High-speed aircraft structure thermal test heating system

Abstract

The invention belongs to the technical field of high-speed aircraft structure thermal tests, and particularly relates to a high-speed aircraft structure thermal test heating system which comprises a quartz lamp tube, a silicon controlled rectifier, a controller, a first thermocouple and a second thermocouple. A plurality of quartz lamp tubes are arranged side by side and are arranged close to the test piece; the first thermocouple is arranged on the test piece; the second thermocouple is suspended between the quartz lamp tube and the test piece; the thyristor is connected with the quartz lamp tube; the controller is connected with the first thermocouple, the second thermocouple and the quartz lamp tube; the controller, the first thermocouple and the quartz lamp tube form outer ring indirect negative feedback control for controlling the temperature of the test piece; the controller, the second thermocouple and the quartz lamp tube form inner ring direct negative feedback control for controlling the temperature of a suspension point; the outer loop indirect negative feedback control takes the target temperature of the test piece as a control target value, and the inner loop direct negative feedback control takes the output value of the outer loop indirect negative feedback control as a control target value.

Description

Technical Field

[0001] The present application belongs to the technical field of high-speed aircraft structure thermal testing, and in particular relates to a high-speed aircraft structure thermal testing heating system. Background Art

[0002] Some structures in high-speed aircraft are subjected to large thermal loads during flight, such as the aircraft surface skin. For this reason, a high-speed aircraft structure thermal test is designed to assess the thermal response of the structure.

[0003] Quartz lamp radiation heating has the characteristics of small thermal inertia, easy control and simple structure, and is widely used in high-speed aircraft structural thermal testing.

[0004] Currently, the heating system for high-speed aircraft structure thermal test, such as Figure 1 As shown, it includes a quartz lamp, a thyristor, a controller, a thermocouple, etc., wherein the quartz lamp is arranged close to the test piece, the thermocouple is set on the test piece, the controller is connected to the thermocouple and the thyristor, and the thyristor is connected to the quartz lamp, forming a negative feedback control of the temperature of the test piece. The control logic is as follows Figure 2 As shown, after the test starts, the thermocouple feeds back the test piece temperature to the controller, and the controller subtracts the target temperature from the test piece temperature to obtain the temperature difference. Then, based on the PID control algorithm, the control amount is calculated using the temperature difference. The thyristor adjusts the output power of the quartz lamp according to the control amount to heat the test piece.

[0005] When conducting tests with the current high-speed aircraft structure thermal test heating system, the power radiated by the quartz lamp to the test piece is easily affected by the external environment and fluctuates greatly. The test piece has a large thermal inertia. The fluctuation caused by the external environmental interference takes a long time to react to the test piece temperature, resulting in delayed control of the test piece temperature, poor accuracy, and low temperature control precision, which affects the smooth progress of the test.

[0006] This application is proposed in view of the above-mentioned technical defects. Summary of the invention

[0007] The purpose of the present application is to provide a high-speed aircraft structure thermal test heating system to overcome or alleviate at least one aspect of the known technical deficiencies.

[0008] The technical solution of this application is:

[0009] A high-speed aircraft structure thermal test heating system comprises a quartz lamp, a thyristor, a controller, a first thermocouple, and a second thermocouple;

[0010] There are multiple quartz lamps, which are arranged side by side and close to the test piece;

[0011] A first thermocouple is disposed on the test piece;

[0012] The second thermocouple is suspended between the quartz lamp and the test piece;

[0013] The thyristor is connected to the quartz tube;

[0014] The controller is connected to the first thermocouple, the second thermocouple and the quartz lamp;

[0015] The controller, the first thermocouple, and the quartz lamp constitute an outer loop indirect negative feedback control for the temperature control of the test piece;

[0016] The controller, the second thermocouple and the quartz lamp tube constitute an inner loop direct negative feedback control for the temperature control of the suspension point;

[0017] The outer loop indirect negative feedback control takes the target temperature of the test piece as the control target value, and the inner loop direct negative feedback control takes the output value of the outer loop indirect negative feedback control as the control target value;

[0018] The first thermocouple feeds back the temperature of the test piece to the controller, and the controller calculates the outer loop indirect control temperature based on the target temperature and the temperature of the test piece. The second thermocouple feeds back the temperature of the suspension point to the controller, and the controller calculates the inner loop direct control quantity based on the suspension temperature and the outer loop indirect control temperature. The thyristor adjusts the output power of the quartz lamp according to the inner loop direct control quantity to heat the test piece.

[0019] According to at least one embodiment of the present application, in the above-mentioned high-speed aircraft structure thermal test heating system, the controller adopts an industrial computer.

[0020] According to at least one embodiment of the present application, in the above-mentioned high-speed aircraft structure thermal test heating system, the controller adopts a high-performance computer with a display.

[0021] According to at least one embodiment of the present application, in the above-mentioned high-speed aircraft structure thermal test heating system, the controller calculates the outer loop indirect control temperature according to the test piece target temperature and the test piece temperature, specifically:

[0022] The controller subtracts the target temperature from the test piece temperature to obtain a temperature difference, and then uses the temperature difference to calculate the outer loop indirect control temperature based on the outer loop indirect PID control algorithm.

[0023] According to at least one embodiment of the present application, in the above-mentioned high-speed aircraft structure thermal test heating system, the controller calculates the inner loop direct control amount according to the suspension temperature and the outer loop indirect control temperature, which is specifically:

[0024] The controller subtracts the suspension temperature from the outer loop indirect control temperature to obtain the temperature difference, and then uses the temperature difference to calculate the inner loop direct control amount based on the inner loop direct PID control algorithm.

[0025] This application has at least the following beneficial technical effects:

[0026] A high-speed aircraft structure thermal test heating system is provided. Two inner and outer closed-loop negative feedback controls are constructed in terms of structure. The outer-loop indirect negative feedback control takes the target temperature of the test piece as the target value, and the inner-loop direct negative feedback control takes the output value of the outer-loop indirect negative feedback control as the target value. The fluctuation of the power radiated from the quartz lamp to the test piece caused by interference can be suppressed in advance, the accuracy of the temperature control of the test piece can be improved, and the smooth completion of the test can be ensured. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a schematic diagram of the existing high-speed aircraft structure thermal test heating system;

[0028] Figure 2 It is a schematic diagram of the control logic of the heating system for the existing high-speed aircraft structure thermal test;

[0029] Figure 3 is a schematic diagram of a high-speed aircraft structure thermal test heating system provided in an embodiment of the present application;

[0030] Figure 4 It is a schematic diagram of the control logic of the heating system for high-speed aircraft structure thermal testing provided in an embodiment of the present application.

[0031] In order to better illustrate the present embodiment, some parts of the drawings may be omitted, enlarged or reduced, and do not represent the size of the actual product. In addition, the drawings are only used for illustrative purposes and should not be construed as limitations on the present application. DETAILED DESCRIPTION

[0032] In order to make the technical solution and advantages of the present application clearer, the technical solution of the present application will be described in further detail in detail and in detail with reference to the accompanying drawings. It can be understood that the specific embodiments described here are only partial embodiments of the present application, which are only used to explain the present application, not to limit the present application. It should be noted that, for the convenience of description, only the parts related to the present application are shown in the accompanying drawings, and other related parts can refer to the general design.

[0033] In addition, unless otherwise defined, the technical terms or scientific terms used in the description of this application shall have the usual meanings understood by those of ordinary skill in the art to which this application belongs. The words used in the description of this application to indicate orientation are only used to indicate relative directions or positional relationships. When the absolute position of the described object changes, its relative positional relationship may also change accordingly. The word "include" used in the description of this application indicates that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, but does not exclude other elements or objects.

[0034] In addition, it should be noted that, unless otherwise clearly specified and limited, the words "installation", "connection" and similar terms used in the description of this application should be understood in a broad sense. For example, the connection can be a fixed connection or a detachable connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium. Technical personnel in the field can understand its specific meaning in this application according to the specific circumstances.

[0035] A high-speed aircraft structure thermal test heating system, such as Figure 3 As shown, it includes a quartz lamp, a thyristor, a controller, a first thermocouple, and a second thermocouple.

[0036] There are multiple quartz lamp tubes, which are arranged side by side and close to the test piece.

[0037] A first thermocouple is disposed on the test piece.

[0038] The second thermocouple is suspended between the quartz lamp tube and the test piece.

[0039] The thyristor is connected to the quartz lamp.

[0040] The controller can be an industrial computer or a high-performance computer with a display, and is connected to the first thermocouple, the second thermocouple, and the quartz lamp.

[0041] The controller, the first thermocouple and the quartz lamp tube constitute an outer loop negative feedback control for the temperature control of the test piece.

[0042] The controller, the first thermocouple and the quartz lamp tube constitute an outer loop indirect negative feedback control for the temperature control of the test piece.

[0043] The controller, the second thermocouple and the quartz lamp tube constitute an inner loop direct negative feedback control for the temperature control of the suspension point.

[0044] The high-speed aircraft structure thermal test heating system disclosed in the above embodiment introduces a set of inner closed-loop control to eliminate the fluctuation of quartz lamp radiation power caused by interference, effectively improve the temperature control accuracy of the structure thermal test, and constructs two inner and outer closed-loop negative feedback controls in terms of structure. The outer loop indirect negative feedback control takes the target temperature of the test piece as the control target value, and the inner loop direct negative feedback control takes the output value of the outer loop indirect negative feedback control as the control target value. Its control logic is as follows: Figure 4 shown.

[0045] After the test starts, the first thermocouple feeds back the test piece temperature to the controller, and the controller subtracts the target temperature from the test piece temperature to obtain the temperature difference, and then uses the temperature difference to calculate the outer loop indirect control temperature based on the outer loop indirect PID control algorithm. At the same time, the second thermocouple feeds back the suspension point temperature to the controller, and the controller subtracts the suspension temperature from the outer loop indirect control temperature to obtain the temperature difference, and then uses the temperature difference to calculate the inner loop direct control amount based on the inner loop direct PID control algorithm. The thyristor adjusts the output power of the quartz lamp according to the inner loop direct control amount to heat the test piece.

[0046] The temperature of the suspension point is more sensitive to interference than the temperature of the test piece, and directly affects the temperature of the test piece relative to the quartz lamp. In the high-speed aircraft structure thermal test heating system disclosed in the above embodiment, when the power radiated from the quartz lamp to the test piece is disturbed and fluctuates, the temperature of the suspension point will change immediately, and the temperature difference between the suspension temperature and the outer loop indirect control temperature will also change accordingly. The inner loop direct PID control algorithm, which calculates the inner loop direct control amount based on the temperature difference, will also change. The thyristor adjusts the output power of the quartz lamp according to the inner loop direct control amount to heat the test piece, which can suppress the fluctuation of the power radiated from the quartz lamp to the test piece caused by the interference in advance, improve the accuracy of the temperature control of the test piece, and ensure the smooth completion of the test.

[0047] In addition, technicians in the field should also be able to realize that the various modules and units of the high-speed aircraft structure thermal test heating system disclosed in the embodiments of the present application can be implemented by electronic hardware, computer software or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, this application generally describes them according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Technicians in the field can choose to adopt different methods to implement the described functions for each specific application and its actual constraints, but such implementation should not be considered to be beyond the scope of this application.

[0048] So far, the technical solution of the present application has been described in conjunction with the preferred embodiments shown in the accompanying drawings. Those skilled in the art should understand that the scope of protection of the present application is obviously not limited to these specific embodiments. Without departing from the principles of the present application, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the scope of protection of the present application.

Claims

1. A high-speed aircraft structure thermal test heating system, characterized in that: It includes a quartz lamp, a thyristor, a controller, a first thermocouple, and a second thermocouple; There are multiple quartz lamps, which are arranged side by side and close to the test piece; A first thermocouple is disposed on the test piece; The second thermocouple is suspended between the quartz lamp and the test piece; The thyristor is connected to the quartz tube; The controller is connected to the first thermocouple, the second thermocouple and the quartz lamp; The controller, the first thermocouple, and the quartz lamp constitute an outer loop indirect negative feedback control for the temperature control of the test piece; The controller, the second thermocouple and the quartz lamp tube constitute an inner loop direct negative feedback control for the temperature control of the suspension point; The outer loop indirect negative feedback control takes the target temperature of the test piece as the control target value, and the inner loop direct negative feedback control takes the output value of the outer loop indirect negative feedback control as the control target value; The first thermocouple feeds back the temperature of the test piece to the controller, and the controller calculates the outer loop indirect control temperature based on the target temperature and the temperature of the test piece. The second thermocouple feeds back the temperature of the suspension point to the controller, and the controller calculates the inner loop direct control quantity based on the suspension temperature and the outer loop indirect control temperature. The thyristor adjusts the output power of the quartz lamp according to the inner loop direct control quantity to heat the test piece.

2. The high-speed aircraft structure thermal test heating system according to claim 1, characterized in that: The controller adopts industrial computer.

3. The high-speed aircraft structure thermal test heating system according to claim 1, characterized in that: The controller uses a high-performance computer with a display.

4. The high-speed aircraft structure thermal test heating system according to claim 1, characterized in that: The controller calculates the outer loop indirect control temperature based on the test piece target temperature and the test piece temperature, specifically: The controller subtracts the target temperature from the test piece temperature to obtain a temperature difference, and then uses the temperature difference to calculate the outer loop indirect control temperature based on the outer loop indirect PID control algorithm.

5. The high-speed aircraft structure thermal test heating system according to claim 1, characterized in that: The controller calculates the inner loop direct control quantity based on the suspension temperature and the outer loop indirect control temperature, which is: The controller subtracts the suspension temperature from the outer loop indirect control temperature to obtain the temperature difference, and then uses the temperature difference to calculate the inner loop direct control amount based on the inner loop direct PID control algorithm.

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