Global temperature control laser scanning galvanometer service life test device and test method

Abstract

The invention relates to a global temperature control laser scanning galvanometer service life test device and method, the global temperature control laser scanning galvanometer service life test device comprises a mounting clamp, a temperature control device, a laser and a position detector, the temperature control device comprises a box body and a temperature control unit, the mounting clamp is located in the box body, and the temperature control unit is located in the box body. The scanning galvanometer assembly is fixed in the box body through the mounting clamp, and the control unit performs heating and temperature control on the interior of the box body, so that the temperature environment where the scanning galvanometer assembly is located is adjusted, the laser and the position detector are matched to detect the environment adaptability resistance of the scanning galvanometer assembly, and the product quality of the scanning galvanometer assembly is guaranteed.

Description

Technical Field

[0001] The present application relates to the technical fields of laser manufacturing and additive manufacturing, and in particular to a global temperature-controlled laser scanning galvanometer life test device and test method. Background Art

[0002] Simply speaking, a galvo scanning system is a high-speed scanning galvo used in the laser industry. The so-called galvo scanning system can also be called an ammeter. Its design concept completely follows the design method of the ammeter. The lens replaces the needle, and the signal of the probe is replaced by a DC signal controlled by a computer to complete the predetermined action. The existing high-speed scanning galvo scanning system uses the principle of interference fringes to measure the deflection angle of the laser scanning galvo scanning system, which can improve the measurement accuracy of the galvo scanning system.

[0003] However, the existing laser galvanometer testing device and testing method cannot measure the environmental adaptability of the galvanometer under different temperatures, and thus cannot guarantee the product quality of the galvanometer under different temperature conditions. Summary of the invention

[0004] Based on this, it is necessary to provide a laser scanning galvanometer life test device and test method with global temperature control to address the problem that the existing laser galvanometer test device and test method cannot measure temperature drift and the galvanometer's environmental adaptability, and thus cannot guarantee the galvanometer's product quality.

[0005] In a first aspect, an embodiment of the present application provides a global temperature-controlled laser scanning galvanometer life test device, the global temperature-controlled laser scanning galvanometer life test device comprising:

[0006] A mounting fixture, the mounting fixture is used to fix the scanning galvanometer assembly, the scanning galvanometer assembly includes a lens;

[0007] A temperature control device, the temperature control device comprising a box and a temperature control unit, the temperature control unit is used to adjust the temperature in the box, the box is used to accommodate the mounting fixture and the scanning galvanometer assembly, and the box is provided with a light-transmitting hole;

[0008] A laser, the laser is located outside the box, the laser can emit laser light to the scanning galvanometer assembly, and the laser light can pass through the light-transmitting hole to reach the lens;

[0009] A position detector is located outside the box, and the lens can reflect the laser so that the laser passes through the light-transmitting hole to reach the position detector.

[0010] In one of the embodiments, the globally temperature-controlled laser scanning galvanometer life test device also includes an adjustment mechanism, which is located in the housing, and the mounting fixture is fixed on the adjustment mechanism. The adjustment mechanism can drive the mounting fixture to move along a first direction and a second direction, and the adjustment mechanism can also adjust the angle of the lens relative to the first direction.

[0011] In one embodiment, the adjustment mechanism includes a first adjustment component, the first adjustment component includes a first driving member, a first driving rod and a first adjustment platform, the first adjustment platform is fixed in the box body, the first driving member is fixed in the box body, the first driving rod is arranged at the output end of the first driving member, and the first driving member can drive the first driving rod to drive the first adjustment platform to move along the first direction.

[0012] In one embodiment, the adjustment mechanism includes a second adjustment component, the second adjustment component includes a second driving member, a second driving rod and a second adjustment platform, the second adjustment platform is fixed to the first adjustment platform, the second driving member is fixed to the first adjustment platform, the second driving rod is arranged at the output end of the second driving member, and the second driving member can drive the second driving rod to drive the second adjustment platform to move along the second direction.

[0013] In one embodiment, the adjustment mechanism includes an angle adjustment component, which includes a first rotating seat, a second rotating seat and a third driving member. The first rotating seat is fixed to the second adjustment platform, and the third driving member is fixed to the second adjustment platform. An arc groove is provided on the first rotating seat, and an arc protrusion is provided on the second rotating seat. The arc groove and the arc protrusion arc surface cooperate with each other, and the third driving member can drive the second rotating seat to rotate along the arc groove.

[0014] In one embodiment, the temperature control device also includes a heating component, which includes a heating tube and a heating motor. The heating tube is arranged on the inner wall of the box, and the heating motor is arranged at the bottom of the box. The temperature control unit can control the heating motor.

[0015] In one of the embodiments, a vibration isolation platform is further disposed in the box, the vibration isolation platform is disposed in the box, and the mounting fixture is fixed on the vibration isolation platform.

[0016] In one of the embodiments, the global temperature-controlled laser scanning galvanometer life test device further includes a mounting platform, the mounting platform is located outside the box, and the mounting platform is used to fix the laser and the position detector.

[0017] In one of the embodiments, the globally temperature-controlled laser scanning galvanometer life test device also includes a temperature sensor, which is arranged in the box body. The temperature sensor is electrically connected to the temperature control unit, and the temperature sensor can monitor the temperature of the scanning galvanometer assembly. The temperature control unit is used to adjust the temperature in the box body according to the temperature control monitored by the temperature sensor.

[0018] In the second aspect, a global temperature-controlled laser scanning galvanometer life test method is also provided in the embodiment of the present application, and the test is performed using the above-mentioned global temperature-controlled laser scanning galvanometer life test device. The global temperature-controlled laser scanning galvanometer life test method includes the following steps:

[0019] Using the adjustment mechanism to adjust the laser galvanometer assembly to zero position, and adjusting the lens installation angle so that the laser reflected by the lens can fall into the position detector;

[0020] Start the temperature control device and set the heating temperature to the test temperature T;

[0021] The temperature of the galvanometer motor is measured by the temperature sensor, and a life index test is performed after the temperature is stabilized.

[0022] Beneficial effects:

[0023] The embodiment of the present application provides a global temperature-controlled laser scanning galvanometer life test device and a test method. The global temperature-controlled laser scanning galvanometer life test device includes a mounting fixture, a temperature control device, a laser and a position detector. The temperature control device includes a box and a temperature control unit. The mounting fixture is located in the box. The scanning galvanometer assembly is fixed in the box by the mounting fixture. The control unit heats and controls the temperature in the box, thereby adjusting the temperature environment in which the scanning galvanometer assembly is located, and then cooperates with the laser and the position detector to detect the environmental adaptability of the scanning galvanometer assembly, thereby ensuring the product quality of the scanning galvanometer assembly. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 A schematic structural diagram of a laser scanning galvanometer life test device with global temperature control provided in some embodiments of the present application.

[0025] Figure 2 A schematic structural diagram of a mounting fixture and an adjustment mechanism for a global temperature-controlled laser scanning galvanometer life test device provided in some embodiments of the present application.

[0026] Figure 3 A schematic structural diagram of an adjustment mechanism of a global temperature-controlled laser scanning galvanometer life test device provided in some embodiments of the present application.

[0027] Figure 4A diagram showing the relationship between the deflection angle of a scanning galvanometer assembly and the displacement detected by a position detector of a laser scanning galvanometer life test device with global temperature control provided in some embodiments of the present application.

[0028] Figure 5 A graph showing the relationship between the deflection angle of a scanning galvanometer component and the displacement of a reflected light spot in a laser scanning galvanometer life test device with global temperature control provided in some embodiments of the present application.

[0029] Reference numerals:

[0030] 1. Temperature control device; 11. Box body; 12. Light transmission hole; 13. Vibration isolation table;

[0031] 2. Mounting fixture; 21. Mounting frame; 211. Base; 212. Connecting plate; 22. Fixing plate;

[0032] 3. Laser;

[0033] 4. Position detector;

[0034] 5. Adjustment mechanism; 51. First adjustment assembly; 511. First drive rod; 512. First adjustment platform; 52. Second adjustment assembly; 521. Second drive rod; 522. Second adjustment platform; 53. Angle adjustment assembly; 531. First rotating seat; 532. Second rotating seat;

[0035] 100, scanning galvanometer assembly; 101, lens; 102, galvanometer motor;

[0036] X, first direction; Y, second direction; Z, third direction. DETAILED DESCRIPTION

[0037] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0038] In the description of the present application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application.

[0039] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0040] In this application, unless otherwise clearly specified and limited, if the terms "installed", "connected", "connected", "fixed" and the like appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0041] In the present application, unless otherwise clearly specified and limited, if there is a description that a first feature is "above" or "below" a second feature, etc., or similar descriptions appear, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "above" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0042] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only implementation method.

[0043] First, see Figure 1-Figure 3 An embodiment of the present application provides a global temperature-controlled laser scanning galvanometer life test device, which includes a mounting fixture 2, a temperature control device 1, a laser 3 and a position detector 4.

[0044] In the embodiment of the present application, the mounting fixture 2 is used to fix the scanning galvanometer assembly 100, and the scanning galvanometer assembly 100 includes a lens 101; the temperature control device 1 includes a housing 11 and a temperature control unit, and the temperature control unit is used to adjust the temperature in the housing 11, and the housing 11 is used to accommodate the mounting fixture 2 and the scanning galvanometer assembly 100, and the housing 11 is provided with a light-transmitting hole; the laser 3 is located outside the housing 11, and the laser 3 can emit a laser to the scanning galvanometer assembly 100, and the laser can pass through the light-transmitting hole to reach the lens 101; the position detector 4 is located outside the housing 11, and the lens 101 can reflect the laser so that the laser passes through the light-transmitting hole to reach the position detector 4.

[0045] A laser scanning galvanometer life test device with global temperature control provided in an embodiment of the present application fixes the scanning galvanometer assembly 100 in a housing 11 by means of an installation fixture 2, and a control unit performs heating and temperature control on the housing 11, thereby adjusting the temperature environment in which the scanning galvanometer assembly 100 is located, and then cooperates with the laser 3 and the position detector 4 to detect the environmental adaptability of the scanning galvanometer assembly 100, thereby ensuring the product quality of the scanning galvanometer assembly 100.

[0046] It should be noted that the first direction X is the X direction, the second direction Y is the Y direction, the third direction Z is the Z direction, and the first direction X, the second direction Y and the third direction Z are perpendicular to each other.

[0047] like Figure 1-Figure 3 As shown, in some embodiments, the globally temperature-controlled laser scanning galvanometer life test device also includes an adjustment mechanism 5, which is located in the box 11, and the mounting fixture 2 is fixed on the adjustment mechanism 5. The adjustment mechanism 5 can drive the mounting fixture 2 to move along the first direction X and the second direction Y. The adjustment mechanism 5 can also adjust the angle of the lens 101 relative to the first direction X.

[0048] By arranging the adjustment mechanism 5 in the box body 11 and fixing the mounting fixture 2 to the adjustment mechanism 5, the mounting fixture 2 and the scanning galvanometer assembly 100 fixed on the mounting fixture 2 can be driven by the adjustment mechanism 5 to move along the first direction X and the second direction Y, and adjust the angle of the lens 101 relative to the first direction X, thereby greatly improving the movement range of the lens 101, and then improving the testing degree of the lens 101, so that the product quality of the scanning galvanometer assembly 100 is further improved.

[0049] like Figure 1-Figure 3 As shown, specifically, the adjustment mechanism 5 includes a first adjustment component 51, and the first adjustment component 51 includes a first driving member, a first driving rod 511 and a first adjustment platform 512. The first adjustment platform 512 is fixed in the box body 11, and the first driving member is fixed in the box body 11. The first driving rod 511 is arranged at the output end of the first driving member. The first driving member can drive the first driving rod 511 to drive the first adjustment platform 512 to move along the first direction X.

[0050] By driving the first driving rod 511 through the first driving member to drive the first adjustment platform 512 to move along the first direction X, the movement range of the lens 101 along the first direction X can be expanded, thereby improving the testing degree of the lens 101, so that the product quality of the scanning galvanometer assembly 100 is further improved, and the degree of automation of the laser scanning galvanometer life test device with global temperature control can be improved, so that the experimental efficiency is improved, thereby accelerating the production efficiency of the scanning galvanometer assembly 100.

[0051] like Figure 1-Figure 3 As shown, specifically, the adjustment mechanism 5 includes a second adjustment component 52, and the second adjustment component 52 includes a second driving member, a second driving rod 521 and a second adjustment platform 522. The second adjustment platform 522 is fixed to the first adjustment platform 512, the second driving member is fixed to the first adjustment platform 512, and the second driving rod 521 is arranged at the output end of the second driving member. The second driving member can drive the second driving rod 521 to drive the second adjustment platform 522 to move along the second direction Y.

[0052] By driving the second driving rod 521 through the second driving member to drive the second adjustment platform 522 to move along the second direction Y, the movement range of the lens 101 along the second direction Y can be expanded, thereby further improving the testing degree of the lens 101, so that the product quality of the scanning galvanometer assembly 100 is further improved, and the degree of automation of the laser scanning galvanometer life test device with global temperature control can be improved, so that the experimental efficiency is further improved, thereby accelerating the production efficiency of the scanning galvanometer assembly 100.

[0053] like Figure 1-Figure 3As shown, specifically, the adjustment mechanism 5 includes an angle adjustment component 53, the angle adjustment component 53 includes a first rotating seat 531, a second rotating seat 532 and a third driving member, the first rotating seat 531 is fixed to the second adjustment platform 522, the third driving member is fixed to the second adjustment platform 522, an arc groove is provided on the first rotating seat 531, and an arc protrusion is provided on the second rotating seat 532, the arc groove and the arc surface of the arc protrusion cooperate, and the third driving member can drive the second rotating seat 532 to rotate along the arc groove to adjust the angle of the lens 101 relative to the first direction X.

[0054] By setting an arc groove on the first rotating seat 531 and an arc protrusion on the second rotating seat 532, and driving the second rotating seat 532 to rotate along the arc groove through the third driving member, the angle of the lens 101 relative to the first direction X can be adjusted, thereby further improving the testing degree of the lens 101, and further improving the product quality of the scanning galvanometer assembly 100.

[0055] Specifically, the axial direction of the arc-shaped groove in the embodiment of the present application is the second direction Y.

[0056] like Figure 1-Figure 3 As shown, in some embodiments, the temperature control device 1 further includes a heating component, the heating component includes a heating tube and a heating motor, the heating tube is arranged on the inner wall of the box 11, the heating motor is arranged at the bottom of the box 11, and the temperature control unit can control the heating motor. By arranging the heating tube on the inner wall of the box 11 and heating the heating tube by the heating motor, the temperature inside the box 11 is increased. In addition, the switch of the heating element can be controlled by the temperature control unit to adjust the temperature inside the box 11.

[0057] like Figure 1-Figure 3 As shown, in some embodiments, a vibration isolation platform 13 is further disposed in the box body 11 . The vibration isolation platform 13 is disposed in the box body 11 , and the mounting fixture 2 is fixed on the vibration isolation platform 13 .

[0058] By setting up a vibration isolation table 13 in the box 11 and fixing the mounting fixture 2 on the vibration isolation table 13, the mounting fixture 2 can be cushioned, so that the lens 101 fixed on the mounting fixture 2 can be more stable, and the lens 101 can be adjusted more accurately, thereby making the detection result detected by the position detector more accurate and improving the experimental effect.

[0059] like Figure 1-Figure 3 As shown, in some embodiments, the global temperature-controlled laser scanning galvanometer life test device also includes a mounting platform, which is located outside the box 11 and is used to fix the laser 3 and the position detector 4.

[0060] In some embodiments, the mounting platform is further provided with a fixing member, and the fixing member is used to fix the laser 3 and the position detector 4 on the mounting platform.

[0061] By setting up a mounting platform to place the laser 3 and the position detector 4, and fixing the laser 3 and the position detector 4 on the mounting platform through fixing parts, the placement positions of the laser 3 and the position detector 4 can be fixed, thereby making the laser 3 and the position detector 4 more stable, making the test results more accurate, and by fixing the positions of the laser 3 and the position detector 4, the experimental efficiency can be improved.

[0062] like Figure 1-Figure 3 As shown, in some embodiments, the globally temperature-controlled laser scanning galvanometer life test device also includes a temperature sensor, which is disposed in the box 11. The temperature sensor is electrically connected to the temperature control unit. The temperature sensor can monitor the temperature of the scanning galvanometer assembly 100, and the temperature control unit is used to adjust the temperature in the box 11 according to the temperature monitored by the temperature sensor.

[0063] Specifically, the temperature control unit includes a control screen and a control board. The control screen is electrically connected to the temperature sensor and can display the temperature inside the box 11. The control board is electrically connected to the heating motor and can control the switch of the heating motor to adjust the temperature inside the box 11.

[0064] like Figure 1-Figure 3 As shown, in some embodiments, the mounting fixture 2 includes a mounting frame 21 and a fixing plate 22, the mounting frame 21 includes a base 211 and a connecting plate 212, the base 211 is fixed in the box body 11, the connecting plate 212 is extended along a third direction Z, the bottom of the connecting plate 212 is fixed on the base 211, the fixing plate 22 is fixedly connected to the connecting plate 212, and the fixing plate 22 is used to fix the scanning galvanometer assembly 100.

[0065] like Figure 1-Figure 3 As shown, in some embodiments, a slide rail is provided on the connecting plate 212, and the slide rail is extended along the third direction Z. The fixed plate 22 is slidably connected to the slide rail, and fasteners are provided on the fixed plate 22 for fixing the position of the fixed plate 22 on the slide rail.

[0066] By providing a slide rail on the connecting plate 212, the fixed plate 22 is slidably connected to the slide rail, so that the fixed plate 22 can slide along the third direction Z, thereby driving the scanning galvanometer assembly 100 to move along the third direction Z, thereby adjusting the position of the lens 101 in the third direction Z, thereby further improving the testing degree of the lens 101, and further improving the product quality of the scanning galvanometer assembly 100. In addition, the position of the fixed plate 22 on the slide rail is fixed by fasteners, thereby greatly improving the stability of the scanning galvanometer assembly 100 and improving the experimental quality.

[0067] Second, as Figure 4-Figure 5As shown, the embodiment of the present application also provides a global temperature-controlled laser scanning galvanometer life test method, the global temperature-controlled laser scanning galvanometer life test method uses the above-mentioned global temperature-controlled laser scanning galvanometer life test device to perform the test, and the global temperature-controlled laser scanning galvanometer life test method includes the following steps:

[0068] Use the adjustment mechanism 5 to adjust the laser galvanometer assembly to the zero position, and adjust the installation angle of the lens 101 so that the laser reflected by the lens 101 can fall into the position detector 4;

[0069] Start the temperature control device 1 and set the heating temperature to the test temperature T;

[0070] The temperature of the galvanometer motor 102 is measured by a temperature sensor, and a life index test is performed after the temperature is stabilized.

[0071] like Figure 4-Figure 5 As shown, in some embodiments, specifically, a global temperature-controlled laser scanning galvanometer life test device and a scanning galvanometer assembly 100 to be tested are started, the monochromatic laser 3 is turned on, and the lens 101 is placed at zero position, and the installation angle of the lens 101 is adjusted to ensure that the light spot appears on the position detector when the lens 101 is at the maximum deflection angle in both the positive and negative directions and when the lens 101 is at zero position.

[0072] In some embodiments, the life index test includes a test before the life test, and the test before the life test is an index test. The index test includes a maximum scanning angle test of the scanning galvanometer, a deflection accuracy test, a linearity test, and a zero deviation test.

[0073] In an embodiment of the present application, the life index test also includes a test during the life test. After the scanning galvanometer assembly 100 passes the pre-life test test, the life test test begins. The test time during the life test is 1500 hours, and the test cycle is 24 hours. An index test is carried out in each test cycle to test the maximum scanning angle, deflection accuracy, linearity, and zero position deviation of the scanning galvanometer assembly 100.

[0074] In the embodiment of the present application, the life index test also includes a post-life test test. After the scanning galvanometer assembly 100 completes the 1500-hour life test, the life test is stopped and a final index test is carried out.

[0075] In some embodiments, after completing the above life index test, if the scanning galvanometer assembly 100 has not failed and all index tests meet the requirements, it is considered that the scanning galvanometer assembly 100 has passed the life test at temperature T.

[0076] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0077] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the patent application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent application shall be subject to the attached claims.

Claims

1. A global temperature controlled laser scanning galvanometer life test device, characterized in that: The global temperature controlled laser scanning galvanometer life test device comprises: A mounting fixture, the mounting fixture is used to fix the scanning galvanometer assembly, the scanning galvanometer assembly includes a lens; A temperature control device, the temperature control device comprising a box and a temperature control unit, the temperature control unit is used to adjust the temperature in the box, the box is used to accommodate the mounting fixture and the scanning galvanometer assembly, and the box is provided with a light-transmitting hole; A laser, the laser is located outside the box, the laser can emit laser light to the scanning galvanometer assembly, and the laser light can pass through the light-transmitting hole to reach the lens; A position detector is located outside the box, and the lens can reflect the laser so that the laser passes through the light-transmitting hole to reach the position detector.

2. The global temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The globally temperature-controlled laser scanning galvanometer life test device also includes an adjustment mechanism, which is located in the box body. The mounting fixture is fixed on the adjustment mechanism. The adjustment mechanism can drive the mounting fixture to move along a first direction and a second direction. The adjustment mechanism can also adjust the angle of the lens relative to the first direction.

3. The global temperature controlled laser scanning galvanometer life test device according to claim 2, characterized in that: The adjustment mechanism includes a first adjustment component, which includes a first driving member, a first driving rod and a first adjustment platform. The first adjustment platform is fixed in the box body, the first driving member is fixed in the box body, the first driving rod is arranged at the output end of the first driving member, and the first driving member can drive the first driving rod to drive the first adjustment platform to move along the first direction.

4. The global temperature controlled laser scanning galvanometer life test device according to claim 3, characterized in that: The adjustment mechanism includes a second adjustment component, the second adjustment component includes a second driving member, a second driving rod and a second adjustment platform, the second adjustment platform is fixed to the first adjustment platform, the second driving member is fixed to the first adjustment platform, the second driving rod is arranged at the output end of the second driving member, and the second driving member can drive the second driving rod to drive the second adjustment platform to move along the second direction.

5. The global temperature controlled laser scanning galvanometer life test device according to claim 4, characterized in that: The adjustment mechanism includes an angle adjustment component, which includes a first rotating seat, a second rotating seat and a third driving member. The first rotating seat is fixed to the second adjustment platform, and the third driving member is fixed to the second adjustment platform. An arc groove is provided on the first rotating seat, and an arc protrusion is provided on the second rotating seat. The arc groove and the arc surface of the arc protrusion cooperate with each other, and the third driving member can drive the second rotating seat to rotate along the arc groove.

6. The global temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The temperature control device also includes a heating component, which includes a heating tube and a heating motor. The heating tube is arranged on the inner wall of the box, and the heating motor is arranged on the bottom of the box. The temperature control unit can control the heating motor.

7. The global temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: A vibration isolation platform is also provided in the box body, and the vibration isolation platform is provided in the box body, and the mounting fixture is fixed on the vibration isolation platform.

8. The global temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The global temperature-controlled laser scanning galvanometer life test device further includes a mounting platform, which is located outside the box and is used to fix the laser and the position detector.

9. The global temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The globally temperature-controlled laser scanning galvanometer life test device also includes a temperature sensor, which is arranged in the box body. The temperature sensor is electrically connected to the temperature control unit. The temperature sensor can monitor the temperature of the scanning galvanometer assembly. The temperature control unit is used to adjust the temperature in the box body according to the temperature control monitored by the temperature sensor.

10. A global temperature controlled laser scanning galvanometer life test method, characterized in that: The test is conducted using the global temperature controlled laser scanning galvanometer life test device as described in any one of claims 1 to 9, and the global temperature controlled laser scanning galvanometer life test method comprises the following steps: Using the adjustment mechanism to adjust the scanning galvanometer assembly to zero position, and adjusting the lens installation angle so that the laser reflected by the lens can fall into the position detector; Start the temperature control device and set the heating temperature to the test temperature T; The temperature sensor is used to measure the temperature of the galvanometer motor, and after the temperature is stabilized, a life index test is performed.

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