convey the chips to be tested one by one.

[0045] S2, the rotation drive assembly drives the turntable 7 to rotate and rotates the empty placement slot 71 to the conveying assembly close to the feed end. At the same time, the transmission assembly cooperates with the lifting drive assembly and the air pump 21 to transfer the chip to be tested to the placement slot 71 through the suction cup 20.

[0046] S3, the rotation drive assembly drives the turntable 7 to rotate intermittently and continuously, so as to push the chip to be tested to the bottom of the testing probe 13 while loading the material, and the testing probe 13 scans its packaging and internal structure.

[0047] S4, the rotating drive assembly continues to move, and while loading, the chip detected by the detection probe 13 is transferred to the bottom of the conductive motherboard 16. At this time, the suction cups 20 on both sides are kept in a low position, the conductive motherboard 16 is lowered to a low position, and the chip is electrically tested.

[0048] S5, the rotating driving assembly continues to move, the suction cup 20 on the feeding side keeps loading the material, and the suction cup 20 on the discharging side transfers the tested chips to the conveying assembly on the discharging side.

[0049] The embodiments of the present invention are described in detail above with reference to the accompanying drawings, but the present invention is not limited thereto, and various changes can be made within the knowledge scope of technicians in the relevant technical field without departing from the purpose of the present invention.

Claims

1. A chip testing device, characterized in that: include An operating table (1), a turntable (7) rotatably connected to the operating table (1) is centrally arranged, a plurality of placement grooves (71) are arranged in a ring array around the axis of the turntable (7), and a support plate (8) is arranged in the placement groove (71); Conveying components, two sets of conveying components are arranged on the operating table (1); A control box (12), the control box (12) is connected to the operating table (1), the control box (12) is connected to the detection probe (13), the control box (12) is movably connected to the movable plate (14), and the movable plate (14) is connected to the conductive motherboard (16); A lifting drive member, the lifting drive member is connected to the control box (12) and drives the movable plate (14) and the conductive mother plate (16) to lift and lower; A rotation drive assembly connected to the operating table (1) and driving the turntable (7) to rotate so that each placement slot (71) passes under the detection probe (13) and the conductive motherboard (16) in sequence; A guide plate (18), the guide plate (18) is integrally connected to the movable plate (14), two slide seats (19) are symmetrically arranged on the guide plate (18) about the center of the turntable (7), a suction cup (20) is arranged at the bottom of the slide seat (19), and an air pump (21) connected to the suction cup (20) is arranged on the slide seat (19); and a transmission component, which is connected to the turntable (7) and the slide (19) by transmission, so as to drive the slides (19) on both sides to move back and forth synchronously when the turntable (7) rotates, so as to suck the chip to be tested from the conveying component on one side through the suction cup (20) on one side and place it in the placement groove (71) on the corresponding side, and to take the chip that has been tested out of the corresponding placement groove (71) through the suction cup (20) on the other side and place it on the conveying component on the other side.

2. A chip testing device according to claim 1, characterized in that: A circular groove (101) is centrally arranged on the operating table (1), a rotating disk (7) is arranged in the circular groove (101) and is in contact with the inner wall thereof, two feeding grooves (102) are symmetrically arranged on the operating table (1) about the center of the circular groove (101), and two groups of conveying components are respectively located in the feeding grooves (102) on corresponding sides.

3. A chip testing device according to claim 2, characterized in that: The conveying assembly comprises a transmission roller (2), a conveyor belt (3), a toothed belt (5) and a motor A (6); two transmission rollers (2) are arranged in parallel in each feeding trough (102); the two transmission rollers (2) in the same feeding trough (102) are connected by transmission through a conveyor belt (3); two adjacent transmission rollers (2) in the feeding troughs (102) on both sides are coaxially connected to a pulley (4); the pulleys (4) on both sides are connected by transmission through a toothed belt (5); the body of the motor A (6) is connected to the operating table (1); and the output end of the motor A (6) is connected to the roller shaft of one of the transmission rollers (2).

4. A chip testing device according to claim 3, characterized in that: A pressure cover (11) for closing the circular groove (101) is arranged on the operating table (1), and the upper end surface of the turntable (7) is rotatably connected to the pressure cover (11). A loading station (111), a detection station A (113), a detection station B (114) and a material unloading station (112) are arranged on the pressure cover (11) in sequence along the rotation direction of the turntable (7), wherein the loading station (111) and the material unloading station (112) respectively correspond to the feeding groove (102) on the corresponding side, and the loading station (111), the detection station A (113), the detection station B (114) and the material unloading station (112) are respectively connected to a placement groove (71).

5. A chip testing device according to claim 4, characterized in that: The rotary drive assembly comprises a motor B (10), the body of the motor B (10) is connected to the operating table (1), and the output end of the motor B (10) is coaxially connected to the turntable (7).

6. A chip testing device according to claim 1, characterized in that: The transmission assembly comprises a reciprocating screw rod (22), a spline shaft (23), a hollow shaft (25), a gear A (26) and a gear B (27); a slide groove is arranged on the guide plate (18); two reciprocating screw rods (22) are coaxially connected and arranged in the slide groove; the reciprocating screw rods (22) are rotationally connected to the guide plate (18); a slide seat (19) is inserted into the slide groove and slidably connected to the inner wall thereof; the shuttles on the reciprocating screw rods (22) on both sides are respectively connected to the slide seats (19) on the corresponding sides; the spline shaft (23) and the guide plate (18) are connected to each other. ) are rotatably connected, a bevel gear (24) is respectively arranged on the spline shaft (23) and the reciprocating screw rod (22), and the two bevel gears (24) are meshed; a hollow shaft (25) is sleeved on the outside of the spline shaft (23) and slides along its radial direction, the hollow shaft (25) is rotatably connected to the operating table (1), and the hollow shaft (25) is coaxially connected to the gear A (26); the turntable (7) is coaxially connected to the center shaft (9), the gear B (27) is coaxially connected to the center shaft (9), and the gear B (27) is meshed with the gear A (26).

7. A chip testing device according to claim 1, characterized in that: The detection probe (13) is an X-ray probe, and a controller electrically connected to the X-ray probe is arranged in the control box (12).

8. A chip testing method, using the chip testing device according to any one of claims 1 to 7, characterized in that: The following steps are involved: S1, using the conveying assembly at the feeding end of the operating table (1) to convey the chips to be tested one by one; S2, the rotary drive assembly drives the turntable (7) to rotate and rotates the vacant placement slot (71) to the conveying assembly close to the feed end. At the same time, the transmission assembly cooperates with the lifting drive assembly and the air pump (21) to transfer the chip to be tested to the placement slot (71) through the suction cup (20); S3, the rotary drive component drives the turntable (7) to rotate intermittently and continuously, so as to push the chip to be tested to the bottom of the detection probe (13) while loading the material, and the detection probe (13) scans its packaging and internal structure; S4, the rotating drive assembly continues to move, and while loading, the chip detected by the detection probe (13) is transferred to the bottom of the conductive motherboard (16), at this time, the suction cups (20) on both sides are kept in a low position, the conductive motherboard (16) is lowered to a low position and the chip is electrically tested; S5, the rotating driving assembly continues to move, the suction cup (20) on the feeding side keeps loading the material, and the suction cup (20) on the discharging side transfers the chips that have completed the test to the conveying assembly on the discharging side.

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