Monocrystal thickness measuring method for cultivating colored diamonds

Abstract

The invention relates to a single crystal thickness measurement method for cultivating colored diamonds, and belongs to the technical field of thickness measurement of cultivated diamonds. The method comprises the following steps: identifying a single crystal area on a growth surface of a to-be-tested and cultivated colored diamond through an image acquisition and identification device above the growth surface of the colored diamond; distributing each thickness measuring point in a single crystal area on the growth surface of the identified to-be-measured cultivation colored diamond; and measuring the thicknesses of the positions where the thickness measurement points are located by adopting a spectral confocal mode to obtain the thickness measurement value of each thickness measurement point, and obtaining the thickness of the single crystal for cultivating the colored diamond according to the minimum value in the thickness measurement values. Compared with the prior art that the single crystal is identified manually and then the thickness gauge is used for measuring the thickness of the single crystal for cultivating the colored diamond, the accuracy and the efficiency are greatly improved.

Description

Technical Field

[0001] The invention relates to a method for measuring the single crystal thickness of a cultured colored diamond, and belongs to the technical field of cultured diamond thickness measurement. Background Art

[0002] In the production process of cultured diamonds, multiple rounds of growth are required to reach the rough diamond. After each round of growth, the growth rate needs to be evaluated, that is, the effective thickness of this growth needs to be measured, and this thickness needs to be used to determine the processing plan in subsequent diamond processing.

[0003] Since there are many types of cultured diamonds, there are white diamonds and colored diamonds, such as Figure 1 As shown in Figure 1, the growth surface of white diamond is relatively smooth after each round of growth, and there are more single crystal areas, and the thickness is easy to measure; Figure 2 As shown, the growth surface of colored diamonds is uneven after growth, with many polycrystalline areas, and the thickness is difficult to measure. The current method for measuring the single crystal thickness of colored diamonds is to manually identify the single crystal area and then use a thickness gauge to measure the four corners and the middle position of the single crystal area of ​​the product, and the thickness of the lowest point measured is used as the effective thickness of the cultured diamond this time. However, this method of measuring the single crystal thickness has a large error and low efficiency. Summary of the invention

[0004] The purpose of the present invention is to provide a method for measuring the thickness of a single crystal of a cultured colored diamond, so as to solve the problem that the existing method of manually identifying the single crystal and then measuring the thickness of the single crystal of the colored diamond by a thickness gauge has large measurement errors and low efficiency.

[0005] In order to solve the above technical problems, the present invention provides a method for measuring the thickness of a single crystal of a cultivated colored diamond, the method comprising the following steps: S1: Identify the single crystal region on the growth surface of the colored diamond to be tested by an image acquisition and recognition device above the growth surface of the colored diamond; S2: Distribute various thickness measurement points in the single crystal area on the growth surface of the identified cultured colored diamond to be tested; measure the thickness of the positions of these thickness measurement points using a spectral confocal method to obtain thickness measurement values ​​of each thickness measurement point, and obtain the single crystal thickness of the cultured colored diamond according to the minimum value of the thickness measurement values.

[0006] Furthermore, the method of distributing each thickness measurement point in the single crystal area on the growth surface of the identified cultured colored diamond to be tested is to select the largest single crystal area on the growth surface of the identified cultured colored diamond to be tested, and distribute each thickness measurement point in the selected single crystal area.

[0007] Further, the manner of distributing the various thickness measurement points in the selected single crystal region is to evenly distribute the various thickness measurement points in the selected single crystal region.

[0008] Beneficial effects: The present invention provides a new method for measuring the thickness of a single crystal of a cultured colored diamond. The method identifies the single crystal region on the growth surface of the cultured colored diamond to be tested by an image acquisition and recognition device above the growth surface of the colored diamond; distributes various thickness measurement points in the identified single crystal region on the growth surface of the cultured colored diamond to be tested; measures the thickness of the positions of these thickness measurement points by using a spectral confocal method to obtain the thickness measurement value of each thickness measurement point, and obtains the single crystal thickness of the cultured colored diamond according to the minimum value of the thickness measurement value. Compared with the method of manually identifying single crystals and then using a thickness gauge to measure the single crystal thickness of cultured colored diamonds in the prior art, the present invention greatly improves the accuracy and efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Figure 1 This is an example diagram of the appearance of a white diamond product in the background technology of the present invention; Figure 2 This is an example of the appearance of a colored diamond product in the background technology of the present invention; Figure 3 It is a schematic diagram of components for measuring the thickness of a single crystal of a cultivated colored diamond in an embodiment of the method for measuring the thickness of a single crystal of a cultivated colored diamond of the present invention; Figure 4 is a flow chart of a method for measuring the thickness of a single crystal of a cultured colored diamond in an embodiment of the method for measuring the thickness of a single crystal of a cultured colored diamond of the present invention; Figure 5 This is an example diagram of single crystals and points identified by a camera in an embodiment of a method for measuring the thickness of a single crystal of cultured colored diamonds of the present invention; Figure 6a is an example diagram of uniformly distributed thickness measurement points in an embodiment of a method for measuring thickness of a single crystal of cultured colored diamonds of the present invention; Figure 6b This is an example diagram of uniformly distributed thickness measurement points in an embodiment of the method for measuring the thickness of a single crystal of cultured colored diamonds of the present invention. DETAILED DESCRIPTION

[0010] The specific implementation of the present invention will be further described below in conjunction with the accompanying drawings.

[0011] Example of a method for measuring the thickness of a single crystal of a cultured colored diamond This embodiment provides a technical solution for a method for measuring the thickness of a single crystal of a cultured colored diamond, the method comprising the following steps: S1: identifying the single crystal region on the growth surface of the cultured colored diamond to be tested by an image acquisition and recognition device above the growth surface of the colored diamond; S2: distributing various thickness measurement points in the identified single crystal region on the growth surface of the cultured colored diamond to be tested; measuring the thickness of the positions of these thickness measurement points by using a spectral confocal method to obtain the thickness measurement value of each thickness measurement point, and obtaining the single crystal thickness of the cultured colored diamond according to the minimum value of the thickness measurement values. Compared with the method of manually identifying single crystals and then measuring the single crystal thickness of cultured colored diamonds by using a thickness gauge in the prior art, the accuracy and efficiency of this measurement method are greatly improved.

[0012] The schematic diagram of the components for measuring the thickness of the single crystal of the cultured colored diamond in this embodiment is as follows: Figure 3 As shown, a lens and an upper camera are arranged above the growth surface of the colored diamond product, and the upper camera is connected to the spectral confocal device through a connector; wherein the upper camera also has its corresponding recognition software, and the camera with the recognition software is a prior art, which will not be described in detail here. The lens, the upper camera and its corresponding recognition software are used to identify the single crystal area on the growth surface of the cultivated colored diamond to be tested, and to distribute various thickness measurement points in the identified single crystal area on the growth surface of the cultivated colored diamond to be tested; the spectral confocal device is used to measure the thickness of the location of the thickness measurement point to obtain the thickness measurement value of each thickness measurement point; wherein a lower camera is arranged below the bottom surface of the colored diamond product, and in this embodiment, the lower camera has no practical effect on the single crystal thickness measurement of the cultivated colored diamond, and in other embodiments, the lower camera may not be arranged.

[0013] The flow chart of the method for measuring the thickness of a single crystal of cultured colored diamonds is as follows: Figure 4 As shown, the following is an explanation combined with the specific measurement process: S1: Identify the single crystal region on the growth surface of the colored diamond to be tested by an image acquisition and recognition device above the growth surface of the colored diamond; In this embodiment, the image acquisition and recognition device above the growth surface of the colored diamond specifically includes a lens, an upper camera and corresponding recognition software, and the upper camera and the lens are used to acquire an image of the growth surface of the cultivated colored diamond to be tested, and then the recognition software corresponding to the upper camera is used to recognize the single crystal area on the growth surface of the cultivated colored diamond to be tested; S2: various thickness measurement points are distributed in the single crystal area on the growth surface of the cultured colored diamond to be tested; the thickness of the positions of these thickness measurement points are measured by spectral confocal method to obtain the thickness measurement value of each thickness measurement point, and the single crystal thickness of the cultured colored diamond is obtained according to the minimum value of the thickness measurement values.

[0014] Specifically, the recognition software corresponding to the camera distributes each thickness measurement point in the single crystal area on the growth surface of the identified cultured colored diamond to be tested; wherein, the method of distributing each thickness measurement point in the single crystal area on the growth surface of the identified cultured colored diamond to be tested is to select the largest single crystal area on the growth surface of the identified cultured colored diamond to be tested, and distribute each thickness measurement point in the selected single crystal area. The single crystal recognized by the camera and the example of the point distribution are shown in the figure below. Figure 5 As shown, the area of ​​the purple-red rectangular frame is the growth surface of the colored diamond to be tested, the black area in the purple-red rectangular frame is the polycrystalline area, and the area where the green outline is located is the single crystal area; the purple-red circle is the distribution of various thickness measurement points in the single crystal area on the growth surface of the identified cultivated colored diamond to be tested; The method of distributing each thickness measurement point in the selected single crystal region is to evenly distribute each thickness measurement point in the selected single crystal region. An example of evenly distributed thickness measurement points is shown in FIG. Figure 6a , 6b As shown, Figure 6a and 6b The green circles in the figure are the thickness measurement points evenly distributed in the selected single crystal region by the software corresponding to the upper camera. In this embodiment, the number of thickness measurement points is 9. Specifically, the number of thickness measurement points is determined according to actual needs. In this embodiment, the recognition software corresponding to the camera will record the coordinates of each thickness measurement point after identifying the distribution of each thickness measurement point in the single crystal region on the growth surface of the cultivated colored diamond to be tested, and send the coordinates to the spectral confocal device. The spectral confocal device then measures the thickness of each thickness measurement point according to the coordinates of each thickness measurement point. The recognition software corresponding to the camera records the coordinates of each thickness measurement point and transmits the coordinates of each thickness measurement point to the spectral confocal device, which belongs to the prior art and will not be elaborated here.

[0015] The spectral confocal device is used to measure the thickness of the uniformly distributed points on the single crystal area (corresponding to Figure 5 The thickness of the position where the diamond is located (the green circle in the figure) is measured to obtain the thickness measurement value of each thickness measurement point, and the single crystal thickness of the cultured colored diamond is obtained based on the minimum value of the thickness measurement values.

Claims

1. A method for measuring the thickness of a single crystal of a cultivated colored diamond, characterized in that: The following steps are involved: S1: Identify the single crystal region on the growth surface of the colored diamond to be tested by an image acquisition and recognition device above the growth surface of the colored diamond; S2: Distribute various thickness measurement points in the single crystal area on the growth surface of the identified cultured colored diamond to be tested; measure the thickness of the positions of these thickness measurement points using a spectral confocal method to obtain thickness measurement values ​​of each thickness measurement point, and obtain the single crystal thickness of the cultured colored diamond according to the minimum value of the thickness measurement values.

2. The method for measuring the single crystal thickness of cultured colored diamonds according to claim 1, characterized in that: The method of distributing various thickness measurement points in the single crystal area on the growth surface of the identified cultured colored diamond to be tested is to select the largest single crystal area on the growth surface of the identified cultured colored diamond to be tested, and distribute various thickness measurement points in the selected single crystal area.

3. The method for measuring the thickness of a single crystal of a cultured colored diamond according to claim 2, characterized in that: The manner of distributing the thickness measurement points in the selected single crystal region is to evenly distribute the thickness measurement points in the selected single crystal region.

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