Method and device for measuring dielectric constant of atomic clock storage bubble

By building a simulation model in the atomic clock cavity bubble system, combining the actual measured resonance frequency, accurately measuring the dielectric constant of the storage bubble, the problems of low measurement accuracy and insufficient system flexibility in the existing technology are solved, and higher accuracy is achieved Measurement of dielectric constant of .

CN119471061AActive Publication Date: 2025-02-18LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH

Patent Information

Application Number
CN202411497092.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-10-25
Publication Date
2025-02-18
Estimated Expiration
2044-10-25

AI Technical Summary

Technical Problem

The prior art is not very accurate when measuring the dielectric constant of the atomic clock storage bubble, and the measurement system requires high requirements, lacks flexibility, and has certain limitations.

Method used

By connecting the measuring device to the atomic clock cavity bubble system, the actual measured resonance frequency is obtained, and a simulation model is constructed based on the state parameters of the cavity bubble system, parameter scanning analysis is carried out to obtain the relationship between the dielectric constant of the storage bubble and the simulation resonance frequency of the cavity bubble system. image, and then determine the dielectric constant value.

Benefits of technology

The accuracy of measuring the dielectric constant of the storage bubble is improved, and the changes in the dielectric constant can be reflected more accurately, solving the problems of low measurement accuracy and insufficient system flexibility in the prior art.

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Abstract

The invention provides a method and a device for measuring a dielectric constant of a storage bubble of an atomic clock. The method comprises the following steps: starting a device for measuring the dielectric constant of an atomic clock storage bubble to obtain the actually measured resonant frequency of an atomic clock cavity bubble system; constructing a simulation model according to the state parameters of the cavity bubble system; parameter scanning analysis is carried out according to the simulation model, and a relation image of the storage bubble dielectric constant and the cavity bubble system simulation resonant frequency is obtained; determining the dielectric constant value of the storage bubble according to the measurement frequency and the simulation frequency on the relation image; the position of the tuner and the environment temperature are changed, the measurement accuracy can be improved through multiple times of measurement statistical averaging, and the relation between the dielectric constant of the storage bubble and the temperature can be analyzed. The method solves the problem that a conventional method for measuring the dielectric constant by adopting a calculation formula for inversion is lack of flexibility and has certain limitation. The method is of great significance to the optimization design of a high-performance cavity bubble system, the improvement of the temperature frequency characteristic of the atomic clock and the promotion of the development of a small light-weight active atomic clock.
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Description

Technical Field

[0001] The invention relates to the technical field of quantum frequency standards and dielectric constant measurement, and in particular to a method and device for measuring the dielectric constant of an atomic clock storage bubble. Background Art

[0002] The cavity-bubble system is the core component of the physical part of hydrogen atomic clocks and rubidium atomic clocks. Its performance directly determines the quality of the hydrogen atom quantum transition spectrum, thus affecting the frequency characteristics such as the accuracy and stability of the atomic clock output frequency. The structure, shape, material, surface state, electromechanical parameters and environment of the microwave resonant cavity, storage bubble and other components are the main factors affecting the performance of the cavity-bubble system, among which the physical quantities such as the structure, shape and material of the storage bubble are particularly important.

[0003] Storage bubbles are dielectric components that exist in large quantities in the cavity. They can be of various shapes and made of materials such as Teflon, quartz, ceramic or sapphire. Due to the different dielectric constants and temperature sensitivity of different materials, the structure, shape, material and environmental resistance of the microwave cavity are designed differently, which in turn makes the cavity bubble system itself have different volumes, weights, quality factors of quantum transition spectral lines and environmental immunity.

[0004] In order to optimize the design and manufacture of high-performance hydrogen atomic clocks (rubidium atomic clocks), it is necessary to accurately measure the dielectric constant of the storage bubble and its change with the environment based on practical conditions. However, the current method of measuring the dielectric constant is based on measuring the resonant frequency of a microwave resonant cavity containing a standard regular sample, and constructing an expression formula for the resonant frequency and the dielectric constant, and finally inverting it to achieve the measurement of the dielectric constant value.

[0005] Since the measurement object is a microwave resonant cavity containing a sample, the sample and the resonant cavity may be different from the actual situation, and the expression formula of the resonant frequency and dielectric constant constructed is also a general model, not constructed for the actual microwave resonant cavity and cavity bubble system. As mentioned above, the structure, shape, material, surface state, electromechanical parameters and environment of the microwave resonant cavity, storage bubble and other components are the main factors affecting the performance of the cavity bubble system, among which the physical quantities such as the structure, shape and material of the storage bubble are particularly important. Therefore, the dielectric constant obtained by the general model is not accurate. The existing measurement scheme also has high requirements for the measurement system, lacks flexibility, and has certain limitations. Summary of the invention

[0006] In view of this, the present invention provides a method and device for measuring the dielectric constant of an atomic clock storage bubble, which can improve the accuracy of measuring the dielectric constant of the storage bubble.

[0007] In order to solve the above technical problems, the present invention is implemented as follows.

[0008] In order to have a basic understanding of some aspects of the disclosed embodiments, a brief summary is given below. This summary is not intended to be a general review, nor is it intended to identify key / important components or to delineate the scope of protection of these embodiments. Its only purpose is to present some concepts in a simple form as a preface to the detailed description that follows.

[0009] In a first aspect, an embodiment of the present invention provides a method for measuring the dielectric constant of an atomic clock storage bubble, the method comprising:

[0010] The measuring device of the dielectric constant of the atomic clock storage bubble is connected to the cavity bubble system used for the atomic clock;

[0011] The measuring device obtains the measured resonant frequency of the cavity-bubble system;

[0012] A simulation model is constructed according to the state parameters of the cavity-bubble system; the state parameters are data of actual devices related to the cavity-bubble system, and the actual devices involve measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring; parameter types include temperature, structural size, surface roughness, electrical parameters, and surface coating parameters;

[0013] Carry out parameter scanning analysis according to the simulation model to obtain a relationship image between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system;

[0014] Determine the dielectric constant value of the storage bubble according to the measured resonance frequency and the simulated resonance frequency on the relationship image;

[0015] To improve the accuracy of dielectric constant measurement, the state parameters of the cavity system can be kept unchanged, the above operation can be repeated, and statistical averaging can be performed through multiple measurements; or the tuner position can be changed, the above operation can be repeated, and statistical averaging can be performed through multiple measurements to improve the accuracy of measurement.

[0016] According to a preferred embodiment, the method further comprises: adjusting the temperature of the measurement environment, repeating all operations, and obtaining the relationship between the dielectric constant of the storage bubble and the temperature.

[0017] According to a preferred embodiment, the method further comprises: before measuring, evacuating the cavity bubble system.

[0018] In a second aspect, an embodiment of the present invention provides a device for measuring the dielectric constant of an atomic clock storage bubble, wherein the object to be measured is a storage bubble in a cavity bubble system for an atomic clock; the device comprises: a vacuum thermostat, an atomic clock cavity bubble system, a network analyzer, a 10 MHz frequency reference source, a simulation module, and a calculation module; the device is connected to the cavity bubble system;

[0019] Vacuum thermostat, used to provide a vacuum measurement environment with different constant temperatures for the cavity and bubble system;

[0020] A cavity system, used to provide an electromagnetic energy field for measuring the dielectric constant and to provide an interface for the measurement;

[0021] A network analyzer is used to measure the resonant frequency of the cavity-bubble system and read the measured resonant frequency by obtaining the S11 curve or the S21 curve;

[0022] 10MHz frequency reference source, used to generate 10MHz frequency standard, connected to network analyzer and calibrated;

[0023] A simulation module is used to construct a simulation model of the cavity-bubble system according to the state parameters of the cavity-bubble system; perform parameter scanning analysis according to the simulation model to obtain a relationship image between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system;

[0024] The state parameters are data of actual devices in the atomic clock, and the actual devices involve measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring; parameter types include temperature, structural size, surface roughness, electrical parameters, and surface coating parameters;

[0025] The calculation module is used to read the measured resonance frequency from the network analyzer, and determine the dielectric constant value of the storage bubble by comparing it with the simulated resonance frequency on the relationship image.

[0026] Wherein, the cavity-bubble system is composed of a microwave resonant cavity, a storage bubble, a tuner and an antenna coupling ring;

[0027] Preferably, the calculation module further obtains multiple dielectric constant values ​​at different resonant frequencies through multiple measurements for different tuner positions, and takes an average as the measurement result of the dielectric constant of the storage bubble.

[0028] According to a preferred embodiment, the simulation module constructs the state parameters of the cavity-bubble system based on the simulation model, including: the temperature of the measurement environment; the cavity structure of the microwave resonant cavity, the film thickness, conductivity and roughness of the cavity surface coating; the structure and surface roughness of the storage bubble; the structure and position of the tuner and the film thickness, conductivity and roughness of the surface coating; the structure of the antenna coupling ring and the film thickness, conductivity and roughness of the surface coating; and the microwave power of the cavity-bubble system input to the network analyzer.

[0029] The microwave resonant cavity is a magnetron type resonant cavity, or a standard waveguide resonant cavity.

[0030] The antenna coupling ring is a measurement interface for measuring the resonant frequency of the cavity-bubble system, and the number of the antenna coupling ring is at least one.

[0031] The storage bubble, as the component to be tested, can be made of ceramic, quartz, Teflon or sapphire, and can be spherical, rectangular, ellipsoidal or cylindrical in shape.

[0032] Beneficial effects:

[0033] (1) The present invention provides a method and device for measuring the dielectric constant of an atomic clock storage bubble. The dielectric constant of the storage bubble is mainly measured based on the atomic clock cavity bubble system. The actual cavity bubble system, resonant cavity, and storage bubble in the atomic clock are used for measurement, thereby avoiding the inaccuracy caused by the use of samples and external test environments. Moreover, the simulation model constructed by the present invention is also constructed based on the actual test environment and cavity bubble system. The present invention analyzes the influence of various parameters of the environment, atomic clock, and storage bubble on the test, and determines that the components that affect the results involve the measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring. The types of influencing parameters involve temperature, structural size, surface roughness, electrical parameters, and surface coating parameters, so that the change in dielectric constant can be accurately reflected in the simulation model. By using such a simulation model to construct an image of the relationship between resonant frequency and dielectric constant, a more realistic measurement of the dielectric constant of the storage bubble can be achieved. At the same time, the measurement data can be used as a reference to correct and compensate for the frequency offset of the atomic clock affected by temperature, thereby improving the temperature coefficient of the atomic clock and enhancing environmental immunity.

[0034] (2) In a preferred embodiment, the dielectric constant of the storage bubble and its variation with ambient temperature can be accurately measured in the practical state of the storage bubble, thereby solving the problem that the current method of measuring the dielectric constant by inversion of the calculation formula has high requirements on the measurement system, few model parameters, lacks flexibility, and has certain limitations.

[0035] (3) The optimized design of high-performance cavity systems in terms of structure, process, and environmental adaptability is of great significance, especially in the development of small and lightweight active atomic clocks. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0037] Figure 1 It is a schematic flow chart of a method for measuring the dielectric constant of a hydrogen clock storage bubble provided by an embodiment of the present invention;

[0038] Figure 2 Schematic diagram of a device for measuring the dielectric constant of a hydrogen clock storage bubble provided by an embodiment of the present invention;

[0039] Figure 3 is a schematic diagram of an S11 curve image provided by an embodiment of the present invention;

[0040] Figure 4 is a schematic diagram of a dielectric constant-resonance frequency curve provided by an embodiment of the present invention;

[0041] Among them, 1-vacuum constant temperature device, 2-cavity bubble system, 21-microwave resonant cavity, 22-storage bubble, 23-tuner, 24-antenna coupling ring, 3-network analyzer, 4-10MHz frequency reference source, 5-computer, 6-simulation software. DETAILED DESCRIPTION

[0042] The present invention is described in detail below with reference to the accompanying drawings and embodiments.

[0043] The following description and the drawings sufficiently illustrate specific embodiments of the invention to enable those skilled in the art to practice them.

[0044] It should be clear that the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0045] When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are only examples of systems and methods consistent with some aspects of the present invention as detailed in the attached claims.

[0046] In the description of the present invention, it should be understood that the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. In addition, in the description of the present invention, unless otherwise specified, "plurality" refers to two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the previously associated objects are in an "or" relationship.

[0047] The following will be combined Figure 1-Figure 4 , a method and device for measuring the dielectric constant of an atomic clock storage bubble provided by an embodiment of the present invention are introduced in detail. The following description is made using a hydrogen clock as an example. The present invention can also be used to measure the dielectric constant of a rubidium clock storage bubble.

[0048] In order to achieve the functional effect of measuring the dielectric constant of the hydrogen clock storage bubble, a method and device for measuring the dielectric constant of the hydrogen clock storage bubble and an implementation process are invented as follows:

[0049] S100, a device for measuring the dielectric constant of a storage bubble is connected to a cavity bubble system for a hydrogen clock, wherein the storage bubble in the cavity bubble system is a measurement object; the measuring device is started to obtain a measured resonant frequency of the hydrogen clock cavity bubble system.

[0050] The cavity system used in the hydrogen clock can be a cavity system used in the development process of an atomic clock for development work; or it can be a cavity system in an atomic clock product for performance analysis of the atomic clock product.

[0051] Before measuring, the cavity system can be evacuated to avoid the influence of other gases on the measurement.

[0052] For example, Figure 2 As shown, it is a schematic diagram of a device for measuring the dielectric constant of a hydrogen clock storage bubble. The device is mainly composed of a vacuum thermostat 1, a cavity system 2, a network analyzer 3, a 10MHz frequency reference source 4 and a computer 5. The cavity system 2 is composed of a microwave resonant cavity 21, a storage bubble 22, a tuner 23 and two antenna coupling loops 24. First, the cavity system 2 is placed in a vacuum thermostat 1. The vacuum thermostat 1 here is the original part of the hydrogen clock. In practice, an additional vacuum thermostat can also be used to control the ambient temperature. One of the antenna coupling loops 24 is connected to the network analyzer 3 as the external interface of the cavity system 2, and the network analyzer 3 is connected to the 10MHz frequency reference source 4 and the computer 5, thereby forming a measuring device.

[0053] The measuring device is started, and the ambient temperature value is set to T1 through the vacuum thermostat 1, and the vacuum degree is less than or equal to the set vacuum degree P0. At this time, the gas inside and outside the storage bubble 22 no longer affects the resonant frequency of the cavity bubble system 2. After the temperature is balanced, the network analyzer 3 is used to measure the following Figure 3 The S11 curve A at the temperature T1 shown, the frequency value corresponding to the minimum value of the curve A is the measured resonant frequency of the cavity system 2.

[0054] In practice, both antenna coupling loops 24 can be connected to the network analyzer 3 , and the network analyzer measures the S21 curve at temperature T1 . The frequency value corresponding to the maximum value of the curve is the actual measured resonant frequency of the cavity system 2 .

[0055] In this case, the structure of the microwave resonant cavity 21 is a standard cylindrical waveguide resonant cavity; the storage bubble 22 is a spherical quartz glass bubble; the 10MHz frequency reference source 4 is a VCH 1003 hydrogen clock, which is used to generate a 10MHz high-stability frequency standard source, connected to the network analyzer 3 and calibrated to ensure the accuracy of frequency measurement; the computer 5 is used to collect the measured resonant frequency according to the S11 curve measured by the network analyzer 3.

[0056] S200, constructing a simulation model according to the state parameters of the actual cavity-bubble system.

[0057] For example, a simulation model of the cavity system 2 can be constructed on a computer 5 using simulation software 6 such as HFSS, CST, and COMSOL.

[0058] The present invention analyzes the influence of various parameters of the environment, atomic clock, and storage bubble on the test, and determines that the devices that affect the results involve the measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring, and the types of influencing parameters involve temperature, structural size, surface roughness, electrical parameters, and surface coating parameters, so that the change of dielectric constant can be accurately reflected in the simulation model. By using such a simulation model to construct an image of the relationship between the resonant frequency and the dielectric constant, a more realistic measurement of the dielectric constant of the storage bubble can be achieved.

[0059] In this preferred embodiment, the state parameters of the cavity-bubble system 2 include: the temperature value T1 of the ambient vacuum thermostat; the cavity structure dimensions of the microwave resonant cavity 21, the film thickness, conductivity and roughness of the cavity surface coating; the structure dimensions and surface roughness of the storage bubble 22; the structure dimensions, position and film thickness, conductivity and roughness of the surface coating of the tuner 23; the structure dimensions and film thickness, conductivity and roughness of the surface coating of the antenna coupling ring 24; the microwave power input to the cavity-bubble system 2 by the network analyzer 3, etc. In this case, when constructing the simulation model, the simulation software 6 is used to solve the simulation resonant frequency for the excitation model in HFSS.

[0060] S300, performing parameter scanning analysis according to the simulation model to obtain a relationship image between the storage bubble dielectric constant and the simulated resonant frequency of the cavity-bubble system.

[0061] For example, Figure 4 As shown, curve a1 is the simulated resonant frequencies obtained after the storage bubble 22 in the cavity bubble system 2 takes different dielectric constants when simulating in the computer 5. The horizontal axis of the curve a1 is the dielectric constant, and the vertical axis is the simulated resonant frequency. It can be seen that the curve a1 clearly shows the relationship between the dielectric constant of the storage bubble 22 and the resonant frequency of the cavity bubble system 2.

[0062] S400, determining the dielectric constant value of the storage bubble according to the measured resonance frequency and comparing it with the resonance frequency on the relationship image.

[0063] For example, the measured resonant frequency f1 in step S100 is compared with Figure 4 The horizontal coordinate value corresponding to the vertical coordinate point f1 of the simulation frequency curve a1 is ε1, from which it can be obtained that ε1 is the actual value of the dielectric constant of the storage bubble 22, thereby realizing the measurement of the dielectric constant of the hydrogen clock storage bubble 22.

[0064] S500, changing the position of the tuner in the cavity system, repeating the above operation, and improving the accuracy of the measurement through statistical averaging of multiple measurements.

[0065] For example, if other state parameters of the cavity bubble system 2 are kept unchanged and only the tuner 23 is adjusted to a different position, the resonant frequency of the cavity bubble system 2 will change. To achieve another measurement, the process of S100-S400 needs to be repeated to measure the dielectric constant of the storage bubble 22 at the position of the tuner 23; in this way, after changing the position multiple times and measuring multiple times, the multiple measured values ​​are statistically averaged to obtain a more accurate dielectric constant value of the storage bubble 22.

[0066] S600, adjusting the temperature of the environment, repeating the above operation, and analyzing the relationship between the dielectric constant of the storage bubble and the temperature.

[0067] For example, if the other state parameters of the cavity system 2 remain unchanged and only the temperature value of the vacuum thermostat 1 is set from T1 to T2, the resonant frequency of the cavity system 2 will change. To achieve re-measurement, the process of S100-S400 needs to be repeated. It can be measured that under the ambient temperature T2, Figure 3 The S11 curve A2 shown and Figure 4 The dielectric constant and resonant frequency curve a2 is shown. The corresponding measured frequency f2 can be obtained and compared with Figure 4 The dielectric constant ε2 of the storage bubble 22 is obtained. By changing the temperature setting value of the vacuum thermostat 1 for many times and repeating the above process, the law of the dielectric constant of the storage bubble 22 changing with temperature can be obtained after many measurements.

[0068] Through the above case, in order to achieve the effect of measuring the dielectric constant of the hydrogen clock storage bubble, mainly based on the hydrogen clock cavity bubble system 2, by measuring the resonant frequency and constructing a simulation model of the relationship between the resonant frequency and the dielectric constant, the purpose of more realistic measurement of the dielectric constant of the storage bubble 22 is achieved. Since the method can accurately measure the dielectric constant of the storage bubble 22 and its change law with the ambient temperature when the storage bubble 22 is in a practical state, it solves the problem that the current method of inversely measuring the dielectric constant using limited samples and simple calculation formulas has high requirements for the measurement system, too few model parameters, lack of flexibility, and certain limitations. This method and device are of great significance to the optimization design of high-performance cavity bubble systems in terms of their structure, process, environmental adaptability and reliability, especially in the development of small and lightweight active hydrogen atomic clocks.

[0069] It should be noted that the device for measuring the dielectric constant of the storage bubble provided in the above embodiment only uses the division of the above functional modules as an example when executing the method for measuring the dielectric constant of the storage bubble. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the method for measuring the dielectric constant of the storage bubble and the device for measuring the dielectric constant of the storage bubble provided in the above embodiment belong to the same concept, and the implementation process thereof is detailed in the method embodiment, which will not be repeated here.

[0070] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0071] The above specific embodiments only describe the design principle of the present invention. The shapes and names of the components in the description may be different and are not limited. Therefore, those skilled in the art in the field of the present invention may modify or replace the technical solutions recorded in the above embodiments; and these modifications and replacements do not deviate from the creative purpose and technical solutions of the present invention and should all fall within the protection scope of the present invention.

Claims

1. A method for measuring the dielectric constant of an atomic clock storage bubble, characterized in that: The following steps are involved: The measuring device of the dielectric constant of the atomic clock storage bubble is connected to the cavity bubble system used for the atomic clock; the storage bubble in the cavity bubble system is the measuring object; The measuring device obtains the measured resonant frequency of the cavity-bubble system; Constructing a simulation model according to the state parameters of the cavity-bubble system; The state parameters are data of actual devices related to the cavity-bubble system, and the actual devices involve measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring; parameter types include temperature, structural size, surface roughness, electrical parameters, and surface coating parameters; Carry out parameter scanning analysis according to the simulation model to obtain a relationship image between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system; Determine the dielectric constant value of the storage bubble according to the measured resonance frequency and the simulated resonance frequency on the relationship image; The position of the tuner in the cavity bubble system is changed, and the above operation is repeated. The statistical average of multiple measurements is taken as the measurement result of the storage bubble dielectric constant.

2. The method according to claim 1, characterized in that The method further comprises: adjusting the temperature of the measuring environment, repeating all operations, and obtaining the relationship between the dielectric constant and the temperature of the storage bubble.

3. The method according to claim 1, characterized in that The method further comprises: before measuring, evacuating the cavity bubble system.

4. The method according to claim 1, characterized in that: The atomic clock is a hydrogen clock or a rubidium clock.

5. A device for measuring the dielectric constant of an atomic clock storage bubble, characterized in that: The device comprises: a vacuum thermostat, a network analyzer, a 10MHz frequency reference source, a simulation module and a calculation module; the device is connected to a cavity bubble system used for an atomic clock, and the storage bubble in the cavity bubble system is a measurement object; Vacuum thermostat, used to provide a vacuum measurement environment with different constant temperatures for the cavity and bubble system; A cavity system, used to provide an electromagnetic energy field for measuring the dielectric constant and to provide an interface for the measurement; A network analyzer is used to measure the resonant frequency of the cavity system and read the measured resonant frequency by obtaining the S11 curve or the S21 curve; 10MHz frequency reference source, used to generate 10MHz frequency standard, connected to network analyzer and calibrated; A simulation module is used to construct a simulation model of the cavity-bubble system according to the state parameters of the cavity-bubble system; perform parameter scanning analysis according to the simulation model to obtain a relationship image between the dielectric constant of the storage bubble and the simulated resonant frequency of the cavity-bubble system; The state parameters are data of actual devices for designing the cavity-bubble system, and the actual devices involve measurement environment, microwave resonant cavity, storage bubble, tuner, and antenna coupling ring; parameter types include temperature, structural dimensions, surface roughness, electrical parameters, and surface coating parameters; The calculation module is used to read the measured resonance frequency from the network analyzer, and determine the dielectric constant value of the storage bubble by comparing it with the simulated resonance frequency on the relationship image.

6. The device according to claim 5, characterized in that The cavity-bubble system is composed of a microwave resonant cavity, a storage bubble, a tuner and an antenna coupling ring; The calculation module further obtains multiple dielectric constant values ​​at different resonant frequencies through multiple measurements according to different tuner positions, and takes an average as the measurement result of the dielectric constant of the storage bubble.

7. The device according to claim 5, characterized in that The simulation module constructs the state parameters of the cavity-bubble system based on the simulation model, including: the temperature of the measurement environment; the cavity structure of the microwave resonant cavity, the film thickness, conductivity and roughness of the cavity surface coating; the structure and surface roughness of the storage bubble; the structure and position of the tuner and the film thickness, conductivity and roughness of the surface coating; the structure of the antenna coupling ring and the film thickness, conductivity and roughness of the surface coating; the microwave power input to the cavity-bubble system by the network analyzer.

8. The device according to claim 6, characterized in that The microwave resonant cavity is a magnetron type resonant cavity, or a standard waveguide resonant cavity.

9. The device according to claim 6, characterized in that The antenna coupling ring is a measurement interface for measuring the resonant frequency of the cavity-bubble system, and the number of the antenna coupling ring is at least one.

10. The device according to claim 5, characterized in that The storage bubble, as the component to be tested, is made of ceramic, quartz, Teflon or sapphire, and has a spherical, rectangular, ellipsoidal or cylindrical shape.

Citation Information

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