Chip detection equipment for electronic information engineering
By using the coordinated settings of components such as the base plate, controller, and probe needle in the chip detection equipment, the problem of poor linkage and coordination performance of the chip detection equipment in the prior art is solved, and a high degree of automation of chip detection is achieved.
Patent Information
- Application Number
- CN202411794878.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-09
- Publication Date
- 2025-02-25
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
During the working process of existing chip detection equipment, the linkage and coordination performance between the chip loading assembly and the proximity detection assembly of the probe are poor, and the degree of automation is low.
Through the coordination arrangement of the bottom plate, controller, detection needle, side plate, roller, conveyor belt, first support member, drive wheel, drive pin, driven wheel, drive groove, first cam, second support member, lifting rod and drive device, automatic detection of the chip is realized.
It improves the linkage and coordination performance of chip detection equipment, improves the degree of automation, and ensures the accuracy and efficiency of detection.
Smart Images

Figure CN119511044A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of chip detection, and in particular to chip detection equipment for electronic information engineering. Background Art
[0002] A chip is a general term for semiconductor components, classified as integrated circuits, and composed of a large number of transistors. Different chips have varying levels of integration, ranging from hundreds of millions to tens or hundreds of transistors. Transistors have two states: on and off, represented by 1 and 0. Multiple transistors generate multiple 1 and 0 signals, which are programmed to specific functions (i.e., instructions and data) to represent or process letters, numbers, colors, and graphics. When the chip is powered on, it first generates a startup instruction to activate the chip, and then continuously accepts new instructions and data to complete its function.
[0003] With the continuous advancement of technology, integrated circuit chips, as core components of electronic devices, have become increasingly important for their performance and quality, crucial to the stability and reliability of the entire electronic product. Therefore, rigorous testing of integrated circuit chips is particularly important. Chip testing equipment was developed precisely to meet this demand. Chip testing requires a probe to be brought close to the chip. However, existing chip testing equipment suffers from poor coordination and interoperability between the chip loading assembly and the probe's proximity testing component, resulting in a low degree of automation.
[0004] For example, the Chinese invention patent with patent publication number CN113009320B discloses an optical chip detection seat that can be used for high-frequency testing. The device uses motor 2 to drive the rotation of the turntable to perform work station conversion, and then uses motor 1 to drive the detection needle through the upper detection seat to approach the chip at the detection position for chip detection. In this detection method, it is difficult to achieve the linkage and coordination between motor 1 and motor 2 during the working process, and the degree of automation is low. Summary of the Invention
[0005] The embodiment of the present invention provides a chip detection device for electronic information engineering, which can solve the problems of poor linkage and coordination performance and low automation between the chip loading component and the probe proximity detection component in the prior art.
[0006] In order to solve the above technical problems, the present invention adopts the following technical solutions: a chip detection device for electronic information engineering, comprising a base plate, a controller, and a detection needle electrically connected to the controller, wherein a conveyor is provided on the base plate, the conveyor comprising two oppositely arranged side plates, two rollers rotatably connected between the two side plates, the two rollers being distributed at both ends of the two side plates, and a conveyor belt being transmission-connected to the two rollers;
[0007] A first support member is provided at the front end of one of the side panels, a driving wheel is rotatably connected to the first support member, a driving pin is eccentrically provided on the driving wheel, a driven wheel is coaxially provided with the roller at the front end, a plurality of driving grooves adapted to the driving pin are provided in a ring array on the edge of the driven wheel, a first cam is coaxially provided on the driving wheel, a second support member is provided on the other side panel, a lifting rod is vertically slidably connected to the second support member, an "L"-shaped connecting rod is provided on the lifting rod, the detection needle is provided at the lower end of the "L"-shaped connecting rod, and a driving device for driving the first cam and the driving wheel to rotate synchronously is provided on the bottom plate.
[0008] Preferably, a first elastic member is provided between the lifting rod and the second supporting member, and the lower end of the lifting rod is in close contact with the first cam under the action of the elastic potential energy of the first elastic member.
[0009] Preferably, a locking arc is provided on the driving wheel, and a locking groove adapted to the locking arc is provided on the edge annular array of the driven wheel. The number of the locking grooves is the same as the number of the driving grooves and is evenly spaced.
[0010] Preferably, a plurality of detection grooves are evenly arranged on the conveying surface of the conveyor belt.
[0011] Preferably, the detection groove is internally slidably connected to a limit plate, the limit plate is provided with a force guide rod slidably connected to the side wall of the detection groove, a tension spring is provided between the limit plate and the inner wall of the detection groove, and a trapezoidal guide block is provided on the inner wall of the side plate on the same side as the force guide rod.
[0012] Preferably, a collecting box is slidably connected to the bottom plate, and a partition is provided inside the collecting box, which separates the collecting box into a good product slot and a waste product slot. The collecting box is located below the front end of the conveyor, and a telescopic device with an output end fixedly connected to the collecting box is provided on the bottom plate, and the telescopic device is electrically connected to the controller.
[0013] Preferably, a photoelectric sensor electrically connected to the controller is provided at the front end of the conveyor.
[0014] Preferably, a piston cylinder is provided on the second support member, an air inlet pipe and an air outlet pipe are provided on the piston cylinder, a piston is slidably connected to the interior of the piston cylinder, a second elastic member is provided between the piston and the inner bottom wall of the piston cylinder, a piston rod is provided on the piston extending from the piston cylinder, a second cam is coaxially provided on the driving wheel, and the front end of the piston rod is in close contact with the second cam under the action of the elastic potential energy of the second elastic member.
[0015] Preferably, the air inlet pipe and the air outlet pipe are respectively provided with an air check valve.
[0016] Preferably, the driving device includes a driving portion arranged on the base plate, an output end of the driving portion is provided with a driving pulley, a driven pulley is coaxially provided with the driving pulley, and a belt is connected between the driving pulley and the driven pulley.
[0017] Compared with the prior art, the present invention is provided with a bottom plate, a controller, a detection needle, a side plate, a roller, a conveyor belt, a first support, a driving wheel, a driving pin, a driven wheel, a driving groove, a first cam, a second support, a lifting rod, an "L"-shaped connecting rod and a driving device. The chip to be detected is evenly placed on the upper conveyor belt from the rear end of the conveyor by manual or mechanical means. The driving device drives the first cam and the driving wheel to rotate synchronously. One rotation of the driving wheel will drive the driving pin to rotate one circle. The driving pin drives the driven wheel to rotate a specific angle through the driving groove. The driven wheel drives the coaxial arrangement thereof. The rollers rotate synchronously, and the two rollers exert tension on the conveyor belt. When the rollers rotate, the conveyor belt is driven to rotate synchronously through friction, so that the conveyor belt moves a specific distance, and the chip to be detected is intermittently moved to the detection position (directly below the detection needle) in sequence. The first cam rotates one circle synchronously to drive the lifting rod to rise and fall once. The lifting rod drives the detection needle to rise and fall once through the "L"-shaped connecting rod to approach the chip to be detected, and detect the chip. The drive device works continuously, so that the work station conversion and the lifting and lowering detection of the detection needle are carried out continuously, with good linkage and coordination performance and a high degree of automation. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 This is a schematic diagram of the main structure of the present invention;
[0019] Figure 2 This is a rear view structural diagram of the present invention;
[0020] Figure 3 This is a schematic diagram of the structure of the conveyor of the present invention from a top view;
[0021] Figure 4 This is a schematic diagram of the cross-sectional structure of the piston cylinder of the present invention;
[0022] Figure 5 This is a schematic diagram of the main cross-sectional structure of the collection box of the present invention;
[0023] Figure 6 For the present invention Figure 3 A magnified schematic diagram of the structure in the middle.
[0024] In the figure: 1. Base plate; 2. Detection needle; 3. Side plate; 4. Roller; 5. Conveyor belt; 6. First support member; 7. Driving wheel; 8. Driving pin; 9. Driven wheel; 10. Driving groove; 11. First cam; 12. Second support member; 13. Lifting rod; 14. "L"-shaped connecting rod; 15. First elastic member; 16. Locking arc; 17. Locking groove; 18. Detection groove; 19. Limiting plate; 20. Guide rod; 21. Tension spring; 22. Trapezoidal guide block; 23. Collecting box; 24. Partition; 25. Photoelectric sensor; 26. Piston cylinder; 27. Inlet pipe; 28. Outlet pipe; 29. Piston; 30. Second elastic member; 31. Piston rod; 32. Second cam; 33. Driving part; 34. Active pulley; 35. Driven pulley; 36. Belt. DETAILED DESCRIPTION
[0025] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "axial", "radial", "circumferential" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the technical solutions of the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.
[0026] like Figures 1 to 6 As shown, a chip detection device for electronic information engineering includes a base plate 1, a controller, and a detection probe 2 electrically connected to the controller. A conveyor is provided on the base plate 1. The conveyor includes two oppositely arranged side plates 3. Two rollers 4 are rotatably connected between the two side plates 3. The two rollers 4 are distributed at both ends of the two side plates 3. A conveyor belt 5 is connected to the two rollers 4 in a driving manner.
[0027] A first support member 6 is provided at the front end of one of the side panels 3, and a driving wheel 7 is rotatably connected to the first support member 6. A driving pin 8 is eccentrically provided on the driving wheel 7. A driven wheel 9 is coaxially provided on the roller 4 at the front end, and a plurality of driving grooves 10 adapted to the driving pin are provided in a ring array on the edge of the driven wheel 9. A first cam 11 is coaxially provided on the driving wheel 7. A second support member 12 is provided on the other side panel 3, and a lifting rod 13 is vertically slidably connected to the second support member 12. An "L"-shaped connecting rod 14 is provided on the lifting rod 13, and the detection needle 2 is provided at the lower end of the "L"-shaped connecting rod 14. A driving device for driving the first cam 11 and the driving wheel 7 to rotate synchronously is provided on the base plate 1.
[0028] During specific use, the chip to be tested is evenly placed on the upper conveyor belt 5 from the rear end of the conveyor by manual or mechanical means, and the driving device drives the first cam 11 and the driving wheel 7 to rotate synchronously. One rotation of the driving wheel 7 will drive the driving pin 8 to rotate one circle. The driving pin 8 drives the driven wheel 9 to rotate a specific angle through the driving slot 10, and the driven wheel 9 drives the roller 4 coaxially arranged therewith to rotate synchronously. The two rollers 4 have a tension effect on the conveyor belt 5. When the roller 4 rotates, the conveyor belt 5 will be driven to rotate synchronously through the friction force, so that the conveyor belt 5 moves a specific distance, so that the chip to be tested is intermittently moved in sequence to the point directly below the detection position detection needle 2. The first cam 11 rotates synchronously one circle to drive the lifting rod 13 to lift once. The lifting rod 13 drives the detection needle 2 to lift once through the "L"-shaped connecting rod 14 to approach the chip to be tested, and detect the chip. The driving device continues to work, so that the work station conversion and the lifting and lowering detection of the detection needle 2 are carried out continuously.
[0029] In order to achieve the purpose of improving detection accuracy, preferably, a first elastic member 15 is provided between the lifting rod 13 and the second support member 12. The lower end of the lifting rod 13 is in close contact with the first cam 11 under the action of the elastic potential energy of the first elastic member 15. The first elastic member 15 is preferably a spring. During detection, the detection needle 2 is in close contact with the chip under the action of the elastic potential energy of the spring, avoiding poor contact and improving detection accuracy.
[0030] In order to achieve the purpose of improving detection accuracy, preferably, a locking arc 16 is provided on the driving wheel 7, and a locking groove 17 adapted to the locking arc 16 is provided on the edge ring array of the driven wheel 9. The number of the locking grooves 17 is the same as the number of the driving grooves 10 and is evenly spaced. Each time the driving wheel 7 drives the driven wheel 9 to rotate once, the locking arc 16 is embedded in the locking groove 17 once to prevent the driven wheel 9 from rotating by inertia. The intermittent rotation of the driven wheel 9 drives the conveyor to rotate intermittently.
[0031] In order to achieve the purpose of improving detection accuracy, preferably, a plurality of detection grooves 18 are evenly arranged on the conveying surface of the conveyor belt 5 to facilitate the positioning and placement of the chip, and the adjacent chips are evenly spaced, so that when the chip to be detected moves to the detection position, it is just below the detection needle 2, thereby improving the detection accuracy and detection efficiency.
[0032] In order to achieve the purpose of improving the detection accuracy, preferably, the internal sliding connection of the detection groove 18 is connected to the limit plate 19, and the limit plate 19 is provided with a guide rod 20 that is slidably connected to the side wall of the detection groove 18, and a tension spring 21 is provided between the limit plate 19 and the inner wall of the detection groove 18, and a trapezoidal guide block 22 is provided on the inner wall of the side plate 3 on the same side as the guide rod 20. When the chip to be detected moves to the detection position, under the extrusion action of the rear end inclined surface of the trapezoidal guide block 22, the limit plate 19 moves toward the side plate 3 on the other side, clamping the chip and fixing it at the same time, stretching the tension spring 21. After the detection is completed, when the chip is moved out of the detection position, the guide rod 20 gradually disengages from the front end inclined surface of the trapezoidal guide block 22, and the limit plate 19 is reset under the tension of the tension spring 21, releasing the chip, which has the effect of automatically fixing the chip during detection and automatically releasing the chip after detection, avoiding chip dislocation and improving detection accuracy.
[0033] In order to achieve the purpose of automatically sorting chips, preferably, a collection box 23 is slidably connected to the bottom plate 1, and a partition 24 is provided inside the collection box 23. The partition 24 divides the collection box 23 into a good product slot and a waste slot. The collection box 23 is located below the front end of the conveyor, and a telescopic device with an output end fixedly connected to the collection box 23 is provided on the bottom plate 1. The telescopic device is electrically connected to the controller, and a photoelectric sensor 25 electrically connected to the controller is provided at the front end of the conveyor. The photoelectric sensor 25 is a through-beam sensor or a mirror reflection sensor, and the telescopic device is an electric push rod or a cylinder. Here, the front end of the collection box 23 is taken as the good product slot and the rear end of the collection box 23 is taken as the waste slot as an example. In the initial state, the good product slot is directly below the front end of the conveyor. The chips after inspection continue to move toward the front end with the conveyor. When the photoelectric sensor 25 detects that a defective product has passed, the telescopic end of the telescopic device extends, and the defective product falls into the waste slot. When the photoelectric sensor 25 detects that a good product has passed, the telescopic end of the telescopic device contracts, and the good product falls into the good product slot.
[0034] In order to achieve the purpose of improving the detection accuracy, preferably, a piston cylinder 26 is provided on the second support member 12, an air inlet pipe 27 and an air outlet pipe 28 are provided on the piston cylinder 26, a piston 29 is slidably connected to the inside of the piston cylinder 26, a second elastic member 30 is provided between the piston 29 and the inner bottom wall of the piston cylinder 26, a piston rod 31 passing through the piston cylinder 26 is provided on the piston 29, a second cam 32 is coaxially provided on the driving wheel 7, the front end of the piston rod 31 is in close contact with the second cam 32 under the action of the elastic potential energy of the second elastic member 30, an air check valve is provided on the air inlet pipe 27 and the air outlet pipe 28 respectively, an air filter is provided on the air inlet pipe 27, and the second The second elastic member 30 is preferably a spring. The air one-way valve on the air inlet pipe 27 only allows air to enter the piston cylinder 26 from the external atmosphere. The air one-way valve on the air outlet pipe 28 only allows air to enter the air outlet pipe 28 from the piston cylinder 26, and the reverse direction is cut off. During operation, the second cam 32 intermittently squeezes the piston rod 31, and the piston rod 31 drives the piston 29 to slide inside the piston cylinder 26. While squeezing the gap, the piston 29 is reset under the elastic potential energy of the second elastic member 30, so that the piston 29 performs piston motion inside the piston cylinder 26, extracts the air purified by the filter and blows it to the chip at the detection position to clean the chip and prevent dust from affecting the detection accuracy.
[0035] In order to achieve the purpose of chip detection, preferably, the driving device includes a driving part 33 arranged on the base plate 1, and the output end of the driving part 33 is provided with a driving pulley 34, and the driving wheel 7 is coaxially provided with a driven pulley 35, and a belt 36 is connected between the driving pulley 34 and the driven pulley 35. The driving part 33 is preferably a motor, and the driving part 33 drives the driving pulley 34 to rotate, and the driving pulley 34 drives the driven pulley 35 to rotate through the belt 36, and the driven pulley 35 drives the driving wheel 7, the first cam 11 and the second cam 32 to rotate synchronously, thereby realizing automatic detection of the chip.
[0036] Compared with the prior art, the present invention is provided with the coordination of the bottom plate 1, the controller, the detection needle 2, the side plate 3, the roller 4, the conveyor belt 5, the first support 6, the driving wheel 7, the driving pin 8, the driven wheel 9, the driving groove 10, the first cam 11, the second support 12, the lifting rod 13, the "L"-shaped connecting rod 14 and the driving device. The chip to be detected is evenly placed on the upper conveyor belt 5 from the rear end of the conveyor by manual or mechanical hands. The driving device drives the first cam 11 and the driving wheel 7 to rotate synchronously. The driving wheel 7 rotates one circle to drive the driving pin 8 to rotate one circle. The driving pin 8 drives the driven wheel 9 to rotate a specific angle through the driving groove 10. The driven wheel 9 drives The rollers 4 coaxially arranged therewith rotate synchronously, and the two rollers 4 exert tension on the conveyor belt 5. When the rollers 4 rotate, the conveyor belt 5 is driven to rotate synchronously by friction, so that the conveyor belt 5 moves a specific distance, and the chip to be detected is intermittently moved to the detection position (directly below the detection needle 2) in sequence. The first cam 11 rotates synchronously one circle to drive the lifting rod 13 to rise and fall once. The lifting rod 13 drives the detection needle 2 to rise and fall once through the "L"-shaped connecting rod 14 to approach the chip to be detected, and detect the chip. The driving device works continuously, so that the work station conversion and the lifting and lowering detection of the detection needle 2 are carried out continuously, with good linkage and coordination performance and a high degree of automation.
[0037] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. A chip detection device for electronic information engineering, comprising a base plate (1), a controller and a detection needle (2) electrically connected to the controller, characterized in that: A conveyor is arranged on the bottom plate (1), and the conveyor comprises two side plates (3) arranged opposite to each other, two rollers (4) are rotatably connected between the two side plates (3), the two rollers (4) are distributed at both ends of the two side plates (3), and a conveyor belt (5) is transmission-connected to the two rollers (4); A first support member (6) is provided at the front end of one of the side plates (3), a driving wheel (7) is rotatably connected to the first support member (6), a driving pin (8) is eccentrically provided on the driving wheel (7), a driven wheel (9) is coaxially provided on the roller (4) at the front end, a plurality of driving grooves (10) matched with the driving pin (8) are provided in a ring array at the edge of the driven wheel (9), a first cam (11) is coaxially provided on the driving wheel (7), a second support member (12) is provided on the other side plate (3), a lifting rod (13) is vertically slidably connected to the second support member (12), an "L"-shaped connecting rod (14) is provided on the lifting rod (13), the detection needle (2) is provided at the lower end of the "L"-shaped connecting rod (14), and a driving device for driving the first cam (11) and the driving wheel (7) to rotate synchronously is provided on the bottom plate (1).
2. The chip testing equipment for electronic information engineering according to claim 1, characterized in that: A first elastic member (15) is provided between the lifting rod (13) and the second support member (12); the lower end of the lifting rod (13) is in close contact with the first cam (11) under the action of the elastic potential energy of the first elastic member (15).
3. The chip testing equipment for electronic information engineering according to claim 1 or 2, characterized in that: The driving wheel (7) is provided with a locking arc (16), and the edge annular array of the driven wheel (9) is provided with locking grooves (17) adapted to the locking arc (16), and the number of the locking grooves (17) is the same as the number of the driving grooves (10) and is evenly spaced.
4. The chip testing equipment for electronic information engineering according to claim 3, characterized in that: A plurality of detection grooves (18) are evenly arranged on the conveying surface of the conveying belt (5).
5. The chip testing equipment for electronic information engineering according to claim 4, characterized in that: The detection groove (18) is internally slidably connected to a limit plate (19), and the limit plate (19) is provided with a force guide rod (20) slidably connected to the side wall of the detection groove (18), a tension spring (21) is provided between the limit plate (19) and the inner wall of the detection groove (18), and a trapezoidal guide block (22) is provided on the inner wall of the side plate (3) on the same side as the force guide rod (20).
6. The chip testing equipment for electronic information engineering according to claim 5, characterized in that: A collecting box (23) is slidably connected to the bottom plate (1), a partition (24) is arranged inside the collecting box (23), and the partition (24) divides the collecting box (23) into a good product slot and a waste product slot. The collecting box (23) is located below the front end of the conveyor. A telescopic device is arranged on the bottom plate (1) with an output end fixedly connected to the collecting box (23), and the telescopic device is electrically connected to a controller.
7. The chip testing equipment for electronic information engineering according to claim 6, characterized in that: A photoelectric sensor (25) electrically connected to the controller is arranged at the front end of the conveyor.
8. The chip testing equipment for electronic information engineering according to claim 7, characterized in that: The second support member (12) is provided with a piston cylinder (26), and an air inlet pipe (27) and an air outlet pipe (28) are provided on the piston cylinder (26). A piston (29) is slidably connected to the interior of the piston cylinder (26), and a second elastic member (30) is provided between the piston (29) and the inner bottom wall of the piston cylinder (26). The piston (29) is provided with a piston rod (31) extending from the piston cylinder (26), and a second cam (32) is coaxially provided on the driving wheel (7), and a front end of the piston rod (31) is in close contact with the second cam (32) under the action of the elastic potential energy of the second elastic member (30).
9. The chip testing equipment for electronic information engineering according to claim 8, characterized in that: The air inlet pipe (27) and the air outlet pipe (28) are respectively provided with an air check valve.
10. The chip testing equipment for electronic information engineering according to claim 9, characterized in that: The driving device comprises a driving part (33) arranged on a base plate (1), a driving pulley (34) being arranged at the output end of the driving part (33), a driven pulley (35) being coaxially arranged on the driving wheel (7), and a belt (36) being connected between the driving pulley (34) and the driven pulley (35) for transmission.
Citation Information
Patent Citations
An optical chip detection seat that can be used for high-frequency testing
CN113009320B