Weak driving level conversion circuit test system and method
By designing functional modules to reduce transmission impedance and unidirectional transmission characteristics, the problem of signal oscillation in ATE equipment testing of weak drive level converters was solved, achieving efficient batch testing and cost reduction.
Patent Information
- Application Number
- CN202411646771.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-18
- Publication Date
- 2025-02-14
AI Technical Summary
In existing technologies, weak drive level converters cause signal oscillations due to capacitive loads during ATE equipment testing, making batch testing impossible, resulting in low testing efficiency and high costs.
A weak drive level conversion circuit test system was designed. The system reduces the transmission impedance between the device under test and the testing equipment through functional modules, and avoids signal oscillation by utilizing unidirectional transmission characteristics. It also enables batch testing by combining test stations and connectors.
It effectively reduces signal oscillation, improves testing efficiency, enables batch testing, and reduces testing costs.
Smart Images
Figure CN119438867A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of electronic device testing, and in particular to a weak drive level conversion circuit testing system and method. Background Art
[0002] For weak drive level converters, this type of level converter has the characteristics of weak driving capability and is sensitive to capacitive loads. The internal wiring of the ATE (Automatic Test Equipment) equipment used for testing is long and complex, and there are many unavoidable capacitive loads. Therefore, when using ATE for testing, the input and output waveforms will oscillate, and the input and output signals cannot be identified. It is difficult to use ATE equipment for batch testing. Most of the functions and performance tests of this model are achieved by designing board-level test circuits. This method is not easy to achieve batch testing, and the test efficiency is low. For third-party testing organizations, the development and testing costs are high.
[0003] Therefore, a solution is needed that can reduce the influence of capacitive load on the device under test and improve the load driving capability of the device. Summary of the invention
[0004] In view of this, the purpose of the present application is to provide a weak drive level conversion circuit testing system and method that overcomes the above problems or at least partially solves the above problems.
[0005] Based on the above purpose, the first aspect of the present application provides a weak drive level conversion circuit testing system, including:
[0006] The device under test comprises a first terminal and a second terminal;
[0007] A detection device connected to the first end and the second end respectively, the detection device is used to provide power to the device under test, and the detection device located at the first end outputs a device under test output detection signal to the device under test, and the detection device located at the second end receives an input signal of the device under test;
[0008] The functional module is connected between the device under test and the detection equipment, and is used to reduce the transmission impedance between the device under test and the detection equipment and to reduce the signal oscillation of the device under test by utilizing the unidirectional transmission characteristic.
[0009] In some embodiments, it further includes a first connector connected between the device under test and the functional module;
[0010] The first connector includes a gate switch, a first branch and a second branch. In a first state, the gate switch is connected to the first branch, and the first branch connects the device under test and the functional module.
[0011] In the second state, the selection switch is connected to the second branch, and the second branch connects the device under test and the detection equipment.
[0012] In some embodiments, the functional module includes a signal amplification module, and the signal amplification module is used to amplify the detection signal transmitted to the device under test.
[0013] In some embodiments, the functional module further includes a third terminal and a fourth terminal, wherein the functional module is configured such that a signal is unidirectionally transmitted from the third terminal to the fourth terminal, or unidirectionally transmitted from the fourth terminal to the third terminal.
[0014] In some embodiments, in a first state, the first end of the device under test receives a signal unidirectionally transmitted from the detection device at the first end to the functional module, and unidirectionally transmits an input signal to the detection device to the functional module at the second end;
[0015] Or the second end of the device under test receives the signal unidirectionally transmitted from the detection device located at the second end to the functional module, and unidirectionally transmits the signal value of the detection device to the functional module located at the second end.
[0016] In some embodiments, a test station is further included, and the test station, the functional module and the first connector are all arranged on the same test board;
[0017] The test station is adapted to the contour of the device under test, and a spring pin is provided at the bottom of the test station for connecting the first end and the second end of the device under test respectively.
[0018] In some embodiments, a second connector is provided on a side of the test board away from the test station and the functional module, the second connector is respectively connected to the functional module and the first connector, and the second connector has a pin, which is connected to the detection device through the pin.
[0019] In some embodiments, a filter capacitor is provided between the second connector, the functional module and the first connector.
[0020] A second aspect of the present application provides a weak drive level conversion circuit testing method, which is applicable to the weak drive level conversion circuit testing system described in the first aspect, and the method includes:
[0021] Powering up the detection device at the first end of the device under test to provide and output a detection signal;
[0022] The detection signal passes through the functional module, and the functional module is used to reduce the impedance between the device under test and the detection equipment and reduce the signal oscillation of the device under test;
[0023] The input signal is received by a detection device at the second end of the device under test, and the input signal is compared with a preset vector to determine the accuracy of the input signal.
[0024] In some embodiments, the method further comprises:
[0025] Directly connect the detection equipment at the first end of the device under test to the first end of the device under test, directly connect the detection equipment at the second end of the device under test to the second end of the device under test, gradually increase the current of the device under test using the detection equipment at the first end, and measure the voltage using the detection equipment at the second end; and gradually increase the voltage of the device under test using the detection equipment at the first end, and measure the current using the detection equipment at the second end to determine the performance of the device under test.
[0026] As can be seen from the above, the weak drive level conversion circuit test system and method provided by the present application, in the ATE test environment, a new test circuit is designed, when the functional test is performed, that is, in the first state, the device under test is connected to the detection device through the functional module, and the functional module is used as the next level circuit of the device under test, which reduces the transmission distance between the device under test and the next level circuit, reduces the capacitive load, and further, utilizes the unidirectional transmission characteristics of the functional module, because the signal transmission direction is unique, avoids the signal from repeatedly oscillating. The detection device compares the input signal of the device under test with the preset vector to determine the accuracy of the input signal, thereby determining the function of the device under test. When the performance test is performed, that is, in the second state, the device under test is directly connected to the detection device, and the performance of the device under test is determined by AC pressure measurement and pressurized current measurement. In addition, the setting of the test station realizes batch testing of the device under test, and the test station, the functional module, the first connector and the second connector are all integrated on the test board, reducing the additional wiring setting and realizing the lightweight of the test circuit. BRIEF DESCRIPTION OF THE DRAWINGS
[0027] In order to more clearly illustrate the technical solutions in the present application or related technologies, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0028] Figure 1 A schematic diagram of a weak drive level conversion circuit test system according to an embodiment of the present application;
[0029] Figure 2 A schematic diagram of a device under test according to an embodiment of the present application;
[0030] Figure 3 This is a schematic diagram of the functional modules of an embodiment of the present application;
[0031] Figure 4 This is a flow chart of a weak drive level conversion circuit testing method according to an embodiment of the present application. DETAILED DESCRIPTION
[0032] In order to make the objectives, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in combination with specific embodiments and with reference to the accompanying drawings.
[0033] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present application should be the usual meanings understood by people with ordinary skills in the field to which the present application belongs. The "first", "second" and similar words used in the embodiments of the present application do not represent any order, quantity or importance, but are only used to distinguish different components. "Including" or "comprising" and similar words mean that the elements or objects appearing in front of the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.
[0034] As described in the background technology, for weak-drive level converters, such as XX0108, this type of level converter has the characteristics of weak driving capability and is sensitive to capacitive loads. The internal wiring of the ATE equipment used for testing is long and loaded, and there are many unavoidable capacitive loads. At the same time, the long wiring increases the transmission distance between the ATE equipment and the weak-drive level converter. Therefore, when using the ATE equipment for testing, the input and output waveforms will oscillate, and the input and output signals cannot be identified.
[0035] Different weak-drive level converters have the same problem, so batch testing cannot be achieved during the testing of the weak-drive level converters.
[0036] Based on this, the present application provides a weak drive level conversion circuit testing system, including:
[0037] The device under test 1 comprises a first end 11 and a second end 12;
[0038] A detection device 4 connected to the first end 11 and the second end 12 respectively, the detection device 4 is used to provide power to the device under test 1, and the detection device located at the first end 11 or the second end 12 outputs a detection signal of the device under test 1 to the device under test 1, and the detection device located at the second end 12 or the first end 11 receives an input signal of the device under test 1;
[0039] The functional module 2 is connected between the device under test 1 and the detection device 4 and is used to reduce the impedance between the device under test 1 and the detection device 4 and reduce the signal oscillation of the device under test 1 by using the unidirectional transmission characteristic.
[0040] In some exemplary embodiments, the device under test 1 is a weak drive level converter, for example Figure 2 The XX0108 type weak drive level converter shown in the figure has a first terminal 11 which can be Figure 2 The second end 12 may be on the side where the middle pins A1, A2, A3, A4, A5, A6, A7, A8 are located. Figure 2 In the embodiment of the present application, the side where the pins B1, B2, B3, B4, B5, B6, B7, and B8 are located is used as the first end 11, and the side where the pins B1, B2, B3, B4, B5, B6, B7, and B8 are located is used as the second end 12.
[0041] In some exemplary embodiments, the detection device 4 can be ATE (Automatic Test Equipment). The main reasons for the long and complex internal wiring of the ATE device include: first, the main function of the ATE device is to perform functional and performance tests on electronic components. In order to achieve this function, the ATE needs to process a large amount of signal data, including basic physical parameters of time, phase, voltage, and current. These signals and data need to be transmitted and processed inside the ATE, so long wiring is required to connect various components and modules. Second, ATE is usually composed of multiple modules, such as test heads, signal generators, data acquisition cards, computer control systems, etc. These modules need to be connected to each other to achieve data transmission and functional systems, so the internal wiring is relatively long and complex. Third, the ATE contains a variety of test circuits and modules, such as power supply circuits, signal conditioning circuits, data acquisition circuits, etc. The connection between these circuits and modules also requires long wiring to transmit test signals and data. Therefore, a long circuit will bring capacitive loads. Compared with a level converter with weak driving capability, the input and output waveforms will oscillate when using ATE for testing.
[0042] In the present application, the functional module 2 is used as the next level circuit node of the device under test 1, and the output signal of the detection device 4 is directly transmitted to the device under test 1 through the functional module 2, so as to avoid the device under test 1 being directly connected to the detection device 4 so as to use the detection device 4 as the next level circuit of the device under test 1. By reducing the distance between the device under test 1 and the functional module 2, the transmission distance between the device under test 1 and the detection device 4 is reduced, and the transmission impedance is reduced. At the same time, the unidirectional transmission characteristics of the functional module 2 are used to avoid the signal oscillation caused by the weak driving load capacity of the device under test 1, so as to achieve the effect of reducing the signal oscillation. The detection device 4 compares the input signal with the preset vector by comparing the input signal with the preset vector to determine the correctness of the input signal. The preset vector is the standard signal vector designed for the device under test 1. When the input signal of the detection device 4 is the same as the preset vector or within the error range, the function of the device under test 1 meets the use standard, and when the input signal of the detection device 4 is different from the preset vector or outside the error range, the function of the device under test 1 does not meet the use standard.
[0043] It should be noted that, during the functional test of the device under test 1, the detection device 4 at the first end 11 of the device under test 1 is used to output a detection signal, and the detection device 4 at the second end 12 is used to detect an input signal. The first end 11 and the second end 12 are not directional here, and the detection device 4 at the second end 12 can also be used to output a detection signal, and the detection device 4 at the first end 11 can be used to detect an input signal.
[0044] In some embodiments, a first connector 5 is further included, wherein the first connector 5 is connected between the device under test 1 and the functional module 2; the first connector 5 includes a gating switch, a first branch and a second branch, and in a first state, the gating switch is connected to the first branch, and the first branch connects the device under test 1 and the functional module 2;
[0045] In the second state, the selection switch is connected to the second branch, and the second branch connects the device under test 1 and the detection equipment 4 .
[0046] In this embodiment, the first state is a functional test state. In the first state, the functional module 2 is in the test circuit, and the functional module 2 is used to reduce the transmission impedance between the detection device 4 and the device under test 1, while reducing the signal oscillation of the device under test, and avoiding the influence of the capacitive load on the test of the device under test 1. The detection device 4 compares the input signal with the preset vector to determine the correctness of the input signal, that is, the yield rate of the device under test 1.
[0047] The second state is a performance test state. In the second state, the device under test 1 is directly connected to the detection device 4. Current is applied to the detection device 4 at the first end 11 of the device under test 1, and the voltage of the device under test 1 is measured through the detection device 4 at the second end 12. Alternatively, voltage is applied to the detection device 4 at the first end 11 of the device under test 1, and the current of the device under test 1 is measured through the detection device 4 at the second end, that is, current is added to measure voltage or pressure is added to measure current. If the voltage or current measured by the detection device 4 at the second end 12 of the device under test 1 increases during the process of adding current or applying pressure, it proves that the performance of the device under test 1 meets the design requirements.
[0048] In some optional embodiments, the gating switch can be replaced by a relay to achieve its gating function.
[0049] In some embodiments, the functional module 2 includes a signal amplification module, and the signal amplification module is used to amplify the detection signal transmitted to the device under test 1.
[0050] In this embodiment, the signal amplification module is used to amplify the detection signal of the detection device 4, so as to realize a stronger load driving capability of the functional module 2 relative to the device under test 1. At the same time, the detection signal is amplified and the amplified detection signal is transmitted to the device under test 1, thereby reducing the transmission impedance when the device under test 1 is directly connected to the detection device 4.
[0051] In some embodiments, the functional module 2 further includes a third terminal 22 and a fourth terminal 23 , wherein the functional module 2 is configured for unidirectional transmission of signals from the third terminal 22 to the fourth terminal 23 , or from the fourth terminal 23 to the third terminal 22 .
[0052] In some exemplary embodiments, reference Figure 3 As shown, it is a diagram of a functional module 2 provided in an embodiment of the present application, wherein the third end 22 can be the side where pins A1, A2, A3, A4, A5, A6, A7, and A8 are located, and the fourth end 23 can be the side where pins B1, B2, B3, B4, B5, B6, B7, and B8 are located. Correspondingly, the third end 22 can also be the side where pins B1, B2, B3, B4, B5, B6, B7, and B8 are located, and the fourth end 23 can also be the side where pins A1, A2, A3, A4, A5, A6, A7, and A8 are located. No specific limitation is made here, but if the third end 22 is pin A1, then the fourth end 23 is pin B1 accordingly. In the embodiment of the present application, the side where pins A1, A2, A3, A4, A5, A6, A7, and A8 are located is used as the third end 22, and the side where pins B1, B2, B3, B4, B5, B6, B7, and B8 are located is used as the fourth end 23.
[0053] pass Figure 1 It can be seen that the detection device 4 and the functional module 2 at the first end 11 and the second end 12 of the device under test 1 are symmetrically arranged. In the first state, the detection device 4 at the first end 11 of the device under test 1 sends a detection signal, and the detection device 4 at the first end 11 controls the levels of the DIR end and the OE end in the functional module 2, so that the detection signal is unidirectionally transmitted from the third end 22 to the fourth end 23 of the functional module 2. The detection device 4 at the second end 12 of the device under test 1 receives an input signal, and the detection device 4 at the second end 12 controls the levels of the DIR end and the OE end in the functional module 2, so that the input signal is unidirectionally transmitted from the fourth end 23 to the third end 22. By using unidirectional transmission, the only input and output direction of the signal is determined, and the signal oscillation caused by the repeated signal caused by the weak driving load capacity of the device under test 1 is avoided, so as to achieve the effect of reducing signal oscillation.
[0054] In some embodiments, in the first state, the first end 11 of the device under test 1 receives a signal unidirectionally transmitted from the detection device 4 box function module 2 located at the first end 11, and unidirectionally transmits an input signal to the function module 2 located at the second end 12 to the detection device 4;
[0055] Or the second end 12 of the device under test 1 receives the signal unidirectionally transmitted from the detection device 4 located at the second end 12 to the functional module 2 , and unidirectionally transmits the signal value of the detection device 4 to the functional module 2 located at the second end 12 .
[0056] In some exemplary embodiments, in the first state, the detection device 4 at the first end 11 of the device under test 1 sends a detection signal, and the detection device 4 at the first end 11 controls the levels of the DIR end and the OE end in the functional module 2, so that the detection signal is unidirectionally transmitted from the third end 22 to the fourth end 23 of the functional module 2. The detection device 4 at the second end 12 of the device under test 1 receives an input signal, and the detection device 4 at the second end 12 controls the levels of the DIR end and the OE end in the functional module 2, so that the input signal is unidirectionally transmitted from the fourth end 23 to the third end 22. By using unidirectional transmission, the only input and output direction of the signal is determined, and the signal oscillation caused by the weak driving load capacity of the device under test 1 is avoided, thereby achieving the effect of reducing signal oscillation.
[0057] In other exemplary embodiments, in the first state, the detection device 4 at the second end 12 of the device under test 1 sends a detection signal, and the detection device 4 at the second end 12 controls the levels of the DIR end and the OE end in the functional module 2, so that the detection signal is unidirectionally transmitted from the third end 22 to the fourth end 23 of the functional module 2. The detection device 4 at the first end 11 of the device under test 1 receives an input signal, and the detection device 4 at the first end 11 controls the levels of the DIR end and the OE end in the functional module 2, so that the input signal is unidirectionally transmitted from the fourth end 23 to the third end 22. By using unidirectional transmission, the only input and output direction of the signal is determined, and the signal oscillation caused by the weak driving load capacity of the device under test 1 is avoided, thereby achieving the effect of reducing signal oscillation.
[0058] In some embodiments, a test station is further included, and the test station, the functional module 2 and the first connector 5 are all arranged on the same test board;
[0059] The test station is adapted to the contour of the device under test 1 , and a spring pin is provided at the bottom of the test station for connecting the first end 11 and the second end 12 of the device under test 1 .
[0060] The test station, the functional module 2 and the first connector 5 are all arranged on the test board, and the corresponding wiring design is performed using the performance of the test board to achieve interconnection between different devices and reduce additional wiring.
[0061] The test station is adapted to the contour of the device under test 1. During the test of the device under test 1, the device under test 1 is directly placed on the corresponding test station to achieve function and performance testing without the need to design a special test circuit. At the same time, for batch testing, the test station can also be directly used to perform corresponding tests. Further, a pogo pin is used to connect the device under test 1 to the test station, which facilitates the testing of the device under test 1 at any time. The pogo pin serves as a connector between the test station and the device under test 1, which can reduce the interference of the frequency and high heat generation on the device under test 1.
[0062] In some optional embodiments, the test station is pluggably connected to the test board.
[0063] In some optional embodiments, a second connector 3 is provided on the side of the test board away from the test station and the functional module 2, and the second connector 3 is respectively connected to the functional module 2 and the first connector 5, and the second connector 3 has a pin and is connected to the detection device 4 through the pin.
[0064] A second connector 3 is arranged on the other side of the test board. The second connector 3 is a pin-type connector. The pin-type connector is used for its connection stability and reliability, and can realize the stable connection between the test board and the detection equipment 4. In addition, the pin-type connector has a larger contact surface, which realizes the effective connection between the test board and the detection equipment 4, avoids the possibility of false connection, and also avoids inaccurate detection results caused by false connection.
[0065] In some embodiments, a filter capacitor is provided between the second connector 3 and the functional module 2 and the first connector 5. Through the design of the filter capacitor, during the functional test of the device under test 1, noise interference and clutter interference in the detection signal are eliminated.
[0066] The weak drive level conversion circuit test system provided by the embodiment of the present application designs a new test circuit. When performing a functional test, that is, in the first state, the device under test 1 is connected to the detection device 4 through the functional module 2, and the functional module 2 is used as the next-level circuit of the device under test 1, which reduces the transmission distance between the device under test 1 and the next-level circuit, reduces the capacitive load, and further, utilizes the unidirectional transmission characteristics of the functional module 2. Since the signal transmission direction is unique, the signal oscillation is avoided repeatedly. The detection device 4 compares the input signal of the device under test 1 with the preset vector to determine the accuracy of the input signal, thereby determining the function of the device under test 1. When performing a performance test, that is, in the second state, the device under test 1 is directly connected to the detection device 4, and the performance of the device under test 1 is determined by AC pressure measurement and pressurized current measurement. In addition, the setting of the test station realizes batch testing of the device under test 1, and the test station, the functional module 2, the first connector 5 and the second connector 3 are all integrated on the test board, reducing the additional wiring setting and realizing the lightweight of the test circuit.
[0067] Based on the same inventive concept, Figure 4 As shown, an embodiment of the present application provides a weak drive level conversion circuit testing method, which is applicable to the weak drive level conversion circuit testing system described in any of the above embodiments, including:
[0068] S10, powering up the detection device at the first end of the device under test and providing an output detection signal.
[0069] The detection device is used as a power source to provide current to the entire test circuit, and a detection signal is output to the device under test through the functional module.
[0070] S20, the detection signal passes through the functional module, and the functional module is used to reduce the impedance between the device under test and the detection equipment, and the signal oscillation of the device under test is reduced by the unidirectional transmission of the functional module.
[0071] By utilizing the unidirectional transmission characteristics of the functional module, the signal oscillation caused by the weak driving load capacity of the device under test can be avoided, thereby reducing the signal oscillation.
[0072] S30, using a detection device at the second end or the first end of the device under test to receive the input signal, and comparing the input signal with a preset vector to determine the accuracy of the input signal.
[0073] The detection device compares the input signal with the preset vector to determine the correctness of the input signal. The preset vector is a standard signal vector designed for the device under test. When the input signal of the detection device is the same as the preset vector or within the error range, the function of the device under test meets the use standard. When the input signal of the detection device is different from the preset vector or outside the error range, the function of the device under test does not meet the use standard.
[0074] In some embodiments, the method further comprises:
[0075] Directly connect the detection equipment at the first end of the device under test to the first end of the device under test, directly connect the detection equipment at the second end of the device under test to the second end of the device under test, gradually increase the current of the device under test using the detection equipment at the first end, and measure the voltage using the detection equipment at the second end; and gradually increase the voltage of the device under test using the detection equipment at the first end, and measure the current using the detection equipment at the second end to determine the performance of the device under test.
[0076] In the second state, the device under test is directly connected to the detection equipment, and current is applied to the detection equipment at the first end of the device under test, and the voltage of the device under test is measured through the detection equipment at the second end. Alternatively, voltage is applied to the detection equipment at the first end of the device under test, and the current of the device under test is measured through the detection equipment at the second end, that is, current is added to measure voltage or pressure is added to measure current. If the voltage or current measured by the detection equipment at the second end of the device under test increases during the process of adding current or pressure, it proves that the performance of the device under test meets the design requirements.
[0077] Those skilled in the art should understand that the discussion of any of the above embodiments is merely illustrative and is not intended to imply that the scope of the present application (including the claims) is limited to these examples. In line with the concept of the present application, the technical features in the above embodiments or different embodiments may be combined, the steps may be implemented in any order, and there are many other variations of the different aspects of the embodiments of the present application as described above, which are not provided in detail for the sake of simplicity.
[0078] In addition, to simplify the description and discussion, and in order not to make the embodiments of the present application difficult to understand, the known power supply / ground connection with the integrated circuit (IC) chip and other components may or may not be shown in the provided drawings. In addition, the device can be shown in the form of a block diagram to avoid making the embodiments of the present application difficult to understand, and this also takes into account the fact that the details of the implementation of these block diagram devices are highly dependent on the platform to be implemented in the embodiments of the present application (that is, these details should be fully within the scope of understanding of those skilled in the art). In the case of elaborating specific details (e.g., circuits) to describe exemplary embodiments of the present application, it is obvious to those skilled in the art that the embodiments of the present application can be implemented without these specific details or when these specific details are changed. Therefore, these descriptions should be considered to be illustrative rather than restrictive.
[0079] Although the present application has been described in conjunction with specific embodiments of the present application, many replacements, modifications and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may use the embodiments discussed.
[0080] The embodiments of the present application are intended to cover all such substitutions, modifications and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the embodiments of the present application should be included in the scope of protection of the present application.
Claims
1. A weak drive level conversion circuit test system, characterized in that: include: The device under test comprises a first end and a second end; A detection device connected to the first end and the second end respectively, the detection device is used to provide power to the device under test, and the detection device located at the first end outputs a device under test output detection signal to the device under test, and the detection device located at the second end receives an input signal of the device under test; The functional module is connected between the device under test and the detection equipment, and is used to reduce the transmission impedance between the device under test and the detection equipment and to reduce the signal oscillation of the device under test by utilizing the unidirectional transmission characteristic.
2. The weak drive level conversion circuit test system according to claim 1, characterized in that: Also included is a first connector, the first connector being connected between the device under test and the functional module; The first connector includes a gate switch, a first branch and a second branch. In a first state, the gate switch is connected to the first branch, and the first branch connects the device under test and the functional module. In the second state, the selection switch is connected to the second branch, and the second branch connects the device under test and the detection equipment.
3. The weak drive level conversion circuit test system according to claim 2, characterized in that: The functional module includes a signal amplification module, and the signal amplification module is used to amplify the detection signal transmitted to the device under test.
4. The weak drive level conversion circuit test system according to claim 2, characterized in that: The functional module further includes a third terminal and a fourth terminal, wherein the functional module is configured such that a signal is unidirectionally transmitted from the third terminal to the fourth terminal, or unidirectionally transmitted from the fourth terminal to the third terminal.
5. The weak drive level conversion circuit test system according to claim 4, characterized in that: In a first state, the first end of the device under test receives a signal unidirectionally transmitted from the detection device at the first end to the functional module, and unidirectionally transmits an input signal to the detection device to the functional module at the second end; Or the second end of the device under test receives the signal unidirectionally transmitted from the detection device located at the second end to the functional module, and unidirectionally transmits the signal value of the detection device to the functional module located at the second end.
6. The weak drive level conversion circuit test system according to claim 2, characterized in that: It also includes a test station, wherein the test station, the functional module and the first connector are all arranged on the same test board; The test station is adapted to the contour of the device under test, and a spring pin is provided at the bottom of the test station for connecting the first end and the second end of the device under test respectively.
7. The weak drive level conversion circuit test system according to claim 6, characterized in that: A second connector is provided on one side of the test board away from the test station and the functional module. The second connector is connected to the functional module and the first connector respectively. The second connector has a pin and is connected to the detection device through the pin.
8. The weak drive level conversion circuit test system according to claim 7, characterized in that: A filter capacitor is provided between the second connector, the functional module and the first connector.
9. A method for testing a weak drive level conversion circuit, characterized in that: The method for testing a weak drive level conversion circuit according to any one of claims 1 to 8 comprises: Powering up the detection device at the first end of the device under test to provide and output a detection signal; The detection signal passes through the functional module, and the functional module is used to reduce the impedance between the device under test and the detection equipment and reduce the signal oscillation of the device under test; The input signal is received by a detection device at the second end of the device under test, and the input signal is compared with a preset vector to determine the accuracy of the input signal.
10. The method for testing a weak drive level conversion circuit according to claim 9, characterized in that: The method further comprises: Directly connect the detection equipment at the first end of the device under test to the first end of the device under test, directly connect the detection equipment at the second end of the device under test to the second end of the device under test, gradually increase the current of the device under test using the detection equipment at the first end, and measure the voltage using the detection equipment at the second end; and gradually increase the voltage of the device under test using the detection equipment at the first end, and measure the current using the detection equipment at the second end to determine the performance of the device under test.