Chip production spacing control method and system

Abstract

The invention relates to the technical field of manufacturing process control, and discloses a chip production spacing control method and system, and the method comprises the steps: extracting a corresponding historical welding record from a historical welding record library based on pad state data and a welding spacing threshold value, and analyzing the historical welding record, calculating a historical deviation coefficient of the welding spacing threshold based on the analysis result; according to the historical deviation coefficient, whether the welding interval threshold value needs to be corrected or not is judged, if yes, a correction coefficient corresponding to the welding interval threshold value is set, and a corrected welding interval threshold value is obtained; environment parameters and process parameters in the welding process are collected, the environment parameters and the process parameters are analyzed, and a compensation control algorithm is generated based on the analysis result; chip welding is conducted according to the corrected welding interval threshold value, and the welding process is controlled through an SPC tool based on a compensation control algorithm; according to the invention, the welding quality in the chip production process can be effectively improved, and welding defects caused by improper spacing can be reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of manufacturing process control, and in particular to a chip production spacing control method and system. Background Art

[0002] In the semiconductor industry, especially in the chip manufacturing process, the control of pad spacing is particularly important. The accuracy of pad spacing directly determines the performance and reliability of the chip. If the pad spacing is too large or too small, it will have a negative impact on the normal operation of the chip and even cause the chip to fail. Therefore, the precise control of pad spacing is an indispensable part of the chip manufacturing process.

[0003] However, traditional pad spacing control methods have many limitations. First, the control accuracy of these methods is often insufficient, which is difficult to meet the high-precision requirements of modern chip manufacturing. Second, these methods have a low degree of automation and require a lot of manual intervention, which increases production costs and the probability of errors. In addition, the production efficiency of traditional methods is not high, which is difficult to meet the needs of large-scale production.

[0004] Therefore, it is necessary to design a chip production spacing control method and system to solve the technical problems existing in the prior art. Summary of the invention

[0005] In view of this, the present invention proposes a chip production spacing control method and system, aiming to solve the problem that the pad spacing control method in the current technology is difficult to meet the high-precision requirements of modern chip manufacturing.

[0006] In one aspect, the present invention provides a chip production spacing control method, comprising the following steps:

[0007] S100: Determine a pad to be monitored, and obtain pad status data of the pad to be monitored;

[0008] S200: Acquire welding requirement data and component characteristic data, and determine a welding spacing threshold value according to the pad status data, welding requirement data and component characteristic data;

[0009] S300: extracting corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyzing the historical welding records, and calculating a historical deviation coefficient of the welding spacing threshold based on the analysis result;

[0010] S400: judging whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, and if so, setting a correction coefficient corresponding to the welding spacing threshold, and obtaining a corrected welding spacing threshold;

[0011] S500: collecting environmental parameters and process parameters during the welding process, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results; wherein the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature and welding pressure;

[0012] S600: performing chip welding according to the modified welding spacing threshold, and controlling the welding process using an SPC tool and based on a compensation control algorithm.

[0013] Further, determining the welding spacing threshold according to the pad status data, welding requirement data and component characteristic data includes:

[0014] The welding spacing threshold is obtained by the following formula:

[0015]

[0016] Where D is the welding spacing threshold, D p is the pad diameter, T p is the pad thickness, C p is the pad surface flatness factor, T w is the welding required temperature, P w is the welding pressure requirement, t w is the welding time required, S c is the component size factor, W c is the component weight factor, K is the empirical coefficient, K includes K1 and K2, K1<K2, when K=K1, D is the first welding spacing threshold, when K=K2, D is the second welding spacing threshold.

[0017] Further, the analyzing the historical welding records and calculating the historical deviation coefficient of the welding spacing threshold based on the analysis results include:

[0018] Determine the welding influencing factors corresponding to each abnormal welding behavior and construct a welding influencing factor sequence;

[0019] Counting a first number of normal welding behaviors and a second number of abnormal welding behaviors;

[0020] Calculate the historical deviation coefficient of the welding spacing threshold value according to the welding influencing factor sequence, the first quantity and the second quantity;

[0021] The historical deviation coefficient is obtained by the following formula:

[0022]

[0023] Where HDC is the historical deviation coefficient, F iis the ith welding influence factor in the welding influence factor sequence, A i is the number of the i-th abnormal welding behavior, N is the first number, M is the second number, and λ is the weight coefficient.

[0024] Further, the determining of the welding influencing factor corresponding to each abnormal welding behavior includes:

[0025] Extracting the actual welding time corresponding to the abnormal welding behavior, obtaining a preset ideal welding time, and calculating a first welding time difference according to the actual welding time and the ideal welding time;

[0026] Analyze all normal welding behaviors, determine the welding time corresponding to each normal welding behavior, and extract the minimum welding time;

[0027] Calculate a second welding time difference according to the actual welding time and the minimum welding time;

[0028] Calculating a welding influence factor corresponding to each abnormal welding behavior based on the first welding time difference and the second welding time difference;

[0029] The calculation formula of the welding influence factor is:

[0030] F = α1 × △T1 + α2 × △T2;

[0031] Wherein, F is the welding influence factor, △T1 is the first welding time difference, △T2 is the second welding time difference, α1 and α2 are time difference coefficients, and α1+α2=1 is satisfied.

[0032] Further, judging whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient includes:

[0033] Obtaining a preset historical deviation coefficient, and when the historical deviation coefficient is less than or equal to the preset historical deviation coefficient, determining that the welding spacing threshold does not need to be corrected;

[0034] When the historical deviation coefficient is greater than the preset historical deviation coefficient, it is determined that the welding spacing threshold needs to be corrected.

[0035] Further, the setting of the correction coefficient corresponding to the welding spacing threshold and obtaining the corrected welding spacing threshold includes:

[0036] Presetting a correction coefficient interval, wherein the correction coefficient interval includes a first correction coefficient, a second correction coefficient and a third correction coefficient;

[0037] Calculating a coefficient ratio of the historical deviation coefficient and the preset historical deviation coefficient;

[0038] When the coefficient ratio is greater than 1 and less than or equal to 1.2, the first correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the first correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold;

[0039] When the coefficient ratio is greater than 1.2 and less than or equal to 1.4, the second correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the second correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold;

[0040] When the coefficient ratio is greater than 1.4, the third correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the third correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold;

[0041] The corrected welding spacing threshold includes a first corrected welding spacing threshold and a second corrected welding spacing threshold.

[0042] Furthermore, the environmental parameters and process parameters in the welding process are collected, and the environmental parameters and process parameters are analyzed, and a compensation control algorithm is generated based on the analysis results, including:

[0043] Determine the real-time environmental standard value, and calculate the environmental parameter identification compensation amount according to the environmental parameter and the real-time environmental standard value, wherein the environmental parameter identification compensation amount is obtained by the following formula:

[0044] T A =r1×(m n -m r )+r2×(H n -H r );

[0045] Among them, T A is the environmental parameter identification compensation, m n is the real-time ambient temperature, m r is the standard value of ambient temperature, r1 is the temperature compensation coefficient, H n is the real-time ambient humidity, H r is the standard value of ambient humidity, r2 is the humidity compensation coefficient;

[0046] Calculate the welding process parameter identification compensation amount, which is obtained by the following formula:

[0047] T B =g1×9T n -T w )+g2×(P n -P w );

[0048] Among them, T B is the process parameter identification compensation, T n is the welding temperature, T w is the welding required temperature, P n is the welding pressure, P w is the welding required pressure, g1 is the welding temperature compensation coefficient, and g2 is the welding pressure compensation coefficient.

[0049] Furthermore, the collecting of environmental parameters and process parameters during the welding process, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results, also includes:

[0050] After the environmental parameter identification compensation amount and the welding process parameter identification compensation amount are corrected, the real-time pad spacing is collected, the real-time pad spacing is compared with the first corrected welding spacing threshold and the second corrected welding spacing threshold, and the real-time pad spacing is compensated according to the comparison result;

[0051] When the real-time pad spacing is less than the first corrected welding spacing threshold, selecting a first compensation coefficient to compensate the real-time pad spacing;

[0052] When the real-time pad spacing is between the first corrected welding spacing threshold and the second corrected welding spacing threshold, no compensation is performed;

[0053] When the real-time pad spacing is greater than the second corrected pad spacing threshold, a second compensation coefficient is selected to compensate for the real-time pad spacing.

[0054] Further, the chip welding is performed according to the modified welding spacing threshold, and the welding process is controlled using an SPC tool and based on a compensation control algorithm, including:

[0055] Using sensors to collect the environmental parameters and process parameters in real time, and inputting the data into the SPC tool for analysis;

[0056] And set control limits. When the key parameters exceed the control limits, correct the environmental parameters and process parameters. The control limits include the upper control limit threshold and the lower control limit threshold of each of the environmental parameters and process parameters. Always control the environmental parameters and process parameters to be between the upper control limit threshold and the lower control limit threshold.

[0057] Compared with the prior art, the beneficial effect of the present invention is that the chip production spacing control method provided by the present invention can effectively improve the welding quality in the chip production process and reduce welding defects caused by improper spacing. In addition, by real-time monitoring and adjustment of welding parameters, the method can adapt to changes in different environmental and material conditions and ensure the stability and reliability of the welding process. Ultimately, this will help improve overall production efficiency, reduce production costs, and enhance the market competitiveness of products.

[0058] On the other hand, the present invention also proposes a chip production spacing control system, comprising:

[0059] A determination module is configured to determine a pad to be monitored and obtain pad status data of the pad to be monitored;

[0060] A spacing threshold module is configured to obtain welding requirement data and component characteristic data, and determine a welding spacing threshold according to the pad state data, welding requirement data and component characteristic data;

[0061] A historical deviation coefficient calculation module is configured to extract corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyze the historical welding records, and calculate the historical deviation coefficient of the welding spacing threshold based on the analysis result;

[0062] a correction module, configured to determine whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, and if so, set a correction coefficient corresponding to the welding spacing threshold to obtain a corrected welding spacing threshold;

[0063] An algorithm generation module is configured to collect environmental parameters and process parameters during the welding process, analyze the environmental parameters and process parameters, and generate a compensation control algorithm based on the analysis results; wherein the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature and welding pressure;

[0064] The control module is configured to perform chip bonding according to the modified bonding pitch threshold, and control the bonding process using an SPC tool and based on a compensation control algorithm.

[0065] It is understandable that the above-mentioned chip production spacing control method and system have the same beneficial effects, which will not be described in detail here. BRIEF DESCRIPTION OF THE DRAWINGS

[0066] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0067] Figure 1 A flow chart of a chip production spacing control method provided by an embodiment of the present invention;

[0068] Figure 2 This is a structural block diagram of a chip production spacing control system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0069] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments described herein. On the contrary, these embodiments are provided in order to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art. It should be noted that, in the absence of conflict, the embodiments of the present invention and the features described in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0070] See also Figure 1 As shown, in some embodiments of the present application, this embodiment provides a chip production spacing control method, comprising the following steps:

[0071] S100: Determine a pad to be monitored, and obtain pad status data of the pad to be monitored;

[0072] In this embodiment, the pad status data includes pad diameter, pad thickness, pad shape and pad surface flatness.

[0073] S200: Obtain welding requirement data and component characteristic data, and determine a welding spacing threshold according to pad status data, welding requirement data and component characteristic data;

[0074] In this embodiment, the welding requirement data includes the welding requirement temperature, welding requirement pressure and welding requirement time; the component characteristic data includes the component size and component weight.

[0075] In this embodiment, the pad spacing threshold includes a first corrected welding spacing threshold and a second corrected welding spacing threshold. The first corrected welding spacing threshold is used to determine whether the pad spacing is too small, and the second corrected welding spacing threshold is used to determine whether the pad spacing is too large. Through such a setting, it can be ensured that the pad spacing during the welding process remains within an ideal range, thereby improving welding quality and chip production efficiency.

[0076] S300: extracting corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyzing the historical welding records, and calculating a historical deviation coefficient of the welding spacing threshold based on the analysis result;

[0077] In this embodiment, the historical welding record library is a database that pre-stores a large amount of historical welding data, which includes but is not limited to key parameters such as pad spacing, welding temperature, welding pressure, etc. under different welding conditions.

[0078] S400: judging whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, and if so, setting a correction coefficient corresponding to the welding spacing threshold, and obtaining a corrected welding spacing threshold;

[0079] S500: collecting environmental parameters and process parameters during the welding process, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results; wherein the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature and welding pressure;

[0080] S600: Perform chip bonding according to the corrected bonding pitch threshold, and use SPC tools to control the bonding process based on the compensation control algorithm.

[0081] In this embodiment, SPC (Statistical Process Control) is a method for monitoring and controlling the production process to ensure that the product meets the quality standards. By real-time monitoring of key parameters, the SPC tool can promptly detect abnormalities in the process and take measures to make adjustments to avoid the production of defective products. In the present invention, the SPC tool is combined with the compensation control algorithm to more accurately control the welding process and ensure the accuracy and consistency of the chip spacing.

[0082] It can be understood that the chip production spacing control method provided in this embodiment can effectively improve the welding quality in the chip production process and reduce welding defects caused by improper spacing. In addition, by real-time monitoring and adjusting welding parameters, the method can adapt to changes in different environmental and material conditions and ensure the stability and reliability of the welding process. Ultimately, this will help improve overall production efficiency, reduce production costs, and enhance the market competitiveness of products.

[0083] Specifically, when determining the welding spacing threshold according to the pad status data, welding requirement data and component characteristic data, it includes:

[0084] The welding spacing threshold is obtained by the following formula:

[0085]

[0086] Where D is the welding spacing threshold, D p is the pad diameter, T p is the pad thickness, C p is the pad surface flatness factor, T w is the welding required temperature, P w is the welding pressure requirement, t w is the welding time required, S c is the component size factor, W c is the component weight factor, K is the empirical coefficient, K includes K1 and K2, K1<K2, when K=K1, D is the first welding spacing threshold, when K=K2, D is the second welding spacing threshold.

[0087] It is understandable that the selection of the empirical coefficients K1 and K2 depends on the specific production environment and welding process requirements.

[0088] Specifically, the historical welding records are analyzed, and the historical deviation coefficient of the welding spacing threshold is calculated based on the analysis results, including:

[0089] Determine the welding influencing factors corresponding to each abnormal welding behavior and construct a welding influencing factor sequence;

[0090] counting a first number of normal welding behaviors and a second number of abnormal welding behaviors;

[0091] Calculate the historical deviation coefficient of the welding spacing threshold value according to the welding influencing factor sequence, the first quantity and the second quantity;

[0092] The historical deviation coefficient is obtained by the following formula:

[0093]

[0094] Where HDC is the historical deviation coefficient, F i is the ith welding influence factor in the welding influence factor sequence, A i is the number of the i-th abnormal welding behavior, N is the first number, M is the second number, and λ is the weight coefficient.

[0095] It is understandable that the determination of the weight coefficient λ is based on the evaluation of the influence on the stability and reliability of the welding process. In practical applications, the value of λ can be adjusted according to the specific requirements of the production environment and the welding process to ensure that the historical deviation coefficient HDC can accurately reflect the degree of deviation of the welding spacing threshold. In this way, it can ensure that the correction of the welding spacing threshold is more accurate, thereby improving the welding quality.

[0096] Specifically, determining the welding influencing factor corresponding to each abnormal welding behavior includes:

[0097] Extracting the actual welding time corresponding to the abnormal welding behavior, obtaining a preset ideal welding time, and calculating a first welding time difference according to the actual welding time and the ideal welding time;

[0098] Analyze all normal welding behaviors, determine the welding time corresponding to each normal welding behavior, and extract the minimum welding time;

[0099] Calculate a second welding time difference according to the actual welding time and the minimum welding time;

[0100] Calculate a welding influence factor corresponding to each abnormal welding behavior based on the first welding time difference and the second welding time difference;

[0101] The calculation formula of welding influence factor is:

[0102] F = α1 × △T1 + α2 × △T2;

[0103] Wherein, F is the welding influence factor, △T1 is the first welding time difference, △T2 is the second welding time difference, α1 and α2 are time difference coefficients, and α1+α2=1 is satisfied.

[0104] It is understandable that the selection of the time difference coefficients α1 and α2 depends on the specific welding process and production environment. In practical applications, the values ​​of α1 and α2 can be dynamically adjusted according to real-time feedback during the welding process to ensure that the welding influence factor can accurately reflect the degree of influence of abnormal welding behavior on welding quality. By accurately calculating the welding influence factor, the setting of the welding spacing threshold can be further optimized, thereby achieving higher quality welding effects in the production process. In addition, by real-time monitoring of key parameters in the welding process and combining compensation control algorithms, welding defects can be effectively reduced and the overall efficiency and product quality of chip production can be improved.

[0105] Specifically, when judging whether the welding spacing threshold needs to be corrected based on the historical deviation coefficient, it includes:

[0106] Obtaining a preset historical deviation coefficient, and when the historical deviation coefficient is less than or equal to the preset historical deviation coefficient, it is determined that there is no need to correct the welding spacing threshold;

[0107] When the historical deviation coefficient is greater than the preset historical deviation coefficient, it is determined that the welding spacing threshold needs to be corrected.

[0108] It is understandable that the setting of the preset historical deviation coefficient is based on the consideration of the long-term stability of the welding process and the comprehensive analysis of historical data. In actual production, the setting of this coefficient needs to take into account factors such as the volatility of the production environment, changes in material properties, and the performance of welding equipment. By setting a reasonable preset historical deviation coefficient, it can be ensured that the adjustment of the welding spacing threshold is neither too frequent nor lags behind the actual production needs, thereby improving production efficiency and reducing costs while ensuring welding quality. In addition, by real-time monitoring and analysis of key parameters in the welding process, combined with a compensation control algorithm, dynamic adjustment of the welding spacing threshold can be achieved, further improving the accuracy and reliability of chip welding.

[0109] Specifically, when setting the correction coefficient corresponding to the welding spacing threshold and obtaining the corrected welding spacing threshold, it includes:

[0110] Presetting a correction coefficient interval, wherein the correction coefficient interval includes a first correction coefficient, a second correction coefficient and a third correction coefficient;

[0111] Calculate the coefficient ratio of the historical deviation coefficient and the preset historical deviation coefficient;

[0112] When the coefficient ratio is greater than 1 and less than or equal to 1.2, the first correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the first correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold;

[0113] When the coefficient ratio is greater than 1.2 and less than or equal to 1.4, the second correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the second correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold;

[0114] When the coefficient ratio is greater than 1.4, the third correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the third correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold;

[0115] The corrected welding spacing threshold includes a first corrected welding spacing threshold and a second corrected welding spacing threshold.

[0116] It is understandable that the selection of the correction coefficient is based on an in-depth understanding of the impact on welding quality and the need to optimize production efficiency. In practical applications, the values ​​of the first correction coefficient, the second correction coefficient, and the third correction coefficient can be dynamically adjusted according to the real-time data in the welding process, and the first correction coefficient < the second correction coefficient < the third correction coefficient. Such a setting ensures that the adjustment of the welding spacing threshold can be flexibly responded to according to the degree of deviation in the actual welding process, and will not affect the welding quality due to excessive correction, nor will it be unable to correct the deviation in the welding process in time due to insufficient correction. In this way, it can be ensured that the correction of the welding spacing threshold meets the actual production needs and does not have a negative impact on the welding quality. In addition, by real-time monitoring of key parameters in the welding process and combining compensation control algorithms, welding defects can be effectively reduced and the overall efficiency and product quality of chip production can be improved.

[0117] Specifically, the environmental parameters and process parameters in the welding process are collected, and the environmental parameters and process parameters are analyzed. Based on the analysis results, a compensation control algorithm is generated, including:

[0118] The real-time environmental standard value is determined, and the environmental parameter identification compensation amount is calculated according to the environmental parameter and the real-time environmental standard value. The environmental parameter identification compensation amount is obtained by the following formula:

[0119] T A =r1×(m n -m r )+r2×(H n -H r );

[0120] Among them, T A is the environmental parameter identification compensation, m n is the real-time ambient temperature, m r is the standard value of ambient temperature, r1 is the temperature compensation coefficient, H n is the real-time ambient humidity, H r is the standard value of ambient humidity, r2 is the humidity compensation coefficient;

[0121] Calculate the welding process parameter identification compensation amount, which is obtained by the following formula:

[0122] T B =g1×(T n -T w )+g2×9P n -P w );

[0123] Among them, T B is the process parameter identification compensation, T n is the welding temperature, T w is the welding required temperature, Pn is the welding pressure, P w is the welding required pressure, g1 is the welding temperature compensation coefficient, and g2 is the welding pressure compensation coefficient.

[0124] It can be understood that by accurately calculating the compensation amount of environmental parameters and process parameters, the welding process can be effectively adjusted to adapt to environmental changes and ensure welding quality. The setting of temperature compensation coefficient and humidity compensation coefficient, as well as the compensation coefficient of welding temperature and pressure, are based on a deep understanding of the welding process and strict requirements for welding quality. In actual production, these compensation coefficients need to be dynamically adjusted according to the real-time monitored environmental and process parameters to ensure the stability of the welding process and the consistency of the welding results. In this way, the accuracy and reliability of chip welding can be further improved, and welding defects caused by environmental changes or improper operation can be reduced, thereby improving overall production efficiency and product quality.

[0125] Specifically, the environmental parameters and process parameters in the welding process are collected, and the environmental parameters and process parameters are analyzed. Based on the analysis results, when a compensation control algorithm is generated, it also includes:

[0126] After the environmental parameter identification compensation amount and the welding process parameter identification compensation amount are corrected, the real-time pad spacing is collected, the real-time pad spacing is compared with the first corrected welding spacing threshold and the second corrected welding spacing threshold, and the real-time pad spacing is compensated according to the comparison result;

[0127] When the real-time pad spacing is less than the first corrected pad spacing threshold, selecting a first compensation coefficient to compensate the real-time pad spacing;

[0128] When the real-time pad spacing is between the first corrected welding spacing threshold and the second corrected welding spacing threshold, no compensation is performed;

[0129] When the real-time pad spacing is greater than the second corrected pad spacing threshold, a second compensation coefficient is selected to compensate the real-time pad spacing.

[0130] It is understandable that by compensating for the real-time pad spacing, it is possible to ensure that the spacing during the welding process is always kept within the ideal range, thereby avoiding welding defects caused by excessive or small spacing. The selection of the first compensation coefficient and the second compensation coefficient is based on an in-depth analysis of the impact on welding quality and the need to optimize production efficiency. In practical applications, these two compensation coefficients can be dynamically adjusted according to the real-time monitored pad spacing data to adapt to different production conditions and material properties. In this way, welding defects can be effectively reduced and the overall efficiency and product quality of chip production can be improved. In addition, by real-time monitoring of key parameters in the welding process and combining the compensation control algorithm, the accuracy and reliability of chip welding can be further improved, ensuring welding quality while improving production efficiency and reducing costs.

[0131] Specifically, when performing chip bonding according to the modified bonding pitch threshold, using the SPC tool and controlling the bonding process based on the compensation control algorithm, it includes:

[0132] Use sensors to collect environmental parameters and process parameters in real time and input the data into SPC tools for analysis;

[0133] And set control limits. When key parameters exceed the control limits, correct the environmental parameters and process parameters. The control limits include the upper control limit threshold and the lower control limit threshold of each environmental parameter and process parameter. The environmental parameters and process parameters are always controlled between the upper control limit threshold and the lower control limit threshold.

[0134] It is understandable that the use of SPC tools can monitor the key parameters of the welding process in real time to ensure the stability of welding quality. The control limits are set to prevent the parameters in the welding process from fluctuating beyond the acceptable range, thereby avoiding unqualified welding results. The setting of the upper control limit threshold and the lower control limit threshold is based on in-depth research on the welding process and historical data analysis to ensure that every link of the welding process operates in the best condition. When it is detected that the parameters are beyond the control limit, the system will automatically adjust the environmental parameters and process parameters to quickly return to normal working conditions. This real-time monitoring and automatic adjustment mechanism not only improves the reliability of the welding process, but also reduces the need for manual intervention, further improving production efficiency and product quality.

[0135] See also Figure 2 As shown, in some embodiments of the present application, this embodiment provides a chip production spacing control system, including:

[0136] A determination module is configured to determine a pad to be monitored and obtain pad status data of the pad to be monitored;

[0137] A spacing threshold module is configured to obtain welding requirement data and component characteristic data, and determine a welding spacing threshold according to pad status data, welding requirement data and component characteristic data;

[0138] A historical deviation coefficient calculation module is configured to extract corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyze the historical welding records, and calculate the historical deviation coefficient of the welding spacing threshold based on the analysis result;

[0139] a correction module, configured to determine whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, and if so, set a correction coefficient corresponding to the welding spacing threshold to obtain a corrected welding spacing threshold;

[0140] The algorithm generation module is configured to collect environmental parameters and process parameters during the welding process, analyze the environmental parameters and process parameters, and generate a compensation control algorithm based on the analysis results; wherein the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature and welding pressure;

[0141] The control module is configured to perform chip bonding according to the modified bonding pitch threshold, and to control the bonding process based on a compensation control algorithm using an SPC tool.

[0142] It is understandable that the chip production spacing control system provided in this embodiment can effectively adapt to a variety of production environments and ensure the stability of the welding process and the consistency of welding quality. Through real-time monitoring and dynamic adjustment, welding defects caused by environmental changes or improper operation can be significantly reduced, thereby improving overall production efficiency and product quality. In addition, this method can also monitor key parameters in the welding process in real time through the use of SPC tools to ensure the stability of welding quality. The setting of control limits is to prevent parameter fluctuations in the welding process from exceeding the acceptable range, thereby avoiding unqualified welding results. The setting of the upper control limit threshold and the lower control limit threshold is based on in-depth research on the welding process and historical data analysis to ensure that every link of the welding process is running in the best state. When it is detected that the parameters exceed the control limit, the system will automatically adjust the environmental parameters and process parameters to quickly return to normal working conditions. This real-time monitoring and automatic adjustment mechanism not only improves the reliability of the welding process, but also reduces the need for manual intervention, further improving production efficiency and product quality.

[0143] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes.

[0144] The present application is described with reference to flowcharts and / or block diagrams of methods, devices (systems) and computer program products according to embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0145] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0146] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0147] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A chip production spacing control method, characterized in that: include: Determine a pad to be monitored, and obtain pad status data of the pad to be monitored; Acquire welding requirement data and component characteristic data, and determine a welding spacing threshold value according to the pad status data, welding requirement data and component characteristic data; Extracting corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyzing the historical welding records, and calculating a historical deviation coefficient of the welding spacing threshold based on the analysis result; Determining whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, and if so, setting a correction coefficient corresponding to the welding spacing threshold to obtain a corrected welding spacing threshold; Collecting environmental parameters and process parameters during the welding process, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results; wherein the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature and welding pressure; Chip bonding is performed according to the modified bonding pitch threshold, and the bonding process is controlled using an SPC tool based on a compensation control algorithm.

2. The chip production spacing control method according to claim 1, characterized in that: The step of determining the welding spacing threshold according to the pad status data, welding requirement data and component characteristic data includes: The welding spacing threshold is obtained by the following formula: Where D is the welding spacing threshold, D p is the pad diameter, T p is the pad thickness, C p is the pad surface flatness factor, T w is the welding required temperature, P w is the welding pressure requirement, t w is the welding time required, S c is the component size factor, W c is the component weight factor, K is the empirical coefficient, K includes K1 and K2, K1<K2, when K=K1, D is the first welding spacing threshold, when K=K2, D is the second welding spacing threshold.

3. The chip production spacing control method according to claim 1, characterized in that: The analyzing the historical welding records and calculating the historical deviation coefficient of the welding spacing threshold based on the analysis results includes: Determine the welding influencing factors corresponding to each abnormal welding behavior and construct a welding influencing factor sequence; Counting a first number of normal welding behaviors and a second number of abnormal welding behaviors; Calculate the historical deviation coefficient of the welding spacing threshold value according to the welding influencing factor sequence, the first quantity and the second quantity; The historical deviation coefficient is obtained by the following formula: Where HDC is the historical deviation coefficient, F i is the ith welding influence factor in the welding influence factor sequence, A i is the number of the i-th abnormal welding behavior, N is the first number, M is the second number, and λ is the weight coefficient.

4. The chip production spacing control method according to claim 3, characterized in that: The step of determining the welding influencing factor corresponding to each abnormal welding behavior includes: Extracting the actual welding time corresponding to the abnormal welding behavior, obtaining a preset ideal welding time, and calculating a first welding time difference according to the actual welding time and the ideal welding time; Analyze all normal welding behaviors, determine the welding time corresponding to each normal welding behavior, and extract the minimum welding time; Calculate a second welding time difference according to the actual welding time and the minimum welding time; Calculating a welding influence factor corresponding to each abnormal welding behavior based on the first welding time difference and the second welding time difference; The calculation formula of the welding influence factor is: F = α1 × △T1 + α2 × △T2; Wherein, F is the welding influence factor, △T1 is the first welding time difference, △T2 is the second welding time difference, α1 and α2 are time difference coefficients, and α1+α2=1 is satisfied.

5. The chip production spacing control method according to claim 4, characterized in that: The determining whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient includes: Obtaining a preset historical deviation coefficient, and when the historical deviation coefficient is less than or equal to the preset historical deviation coefficient, determining that the welding spacing threshold does not need to be corrected; When the historical deviation coefficient is greater than the preset historical deviation coefficient, it is determined that the welding spacing threshold needs to be corrected.

6. The chip production spacing control method according to claim 5, characterized in that: The step of setting a correction coefficient corresponding to the welding spacing threshold and obtaining a corrected welding spacing threshold comprises: Presetting a correction coefficient interval, wherein the correction coefficient interval includes a first correction coefficient, a second correction coefficient and a third correction coefficient; Calculating a coefficient ratio of the historical deviation coefficient and the preset historical deviation coefficient; When the coefficient ratio is greater than 1 and less than or equal to 1.2, the first correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the first correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold; When the coefficient ratio is greater than 1.2 and less than or equal to 1.4, the second correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the second correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold; When the coefficient ratio is greater than 1.4, the third correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the third correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold; The corrected welding spacing threshold includes a first corrected welding spacing threshold and a second corrected welding spacing threshold.

7. The chip production spacing control method according to claim 6, characterized in that: The collecting of environmental parameters and process parameters during welding, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results include: Determine the real-time environmental standard value, and calculate the environmental parameter identification compensation amount according to the environmental parameter and the real-time environmental standard value, wherein the environmental parameter identification compensation amount is obtained by the following formula: T A =r1×9m n -m r )+r2×9H n -H r ); Among them, T A is the environmental parameter identification compensation, m n is the real-time ambient temperature, m r is the standard value of ambient temperature, r1 is the temperature compensation coefficient, H n is the real-time ambient humidity, H r is the standard value of ambient humidity, r2 is the humidity compensation coefficient; Calculate the welding process parameter identification compensation amount, which is obtained by the following formula: T B =g1×(T n -T w )+g2×(P n -P w ); Among them, T B is the process parameter identification compensation, T n is the welding temperature, T w is the welding required temperature, P n is the welding pressure, P w is the welding required pressure, g1 is the welding temperature compensation coefficient, and g2 is the welding pressure compensation coefficient.

8. The chip production spacing control method according to claim 7, characterized in that: The collecting of environmental parameters and process parameters during welding, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results, also includes: After the environmental parameter identification compensation amount and the welding process parameter identification compensation amount are corrected, the real-time pad spacing is collected, the real-time pad spacing is compared with the first corrected welding spacing threshold and the second corrected welding spacing threshold, and the real-time pad spacing is compensated according to the comparison result; When the real-time pad spacing is less than the first corrected welding spacing threshold, selecting a first compensation coefficient to compensate the real-time pad spacing; When the real-time pad spacing is between the first corrected welding spacing threshold and the second corrected welding spacing threshold, no compensation is performed; When the real-time pad spacing is greater than the second corrected pad spacing threshold, a second compensation coefficient is selected to compensate for the real-time pad spacing.

9. The chip production spacing control method according to claim 8, characterized in that: The chip welding is performed according to the modified welding spacing threshold, and the welding process is controlled using an SPC tool based on a compensation control algorithm, including: Using sensors to collect the environmental parameters and process parameters in real time, and inputting the data into the SPC tool for analysis; And set control limits. When the key parameters exceed the control limits, correct the environmental parameters and process parameters. The control limits include the upper control limit threshold and the lower control limit threshold of each of the environmental parameters and process parameters. Always control the environmental parameters and process parameters to be between the upper control limit threshold and the lower control limit threshold.

10. A chip production spacing control system, characterized in that: include: A determination module is configured to determine a pad to be monitored and obtain pad status data of the pad to be monitored; A spacing threshold module is configured to obtain welding requirement data and component characteristic data, and determine a welding spacing threshold according to the pad state data, welding requirement data and component characteristic data; A historical deviation coefficient calculation module is configured to extract corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyze the historical welding records, and calculate the historical deviation coefficient of the welding spacing threshold based on the analysis result; a correction module, configured to determine whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, and if so, set a correction coefficient corresponding to the welding spacing threshold to obtain a corrected welding spacing threshold; An algorithm generation module is configured to collect environmental parameters and process parameters during the welding process, analyze the environmental parameters and process parameters, and generate a compensation control algorithm based on the analysis results; wherein the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature and welding pressure; The control module is configured to perform chip bonding according to the modified bonding pitch threshold, and control the bonding process using an SPC tool and based on a compensation control algorithm.

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