Liquid crystal screen testing method and system based on chip automatic identification

Abstract

The invention discloses a liquid crystal display testing method and system based on chip automatic identification, and relates to the technical field of liquid crystal display testing, and the method comprises the steps: identifying the chip information of a to-be-tested liquid crystal display to determine the chip type of the to-be-tested liquid crystal display; determining a target test program according to the chip type of the to-be-tested liquid crystal screen and candidate test programs which are integrated by a test program storage and calling module and correspond to multiple test items; executing the target test program, and controlling to output a test result; wherein the signal isolation protection module is used for separating an interference signal from a test signal generated in the process of executing a target test program; a current sensor and a voltage sensor are used for monitoring the current value and the voltage value of the to-be-tested liquid crystal screen in the testing process in real time; and calling a protection mechanism under the condition that the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition.

Description

Technical Field

[0001] The present application relates to the technical field of liquid crystal screen testing, and in particular to a liquid crystal screen testing method and system based on automatic chip identification. Background Art

[0002] With the rapid development of liquid crystal display technology, LCD screens are increasingly used in various electronic products. However, LCD screens need to undergo rigorous testing during the production process to ensure that their quality and performance meet design requirements. Traditional LCD screen defect detection mainly relies on manual visual inspection methods, which are inefficient and affected by subjective factors of the inspectors, and cannot guarantee the quality of inspection. Manual inspection is easily affected by factors such as personal vision, emotions, fatigue, and light, resulting in low work efficiency.

[0003] To address the above-mentioned problems, no effective solution has been proposed yet. Summary of the invention

[0004] The embodiments of the present application provide a liquid crystal screen testing method and system based on automatic chip identification to solve the above technical problems.

[0005] The present application provides a liquid crystal screen testing method based on chip automatic identification, comprising: identifying the chip information of the liquid crystal screen to be tested to determine the chip type of the liquid crystal screen to be tested; determining a target test program according to the chip type of the liquid crystal screen to be tested and candidate test programs corresponding to multiple test items integrated by a test program storage and calling module; executing the target test program, and controlling the output of the test result; wherein a signal isolation protection module is used to separate an interference signal from a test signal generated during the execution of the target test program; using a current sensor and a voltage sensor to monitor the current value and voltage value of the liquid crystal screen to be tested in real time during the test process; and calling a protection mechanism when the monitored current value does not meet a current qualification condition or the monitored voltage value does not meet a voltage qualification condition.

[0006] The present application provides a liquid crystal screen test system based on chip automatic identification, comprising: a chip automatic identification module, used to identify the chip information of the liquid crystal screen to be tested to determine the chip type of the liquid crystal screen to be tested; a test program storage and call module, used to determine the target test program according to the chip type of the liquid crystal screen to be tested determined by the chip automatic identification module and the candidate test programs corresponding to multiple test items integrated by the test program storage and call module; a control unit, used to receive and process data from each module, execute the target test program, and control the output of the test result; wherein the modules communicate with each other through a high-speed bus; a current and voltage detection module, used to use a current sensor and a voltage sensor to monitor the current value and voltage value of the liquid crystal screen to be tested in real time during the test process; and when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition, call a protection mechanism; a signal isolation protection module, used to separate the interference signal from the test signal generated in the process of the control unit executing the target test program.

[0007] Based on the embodiment provided by the present application, the chip information of the LCD screen to be tested is identified to determine the chip type of the LCD screen to be tested; the target test program is determined according to the chip type of the LCD screen to be tested and the candidate test programs corresponding to multiple test items integrated by the test program storage and calling module; the target test program is executed, and the output test result is controlled; wherein the signal isolation protection module is used to separate the interference signal from the test signal generated in the process of executing the target test program; the current value and voltage value of the LCD screen to be tested during the test process are monitored in real time by using the current sensor and the voltage sensor; and the protection mechanism is called when the monitored current value does not meet the current qualified condition or the monitored voltage value does not meet the voltage qualified condition. Thus, the test efficiency and accuracy of the LCD screen are improved. By automatically identifying the chip type, judging whether the current is qualified, realizing voltage protection and test signal isolation, the system can meet the factory's all-round testing needs for the LCD screen. At the same time, the system has a high degree of intelligence and automation, which reduces the frequency of manual intervention and test program replacement, and reduces production costs and labor intensity. In addition, the system also has good scalability and compatibility, and can adapt to the development trend of LCD screen testing technology in the future.

[0008] To sum up, the LCD screen testing system based on chip automatic identification and its implementation method proposed in this application have the advantages of high efficiency, accuracy, intelligence and high degree of automation. It can meet the needs of modern factories for LCD screen testing and has high practical value and application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] The drawings described herein are used to provide a further understanding of the embodiments of the present invention and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0010] Figure 1 It is a flowchart of an optional LCD screen testing method based on automatic chip identification according to an embodiment of the present application;

[0011] Figure 2 is a structural diagram of an optional LCD screen testing system based on automatic chip identification according to an embodiment of the present application;

[0012] Figure 3 is a schematic diagram of an optional current and voltage detection module according to an embodiment of the present application;

[0013] Figure 4 Schematic diagram of an optional signal isolation protection module according to an embodiment of the present application.

[0014] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0015] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application.

[0016] Traditional LCD screen test systems usually have problems such as complex test procedures, low test efficiency, and frequent test program changes, which are difficult to meet the large-scale and efficient production needs of modern factories. Therefore, the present invention proposes an intelligent LCD screen test system, which uses an STM32F103VCT6 microcontroller as a core control unit, can automatically identify chip types, judge whether current is qualified, realize voltage protection, test signal isolation, and meet the test requirements of all LCD screens in the factory, thereby significantly improving test efficiency and accuracy.

[0017] Alternatively, if Figure 1 As shown, the present application provides a liquid crystal screen testing method based on chip automatic identification, comprising:

[0018] S101, identifying chip information of the LCD screen to be tested to determine the chip type of the LCD screen to be tested;

[0019] S102, determining a target test program according to the chip type of the LCD screen to be tested and the candidate test programs corresponding to the various test items integrated by the test program storage and calling module;

[0020] S103, executing the target test program and controlling the output of the test results; wherein the signal isolation protection module is used to separate the interference signal from the test signal generated during the execution of the target test program;

[0021] Among them, interference signals refer to non-target signals that may have adverse effects on the LCD test system during the test process. These signals may come from a variety of factors, including but not limited to: Electromagnetic interference: interference caused by electromagnetic fields generated by other electronic devices or power lines, which may affect the sensor readings and signal transmission of the test system; Power supply noise: fluctuations or noise in the power supply line, which may be caused by the power supply itself or other devices connected to the same power supply; Crosstalk: signal interference caused by electromagnetic coupling between multiple signal lines or circuit board traces; Radio frequency interference: interference generated by radio frequency devices such as wireless communication equipment, radar, etc.; Digital noise: Rapid voltage changes that may be generated by switching operations in digital circuits, which can be coupled into analog circuits and affect the accuracy of test signals; Environmental noise: Noise caused by environmental factors such as electrostatic discharge, temperature changes, and humidity changes; Equipment noise: Noise generated by internal components of the test equipment, such as amplifier noise, sensor noise, etc.; Signal reflection and refraction: Signal reflection and refraction caused by impedance mismatch in long cables or transmission lines.

[0022] In the test system, the role of the signal isolation protection module is to separate these interference signals from the test signals generated by the control unit during the execution of the target test program to ensure the accuracy and reliability of the test results. By using isolation circuits and filtering circuits, the system can reduce or eliminate the impact of these interference signals, thereby improving the stability and accuracy of the test.

[0023] S104, using a current sensor and a voltage sensor to monitor the current value and voltage value of the tested LCD screen in real time during the test process; and in the case where the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition, calling the protection mechanism.

[0024] Through high-precision current sensors and voltage sensors, the system can accurately determine whether the current of the LCD screen is qualified, and take timely protective measures when the voltage is abnormal, ensuring the safety and reliability of the test process.

[0025] During the LCD screen test, the protection mechanism is called to ensure the safety of the test and the integrity of the LCD screen. When the current value or voltage value monitored by the current sensor and voltage sensor exceeds the preset safety range, the protection mechanism will be activated. Specifically, the protection mechanism can include the following aspects: Power-off protection: Once an abnormal current or voltage is detected, the system will immediately cut off the power supply to prevent damage to the LCD screen or test equipment; Alarm prompt: The system may issue an audible and visual alarm to notify the operator to check and deal with the abnormal situation; Data recording: When an abnormality occurs, the system will record the current and voltage values ​​when the abnormality occurs, as well as the time point of occurrence, so as to facilitate subsequent analysis of the cause; Automatic reset: In some cases, the system may try to automatically reset and restart the test process; Short circuit protection: If a short circuit is detected, the protection mechanism will prevent the current from continuing to flow to avoid circuit overheating or fire risks; Overload protection: When the current exceeds the maximum value that the LCD screen or test equipment can withstand, the protection mechanism will limit the current to prevent equipment damage; Voltage abnormality protection: If the voltage exceeds the normal working range, the system will adjust the voltage or cut off the power supply to protect the LCD screen and test equipment.

[0026] The implementation of these protection mechanisms can refer to specific LCD detection technology, for example, by powering on the LCD and determining whether the voltage value is the expected value, if the voltage value is abnormal, then turning off the power and re-crimping the connector or taking other protective measures. In this way, the protection mechanism helps to improve the reliability and safety of the test process.

[0027] Based on the embodiment provided by the present application, the chip information of the LCD screen to be tested is identified to determine the chip type of the LCD screen to be tested; the target test program is determined according to the chip type of the LCD screen to be tested and the candidate test programs corresponding to multiple test items integrated by the test program storage and calling module; the target test program is executed, and the output test result is controlled; wherein the signal isolation protection module is used to separate the interference signal from the test signal generated in the process of executing the target test program; the current value and voltage value of the LCD screen to be tested during the test process are monitored in real time by using the current sensor and the voltage sensor; and the protection mechanism is called when the monitored current value does not meet the current qualified condition or the monitored voltage value does not meet the voltage qualified condition. Thus, the test efficiency and accuracy of the LCD screen are improved. By automatically identifying the chip type, judging whether the current is qualified, realizing voltage protection and test signal isolation, the system can meet the factory's all-round testing needs for the LCD screen. At the same time, the system has a high degree of intelligence and automation, which reduces the frequency of manual intervention and test program replacement, and reduces production costs and labor intensity. In addition, the system also has good scalability and compatibility, and can adapt to the development trend of LCD screen testing technology in the future.

[0028] In summary, the LCD screen testing system based on chip automatic identification and its implementation method proposed in this application have the advantages of high efficiency, accuracy, intelligence and high degree of automation. They can meet the needs of modern factories for LCD screen testing and have high practical value and application prospects.

[0029] Alternatively, if Figure 2 As shown, the present application provides a liquid crystal screen testing system based on automatic chip identification, the system implements the method as claimed in claim 1, characterized in that it includes:

[0030] The chip automatic identification module 201 is used to identify the chip information of the LCD screen to be tested to determine the chip type of the LCD screen to be tested;

[0031] It uses advanced chip automatic recognition technology to automatically match the corresponding test program by reading the chip information on the LCD screen. This technology not only avoids the tedious process of manually selecting the test program, but also greatly improves the accuracy and efficiency of the test. At the same time, this technology also supports the recognition of multiple chip types, meeting the factory's testing needs for different types of LCD screens.

[0032] The test program storage and calling module 202 is used to determine the target test program according to the chip type of the LCD screen to be tested determined by the chip automatic identification module 201 and the candidate test programs corresponding to the various test items integrated by the test program storage and calling module 202;

[0033] The control unit 203 is used to receive and process data from each module, execute the target test program, and control the output of the test results; wherein each module communicates with each other via a high-speed bus;

[0034] The overall system architecture is clear, and each module communicates through a high-speed bus to ensure the real-time and accuracy of data.

[0035] The current and voltage detection module 204 is used to use a current sensor and a voltage sensor to monitor the current value and the voltage value of the LCD screen to be tested in real time during the test process; and to call a protection mechanism when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition;

[0036] The signal isolation protection module 205 is used to separate the interference signal from the test signal generated in the process of the control unit 203 executing the target test program.

[0037] For example, the current and voltage detection module 204 can be as follows Figure 3 The signal isolation protection module 205 can be as shown. Figure 4 shown.

[0038] Furthermore, the chip automatic identification module identifies the chip information of the LCD screen to be tested to determine the chip type of the LCD screen to be tested, and is configured as follows:

[0039] Initialize and write the first register of the LCD screen to be tested;

[0040] By calling the reset function, the LCD screen to be tested is detected whether it is reset; if the LCD screen to be tested is not reset, the LCD screen to be tested is reset;

[0041] Read the value of the first register to identify the ID value of the LCD screen to be tested;

[0042] Among them, the first register is the ID register.

[0043] Correct the identified ID value;

[0044] Traverse the predefined ID array, and for each ID value in the predefined ID array, determine whether the identified ID value matches the current ID value; if the identified ID value matches the current ID value, determine the chip series type corresponding to the current ID value as the chip series type of the LCD screen to be tested; wherein the predefined ID array stores the ID values ​​of different LCD chips and the corresponding index values; the index value is used to identify the chip series type of the LCD chip;

[0045] If the chip series type of the LCD screen to be tested does not belong to the preset chip series type, the chip series type of the LCD screen to be tested is determined as the chip type of the LCD screen to be tested;

[0046] If the chip series type of the LCD screen to be tested belongs to the preset chip series type, the chip type of the LCD screen to be tested is determined by reading the value of the second register of the LCD screen to be tested.

[0047] Furthermore, the preset series chip types include 7781 series chip types, 9325 series chip types, and 9225 series chip types; if the chip series type of the LCD screen to be tested belongs to the preset series chip type, the chip type of the LCD screen to be tested is determined by reading the value of the second register of the LCD screen to be tested, and is configured as follows:

[0048] If the chip series type of the LCD screen to be tested belongs to the 7781 series chip type, the second register is the 0xFF register; read the value of the 0xFF register; if the value of the 0xFF register is not 0, it is determined that the chip type of the LCD screen to be tested is the 7781 model; if the value of the 0xFF register is 0, it is determined that the chip type of the LCD screen to be tested is the 7781R model;

[0049] If the chip series type of the LCD screen to be tested belongs to the 9325 series chip type, the second register is the 0xE4 register; read the value of the 0xE4 register; if the value of the 0xE4 register is 0x1C30, it is determined that the chip type of the LCD screen to be tested is the 9325 model; if the value of the 0xE4 register is 0x310b, it is determined that the chip type of the LCD screen to be tested is the 3225A model; if the value of the 0xE4 register is 0x1480, read the value of the 0xCD register of the LCD screen to be tested; according to the value of the 0xCD register, it is determined that the chip type of the LCD screen to be tested is the 9325C model or the 9325D model;

[0050] If the chip series type of the LCD screen to be tested belongs to the 9225 series chip type, the second register is the 0xED register; read the value of the 0xED register; if the value of the 0xED register is 0x2683, it is determined that the chip type of the LCD screen to be tested is the 9225 model; if the value of the 0xED register is 0x2682, it is determined that the chip type of the LCD screen to be tested is the 1L19225C model.

[0051] For example, in a process: Initialization and write command: First, the registers of the LCD display are initialized and written through a loop. This is to ensure that the LCD screen is in a known initial state for the subsequent recognition process.

[0052] Reset detection: Detect whether the LCD screen has been reset by calling the tst_Reset() function. If the LCD screen has not been reset, a reset operation will be performed in advance to ensure stability.

[0053] Read ID register: Use TEST_LCD_ReadReg16BIT(0x00) function to read the ID register of LCD screen. This register usually contains information for identifying chip model.

[0054] ID value correction: According to the ID value read, some corrections are made. This is because some chips may have misaligned or wrong values ​​when reading the ID. For example, if the ID is 0x1006, it is corrected to 0x7006; if it is 0x3145, it is corrected to 0x4531.

[0055] ID matching: Traverse a predefined ID array IC and check whether the read ID matches an ID in the array. If a matching ID is found, it means that the LCD chip model has been identified.

[0056] Distinguishing specific models: For some specific chip models, further differentiation is required. Distinguishing is done by reading the value of another register (0xFF). If the value of this register is not 0, it is considered to be a 7781 model; if it is 0, it jumps to 7781 for execution.

[0057] Distinguish 9325 series: For 9325 series chips, read the value of register 0xE4 to distinguish different sub-models. For example, if the value of 0xE4 is 0x1C30, it is considered to be a 9325 model; if it is 0x310b, it is considered to be a 3225A model; if it is 0x1480, you need to further read the value of register 0xCD to distinguish 9325C and 9325D.

[0058] Distinguish the 9225 series: For the 9225 series chips, read the value of the 0xED register. If the value is 0x2683, it is considered to be a 9225 model; if it is 0x2682, it is considered to be a 1L19225C model.

[0059] Return result: Once the chip model is identified, an index value is returned through the return statement. This index value corresponds to the position in the predefined ID array IC, which is used to indicate the identified chip model.

[0060] The entire process recognizes the LCD chip model by reading specific register values, combining a predefined ID array, and some specific correction and differentiation logic.

[0061] Further, one test item corresponds to multiple candidate test programs; the test items include a hidden black spot test item, a white spot and black spot test item, a light and dark scratch test item, a combined misalignment test item, a brightness and contrast test item, a color accuracy test item, and a bad pixel test item; the test program storage and call module determines the target test program according to the chip type of the LCD screen to be tested determined by the chip automatic identification module and the candidate test programs corresponding to the multiple test items integrated by the test program storage and call module, and is configured as follows:

[0062] Determine the target test items supported by the chip type of the LCD screen to be tested and multiple candidate test programs corresponding to the target test items according to the constructed chip test database, wherein the chip test database includes the LCD screen chip type, supported test items and corresponding multiple candidate test programs;

[0063] Analyze the support degree of the LCD screen to be tested for the target test items and the combination and selection method of multiple candidate test programs corresponding to the target test items;

[0064] Determine a target combination test program from a plurality of candidate test programs corresponding to the target test items according to the analysis results;

[0065] According to the chip type of the LCD screen to be tested, the test parameters of the target combination test program are optimized, and the optimized target combination test program is determined as the target test program.

[0066] Further, the support degree of the LCD screen to be tested for the target test items and the combination and selection method of multiple candidate test programs corresponding to the target test items are analyzed; according to the analysis results, a target combination test program is determined from the multiple candidate test programs corresponding to the target test items, which is configured as follows:

[0067] Determine the performance parameters of the LCD screen to be tested related to the target test items;

[0068] Determine the support degree of the chip type of the LCD screen to be tested for the target test item according to the performance parameters related to the target test item; wherein the performance parameters corresponding to the target test item include resolution, color depth, response time and power consumption;

[0069] Take each candidate test program as a node and build a test program dependency network;

[0070] If there is a dependency relationship between two candidate test programs, for example, the output of one test program is the input of another, a directed edge is established between the corresponding nodes;

[0071] Assign an initial influence score to each candidate test program based on the following formula; wherein the initial influence score is based on the position and number of connections of the candidate test program in the test program dependency network;

[0072] InitialInfluence(p)=k×degree(p)+∑ q∈dependent(p) InitialInfluence(q)

[0073] Where, InitialInfluence(p) is the initial influence score of node p in the test program dependency network; k is the adjustment constant; degree(p) is the degree of node p; dependent(p) is the set of nodes that depend on node p; node q is the node that depends on node p; InitialInfluence(q) is the initial influence score of node q;

[0074] Create a reference matrix DSM; where the rows and columns of the reference matrix DSM represent candidate test programs. If program i depends on program j, the position of DSM[i][j] is marked as 1;

[0075] The reference matrix DSM is analyzed using a hierarchical clustering algorithm to identify candidate test programs that can be executed in parallel;

[0076] Calculate the K-shell value of each node; the K-shell value is used to reflect the coreness of the node in the test program dependency network;

[0077] The K-shell value is the minimum shell layer of a node, which indicates how many layers of nodes need to be removed from the node to disconnect the network.

[0078] Sort candidate test programs according to K-shell values, giving priority to test programs with high coreness;

[0079] Determine a dynamic adaptability score for each candidate test program based on the following formula; the dynamic adaptability score takes into account the adaptability of the test program to different chip types and its performance in different test environments;

[0080] AdapabilityScore(p)

[0081] =α 1 ×Accuracy(p)+α 2 ×Flexibility(p)+α 3 ×Stability(p)

[0082] Where AdapabilityScore(p) is the dynamic adaptability score of the candidate test program corresponding to node p; Accuracy(p) is the accuracy of the candidate test program corresponding to node p; Flexibilty(p) is the flexibility of the candidate test program corresponding to node p; Stability(p) is the stability of the candidate test program corresponding to node p; α 1 , α 2 , α 3 All are weight coefficients;

[0083] According to the initial impact score, K-shell core ranking and dynamic adaptability score, the combination and selection methods of multiple candidate test programs corresponding to the target test items are analyzed to obtain the analysis results;

[0084] According to the clustering results and analysis results of the reference matrix DSM, a target combination test program is determined from a plurality of candidate test programs corresponding to the target test items.

[0085] When analyzing the combination and selection of multiple candidate test programs corresponding to the target test items, the design structure matrix and K-shell method can be used. These two methods can help us understand the dependencies and interactions between test programs and identify key test programs.

[0086] Application of design structure matrix: Design structure matrix is ​​a method for representing and analyzing system models. It uses a square matrix to show the relationship between elements in the system. In the selection of test programs, we can regard each test program as an element of the matrix. If there is a dependency relationship between two test programs, the corresponding matrix position is marked as 1, otherwise it is 0. In this way, we can intuitively see the dependency structure between test programs.

[0087] Application of K-shell method: K-shell method is a coarse-grained decomposition method based on the global structure of the network. It judges the importance of nodes according to their positions in the network. In the selection of test programs, we can regard each test program as a node in the network, and the K-shell value of the node indicates its core degree in the test process.

[0088] This combination of DSM and K-shell methods can provide a comprehensive and detailed perspective to analyze and select test programs, ensuring the efficiency and systematicness of the test process. This method can ensure that key test programs are executed first, while reducing dependency conflicts during the test process and improving the efficiency and effectiveness of the overall test.

[0089] Furthermore, based on the following formula, according to the clustering results of the reference matrix DSM, the coreness ranking and dynamic adaptability score of K-shell, the combination and selection methods of multiple candidate test programs corresponding to the target test items are analyzed:

[0090]

[0091] Wherein, OptimalCombination represents the optimal combination of candidate test programs; C is a subset of the candidate test program set P, and the candidate test program set P includes multiple candidate test programs corresponding to the target test items; It is used to find all possible test program subsets C so that the sum of the products of the dynamic adaptability scores and the comprehensive influence of all candidate test programs in C is maximized; the comprehensive influence includes CoreInfluence(p) and InitialInfluence(p); AdapabilityScore(p) represents the dynamic adaptability score of the candidate test program corresponding to node p; CoreInfluence(p) represents the core influence of the candidate test program corresponding to node p in the test program dependency network, which is evaluated based on the K-shell value of node p; the K-shell value of node p reflects the coreness of node p in the test program dependency network, that is, the connectivity of neighboring nodes after node p is removed; InitialInfluence(p) is the initial influence score of node p.

[0092] Furthermore, the support degree of the LCD screen to be tested for the target test items is expressed as:

[0093]

[0094] Among them, S is the comprehensive support score; R is the resolution score, which is determined according to the theoretical resolution of the LCD screen to be tested and the resolution required by the target test item; D is the color depth score, which is determined according to the theoretical color depth of the LCD screen to be tested and the color depth required by the target test item; T is the response time score, which is determined according to the theoretical response time of the LCD screen to be tested and the response time required by the target test item; P is the power consumption score, which is determined according to the theoretical power consumption of the LCD screen to be tested and the power consumption required by the target test item; ω 1 ,ω 2 ,ω 3 ,ω 4 are weight factors corresponding to the relative importance of resolution, color depth, response time, and power consumption, ω 1 +ω 2 +ω 3 +ω 4 =1; A is the adaptability score, which is scored according to the adaptability of the LCD screen to the test environment, ranging from 0 to 1; I is the innovation score, which is scored according to the improvement brought by the test items based on the characteristics of the LCD screen to be tested, ranging from 0 to 1. This formula introduces the adaptability score and the innovation score, which not only considers the traditional performance parameters, but also the adaptability and innovation of the chip in actual applications, thus providing a more comprehensive and forward-looking evaluation method. This method can help the test team better understand the potential and limitations of the chip and how it can adapt to future test needs.

[0095] Furthermore, the LCD screen test system based on automatic chip identification also includes:

[0096] A human-computer interaction interface is used to receive modification instructions for a first candidate test program corresponding to a plurality of test items input by a user, to modify the test parameters or the test process of the first candidate test program; and to display the test results of the LCD screen to be tested output by the control unit and the test report generated according to the test results.

[0097] Further, the first register is an ID register;

[0098] The control unit includes an STM32F103VCT6 microcontroller. The STM32F103VCT6 is a high-performance, low-power 32-bit microcontroller with rich peripheral interfaces and powerful processing capabilities. In this system, the STM32F103VCT6 serves as the core control unit, responsible for receiving and processing data from each module, executing the test program, and controlling the output of the test results. Its high-speed computing power and rich interface resources provide a strong guarantee for the stability and scalability of the system.

[0099] It should be noted that in the present application, the embodiments implemented on the LCD screen testing system side based on chip automatic identification can be cross-referenced with the embodiments implemented on the LCD screen testing method side based on chip automatic identification, and the present application will not go into details one by one.

[0100] The above are only preferred embodiments of the present invention, and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A liquid crystal screen testing method based on automatic chip identification, characterized in that: include: Identify the chip information of the LCD screen to be tested to determine the chip type of the LCD screen to be tested; Determine a target test program according to the chip type of the liquid crystal screen to be tested and the candidate test programs corresponding to the various test items integrated by the test program storage and calling module; Execute the target test program, and control the output of the test results; wherein the signal isolation protection module is used to separate the interference signal from the test signal generated during the execution of the target test program; The current sensor and the voltage sensor are used to monitor the current value and the voltage value of the LCD screen to be tested in real time during the test process; and when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition, the protection mechanism is called.

2. A liquid crystal screen test system based on automatic chip identification, the system implements the method according to claim 1, characterized in that: include: A chip automatic identification module is used to identify the chip information of the LCD screen to be tested to determine the chip type of the LCD screen to be tested; A test program storage and calling module, used to determine a target test program according to the chip type of the LCD screen to be tested determined by the chip automatic identification module and candidate test programs corresponding to a variety of test items integrated by the test program storage and calling module; A control unit, used to receive and process data from each module, execute the target test program, and control the output of the test results; wherein each module communicates with each other via a high-speed bus; The current and voltage detection module is used to monitor the current value and voltage value of the LCD screen to be tested in real time during the test process using a current sensor and a voltage sensor; and to call a protection mechanism when the monitored current value does not meet the current qualification condition or the monitored voltage value does not meet the voltage qualification condition; The signal isolation protection module is used to separate the interference signal from the test signal generated during the control unit executing the target test program.

3. The LCD screen test system based on chip automatic identification according to claim 2 is characterized in that: The chip automatic identification module identifies the chip information of the LCD screen to be tested to determine the chip type of the LCD screen to be tested, and is configured as follows: Initializing and writing the first register of the liquid crystal screen to be tested; Detecting whether the LCD screen to be tested is reset by calling a reset function; if the LCD screen to be tested is not reset, resetting the LCD screen to be tested; Reading the value of the first register to identify the ID value of the LCD screen to be tested; Correct the identified ID value; Traversing the predefined ID array, for each ID value in the predefined ID array, determining whether the identified ID value matches the current ID value; if the identified ID value matches the current ID value, determining the chip series type corresponding to the current ID value as the chip series type of the LCD screen to be tested; wherein the predefined ID array stores the ID values ​​of different LCD chips and the corresponding index values; the index value is used to identify the chip series type of the LCD chip; If the chip series type of the LCD screen to be tested does not belong to the preset chip series type, determining the chip series type of the LCD screen to be tested as the chip type of the LCD screen to be tested; If the chip series type of the LCD screen to be tested belongs to the preset chip series type, the chip type of the LCD screen to be tested is determined by reading the value of the second register of the LCD screen to be tested.

4. The LCD screen test system based on chip automatic identification according to claim 3 is characterized in that: The preset series chip types include 7781 series chip types, 9325 series chip types and 9225 series chip types; if the chip series type of the LCD screen to be tested belongs to the preset series chip type, the chip type of the LCD screen to be tested is determined by reading the value of the second register of the LCD screen to be tested, and is configured as follows: If the chip series type of the LCD screen to be tested belongs to the 7781 series chip type, the second register is a 0xFF register; read the value of the 0xFF register; if the value of the 0xFF register is not 0, determine that the chip type of the LCD screen to be tested is a 7781 model; if the value of the 0xFF register is 0, determine that the chip type of the LCD screen to be tested is a 7781R model; If the chip series type of the LCD screen to be tested belongs to the 9325 series chip type, the second register is the 0xE4 register; read the value of the 0xE4 register; if the value of the 0xE4 register is 0x1 C30, determine that the chip type of the LCD screen to be tested is the 9325 model; if the value of the 0xE4 register is 0x310b, determine that the chip type of the LCD screen to be tested is the 3225A model; if the value of the 0xE4 register is 0x1480, read the value of the 0xCD register of the LCD screen to be tested; judge whether the chip type of the LCD screen to be tested is the 9325C model or the 9325D model according to the value of the 0xCD register; If the chip series type of the LCD screen to be tested belongs to the 9225 series chip type, the second register is the 0xED register; read the value of the 0xED register; if the value of the 0xED register is 0x2683, it is determined that the chip type of the LCD screen to be tested is the 9225 model; if the value of the 0xED register is 0x2682, it is determined that the chip type of the LCD screen to be tested is the 1L19225C model.

5. The LCD screen test system based on chip automatic identification according to claim 2 is characterized in that: A test item corresponds to multiple candidate test programs; the test items include a hidden black spot test item, a white spot and black spot test item, a light and dark scratch test item, a combined misalignment test item, a brightness and contrast test item, a color accuracy test item, and a bad pixel test item; the test program storage and calling module determines a target test program according to the chip type of the liquid crystal screen to be tested determined by the chip automatic identification module and the candidate test programs corresponding to the multiple test items integrated by the test program storage and calling module, and is configured as follows: Determine the target test items supported by the chip type of the LCD screen to be tested and multiple candidate test programs corresponding to the target test items according to the constructed chip test database, wherein the chip test database includes the LCD screen chip type, supported test items and corresponding multiple candidate test programs; Analyze the support degree of the LCD screen to be tested for the target test items and the combination and selection method of multiple candidate test programs corresponding to the target test items; Determine a target combination test program from a plurality of candidate test programs corresponding to the target test items according to the analysis results; According to the chip type of the liquid crystal screen to be tested, the test parameters of the target combination test program are optimized, and the optimized target combination test program is determined as the target test program.

6. The LCD screen test system based on chip automatic identification according to claim 5 is characterized in that: The analyzing the support degree of the LCD screen to be tested for the target test item and the combination and selection method of multiple candidate test programs corresponding to the target test item; determining the target combination test program from the multiple candidate test programs corresponding to the target test item according to the analysis result, is configured as follows: Determining performance parameters of the liquid crystal screen to be tested that are related to the target test items; Determine the support degree of the chip type of the LCD screen to be tested for the target test item according to the performance parameters related to the target test item; wherein the performance parameters corresponding to the target test item include resolution, color depth, response time and power consumption; Take each candidate test program as a node and build a test program dependency network; If there is a dependency relationship between two candidate test programs, a directed edge is established between the corresponding nodes; An initial influence score is assigned to each candidate test program based on the following formula; wherein the initial influence score is based on the position and number of connections of the candidate test program in the test program dependency network.

7. The LCD screen test system based on chip automatic identification according to claim 6 is characterized in that: Create a reference matrix DSM; wherein the rows and columns of the reference matrix DSM represent the candidate test programs, and if program i depends on program j, the position of DSM[i][j] is marked as 1; Analyzing the reference matrix DSM using a hierarchical clustering algorithm to identify candidate test programs that can be executed in parallel; Calculating the K-shell value of each node; wherein the K-shell value is used to reflect the coreness of the node in the test program dependency network; sorting the candidate test programs according to the K-shel l value; Each candidate test program determines a dynamic fitness score; Analyze the combination and selection methods of multiple candidate test programs corresponding to the target test items according to the initial influence score, the core ranking of the K-shell and the dynamic adaptability score to obtain an analysis result; According to the clustering result of the reference matrix DSM and the analysis result, the target combination test program is determined from a plurality of candidate test programs corresponding to the target test items.

8. The LCD screen test system based on chip automatic identification according to claim 7 is characterized in that: According to the clustering results of the reference matrix DSM, the coreness ranking of the K-shell and the dynamic adaptability score, the combination and selection method of multiple candidate test programs corresponding to the target test items are analyzed.

9. The LCD screen test system based on chip automatic identification according to claim 2, characterized in that: The LCD screen test system based on chip automatic identification also includes: A human-computer interaction interface is used to receive modification instructions input by a user for a first candidate test program corresponding to the multiple test items, modify the test parameters or test process of the first candidate test program; and display the test results of the LCD screen to be tested output by the control unit and the test report generated based on the test results.

10. The LCD screen test system based on chip automatic identification according to claim 3, characterized in that: The first register is an ID register; The control unit includes a STM32F103VCT6 microcontroller.

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