Audio chip test method and device based on UVM test platform, and storage medium

Abstract

The invention relates to an audio signal processing technology, and discloses an audio chip test method and device based on a UVM test platform, and a storage medium, and the method comprises the steps: generating an audio signal through an HDA / I2S detector based on the UVM test platform; outputting the audio signal to an audio chip and a contrast board of a UVM test platform; wherein the audio chip receives an audio signal based on an HDA / I2S interface, converts the audio signal into a corresponding analog signal and a corresponding digital signal, and outputs the analog signal and the digital signal to the UVM test platform; analyzing the audio signal based on the contrast board to obtain audio recording and audio playback, and then generating expected data; the comparison board generates sampling data according to the analog signal and the digital signal output by the audio chip; and comparing the sampling data with expected data to generate a test result of the audio chip. The invention further discloses a control device. The invention aims to improve the efficiency of testing the audio chip of the high-fidelity audio standard.

Description

Technical Field

[0001] The present application relates to the technical field of audio signal processing, and in particular to an audio chip testing method, a control device, a computer device, and a computer-readable storage medium based on a UVM testing platform. Background Art

[0002] With the rapid development of digital audio technology, audio chips are becoming more and more important in modern electronic devices. Audio chips are commonly used in a variety of consumer electronic products such as mobile phones, tablets, and audio systems, and are responsible for processing and outputting high-quality audio signals. In order to ensure that these audio chips can work properly and provide excellent audio performance, it is crucial to develop efficient testing methods.

[0003] Most traditional audio chip testing methods rely on hardware testing equipment and manual operations, which not only makes the testing process cumbersome and inefficient, but also makes it difficult to ensure consistency and repeatability. In addition, the ability to capture and analyze signals during the test process also limits the comprehensive evaluation of the complex performance of audio chips, especially for performance testing under high-fidelity audio standards (such as HDA / I2S interfaces).

[0004] The above contents are only used to assist in understanding the technical solution of the present application and do not constitute an admission that the above contents are prior art. Summary of the invention

[0005] The main purpose of this application is to provide an audio chip testing method, a control device, a computer device and a computer-readable storage medium based on a UVM test platform, aiming to improve the efficiency of testing audio chips of high-fidelity audio standards.

[0006] To achieve the above purpose, the present application provides an audio chip testing method based on a UVM test platform, comprising the following steps:

[0007] HDA / I2S (High Definition Audio / Inter-IC Sound) detector based on UVM (Universal Verification Methodology) test platform to generate audio signals;

[0008] Output the audio signal to the control board of the audio chip and the UVM test platform; wherein, after the audio chip receives the audio signal based on the HDA / I2S interface, it converts it into corresponding analog signals and digital signals, and outputs the analog signals and digital signals to the UVM test platform;

[0009] The control board analyzes the audio signal, obtains the audio recording and the audio playback, and generates the expected data; and the control board generates the sampling data according to the analog signal and the digital signal output by the audio chip;

[0010] Compare the sampled data with the expected data to generate the test results of the audio chip.

[0011] Optionally, the audio chip testing method based on the UVM test platform also includes:

[0012] When comparing the sampled data with the expected data, a first feature quantity corresponding to the sampled data and a second feature quantity corresponding to the expected data are calculated using a fast Fourier transform;

[0013] The first feature quantity is compared with the second feature quantity.

[0014] Optionally, the step of comparing the sampled data with the expected data to generate a test result of the audio chip includes:

[0015] If the sampled data is consistent with the expected data, the test result of the generated audio chip is passed;

[0016] If the sampled data is inconsistent with the expected data, the test result of the generated audio chip is test failure.

[0017] Optionally, the audio chip testing method based on the UVM test platform also includes:

[0018] If the difference between the sampled data and the expected data is within a reasonable deviation range, the sampled data is judged to be consistent with the expected data;

[0019] If the difference between the sampled data and the expected data is not within a reasonable deviation range, it is determined that the sampled data is inconsistent with the expected data.

[0020] Optionally, the audio chip testing method based on the UVM test platform also includes:

[0021] When generating audio signals, diverse test cases are generated by randomizing and constraining the audio signals.

[0022] Optionally, the audio chip testing method based on the UVM test platform also includes:

[0023] When generating the expected data, the expected data is corrected by simulating the working environment and conditions corresponding to the audio chip.

[0024] Optionally, after the step of comparing the sampled data with the expected data to generate the test result of the audio chip, the method further includes:

[0025] When the test result is that the test fails, a differential analysis is performed on the sampled data and the expected data to generate the error reason.

[0026] To achieve the above object, the present application also provides a control device, comprising:

[0027] A generation module for generating audio signals based on the HDA / I2S detector of the UVM test platform;

[0028] The transmission module is used to output the audio signal to the audio chip and the control board of the UVM test platform; wherein, after the audio chip receives the audio signal based on the HDA / I2S interface, it converts it into corresponding analog signals and digital signals, and outputs the analog signals and digital signals to the UVM test platform;

[0029] A processing module, for parsing the audio signal based on the control board, generating expected data after obtaining the audio recording and the audio playback; and the control board generates sampling data according to the analog signal and the digital signal output by the audio chip;

[0030] The comparison module is used to compare the sampled data with the expected data and generate the test results of the audio chip.

[0031] To achieve the above objectives, the present application also provides a computer device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the audio chip testing method based on the UVM testing platform as described above.

[0032] To achieve the above objectives, the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the audio chip testing method based on the UVM testing platform are implemented as described above.

[0033] The audio chip test method, control device, computer equipment and computer-readable storage medium based on the UVM test platform provided by the present application are highly automated test processes based on the UVM test platform, which reduces the tediousness and errors of manual operations, and the automated test greatly improves the efficiency of the test and shortens the test cycle; at the same time, the UVM test platform has strong signal processing capabilities and can cope with complex test requirements under high-fidelity audio standards, which ensures a comprehensive evaluation of the performance of the audio chip; and the UVM test platform is based on software-defined test methods, providing a high degree of flexibility. The test process can be quickly adjusted and customized according to different test requirements and scenarios; and the UVM test platform provides a standardized test process to ensure the consistency and repeatability of each test. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 This is a schematic diagram of the steps of an audio chip testing method based on a UVM testing platform in an embodiment of the present application;

[0035] Figure 2 This is a schematic diagram of the architecture of the UVM test platform and the audio chip in one embodiment of the present application;

[0036] Figure 3 This is a schematic diagram of a control device in an embodiment of the present application;

[0037] Figure 4 A schematic diagram of the internal structure of a computer device according to an embodiment of the present application.

[0038] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0039] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limiting the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0040] In addition, if the description of "first", "second", etc. is involved in this application, it is only used for descriptive purposes (such as for distinguishing the same or similar features), and cannot be understood as indicating or suggesting their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0041] Reference Figure 1 In one embodiment, the audio chip testing method based on the UVM test platform includes:

[0042] Step S10, generating an audio signal based on a HDA / I2S detector of a UVM test platform;

[0043] Step S20, outputting the audio signal to the audio chip and the control board of the UVM test platform; wherein, after the audio chip receives the audio signal based on the HDA / I2S interface, it converts it into corresponding analog signals and digital signals, and outputs the analog signals and digital signals to the UVM test platform;

[0044] Step S30, the control board analyzes the audio signal, obtains the audio recording and the audio playback, and generates the expected data; and the control board generates the sampling data according to the analog signal and the digital signal output by the audio chip;

[0045] Step S40: Compare the sampled data with the expected data to generate a test result of the audio chip.

[0046] In this embodiment, the execution terminal of the embodiment may be a computer device, or may be other equipment or devices (such as a control device) that controls the computer device.

[0047] As described in step S10, refer to Figure 2 In order to generate accurate audio signals, you first need to implement an HDA / I2S detector on the UVM test platform. The HDA / I2S detector is a dedicated tool for testing and verifying audio signal transmission, usually used in applications related to High Definition Audio (HDA) or I2S interfaces.

[0048] In this embodiment, the HDA / I2S detector is responsible for generating a high-fidelity audio signal to simulate a real audio input scenario. The specific implementation steps are as follows:

[0049] 1.1、HDA / I2S detector construction

[0050] A UVM Agent is configured in the UVM test platform, and the Agent may include a driver and a monitor. The driver is responsible for controlling the generation of signals, while the monitor is used to monitor the transmission of signals.

[0051] Optionally, the driver code can be written in SystemVerilog language to generate audio signals that comply with the HDA / I2S standard.

[0052] 1.2 Audio signal generation

[0053] The driver randomly selects a piece of audio data from the predefined audio library and generates a high-fidelity audio signal that complies with the HDA or I2S standard. This audio signal can simulate various audio scenarios, such as voice, music, or test tones. The signal transmission can be controlled by the UVM phase mechanism to ensure signal stability and consistency.

[0054] As described in step S20, the generated audio signal needs to be synchronously output to the audio chip to be tested and the scoreboard of the UVM test platform. In addition to the HDA / I2S detector, the UVM test platform is also provided with a scoreboard.

[0055] The control board is an important component in the UVM test platform, which is mainly used to verify the correctness of the design output. It is responsible for monitoring the input and output data of the design components during the simulation process and comparing them with the expected reference model (ReferenceModel) or expected values. The core function of the control board is to determine whether the design runs as expected by comparing the actual output data with the expected data, thereby discovering potential errors or design defects.

[0056] The audio chip receives the transmitted audio signal through the HDA / I2S interface and starts the internal conversion module to convert the audio signal. Figure 2 The conversion module inside the audio chip includes a digital-to-analog converter and an analog-to-digital converter, wherein the digital-to-analog converter is used to generate analog signal output; the analog-to-digital converter is used to generate digital signal output.

[0057] The audio chip sends the converted analog and digital signals to the UVM test platform through the corresponding output ports for subsequent comparison and analysis.

[0058] As described in step S30, when the control board receives the audio signal sent from the HDA / I2S detector, it processes the audio signal based on the analysis module. The analysis module may include the following functions:

[0059] Signal reception: Receive shortened audio or digital audio signals through an interface (such as an A / D converter).

[0060] Signal decoding: Parsing and analyzing received signals.

[0061] Optionally, the control board captures the transmitted audio signal and records the timing and characteristics of the signal. Perform spectrum analysis on the audio signal, decode the audio frequency band information (if the audio signal is multi-channel (such as stereo or 5.1 channels), the analysis module can also separate the signal content of each channel), and separate the audio signal into audio recording and audio playback parts.

[0062] Optionally, audio recording refers to an audio input signal received by an audio system or device, such as a microphone input; and audio playback refers to an audio output signal sent by an audio system or device, such as a speaker output.

[0063] Optionally, the parsed audio signal can generate expected data through an expected data generation module. The expected data is calculated according to the characteristics of the input signal, the design specification and the signal processing algorithm. The specific steps are as follows:

[0064] Data modeling: Model the analyzed signal using a reference model or mathematical algorithm to generate a theoretical output signal based on the input signal;

[0065] Data generation: Generate expected data based on the theoretical output signal after modeling;

[0066] Data storage: The generated expected data is stored in the data structure of the control plate for subsequent comparison and verification.

[0067] Optional, see Figure 2 The UVM test platform is also equipped with a digital-to-analog conversion detector and an analog-to-digital conversion detector; wherein the digital-to-analog conversion detector is used to detect the analog signal output by the digital-to-analog converter of the audio chip, and the analog-to-digital conversion detector is used to detect the digital signal output by the analog-to-digital converter of the audio chip.

[0068] When the digital-to-analog conversion detector detects an analog signal and the analog-to-digital conversion detector detects a digital signal, the analog signal and the digital signal are output to the control board.

[0069] Optionally, after receiving the analog signal and the digital signal, the control board generates sampling data.

[0070] Optionally, an A / D converter is used to sample the analog signal, and discrete sampling points are obtained according to a predetermined sampling frequency (such as 44.1 kHz or 48 kHz), and the analog voltage value of each sampling point is converted into a digital value with limited precision.

[0071] Optionally, extract the data of each sampling point from the input digital signal stream. Check the integrity of the digital signal by checksum or other error detection methods. Parse the specific value of each sampling point from the data frame.

[0072] Optionally, after completing the processing of the analog signal and the digital signal, ensure that the sampled data of the analog signal and the digital signal are synchronized and aligned in time (this can be achieved through timestamps or other synchronization mechanisms). Store the processed data of each sample point in the data structure of the control board, which can be a two-dimensional array or other format that is easy to access and process.

[0073] The data of all sampling points are integrated into a sampling data set. These data sets can be divided into different channels (such as left channel, right channel) or different signal types (such as recording, playback).

[0074] As described in step S40, the generated sampled data is compared with the expected data to generate a test result of the audio chip.

[0075] The control board compares the generated sampled data with the expected data, wherein the performance error of the audio chip is evaluated by calculating the difference between the two sets of data.

[0076] Optionally, the step of comparing the sampled data with the expected data to generate a test result of the audio chip includes:

[0077] If the sampled data is consistent with the expected data, the test result of the generated audio chip is passed;

[0078] If the sampled data is inconsistent with the expected data, the test result of the generated audio chip is test failure.

[0079] Optionally, if the error is within the allowable range, the test result is marked as "passed".

[0080] Optionally, if the error exceeds a preset threshold, the test result is marked as "failed" and a detailed error report can be generated.

[0081] Optionally, a test report is generated based on the comparison results, and the report includes specific test parameters, error analysis and test conclusions. The test report is automatically output and stored through the report generation mechanism of UVM.

[0082] In addition, in this embodiment, the digital circuit part can be described using RTL code; the analog circuit part can be designed using a circuit diagram and modeled using Verilog-spectre.

[0083] In one embodiment, a highly automated test process is performed based on the UVM test platform, which reduces the tediousness and errors of manual operation, and the automated test greatly improves the efficiency of the test and shortens the test cycle; at the same time, the UVM test platform has a strong signal processing capability and can cope with the complex test requirements under the high-fidelity audio standard (such as HDA / I2S interface), which ensures a comprehensive evaluation of the performance of the audio chip; and the UVM test platform provides a high degree of flexibility based on the software-defined test method. The test process can be quickly adjusted and customized according to different test requirements and scenarios; and the UVM test platform provides a standardized test process to ensure the consistency and repeatability of each test.

[0084] In one embodiment, based on the above embodiment, the audio chip testing method based on the UVM test platform further includes:

[0085] When comparing the sampled data with the expected data, a first feature quantity corresponding to the sampled data and a second feature quantity corresponding to the expected data are calculated using a fast Fourier transform;

[0086] The first feature quantity is compared with the second feature quantity.

[0087] In this embodiment, the fast Fourier transform (FFT) is an algorithm for efficiently calculating the discrete Fourier transform (DFT) and is used to analyze frequency domain features. In audio signal processing, the FFT can convert the audio signal in the time domain into a frequency domain representation, thereby revealing the frequency components and features of the signal.

[0088] The fast Fourier transform algorithm is used to transform the sampled data and the expected data to obtain the corresponding frequency domain representation. The output of the fast Fourier transform is an array of complex numbers, which represents the amplitude and phase of different frequency components.

[0089] The key feature quantity is extracted from the fast Fourier transform result, wherein the feature quantity corresponding to the sampled data is marked as the first feature quantity, and the feature quantity corresponding to the expected data is marked as the second feature quantity.

[0090] Optionally, the characteristic quantities include center frequency, amplitude and signal-to-noise ratio.

[0091] Optionally, when comparing the first feature quantity with the second feature quantity, ensure that the first feature quantity and the second feature quantity are aligned in frequency components. Since the frequency resolution of the fast Fourier transform depends on the sampling frequency and the data length, it is necessary to ensure that the two are consistent in the frequency axis.

[0092] Optionally, the corresponding center frequency, amplitude and signal-to-noise ratio are extracted from the sampled data and the expected data. The difference between the same feature quantities is calculated item by item to evaluate the gap between the actual value and the expected value.

[0093] In one embodiment, the calculation and comparison of characteristic quantities (center frequency, amplitude and signal-to-noise ratio) are crucial components of audio chip testing. By using fast Fourier transform and appropriate error analysis methods, the performance of the audio chip can be comprehensively evaluated to ensure that its output quality meets the design requirements.

[0094] In one embodiment, based on the above embodiment, the audio chip testing method based on the UVM test platform further includes:

[0095] If the difference between the sampled data and the expected data is within a reasonable deviation range, the sampled data is judged to be consistent with the expected data;

[0096] If the difference between the sampled data and the expected data is not within a reasonable deviation range, it is determined that the sampled data is inconsistent with the expected data.

[0097] In this embodiment, before starting the comparison, it is necessary to define the reasonable deviation range of each feature quantity (such as center frequency, amplitude and signal-to-noise ratio). These reasonable deviation ranges can be set according to the design requirements of the system or the expectations of specific application scenarios. They are usually specified in the following way:

[0098] Absolute value range: Set a fixed absolute error range (such as ±x units).

[0099] Relative value range: Set the percentage range relative to the expected value (e.g. ±y%).

[0100] Example:

[0101] The reasonable deviation range of the specified center frequency is ±5Hz;

[0102] The reasonable deviation range of the specified amplitude is ±1dB;

[0103] The reasonable deviation range of the specified signal-to-noise ratio is ±2dB;

[0104] In the process of comparing the feature quantities item by item, the difference between the first feature quantity and the second feature quantity is calculated item by item to determine whether it is within a reasonable deviation range.

[0105] Among them, if the differences between all feature quantities are within a reasonable deviation range, the sampled data is judged to be consistent with the expected data; if the difference between any feature quantity is not within a reasonable deviation range, the sampled data is judged to be inconsistent with the expected data.

[0106] In one embodiment, the reasonable deviation range provides a clear standard for judging the consistency between the sampled data and the expected data, reducing misjudgments caused by data fluctuations. By setting a reasonable range, data differences caused by environmental changes, equipment errors, etc. can be effectively covered, thereby improving the credibility of the test results.

[0107] In one embodiment, based on the above embodiment, the audio chip testing method based on the UVM test platform further includes:

[0108] When generating audio signals, diverse test cases are generated by randomizing and constraining the audio signals.

[0109] In this embodiment, a large number of different test cases can be generated by randomizing the parameters of the audio signal (such as frequency, amplitude, phase, noise, etc.). This can simulate the complex and changeable audio environment in reality and ensure the comprehensiveness of the test. Randomized test cases can cover more edge cases and abnormal scenarios, thereby improving the coverage of the test and discovering problems that may be missed by traditional test methods.

[0110] Optionally, the frequency of the audio signal is randomly generated within a certain range to simulate the frequency variation of different tones and sounds. The frequency can be generated using uniform distribution, normal distribution or other distribution functions to cover audio signals of different frequencies.

[0111] Optionally, the amplitude of the audio signal is randomly generated within a certain range to simulate audio signals of different volume levels. Uniform distribution, logarithmic distribution, etc. can be used to cover audio signals of different amplitudes.

[0112] Optionally, the phase of the audio signal is randomly generated to simulate audio signals with different phase relationships. Uniform distribution or other distribution functions may be used to cover audio signals with different phases.

[0113] Optionally, add random noise to the audio signal to simulate the noise interference in the real environment. You can generate different types of noise such as white noise, pink noise, Gaussian noise, etc.

[0114] Optionally, a complex waveform is generated by Fourier synthesis method, such as a square wave, a sawtooth wave, a triangle wave, etc. Then, the amplitude and frequency of different harmonics are randomly selected to generate a complex waveform.

[0115] On the basis of randomization, reasonable constraints are set to ensure that the generated test cases meet the actual application scenarios and audio standards (such as HDA / I2S interface standards). Constraints can include frequency range, amplitude range, noise level, etc. Constraints help to ensure the quality and rationality of the test signal, avoid generating too extreme or unrealistic test signals, and thus ensure the validity of the test results.

[0116] Taking the frequency range as an example, the constraints on the frequency range are: ensure that the generated frequency is within a reasonable range that the audio chip can handle, and avoid frequencies that are too extreme or unrealistic. When generating the frequency, perform boundary checks to ensure that the frequency is within a reasonable range.

[0117] In addition to boundary constraints, distribution constraints and probability constraints can also be used. Among them, distribution constraints can use normal distribution to generate parameters to ensure that the generated parameters meet the characteristics of normal distribution; or use uniform distribution to generate parameters to ensure that the generated parameters are uniformly distributed within a certain range. Probability constraints use probability density functions to generate parameters to ensure that the generated parameters meet specific probability distributions.

[0118] The process of generating diversified test cases is as follows:

[0119] (1) Initialization parameters: define the reasonable range of frequency, amplitude, phase and noise. Select the appropriate audio signal generation algorithm (such as sine wave generator, Fourier synthesis, etc.).

[0120] (2) Randomized parameters: Each time an audio signal is generated, the values ​​of frequency, amplitude, phase, and noise are randomly selected. After the parameters are randomly selected, boundary constraints and distribution constraints are applied to ensure that the generated parameters are within a reasonable range.

[0121] (3) Generate audio signal: Generate audio signal according to randomly selected parameters. Save the test case and save the generated audio signal as a test case for subsequent testing.

[0122] Optionally, using the UVM test platform, the HDA / I2S detector can automatically execute the generated test cases and generate corresponding audio signals for subsequent testing.

[0123] In one embodiment, by randomizing and constraining the audio signal, a variety of test cases can be generated to ensure the comprehensiveness and coverage of the test. The randomized parameters can simulate the complex audio environment in reality and discover potential problems of the audio chip under different conditions. The constraints ensure that the generated parameters are within a reasonable range and avoid overly extreme or unrealistic test signals. Through reasonable implementation and optimization, the test efficiency and accuracy can be further improved to ensure that the audio chip can perform at its best in various application scenarios.

[0124] In one embodiment, based on the above embodiment, the audio chip testing method based on the UVM test platform further includes:

[0125] When generating the expected data, the expected data is corrected by simulating the working environment and conditions corresponding to the audio chip.

[0126] In this embodiment, the expected data is corrected by simulating the working environment and conditions of the audio chip, which can further improve the accuracy and reliability of the test. This process may include the following:

[0127] (1) Identify the working environment and conditions

[0128] Optionally, identify the working environment parameters, including temperature, power supply voltage, load conditions, etc. Among them, the ambient temperature will affect the performance of the audio chip, and the temperature range during the test needs to be defined; the change of the power supply voltage will affect the working state and output results of the chip, and the reference voltage and voltage fluctuation range need to be set; different load conditions (such as external speakers, headphone impedance, etc.) will affect the output characteristics of the audio chip.

[0129] In addition, usage conditions can be identified: such as long continuous operation versus short high-load operation, under which the device performance may differ.

[0130] For example, additional excitation is set for the analog circuit part, which is generally the configuration of the power supply. The simulation of the analog circuit part is the setting of temperature and process angle. The simulation time of the analog part should be greater than the digital simulation time. The power supply voltage setting range is 3.0V~3.6V, the temperature is set to -40°~125°, and the process angle is set to three conditions: ff, ss and tt.

[0131] (2) Obtaining the simulation model

[0132] Optionally, a hardware description language (HDL) model is used to build a behavioral model of the audio chip in advance using a hardware description language (such as Verilog / VHDL) to accurately simulate its input and output characteristics. The operating characteristics under specific working conditions are extracted from the model, including frequency response, distortion, noise, etc.

[0133] Optionally, select an appropriate simulation tool (such as ModelSim, VCS, Synopsys, etc.) to run the test plan. Build a simulation environment in the simulation tool to ensure that the working conditions of the audio chip can be accurately simulated.

[0134] (3) Generate expected data

[0135] Input randomized audio signals (such as frequency, amplitude, and phase) into the simulation environment and observe the changes in the output signal. Use the simulation results to generate expected data, which includes the correct output of the audio chip under ideal conditions.

[0136] Compare the actual simulation output with the theoretical expectation to identify possible deviations and error sources. Based on the results of the simulation analysis, modify the expected data to take into account non-ideal factors that may occur in the actual working environment.

[0137] (4) Create revised expected data

[0138] The impact of the actual environment on the performance of the audio signal (such as the gain or attenuation of the frequency response) is mapped to the expected data. A correction formula can be established to dynamically adjust the expected output results based on the working conditions.

[0139] For example, if simulation analysis shows that the output is attenuated at a certain temperature, the expected value can be adjusted using the formula:

[0140] Y = y + Δy;

[0141] Among them, y is the basic value and Δy is the correction value.

[0142] (5) Test case generation and execution

[0143] The corrected expected output data is integrated with the randomly generated input signal to form a complete test case. The test case is generated using the automation function of the UVM platform, making the generation of test cases more efficient.

[0144] Run the generated test cases on the UVM test platform, compare the chip output with the corrected expected output, and record the test results.

[0145] In one embodiment, by simulating the working environment and conditions corresponding to the audio chip and correcting the expected data, the accuracy and reliability of the audio chip test based on the UVM test platform can be significantly improved. This method can effectively deal with non-ideal factors that may occur in actual work and ensure that the test results are more real and reliable. This systematic testing method helps to improve the performance of audio chips in practical applications and promote the market application and competitiveness of products.

[0146] In one embodiment, based on the above embodiment, after the step of comparing the sampled data with the expected data to generate the test result of the audio chip, the step further includes:

[0147] When the test result is that the test fails, a differential analysis is performed on the sampled data and the expected data to generate the error reason.

[0148] In this embodiment, during the audio chip test process, after comparing the sampled data with the expected data, if the test result shows "test failed", a detailed differential analysis is required to find out the root cause of the test failure.

[0149] Optionally, compare the actual sampled audio data to the expected data generated by the simulation, using an audio analysis tool or custom script to quantify and visualize the differences between the two sets of data.

[0150] Optionally, identify which parameters caused the test failure by analyzing the specific parameters of the difference, such as frequency, amplitude, phase, noise, etc. Determine the specific location of the difference, such as abnormal performance in a specific frequency range, or the overall noise level is too high.

[0151] Optionally, draw waveform graphs of the sampled data and expected data to visually display the difference between the two; or, use spectrum analysis tools to display the differences in the frequency domain to help locate problems at specific frequencies; or, calculate error statistics (such as mean square error, maximum error, error distribution, etc.) between the sampled data and the expected data.

[0152] Furthermore, the changing trend of the error under different test conditions is analyzed to find out the causes of the systematic error.

[0153] Optionally, analyze whether there are any circuit design defects, such as inappropriate parameter settings, logic errors, etc. Check whether the components in the signal path (such as amplifiers, filters, etc.) work as expected.

[0154] Optionally, the effect of temperature changes on the performance of the audio chip is analyzed to determine whether there is performance degradation at a specific temperature.

[0155] Optionally, check the impact of power supply voltage fluctuations on circuit performance to determine whether power management needs to be optimized.

[0156] Optionally, analyze the differences in circuit performance under different process corners to determine whether the design needs to be adjusted to adapt to changes in the manufacturing process; consider the fluctuations in component parameters during the actual manufacturing process and evaluate their impact on the overall performance.

[0157] Optionally, check whether the test stimulus settings are reasonable to ensure that the test conditions can truly reflect the actual application environment. Verify whether the simulation model accurately reflects the behavior of the audio chip and whether the simulation parameters or model need to be adjusted.

[0158] Combined with the above analysis results, each difference point that caused the test failure was deeply interpreted and a detailed analysis report was generated. The causes of the errors were classified and sorted to facilitate subsequent defect tracking and repair.

[0159] Summarize the analysis results and clearly point out each difference and the corresponding root cause. For example, describe in detail the specific manifestation of the difference (such as gain drop at a specific frequency); analyze the degree and scope of the impact of the difference on the overall performance; list several major reasons that may cause the difference (such as design defects, temperature effects, etc.); based on the analysis results, propose possible repair solutions or directions for further testing.

[0160] Optionally, the analysis results are fed back to the design team to initiate design repair or optimization. After the repair or optimization, re-test verification is performed to ensure that the problem is resolved.

[0161] Optionally, based on the analysis results, develop optimization strategies, such as adjusting circuit parameters, improving signal paths, enhancing power management, etc. If the problem is related to manufacturing, promote process improvements to reduce the impact of process deviations on performance.

[0162] Through the above-mentioned systematic analysis and report generation process, we can fully understand the root cause of the test failure and provide a clear direction for subsequent repair and optimization work. This will not only improve the test coverage and reliability of the audio chip, but also effectively shorten the product development cycle and ensure that new products have good competitiveness in the market.

[0163] In addition, refer to Figure 3 In an embodiment of the present application, a control device Z10 is also provided, comprising:

[0164] A generation module Z11 is used for generating audio signals based on the HDA / I2S detector of the UVM test platform;

[0165] The transmission module Z12 is used to output the audio signal to the audio chip and the control board of the UVM test platform; wherein, after the audio chip receives the audio signal based on the HDA / I2S interface, it converts it into corresponding analog signals and digital signals, and outputs the analog signals and digital signals to the UVM test platform;

[0166] The processing module Z13 is used to parse the audio signal based on the control board, obtain the audio recording and audio playback, and generate the expected data; and the control board generates the sampling data according to the analog signal and digital signal output by the audio chip;

[0167] The comparison module Z14 is used to compare the sampled data with the expected data to generate the test result of the audio chip.

[0168] Optionally, the control device Z10 may be a virtual control device (such as a virtual machine) or a physical device (such as a physical device other than a computer device that can execute the corresponding method).

[0169] In addition, a computer device is also provided in an embodiment of the present application. The internal architecture of the computer device can be as follows: Figure 4 As shown, it includes a processor, a memory, a communication interface and an input interface connected by a system bus. Among them, the processor is used to provide computing and control capabilities. The memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database is used to store data called by the computer program. The communication interface is used to communicate data with an external terminal. The input interface is used to receive a signal input by an external device. When the computer program is executed by the processor, an audio chip testing method based on the UVM test platform as described in the above embodiment is implemented.

[0170] Those skilled in the art will understand that Figure 4 The structure shown in the figure is only a block diagram of a part of the structure related to the present application scheme, and does not constitute a limitation on the computer device to which the present application scheme is applied. For example, in some optional embodiments, the computer device may also include an output interface (not shown in the figure), and the output interface is also connected to the system bus and is used to output corresponding signals to the peripheral device.

[0171] In addition, the present application also proposes a computer-readable storage medium, the computer-readable storage medium includes a computer program, and the computer program, when executed by a processor, implements the steps of the audio chip testing method based on the UVM test platform as described in the above embodiment. It can be understood that the computer-readable storage medium in this embodiment can be a volatile readable storage medium or a non-volatile readable storage medium.

[0172] In summary, the audio chip test method, control device, computer equipment and computer-readable storage medium based on the UVM test platform provided in the embodiment of the present application, a highly automated test process based on the UVM test platform, reducing the cumbersomeness and error of manual operation, and automated testing greatly improves the efficiency of the test and shortens the test cycle; at the same time, the UVM test platform has a strong signal processing capability and can cope with the complex test requirements under the high-fidelity audio standard, which ensures a comprehensive evaluation of the performance of the audio chip; and the UVM test platform is based on a software-defined test method, providing a high degree of flexibility. The test process can be quickly adjusted and customized according to different test requirements and scenarios; and the UVM test platform provides a standardized test process to ensure the consistency and repeatability of each test.

[0173] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media provided in this application and used in the embodiments may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (SSRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0174] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, device, article or method including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, device, article or method. In the absence of further restrictions, an element defined by the sentence "includes a ..." does not exclude the presence of other identical elements in the process, device, article or method including the element.

[0175] The above description is only a preferred embodiment of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. An audio chip testing method based on UVM test platform, characterized in that: include: HDA / I2S detector based on UVM test platform to generate audio signal; Output the audio signal to the control board of the audio chip and the UVM test platform; wherein, after the audio chip receives the audio signal based on the HDA / I2S interface, it converts it into corresponding analog signals and digital signals, and outputs the analog signals and digital signals to the UVM test platform; The control board analyzes the audio signal, obtains the audio recording and the audio playback, and generates the expected data; and the control board generates the sampling data according to the analog signal and the digital signal output by the audio chip; Compare the sampled data with the expected data to generate the test results of the audio chip.

2. The audio chip testing method based on UVM test platform as claimed in claim 1, characterized in that, The audio chip testing method based on the UVM test platform also includes: When comparing the sampled data with the expected data, a first feature quantity corresponding to the sampled data and a second feature quantity corresponding to the expected data are calculated using a fast Fourier transform; The first feature quantity is compared with the second feature quantity.

3. The audio chip testing method based on the UVM test platform as described in claim 1 or 2, characterized in that, The step of comparing the sampled data with the expected data to generate the test result of the audio chip includes: If the sampled data is consistent with the expected data, the test result of the generated audio chip is passed; If the sampled data is inconsistent with the expected data, the generated test result of the audio chip is that the test fails.

4. The audio chip testing method based on the UVM test platform as claimed in claim 3, characterized in that, The audio chip testing method based on the UVM test platform also includes: If the difference between the sampled data and the expected data is within a reasonable deviation range, the sampled data is judged to be consistent with the expected data; If the difference between the sampled data and the expected data is not within a reasonable deviation range, it is determined that the sampled data is inconsistent with the expected data.

5. The audio chip testing method based on UVM test platform as claimed in claim 1, characterized in that, The audio chip testing method based on the UVM test platform also includes: When generating audio signals, diverse test cases are generated by randomizing and constraining the audio signals.

6. The audio chip testing method based on UVM test platform as claimed in claim 1, characterized in that, The audio chip testing method based on the UVM test platform also includes: When generating the expected data, the expected data is corrected by simulating the working environment and conditions corresponding to the audio chip.

7. The audio chip testing method based on the UVM test platform as claimed in claim 1, characterized in that, After the step of comparing the sampled data with the expected data to generate the test result of the audio chip, the method further includes: When the test result is that the test fails, a differential analysis is performed on the sampled data and the expected data to generate the error reason.

8. A control device, characterized in that: include: A generation module for generating audio signals based on the HDA / I2S detector of the UVM test platform; The transmission module is used to output the audio signal to the audio chip and the control board of the UVM test platform; wherein, after the audio chip receives the audio signal based on the HDA / I2S interface, it converts it into corresponding analog signals and digital signals, and outputs the analog signals and digital signals to the UVM test platform; A processing module, for parsing the audio signal based on the control board, generating expected data after obtaining the audio recording and the audio playback; and the control board generates sampling data according to the analog signal and the digital signal output by the audio chip; The comparison module is used to compare the sampled data with the expected data and generate the test results of the audio chip.

9. A computer device, characterized in that: The computer device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, the steps of the audio chip testing method based on the UVM testing platform as described in any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the audio chip testing method based on the UVM testing platform as described in any one of claims 1 to 7 are implemented.

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